CN112114261B - Integrated chip for testing internal resistance of battery - Google Patents
Integrated chip for testing internal resistance of battery Download PDFInfo
- Publication number
- CN112114261B CN112114261B CN202011005948.8A CN202011005948A CN112114261B CN 112114261 B CN112114261 B CN 112114261B CN 202011005948 A CN202011005948 A CN 202011005948A CN 112114261 B CN112114261 B CN 112114261B
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- battery
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- cabin
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- 238000012360 testing method Methods 0.000 title claims abstract description 118
- 238000012423 maintenance Methods 0.000 claims abstract description 22
- 230000017525 heat dissipation Effects 0.000 claims abstract description 20
- 239000002184 metal Substances 0.000 claims description 12
- 238000009434 installation Methods 0.000 abstract description 3
- 108010066057 cabin-1 Proteins 0.000 description 12
- 238000007789 sealing Methods 0.000 description 8
- 230000006835 compression Effects 0.000 description 4
- 238000007906 compression Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000009423 ventilation Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000011418 maintenance treatment Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/385—Arrangements for measuring battery or accumulator variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/389—Measuring internal impedance, internal conductance or related variables
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0073—Shielding materials
- H05K9/0081—Electromagnetic shielding materials, e.g. EMI, RFI shielding
- H05K9/0086—Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising a single discontinuous metallic layer on an electrically insulating supporting structure, e.g. metal grid, perforated metal foil, film, aggregated flakes, sintering
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Thermal Sciences (AREA)
- Battery Mounting, Suspending (AREA)
Abstract
The invention discloses an integrated chip for testing internal resistance of a battery, which comprises an integrated chip assembly cabin, a maintenance convenient structure and a protection shielding structure, wherein one side of the integrated chip assembly cabin is provided with the test battery assembly structure, the two sides of the integrated chip assembly cabin are respectively provided with a vent hole, the maintenance convenient structure is arranged in the integrated chip assembly cabin, one side of the maintenance convenient structure is connected with the chip protection heat dissipation assembly structure, the inside of the chip protection heat dissipation assembly structure is provided with the test integrated chip, and the protection shielding structure is arranged on the inner wall of the integrated chip assembly cabin. According to the invention, the convenience of installation and use of the test inserted bar can be ensured through the inserted bar assembly groove and the test inserted bar which are mutually matched, and the internal resistance test of large-sized batteries such as lead storage batteries can be conveniently carried out through the arranged test inserted bar, so that the variety of internal resistance types of the integrated chip test batteries can be improved.
Description
Technical Field
The invention relates to the technical field of battery internal resistance test chips, in particular to an integrated chip for testing battery internal resistance.
Background
Integrated chips are modern digital integrated chips manufactured mainly using CMOS processes. CMOS devices have low static power consumption, but in the case of high speed switches, CMOS devices require power supplies to provide instantaneous power, and the dynamic power requirements of high speed CMOS devices exceed those of similar bipolar devices. Decoupling capacitors must be added to these devices to meet instantaneous power requirements. Modern integrated chips have a variety of packaging structures, with shorter pins and less EMI problems for discrete components. Because of the smaller mounting area and lower mounting location of the surface mount device, and thus better EMC performance, surface mount components should be preferred, even if the die is mounted directly on the PCB.
Generally, when testing the internal resistance of a battery, the battery cannot be matched with the battery because of different sizes and models of the battery, and the inaccurate test result is caused by the electromagnetic influence of the outside during the test, and meanwhile, the integrated chip has the inconvenient problems of chip protection, heat dissipation, maintenance and the like when the integrated chip is used.
Disclosure of Invention
The invention aims to provide an integrated chip for testing the internal resistance of a battery, which solves the problems that the battery cannot be matched for testing due to different sizes and types of the battery generally when the internal resistance of the battery is tested, and the testing result is inaccurate due to the electromagnetic influence of the outside during testing, and meanwhile, the integrated chip is inconvenient in chip protection, heat dissipation, maintenance and the like when the integrated chip is used.
