CN107924172A - A kind of digital control mainboard automatization test system - Google Patents
A kind of digital control mainboard automatization test system Download PDFInfo
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- CN107924172A CN107924172A CN201580080838.9A CN201580080838A CN107924172A CN 107924172 A CN107924172 A CN 107924172A CN 201580080838 A CN201580080838 A CN 201580080838A CN 107924172 A CN107924172 A CN 107924172A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
Abstract
The invention discloses a kind of digital control mainboard automatization test system, including：Test digital control mainboard (1100) and tested digital control mainboard (1200), test digital control mainboard (1100) is connected with tested digital control mainboard (1200), for being tested under the control of test software tested digital control mainboard (1200).Since the corresponding test module of connecting interface with tested digital control mainboard (1200) can use the module tested digital control mainboard (1100) and carried, therefore the imput output circuit of test digital control mainboard (1100) need to only be changed by software, such as the first data output interface is arranged to the first Data Input Interface by software control, the test signal that the first data output interface for receiving tested digital control mainboard (1200) exports, or the second Data Input Interface is arranged to the second data output interface by software control, for exporting test signal to the second Data Input Interface of tested digital control mainboard (1200), the tested digital control mainboard (1200) of test digital control mainboard (1100) test can be used, therefore the development cost of numerical control test board is reduced.
Description
The application implementation is related to digital control system field more particularly to a kind of digital control mainboard automatization test system.
With the raising of Chinese human cost, the fast development of machine-tool industry, the demand that digital control system manufacturer tests product automation is more more and more urgent.Semi-automatic testing scheme and two kinds of automatic test scheme generally can be divided into for the testing scheme of digital control mainboard, wherein automatic test scheme is used widely because having many advantages, such as that test is comprehensive, testing efficiency is high.
The automatization test system of digital control mainboard generally comprises the numerical control test board of digital control mainboard to be measured and customization.Wherein, the numerical control test board of customization designs corresponding test module for connecting interfaces different on digital control mainboard to be measured.
Existing automatic test scheme designs corresponding test module due to the distinct interface that be directed on digital control mainboard to be measured, customizes numerical control test board, thus haves the defects that development cost is big.
Summary of the invention
The one side of the embodiment of the present invention provides a kind of digital control mainboard automatization test system, comprising:
Digital control mainboard and tested digital control mainboard are tested, test digital control mainboard is connected with tested digital control mainboard, for testing under the control of the test software tested digital control mainboard；
First data output interface of test digital control mainboard is arranged to the first Data Input Interface by software control, the test signal that the first data output interface for receiving tested digital control mainboard exports；
Second Data Input Interface of test digital control mainboard is arranged to the second data output interface by software control, for exporting test signal to the second Data Input Interface of tested digital control mainboard；
The third Data Input Interface of test digital control mainboard is connected with the third data output interface of tested digital control mainboard, the test signal that the third data output interface for receiving tested digital control mainboard exports；
4th data output interface of test digital control mainboard is connected with the 4th Data Input Interface of tested digital control mainboard, for exporting test signal to the 4th Data Input Interface of tested digital control mainboard；
The debugging interface of test digital control mainboard is connected with the debugging interface of tested digital control mainboard, instructs and receive its test result fed back for exporting test to tested digital control mainboard.
With reference to first aspect, in the first possible implementation of the first aspect, it tests on digital control mainboard
Test software is installed.
With reference to first aspect or the first possible implementation of first aspect, in the second possible implementation of the first aspect, digital control mainboard automatization test system further includes host computer, test software is installed on host computer, host computer is connected with test digital control mainboard, tests for controlling test digital control mainboard tested digital control mainboard.
With reference to first aspect, among the possible implementation of the first of first aspect and second of possible implementation of first aspect any one, in a third possible implementation of the first aspect, the first data output interface includes main shaft output interface and/or axis servomotor output interface.
With reference to first aspect, among the third possible implementation of the possible implementation of the first of first aspect, second of possible implementation of first aspect and first aspect any one, in a fourth possible implementation of the first aspect, the second Data Input Interface is handwheel input interface.
With reference to first aspect, among the 4th kind of possible implementation of the possible implementation of the first of first aspect, second of possible implementation of first aspect, the third possible implementation of first aspect and first aspect any one, in the fifth possible implementation of the first aspect, third Data Input Interface and the 4th Data Input Interface are that external digital inputs EDI interface, and third data output interface and the 4th data output interface are that external digital exports EDO interface.
