CN112129975A - Electrical connection assembly - Google Patents

Electrical connection assembly Download PDF

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Publication number
CN112129975A
CN112129975A CN201910555222.2A CN201910555222A CN112129975A CN 112129975 A CN112129975 A CN 112129975A CN 201910555222 A CN201910555222 A CN 201910555222A CN 112129975 A CN112129975 A CN 112129975A
Authority
CN
China
Prior art keywords
spring
section
electrical connection
outer diameter
connection assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910555222.2A
Other languages
Chinese (zh)
Inventor
吴树林
林彦维
陈威助
蔡伯晨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
China Contact Probes Co ltd
C C P CONTACT PROBES Co Ltd
Original Assignee
China Contact Probes Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by China Contact Probes Co ltd filed Critical China Contact Probes Co ltd
Priority to CN201910555222.2A priority Critical patent/CN112129975A/en
Publication of CN112129975A publication Critical patent/CN112129975A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

Abstract

The invention discloses an electric connection component, which comprises: a body and a spring. One end of the body is used for contacting with an object to be measured. The spring is sleeved on the body, the two ends of the spring are respectively defined as a first end and a second end, the first end is abutted against the limiting convex part, and the concealed section of the body is correspondingly positioned in the spring. The spring is provided with a first tight section, an elastic section and a second tight section from a first end to a second end in sequence; the distance between the springs and the elastic section is larger than that between the springs and the first tight section, and the distance between the springs and the elastic section is larger than that between the springs and the second tight section. The spring is formed by spirally rotating a wire body by taking a central shaft as a center, the tail end of the wire body is bent towards the central shaft to form a tail end part, and the tail end part is positioned at the position of the second tight section, which is far away from the first end of the spring. The terminal portion is used for being mutually fixed with the contact portion on the circuit board.

