CN112082584A - Optical fiber distributed physical quantity measuring method, device and system based on laser tuning control - Google Patents
Optical fiber distributed physical quantity measuring method, device and system based on laser tuning control Download PDFInfo
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- G01D5/35325—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using an interferometer arrangement using interferometer with two arms in reflection, e.g. Mickelson interferometer
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- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
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- G01D5/353—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
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Abstract
The application discloses an optical fiber distributed physical quantity measuring method based on laser tuning control, which is used for measuring physical quantity change of an object to be measured through an optical fiber sensor coupled to the object to be measured. The distributed feedback array laser is applied to the distributed physical quantity measuring device based on the optical frequency domain reflection technology, the method achieves the mode-hopping-free wavelength tuning range in a large range, and the spatial resolution and the measuring range of the distributed measuring method and the distributed measuring device are improved. The application also discloses a corresponding device and a corresponding system.
Description
Technical Field
The invention belongs to the technical field of optical fiber sensing, and particularly relates to a high-resolution distributed physical quantity measuring method, device and system.
Background
Distributed physical quantity measurement based on optical frequency domain reflection technology principle is a technical means which can realize the distributed measurement of physical quantity, and related early documents comprise:
Distributed measurement of static strain in an optical fiber with multiple Bragg gratings at nominally equal wavelengths[J].Applied Optics,1998,37(10):1741-1746.
High-spatial-resolution distributed strain measurement in optical fiber with Rayleigh scatter[J]. Applied Optics,1998,37(10):1735-1740.
a tunable laser is used as a system light source in a distributed physical quantity measuring system based on an optical frequency domain reflection principle, and the spatial resolution and the measuring range of the measuring system are limited by the modulation range of output signals of the tunable laser. The system spatial resolution is numerically inversely proportional to the modulation range of the output signal of the tunable laser, and the larger the tuning range, the higher the system spatial resolution. Meanwhile, the larger the tuning range is, the larger the measurement range of the effect of the change of the physical quantity of the measured object such as strain temperature is. Therefore, in order to improve the spatial resolution and the physical quantity measurement range of the system, the sweep frequency or tuning range of the tunable laser needs to be increased. In the prior art or device, an external cavity type tuned laser or a semiconductor laser is generally adopted as a light source, but the external cavity type tuned laser is expensive and mode hopping is easy to occur. The sweep frequency range of the semiconductor laser is only dozens of GHz (less than 1nm) generally, and the requirement of a distributed physical quantity measurement system on the spatial resolution cannot be met.
Distributed feedback array lasers (DFB array lasers) have recently been used in the field of optical Communications and have gained significant utility in optical transmission networks and optical interconnects, among other wavelength division multiplexing systems (ref. [1] Mary, flood, Liangsong, Wangbaojun, Zhan, Zhao lingjuan, Binghua, Chengming. DFB laser arrays are monolithically integrated with MMI couplers, SOA. optoelectronic. lasers, 2013,24(03):424 and 428. 2. Kobayashi, Go, et al. narrow line with tunable laser array, optical Fiber Communication conference. optical resource of America, 20143 Ni Y, Kong X, Gu X, P. packing and optical Fiber, 2014,312). Compared with the conventional distributed feedback laser, the distributed feedback array laser is generally structurally composed of a plurality of laser diodes spaced at a certain wavelength, a multimode interference coupler (MMI) and a Semiconductor Optical Amplifier (SOA). Due to the existence of a plurality of laser diodes, the distributed feedback array laser can realize the multiplexing of a plurality of channels.
Disclosure of Invention
The invention relates to a distributed feedback array laser applied to a distributed sensing system based on an optical frequency domain reflection technology, and discloses a high-resolution distributed physical quantity measuring method, device and system based on the distributed feedback array laser.
To achieve the object of the present application, the present application provides a fiber distributed physical quantity measuring method based on laser tuning control for measuring physical quantity variation of an object to be measured by a fiber sensor coupled to the object to be measured, the method comprising the steps of: providing main path interference light formed by interference of output power stabilized laser output of the output wavelength range of all of the selected laser diodes and reflected light of the measurement state laser output by the fiber optic sensor by changing the operating temperature of the selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser output having overlapping wavelength ranges; converting the interference light into a main path interference light signal; synchronously acquiring the main path interference optical signal and a measurement state laser output wavelength monitoring signal containing absolute wavelength information output by the reference state laser in a measurement state comprising the physical quantity change to obtain a measurement state main path interference optical signal and a measurement state laser output wavelength monitoring signal; determining splicing points in the collected main path interference optical signals in the measurement state according to absolute wavelength information provided by the monitoring signals of the laser output wavelength in the measurement state; removing the part except the splicing point in the wavelength overlapping region in the acquired main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and calculating the physical quantity change based on the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
Further embodiments of the present invention provide a fiber optic distributed physical quantity measuring apparatus based on laser tuning control for measuring a physical quantity change of an object to be measured by a fiber optic sensor coupled to the object to be measured, the apparatus including: a distributed feedback array laser configured to provide a laser output with stable output power that continuously covers the output wavelength range of all selected laser diodes by changing the operating temperature of selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser outputs with overlapping wavelength ranges, a wavelength monitoring unit configured to receive the laser output to provide a wavelength monitoring signal containing absolute wavelength information of the laser output; a main path interferometer unit configured to receive the laser output and reflected light of the optical fiber sensor and cause the two to interfere to form a main path interference optical signal; the acquisition unit is configured to synchronously acquire the main path interference optical signal and the wavelength monitoring signal in a measurement state including the physical quantity change to obtain a main path interference optical signal and a measurement state wavelength monitoring signal in the measurement state; the data processing unit is configured to determine splicing points in the acquired main path interference optical signal in the measurement state according to the received absolute wavelength information provided by the laser output signal in the measurement state; removing the part except the splicing point in the wavelength overlapping region in the collected main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and calculating the physical quantity change based on the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
The invention also provides an optical fiber distributed physical quantity measuring system based on the laser tuning control.
The invention has the beneficial effects that: the distributed feedback array laser is applied to the distributed physical quantity measuring device based on the optical frequency domain reflection technology, the large-range mode-hopping-free wavelength tuning range is realized, and the spatial resolution and the measuring range of the distributed measuring method and the distributed measuring device are improved. The method and the device have the advantages of simple control method and device, low cost, small volume and contribution to system integration.
Drawings
Fig. 1 is a schematic diagram of a distributed feedback array laser structure according to an embodiment of the present application;
FIG. 2 is a diagram of a fiber optic distributed physical quantity measurement device based on laser tuning control according to an embodiment of the present application;
FIG. 3 is an absorption spectrum of a hydrogen cyanide gas cell according to an embodiment of the present application;
FIG. 4 is a schematic illustration of a splice point determination according to an embodiment of the present application;
FIG. 5 is a FP etalon output signal according to embodiments of the present application;
FIG. 6 is a fiber optic interferometer output signal according to an embodiment of the present application;
FIG. 7 is a fiber ring resonator output signal according to an embodiment of the present application;
FIG. 8 is a schematic diagram of wavelength tuning ranges of individual laser diodes on a distributed feedback array laser under temperature tuning in accordance with an embodiment of the present application; wherein the content of the first and second substances,
in fig. 1: 33 is a multimode interference coupler, 35 is a thermoelectric cooler, 36 is a thermistor, 37 is a substrate, and 38 is a plurality of laser diodes spaced at certain wavelengths.
