CN112034321B - Method for evaluating functional performance of fast soft recovery diode - Google Patents
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Abstract
The invention relates to a method for evaluating the functional performance of a fast soft recovery diode, in particular to a method for evaluating the functional performance of a fast soft recovery diode based on safety working area verification, and belongs to the technical field of component application verification. Whether the rapid soft recovery diode meets the application requirements is checked by performing comprehensive functional performance evaluation on the rapid soft recovery diode, and the evaluation contents comprise correlation characteristics of forward voltage and forward current under different temperature conditions, correlation characteristics of reverse withstand voltage and reverse leakage current under different temperature conditions, correlation characteristics of reverse recovery time and temperature, correlation characteristics of reverse recovery current and temperature, steady-state power safety working area verification and surge power safety working area verification. The method combines the user requirements and the device characteristics to provide a comprehensive verification project of the functional performance of the fast soft recovery diode based on the safe working area verification.
Description
Technical Field
The invention relates to a method for evaluating the functional performance of a fast soft recovery diode, in particular to a method for evaluating the functional performance of a fast soft recovery diode based on safety working area verification, and belongs to the technical field of component application verification.
Background
The fast soft recovery diode is widely used for power supply circuits in aerospace models to achieve functions of rectification, follow current or isolation. At present, the aerospace industry in China is in a high-speed development stage, a plurality of major aerospace projects such as long-life satellites, manned aerospace projects, lunar exploration projects and the like are all performed in a tense manner, and with the development of a new generation of spacecraft, the demand for various aerospace-level components is increased increasingly.
At present, manufacturers capable of producing aerospace-grade components internationally are all concentrated in the United states, and are mainly concentrated in a few manufacturers such as MICROSOFI EMI and IR. The manufacturers in China develop the fast soft recovery diode in succession, and because a certain gap still exists between the diode and the like products abroad at a later start, the problems of low maturity, imperfect component assessment index system and the like exist, and certain application risks exist. In order to ensure the application reliability of the device, comprehensive functional performance evaluation on the fast soft recovery diode for aerospace needs to be urgently needed, the application reliability is improved, and the application risk of aerospace models is reduced.
The fast soft recovery diode usually adopts a PIN structure or an MPS structure, when the diode is switched from forward conduction to reverse cutoff, a reverse current overshoot is generated, namely when the diode is switched on in the forward direction, a large number of holes are injected from a heavily doped P region to a lightly doped N-drift region, the holes are stored in the N-drift region in a minority carrier mode, when a reverse bias voltage is suddenly applied to the device, stored charges form a reverse recovery current under the action of a reverse voltage, and the process of charge extraction or recombination is a reverse recovery process. Because the fast soft recovery rectifier diode is mostly used for rectification in the power circuit, the output voltage stability of the power circuit is directly affected by the overshoot of the reverse current, i.e. the reverse recovery current, and even the output of the power circuit is reduced to a level that cannot meet the requirements of the later stage circuit. The forward electrical characteristics and the reverse electrical characteristics of the fast soft recovery rectifier diode are directly related to the power supply conversion effect of the rectifier circuit, and the fast soft recovery rectifier diode is particularly concerned in space navigation application and needs to be fully evaluated. The steady-state power safety working area and the surge power safety working area of the fast soft recovery rectifier diode are directly related to the safety application of the fast soft recovery rectifier diode in an aerospace model and need to be fully evaluated and verified.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the defects of the prior art are overcome, and the method for evaluating the functional performance of the fast soft recovery diode based on the safe working area verification is provided.
