CN112056760A - One-stop test system and method - Google Patents
One-stop test system and method Download PDFInfo
- Publication number
- CN112056760A CN112056760A CN202010832297.3A CN202010832297A CN112056760A CN 112056760 A CN112056760 A CN 112056760A CN 202010832297 A CN202010832297 A CN 202010832297A CN 112056760 A CN112056760 A CN 112056760A
- Authority
- CN
- China
- Prior art keywords
- test
- electrically connected
- tested product
- product
- processing module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47B—TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE
- A47B21/00—Tables or desks for office equipment, e.g. typewriters, keyboards
- A47B21/04—Tables or desks for office equipment, e.g. typewriters, keyboards characterised by means for holding or fastening typewriters or computer equipment
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47B—TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE
- A47B37/00—Tables adapted for other particular purposes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L9/00—Supporting devices; Holding devices
- B01L9/02—Laboratory benches or tables; Fittings therefor
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47B—TABLES; DESKS; OFFICE FURNITURE; CABINETS; DRAWERS; GENERAL DETAILS OF FURNITURE
- A47B37/00—Tables adapted for other particular purposes
- A47B2037/005—Tables specially adapted for laboratories
Abstract
The invention relates to a one-stop test system, which comprises a computer end, a tested end electrically connected with the computer end, an instrument end electrically connected with the computer end and the tested end respectively, a display end electrically connected with the computer end, and a confirmation end electrically connected with the computer end. The computer end is provided with: the device comprises a control processing module, a data acquisition module electrically connected with the control processing module, a DIO module electrically connected with the control processing module, a power control module electrically connected with the control processing module, a communication module electrically connected with the control processing module and a memory electrically connected with the control processing module. According to the scheme, the one-stop type test system adopts a one-to-two parallel test method, one set of equipment can support two products to simultaneously perform product function automatic test, human-computer interaction function test and the like, and the system has the advantages of high production efficiency, lower input cost, convenience in maintenance, less human resource input and the like.
Description
Technical Field
The invention relates to the field of vehicle-mounted electronic product production, in particular to a one-stop test system and a one-stop test method.
Background
With the development of the automobile electronic industry, the vehicle-mounted electronic products gradually change to the direction of modularization and integration, and the existing navigation products also gradually change to a mode of a split screen plus a navigation host. In this case, the functions of the navigation host will gradually increase, and the workload of the test will also be increased.
The existing test system has the following defects:
(1) the product function automatic test and the human-computer interaction function test are divided into two independent systems to complete the test, one product needs to be divided into at least 2 different test items to complete the test, along with the increase of the product functions, more and more processes need to be carried out on one product, and the production efficiency is reduced;
(2) the test system has a complex structure, and once a problem occurs, a lot of time is spent on troubleshooting and improving the problem, so that the production is seriously influenced.
(3) The existing system hardware has long service time, and part of the hardware receives the production halt notice, so that a new test system is urgently needed to be developed to solve the crisis.
In response to these problems, we have invented a one-stop test system and method.
Disclosure of Invention
The invention aims to solve the problems that the existing test system has automatic product function test and man-machine interaction function test and is completed by two independent systems, along with the increase of product functions, one product needs more and more processes, the production efficiency is reduced, the structure of the test system is complex, once a problem occurs, the production is seriously affected, part of hardware of the system receives a production stop notice, and a new test system is urgently required to be developed to solve crisis. The concrete solution is as follows:
a one-stop test system comprising:
the computer end is arranged in the cabinet and is used for controlling and processing the whole system;
the tested end is arranged on the test rack on the operating table and is electrically connected with the computer end and used for simultaneously testing two tested products;
the instrument end is arranged in the cabinet, is electrically connected with the computer end and the tested end respectively and is used for providing instruments and signals related to the test for the tested product;
the display end is arranged on the display bracket above the operating table, is electrically connected with the computer end and is used for displaying the relevant information of the system and the tested product;
and the confirmation end is arranged on the front side of the operation table and electrically connected with the computer end and is used for scanning the dialog box and confirming the state during the human-computer interaction test.
Further, the computer end is provided with:
the control processing module is used for sending a control signal to control each unit in the system to work or receiving the signal of each unit for analysis and processing;
the data acquisition module is electrically connected with the control processing module and is used for acquiring the related information of the tested product;
the DIO module is electrically connected with the control processing module and is used as a digital quantity input/output port;
the power supply control module is electrically connected with the control processing module and is used for controlling the power supply of the test rack;
the communication module is electrically connected with the control processing module and is used for communicating with a tested product electrically connected to the test rack;
and the memory is electrically connected with the control processing module and is used for storing preset parameters, preset programs and test data in the system.