With reference to first aspect, among the 5th kind of possible implementation of the possible implementation of the first of first aspect, second of possible implementation of first aspect, the third possible implementation of first aspect, the 4th kind of possible implementation of first aspect and first aspect any one, in the sixth possible implementation of the first aspect, tested digital control mainboard further includes flying probe module.
With reference to first aspect, among the 6th kind of possible implementation of the possible implementation of the first of first aspect, second of possible implementation of first aspect, the third possible implementation of first aspect, the 4th kind of possible implementation of first aspect, the 5th kind of possible implementation of first aspect and first aspect any one, in a seventh possible implementation of the first aspect, flying probe module includes supply voltage detection unit and crystal oscillator detection unit.
With reference to first aspect, among the 7th kind of possible implementation of the possible implementation of the first of first aspect, second of possible implementation of first aspect, the third possible implementation of first aspect, the 4th kind of possible implementation of first aspect, the 5th kind of possible implementation of first aspect, the 6th kind of possible implementation of first aspect and first aspect any one, in the 8th kind of possible implementation of first aspect, flying probe module includes supply voltage detection unit and crystal oscillator detection unit.
With reference to first aspect, the possible implementation of the first of first aspect, the possible implementation of second of first aspect, the third possible implementation of first aspect, 4th kind of possible implementation of first aspect, 5th kind of possible implementation of first aspect, 6th kind of possible implementation of first aspect, among 7th kind of possible implementation of first aspect and the 8th kind of possible implementation of first aspect any one, in the 9th kind of possible implementation of first aspect, supply voltage detection unit includes for analog-to-digital conversion ADC subelement needed for analog quantity test.
With reference to first aspect, the possible implementation of the first of first aspect, the possible implementation of second of first aspect, the third possible implementation of first aspect, 4th kind of possible implementation of first aspect, 5th kind of possible implementation of first aspect, 6th kind of possible implementation of first aspect, 7th kind of possible implementation of first aspect, among 8th kind of possible implementation of first aspect and the 9th kind of possible implementation of first aspect any one, in the tenth kind of possible implementation of first aspect, it tests digital control mainboard and tested digital control mainboard can be pulsed digital control mainboard, it may be bus type digital control mainboard.
With reference to first aspect, the possible implementation of the first of first aspect, the possible implementation of second of first aspect, the third possible implementation of first aspect, 4th kind of possible implementation of first aspect, 5th kind of possible implementation of first aspect, 6th kind of possible implementation of first aspect, 7th kind of possible implementation of first aspect, 8th kind of possible implementation of first aspect, among 9th kind of possible implementation of first aspect and the tenth kind of possible implementation of first aspect any one, in a kind of the tenth possible implementation of first aspect, the processor for testing digital control mainboard is X 86 processor or arm processor or on-site programmable gate array FPGA.
In scheme provided by the embodiments of the present application, the present invention is using digital control mainboard as the numerical control test board in digital control mainboard automatization test system, due to the module that test digital control mainboard can be used included with the corresponding test module of the connecting interface of tested digital control mainboard, the present invention need to only change the imput output circuit of test digital control mainboard by software, test digital control mainboard can be used to test tested digital control mainboard, therefore reduce the development cost of numerical control test board.
Fig. 1 is one embodiment schematic diagram of digital control mainboard automatization test system of the present invention；
Fig. 2 is another embodiment schematic diagram of digital control mainboard automatization test system of the present invention；
Fig. 3 is one embodiment schematic diagram of flying probe module in present invention test digital control mainboard；
Fig. 4 is another embodiment schematic diagram of digital control mainboard automatization test system of the present invention.
The embodiment of the invention provides a kind of digital control mainboard automatization test systems, using digital control mainboard as the numerical control test board in digital control mainboard automatization test system, it only need to change the imput output circuit of test digital control mainboard by software, therefore reduce the development cost of numerical control test board.
In order to enable those skilled in the art to better understand the solution of the present invention, following will be combined with the drawings in the embodiments of the present invention, technical scheme in the embodiment of the invention is clearly and completely described, obviously, the described embodiment is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, every other embodiment obtained by those of ordinary skill in the art without making creative efforts, should fall within the scope of the present invention.