In fig. 2: 28 is a first laser diode pin, 29 is a second laser diode pin, 30 is a twelfth laser diode pin, 27 is an on-chip thermoelectric cooler pin, 1 is a main control module, 26 is a temperature control module, 25 is a high-speed electrical switch, 24 is a current driving module, 2 is a distributed feedback array laser, 3 is a first fiber coupler, 4 is a second fiber coupler, 12 is a third fiber coupler, 7 is a fourth fiber coupler, 23 is a delay fiber, 20 is a wavelength monitoring device, 21 is an auxiliary interferometer, 22 is a main path interferometer, 19 is an acquisition device, 18 is a first photodetector, 15 is a second photodetector, 10 is a third photodetector, 31 is a storage module, 32 is a data processing module, 13 is a first faraday rotator mirror, 14 is a second faraday rotator mirror, 6 is a sensing fiber, and 39 is an external acting tensile strain.
In fig. 4, 70 is the splicing position of the output signal of the main path interferometer in the previous section, 71 is the splicing position of the output signal of the main path interferometer in the next section, 72 is the output optical signal of the output signal of the main path interferometer in the previous section, 73 is the output optical signal in the next section, 74 is the signal of the air chamber in the previous section, 75 is the signal of the air chamber in the next section, and 77 is the output optical signal of the main path interferometer after interception and splicing.
In fig. 8, 55 is a wavelength tuning range of the first laser diode, 57 is a wavelength tuning range of the second laser diode, 58 is a wavelength tuning range of the third laser diode, 58 is a wavelength tuning range of the tenth laser diode, 59 is a wavelength tuning range of the eleventh laser diode, and 60 is a wavelength tuning range of the twelfth laser diode.
Detailed Description
Fig. 1 is a schematic diagram of a typical distributed feedback array laser structure. In general, the distributed feedback array laser is composed of a single integrated laser diode 38 with different wavelengths and a multimode interference coupler 33 for beam combination, and the distributed feedback array laser has a thermoelectric cooler 35 for heating or cooling that can be controlled by current and a thermistor 36 with resistance value varying with temperature on a substrate 37. For a D66 model distributed feedback array laser manufactured by FITEEL corporation of Japan, 12 laser diodes (https:// www.furukawa.co.jp/firm/english/active/pdf/signal/ODC-7 AH001H _ FRL15TCWx-D66-xx xxx-D.pdf) with a wavelength interval of 3.5nm are integrated on a single chip. The distributed feedback array laser output wavelength is responsive to both temperature and current. The usual usage is to achieve wavelength tuning by adjusting the temperature of the laser array using a thermo-electric cooler 35, and the response sensitivity of the laser output wavelength to current is low, so current is typically used for a small range of wavelength tuning or to control the output optical power. Without loss of generality, how to realize measurement is described below by using the distributed feedback array laser and its parameters as the light source of the high-speed and high-resolution distributed physical quantity measuring device.
In fig. 1: 33 is a multimode interference coupler, 35 is a thermoelectric cooler, 36 is a thermistor, 37 is a substrate, and 38 is a plurality of laser diodes spaced at certain wavelengths.
The invention relates to a distributed feedback array laser applied to a distributed sensing system based on an optical frequency domain reflection technology, and researches a high-resolution distributed physical quantity measuring method and device based on the distributed feedback array laser. The high-resolution distributed physical quantity measuring method and device provided by the patent use a distributed feedback array laser as a system light source. Each laser diode in the distributed feedback array laser can realize the requirement of the distributed physical quantity measuring system on the light source through temperature tuning and spectral multiplexing.
Fig. 2 is a schematic diagram illustrating a method and an apparatus for measuring high-resolution distributed physical quantities based on a distributed feedback array laser. The distributed feedback array laser 2 controls the high-speed electrical switch 25 to switch different laser diodes through the main control module 1, and sequentially connects the constant current generated by the current driving module to the anodes of the pins of the distributed feedback array laser 2, wherein the pins of the anodes are a first laser diode pin 28 and a second laser diode pin 29 in fig. 2, and the pins are up to a twelfth laser diode pin 30. At a constant current, the laser outputs laser light of a constant power. The master control module 1 controls the temperature control module 26 to control the thermo-electric cooler 35 on the distributed feedback array laser 2 to change the laser temperature. The laser output light wavelength changes with changes in the laser temperature. Typically, this tuning coefficient is a certain value, such as 0.1nm per degree celsius. In the process of changing the temperature from 15 degrees to 55 degrees, the variation of the output light wavelength is about 4 nm. And the inherent wavelength interval of the adjacent laser diodes on the model D66 distributed feedback array laser is 3.5 nm. Therefore, wavelength overlap of the sweep ranges of each laser diode can be achieved if the amount of wavelength that is changed by temperature tuning is greater than the inherent wavelength interval for each laser diode. Meanwhile, in the following embodiment, in order to achieve the maximum wavelength tuning range, all the laser diodes in the distributed feedback array laser 2 are wavelength-tuned by temperature. However, if only a portion of the laser diodes in the distributed feedback array laser 2 are wavelength tuned and the remaining portion discarded, it is also possible if the desired wavelength range is met. It is also defined that the output wavelength of the laser is increased with the increase of the temperature, and the output wavelength of the laser is increased with the increase of the serial number of the laser diode in the distributed feedback array laser.
The main control module 1 controls the current driving module 24 to generate a current signal with a constant magnitude, and simultaneously, the current signal is switched to the first laser diode through the high-speed electrical switch 25. The master control module 1 controls the temperature control module 26 to control 35 thermoelectric coolers on the distributed feedback array laser 2 to change the laser temperature. The temperature control module 26 may be a chip MAX 1978. Meanwhile, considering that the response speed of the output wavelength of the laser to the temperature change is low, the control signal of the temperature control module 26 can be directly a step signal, and experiments show that when the temperature control signal is a step current signal, the time required for the temperature to rise from 15 degrees to 55 degrees is about 0.5 second. The laser output wavelength increases monotonically with increasing temperature. The laser output by the laser enters the first optical fiber coupler 3, the laser is divided into three beams of output light at the first optical fiber coupler 3, and the three beams of output light respectively enter the wavelength monitoring device 20, the auxiliary interferometer 21 and the main path interferometer 22. The wavelength monitoring device 20 includes a hydrogen cyanide molecular gas chamber capable of outputting characteristic signals, the absorption spectrum of which is shown in fig. 4, and the light passing through the hydrogen cyanide molecular gas chamber is absorbed at a specific traceable wavelength position, detected by the first photodetector 18 and photoelectrically converted by an acquisition channel of the acquisition device 19 and transmitted to the storage module 31. The acquisition device 19 may be a multi-channel oscilloscope or an acquisition card. Meanwhile, a part of light is output to the auxiliary interferometer 21 through another output port c of the first optical fiber coupler 3, and the auxiliary interferometer 21 may be a michael grandson interferometer structure shown in fig. 2, and is composed of a third optical fiber coupler 12, a delay optical fiber 23, a first faraday rotator mirror 13, a second faraday rotator mirror 14, and a second photodetector 15. For the michael grand structure interferometer shown in this figure, the output signal of the interferometer during the laser tuning process is a sinusoidal signal, the period of which is related to the wavelength range swept and to the length of delay fiber 23. The longer the length of the delay fiber 23, the smaller the period of the sinusoid, and the smaller the wavelength range swept by each sinusoid. Meanwhile, the phase of the sinusoidal signal directly corresponds to the phase of the light source output signal, so that the interferometer can perform wavelength or phase tracking on laser output by the tuned laser and can be used for subsequent nonlinear correction. The sinusoidal signal output by the auxiliary interferometer 21 is collected by the collection device 19. The other output port d of the three-port optical fiber coupler 3 outputs light to the main path interferometer 22, the main path interferometer is also an optical path structure for completing measurement or sensing, fig. 2 shows an optical fiber interferometer with a mach-zehnder structure, the second optical fiber coupler 4 is divided into a reference arm and directly connected to the fourth optical fiber coupler 7, the other path is a measurement arm and outputs the light from the second optical fiber coupler 4 to the port a of the circulator 5, and the circulator 5 has characteristics of a input and a output and c input and b output. Thus, light from the a port of the circulator 5 enters the measurement sensing fiber 6, and a scattered or reflected signal on the measurement sensing fiber 6 returns to the circulator 5 and enters the b port of the circulator 5 and then enters the fourth fiber coupler 7. After the two beams are combined in the optical fiber coupler 7, the two beams are detected by the third photodetector 10 and collected by the collecting device 19. The three-way signal is collected by the collecting device 19 and then transmitted to the storage module 31 and further transmitted to the data processing module 32.