Description

Electrical connection assembly
Technical Field
The present disclosure relates to electrical connection assemblies, and particularly to an electrical connection assembly for detecting electronic components.
Background
Generally, before shipping, each electronic component or electronic product is subjected to related electrical inspection operations to ensure that the electronic component or electronic product meets the related specifications.
As shown in fig. 1, a conventional probe assembly 10 for inspecting electronic components is shown, such a probe assembly 10 includes a housing 101, two contacts 102, 103 and a spring 104, the two contacts 102, 103 and the spring 104 are disposed in the housing 101, the spring 104 is located between the two contacts 102, 103, and the spring 104 abuts against the two contacts 102, 103 to make a portion of the two contacts 102, 103 protrude out of the housing 101. When the probe assembly is used for detection, the two contact elements 102 and 103 protrude out of the shell 101 and respectively contact an object to be detected and a related detection device, and the detection device can detect the related electrical state of the object to be detected through the probe assembly 10. In a specific application, the probe assembly 10 shown in fig. 1 has many components, so the assembly process is complicated, and the production cost is high.
As shown in fig. 2, which shows another probe assembly 11, although the structure of such a probe assembly 11 is simple relative to the probe assembly 10 shown in fig. 1, such a probe assembly 11 has other problems. The probe assembly 11 includes a probe body 111 and a spring 112, a contact structure 1121 is formed at the end of the spring 112 extending outwards, and the probe assembly 11 is fixed to a pad S1 on a circuit board S by the contact structure 1121.
In the probe assembly 11 shown in fig. 2, in a specific implementation, since the end surface of the end of the contact structure 1121 is small, when the contact structure 1121 and the pad S1 of the circuit board S are fixed to each other, a problem that the contact structure 1121 cannot be correctly fixed to the pad S1 is likely to occur. Furthermore, since the contact structure 1121 is entirely in the shape of a rod, during the process of fixing the terminal of the contact structure 1121 and the pad S1 to each other, a moment is formed at the connection portion 1121A of the contact structure 1121 and the spring 112 corresponding to the force applied by the terminal of the contact structure 1121, and the moment is prone to fracture at the connection portion 1121A of the contact structure 1121 and the spring 112.
Disclosure of Invention
The invention discloses an electric connection component, which is mainly used for improving the problem that the conventional probe component has many components and complicated assembly procedures so as to cause high production cost.
The embodiment of the invention discloses an electric connection assembly, which comprises a body and a spring, wherein the body is of a conductive rod-shaped structure, two ends of the body are respectively defined as a contact end and a tail end, the contact end is used for contacting with an object to be tested, a position of the body adjacent to the contact end is provided with a limiting convex part, and the limiting convex part divides the body into an exposed section and an embedded section; the spring is sleeved on the body, two ends of the spring are respectively defined as a first end and a second end, the first end is abutted against the limiting convex part, and the concealed section of the body is correspondingly positioned in the spring; the spring is provided with a first tight section, an elastic section and a second tight section from the first end to the second end in sequence; the distance between the springs and the elastic section is larger than that between the springs and the first tight section, and the distance between the springs and the elastic section is larger than that between the springs and the second tight section; the outer diameter of the spring is between 0.05 mm and 3 mm; the spring is formed by spirally rotating a wire body by taking a central shaft as a center, the tail end of the wire body is bent towards the central shaft to form a tail end part, and the tail end part is positioned at the position of the second tight section, which is far away from the first end of the spring; when one end of the spring is fixed and the other end is extruded, the elastic section is elastically deformed, and when the spring is not extruded any more, the elastic restoring force generated by the elastic section enables the spring to be restored to the state of not being extruded.
Preferably, the body further has a fixing section separated from the built-in section, the outer diameter of the body in the fixing section is larger than the outer diameter of the body in the other built-in sections, the inner diameter of the spring in the first tightening section is smaller than the outer diameter of the body in the fixing section, and when one end of the spring abuts against the limiting convex part, the first tightening section is fixed with the fixing section of the body correspondingly.
Preferably, the spring is further divided into a tapered section in the second compact section, and the outer diameter of the spring is gradually reduced in the tapered section.
Preferably, the smallest inner diameter of the spring in the tapered section is smaller than the outer diameter of the body in the built-in section.
Preferably, the minimum outer diameter of the spring in the tapered section is 0.6 to 0.8 times the maximum outer diameter of the spring in the remaining section.
Preferably, the tapered section is located at the second end of the spring, and the spring is formed with a tip portion at the end of the tapered section.
Preferably, the difference between the length of the spring in the axial direction when the spring is not pressed and the length of the built-in section of the body in the axial direction is larger than the elastic stroke of the spring.
In summary, the electrical connection assembly of the present invention has a simple structure, and can greatly reduce the assembly process, thereby further reducing the production cost, and the terminal portion of the electrical connection assembly for fixing with the contact portion of the circuit board has stronger structural strength compared with the contact structure (as shown in fig. 2) of the prior electrical connection assembly in which the spring extends, and the terminal portion is not easily broken during the process of fixing with the contact portion of the circuit board. In addition, the terminal portion has a larger contact area than the contact structure (shown in fig. 2) of the prior electrical connection assembly from which the spring extends, and can be more easily and correctly fixed to the contact portion.