Furthermore, the tested end comprises a first test rack electrically connected with the control processing module, a first tested product electrically connected with the first test rack, a second test rack electrically connected with the control processing module, and a second tested product electrically connected with the second test rack.
Furthermore, the instrument end comprises a relay module electrically connected with the DIO module, a programmable power supply electrically connected with the power control module, an external instrument, an external signal source and a scanning gun which are respectively electrically connected with the control processing module, and a power distributor electrically connected with the external signal source, wherein the programmable power supply is electrically connected with the relay module, and the scanning gun is arranged on a scanning support on the operating platform and used for scanning product labels.
Furthermore, the data acquisition module, the scanning gun and the power distributor are respectively electrically connected with the first tested product and the second tested product.
Furthermore, the communication module, the relay module and the external instrument are respectively and electrically connected with the first test rack and the second test rack.
Furthermore, the display end is a display used for observing the conditions of the current test system and the tested product in real time.
Furthermore, the confirmation end comprises a trigger key used for confirming the state of a scanning dialog box and a man-machine interaction test which are displayed in the display, and an emergency stop key used for the operation of emergency stop in abnormal conditions.
The one-stop test method based on the one-stop test system comprises the following steps:
step 1, initializing system resources after a test system is started;
step 2, respectively placing a first tested product and a second tested product on a first test rack and a second test rack;
step 3, after a trigger key of the first tested product is manually pressed, the display sets the scanning dialog box of the currently selected first tested product to the top;
step 4, scanning the product label by using a scanning gun, and after the product label is checked correctly, controlling the program-controlled power supply and the relay module by the control processing module through the power supply control module and the DIO module respectively to electrify the product;
step 5, after the product is normally started, controlling the processing module control system to perform automatic function test on the first tested product;
step 6, after the automatic test is finished, the control processing module automatically switches the test state to a human-computer interaction test, and prompts the operation content on the display to carry out the human-computer interaction test;
step 7, after the test is passed, manually pressing a trigger key until the man-machine interaction function test is completed;
step 8, after the human-computer interaction test is finished, the system automatically sets the product to be in a factory state, and turns off the power supply, and automatically prints the body label;
9, taking out the first tested product, changing the first tested product to the next first tested product, and repeating the steps 3 to 9;
step 11, scanning a second tested product label by using a scanning gun, and controlling a processing module to electrify and start up the second tested product after the second tested product label is checked to be correct;
step 12, when the first tested product enters a human-computer interaction test, namely step 6, the system automatically performs a function automation test on the second tested product;
step 13, when the next first tested product is powered on, namely step 4, the second tested product automatically enters a human-computer interaction test;
step 14, after the man-machine interaction test of the second tested product is finished, the system automatically sets the product to be in a factory state, and turns off the power supply, and automatically prints the body label;
and 15, taking out the second tested product, replacing the second tested product with the next second tested product, and repeating the steps 10 to 15.
Furthermore, the test system has an automatic cooperation function of the test bed, the control processing module automatically judges all test results, and when any one test fails in the test process of the product, the control processing module automatically controls to interrupt and quit the test, and simultaneously displays the result on the display.
In summary, the technical scheme of the invention has the following beneficial effects:
the invention solves the problems that the existing test system has automatic product function test and man-machine interaction function test and is completed by two independent systems, along with the increase of product functions, one product needs more and more procedures, the production efficiency is reduced, the structure of the test system is complex, once a problem occurs, the production is seriously affected, part of hardware of the system receives a production stop notice, and a new test system is urgently required to be developed to solve the crisis. According to the scheme, the one-stop type test system adopts a one-to-two parallel test method, one set of equipment can support two products to simultaneously perform product function automatic test, human-computer interaction function test and the like, and the system has the advantages of high production efficiency, lower input cost, convenience in maintenance, less human resource input and the like. Compared with the existing test system, the test production efficiency of a single product can be doubled, and one set of test equipment and one set of test system can complete the work of 2 sets of test equipment and 2 sets of test systems. In addition, through technical innovation, an equipment hardware substitution scheme is successfully found, namely the DIO module and the relay module are used for substituting the original high-current switch board card, the universality of the method is stronger, the subsequent substitution and iteration are very convenient, and the influence of hardware production halt on the hardware is reduced to the maximum extent. Through the development of the test system, the cost of the whole equipment is obviously reduced, and the competitiveness of the manufacturing link of the product is further improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is a block diagram of a one-stop test system of the present invention;
FIG. 2 is an electrical block diagram of a one-stop test system of the present invention;
FIG. 3 is a flow chart of the test items of the present invention.