Next, the main control module 1 controls the high-speed electrical switch 25 to switch to the laser diode No. 2, and the main control module 1 controls the temperature control module 26 to control the thermoelectric cooler integrated on the distributed feedback array laser 2 to change the laser temperature. Other acquisition processes are as described in the previous paragraph. The three-way signal is collected by the collecting device 19 and then transmitted to the storage module 31 and further transmitted to the data processing module 32.
And by analogy, the wavelength tuning process of each laser diode selected on the distributed feedback array laser is finished and the data is recorded. It is assumed here that the output wavelength of the laser increases with increasing temperature. Meanwhile, the output wavelength of the laser is increased along with the increase of the serial number of the laser diode in the distributed feedback array laser. The data recorded is that of each laser diode passing through the sensing or measuring device module with its drive current constant and only tuned with the temperature tuned output. In order to obtain data in a wide wavelength range, the data tuned by each laser diode needs to be spliced, and the spliced data is used as the input of the distributed physical quantity demodulation, so that the distributed physical quantity result is obtained.
The principle of distributed physical quantity measurement or sensing based on the optical frequency domain reflection principle is that micrometer-scale space positioning is carried out by utilizing different beat frequency quantities corresponding to different positions on sensing or measuring optical fibers. Theoretically, the two points on the optical fiber have a spatial resolution Δ z ═ c/2n Δ F, where c is the speed of light in vacuum, n is the refractive index in the optical fiber, and Δ F is the range of light frequencies swept by the tunable laser. Therefore, in order to reduce the value of the spatial resolution of two points on the optical fiber, the tuning range should be expanded to improve the spatial resolution. Meanwhile, the variable quantity of the physical quantity is calculated through the offset of the spectrum by distributed physical quantity measurement or sensing based on the optical frequency domain reflection principle, so that the tuning range is larger, and the measuring range of the distributed physical quantity is larger.
In order to implement distributed demodulation of the physical quantity, it is necessary to record data in a reference state first and then record data in a measurement state, operations performed in the two processes are the same, the collected data are distinguished by the reference state and the measurement state, the collected reference state wavelength monitoring output signal, the collected reference state auxiliary interferometer output signal, the collected reference state main path interferometer output signal, and the collected measurement state wavelength monitoring output signal, the collected measurement state auxiliary interferometer output signal, and the collected measurement state main path interferometer output signal are stored in the storage module 31. The storage module 31 transmits the raw data to the data processing module 32, and the data processing module 32 completes operations such as nonlinear correction, splice point position determination, distributed physical quantity demodulation and the like. The results of the demodulation and the splice point positions can be stored in the storage module 31.
Since distributed physical quantity measurement or sensing based on the optical frequency domain reflection principle is relative measurement, it is first necessary to determine a reference state signal, which is collected in an external first state and stored in a computer memory, and a second external state, which is described below, represents a measurement state, with respect to which the sensing fiber may have the effect of a physical quantity change. A high resolution distributed physical quantity measurement or sensing process based on a distributed feedback array laser is described below.
in order to ensure that the wavelength tuning of the individual laser diodes by temperature tuning allows a wide range of gapless wavelength coverage and facilitates the subsequent determination of the position of the wavelength splice point, it should be ensured in the wavelength tuning that the starting wavelength of each laser diode at the temperature tuning is smaller than the ending wavelength of the laser diode adjacent to the laser diode with the larger intrinsic wavelength value at the temperature tuning so that the output signals of the laser diodes with adjacent wavelengths partially overlap in spectrum. For a distributed feedback array laser model D66 from the japanese FITEL corporation, 12 laser diodes were tuned sequentially with temperature, the wavelength tuning range experienced by each laser diode is shown in fig. 8, and the wavelength range illustration of the first three and the last three laser diodes is omitted in fig. 8. It can be seen that the entire wavelength band is covered without gaps due to the discrete and inherent spacing of the laser diodes themselves in the laser array over the wavelength, and the tuning of the large wavelength range of the individual laser diodes by varying the temperature.
And 2, repeating the step 1 in a second external state, wherein the recorded measurement state signals output by the distributed physical quantity measuring device under the wavelength tuning of each laser diode comprise: measuring state wavelength monitoring output signals, measuring state auxiliary interferometers output signals and measuring state main path interferometers output signals;
In addition, under the condition that the contents and sequence of the 1 st step and the 2 nd step are not changed, the 3 rd step and the 4 th step can be adjusted to be as follows: step 3, carrying out nonlinear correction on the output signal of the reference state main path interferometer and the reference state wavelength monitoring output signal by using the output signal of the reference state auxiliary interferometer, carrying out nonlinear correction on the output signal of the measurement state main path interferometer and the measurement state wavelength monitoring output signal by using the output signal of the measurement state auxiliary interferometer to obtain a corrected reference state wavelength monitoring output signal, a corrected measurement state wavelength monitoring output signal, a corrected reference state wavelength monitoring output signal and a corrected measurement state wavelength monitoring output signal; and 4, determining the reference state wavelength overlapping position and the measurement state wavelength overlapping position output by each laser diode according to the corrected reference state wavelength monitoring output signal and the corrected measurement state wavelength monitoring output signal, respectively outputting signals to the reference state main path interferometer according to the positions, and performing signal interception and splicing on the corrected measurement state main path interferometer output signal to obtain a final reference state main path interferometer output signal and a final measurement state main path interferometer output signal. This final reference state main path interferometer output signal and the final measurement state main path interferometer output signal will be used to participate in the demodulation of the distributed sensing information.
Since the wavelength tuning of the laser due to temperature tuning is non-linear, i.e. the output optical frequency does not increase linearly with time, if each output signal is sampled at a fixed sampling rate, the sampling points are not equidistant from the optical frequency, which deteriorates the spatial resolution of the sensing or measuring system. The above method for performing nonlinear correction on the output signal of the main path interferometer in the measurement state and the output signal of the wavelength monitoring in the measurement state by using the output signal of the auxiliary interferometer has several different implementation manners: the auxiliary interferometer signal may be acquired by the acquisition device 19 with a fixed sampling rate in synchronization with the other path signals, and then the data processing module may perform nonlinear correction on the main path interferometer output signal or the wavelength monitoring output signal. The method comprises the steps of performing Hilbert expansion on an output signal of the auxiliary interferometer, performing phase deconvolution, then equally dividing the phase, for example, equally dividing according to pi radian to obtain corresponding sampling points, then resampling the output signal of the main path interferometer and the wavelength monitoring output signal by using the sampling points, wherein the resampled output signal of the main path interferometer and the wavelength monitoring output signal are signals with nonlinear correction. In addition, the method also has the realization forms of non-uniform Fourier transform, a deskew filter, PNC phase compensation and the like which use a post software processing mode to correct nonlinearity. In addition, the sinusoidal signal output by the auxiliary interferometer may be used as the clock of the acquisition device 19, and the clock may be used as the acquisition clock of the output signal of the main path interferometer and the output signal of the wavelength monitoring device to acquire the two paths. In view of the existing prior art, this part will not be described in detail. The relevant literature can be found (1. Zhang, several methods for improving OFDR performance were proposed and verified, 2013, Tianjin university. 2.Fan, X., Y. Koshikiya and F. Ito, Phase-noise-compensated Optical Frequency dependent coherent Optical Frequency measurement method. optics guides, 2007.32(22): p.32273. Swart-wave interference for Distributed Sensing Applications 4. Sound, et al, Long-Range High spectral Resolution test and analysis method, J.P. J.