Description and claims of this specification and the (if present)s such as term " first " in above-mentioned attached drawing, " second ", " third " " the 4th " are to be used to distinguish similar objects, without being used to describe a particular order or precedence order.It should be understood that the data used in this way are interchangeable under appropriate circumstances, so that the embodiments described herein can be implemented with the sequence other than the content for illustrating or describing herein.Furthermore, term " includes " and " having " and their any deformation, it is intended to cover and non-exclusive includes, such as, the process, method, system, product or equipment for containing a series of steps or units those of are not necessarily limited to be clearly listed step or unit, but may include other step or units being not clearly listed or intrinsic for these process, methods, product or equipment.
As shown in Figure 1, being one embodiment schematic diagram of digital control mainboard automatization test system of the present invention.
Digital control mainboard automatization test system is made of test digital control mainboard 1100 and tested digital control mainboard 1200, and test digital control mainboard 1100 is connected with tested digital control mainboard 1200, for testing under the control of the test software tested digital control mainboard 1200；
First data output interface of test digital control mainboard 1100 is arranged to the first Data Input Interface 1110 by software control, the test signal that the first data output interface 1210 for receiving tested digital control mainboard 1200 exports；
Second Data Input Interface of test digital control mainboard 1100 is arranged to the second data output interface 1120 by software control, for exporting test signal to the second Data Input Interface 1220 of tested digital control mainboard 1200；
The third Data Input Interface 1130 of test digital control mainboard 1100 is connected with the third data output interface 1230 of tested digital control mainboard 1200, the test signal that the third data output interface 1230 for receiving tested digital control mainboard 1200 exports；
4th data output interface 1140 of test digital control mainboard 1100 is connected with the 4th Data Input Interface 1240 of tested digital control mainboard 1200, for exporting test signal to the 4th Data Input Interface 1240 of tested digital control mainboard 1200；
The debugging interface 1150 of test digital control mainboard 1100 is connected with the debugging interface 1250 of tested digital control mainboard 1200, instructs and receive its test result fed back for exporting test to tested digital control mainboard 1200.
It should be noted that, processor is installed on test digital control mainboard 1100, the processor can be X86 series processors or arm processor or on-site programmable gate array FPGA, it may be other processors, it is not specifically limited herein, as long as can input and export by the signal of each interface of software control.It can change imput output circuit by changing software, it can control former input interface output signal, become output interface, also can control former output interface input signal, become input interface.
Due to having and tested 1200 identical data interface of digital control mainboard on test digital control mainboard 1100, therefore it only needs to change imput output circuit, so that identical data-interface is connected with each other on test digital control mainboard 1100 and tested digital control mainboard 1200, can mutually communication number, can be realized test digital control mainboard data-interface test function.
Test software can be mounted on test digital control mainboard by the present embodiment, that is, test digital control mainboard software is increased test function outside standard feature, so that not having to connection host computer can be tested.It should be noted that in actual use, test software can also be mounted on host computer, and host computer is connected with test digital control mainboard, tested digital control mainboard is tested for controlling test digital control mainboard.
In order to illustrate the interface of test digital control mainboard, referring to Fig.2, another embodiment of digital control mainboard automatization test system of the present invention includes:
Digital control mainboard automatization test system is made of test digital control mainboard 2100 and tested digital control mainboard 2200, and test digital control mainboard 2100 is connected with tested digital control mainboard 2200.
The first Data Input Interface 2110 of digital control mainboard 2100 is tested in the present embodiment, second data output interface 2120, third Data Input Interface 2130, first Data Input Interface 1110 of the 4th data output interface 2140 and debugging interface 2150 the test digital control mainboard 1100 in embodiment corresponding with Fig. 1 respectively, second data output interface 1120, third Data Input Interface 1130, 4th data output interface 1140 and debugging interface 1150 are identical, first data output interface 2210 of tested digital control mainboard 2200, second Data Input Interface 2220, third data output interface 2230, 4th Data Input Interface 2240 and the debugging interface 2250 tested digital control mainboard 120 in embodiment corresponding with Fig. 1 respectively 0 the first data output interface 1210, the second Data Input Interface 1220, third data output interface 1230, the 4th Data Input Interface
1240 and debugging interface 1250 it is identical, and connection relationship is identical between the interface between the interface in the present embodiment in connection relationship embodiment corresponding with Fig. 1, and details are not described herein again.