For a better understanding of the nature and technical content of the present invention, reference should be made to the following detailed description of the invention and the accompanying drawings, which are provided for illustration purposes only and are not intended to limit the scope of the invention in any way.
Drawings
Fig. 1 and 2 are cross-sectional views of a conventional probe assembly.
Fig. 3 is an assembly view of the electrical connection assembly of the present invention.
Fig. 4 is an exploded view of the electrical connection assembly of the present invention.
Fig. 5 is an exploded cross-sectional view of the electrical connection assembly of the present invention.
FIG. 6 is a cross-sectional view of an electrical connection assembly of the present invention with one end thereof fixed to a circuit board.
Fig. 7 is a bottom view of the second end of the spring of the electrical connection assembly of the present invention.
Detailed Description
In the following description, reference is made to or shown in the accompanying drawings for the purpose of illustrating the subject matter described herein, and in which is shown by way of illustration only, and not by way of limitation, specific reference may be made to the drawings.
Referring to fig. 3 to 5, fig. 3 is an assembly view of the electrical connection assembly of the present invention, fig. 4 is an exploded view of the electrical connection assembly, and fig. 5 is a cross-sectional exploded view of the electrical connection assembly. As shown, the electrical connection assembly 20 includes: a body 201 and a spring 202. In practical applications, one end of the electrical connection component 20 is used to be fixedly disposed on a circuit board, and the other end of the electrical connection component 20 is used to be in contact with an object to be tested (such as various chips and sensors), so that a processor connected to the circuit board can determine a related electrical state of the object to be tested contacted by the electrical connection component 20 through the electrical connection component 20, for example, the electrical connection component 20 of the present invention can be used to test an open/short (open/short) state of an electronic component. In practical applications, the electrical connection elements 20 may be fixedly disposed in an electrical base fixed on a circuit board, the electrical base is used to carry a chip (such as a memory), and the electrical connection elements 20 are used to electrically connect the chip disposed on the electrical base and the circuit board, that is, the electrical connection elements 20 of the present invention may be used as probes in the electrical base.
The body 201 is a conductive rod-like structure. As shown in fig. 4 and 5, two ends of the body 201 define a contact end 201A and a tail end 201B; the contact terminal 201A is used to contact the test object. The body 201 has a limiting protrusion 2011 (a ring structure is illustrated in the figures, but the shape is not limited thereto) at a position adjacent to the contact end 201A, and the limiting protrusion 2011 divides the body 201 into an exposed section 201C and an embedded section 201D. The outer diameter D1 of the limit protrusion 2011 is greater than or equal to the outer diameter D2 of the body 201 in the exposed section 201C, the outer diameter D1 of the limit protrusion 2011 is also greater than the outer diameters D31 and D32 of the body 201 in the concealed section 201D, and the outer diameter D1 of the limit protrusion 2011 is greater than the outer diameter D4 of the spring 202.
The body 201 may further be divided into a fixed section 201E in the hidden section 201D, the fixed section 201E is located adjacent to the limit protrusion 2011, and an outer diameter D31 of the body 201 in the fixed section 201E is greater than an outer diameter D32 of the body 201 in the remaining sections of the hidden section 201D. Although the embodiment is illustrated in the drawings by taking the body 201 with the fixing section 201E as an example, in practical applications, the body 201 may not have the fixing section 201E according to different assembling manners of the body 201 and the spring 202.
The spring 202 is sleeved on the built-in section 201D of the body 201, one end of the spring 202 abuts against the limit protrusion 2011, and the spring 202 is limited by the limit protrusion 2011 and cannot be separated from the body 201 by the contact end 201A of the body 201, that is, the exposed section 201C of the body 201 is not sleeved with the spring 202.
The two opposite ends of the spring 202 are respectively defined as a first end 202E1 and a second end 202E2, and the first end 202E1 of the spring 202 is abutted against the limit protrusion 2011. The spring 202 is sequentially divided into a first tightening section 202A, an elastic section 202B and a second tightening section 202C from the first end 202E1 to the second end 202E 2.
As shown in fig. 5, the pitch p (pitch) of the spring 202 in the first tightening section 202A and the pitch (pitch) of the spring 202 in the second tightening section 202C are respectively smaller than the pitch p (pitch) of the spring 202 in the elastic section 202B. In practical applications, the distance (pitch) between the first tightening segment 202A and the second tightening segment 202C of the spring 202 may be close to zero, i.e., the spring 202 is not deformed in either the first tightening segment 202A or the second tightening segment 202C regardless of whether the spring 202 is compressed or not.
The inner diameter D5 of the first tightening section 202A of the spring 202 is smaller than the outer diameter D31 of the body 201 at the fixing section 201E, and when the spring 202 is sleeved on the hidden section 201D of the body 201, the first tightening section 202A of the spring 202 is correspondingly fastened with the fixing section 201E of the body 201, and one end of the spring 202 adjacent to the first tightening section 202A is correspondingly abutted against one side of the limit protrusion 2011. That is, one end of the spring 202 can be fixedly disposed on the fixed section 201E of the body 201 by the design of the inner diameter D5 of the first tightening section 202A of the spring 202 and the outer diameter D31 of the fixed section 201E matching each other.