The sensing fibers 6 may be ordinary single mode fibers, or sensing fibers of a written weakly reflecting fiber grating array with equal center wavelength (Use of 3000Bragg grating sensors distributed on four optical fiber grating structures), or Rayleigh scattering enhanced sensing fibers (Loanger, S., et al, Rayleigh scattering based order of magnetic in distributed temperature and strain sensing by simple UV exposure of optical fiber, scientific Reports,2015.5: p.11177), etc.
If the sensing fiber is composed of a weak reflection fiber grating array with equi-center wavelengths at equal intervals, the distributed physical quantity resolving process in the step 5 is as follows: the resolving includes: the method comprises the steps of respectively carrying out fast Fourier transform on a spliced reference state main path interference optical signal and a spliced measurement state main path interference optical signal to obtain distance domain signals of the spliced reference state main path interference optical signal and the spliced measurement state main path interference optical signal, selecting parts corresponding to all fiber gratings in the distance domain signals by using a window function, respectively converting the selected parts into optical frequency domains by using inverse Fourier transform, and respectively obtaining a reference state signal of each fiber grating and a grating spectrum signal under the measurement state signal; carrying out envelope detection on the grating spectrum signals of the reference state signal and the measurement state signal and finding out the position of a peak value, wherein the difference value of the peak value positions of the grating spectrum signals of the reference state signal and the measurement state signal of each fiber grating represents the physical quantity of the object to be measured on the grating at the position; if the sensing fiber is a fiber with Rayleigh scattering, the spectral shift can be obtained by cross-correlation because there is no signal with randomly distributed optical frequency domain and no single peak (refer to Cui J, Zhao S, Yang D, et al. investment of the interaction method to the distributed and structured spectrum reflection systems [ J ]. Applied optics,2018,57 (6):1424 1431.). In addition, other known well-established methods can be used to perform offset calculations on the spectral signal with peaks, such as the maximum method, the energy centroid method, etc., and are described in the relevant literature (Tosi, D., Review and Analysis of Peak Tracking technologies for Fiber Bragg Grating Sensors,2017.17(10): p.2368).
Whether cross-correlation or peak detection is used in the solution of the distributed physical quantity, the directly obtained result is the offset of the spectrum, and the offset of the spectrum is the response function of the distributed physical quantity. Fig. 2 represents the measured physical quantity, i.e. the distributed strain, only by the tension 39. The distributed physical quantity may be strain, or temperature, or other physical quantity that may cause a strain or temperature change in the optical fiber. These physical quantities and spectral offsets typically differ by a factor (sensitivity) or, for greater accuracy, by a polynomial function, or may be obtained by calibration experiments (see Cui J, Zhao S, Yang D, et al. investment of the iterative method to estimate the distributed structure parameter system [ J ]. Applied optics,2018,57(6): 1424-) 1431.).
In order to determine a splicing position in the wavelength overlapping region so as to intercept and splice the output signals of the auxiliary interferometer and the main path interferometer to obtain a continuous output signal without overlapping, the wavelength of the laser diode tuning process under each temperature tuning section needs to be monitored or traced. The process of determining the splicing position of the output optical signals of the output signals of the auxiliary interferometer and the main path interferometer by using the laser wavelength monitoring device is described below.
The laser wavelength monitoring device 17 may itself be a device that directly measures wavelength, such as a spectrometer or a wavemeter, or may be a gas molecule gas cell that can characterize wavelength characteristics or changes, a fiber grating with a known center wavelength, or a fiber optic interferometer or a etalon of fabry perot structure. For a spectrometer or a wavelength meter, the reading is the laser wavelength, and at this time, only any point in the overlapping region needs to be selected, and preferably, a point in the middle of the overlapping region can be selected as the splicing position.
The following describes the process of determining the position of the splicing point, and intercepting and splicing the output signals of two adjacent main path interferometers by using a hydrogen cyanide gas chamber as a laser wavelength monitoring device with reference to fig. 4. As shown in fig. 4, which is a characteristic line of the hydrogen cyanide molecular gas cell, in the wavelength tuning of the input optical signal, the transmitted light of the hydrogen cyanide molecular gas cell has the absorption line of fig. 4, which is used as a wavelength reference of the C-band. In fig. 4, 72 and 73 are output signals of the main path interferometer of a certain pair of adjacent two segments, and 74 and 75 are output signals of the wavelength monitoring device (here, transmission signals of the hydrogen cyanide chamber) which are synchronously collected. For the hydrogen cyanide cell transmission signal, the signal 74 from the previous segment passing through the cell is at the wavelength position λk-1And λkWhere there is an absorption peak and the latter signal 75 passing through the gas cell is at the wavelength position λkAnd λk+1There is an absorption peak. Thus can beBy λkAs splice wavelength locations. The sampling point positions of the output signal of the main path interferometer in the previous section and the output signal of the main path interferometer in the next section corresponding to the position are 70 and 71 respectively. The data behind the sampling point 70 is discarded for the previous segment main path interferometer output signal 72, and the data in front of the sampling point 71 is discarded for the next segment main path interferometer output signal 73. The newly obtained output signals of the two adjacent main path interferometers are sequentially spliced to obtain a new output signal 77 of the main path interferometer. Similar processing is carried out on a full-wave band (12 laser diodes can be used for a D66 model distributed feedback array laser of the Nissan FITIEL company), and a full-wave band continuous laser output signal can be obtained. Splicing here means that the individual wavelength bands are rearranged in wavelength order into a continuous output optical signal.
The laser wavelength monitoring device can also be an FP standard or an optical fiber interferometer or an optical fiber ring resonator, and the optical fiber interferometer can be a typical Mach-Zehnder interferometer or a Michelson interferometer. Fig. 7 shows the signal of the tuned optical signal passing through the FP etalon, and for the high coherence FP etalon, the output signal has a sharp comb-like periodic signal, whose optical frequency spacing is the free spectral range of the FP etalon, which is related to the cavity length and the refractive index. The output signal may be used as a wavelength reference (Deng, Z., et al., Frequency-scanning interferometry for depth-mapping using the Fabry-Perot cavity as a reference with compensation for nonlinear optical Frequency scanning optics, 2020.455: p. 124556.). FIG. 8 is a graph of the signal of a tuned optical signal passing through a fiber optic interferometer, the period of the sinusoidal signal being related to the optical path length difference between the two arms of the interferometer. The period of the sinusoid signal determines the free spectral range of the interferometer, i.e. the optical frequency separation represented by each sinusoid. The phase change of the optical signal can be obtained by expanding the signal Hilbert, so the output signal can also be used as a signal for wavelength tracking (Ahn, T.and D.Y.Kim, Analysis of nonlinear frequency sweep in high-speed tunable laser sources using a self-mode measurement and Hilbert transformation.2007.46(13): p.2394.). The typical Fiber ring Resonator output signal has a similar signal to that of the FP etalon output, has a sharp peak signal, and its free spectral range is related to the internal Fiber length (Gao, W., et al., Angular Random Walk Improvement of the reactor Fiber optical by optimization Modulation frequency. IEEE Photonics Journal, 2019.11 (4): p.1-13.). By utilizing the FP standard, the output signal of the optical fiber interferometer or the optical fiber ring resonator is often matched with absolute wavelength reference to track the optical frequency of wavelength traceable sources, so as to determine the wavelength splicing position of the tuning superposition area.
