CN112115186A - Method for constructing quality improvement index of electronic product through big data - Google Patents

Method for constructing quality improvement index of electronic product through big data Download PDF

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CN112115186A
CN112115186A CN202011065322.6A CN202011065322A CN112115186A CN 112115186 A CN112115186 A CN 112115186A CN 202011065322 A CN202011065322 A CN 202011065322A CN 112115186 A CN112115186 A CN 112115186A
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quality
electronic product
main
quality improvement
evaluation system
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黄晓斌
杨芳
张露薇
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Sichuan Changhong Electric Co Ltd
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Sichuan Changhong Electric Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
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    • G06Q50/04Manufacturing
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Abstract

The invention discloses a method for constructing an electronic product quality improvement index through big data, which comprises the following steps: establishing an electronic product quality improvement evaluation system; establishing a standard unified quality data collection system and a standard unified quality data collection process in each production process, and configuring corresponding hardware to input relevant quality data; the quality improvement evaluation system automatically analyzes and determines the main quality problem of the product by using a data analysis model according to the quality data collected by the quality database; according to the determined main quality problem, the quality improvement evaluation system automatically calls a cause-effect graph in the quality management common graph to find out the reason causing the main quality problem according to a certain method; and according to the determined reason, the quality improvement index of the electronic product is specifically formulated. The method can find the main quality problem, then uses the cause-effect graph to find the first three main causes of the main problem, and establishes the quality improvement index according to the analyzed causes in a pertinence manner, thereby ensuring that the quality improvement index is more comprehensive, systematic and accurate.

Description

Method for constructing quality improvement index of electronic product through big data
Technical Field
The invention belongs to the technical field of quality improvement of electronic products, and particularly relates to a method for constructing an electronic product quality improvement index through big data.
Background
In recent years, with the rapid development of big data technologies, including big data storage, big data analysis and big data algorithm, big data display technologies are changing day by day, and more industries introduce big data technologies, thereby providing various solutions more accurately and reliably.
In order to better improve the quality of product objects, a plurality of enterprises can not improve the quality without a quality control system and PDCA circulation, the quality of the product objects can not be improved only by continuously promoting the quality improvement of the product, and the quality improvement index pulls the whole process of the quality improvement.
In the current enterprise quality activities, the quality improvement index requirements of most enterprises are input systematically and comprehensively, and the quality index setting is unscientific, so that the quality improvement activities are half successful, and even the product quality level is continuously reduced.
Disclosure of Invention
The invention aims to provide a method for constructing an electronic product quality improvement index through big data, which aims to overcome the defects of the prior art.
The technical scheme of the invention is as follows:
a method for constructing an electronic product quality improvement index through big data comprises the following steps:
establishing an electronic product quality improvement evaluation system;
establishing a standard unified quality data collection system and a standard unified quality data collection process in each production process, and configuring corresponding hardware to input relevant quality data;
the quality improvement evaluation system automatically analyzes and determines the main quality problem of the product by using a data analysis model according to the quality data collected by the quality database;
according to the determined main quality problem, the quality improvement evaluation system automatically calls a cause-effect graph in the quality management common graph to find out the reason causing the main quality problem according to a certain method;
and according to the determined reason, the quality improvement index of the electronic product is specifically formulated.
Further, the establishment of the quality improvement evaluation system comprises the steps of establishing a quality database, determining a quality data storage place, establishing a quality data analysis model, developing a quality management common chart, setting factors influencing the product quality, and setting analysis result display contents.
Further, each process of the production includes an electronic product design process, an electronic product production process, an electronic product inspection process, an electronic product sales process, and an electronic product after-sales process.
Further, the cause and effect graph is a fishbone graph.
Further, according to the determined main quality problem, the quality improvement evaluation system automatically calls a cause-and-effect graph in the quality management common graph to find the reason causing the main quality problem according to the twenty-eight principle.
Further, according to the determined main quality problem, the quality improvement evaluation system automatically calls a cause-and-effect graph in the quality management common graph to find three main reasons causing the main quality problem according to the twenty-eight principle.
Further, according to the three determined main reasons, an electronic product quality improvement index is established in a targeted manner.
The invention has the following beneficial effects:
the invention provides a comprehensive, systematic and scientific method for collecting mass big data, storing the mass big data, calculating the mass big data and analyzing the mass big data.
Drawings
Fig. 1 is a flow chart of a method for constructing an electronic product quality improvement index through big data according to the present invention.
Detailed Description
The technical solution of the present invention is further described below with reference to specific examples, but the present invention is not limited to the contents of the examples in any way.
Example 1
As shown in fig. 1, a method for constructing an electronic product quality improvement index through big data includes:
the method comprises the steps of establishing an electronic product quality improvement evaluation system, wherein the establishment of the quality improvement evaluation system comprises the steps of establishing a quality database, determining a quality data storage place, establishing a quality data analysis model, developing a quality management common chart, setting factors influencing product quality, and setting analysis result display contents.
Establishing a standard unified quality data collection system and a standard unified quality data collection flow in each production process, and inputting relevant quality data by corresponding hardware, wherein each production process comprises an electronic product design process, an electronic product production process, an electronic product inspection process, an electronic product sale process and an electronic product after-sale process;
the quality improvement evaluation system automatically analyzes and determines the main quality problem of the product by using a data analysis model according to the quality data collected by the quality database;
according to the determined main quality problem, the quality improvement evaluation system automatically calls a cause-and-effect graph, such as a fishbone graph, in the common quality management graph to find three main reasons causing the main quality problem according to a two-eight principle;
and according to the three determined main reasons, the quality improvement index of the electronic product is made in a targeted manner.
The embodiment aims at improving the quality of the color television set without power supply, and establishes the quality improvement index of the color television set without power supply, and comprises the following steps:
developing a color television quality improvement evaluation system, establishing a color television quality database in the quality improvement evaluation system, determining a quality data storage place, establishing a color television quality data analysis model, developing a color television quality management common chart, setting factors influencing the color television quality, and setting analysis result display contents;
establishing a standard unified quality data collection system and a standard unified quality data collection process in the design process, the production process, the product inspection process, the sales process and the after-sales process of the color television, and inputting parameters in the aspects of personnel, equipment, materials, environment, methods and the like and quality problems and reasons exposed in each process by using hardware equipment;
the quality improvement and evaluation system of the color television automatically extracts the data of the quality database periodically for analysis, and the system automatically determines the main quality problem of the product by using a data analysis model, if the main problem is determined to be non-electrification in the example, the main problem is further analyzed to be solder joint rosin joint;
the quality improvement evaluation system automatically calls a cause-and-effect analysis chart, and three main reasons causing insufficient soldering of the soldering points are found according to the principle of twenty-eight, namely that wave soldering temperature is too low, printed board weldability is poor, and wave soldering time is too short;
according to three main reasons of over-low wave soldering temperature, poor weldability of a printed board and over-short wave soldering time, quality improvement indexes of 0 virtual soldering rate of a welding spot, 100 percent of standard reaching rate of the wave soldering time, 100 percent of standard reaching rate of the wave soldering temperature and 99 percent of qualified rate of raw material inspection are respectively determined.
Although the present invention has been described herein with reference to the illustrated embodiments thereof, which are intended to be preferred embodiments of the present invention, it is to be understood that the invention is not limited thereto, and that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this disclosure.