In order to achieve the above purpose, the present invention provides the following technical solutions: the utility model provides an integrated chip of test battery internal resistance, includes integrated chip assembly cabin, maintains convenient structure and protection shielding structure, one side of integrated chip assembly cabin is provided with test battery assembly structure, and the air vent has all been seted up to the both sides of integrated chip assembly cabin, maintain convenient structure setting in the inside of integrated chip assembly cabin, one side of maintaining convenient structure is connected with chip protection heat dissipation assembly structure, and the inside assembly of chip protection heat dissipation assembly structure has test integrated chip, protection shielding structure sets up in the inner wall of integrated chip assembly cabin, the one end of integrated chip assembly cabin is provided with dismantles maintenance structure.
Preferably, the test battery assembly structure comprises a battery assembly cabin, a first battery connection contact, a second battery connection contact, a pressing disc, a connecting shaft, a plug assembly groove and a test plug, wherein the first battery connection contact is arranged at the bottom end inside the battery assembly cabin, the second battery connection contact is arranged above the first battery connection contact, the connecting shaft is connected with the upper end of the second battery connection contact, the pressing disc is connected with the upper end of the connecting shaft, the plug assembly groove is formed in the outer side end face of the battery assembly cabin, and the test plug is arranged inside the plug assembly groove.
Preferably, the connecting shaft penetrates through the battery assembly cabin, the second battery connecting contact forms a telescopic structure with the battery assembly cabin through the pressing plate and the connecting shaft, and the first battery connecting contact and the second battery connecting contact are mutually aligned up and down.
Preferably, the two insert rod assembly grooves and the two test insert rods are arranged, and the insert rod assembly grooves and the two test insert rods are matched with each other.
Preferably, the chip protection heat dissipation assembly structure comprises an assembly clamping plate, clamping grooves and connecting gaskets, wherein the clamping grooves are formed in the assembly clamping plate, and the connecting gaskets are arranged in the clamping grooves.
Preferably, the assembly clamping plate is clamped with the test integrated chip through the clamping groove, the lower end of the test integrated chip is mutually attached to the connecting gasket, and the gap between the lower end face of the test integrated chip and the inner end face of the assembly clamping plate is 0-5mm.
Preferably, the convenient structure of maintaining includes assembly motor, screw rod, slider and spacing groove, and the output of assembly motor is connected with the screw rod to the outside of screw rod is connected with the slider, and the outside of slider is provided with the spacing groove simultaneously, the assembly motor passes through and constitutes extending structure between screw rod and the slider, and the slider passes through and constitutes sliding structure between spacing groove and the integrated chip assembly cabin.
Preferably, the protection shielding structure comprises a shielding protection metal net and a fixing pressing rod, the fixing pressing rod is arranged on the outer side of the shielding protection metal net, the shielding protection metal net is tightly attached to the inner wall of the integrated chip assembly cabin, and a plurality of groups of fixing pressing rods are arranged.
Preferably, the disassembly and maintenance structure comprises a connecting hinge, a sealing cover plate, an inserting connector and an inserting groove, wherein one side of the connecting hinge is connected with the sealing cover plate, the inner end face of the sealing cover plate is provided with the inserting connector, the symmetrical position of the connecting hinge relative to the vertical central line of the connecting hinge is provided with the inserting groove, the sealing cover plate forms a rotating structure between the connecting hinge and the integrated chip assembly cabin, and the inserting connector is inserted between the inserting connector and the inserting groove.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention can facilitate the convenience of the integrated chip in detecting and using the internal resistance of the battery through the arranged battery assembling structure, can improve the testing efficiency of the internal resistance of the battery through the direct assembly of the test battery, can assemble batteries with different sizes in the battery assembling cabin through the arranged battery assembling cabin, thereby improving the convenience of the battery test, can ensure the contact compactness during the battery test through manually pressing the pressing disc, and avoid the problem of inaccurate test caused by unstable contact.
2. According to the invention, the convenience of installation and use of the test inserted bar can be ensured through the inserted bar assembly groove and the test inserted bar which are mutually matched, and the internal resistance test of large-sized batteries such as lead storage batteries can be conveniently carried out through the arranged test inserted bar, so that the variety of internal resistance types of the integrated chip test batteries can be improved.
3. The chip protection heat dissipation assembly structure can protect and dissipate heat of the test integrated chip, the arranged test integrated chip is assembled in the clamping groove in a clamping mode, so that the test integrated chip is prevented from being damaged due to external collision, and meanwhile, a certain gap can be kept between the test integrated chip and the assembly clamping plate through the arranged connecting gasket, and the heat dissipation and ventilation effects can be achieved through the gap.