It can be seen that the present invention utilizes the basic and wavelength tuning characteristics of monolithic integration of multiple laser diodes of distributed feedback array lasers, and utilizes temperature to realize the wavelength tuning of each laser, and the current-temperature alternative modulation method realizes the full-coverage continuous wavelength tuning of the whole band on the monolithic distributed feedback array laser. Compared with other semiconductor lasers such as a single distributed feedback laser, the frequency sweeping range of the light source of the distributed physical quantity measuring or sensing system is effectively expanded, the spatial resolution capability of the system is further improved, and the physical quantity measuring range is improved. Meanwhile, compared with the wavelength tuning performed by current, the wavelength range which can be tuned by temperature tuning is larger, and within the safe temperature of the laser, each laser diode in the distributed feedback array laser can realize a larger frequency sweeping range which can be overlapped with the wavelength of the adjacent laser diode, so that a plurality of wave bands are free of blank to form integral laser output with large-range wavelength tuning.
In this application, the main path interference optical signal refers to a signal provided by a main path interferometer unit or other units having the same or substantially the same function; the auxiliary interference optical signal refers to a signal provided by a secondary interferometer unit or other unit having the same or substantially the same function; the laser output wavelength monitoring signal or simply the wavelength monitoring signal refers to a signal provided by a laser wavelength monitoring unit or other units having the same or substantially the same function.
The above description is only a preferred embodiment of the present invention, and these embodiments are based on different implementations of the present invention, and the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
The method, the device and the system disclosed by the invention can be further realized by the following specific examples:
1. optical fiber distributed physical quantity measuring method based on laser tuning control and used for optical fiber transmission coupled with object to be measured
The sensor measures the physical quantity change of an object to be measured, and is characterized in that the method comprises the following steps:
providing main path interference light formed by interference of output power stabilized laser output of the output wavelength range of all of the selected laser diodes and reflected light of the measurement state laser output by the fiber optic sensor by changing the operating temperature of the selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser output having overlapping wavelength ranges;
converting the interference light into a main path interference light signal;
synchronously acquiring the main path interference optical signal and a measurement state laser output wavelength monitoring signal containing absolute wavelength information output by the reference state laser in a measurement state comprising the physical quantity change to obtain a measurement state main path interference optical signal and a measurement state laser output wavelength monitoring signal;
determining splicing points in the collected main path interference optical signals in the measurement state according to absolute wavelength information provided by the monitoring signals of the laser output wavelength in the measurement state;
removing the part except the splicing point in the wavelength overlapping region in the acquired main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and
and calculating the physical quantity change based on the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
2. The method of example 1, wherein: the spliced reference state main path interference optical signal is a pre-stored signal or is obtained by the following method:
synchronously acquiring the main path interference optical signal and a reference state laser output wavelength monitoring signal containing absolute wavelength information output by the reference state laser under a reference state without the physical quantity change to obtain a reference state main path interference optical signal and a reference state laser output wavelength monitoring signal;
determining splicing points in the collected reference state main path interference optical signals according to absolute wavelength information provided by the reference state laser output wavelength monitoring signals;
and removing the part except the splicing point in the wavelength overlapping region in the acquired reference state main path interference optical signal to form a spliced reference state main path interference optical signal.
3. The method of example 1, wherein: also comprises
Providing reference state assist interference light of the laser output of the distributed feedback array laser in the reference state; converting the reference state auxiliary interference light into a reference state auxiliary interference light signal; synchronously acquiring the reference state main path interference optical signal, wherein the reference state laser outputs a wavelength monitoring signal and a reference state auxiliary interference optical signal; carrying out nonlinear correction on the acquired reference state main path interference optical signal by using the acquired reference state auxiliary interference optical signal; and
providing measurement state-assisted interference light of the laser output of the distributed feedback array laser in the measurement state; converting the measurement state auxiliary interference light into a measurement state auxiliary interference light signal; synchronously acquiring the main path interference optical signal in the measurement state, and outputting a wavelength monitoring signal and an auxiliary interference optical signal in the measurement state by the laser in the measurement state; and carrying out nonlinear correction on the acquired main path interference optical signal in the measurement state by using the acquired auxiliary interference optical signal in the measurement state.
4. The method of example 1, wherein: also comprises
Providing reference state assist interference light of the laser output of the distributed feedback array laser in the reference state; converting the reference state auxiliary interference light into a reference state auxiliary interference light signal; synchronously acquiring the reference state main path interference optical signal, wherein the reference state laser outputs a wavelength monitoring signal and a reference state auxiliary interference optical signal; splicing the reference state auxiliary interference optical signal based on absolute wavelength information provided by the acquired reference laser output wavelength monitoring signal, and performing nonlinear correction on the spliced reference state main path interference optical signal by using the spliced reference state auxiliary interference optical signal; and
providing measurement state-assisted interference light of the laser output of the distributed feedback array laser in the measurement state; converting the measurement state auxiliary interference light into a measurement state auxiliary interference light signal; synchronously collecting the main path interference optical signal in the measurement state, and outputting a wavelength monitoring signal and a measurement state auxiliary interference optical signal by the laser; splicing the measurement state auxiliary interference optical signal based on absolute wavelength information provided by the collected measurement state laser output wavelength monitoring signal, and carrying out nonlinear correction on the spliced measurement state main path interference optical signal by using the spliced measurement state auxiliary interference optical signal.
5. The method of any of the above examples, wherein: said non-linear correction comprises estimating a phase of said laser output monitor signal from said auxiliary interference optical signal and thereby non-linearly correcting, e.g. resampling, said collected interferometer signal and said collected laser output wavelength monitor signal; alternatively, an auxiliary interferometer is used in combination with an electro-optic phase-locked loop to achieve non-linear correction.
6. The method of any of the above examples, wherein: the non-linear correction is used to obtain an output signal at equal optical frequency intervals.
7. The method of any of the above examples, wherein: also comprises
Providing reference state assist interference light of the laser output of the distributed feedback array laser in a reference state that does not include the physical quantity change; converting the reference state auxiliary interference light into a reference state auxiliary interference light signal; collecting the reference state auxiliary interference optical signal; and using the reference state auxiliary interference light as a clock for synchronously acquiring the reference state main path interference light signal and the laser output wavelength monitoring signal; and
providing measurement state auxiliary interference light comprising the laser output of the distributed feedback array laser in a measurement state of the physical quantity change; converting the measurement state auxiliary interference light into a measurement state auxiliary interference light signal; collecting the measurement state auxiliary interference optical signal; and using the measurement state auxiliary interference optical signal as a clock for synchronously acquiring the measurement state main path interference optical signal and the laser output wavelength monitoring signal.
