CN112114261A - Integrated chip for testing internal resistance of battery - Google Patents
Integrated chip for testing internal resistance of battery Download PDFInfo
- Publication number
- CN112114261A CN112114261A CN202011005948.8A CN202011005948A CN112114261A CN 112114261 A CN112114261 A CN 112114261A CN 202011005948 A CN202011005948 A CN 202011005948A CN 112114261 A CN112114261 A CN 112114261A
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- integrated chip
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- 238000012360 testing method Methods 0.000 title claims abstract description 115
- 230000017525 heat dissipation Effects 0.000 claims abstract description 21
- 238000012423 maintenance Methods 0.000 claims abstract description 20
- 239000002184 metal Substances 0.000 claims description 12
- 238000007789 sealing Methods 0.000 claims description 12
- 238000009434 installation Methods 0.000 abstract description 3
- 238000003780 insertion Methods 0.000 description 9
- 230000037431 insertion Effects 0.000 description 9
- 108010066057 cabin-1 Proteins 0.000 description 8
- 230000006835 compression Effects 0.000 description 8
- 238000007906 compression Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 3
- 238000009423 ventilation Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/385—Arrangements for measuring battery or accumulator variables
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/389—Measuring internal impedance, internal conductance or related variables
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0073—Shielding materials
- H05K9/0081—Electromagnetic shielding materials, e.g. EMI, RFI shielding
- H05K9/0086—Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising a single discontinuous metallic layer on an electrically insulating supporting structure, e.g. metal grid, perforated metal foil, film, aggregated flakes, sintering
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Thermal Sciences (AREA)
- Battery Mounting, Suspending (AREA)
Abstract
The invention discloses an integrated chip for testing internal resistance of a battery, which comprises an integrated chip assembly cabin, a maintenance convenient structure and a protection shielding structure, wherein the test battery assembly structure is arranged on one side of the integrated chip assembly cabin, vent holes are formed in both sides of the integrated chip assembly cabin, the maintenance convenient structure is arranged inside the integrated chip assembly cabin, one side of the maintenance convenient structure is connected with a chip protection heat dissipation assembly structure, the test integrated chip is assembled inside the chip protection heat dissipation assembly structure, and the protection shielding structure is arranged on the inner wall of the integrated chip assembly cabin. The invention can ensure the convenience of the installation and the use of the test inserted bar through the inserted bar assembling groove and the test inserted bar which are matched with each other, and can conveniently test the internal resistance of large-sized batteries such as lead storage batteries and the like through the arranged test inserted bar, thereby improving the diversity of the internal resistance types of the integrated chip test batteries.
Description
Technical Field
The invention relates to the technical field of a battery internal resistance testing chip, in particular to an integrated chip for testing battery internal resistance.
Background
Integrated chips are modern digital integrated chips that are mainly manufactured using CMOS processes. The static power consumption of the CMOS device is low, but in the case of high-speed switching, the CMOS device needs a power supply to provide instantaneous power, and the dynamic power requirement of the high-speed CMOS device exceeds that of the similar bipolar device. Decoupling capacitors must be added to these devices to meet instantaneous power requirements. Modern integrated chips have a variety of package configurations, and for discrete components, the shorter the pins, the less EMI issues. Because surface mount devices have smaller mounting areas and lower mounting locations and therefore better EMC performance, surface mount components should be preferred, even if the die is mounted directly on the PCB.
Generally, when the internal resistance of the battery is tested, the battery cannot be matched and tested due to different sizes and models of the battery, the test result is inaccurate due to external electromagnetic influence during testing, and meanwhile, when the integrated chip is used, the chip is inconvenient to protect, radiate and maintain, and therefore the integrated chip for testing the internal resistance of the battery with higher practicability is provided.
Disclosure of Invention
The invention aims to provide an integrated chip for testing internal resistance of a battery, which solves the problems that the internal resistance of the battery can not be matched and tested due to different sizes and types of the battery and the test result is inaccurate due to external electromagnetic influence during testing, and simultaneously has the inconvenience of chip protection, heat dissipation, maintenance and the like during use of the integrated chip.