The technical solution of the invention is as follows:
a method for evaluating the functional performance of a fast soft recovery diode based on the verification of a safe working area comprises the following steps:
(1) The method for evaluating the correlation characteristics of the forward voltage and the forward current under different temperature conditions obtains correlation curves of the forward voltage and the forward current of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature;
(2) The method for evaluating the correlation characteristics of reverse withstand voltage and reverse leakage current under different temperature conditions obtains the correlation curve of the reverse leakage current and the reverse voltage of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature;
(3) The method for evaluating the reverse recovery characteristics under different temperature conditions obtains the fast soft recovery diode at room temperature, the highest rated working temperature, the lowest rated working temperature, the highest aerospace application environment temperature and the lowest aerospace application environment temperature FM Test at stress and 50% FM Testing a reverse recovery characteristic curve under stress;
(4) The method for evaluating the correlation characteristics of reverse recovery time and temperature obtains the correlation characteristics of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature FM Test stress and 50% by volume I FM Testing a reverse recovery time and temperature correlation curve under stress;
(5) The method for evaluating the correlation characteristics of the reverse recovery current and the temperature obtains the correlation characteristics of the fast soft recovery diode under the conditions of room temperature, the highest rated working temperature, the lowest rated working temperature, the highest aerospace application environment temperature and the lowest aerospace application environment temperature FM Test stress and 50% by volume I FM Testing a reverse recovery current and temperature correlation curve under stress;
(6) The method for evaluating the verification of the steady-state power safety working area obtains the limit value of the steady-state power safety working area of the fast soft recovery diode;
(7) The method for evaluating the verification of the transient power safe working area obtains the limit value of the transient power safe working area of the fast soft recovery diode;
(8) Determining (I) according to the correlation curve of the forward voltage and the forward current and the correlation curve of the reverse leakage current and the reverse voltage of the fast soft recovery diode obtained in the step (1) and the step (2) under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature, and the temperature condition of practical application and the variation range thereof F ，V F ) And (V) R ，I R ) The variation range of the power supply is further determined, and the power consumption range is further determined when the power supply is applied to rectification, follow current or isolation of a secondary power supply, so that guidance is provided for thermal design or power supply conversion efficiency;
(9) The fast soft recovery diode obtained in the steps (3), (4) and (5) is under the conditions of room temperature, rated highest working temperature, rated lowest working temperature, highest aerospace application environment temperature and lowest aerospace application environment temperature and is under the condition I FM Test stress and 50% by volume I FM Testing a reverse recovery current and temperature correlation curve and a reverse recovery time and temperature correlation curve under stress, obtaining reverse recovery time and reverse recovery current when in application from the curves, and determining the influence of reverse recovery on output voltage according to the reverse recovery time and the reverse recovery current;
(10) Verifying the steady-state power safety working area through the step (6) to obtain the limit value of the steady-state power safety working area of the fast soft recovery diode; and (5) verifying the transient power safe working area through the step (7) to obtain the transient power safe working area of the fast soft recovery diode, wherein the transient power safe working area is used for guiding the design allowance of the fast soft recovery diode.
Compared with the prior art, the invention has the beneficial effects that:
(1) The invention provides a complete and comprehensive method for evaluating the functional performance of the fast soft recovery diode for space navigation, which can adjust and test verification items or methods at any time according to the application verification requirements of devices and has important significance for verifying the functional performance of the fast soft recovery diode for space navigation.
(2) Compared with the conventional quality assurance method for the fast soft recovery diode, the method provided by the invention has the advantages that the forward characteristic and the reverse characteristic under different temperature conditions are evaluated, and a forward voltage and forward current correlation curve and a reverse leakage current and reverse voltage correlation curve of the device under the conditions of the highest rated working temperature of the device, the lowest rated working temperature of the device, the highest aerospace application environment temperature and the lowest aerospace application environment temperature are provided.
(3) Compared with the conventional quality assurance method for the fast soft recovery diode, the method has the advantages that 50% (50% I) of the maximum rated value of the forward rectifying current of the device is obtained through evaluating the correlation characteristic of the reverse recovery characteristic and the temperature FM ) The reverse recovery time versus temperature and reverse recovery current versus temperature curves under stress conditions were tested.
(4) Compared with the conventional quality assurance method for the fast soft recovery diode, the method provided by the invention carries out verification tests on the steady-state power safe working area and the transient power safe working area of the device, thereby verifying the rationality of the setting of the device index system.
(5) A rapid soft recovery diode functional performance evaluation method based on safe working area verification is characterized in that whether the rapid soft recovery diode meets application requirements is verified through comprehensive functional performance evaluation on the rapid soft recovery diode, and evaluation contents comprise correlation characteristics of forward voltage and forward current under different temperature conditions, correlation characteristics of reverse withstand voltage and reverse leakage current under different temperature conditions, correlation characteristics of reverse recovery time and temperature, correlation characteristics of reverse recovery current and temperature, steady-state power safe working area verification and surge power safe working area verification. The method combines the user requirements and the device characteristics to provide a comprehensive verification project of the functional performance of the fast soft recovery diode based on the safe working area verification.
Drawings
FIG. 1 is a schematic flow chart of the method of the present invention.
Detailed Description
The invention is further illustrated by the following examples in conjunction with the drawings.