8. The method of any of the above examples, wherein: changing the operating temperature of the distributed laser includes causing the starting wavelength of each selected laser diode tuned at the operating temperature to be less than the ending wavelength of the laser diode with the larger wavelength value adjacent to that laser diode tuned at the operating temperature such that the output lasers of adjacent wavelength laser diodes partially overlap spectrally.
9. The method according to any of the above examples, characterized by: providing a constant drive current control signal to all laser diodes in the distributed feedback array laser.
10. The method according to any of the above examples, characterized by: the calculating the physical quantity change comprises performing fast fourier transform on the spliced reference state main path interference optical signal and the spliced measurement state main path interference optical signal respectively to obtain distance domain signals of the spliced reference state main path interference optical signal and the spliced measurement state main path interference optical signal, selecting a space sensing unit by using the same position of a moving window on a distance domain for the distance domain signals of the spliced reference state main path interference optical signal and the spliced measurement state main path interference optical signal respectively, and performing inverse fourier transform on the space sensing unit signals selected by the moving window to obtain reference state rayleigh scattering spectrum signals and measurement state rayleigh scattering spectrum signals corresponding to the space sensing units corresponding to the moving window; performing cross-correlation operation on the two to obtain the position of the maximum value of the cross-correlation operation result, wherein the position of the maximum value corresponds to the measured physical quantity change on the space sensing unit at the position; and selecting the space sensing units at different positions on the distance domain by sliding the moving window on the distance domain signal so as to obtain the physical quantity change at different positions on the optical fiber.
11. The method according to any of the above examples, characterized by: the wavelength of the output laser of the laser diode in the distributed feedback array laser increases along with the increase of the applied working temperature.
12. The method according to any of the above examples, characterized by: for the case of a weakly reflecting fiber grating array with an isocentric wavelength as the fiber sensor; the resolving the physical quantity variation includes: fast Fourier transform is respectively carried out on the spliced reference state main path interference optical signal and the spliced measurement state main path interference optical signal to obtain distance domain signals of the spliced reference state main path interference optical signal and the spliced measurement state main path interference optical signal, a window function is used for selecting a part corresponding to each fiber grating in the distance domain signals, the selected part is converted into an optical frequency domain by respectively utilizing inverse Fourier transform, and grating spectrum signals under the reference state signals and the measurement state signals of each fiber grating are respectively obtained; and carrying out envelope detection on the grating spectrum signals of the reference state signal and the measurement state signal and finding out the position of a peak value, wherein the difference value of the peak value positions of the grating spectrum signals of the reference state signal and the measurement state signal of each fiber grating represents the physical quantity of the object to be measured on the grating at the position.
13. The method according to any of the above examples, characterized by: the physical quantity includes strain or temperature, or other physical quantity that causes strain or temperature change of the optical fiber sensor.
14. An optical fiber distributed physical quantity measuring device based on laser tuning control, which is used for measuring the physical quantity change of an object to be measured through an optical fiber sensor coupled to the object to be measured, and is characterized in that the device comprises:
a distributed feedback array laser configured to provide a stabilized laser output of output power that continuously covers the output wavelength range of all selected laser diodes by varying the operating temperature of selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser outputs having overlapping wavelength ranges,
a wavelength monitoring unit configured to receive the laser output to provide a wavelength monitoring signal containing absolute wavelength information of the laser output;
a main path interferometer unit configured to receive the laser output and reflected light of the optical fiber sensor and cause the two to interfere to form a main path interference optical signal;
the acquisition unit is configured to synchronously acquire the main path interference optical signal and the wavelength monitoring signal in a measurement state including the physical quantity change to obtain a main path interference optical signal and a measurement state wavelength monitoring signal in the measurement state;
a data processing unit configured to
Determining splicing points in the acquired main path interference optical signal in the measurement state according to the received absolute wavelength information provided by the laser output signal in the measurement state; removing the part except the splicing point in the wavelength overlapping region in the collected main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and
and calculating the physical quantity change based on the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
15. The apparatus of example 14, wherein: the corresponding spliced reference state main path interference optical signal is pre-stored or obtained in real time in the following mode:
the acquisition unit is configured to synchronously acquire the main-state interference optical signal and the wavelength monitoring signal in the reference state to form a reference-state main-state interference optical signal and a reference-state wavelength monitoring signal;
the data processing unit is configured to determine a splicing point in the acquired reference state main path interference optical signal according to absolute wavelength information provided by the received reference state laser output signal; and removing the part except the splicing point in the wavelength overlapping region in the collected reference state main path interference optical signal to form a spliced reference state main path interference optical signal.
16. The apparatus of any of the above examples, wherein: the device also comprises a storage unit which is used for storing the signal splicing position obtained by the data processing unit, storing the distributed physical quantity resolving result or directly storing the original acquisition signal so as to facilitate later off-line processing.
17. The apparatus of any of the above examples, wherein: the optical fiber sensor is configured on the measuring arm of the main path interferometer unit and is a common single mode optical fiber, or an optical fiber with a writing of a weak reflection optical fiber grating array with an isocentric wavelength, or an optical fiber with enhanced Rayleigh scattering.
18. The apparatus of any of the above examples, wherein: the distributed feedback array laser is configured to: the starting wavelength of each selected laser diode tuned at the operating temperature is less than the ending wavelength of the laser diode with the larger wavelength value adjacent to the laser diode tuned at the operating temperature such that the output signals of the adjacent wavelength laser diodes partially overlap spectrally.
19. The apparatus of any of the above examples, wherein: also included is a temperature control unit configured to provide an operating temperature control signal to the distributed feedback array laser to cause the selected laser diode to output the reference state laser output and the measurement state laser output.
20. The apparatus of any of the above examples, wherein: the laser driver further comprises a drive current control unit configured to provide a constant drive current control signal to the laser diodes in the distributed feedback array laser such that each laser diode operates at a constant drive current.
21. The apparatus of any of the above examples, wherein: the method also comprises a laser diode selection unit: configured to switch a laser diode providing a laser output among the selected laser diodes.
22. The apparatus of any of the above examples, wherein: the selected unit of the laser diode is an electrical switch.
23. The apparatus of any of the above examples, wherein: further comprising an auxiliary interferometer unit configured to generate a reference state auxiliary interference light signal based on the received reference state laser output and a measurement state auxiliary interference light signal based on the received measurement state laser output.
24. The apparatus of any of the above examples, wherein: the acquisition unit is configured to acquire the reference state auxiliary interference optical signal and the measurement state auxiliary interference optical signal and acquire the reference state auxiliary interference optical signal and the measurement state auxiliary interference optical signal as an acquisition clock to synchronously acquire the reference state interference light, the measurement state main path interference optical signal, the reference state laser output monitoring signal and the measurement state laser output monitoring signal.
25. The apparatus of any of the above examples, wherein: synchronously acquiring the reference state main path interference optical signal, the reference state auxiliary interference optical signal and the reference state laser output signal; estimating the phase of the collected reference state laser output monitoring signal according to the collected reference state auxiliary interference optical signal, and thereby carrying out nonlinear correction on the collected reference state main path interference optical signal and the reference state laser output monitoring signal so that the reference state main path interference optical signal and the reference state laser output monitoring signal have equal optical frequency intervals; and
synchronously acquiring the main path interference optical signal in the measurement state, the auxiliary interference optical signal in the measurement state and the laser output monitoring signal in the measurement state; estimating the phase of the collected measurement state laser output monitoring signal according to the collected measurement state auxiliary interference optical signal, and thereby performing nonlinear correction on the collected measurement state interference optical signal and the measurement state laser output monitoring signal so that the measurement state main path interference optical signal and the measurement state laser output monitoring signal have equal optical frequency intervals.