Description of reference numerals:
10-an operation desk, 20-a test rack, 30-a cabinet, 40-a display rack, 50-a scanning rack, 60-an operation instruction book, 100-a computer terminal, 101-a control processing module, 102-a data acquisition module, 103-a DIO module, 104-a power supply control module, 105-a communication module, 106-a memory, 200-a tested terminal, 201-a first test rack, 202-a second test rack, 203-a first tested product, 204-a second tested product, 300-an instrument terminal, 301-a relay module, 302-a program-controlled power supply, 303-an external instrument, 304-an external signal source, 305-a scanning gun, 306-a power distributor, 400-a confirmation terminal, 401-a trigger button, 402-an emergency stop button, 500-display end, 501-display.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1 and 2, the one-stop test system includes:
a computer terminal 100 disposed in the cabinet 30 for controlling and processing the whole system;
a tested terminal 200 disposed on the test rack 20 (including a first test rack 201 and a second test rack 202) on the console 10 and electrically connected to the computer terminal 100, for simultaneously testing two tested products (including a first tested product 203 and a second tested product 204);
the instrument end 300 is arranged in the cabinet 30, is electrically connected with the computer end 100 and the tested end 200 respectively, and is used for providing instruments and signals related to the test for the tested product;
a display terminal 500 disposed on the display bracket 40 above the console 10 and electrically connected to the computer terminal 100 for displaying the related information of the system and the tested product;
a confirmation terminal 400 disposed at the front side of the console 10 and electrically connected to the computer terminal 100 for confirming the status of the scan dialog and the human-computer interaction test.
An operation instruction book 60 is provided on the support of the operation table 10 between the display terminal 500 and the measured terminal 200.
Further, the computer terminal 100 is provided with:
the control processing module 101 is used for sending a control signal to control each unit in the system to work or receiving a signal of each unit for analysis processing;
the data acquisition module 102 is electrically connected with the control processing module 101 and is used for acquiring relevant information of a tested product;
a DIO (DIO is an abbreviation of digital input/output and means of a digital input/output) module 103 electrically connected to the control processing module 101 as a digital input/output port;
the power supply control module 104 is electrically connected with the control processing module 101 and is used for controlling the power supply of the test rack 20;
a communication module 105 electrically connected to the control processing module 101 for communicating with a product under test electrically connected to the test rack 20;
and the memory 106 is electrically connected with the control processing module 101 and is used for storing preset parameters, preset programs and test data in the system.
Further, the tested terminal 200 includes a first test rack 201 electrically connected to the control processing module 101, a first product under test 203 electrically connected to the first test rack 201, a second test rack 202 electrically connected to the control processing module 101, and a second product under test 204 electrically connected to the second test rack 202.
Further, the instrument end 300 includes a relay module 301 electrically connected to the DIO module 103, a programmable power supply 302 electrically connected to the power control module 104, an external instrument 303, an external signal source 304, and a scanning gun 305 electrically connected to the control processing module 101, and a power distributor 306 electrically connected to the external signal source 304, wherein the programmable power supply 302 is electrically connected to the relay module 301, and the scanning gun 305 is disposed on the scanning support 50 on the console 10 and is used for scanning a label of a product (referred to as a product to be tested).
Further, the data acquisition module 102, the scan gun 305, and the power distributor 306 are electrically connected to the first product under test 203 and the second product under test 204, respectively.
Further, the communication module 105, the relay module 301, and the external instrument 303 are electrically connected to the first test rack 201 and the second test rack 202, respectively.
Further, the display terminal 500 is a display 501 for observing the current test system and the condition of the product under test in real time.
Further, the confirmation terminal 400 includes a trigger button 401 for confirming the status of the scan dialog and the human-computer interaction test displayed in the display 501, and an emergency stop button 402 for emergency stop operation in case of an abnormal situation.