In order to achieve the purpose, the invention provides the following technical scheme: the utility model provides an integrated chip of test battery internal resistance, includes integrated chip assembly cabin, maintains convenient structure and protection shielding structure, one side of integrated chip assembly cabin is provided with test battery assembly structure, and the both sides in integrated chip assembly cabin have all seted up the air vent, it sets up in the inside in integrated chip assembly cabin to maintain convenient structure, one side of maintaining convenient structure is connected with chip protection heat dissipation assembly structure, and the inside of chip protection heat dissipation assembly structure is equipped with the test integrated chip, protection shielding structure sets up in the inner wall in integrated chip assembly cabin, the one end in integrated chip assembly cabin is provided with dismantles and maintains the structure.
Preferably, the test battery assembly structure comprises a battery assembly cabin, a first battery connecting contact, a second battery connecting contact, a pressing plate, a connecting shaft, an inserting rod assembly groove and a test inserting rod, the bottom end inside the battery assembly cabin is provided with the first battery connecting contact, the second battery connecting contact is arranged above the first battery connecting contact, the upper end of the second battery connecting contact is connected with the connecting shaft, the upper end of the connecting shaft is connected with the pressing plate, the inserting rod assembly groove is formed in the end face of the outer side of the battery assembly cabin, and the test inserting rod is arranged inside the inserting rod assembly groove.
Preferably, the connecting shaft penetrates through the interior of the battery assembly cabin, the second battery connecting contact forms a telescopic structure with the battery assembly cabin through the pressing disc and the connecting shaft, and the first battery connecting contact and the second battery connecting contact are aligned up and down.
Preferably, inserted bar assembly groove and test inserted bar all are provided with two, and match each other between inserted bar assembly groove and the test inserted bar.
Preferably, the chip protection heat dissipation assembly structure comprises an assembly clamping plate, a clamping groove and a connecting gasket, wherein the clamping groove is formed in the assembly clamping plate, and the connecting gasket is arranged in the clamping groove.
Preferably, the assembly clamping plate is clamped with the test integrated chip through the clamping groove, the lower end of the test integrated chip is attached to the connecting gasket, and the range of the gap between the lower end face of the test integrated chip and the inner end face of the assembly clamping plate is 0-5 mm.
Preferably, maintain convenient structure including assembly motor, screw rod, slider and spacing groove, and the output of assembly motor is connected with the screw rod to the outside of screw rod is connected with the slider, and the outside of slider is provided with the spacing groove simultaneously, the assembly motor passes through to constitute extending structure between screw rod and the slider, and the slider passes through to constitute sliding structure between spacing groove and the integrated chip assembly cabin.
Preferably, the protection shielding structure comprises a shielding protection metal net and a fixing compression bar, the fixing compression bar is arranged on the outer side of the shielding protection metal net, the shielding protection metal net is tightly attached to the inner wall of the integrated chip assembly cabin, and the fixing compression bar is provided with multiple groups.
Preferably, the disassembling and maintaining structure comprises a connecting hinge, a sealing cover plate, a plug connector and a plug groove, one side of the connecting hinge is connected with the sealing cover plate, the plug connector is arranged on the inner end face of the sealing cover plate, the plug groove is arranged at the symmetrical position of the connecting hinge relative to the vertical central line of the connecting hinge, the sealing cover plate forms a rotating structure with the integrated chip assembly cabin through the connecting hinge, and the plug connector is plugged with the plug groove.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention can facilitate the convenience of the integrated chip for detecting and using the internal resistance of the battery through the arranged battery assembly structure, can improve the testing efficiency of the internal resistance of the battery through the direct assembly of the battery, and can assemble batteries with different sizes in the battery assembly cabin through the arranged battery assembly cabin, thereby improving the convenience of the battery test, ensuring the contact tightness during the battery test in a mode of manually pressing the pressing disc, and avoiding the problem of inaccurate test caused by unstable contact.