Examples
As shown in fig. 1, a method for evaluating the functional performance of a fast soft recovery diode based on safety working area verification is to evaluate seven characteristics of the fast soft recovery diode, wherein the seven characteristics are respectively:
correlation characteristics of forward voltage and forward current under different temperature conditions;
the correlation characteristics of reverse voltage resistance and reverse leakage current under different temperature conditions;
reverse recovery characteristics under different temperature conditions;
correlation of reverse recovery time with temperature;
reverse recovery current versus temperature;
verifying a steady-state power safety working area;
verifying a safe working area of transient power;
the method comprises the following steps:
(1) A method for evaluating correlation characteristics of forward voltage and forward current under different temperature conditions;
(2) A method for evaluating correlation characteristics of reverse withstand voltage and reverse leakage current under different temperature conditions;
(3) A method for evaluating reverse recovery characteristics under different temperature conditions;
(4) A method for evaluating the correlation characteristics of reverse recovery time and temperature;
(5) A method for evaluating the correlation characteristic of the reverse recovery current and the temperature;
(6) A method for evaluating the verification of a steady-state power safety working area;
(7) A method for evaluating the verification of the safe working area of the transient power;
the method for evaluating the correlation characteristics of the forward voltage and the forward current under different temperature conditions comprises the following steps:
(1.1) testing forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents at room temperature, solving the average value of the voltages of the plurality of fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) as the forward current-forward voltage value F ，V F ) Is represented by the formula I F Denotes forward current, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a correlation curve of forward voltage and forward current at room temperature;
(1.2) testing the forward voltages of a plurality of quick soft recovery diodes under the condition of a plurality of forward currents given by the quick soft recovery diodes under the condition of the highest rated working temperature of the quick soft recovery diodes, solving the average voltage value of the plurality of quick soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) F ，V F ) Is represented by F Denotes the forward current, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a forward voltage and forward current correlation curve of the fast soft recovery diode under the condition of the rated working highest temperature;
(1.3) testing the forward voltages of a plurality of quick soft recovery diodes under the condition of a plurality of forward currents given by the quick soft recovery diodes under the condition of rated working lowest temperature of the quick soft recovery diodes, solving the average value of the voltages of the plurality of quick soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) as the forward current-forward voltage value F ，V F ) Is represented by the formula I F Denotes the forward current, V F Representing forward voltages, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a forward voltage and forward current correlation curve under the condition of the rated working minimum temperature of the fast soft recovery diode;
(1.4) testing the forward direction of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward current under the condition of highest temperature in space navigation application environment of the fast soft recovery diodesVoltage, and calculating the average voltage value of the fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) F ，V F ) Is represented by F Denotes forward current, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a forward voltage and forward current correlation curve of the fast soft recovery diode under the condition of the highest temperature of the aerospace application environment;
(1.5) testing the forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents under the condition of the minimum temperature of the aerospace application environment of the fast soft recovery diodes, solving the average value of the voltages of the plurality of fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) to obtain the forward current-forward voltage value F ，V F ) Is represented by F Denotes the forward current, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a correlation curve of forward voltage and forward current under the condition of the minimum temperature of the aerospace application environment of the fast soft recovery diode;
the forward given current has the following value ranges: the maximum rated value of the forward rectifying current of the fast soft recovery diode is used as the maximum value of the forward current, the minimum value of the forward current is zero, and the testing step length is determined according to the application requirements of the aerospace model;
the method for evaluating the correlation characteristics of reverse withstand voltage and reverse leakage current under different temperature conditions comprises the following steps:
(2.1) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage at room temperature, calculating the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage at room temperature；
The value range of the reverse voltage is as follows: the reverse maximum working voltage of the fast soft recovery diode is used as the maximum value of the reverse voltage, the minimum value of the reverse voltage is zero, and the test step length is determined according to the application requirements of the aerospace model;
(2.2) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage under the condition of the highest rated working temperature of the fast soft recovery diodes, solving the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using the reverse leakage currents as (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of the rated working highest temperature of the fast soft recovery diode;