When the spring 202 is acted by an external force, the elastic section 202B of the spring 202 is elastically deformed and generates an elastic restoring force, and when the spring 202 is no longer acted by the external force, the elastic restoring force can restore the elastic section 202B of the spring 202 to a state of not being acted by the external force. That is, the elastic section 202B of the spring 202 is mainly used for providing an elastic restoring force to restore the spring 202 to an uncompressed state. In practical applications, the length of the spring 202 in the first tightening segment 202A, the length of the spring 202 in the elastic segment 202B, and the length of the spring 202 in the second tightening segment 202C may vary according to requirements, and are shown as an example.
The spring 202 is also separated in the second tightening section 202C by a constant diameter section 202C1 and a tapered section 202C 2. The outer diameter of the spring 202 is unchanged in the constant diameter section 202C1, while the outer diameter of the spring 202 is gradually reduced in the tapered section 202C2, and the minimum inner diameter D6 of the spring 202 in the tapered section 202C2 is smaller than the outer diameter D32 of the body 201 in the built-in section 201D. That is, the outer diameter of the spring 202 of the present embodiment is substantially constant and does not change at the position of the remaining non-tapered section 202C2, except that the outer diameter of the spring 202 changes at the position of the tapered section 202C 2. In addition, the difference L (as shown in fig. 6) between the length of the spring 202 in the axial direction (the Y-axis direction of the coordinate shown in fig. 5) when the spring 202 is not pressed and the length of the built-in section 201D of the body 201 in the axial direction (the Y-axis direction of the coordinate shown in fig. 5) is larger than the elastic stroke of the spring 202, which can elastically deform, that is, when the spring 202 is elastically deformed by the external force, the tail end 201B of the body 201 is still located in the spring 202, and the tail end 201B of the body 201 still does not penetrate through the spring 202.
In practical applications, the minimum outer diameter of the spring 202 in the tapered section 202C2 may be 0.6-0.8 times the maximum outer diameter of the spring 202 in the remaining sections.
Referring to fig. 6 and 7, fig. 6 is a schematic cross-sectional view illustrating the electrical connection assembly 20 of the present invention being fixedly disposed on the circuit board S, and fig. 7 is a bottom view illustrating the spring 202 at the second end 202E 2. As shown, the electrical connection assembly 20 is secured to the contact portion S1 of the circuit board S by the second end 202E2 of the spring 202. Since the length of the body 201 in the axial direction (the Y-axis direction of the coordinate shown in fig. 6) is shorter than the length of the spring 202 in the axial direction, the electrical connection assembly 20 is fixed on the circuit board S, and when the contact end 201A of the body 201 is not pressed, the tail end 201B of the body 201 is correspondingly located in the spring 202. In practical applications, when the spring 202 is not compressed, the tail end 201B of the body 201 may be located at the tapered section 202C2 or the constant diameter section 202C1, respectively.
The spring 202 is formed by a wire body spirally rotating around a central axis C, the end of the wire body is bent towards the central axis C to form a terminal portion 2021, the terminal portion 2021 is located at a position where the second tightening section 202C is far away from the first end 202E1 of the spring 202, and the terminal portion 2021 is used for fixing with the contact portion S1 of the circuit board S. That is, the spring 202 has a terminal portion 2021 formed at the end of the second end 202E2 for being fixed to the contact portion S1 of the circuit board S.
As shown in fig. 5 to 7, since the end portion 2021 is bent toward the central axis C, when the second end 202E2 of the spring 202 contacts the contact portion S1 of the circuit board S, the dot region a shown in fig. 7 can be used as a region contacting the contact portion S1 of the circuit board S. Therefore, the electrical connection assembly 20 of the present invention can greatly increase the contact area between the electrical connection assembly 20 and the contact portion S1 of the circuit board S by bending the end of the spring 202 toward the central axis C of the spring 202 to form the end portion 2021, thereby greatly improving the probability that the electrical connection assembly 20 is correctly fixed on the circuit board S.
In a specific application, as shown in fig. 6 and 7, in a top view of an end of the spring 202 having the end portion 2021, the end portion 2021 is correspondingly passed through the central axis C, and the end portion 2021 widely covers a hollow region B formed by the spring 202 surrounding the central axis C, so that the end portion 2021 of the spring 202 is more easily contacted with the contact portion S1 during the process of fixing the end portion 2021 of the spring 202 to the contact portion S1, thereby greatly increasing the assembling speed.
As described above, in the conventional electrical connection assembly, as shown in fig. 2, the end surface of the contact structure 1121 is in contact with the contact portion of the circuit board, so that it is not easy to make the contact structure 1121 in a correct contact with the contact portion of the circuit board in the process of making the end surface of the contact structure 1121 in contact with the contact portion of the circuit board.
In addition, it is worth mentioning that in the conventional electrical connection assembly shown in fig. 2, in the process of fixing the contact structure 1121 and the contact portion of the circuit board, the contact structure 1121 and the spring are easily broken. In contrast, in the electrical connection assembly 20 of the present invention, the terminal portion 2021 is not easily broken as the contact structure 1121 shown in fig. 2 in the process of fixing the terminal portion 2021 and the contact portion of the circuit board.
It is particularly emphasized that the spring 202 of the present invention has an outer diameter of 0.05 mm to 3 mm, i.e., the electrical connector assembly 20 of the present invention is mainly used to improve the problems of the conventional small-sized electrical connector assembly.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, so that all equivalent technical changes made by using the contents of the present specification and the accompanying drawings are included in the scope of the present invention.