Claims (7)

1. A method for constructing an electronic product quality improvement index through big data is characterized by comprising the following steps:
establishing an electronic product quality improvement evaluation system;
establishing a standard unified quality data collection system and a standard unified quality data collection process in each production process, and configuring corresponding hardware to input relevant quality data;
the quality improvement evaluation system automatically analyzes and determines the main quality problem of the product by using a data analysis model according to the quality data collected by the quality database;
according to the determined main quality problem, the quality improvement evaluation system automatically calls a cause-effect graph in the quality management common graph to find out the reason causing the main quality problem according to a certain method;
and according to the determined reason, the quality improvement index of the electronic product is specifically formulated.
2. The method of claim 1, wherein the step of establishing the quality improvement evaluation system comprises establishing a quality database, determining a quality data storage location, establishing a quality data analysis model, developing a quality management common chart, setting factors affecting product quality, and setting analysis result display contents.
3. The method of claim 1, wherein each process of production comprises an electronic product design process, an electronic product production process, an electronic product inspection process, an electronic product sales process, and an electronic product after sales process.
4. The method of claim 1, wherein the cause-and-effect graph is a fish bone graph.
5. The method for constructing the quality improvement index of the electronic product through the big data as claimed in claim 1, wherein according to the determined main quality problem, the quality improvement evaluation system automatically recalls the cause-effect graph in the quality management common chart to find the cause of the main quality problem according to the twenty-eight principle.
6. The method for constructing the quality improvement index of the electronic product through the big data as claimed in claim 5, wherein according to the determined main quality problem, the quality improvement evaluation system automatically recalls the cause-effect graph in the quality management common chart to find the three main causes causing the main quality problem according to the twenty-eight principle.
7. The method for constructing an index of quality improvement of electronic products through big data as claimed in claim 6, wherein the index of quality improvement of electronic products is customized according to the three main reasons.
CN202011065322.6A 2020-09-30 2020-09-30 Method for constructing quality improvement index of electronic product through big data Pending CN112115186A (en)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20100041112A (en) * 2008-10-13 2010-04-22 (주) 디지털팩토리 Method for building new factory using digital factory
CN102117435A (en) * 2009-12-31 2011-07-06 青岛海尔软件有限公司 Product quality management system
CN108268892A (en) * 2017-12-29 2018-07-10 英特尔产品(成都)有限公司 Fault in production management analysis method
CN109101632A (en) * 2018-08-15 2018-12-28 中国人民解放军海军航空大学 Product quality abnormal data retrospective analysis method based on manufacture big data
CN109146279A (en) * 2018-08-14 2019-01-04 同济大学 Whole process product quality Source Tracing method based on process rule and big data
CN109919446A (en) * 2019-02-01 2019-06-21 北京航空航天大学 A kind of quality accident root primordium recognition methods
CN110163538A (en) * 2019-06-26 2019-08-23 温州大学 Movable core quality inspection improved method based on DMAIC

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20100041112A (en) * 2008-10-13 2010-04-22 (주) 디지털팩토리 Method for building new factory using digital factory
CN102117435A (en) * 2009-12-31 2011-07-06 青岛海尔软件有限公司 Product quality management system
CN108268892A (en) * 2017-12-29 2018-07-10 英特尔产品(成都)有限公司 Fault in production management analysis method
CN109146279A (en) * 2018-08-14 2019-01-04 同济大学 Whole process product quality Source Tracing method based on process rule and big data
CN109101632A (en) * 2018-08-15 2018-12-28 中国人民解放军海军航空大学 Product quality abnormal data retrospective analysis method based on manufacture big data
CN109919446A (en) * 2019-02-01 2019-06-21 北京航空航天大学 A kind of quality accident root primordium recognition methods
CN110163538A (en) * 2019-06-26 2019-08-23 温州大学 Movable core quality inspection improved method based on DMAIC

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