26. The apparatus of any of the above examples, wherein: the non-linear correction includes resampling.
27. The apparatus of any of the above examples, wherein: and the auxiliary interferometer is adopted and combined with a photoelectric phase-locked loop to realize the nonlinear correction of the main path interferometer and the laser output in the reference state and the measurement state.
28. The apparatus of any of the above examples, wherein: the main path interferometer unit includes a fiber interferometer having a Mach-Zehnder structure or a Michael grandchild structure.
29. The apparatus of any of the above examples, wherein: the auxiliary path interferometer unit comprises an optical fiber interferometer with a Mach-Zehnder structure or a Michael grandson structure.
30. The apparatus of any of the above examples, wherein: the wavelength monitoring unit comprises a gas chamber for outputting characteristic signals or a fiber grating with known central wavelength, or a spectrometer or a wavelength meter capable of directly obtaining wavelength, or a fiber interferometer or an FP standard or an optical resonant cavity, or a combination of the above.
31. The apparatus of any of the above examples, wherein: the distributed feedback array laser comprises a plurality of laser diodes with fixed wavelength intervals and a multimode interference coupler, and different laser diodes can be electrically switched and output.
32. An optical fiber distributed physical quantity measuring system based on laser tuning control to measure physical quantity change of an object to be measured, the system is characterized by comprising:
the optical fiber sensor is coupled to the object to be measured;
a distributed feedback array laser configured to provide a stabilized laser output of output power that continuously covers the output wavelength range of all selected laser diodes by varying the operating temperature of selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser outputs having overlapping wavelength ranges,
a wavelength monitoring unit configured to receive the laser output to provide a wavelength monitoring signal containing absolute wavelength information of the laser output;
a main path interferometer unit configured to receive the laser output and reflected light of the optical fiber sensor and cause the two to interfere to form a main path interference optical signal;
the acquisition unit is configured to synchronously acquire the main path interference optical signal and the wavelength monitoring signal in a measurement state including the physical quantity change to obtain a main path interference optical signal and a measurement state wavelength monitoring signal in the measurement state;
a data processing unit configured to
Determining splicing points in the acquired main path interference optical signal in the measurement state according to the received absolute wavelength information provided by the laser output signal in the measurement state; removing the part except the splicing point in the wavelength overlapping region in the collected main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and
and calculating the physical quantity change based on the main path interference optical signal, the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
33. The apparatus of example 32, wherein: the corresponding spliced reference state main path interference optical signal is pre-stored or obtained in real time in the following mode:
the acquisition unit is configured to synchronously acquire the main-state interference optical signal and the wavelength monitoring signal in the reference state to form a reference-state main-state interference optical signal and a reference-state wavelength monitoring signal;
the data processing unit is configured to determine a splicing point in the acquired reference state main path interference optical signal according to absolute wavelength information provided by the received reference state laser output signal; and removing the part except the splicing point in the wavelength overlapping region in the collected reference state main path interference optical signal to form a spliced reference state main path interference optical signal.
34. The system of any of the above examples, wherein: the device also comprises a storage unit which is used for storing the signal splicing position obtained by the data processing unit, storing the distributed physical quantity resolving result or directly storing the original acquisition signal so as to facilitate later off-line processing.
35. The system of any of the above examples, wherein: the optical fiber sensor is configured on the measuring arm of the main path interferometer unit and is a common single mode optical fiber, or an optical fiber with a writing of a weak reflection optical fiber grating array with an isocentric wavelength, or an optical fiber with enhanced Rayleigh scattering.
36. The system of any of the above examples, wherein: the distributed feedback array laser is configured to: the starting wavelength of each selected laser diode tuned at the operating temperature is less than the ending wavelength of the laser diode with the larger wavelength value adjacent to the laser diode tuned at the operating temperature such that the output signals of the adjacent wavelength laser diodes partially overlap spectrally.
37. The system of any of the above examples, wherein: also included is a temperature control unit configured to provide an operating temperature control signal to the distributed feedback array laser to cause the selected laser diode to output the reference state laser output and the measurement state laser output.
38. The system of any of the above examples, wherein: the laser driver further comprises a drive current control unit configured to provide a constant drive current control signal to the laser diodes in the distributed feedback array laser such that each laser diode operates at a constant drive current.
39. The system of any of the above examples, wherein: the method also comprises a laser diode selection unit: configured to switch a laser diode providing a laser output among the selected laser diodes.
40. The system of any of the above examples, wherein: the selected unit of the laser diode is an electrical switch.
41. The system of any of the above examples, wherein: further comprising an auxiliary interferometer unit configured to generate a reference state auxiliary interference light signal based on the received reference state laser output and a measurement state auxiliary interference light signal based on the received measurement state laser output.
42. The system of any of the above examples, wherein: the acquisition unit is configured to acquire the reference state auxiliary interference optical signal and the measurement state auxiliary interference optical signal and acquire the reference state auxiliary interference optical signal and the measurement state auxiliary interference optical signal as an acquisition clock to synchronously acquire the reference state interference light, the measurement state main path interference optical signal, the reference state laser output monitoring signal and the measurement state laser output monitoring signal.
43. The system of any of the above examples, wherein: synchronously acquiring the reference state main path interference optical signal, the reference state auxiliary interference optical signal and the reference state laser output signal; estimating the phase of the collected reference state laser output monitoring signal according to the collected reference state auxiliary interference optical signal, and thereby carrying out nonlinear correction on the collected reference state main path interference optical signal and the reference state laser output monitoring signal so that the reference state main path interference optical signal and the reference state laser output monitoring signal have equal optical frequency intervals; and
synchronously acquiring the main path interference optical signal in the measurement state, the auxiliary interference optical signal in the measurement state and the laser output monitoring signal in the measurement state; estimating the phase of the collected measurement state laser output monitoring signal according to the collected measurement state auxiliary interference optical signal, and thereby performing nonlinear correction on the collected measurement state main path interference optical signal and the measurement state laser output monitoring signal so that the measurement state main path interference optical signal and the measurement state laser output monitoring signal have equal optical frequency intervals.
44. The system of any of the above examples, wherein: the non-linear correction includes resampling.
45. The system of any of the above examples, wherein: and the auxiliary interferometer is adopted and combined with a photoelectric phase-locked loop to realize the nonlinear correction of the main path interferometer and the laser output in the reference state and the measurement state.
46. The system of any of the above examples, wherein: the main path interferometer unit includes a fiber interferometer having a Mach-Zehnder structure or a Michael grandchild structure.
47. The system of any of the above examples, wherein: the auxiliary path interferometer unit comprises an optical fiber interferometer with a Mach-Zehnder structure or a Michael grandson structure.
48. The system of any of the above examples, wherein: the wavelength monitoring unit comprises a gas chamber for outputting characteristic signals or a fiber grating with known central wavelength, or a spectrometer or a wavelength meter capable of directly obtaining wavelength, or a fiber interferometer or an FP standard or an optical resonant cavity, or a combination of the above.
49. The system of any of the above examples, wherein: the distributed feedback array laser comprises a plurality of laser diodes with fixed wavelength intervals and a multimode interference coupler, and different laser diodes can be electrically switched and output.