Wherein, first data output interface 2210 may include main shaft output interface 2211 and axis servomotor output interface 2212, in actual use, it is respectively used to the driving of connection axis servomotor and main shaft drives, corresponding first Data Input Interface may include main shaft input interface 2111 and axis servomotor input interface 2112.Second Data Input Interface 2220 can be handwheel input interface 2221, for connecting with handwheel, the signal of handwheel input be received, correspondingly, the second data output interface can be 2121.Third Data Input Interface 2130 can input EDI interface 2131 for external digital, 4th data output interface 2140 can export EDO interface 2140 for external digital, third data output interface 2230 can export EDO interface 2231 for external digital, 4th Data Input Interface 2240 can input EDI interface 2241 for external digital, input and output forceful electric power signal, such as 24V electric signal.
It is understood that the interface in the present embodiment can also be other data-interfaces, it is not specifically limited herein.
Flying probe can also be carried out in digital control mainboard automatization test system by increasing flying probe module in test digital control mainboard, referring to Fig. 3, the schematic diagram of the flying probe module for present invention test digital control mainboard.
Whether flying probe module 3000 includes supply voltage detection unit 3100 and crystal oscillator detection unit 3200, normal for detecting supply voltage and crystal oscillator.Analog-to-digital conversion ADC subelement 3101 is additionally provided in this supply voltage detection unit, for carrying out analog quantity test.
In order to make it easy to understand, specifically being introduced digital control mainboard automatization test system below, refering to Fig. 4, another embodiment of digital control mainboard automatization test system of the present invention includes:
Digital control mainboard automatization test system includes LCD screen 4300, test digital control mainboard 4100 and tested digital control mainboard 4200, and test digital control mainboard 4100 is connected with tested digital control mainboard 4200, for testing under the control of the test software tested digital control mainboard 4200；
The main shaft output interface of test digital control mainboard 4100 becomes main shaft input interface 4110 by software control, the test signal that the main shaft output interface 4210 for receiving tested digital control mainboard 4200 exports；
The axis servomotor output interface of test digital control mainboard 4100 becomes axis servomotor input interface 4120 by software control, the test signal that the axis servomotor output interface 4220 for receiving tested digital control mainboard 4200 exports；
For the test digital control mainboard 4100 and tested digital control mainboard 4200 of the present embodiment by taking common four axis servomotors and single main spindle numerical control mainboard as an example, axis servomotor input interface 4120 is defeated including X-axis input interface 4121, Y-axis
Incoming interface 4122, the axis of Z axis input interface 4123 and 4 input interface 4124, axis servomotor output interface 4220 include X-axis output interface 4221, Y-axis output interface 4222, the axis of Z axis output interface 4223 and 4 output interface 4224；
The handwheel input interface and keyboard input interface for testing digital control mainboard 4100 pass through software control becomes handwheel output interface 4130 and keyboard output port 4140 respectively, exports handwheel input interface 4230 from test signal to tested digital control mainboard 4200 and keyboard input interface 4240 respectively；
The external digital input EDI interface 4150 of test digital control mainboard 4100 is connected with the external digital of tested digital control mainboard 4200 output EDO interface 4250, the test signal that the EDO interface for receiving tested digital control mainboard exports；
The EDO interface 4160 of test digital control mainboard 4100 is connected with the EDI interface 4260 of tested digital control mainboard 4200, for exporting test signal to the EDI interface of tested digital control mainboard；
The debugging interface 4170 of test digital control mainboard 4100 is connected with the debugging interface 4270 of tested digital control mainboard 4200, its test result fed back is instructed and receive for exporting test to tested digital control mainboard, by taking RS232 interface as an example；
Test digital control mainboard 4100 is connected by LCD connecting interface 4 with LCD screen 4300, for monitoring test process, display test result；
Test software is installed on test digital control mainboard 4100；
Testing digital control mainboard 4100 may include USB interface 4180, and whether the USB interface 4280 for testing tested digital control mainboard 4200 being capable of normal read data；
Testing digital control mainboard 4100 can also include Ethernet interface 4190, and whether 4290 function of Ethernet interface for detecting tested digital control mainboard 4200 is normal.
It is understood that test digital control mainboard can also include other interfaces, it is not specifically limited herein.
Testing process is as follows:
1, digital control mainboard, tested digital control mainboard and LCD screen will be tested refering to Fig. 4 to be attached, and digital control mainboard automatization test system is powered on.
2, test software is run.
3, test digital control mainboard exports test signal to tested digital control mainboard and receives the test signal that tested digital control mainboard exports, and tests the interface of tested digital control mainboard, whether the function of detecting each input/output interface is normal.
4, test result is saved on testing host, and shows test process and test result on the lcd screen,
Test result includes normal interface message and abnormal interface message.