Claims (7)

1. An electrical connection assembly, comprising:
the body is of a conductive rod-shaped structure, two ends of the body are respectively defined as a contact end and a tail end, the contact end is used for contacting with an object to be tested, a position of the body, which is adjacent to the contact end, is provided with a limiting convex part, and the limiting convex part divides the body into an exposed section and an embedded section;
the spring is sleeved on the body, two ends of the spring are respectively defined as a first end and a second end, the first end is abutted against the limiting convex part, and the concealed section of the body is correspondingly positioned in the spring; the spring is provided with a first tight section, an elastic section and a second tight section from the first end to the second end in sequence; the distance between the springs and the elastic section is larger than that between the springs and the first tight section, and the distance between the springs and the elastic section is larger than that between the springs and the second tight section; the outer diameter of the spring is between 0.05 mm and 3 mm;
the spring is formed by spirally rotating a wire body by taking a central shaft as a center, the tail end of the wire body is bent towards the central shaft to form a tail end part, and the tail end part is positioned at the position, far away from the first end of the spring, of the second tightening section;
when one end of the spring is fixed and the other end of the spring is extruded, the elastic section is elastically deformed, and when the spring is not extruded any more, the elastic restoring force generated by the elastic section enables the spring to be restored to an uncompressed state.
2. The electrical connection assembly of claim 1 wherein the body further defines a securing section separated from the concealed section, the outer diameter of the body at the securing section is greater than the outer diameter of the body at the remaining concealed sections, the inner diameter of the spring at the first tightening section is less than the outer diameter of the body at the securing section, and the first tightening section is correspondingly secured to the securing section of the body when one end of the spring abuts against the limiting protrusion.
3. The electrical connection assembly of claim 1 wherein said spring is further separated in said second tightening section by a tapered section, said spring having an outer diameter that tapers in said tapered section.
4. The electrical connection assembly of claim 3 wherein the minimum inner diameter of said spring at said tapered section is less than the outer diameter of said body at said recessed section.
5. The electrical connection assembly of claim 3, wherein the minimum outer diameter of the spring in the tapered section is 0.6 to 0.8 times the maximum outer diameter of the spring in the remaining section.
6. The electrical connection assembly of claim 3, wherein the tapered section is located at the second end of the spring, the spring having the terminal portion formed at a terminal end of the tapered section.
7. The electrical connection assembly of claim 3 wherein the difference between the axial length of said spring when said spring is uncompressed and the axial length of said recessed section of said body is greater than the spring travel of said spring.
CN201910555222.2A 2019-06-25 2019-06-25 Electrical connection assembly Pending CN112129975A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910555222.2A CN112129975A (en) 2019-06-25 2019-06-25 Electrical connection assembly