2. The invention can ensure the convenience of the installation and the use of the test inserted bar through the inserted bar assembling groove and the test inserted bar which are matched with each other, and can conveniently test the internal resistance of large-sized batteries such as lead storage batteries and the like through the arranged test inserted bar, thereby improving the diversity of the internal resistance types of the integrated chip test batteries.
3. The chip protection heat dissipation assembly structure can perform protection heat dissipation treatment on the test integrated chip, the set test integrated chip is clamped and assembled in the clamping groove, so that the test integrated chip can be prevented from being damaged due to external collision, and meanwhile, a certain gap can be kept between the test integrated chip and the assembly clamping plate through the set connecting gasket, so that the heat dissipation and ventilation effects can be achieved through the gap.
4. The maintenance convenient structure provided by the invention can conveniently adjust the position of the test integrated chip, so that the convenience of replacement and maintenance after the internal parts of the device are damaged can be conveniently improved, and the stability of the structure of the test integrated chip during working can be ensured through the mutually matched clamping between the sliding block and the limiting groove.
5. The protective shielding structure can play a role in electromagnetic protection, so that the influence of external electromagnetic transmission on the test of the integrated chip can be avoided, the accuracy of the chip test can be improved, and the device can be conveniently opened by the arranged disassembly and maintenance structure, so that the parts in the device can be maintained, and the practicability of the integrated chip for testing the internal resistance of the battery is greatly improved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the internal structure of the IC assembly chamber according to the present invention;
FIG. 3 is a schematic side view of the structure for facilitating maintenance according to the present invention;
FIG. 4 is a schematic view of the end face structure inside the assembly chamber of the integrated chip of the present invention;
FIG. 5 is a schematic view of a three-dimensional structure of a connection between a test IC and a chip protection heat dissipation assembly structure according to the present invention;
fig. 6 is a schematic view of the bottom-side expanded structure of the ic assembly chamber according to the present invention.
In the figure: 1. an integrated chip assembly cabin; 2. testing the battery assembly structure; 201. a battery assembly compartment; 202. a first battery connection contact; 203. a second battery connection contact; 204. pressing the disc; 205. a connecting shaft; 206. an insertion rod assembly groove; 207. testing the inserted rod; 3. a vent hole; 4. testing the integrated chip; 5. a chip protection heat dissipation assembly structure; 501. assembling a clamping plate; 502. a card slot; 503. connecting a gasket; 6. a convenient structure is maintained; 601. assembling a motor; 602. a screw; 603. a slider; 604. a limiting groove; 7. a protective shielding structure; 701. shielding a protective metal mesh; 702. fixing the compression bar; 8. disassembling the maintenance structure; 801. connecting a hinge; 802. sealing the cover plate; 803. a plug-in connector; 804. and (4) inserting grooves.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Referring to fig. 1-6, an integrated chip for testing internal resistance of a battery comprises an integrated chip assembly chamber 1, a maintenance convenient structure 6 and a protection shielding structure 7, wherein one side of the integrated chip assembly chamber 1 is provided with a battery assembly structure 2, and both sides of the integrated chip assembly chamber 1 are provided with vent holes 3, the battery assembly structure 2 comprises a battery assembly chamber 201, a first battery connecting contact 202, a second battery connecting contact 203, a pressing plate 204, a connecting shaft 205, a plunger assembly groove 206 and a test plunger 207, the bottom end inside the battery assembly chamber 201 is provided with the first battery connecting contact 202, the second battery connecting contact 203 is arranged above the first battery connecting contact 202, the upper end of the second battery connecting contact 203 is connected with the connecting shaft 205, the upper end of the connecting shaft 205 is connected with the pressing plate 204, the outer side surface of the battery assembly chamber 201 is provided with a plunger assembly groove 206, and a test inserted bar 207 is arranged inside the inserted bar assembly groove 206, a connecting shaft 205 penetrates inside the battery assembly compartment 201, and the second battery connecting contact 203 is formed in a telescopic structure with the battery mounting compartment 201 through the pressing plate 204 and the connecting shaft 205, and the first battery connecting contact 202 and the second battery connecting contact 203 are aligned with each other up and down, the integrated chip can be convenient for the detection and the use of the internal resistance of the battery through the arranged test battery assembly structure 2, the test efficiency of the internal resistance of the battery can be improved through the direct assembly of the test battery, and the batteries with different sizes can be assembled in the battery assembling cabin 201, so that the convenience of battery testing can be improved, and the contact tightness during the battery test can also be ensured by manually pressing the pressing disc 204, so that the problem of inaccurate test caused by unstable contact is avoided.