Claims (10)
1. An optical fiber distributed physical quantity measuring method based on laser tuning control, which is used for measuring physical quantity change of an object to be measured through an optical fiber sensor coupled to the object to be measured, and is characterized by comprising the following steps:
providing main path interference light formed by interference of output power stabilized laser output of the output wavelength range of all of the selected laser diodes and reflected light of the measurement state laser output by the fiber optic sensor by changing the operating temperature of the selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser output having overlapping wavelength ranges;
converting the interference light into a main path interference light signal;
synchronously acquiring the main path interference optical signal and a measurement state laser output wavelength monitoring signal containing absolute wavelength information output by the reference state laser in a measurement state comprising the physical quantity change to obtain a measurement state main path interference optical signal and a measurement state laser output wavelength monitoring signal;
determining splicing points in the collected main path interference optical signals in the measurement state according to absolute wavelength information provided by the monitoring signals of the laser output wavelength in the measurement state;
removing the part except the splicing point in the wavelength overlapping region in the acquired main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and
and calculating the physical quantity change based on the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
2. The method of claim 1, wherein: the spliced reference state main path interference optical signal is a pre-stored signal or is obtained by the following method:
synchronously acquiring the main path interference optical signal and a reference state laser output wavelength monitoring signal containing absolute wavelength information output by the reference state laser under a reference state without the physical quantity change to obtain a reference state main path interference optical signal and a reference state laser output wavelength monitoring signal;
determining splicing points in the collected reference state main path interference optical signals according to absolute wavelength information provided by the reference state laser output wavelength monitoring signals;
and removing the part except the splicing point in the wavelength overlapping region in the acquired reference state main path interference optical signal to form a spliced reference state main path interference optical signal.
3. The method of claim 1, wherein: also comprises
Providing reference state assist interference light of the laser output of the distributed feedback array laser in the reference state; converting the reference state auxiliary interference light into a reference state auxiliary interference light signal; synchronously acquiring the reference state main path interference optical signal, wherein the reference state laser outputs a wavelength monitoring signal and a reference state auxiliary interference optical signal; carrying out nonlinear correction on the acquired reference state main path interference optical signal by using the acquired reference state auxiliary interference optical signal; and
providing measurement state-assisted interference light of the laser output of the distributed feedback array laser in the measurement state; converting the measurement state auxiliary interference light into a measurement state auxiliary interference light signal; synchronously acquiring the main path interference optical signal in the measurement state, and outputting a wavelength monitoring signal and an auxiliary interference optical signal in the measurement state by the laser in the measurement state; and carrying out nonlinear correction on the acquired main path interference optical signal in the measurement state by using the acquired auxiliary interference optical signal in the measurement state.
4. The method of claim 1, wherein: also comprises
Providing reference state assist interference light of the laser output of the distributed feedback array laser in the reference state; converting the reference state auxiliary interference light into a reference state auxiliary interference light signal; synchronously acquiring the reference state main path interference optical signal, wherein the reference state laser outputs a wavelength monitoring signal and a reference state auxiliary interference optical signal; splicing the reference state auxiliary interference optical signal based on absolute wavelength information provided by the acquired reference laser output wavelength monitoring signal, and performing nonlinear correction on the spliced reference state main path interference optical signal by using the spliced reference state auxiliary interference optical signal; and
providing measurement state-assisted interference light of the laser output of the distributed feedback array laser in the measurement state; converting the measurement state auxiliary interference light into a measurement state auxiliary interference light signal; synchronously collecting the main path interference optical signal in the measurement state, and outputting a wavelength monitoring signal and a measurement state auxiliary interference optical signal by the laser; splicing the measurement state auxiliary interference optical signal based on absolute wavelength information provided by the collected measurement state laser output wavelength monitoring signal, and carrying out nonlinear correction on the spliced measurement state main path interference optical signal by using the spliced measurement state auxiliary interference optical signal.
5. An optical fiber distributed physical quantity measuring device based on laser tuning control, which is used for measuring the physical quantity change of an object to be measured through an optical fiber sensor coupled to the object to be measured, and is characterized in that the device comprises:
a distributed feedback array laser configured to provide a laser output with stable output power that continuously covers the output wavelength range of all selected laser diodes by changing the operating temperature of selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser outputs with overlapping wavelength ranges, a wavelength monitoring unit configured to receive the laser output to provide a wavelength monitoring signal containing absolute wavelength information of the laser output;
a main path interferometer unit configured to receive the laser output and reflected light of the optical fiber sensor and cause the two to interfere to form a main path interference optical signal;
the acquisition unit is configured to synchronously acquire the main path interference optical signal and the wavelength monitoring signal in a measurement state including the physical quantity change to obtain a main path interference optical signal and a measurement state wavelength monitoring signal in the measurement state;
a data processing unit configured to
Determining splicing points in the acquired main path interference optical signal in the measurement state according to the received absolute wavelength information provided by the laser output signal in the measurement state; removing the part except the splicing point in the wavelength overlapping region in the collected main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and
and calculating the physical quantity change based on the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
6. The apparatus of claim 5, wherein: the corresponding spliced reference state main path interference optical signal is pre-stored or obtained in real time in the following mode:
the acquisition unit is configured to synchronously acquire the main-state interference optical signal and the wavelength monitoring signal in the reference state to form a reference-state main-state interference optical signal and a reference-state wavelength monitoring signal;
the data processing unit is configured to determine a splicing point in the acquired reference state main path interference optical signal according to absolute wavelength information provided by the received reference state laser output signal; and removing the part except the splicing point in the wavelength overlapping region in the collected reference state main path interference optical signal to form a spliced reference state main path interference optical signal.
7. The apparatus of any one of the preceding claims, wherein: the device also comprises a storage unit which is used for storing the signal splicing position obtained by the data processing unit, storing the distributed physical quantity resolving result or directly storing the original acquisition signal so as to facilitate later off-line processing.
8. The apparatus of any one of the preceding claims, wherein: the optical fiber sensor is configured on the measuring arm of the main path interferometer unit and is a common single mode optical fiber, or an optical fiber with a writing of a weak reflection optical fiber grating array with an isocentric wavelength, or an optical fiber with enhanced Rayleigh scattering.
9. The apparatus according to any of the preceding claims, wherein: the distributed feedback array laser is configured to: the starting wavelength of each selected laser diode tuned at the operating temperature is less than the ending wavelength of the laser diode with the larger wavelength value adjacent to the laser diode tuned at the operating temperature such that the output signals of the adjacent wavelength laser diodes partially overlap spectrally.
10. An optical fiber distributed physical quantity measuring system based on laser tuning control to measure physical quantity change of an object to be measured, the system is characterized by comprising:
the optical fiber sensor is coupled to the object to be measured;
a distributed feedback array laser configured to provide a stabilized laser output of output power that continuously covers the output wavelength range of all selected laser diodes by varying the operating temperature of selected laser diodes in the distributed feedback array laser to cause adjacent selected laser diodes to emit laser outputs having overlapping wavelength ranges,
a wavelength monitoring unit configured to receive the laser output to provide a wavelength monitoring signal containing absolute wavelength information of the laser output;
a main path interferometer unit configured to receive the laser output and reflected light of the optical fiber sensor and cause the two to interfere to form a main path interference optical signal;
the acquisition unit is configured to synchronously acquire the main path interference optical signal and the wavelength monitoring signal in a measurement state including the physical quantity change to obtain a main path interference optical signal and a measurement state wavelength monitoring signal in the measurement state;
a data processing unit configured to
Determining splicing points in the acquired main path interference optical signal in the measurement state according to the received absolute wavelength information provided by the laser output signal in the measurement state; removing the part except the splicing point in the wavelength overlapping region in the collected main path interference optical signal in the measurement state to form a spliced main path interference optical signal in the measurement state; and
and calculating the physical quantity change based on the main path interference optical signal, the spliced measuring state main path interference optical signal and the spliced reference state main path interference optical signal.
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