The one-stop test method based on the one-stop test system comprises the following steps:
step 1, initializing system resources after a test system is started;
step 2, placing a first tested product 203 and a second tested product 204 on a first test rack 201 and a second test rack 202 respectively;
step 3, after the trigger button 401 of the first tested product 203 is manually pressed, the display 501 sets the scanning dialog box of the currently selected first tested product 203 to the top;
step 4, scanning the label of the product (the detected product) by using the scanning gun 305, and after the product is checked to be correct, controlling the processing module 101 to control the program-controlled power supply 302 and the relay module 301 through the power supply control module 104 and the DIO module 103 respectively to electrify the product (the detected product);
step 5, after the product (the tested product) is normally started, controlling the processing module 101 to control the system to automatically test the function of the first tested product 203;
step 6, after the automatic test is finished, the control processing module 101 automatically switches the test state to the human-computer interaction test, and prompts the operation content on the display 501 to perform the human-computer interaction test;
step 7, after the test is passed, manually pressing the trigger button 401 until the human-computer interaction function test is completed;
step 8, after the human-computer interaction test is finished, the system automatically sets a product (namely the tested product) to be in a factory state, and turns off the power supply, and automatically prints a machine body label;
step 9, taking out the first tested product 203, changing to the next first tested product 203, and repeating the steps 3 to 9;
step 11, scanning the label of the second tested product 204 by using the scanning gun 305, and controlling the processing module 101 to power on and start the second tested product 204 after the label is checked to be correct;
step 12, when the first tested product 203 enters a human-computer interaction test, namely step 6, the system automatically performs a function automation test on the second tested product 204;
step 13, when the next first tested product 203 is powered on, namely step 4, the second tested product 204 automatically enters a human-computer interaction test;
step 14, after the man-machine interaction test of the second tested product 204 is completed, the system automatically sets the product to be in a factory state, turns off the power supply and automatically prints the body label;
and 15, taking out the second tested product 204, replacing the second tested product 204 with the next second tested product 204, and repeating the steps 10 to 15.
It should be noted that in the one-stop test method of the present disclosure, the same operator alternately performs the staggered "power on, power on", "automatic test", and "human-machine interaction test" operations on the first tested product 203 and the second tested product 204 on the first test rack 201 and the second test rack 202, that is, when the first tested product 203 is in the "automatic test", the second tested product 204 is in the "power on, power on", when the first tested product 203 is in the "human-machine interaction test", the second tested product 204 is in the "automatic test", when the next first tested product 203 is in the "automatic test", the second tested product 204 is in the "human-machine interaction test", and the "human-machine interaction test" is performed in sequence and in a cycle, so that the most reasonable manual work and instrument sharing distribution is achieved, and the production efficiency is improved.
Further, the test system has an automatic cooperation function of the test bed (in an actual operation process, since only one of part of the instruments, such as a signal generator, cannot support 2 products to be tested simultaneously, and the automatic cooperation function avoids a conflict of hardware use), the control processing module 101 automatically judges all test results, and when any one of the products fails in the test process, the control processing module 101 automatically controls to interrupt and quit the test, and simultaneously displays the results on the display 501.
As shown in fig. 3, all the test items and processes of the present solution are: power-on start → radio reception test → USB audio test → iPod audio test → Bluetooth test → WiFi test → Ethernet test → static current test → USB high-current charging test → carplay test → human-computer interaction function test (including various function menus, input and output interfaces, etc.) → power-off shutdown. Related test items can be increased or decreased according to the needs of actual products.
In summary, the technical scheme of the invention has the following beneficial effects:
the invention solves the problems that the existing test system has automatic product function test and man-machine interaction function test and is completed by two independent systems, along with the increase of product functions, one product needs more and more procedures, the production efficiency is reduced, the structure of the test system is complex, once a problem occurs, the production is seriously affected, part of hardware of the system receives a production stop notice, and a new test system is urgently required to be developed to solve the crisis. According to the scheme, the one-stop type test system adopts a one-to-two parallel test method, one set of equipment can support two products to simultaneously perform product function automatic test, human-computer interaction function test and the like, and the system has the advantages of high production efficiency, lower input cost, convenience in maintenance, less human resource input and the like. Compared with the existing test system, the test production efficiency of a single product can be doubled, and one set of test equipment and one set of test system can complete the work of 2 sets of test equipment and 2 sets of test systems. In addition, through technical innovation, an equipment hardware substitution scheme is successfully found, namely the DIO module and the relay module are used for substituting the original high-current switch board card, the universality of the method is stronger, the subsequent substitution and iteration are very convenient, and the influence of hardware production halt on the hardware is reduced to the maximum extent. Through the development of the test system, the cost of the whole equipment is obviously reduced, and the competitiveness of the manufacturing link of the product is further improved.
The above-described embodiments do not limit the scope of the present invention. Any modification, equivalent replacement, and improvement made within the spirit and principle of the above-described embodiments should be included in the protection scope of the technical solution.