The two insertion rod assembly grooves 206 and the two test insertion rods 207 are arranged, the insertion rod assembly grooves 206 are matched with the test insertion rods 207, the convenience in installation and use of the test insertion rods 207 can be guaranteed through the insertion rod assembly grooves 206 and the test insertion rods 207 which are matched with each other, and internal resistance tests can be conveniently carried out on batteries with large sizes such as lead storage batteries through the arranged test insertion rods 207, so that the diversity of internal resistance types of the integrated chip test batteries can be improved;
the maintenance convenient structure 6 is arranged inside the integrated chip assembly cabin 1, the maintenance convenient structure 6 comprises an assembly motor 601, a screw 602, a sliding block 603 and a limiting groove 604, the output end of the assembly motor 601 is connected with the screw 602, the outer side of the screw 602 is connected with the sliding block 603, the limiting groove 604 is arranged on the outer side of the sliding block 603, the assembly motor 601 forms a telescopic structure through the screw 602 and the sliding block 603, the sliding block 603 forms a sliding structure through the limiting groove 604 and the integrated chip assembly cabin 1, the arranged maintenance convenient structure 6 can conveniently adjust the position of the tested integrated chip 4, so that the convenience of replacement and maintenance after internal parts of the device are damaged can be conveniently improved, and the stability of the structure of the tested integrated chip 4 during working can be ensured through the matched clamping between the sliding block 603 and the limiting groove 604;
one side of the maintenance convenient structure 6 is connected with a chip protection heat dissipation assembly structure 5, the interior of the chip protection heat dissipation assembly structure 5 is assembled with a test integrated chip 4, the chip protection heat dissipation assembly structure 5 comprises an assembly clamping plate 501, a clamping groove 502 and a connecting gasket 503, the interior of the assembly clamping plate 501 is provided with the clamping groove 502, the interior of the clamping groove 502 is provided with the connecting gasket 503, the assembly clamping plate 501 is clamped with the test integrated chip 4 through the clamping groove 502, the lower end of the test integrated chip 4 is mutually attached to the connecting gasket 503, the gap between the lower end surface of the test integrated chip 4 and the inner end surface of the assembly clamping plate 501 is 0-5mm, the chip protection heat dissipation assembly structure 5 can carry out protection heat dissipation treatment on the test integrated chip 4, the arranged test integrated chip 4 is clamped and assembled in the clamping groove 502, so that the test integrated chip 4 can be prevented from being damaged due to external, meanwhile, a certain gap can be kept between the test integrated chip 4 and the assembling clamping plate 501 through the arranged connecting gasket 503, so that the effects of heat dissipation and ventilation can be achieved through the gap;
the protection shielding structure 7 is arranged on the inner wall of the integrated chip assembly cabin 1, the protection shielding structure 7 comprises a shielding protection metal net 701 and fixing compression rods 702, the fixing compression rods 702 are arranged on the outer side of the shielding protection metal net 701, the shielding protection metal net 701 is tightly attached to the inner wall of the integrated chip assembly cabin 1, multiple groups of fixing compression rods 702 are arranged, the protection shielding structure 7 can play a role in electromagnetic protection, so that the influence of external electromagnetic transmission on the test of the integrated chip can be avoided, and the accuracy of the chip test can be improved;
the one end of integrated chip assembly cabin 1 is provided with dismantlement maintenance structure 8, dismantle maintenance structure 8 including connecting hinge 801, sealed apron 802, bayonet joint 803 and inserting groove 804, and one side of connecting hinge 801 is connected with sealed apron 802, and the interior terminal surface of sealed apron 802 is provided with bayonet joint 803, it is provided with inserting groove 804 to connect hinge 801 simultaneously about the symmetrical position of the vertical central line of connecting hinge 801, sealed apron 802 constitutes revolution mechanic through connecting between hinge 801 and the integrated chip assembly cabin 1, and be pegging graft between bayonet joint 803 and inserting groove 804, and the dismantlement maintenance structure 8 that sets up can conveniently open the device, thereby can maintain the processing to the inside spare part of device, the practicality of the integrated chip of this kind of test battery internal resistance has been improved greatly.