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910555222.2A CN112129975A (en) 2019-06-25 2019-06-25 Electrical connection assembly

Publications (1)

Publication Number Publication Date
CN112129975A true CN112129975A (en) 2020-12-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910555222.2A Pending CN112129975A (en) 2019-06-25 2019-06-25 Electrical connection assembly

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Country Link
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TW200730831A (en) * 2005-12-06 2007-08-16 Unitechno Inc Double-ended contact probe
TW200813437A (en) * 2006-06-01 2008-03-16 Rika Denshi America Inc Electrical test probes with a contact element, methods of making and using the same
CN104897934A (en) * 2014-01-28 2015-09-09 旺矽科技股份有限公司 Spring probe
US20160216294A1 (en) * 2015-01-27 2016-07-28 Kurt F. Kaashoek Electrical Spring Probe with Stabilization
TW201638589A (en) * 2015-04-22 2016-11-01 旺矽科技股份有限公司 Probe structure and probe card
TW201712345A (en) * 2015-09-23 2017-04-01 Mpi Corp Telescopic spring probe and probe card having the telescopic spring probe having a probe seat, the probe, and a circuit board
TWI582434B (en) * 2015-12-18 2017-05-11 吳俊杰 Probe device
TW201840986A (en) * 2017-03-30 2018-11-16 日商日本發條股份有限公司 Contact probe and probe unit
CN109103644A (en) * 2018-08-31 2018-12-28 东莞中探探针有限公司 Spring probe

Patent Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997039361A1 (en) * 1996-04-12 1997-10-23 Nhk Spring Co., Ltd. Conductive contact unit system
KR20000005260A (en) * 1996-04-12 2000-01-25 마에다 츠구히로 Conductive contact unit system
CN1242078A (en) * 1996-12-27 2000-01-19 日本发条株式会社 Contact probe unit
CN1769897A (en) * 1996-12-27 2006-05-10 日本发条株式会社 Contact probe unit
CN1312910A (en) * 1998-07-30 2001-09-12 日本发条株式会社 Holder of electroconductive contactor and method for producing same
TW439987U (en) * 1999-07-29 2001-06-07 Ccp Contact Probes Co Ltd Improved probe structure
TW521149B (en) * 1999-09-09 2003-02-21 Nhk Spring Co Ltd Electric contact probe assembly
CN1436306A (en) * 2000-06-16 2003-08-13 日本发条株式会社 Microcontactor probe and electric probe unit
CN2795864Y (en) * 2005-02-03 2006-07-12 陈涛 Spring transfer element of printed circuit board detector
TW200730831A (en) * 2005-12-06 2007-08-16 Unitechno Inc Double-ended contact probe
TW200813437A (en) * 2006-06-01 2008-03-16 Rika Denshi America Inc Electrical test probes with a contact element, methods of making and using the same
CN104897934A (en) * 2014-01-28 2015-09-09 旺矽科技股份有限公司 Spring probe
US20160216294A1 (en) * 2015-01-27 2016-07-28 Kurt F. Kaashoek Electrical Spring Probe with Stabilization
TW201638589A (en) * 2015-04-22 2016-11-01 旺矽科技股份有限公司 Probe structure and probe card
TW201712345A (en) * 2015-09-23 2017-04-01 Mpi Corp Telescopic spring probe and probe card having the telescopic spring probe having a probe seat, the probe, and a circuit board
TWI582434B (en) * 2015-12-18 2017-05-11 吳俊杰 Probe device
TW201840986A (en) * 2017-03-30 2018-11-16 日商日本發條股份有限公司 Contact probe and probe unit
CN109103644A (en) * 2018-08-31 2018-12-28 东莞中探探针有限公司 Spring probe

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