Claims (10)
1. A one-stop test system, comprising:
the computer end is arranged in the cabinet and is used for controlling and processing the whole system;
the tested end is arranged on the test rack on the operating table and is electrically connected with the computer end and used for simultaneously testing two tested products;
the instrument end is arranged in the cabinet, is electrically connected with the computer end and the tested end respectively and is used for providing instruments and signals related to the test for the tested product;
the display end is arranged on the display bracket above the operating table, is electrically connected with the computer end and is used for displaying the relevant information of the system and the tested product;
and the confirmation end is arranged on the front side of the operation table and electrically connected with the computer end and is used for scanning the dialog box and confirming the state during the human-computer interaction test.
2. The one-stop test system of claim 1, wherein the computer side is provided with:
the control processing module is used for sending a control signal to control each unit in the system to work or receiving the signal of each unit for analysis and processing;
the data acquisition module is electrically connected with the control processing module and is used for acquiring the related information of the tested product;
the DIO module is electrically connected with the control processing module and is used as a digital quantity input/output port;
the power supply control module is electrically connected with the control processing module and is used for controlling the power supply of the test rack; the communication module is electrically connected with the control processing module and is used for communicating with a tested product electrically connected to the test rack;
and the memory is electrically connected with the control processing module and is used for storing preset parameters, preset programs and test data in the system.
3. The one-stop test system of claim 2, wherein: the tested end comprises a first test rack electrically connected with the control processing module, a first tested product electrically connected with the first test rack, a second test rack electrically connected with the control processing module, and a second tested product electrically connected with the second test rack.
4. The one-stop test system of claim 3, wherein: the instrument end comprises a relay module electrically connected with the DIO module, a program-controlled power supply electrically connected with the power supply control module, an external instrument, an external signal source and a scanning gun which are respectively electrically connected with the control processing module, and a power distributor electrically connected with the external signal source, wherein the program-controlled power supply is electrically connected with the relay module, and the scanning gun is arranged on a scanning support on the operating platform and used for scanning a product label.
5. The one-stop test system of claim 4, wherein: the data acquisition module, the scanning gun and the power distributor are respectively and electrically connected with the first tested product and the second tested product.
6. The one-stop test system of claim 5, wherein: the communication module, the relay module and the external instrument are respectively and electrically connected with the first test rack and the second test rack.
7. The one-stop test system of claim 6, wherein: the display end is a display and is used for observing the conditions of the current test system and the tested product in real time.
8. The one-stop test system of claim 7, wherein: the confirmation end comprises a trigger key used for confirming the state of a scanning dialog box and a man-machine interaction test which are displayed in the display, and an emergency stop key used for the operation of emergency stop in abnormal conditions.
9. A one-stop test method based on the one-stop test system of any one of claims 1 to 8, characterized by comprising the following steps:
step 1, initializing system resources after a test system is started;
step 2, respectively placing a first tested product and a second tested product on a first test rack and a second test rack;
step 3, after a trigger key of the first tested product is manually pressed, the display sets the scanning dialog box of the currently selected first tested product to the top;
step 4, scanning the product label by using a scanning gun, and after the product label is checked correctly, controlling the program-controlled power supply and the relay module by the control processing module through the power supply control module and the DIO module respectively to electrify the product;
step 5, after the product is normally started, controlling the processing module control system to perform automatic function test on the first tested product;
step 6, after the automatic test is finished, the control processing module automatically switches the test state to a human-computer interaction test, and prompts the operation content on the display to carry out the human-computer interaction test;
step 7, after the test is passed, manually pressing a trigger key until the man-machine interaction function test is completed;
step 8, after the human-computer interaction test is finished, the system automatically sets the product to be in a factory state, and turns off the power supply, and automatically prints the body label;
9, taking out the first tested product, changing the first tested product to the next first tested product, and repeating the steps 3 to 9;
step 10, when the first tested product enters an automatic testing state, namely step 5, a second tested product trigger key is manually pressed, and a scanning dialog box of the second tested product is displayed on a display;
step 11, scanning a second tested product label by using a scanning gun, and controlling a processing module to electrify and start up the second tested product after the second tested product label is checked to be correct;
step 12, when the first tested product enters a human-computer interaction test, namely step 6, the system automatically performs a function automation test on the second tested product;
step 13, when the next first tested product is powered on, namely step 4, the second tested product automatically enters a human-computer interaction test;
step 14, after the man-machine interaction test of the second tested product is finished, the system automatically sets the product to be in a factory state, and turns off the power supply, and automatically prints the body label;
and 15, taking out the second tested product, replacing the second tested product with the next second tested product, and repeating the steps 10 to 15.