The working principle is as follows: for the integrated chip for testing the internal resistance of the battery, firstly, the test of the whole device can be controlled and detected through the arranged test integrated chip 4, the arranged integrated chip assembly cabin 1 can store the test integrated chip 4, when the battery is tested, different modes are used for testing according to the size of the battery, when the size of the battery is smaller, the battery is assembled in the battery assembly cabin 201, one end of the battery is connected to the first battery connecting contact 202, a user presses the pressing disc 204, the pressing disc 204 can drive the second battery connecting contact 203 to move downwards through the connecting shaft 205, the second battery connecting contact 203 can be connected with the other end of the battery, so that the battery can be connected with the test integrated chip 4 through the two connecting contacts and the conducting wires, and the internal resistance test of the battery can be completed, when the large-size battery is tested, the test inserted bar 207 is taken out from the inserted bar assembling groove 206, so that the test inserted bar 207 can be connected with two ends of the large-size battery, and the internal resistance test of the batteries with different sizes can be completed; the test integrated chip 4 can be assembled in the assembly clamping plate 501 through the clamping groove 502, so that the protection effect on the test integrated chip 4 can be achieved, meanwhile, the connecting gaskets 503 can be assembled on the left side and the right side of the lower end face of the test integrated chip 4, so that the gap between the test integrated chip 4 and the inner end face of the assembly clamping plate 501 can be increased through the connecting gaskets 503, so that the heat dissipation effect on the test integrated chip 4 can be achieved through the existence of the gap, the ventilation holes 3 with the hollow structures can enhance the air circulation inside the device, the running stability of the test integrated chip 4 is ensured, when the test integrated chip 4 needs to be overhauled and maintained, the assembly motor 601 is started, the assembly motor 601 is electrified to work and can drive the screw 602 to rotate, the screw 602 can push the sliding block 603 to slide in the limiting groove 604 through the threaded connection between the screw 602 and the sliding block, the shielding protection metal net 701 can be fixedly installed on the inner wall of the integrated chip assembly cabin 1 through the fixing compression rod 702, so that the shadow of external electromagnetism on test operation can be avoided through the shielding of the shielding protection metal net 701; the sealing cover plate 802 is pulled, the plug connector 803 can be pulled out from the plug groove 804 by the sealing cover plate 802, so that the integrated chip assembly chamber 1 can be opened by the sealing cover plate 802 through the rotation of the connecting hinge 801, and the maintenance and the overhaul of the parts in the integrated chip assembly chamber 1 are convenient.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (9)
1. The utility model provides an integrated chip of test battery internal resistance, includes integrated chip assembly cabin (1), maintains convenient structure (6) and protection shielding structure (7), its characterized in that: one side of integrated chip assembly cabin (1) is provided with test battery assembly structure (2), and air vent (3) have all been seted up to the both sides of integrated chip assembly cabin (1), maintain convenient structure (6) and set up in the inside of integrated chip assembly cabin (1), one side of maintaining convenient structure (6) is connected with chip protection heat dissipation assembly structure (5), and the inside of chip protection heat dissipation assembly structure (5) is equipped with test integrated chip (4), protection shielding structure (7) set up in the inner wall of integrated chip assembly cabin (1), the one end of integrated chip assembly cabin (1) is provided with dismantles and maintains structure (8).