In several embodiments provided herein, it should be understood that disclosed system, device and method may be implemented in other ways.Such as, the apparatus embodiments described above are merely exemplary, such as, the division of the unit, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or components can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, shown or discussed mutual coupling, direct-coupling or communication connection can be through some interfaces, the indirect coupling or communication connection of device or unit, can be electrical property, mechanical or other forms.
The above, the above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although the present invention is described in detail referring to the foregoing embodiments, those skilled in the art should understand that: it is still possible to modify the technical solutions described in the foregoing embodiments or equivalent replacement of some of the technical features；And these are modified or replaceed, the spirit and scope for technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution.
Claims (11)
- A kind of digital control mainboard automatization test system characterized by comprisingTest digital control mainboard and tested digital control mainboard, the test digital control mainboard are connected with the tested digital control mainboard, for testing under the control of the test software the tested digital control mainboard；First data output interface of the test digital control mainboard is arranged to the first Data Input Interface by software control, the test signal that the first data output interface for receiving the tested digital control mainboard exports；Second Data Input Interface of the test digital control mainboard is arranged to the second data output interface by software control, for exporting test signal to the second Data Input Interface of the tested digital control mainboard；The third Data Input Interface of the test digital control mainboard is connected with the third data output interface of the tested digital control mainboard, the test signal that the third data output interface for receiving the tested digital control mainboard exports；4th data output interface of the test digital control mainboard is connected with the 4th Data Input Interface of the tested digital control mainboard, for exporting test signal to the 4th Data Input Interface of the tested digital control mainboard；The debugging interface of the test digital control mainboard is connected with the debugging interface of the tested digital control mainboard, for instructing and receiving its test result fed back to the tested digital control mainboard output test.
- Digital control mainboard automatization test system according to claim 1, which is characterized in that be equipped with test software on the test digital control mainboard.
- Digital control mainboard automatization test system according to claim 1, it is characterized in that, the digital control mainboard automatization test system further includes host computer, test software is installed on the host computer, the host computer is connected with the test digital control mainboard, tests for controlling the test digital control mainboard the tested digital control mainboard.
- Digital control mainboard automatization test system according to claim 1, which is characterized in that first data output interface includes main shaft output interface and/or axis servomotor output interface.
- Digital control mainboard automatization test system according to claim 1, which is characterized in that second Data Input Interface is handwheel input interface.
- Digital control mainboard automatization test system according to claim 1, it is characterized in that, the third Data Input Interface and the 4th Data Input Interface are that external digital inputs EDI interface, and the third data output interface and the 4th data output interface are that external digital exports EDO interface.
- Digital control mainboard automatization test system according to any one of claim 1 to 6, which is characterized in that the tested digital control mainboard further includes flying probe module.
- Digital control mainboard automatization test system according to claim 7, which is characterized in that the flying probe module includes supply voltage detection unit and crystal oscillator detection unit.
- Digital control mainboard automatization test system according to claim 8, which is characterized in that the supply voltage detection unit includes for analog-to-digital conversion ADC subelement needed for analog quantity test.
- Digital control mainboard automatization test system according to any one of claim 1 to 6, which is characterized in that the test digital control mainboard and the tested digital control mainboard are pulsed digital control mainboard.
- Digital control mainboard automatization test system according to any one of claim 1 to 6, which is characterized in that the processor of the test digital control mainboard is x86 processor or arm processor or on-site programmable gate array FPGA.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2015/100177 WO2017113321A1 (en) | 2015-12-31 | 2015-12-31 | Automatic test system for numerical control mainboard |
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| CN107924172A true CN107924172A (en) | 2018-04-17 |
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| CN201580080838.9A Pending CN107924172A (en) | 2015-12-31 | 2015-12-31 | A kind of digital control mainboard automatization test system |
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| WO (1) | WO2017113321A1 (en) |
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| CN113360363A (en) * | 2020-03-04 | 2021-09-07 | 腾讯科技（深圳）有限公司 | Test method, device, equipment and computer storage medium for micro service system |
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| CN110417660B (en) * | 2019-08-07 | 2022-02-15 | 南方电网科学研究院有限责任公司 | Communication control method, inter-station router device and simulation test system |
| CN111405202B (en) * | 2020-03-24 | 2022-11-01 | 深圳创维－Rgb电子有限公司 | TCONLESS mainboard signal conversion device and detection system |
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| WO2017113321A1 (en) | 2017-07-06 |
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Application publication date: 20180417 |
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