4. The convenient and fast maintenance structure provided by the invention can conveniently adjust and process the position of the test integrated chip, so that the convenience of replacement and maintenance after the damage of parts in the device can be conveniently improved, and the stability of the structure when the test integrated chip works can be ensured through the mutual matching and clamping between the sliding block and the limiting groove.
5. The arrangement of the protection shielding structure can play a role in electromagnetic protection, so that the influence of external electromagnetic transmission on the test of the integrated chip can be avoided, the accuracy of the test of the chip can be improved, and the arranged disassembly and maintenance structure can facilitate the opening of the device, so that the maintenance treatment of parts in the device can be carried out, and the practicability of the integrated chip for testing the internal resistance of the battery is greatly improved.
Drawings
FIG. 1 is a schematic diagram of the structure of the present invention;
FIG. 2 is a schematic view of the internal structure of the IC chip assembly module according to the present invention;
FIG. 3 is a schematic side view of a maintenance-friendly structure of the present invention;
FIG. 4 is a schematic view of the end face structure of the IC package module of the present invention;
FIG. 5 is a schematic diagram of a three-dimensional structure of a connection between a test integrated chip and a chip protection heat dissipation assembly structure according to the present invention;
fig. 6 is a schematic view of a bottom end deployment structure of an integrated chip assembly module according to the present invention.
In the figure: 1. an integrated chip assembly cabin; 2. testing a battery assembly structure; 201. a battery assembly compartment; 202. a first battery connection contact; 203. a second battery connection contact; 204. pressing a disc; 205. a connecting shaft; 206. a rod assembly groove; 207. testing the inserted bar; 3. a vent hole; 4. testing the integrated chip; 5. chip protection heat dissipation assembly structure; 501. assembling a clamping plate; 502. a clamping groove; 503. a connecting gasket; 6. the structure is convenient to maintain; 601. assembling a motor; 602. a screw; 603. a slide block; 604. a limit groove; 7. a protective shielding structure; 701. shielding protective metal net; 702. fixing the compression bar; 8. disassembling the maintenance structure; 801. a connecting hinge; 802. sealing the cover plate; 803. a plug; 804. and a plug-in groove.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, unless otherwise indicated, the meaning of "a plurality" is two or more; the terms "upper," "lower," "left," "right," "inner," "outer," "front," "rear," "head," "tail," and the like are used as an orientation or positional relationship based on that shown in the drawings, merely to facilitate description of the invention and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Referring to fig. 1-6, an integrated chip for testing internal resistance of a battery, comprising an integrated chip assembling cabin 1, a maintenance convenient structure 6 and a protection shielding structure 7, wherein one side of the integrated chip assembling cabin 1 is provided with a test battery assembling structure 2, and both sides of the integrated chip assembling cabin 1 are provided with vent holes 3, the test battery assembling structure 2 comprises a battery assembling cabin 201, a first battery connecting contact 202, a second battery connecting contact 203, a pressing disc 204, a connecting shaft 205, a plunger assembling groove 206 and a test plunger 207, the bottom end inside the battery assembling cabin 201 is provided with the first battery connecting contact 202, the second battery connecting contact 203 is arranged above the first battery connecting contact 202, the upper end of the second battery connecting contact 203 is connected with a connecting shaft 205, the upper end of the connecting shaft 205 is connected with the pressing disc 204, the outer end surface of the battery assembling cabin 201 is provided with the plunger assembling groove 206, and the inside of the inserted bar assembly groove 206 is provided with a test inserted bar 207, the connecting shaft 205 penetrates through the inside of the battery assembly cabin 201, and the second battery connecting contact 203 forms a telescopic structure with the battery assembly cabin 201 through the pressing plate 204 and the connecting shaft 205, and the first battery connecting contact 202 and the second battery connecting contact 203 are mutually aligned up and down, the convenience of the integrated chip for detecting and using the battery internal resistance can be facilitated through the arranged test battery assembly structure 2, the test efficiency of the battery internal resistance can be improved through the direct assembly of the test battery, and the batteries with different sizes can be assembled in the inside of the battery assembly cabin 201 through the arranged battery assembly cabin, so that the convenience of the battery test can be improved, and the contact tightness during the battery test can be ensured through the manual pressing of the pressing plate 204, the problem of inaccurate test caused by unstable contact is avoided.