2. The integrated chip for testing the internal resistance of the battery according to claim 1, wherein: the test battery assembly structure (2) comprises a battery assembly cabin (201), a first battery connecting contact (202), a second battery connecting contact (203), a pressing disc (204), a connecting shaft (205), an inserted bar assembly groove (206) and a test inserted bar (207), wherein the bottom end of the interior of the battery assembly cabin (201) is provided with the first battery connecting contact (202), the second battery connecting contact (203) is arranged above the first battery connecting contact (202), the upper end of the second battery connecting contact (203) is connected with the connecting shaft (205), the upper end of the connecting shaft (205) is connected with the pressing disc (204), the inserted bar assembly groove (206) is formed in the end face of the outer side of the battery assembly cabin (201), and the test inserted bar (207) is arranged in the inserted bar assembly groove (206).
3. The integrated chip for testing the internal resistance of the battery according to claim 2, wherein: the connecting shaft (205) penetrates through the interior of the battery assembly cabin (201), the second battery connecting contact (203) forms a telescopic structure with the battery assembly cabin (201) through the pressing plate (204) and the connecting shaft (205), and the first battery connecting contact (202) and the second battery connecting contact (203) are aligned up and down.
4. The integrated chip for testing the internal resistance of the battery according to claim 2, wherein: inserted bar assembly slot (206) and test inserted bar (207) all are provided with two, and match each other between inserted bar assembly slot (206) and the test inserted bar (207).
5. The integrated chip for testing the internal resistance of the battery according to claim 1, wherein: the chip protection heat dissipation assembly structure (5) comprises an assembly clamping plate (501), a clamping groove (502) and a connecting gasket (503), wherein the clamping groove (502) is arranged inside the assembly clamping plate (501), and the connecting gasket (503) is arranged inside the clamping groove (502).
6. The integrated chip for testing the internal resistance of the battery according to claim 5, wherein: the assembling clamping plate (501) is clamped with the test integrated chip (4) through the clamping groove (502), the lower end of the test integrated chip (4) is attached to the connecting gasket (503), and the range of a gap between the lower end face of the test integrated chip (4) and the inner end face of the assembling clamping plate (501) is 0-5 mm.
7. The integrated chip for testing the internal resistance of the battery according to claim 1, wherein: maintain convenient structure (6) including assembly motor (601), screw rod (602), slider (603) and spacing groove (604), and the output of assembly motor (601) is connected with screw rod (602) to the outside of screw rod (602) is connected with slider (603), and the outside of slider (603) is provided with spacing groove (604) simultaneously, constitute extending structure between assembly motor (601) through screw rod (602) and slider (603), and constitute sliding structure between slider (603) through spacing groove (604) and integrated chip assembly cabin (1).
8. The integrated chip for testing the internal resistance of the battery according to claim 1, wherein: the protection shielding structure (7) comprises a shielding protection metal net (701) and a fixing pressing rod (702), the fixing pressing rod (702) is arranged on the outer side of the shielding protection metal net (701), the shielding protection metal net (701) is tightly attached to the inner wall of the integrated chip assembly cabin (1), and multiple groups of fixing pressing rods (702) are arranged.
9. The integrated chip for testing the internal resistance of the battery according to claim 1, wherein: the disassembly maintenance structure (8) comprises a connecting hinge (801), a sealing cover plate (802), a plug connector (803) and a plug groove (804), one side of the connecting hinge (801) is connected with the sealing cover plate (802), the plug connector (803) is arranged on the inner end face of the sealing cover plate (802), the plug groove (804) is arranged at the symmetrical position of the connecting hinge (801) relative to the vertical center line of the connecting hinge (801), the sealing cover plate (802) forms a rotating structure with the integrated chip assembly cabin (1) through the connecting hinge (801), and the plug connector (803) and the plug groove (804) are plugged.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202011005948.8A CN112114261B (en) | 2020-09-23 | 2020-09-23 | Integrated chip for testing internal resistance of battery |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011005948.8A CN112114261B (en) | 2020-09-23 | 2020-09-23 | Integrated chip for testing internal resistance of battery |
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| CN112114261A true CN112114261A (en) | 2020-12-22 |
| CN112114261B CN112114261B (en) | 2024-03-01 |
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