CN112070712B - 基于自编码器网络的印刷缺陷检测方法 - Google Patents
基于自编码器网络的印刷缺陷检测方法 Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 107
- 238000001514 detection method Methods 0.000 title claims abstract description 47
- 238000007639 printing Methods 0.000 title claims abstract description 34
- 230000002950 deficient Effects 0.000 claims abstract description 93
- 238000012549 training Methods 0.000 claims abstract description 41
- 238000013528 artificial neural network Methods 0.000 claims abstract description 40
- 230000003042 antagnostic effect Effects 0.000 claims abstract description 30
- 238000001914 filtration Methods 0.000 claims abstract description 16
- 238000004519 manufacturing process Methods 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 claims description 20
- 230000006870 function Effects 0.000 claims description 13
- 230000008447 perception Effects 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 6
- 230000004927 fusion Effects 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 claims description 3
- 238000002372 labelling Methods 0.000 claims description 3
- 230000008485 antagonism Effects 0.000 claims 1
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000008569 process Effects 0.000 description 11
- 238000005516 engineering process Methods 0.000 description 2
- 238000013473 artificial intelligence Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013527 convolutional neural network Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000004660 morphological change Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
- G06F18/214—Generating training patterns; Bootstrap methods, e.g. bagging or boosting
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/045—Combinations of networks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20084—Artificial neural networks [ANN]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30144—Printing quality
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CN112884741B (zh) * | 2021-02-22 | 2023-01-24 | 西安理工大学 | 一种基于图像相似性对比的印刷表观缺陷检测方法 |
CN113240790A (zh) * | 2021-04-14 | 2021-08-10 | 北京交通大学 | 一种基于3d模型和点云处理的钢轨缺陷图像生成方法 |
CN114155244B (zh) * | 2022-02-10 | 2022-05-31 | 北京阿丘科技有限公司 | 缺陷检测方法、装置、设备及存储介质 |
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CN107330897A (zh) * | 2017-06-01 | 2017-11-07 | 福建师范大学 | 图像分割方法及其系统 |
CN110322433A (zh) * | 2019-05-27 | 2019-10-11 | 苏州佳赛特智能科技有限公司 | 一种面向外观缺陷视觉检测的数据集扩增方法 |
CN110516747A (zh) * | 2019-08-29 | 2019-11-29 | 电子科技大学 | 基于对抗生成网络和自编码结合的肺结节良恶性分类方法 |
WO2019233166A1 (zh) * | 2018-06-04 | 2019-12-12 | 杭州海康威视数字技术股份有限公司 | 一种表面缺陷检测方法、装置及电子设备 |
CN110853035A (zh) * | 2020-01-15 | 2020-02-28 | 征图新视(江苏)科技股份有限公司 | 工业视觉检测中基于深度学习的样本生成方法 |
CN110852373A (zh) * | 2019-11-08 | 2020-02-28 | 深圳市深视创新科技有限公司 | 基于视觉的无缺陷样本深度学习网络训练方法 |
CN110992354A (zh) * | 2019-12-13 | 2020-04-10 | 华中科技大学 | 基于引入自动记忆机制对抗自编码器的异常区域检测方法 |
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CN107330897A (zh) * | 2017-06-01 | 2017-11-07 | 福建师范大学 | 图像分割方法及其系统 |
WO2019233166A1 (zh) * | 2018-06-04 | 2019-12-12 | 杭州海康威视数字技术股份有限公司 | 一种表面缺陷检测方法、装置及电子设备 |
CN110322433A (zh) * | 2019-05-27 | 2019-10-11 | 苏州佳赛特智能科技有限公司 | 一种面向外观缺陷视觉检测的数据集扩增方法 |
CN110516747A (zh) * | 2019-08-29 | 2019-11-29 | 电子科技大学 | 基于对抗生成网络和自编码结合的肺结节良恶性分类方法 |
CN110852373A (zh) * | 2019-11-08 | 2020-02-28 | 深圳市深视创新科技有限公司 | 基于视觉的无缺陷样本深度学习网络训练方法 |
CN110992354A (zh) * | 2019-12-13 | 2020-04-10 | 华中科技大学 | 基于引入自动记忆机制对抗自编码器的异常区域检测方法 |
CN110853035A (zh) * | 2020-01-15 | 2020-02-28 | 征图新视(江苏)科技股份有限公司 | 工业视觉检测中基于深度学习的样本生成方法 |
Non-Patent Citations (1)
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