The two insert rod assembly grooves 206 and the two test insert rods 207 are respectively arranged, the insert rod assembly grooves 206 and the two test insert rods 207 are matched with each other, the convenience of installation and use of the test insert rods 207 can be ensured through the insert rod assembly grooves 206 and the test insert rods 207 which are arranged in a matched mode, and internal resistance tests can be conveniently carried out on batteries with large sizes such as lead storage batteries through the arranged test insert rods 207, so that the variety of internal resistance types of the integrated chip test batteries can be improved;
the maintenance convenient structure 6 is arranged in the integrated chip assembly cabin 1, the maintenance convenient structure 6 comprises an assembly motor 601, a screw 602, a sliding block 603 and a limiting groove 604, the output end of the assembly motor 601 is connected with the screw 602, the outer side of the screw 602 is connected with the sliding block 603, meanwhile, the outer side of the sliding block 603 is provided with the limiting groove 604, the assembly motor 601 forms a telescopic structure with the sliding block 603 through the screw 602, the sliding block 603 forms a sliding structure with the integrated chip assembly cabin 1 through the limiting groove 604, the arranged maintenance convenient structure 6 can conveniently adjust the position of the test integrated chip 4, so that the convenience of replacement and maintenance after the damage of parts in the device can be conveniently improved, and the stability of the structure during the operation of the test integrated chip 4 can be ensured through the mutual matching and clamping between the sliding block 603 and the limiting groove 604;
one side of the maintenance convenient structure 6 is connected with a chip protection heat dissipation assembly structure 5, the test integrated chip 4 is assembled in the chip protection heat dissipation assembly structure 5, the chip protection heat dissipation assembly structure 5 comprises an assembly clamping plate 501, a clamping groove 502 and a connecting gasket 503, the clamping groove 502 is arranged in the assembly clamping plate 501, the connecting gasket 503 is arranged in the clamping groove 502, the assembly clamping plate 501 is mutually clamped with the test integrated chip 4 through the clamping groove 502, the lower end of the test integrated chip 4 is mutually attached to the connecting gasket 503, the gap between the lower end face of the test integrated chip 4 and the inner end face of the assembly clamping plate 501 is 0-5mm, the chip protection heat dissipation assembly structure 5 can conduct protection heat dissipation treatment on the test integrated chip 4, the set test integrated chip 4 is clamped and assembled in the clamping groove 502, so that the test integrated chip 4 is prevented from being damaged due to external collision, and meanwhile, a certain gap can be kept between the test integrated chip 4 and the assembly clamping plate 501 through the arranged connecting gasket 503, and the ventilation effect can be achieved through the gap;
the protection shielding structure 7 is arranged on the inner wall of the integrated chip assembly cabin 1, the protection shielding structure 7 comprises a shielding protection metal net 701 and a fixed compression bar 702, the fixed compression bar 702 is arranged on the outer side of the shielding protection metal net 701, the shielding protection metal net 701 is tightly attached to the inner wall of the integrated chip assembly cabin 1, a plurality of groups of the fixed compression bars 702 are arranged, the arrangement of the protection shielding structure 7 can play a role in electromagnetic protection, so that the influence of external electromagnetic transmission on the test of an integrated chip can be avoided, and the accuracy of the chip test can be improved;
one end of integrated chip assembly cabin 1 is provided with dismantles and maintains structure 8, dismantles and maintains structure 8 including connecting hinge 801, sealed apron 802, grafting head 803 and grafting groove 804, and one side of connecting hinge 801 is connected with sealed apron 802, and the interior terminal surface of sealed apron 802 is provided with grafting head 803, the symmetry position of connecting hinge 801 about the vertical central line of connecting hinge 801 is provided with grafting groove 804 simultaneously, constitute rotating-structure between sealed apron 802 and the integrated chip assembly cabin 1 through connecting hinge 801, and peg graft between grafting head 803 and the grafting groove 804, and the dismantlement that sets up maintains structure 8 can conveniently open the device, thereby can maintain the processing to the spare part of device inside, the practicality of the integrated chip of this kind of test battery internal resistance has been improved greatly.