10. The one-stop test method of claim 9, wherein: the test system has the automatic cooperation function of the test bed, the control processing module automatically judges all test results, and when any one test fails in the test process of the product, the control processing module automatically controls the interruption and quits the test, and simultaneously displays the result on the display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010832297.3A CN112056760B (en) | 2020-08-18 | 2020-08-18 | One-stop test system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010832297.3A CN112056760B (en) | 2020-08-18 | 2020-08-18 | One-stop test system and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112056760A true CN112056760A (en) | 2020-12-11 |
| CN112056760B CN112056760B (en) | 2023-01-06 |
Family
ID=73662147
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010832297.3A Active CN112056760B (en) | 2020-08-18 | 2020-08-18 | One-stop test system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112056760B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113001495A (en) * | 2021-03-10 | 2021-06-22 | 机械工业第九设计研究院有限公司 | Multifunctional tool cabinet |
| CN113865826A (en) * | 2021-08-31 | 2021-12-31 | 广东省威汇智能科技有限公司 | Display screen module detection device and detection system |
Citations (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5157781A (en) * | 1990-01-02 | 1992-10-20 | Motorola, Inc. | Data processor test architecture |
| JPH0843500A (en) * | 1994-08-02 | 1996-02-16 | Toshiba Corp | Analog-input/output-board testing apparatus |
| US6269150B1 (en) * | 1998-06-11 | 2001-07-31 | Lucent Technologies, Inc. | Reliable, unattended, automated testing system and method for complex telecommunication systems |
| US20020124042A1 (en) * | 2001-03-02 | 2002-09-05 | Douglas Melamed | System and method for synchronizing execution of a test sequence |
| US20030070118A1 (en) * | 2001-10-09 | 2003-04-10 | Hitachi, Ltd. | Semiconductor integrated circuit with built-in test function |
| US20030208542A1 (en) * | 2002-05-01 | 2003-11-06 | Testquest, Inc. | Software test agents |
| US20050257076A1 (en) * | 2004-05-15 | 2005-11-17 | Hon Hai Precision Industry Co., Ltd. | System and method for controlling power sources of motherboards under test through networks |
| US20060243071A1 (en) * | 2004-09-10 | 2006-11-02 | Sagi-Dolev Alysia M | Multi-threat detection system |
| US20070245199A1 (en) * | 2006-03-31 | 2007-10-18 | Robert Pochowski | Application Specific Distributed Test Engine Architecture System And Method |
| CN102654542A (en) * | 2012-05-09 | 2012-09-05 | 福建联迪商用设备有限公司 | Method for realizing test automation by utilizing bar code |
| CN202548303U (en) * | 2012-04-05 | 2012-11-21 | 浙江昱能光伏科技集成有限公司 | Automatic production test bench for photovoltaic grid-connected micro inverter |
| CN104168349A (en) * | 2014-07-31 | 2014-11-26 | 东莞市诺丽电子科技有限公司 | Smart phone test equipment and test method thereof |
| WO2015158178A1 (en) * | 2014-04-16 | 2015-10-22 | 烽火通信科技股份有限公司 | System, method and apparatus for automatically testing otn protection switching |
| CN205120846U (en) * | 2015-09-11 | 2016-03-30 | 珠海科德电子有限公司 | Many function test system of two mesas |
| CN105519168A (en) * | 2013-09-03 | 2016-04-20 | 莱特普茵特公司 | Method for testing data packet signal transceivers with multiple radio access technologies using interleaved device setup and testing |
| CN105527586A (en) * | 2015-12-30 | 2016-04-27 | 常州星宇车灯股份有限公司 | Automatic detection device and detection method for trunk lamp |
| CN205405254U (en) * | 2016-03-04 | 2016-07-27 | 武汉力神动力电池系统科技有限公司 | Battery management system master control unit test system |
| CN205562698U (en) * | 2016-02-18 | 2016-09-07 | 江西洪都航空工业集团有限责任公司 | Electrical accessory tester |
| CN206114254U (en) * | 2016-11-07 | 2017-04-19 | 惠州市德赛西威汽车电子股份有限公司 | Vehicle combined detection system |
| CN206162177U (en) * | 2016-08-31 | 2017-05-10 | 浙江创亿光电设备有限公司 | Production automation system |
| CN106933217A (en) * | 2017-04-05 | 2017-07-07 | 武汉南斗六星系统集成有限公司 | A kind of automatic checkout equipment of central vehicle control unit |