Working principle: for such an integrated chip for testing internal resistance of a battery, the test of the whole device can be controlled and detected firstly through the set test integrated chip 4, the set integrated chip assembly cabin 1 can store the pair of test integrated chips 4, when the battery is tested, the test is performed in different modes according to the size of the battery, when the size of the battery is smaller, the battery is assembled in the battery assembly cabin 201, one end of the battery is connected to the first battery connecting contact 202, the user presses the pressing disc 204, the pressing disc 204 can drive the second battery connecting contact 203 to move downwards through the connecting shaft 205, the second battery connecting contact 203 can be connected with the other end of the battery, so that the battery can be connected with the test integrated chip 4 through the two connecting contacts and wires, so that the internal resistance test of the battery can be completed, and when the battery is tested into a large-size battery, the test plug 207 is taken out from the plug assembly groove 206, so that the internal resistance test of the battery with different sizes can be completed through the connection of the test plug 207 with the two ends of the large-size battery; the test integrated chip 4 can be assembled in the assembly clamping plate 501 through the clamping groove 502, so that the test integrated chip 4 can be protected, meanwhile, the connecting gaskets 503 can be assembled on the left side and the right side of the lower end face of the test integrated chip 4, the gap between the test integrated chip 4 and the inner end face of the assembly clamping plate 501 can be increased through the connecting gaskets 503, so that the heat dissipation effect on the test integrated chip 4 can be achieved through the existence of the gap, the ventilation holes 3 with hollow structures can enhance the air circulation inside the device, the running stability of the test integrated chip 4 is ensured, when the test integrated chip 4 needs to be overhauled and maintained, the assembly motor 601 is started, the assembly motor 601 can drive the screw 602 to rotate, the screw 602 can push the slide 603 to slide in the limiting groove 604 through threaded connection with the slide 603, so that the running stability of the device can be ensured, the shielding protection metal net 701 can be fixedly installed on the inner wall of the integrated chip assembly 1 through the fixing pressure rods 702, and the external electromagnetic influence on the test running can be avoided through the shielding of the shielding protection metal net 701; the sealing cover plate 802 is stirred, the sealing cover plate 802 can pull out the plug 803 from the plug groove 804, so that the sealing cover plate 802 can rotate through the connecting hinge 801 to open the integrated chip assembly cabin 1, and the maintenance and overhaul treatment of the parts inside the integrated chip assembly cabin 1 are facilitated.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides an integrated chip of test battery internal resistance, includes integrated chip assembly cabin (1), maintains convenient structure (6) and protection shielding structure (7), its characterized in that: one side of the integrated chip assembly cabin (1) is provided with a test battery assembly structure (2), and vent holes (3) are formed in two sides of the integrated chip assembly cabin (1), a maintenance convenient structure (6) is arranged in the integrated chip assembly cabin (1), one side of the maintenance convenient structure (6) is connected with a chip protection heat dissipation assembly structure (5), the inside of the chip protection heat dissipation assembly structure (5) is provided with a test integrated chip (4), a protection shielding structure (7) is arranged on the inner wall of the integrated chip assembly cabin (1), one end of the integrated chip assembly cabin (1) is provided with a disassembly maintenance structure (8), the test battery assembly structure (2) comprises a battery assembly cabin (201), a first battery connection contact (202), a second battery connection contact (203), a pressing disc (204), a connecting shaft (205), a plug rod assembly groove (206) and a test plug rod (207), the bottom end of the inside of the battery assembly cabin (201) is provided with a first battery connection contact (202), a second battery connection contact (203) is arranged above the first battery connection contact (202), the second battery connection contact (205) is connected with the pressing disc (203), the outer end face of the battery assembly cabin (201) is provided with a inserted rod assembly groove (206), and a test inserted rod (207) is arranged in the inserted rod assembly groove (206);
the connecting shaft (205) penetrates through the battery assembly cabin (201), a telescopic structure is formed between the second battery connecting contact (203) and the battery assembly cabin (201) through the pressing disc (204) and the connecting shaft (205), and the first battery connecting contact (202) and the second battery connecting contact (203) are mutually aligned up and down;
the two insert rod assembly grooves (206) and the two test insert rods (207) are respectively arranged, and the insert rod assembly grooves (206) and the test insert rods (207) are matched with each other.
2. The integrated chip for testing internal resistance of a battery according to claim 1, wherein: the chip protection heat dissipation assembly structure (5) comprises an assembly clamping plate (501), clamping grooves (502) and connecting gaskets (503), wherein the clamping grooves (502) are formed in the assembly clamping plate (501), and the connecting gaskets (503) are arranged in the clamping grooves (502).