| CN107239331A (en) * | 2017-05-23 | 2017-10-10 | 中国电子科技集团公司第四十研究所 | A kind of synchronous triggering execution method of concurrent testing task |
| CN108007607A (en) * | 2017-12-28 | 2018-05-08 | 惠州市德赛西威汽车电子股份有限公司 | A kind of vehicle interior temperature sensor detector |
| WO2018119149A1 (en) * | 2016-12-20 | 2018-06-28 | Rainforest Qa, Inc. | Electronic product testing systems |
| US20190114045A1 (en) * | 2017-10-13 | 2019-04-18 | Rainforest Qa, Inc. | Electronic product testing systems |
| US20190187200A1 (en) * | 2017-12-20 | 2019-06-20 | Keyssa Systems, Inc. | System and method for rf and jitter testing using a reference device |
| US20190317886A1 (en) * | 2018-04-13 | 2019-10-17 | Rainforest Qa, Inc. | Electronic product testing systems |
| CN209994436U (en) * | 2019-04-19 | 2020-01-24 | 深圳市巨丰泰自动化设备技术有限公司 | MMI automatic testing machine for functional mobile phone |
| CN110749595A (en) * | 2019-09-05 | 2020-02-04 | 惠州市德赛西威汽车电子股份有限公司 | Automatic testing device and method |
| CN210804110U (en) * | 2019-12-28 | 2020-06-19 | 张家港市诚远电子有限公司 | Fan controller detection equipment |
| CN111383706A (en) * | 2018-12-28 | 2020-07-07 | 海太半导体（无锡）有限公司 | Centralized control system of functional test equipment |
-
2020
- 2020-08-18 CN CN202010832297.3A patent/CN112056760B/en active Active
Patent Citations (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5157781A (en) * | 1990-01-02 | 1992-10-20 | Motorola, Inc. | Data processor test architecture |
| JPH0843500A (en) * | 1994-08-02 | 1996-02-16 | Toshiba Corp | Analog-input/output-board testing apparatus |
| US6269150B1 (en) * | 1998-06-11 | 2001-07-31 | Lucent Technologies, Inc. | Reliable, unattended, automated testing system and method for complex telecommunication systems |
| US20020124042A1 (en) * | 2001-03-02 | 2002-09-05 | Douglas Melamed | System and method for synchronizing execution of a test sequence |
| US20030070118A1 (en) * | 2001-10-09 | 2003-04-10 | Hitachi, Ltd. | Semiconductor integrated circuit with built-in test function |
| US20030208542A1 (en) * | 2002-05-01 | 2003-11-06 | Testquest, Inc. | Software test agents |
| US20050257076A1 (en) * | 2004-05-15 | 2005-11-17 | Hon Hai Precision Industry Co., Ltd. | System and method for controlling power sources of motherboards under test through networks |
| US20060243071A1 (en) * | 2004-09-10 | 2006-11-02 | Sagi-Dolev Alysia M | Multi-threat detection system |
| US20070245199A1 (en) * | 2006-03-31 | 2007-10-18 | Robert Pochowski | Application Specific Distributed Test Engine Architecture System And Method |
| CN202548303U (en) * | 2012-04-05 | 2012-11-21 | 浙江昱能光伏科技集成有限公司 | Automatic production test bench for photovoltaic grid-connected micro inverter |
| CN102654542A (en) * | 2012-05-09 | 2012-09-05 | 福建联迪商用设备有限公司 | Method for realizing test automation by utilizing bar code |
| CN105519168A (en) * | 2013-09-03 | 2016-04-20 | 莱特普茵特公司 | Method for testing data packet signal transceivers with multiple radio access technologies using interleaved device setup and testing |
| WO2015158178A1 (en) * | 2014-04-16 | 2015-10-22 | 烽火通信科技股份有限公司 | System, method and apparatus for automatically testing otn protection switching |
| CN104168349A (en) * | 2014-07-31 | 2014-11-26 | 东莞市诺丽电子科技有限公司 | Smart phone test equipment and test method thereof |
| CN205120846U (en) * | 2015-09-11 | 2016-03-30 | 珠海科德电子有限公司 | Many function test system of two mesas |
| CN105527586A (en) * | 2015-12-30 | 2016-04-27 | 常州星宇车灯股份有限公司 | Automatic detection device and detection method for trunk lamp |
| CN205562698U (en) * | 2016-02-18 | 2016-09-07 | 江西洪都航空工业集团有限责任公司 | Electrical accessory tester |
| CN205405254U (en) * | 2016-03-04 | 2016-07-27 | 武汉力神动力电池系统科技有限公司 | Battery management system master control unit test system |
| CN206162177U (en) * | 2016-08-31 | 2017-05-10 | 浙江创亿光电设备有限公司 | Production automation system |
| CN206114254U (en) * | 2016-11-07 | 2017-04-19 | 惠州市德赛西威汽车电子股份有限公司 | Vehicle combined detection system |
| WO2018119149A1 (en) * | 2016-12-20 | 2018-06-28 | Rainforest Qa, Inc. | Electronic product testing systems |
| CN106933217A (en) * | 2017-04-05 | 2017-07-07 | 武汉南斗六星系统集成有限公司 | A kind of automatic checkout equipment of central vehicle control unit |