3. An integrated chip for testing internal resistance of a battery as defined in claim 2, wherein: the assembly clamping plate (501) is clamped with the test integrated chip (4) through the clamping groove (502), the lower end of the test integrated chip (4) is mutually attached to the connecting gasket (503), and the gap range between the lower end face of the test integrated chip (4) and the inner end face of the assembly clamping plate (501) is 0-5mm.
4. The integrated chip for testing internal resistance of a battery according to claim 1, wherein: the convenient structure (6) of maintaining includes assembly motor (601), screw rod (602), slider (603) and spacing groove (604), and the output of assembly motor (601) is connected with screw rod (602) to the outside of screw rod (602) is connected with slider (603), and the outside of slider (603) is provided with spacing groove (604) simultaneously, constitute extending structure between assembly motor (601) and slider (603) through screw rod (602), and constitute sliding structure between slider (603) through spacing groove (604) and integrated chip assembly cabin (1).
5. The integrated chip for testing internal resistance of a battery according to claim 1, wherein: the protection shielding structure (7) comprises a shielding protection metal net (701) and a fixing pressing rod (702), the fixing pressing rod (702) is arranged on the outer side of the shielding protection metal net (701), the shielding protection metal net (701) is tightly attached to the inner wall of the integrated chip assembly cabin (1), and the fixing pressing rod (702) is provided with a plurality of groups.
6. The integrated chip for testing internal resistance of a battery according to claim 1, wherein: dismantle maintenance structure (8) including link hinge (801), sealed apron (802), grafting head (803) and grafting groove (804), and one side of link hinge (801) is connected with sealed apron (802) to the interior terminal surface of sealed apron (802) is provided with grafting head (803), and the symmetry position of link hinge (801) about the vertical central line of link hinge (801) is provided with grafting groove (804) simultaneously, constitute revolution mechanic between sealed apron (802) through link hinge (801) and integrated chip assembly cabin (1), and peg graft between grafting head (803) and grafting groove (804).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202011005948.8A CN112114261B (en) | 2020-09-23 | 2020-09-23 | Integrated chip for testing internal resistance of battery |
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| CN202011005948.8A CN112114261B (en) | 2020-09-23 | 2020-09-23 | Integrated chip for testing internal resistance of battery |
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| CN112114261B true CN112114261B (en) | 2024-03-01 |
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| CN205941696U (en) * | 2016-08-27 | 2017-02-08 | 浙江科畅电子有限公司 | Storage battery internal resistance test device |
| CN108663629A (en) * | 2018-04-08 | 2018-10-16 | 盈峰汽车科技（上海）有限公司 | A kind of multinomial test device of new-energy automobile aluminum alloy battery packet |
| CN209690471U (en) * | 2019-02-20 | 2019-11-26 | 深圳市思商科技有限公司 | A kind of dynamic lithium battery Life cycle detection device |
| CN210243744U (en) * | 2019-06-03 | 2020-04-03 | 广东科正技术服务有限公司 | New energy battery resistance detection device based on solar charging technology |
| CN210347878U (en) * | 2019-06-26 | 2020-04-17 | 湖北德普智能装备有限公司 | New forms of energy battery module internal resistance test first frock |
| CN210347712U (en) * | 2019-07-05 | 2020-04-17 | 常州市和普电子科技有限公司 | Four-wire insulation resistance rapid test tester |
| CN210347773U (en) * | 2019-07-05 | 2020-04-17 | 常州市和普电子科技有限公司 | Portable high-voltage battery internal resistance tester |
| CN210427760U (en) * | 2019-08-14 | 2020-04-28 | 山东锦自电气科技有限公司 | Contact type internal resistance battery inspection device |
| CN211179907U (en) * | 2019-09-11 | 2020-08-04 | 四川四美科技有限公司 | Automatic control device for battery cycle test |
| CN211236163U (en) * | 2019-11-08 | 2020-08-11 | 新乡市奇鑫电源材料有限责任公司 | Electric quantity detection device of ternary lithium ion battery |
| CN110794309A (en) * | 2019-11-21 | 2020-02-14 | 中国第一汽车股份有限公司 | Soft package battery single body testing device and testing method |
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