| CN107239331A (en) * | 2017-05-23 | 2017-10-10 | 中国电子科技集团公司第四十研究所 | A kind of synchronous triggering execution method of concurrent testing task |
| US20190114045A1 (en) * | 2017-10-13 | 2019-04-18 | Rainforest Qa, Inc. | Electronic product testing systems |
| US20190187200A1 (en) * | 2017-12-20 | 2019-06-20 | Keyssa Systems, Inc. | System and method for rf and jitter testing using a reference device |
| CN108007607A (en) * | 2017-12-28 | 2018-05-08 | 惠州市德赛西威汽车电子股份有限公司 | A kind of vehicle interior temperature sensor detector |
| US20190317886A1 (en) * | 2018-04-13 | 2019-10-17 | Rainforest Qa, Inc. | Electronic product testing systems |
| CN111383706A (en) * | 2018-12-28 | 2020-07-07 | 海太半导体（无锡）有限公司 | Centralized control system of functional test equipment |
| CN209994436U (en) * | 2019-04-19 | 2020-01-24 | 深圳市巨丰泰自动化设备技术有限公司 | MMI automatic testing machine for functional mobile phone |
| CN110749595A (en) * | 2019-09-05 | 2020-02-04 | 惠州市德赛西威汽车电子股份有限公司 | Automatic testing device and method |
| CN210804110U (en) * | 2019-12-28 | 2020-06-19 | 张家港市诚远电子有限公司 | Fan controller detection equipment |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113001495A (en) * | 2021-03-10 | 2021-06-22 | 机械工业第九设计研究院有限公司 | Multifunctional tool cabinet |
| CN113865826A (en) * | 2021-08-31 | 2021-12-31 | 广东省威汇智能科技有限公司 | Display screen module detection device and detection system |
| CN113865826B (en) * | 2021-08-31 | 2024-04-09 | 广东省威汇智能科技有限公司 | Display screen module detection device and detection system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112056760B (en) | 2023-01-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108732443B (en) | Automatic test system and method based on Linux | |
| CN112056760B (en) | One-stop test system and method | |
| TWI389540B (en) | Method for testing multiple mobile communication devices and a rf testing system thereof | |
| CN103293466B (en) | A kind of method and system thereof of testing communication module on embedded PCB A | |
| CN104502743A (en) | Automatic testing system and method for power management product based on Labview | |
| CN103048581A (en) | Cable testing device | |
| CN105258720A (en) | Automation testing system and method | |
| CN205880146U (en) | General automatic test platform | |
| CN102331569B (en) | Intelligent interactive detection apparatus for detection on electric energy meter | |
| CN215219508U (en) | A test fixture for machine controller | |
| CN103323809A (en) | Electric energy meter test equipment | |
| CN103323767B (en) | A kind of method and system thereof of testing bluetooth module on embedded PCB A | |
| CN201607507U (en) | Intelligent backboard test system | |
| CN210038541U (en) | Function test system of motor controller PCBA board | |
| CN107924172A (en) | A kind of digital control mainboard automatization test system | |
| CN103336241A (en) | Method and system for testing Modem module on embedded PCBA (Printed Circuit Board Assembly) | |
| CN113608514A (en) | A test fixture for machine controller | |
| CN114168482A (en) | Test method of vehicle control unit | |
| CN113267095A (en) | Portable missile automatic test diagnosis device and diagnosis method | |
| CN219625643U (en) | Nuclear power board card testing device | |
| CN112003656A (en) | System and method for testing vehicle-mounted wireless communication terminal assembly product | |
| CN210348779U (en) | Carrier wave copying controller switching device | |
| CN217718036U (en) | Testing device for safety power supply | |
| CN116360364A (en) | Spindle position board card ID setting system of multi-spindle position equipment | |
| CN116859894B (en) | Automatic test method for helicopter internal electronic regulator based on multi-agent technology |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20230801 Address after: Room 620 J512, No. 6, Lane 599, Yungu Road, Jiading District, Shanghai, 201800 Patentee after: Shanghai Velcro Automotive Electronics Co.,Ltd. Address before: No. 103, Hechang 5th Road West, Zhongkai high tech Zone, Huizhou City, Guangdong Province Patentee before: HUIZHOU DESAY SV AUTOMOTIVE Co.,Ltd. |