(2.3) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage under the condition of rated working lowest temperature of the fast soft recovery diodes, solving the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using the reverse leakage currents as (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of the rated working minimum temperature of the fast soft recovery diode;
(2.4) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage under the condition of highest temperature of space navigation application environment of the fast soft recovery diodes, calculating the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using the reverse leakage currents as (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of the highest temperature of the aerospace application environment of the fast soft recovery diode;
(2.5) testing reverse leakage currents of a plurality of rapid soft recovery diodes under the condition of given reverse voltage under the condition of the lowest temperature of space navigation application environment of the rapid soft recovery diodes, and solving the average value of the reverse leakage currents of the plurality of rapid soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents for use as (V) R ，I R ) Is represented by the formula I R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of the aerospace application environment lowest temperature of the fast soft recovery diode;
the value range of the reverse voltage is as follows: the reverse maximum working voltage of the fast soft recovery diode is used as the maximum value of the reverse voltage, the minimum value of the reverse voltage is zero, and the test step length is determined according to the application requirements of the aerospace model;
the method for evaluating the reverse recovery characteristics under different temperature conditions comprises the following steps:
(3.1) testing fast soft recovery diodes at room temperature I FM Test at stress and 50% FM Testing a reverse recovery waveform under stress; I.C. A FM Test stress is the maximum rated value of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.2) testing the rated maximum working temperature of the fast soft recovery diode at I FM Test stress and 50% by volume I FM Testing the reverse recovery waveform under stress; I.C. A FM Test stress is the maximum rating of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.3) testing the fast soft recovery diode at I under the rated minimum working temperature of the fast soft recovery diode FM Test stress and 50% by volume I FM Testing stressA lower reverse recovery waveform; i is FM Test stress is the maximum rated value of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.4) testing the maximum temperature of the fast soft recovery diode in the aerospace application environment at I FM Test stress and 50% by volume I FM Testing a reverse recovery waveform under stress; I.C. A FM Test stress is the maximum rating of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.5) testing the minimum temperature of the fast soft recovery diode in the aerospace application environment at I FM Test stress and 50% by volume I FM Testing the reverse recovery waveform under stress; i is FM Test stress is the maximum rated value of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
the method for evaluating the correlation characteristic of the reverse recovery time and the temperature comprises the following steps:
(4.1) at a set temperature T Is provided with Testing a plurality of fast soft recovery diodes I FM Testing the reverse recovery time under stress condition, and calculating the average value of the reverse recovery time of the fast soft recovery diodes to obtain a plurality of groups of set temperature-reverse recovery time for (T) Is provided with ，t rr ) Denotes, T Is provided with Indicating the set temperature, t rr Representing reverse recovery time, and applying the obtained groups (T) Is provided with ，t rr ) Performing curve fitting to obtain I FM Testing a reverse recovery time and temperature correlation curve under a stress condition;
the value range of the set temperature is as follows: the minimum value is the rated working lowest temperature of the fast soft recovery diode, the maximum value is the rated working highest temperature of the fast soft recovery diode, and the testing step length is determined according to the application requirements of the aerospace model;
(4.2) at a set temperature T Is provided with Testing several fast soft recovery diodes 50% FM Testing of the inverse under stressThe recovery time is calculated, and the average value of the reverse recovery time of the plurality of fast soft recovery diodes is obtained to obtain a plurality of groups of set temperature-reverse recovery time for (T) Is provided with ，t rr ) Denotes, T Is provided with Indicating the set temperature, t rr Representing reverse recovery time, and applying the obtained groups (T) Is provided with ，t rr ) Curve fitting was performed to obtain 50% FM Testing a reverse recovery time and temperature correlation curve under a stress condition;
the method for evaluating the correlation characteristic of the reverse recovery current and the temperature comprises the following steps:
(5.1) at a set temperature T Is provided with Testing a plurality of fast soft recovery diodes I FM Testing reverse recovery current under stress condition, and calculating average value of reverse recovery current of the multiple fast soft recovery diodes to obtain multiple sets of set temperature-reverse recovery current, and using (T) Is provided with ，I rr ) Denotes, T Is provided with Indicating a set temperature, I rr Representing reverse recovery current, and for the resulting sets (T) Is provided with ，I rr ) Performing curve fitting to obtain I FM Testing a reverse recovery time and temperature correlation curve under a stress condition;
the value range of the set temperature is as follows: the minimum value is the rated minimum working temperature of the fast soft recovery diode, the maximum value is the rated maximum working temperature of the fast soft recovery diode, and the test step length is determined according to the application requirements of space navigation models;
(5.2) at a set temperature T Is provided with Lower test several fast Soft recovery diodes 50% FM Testing the reverse recovery current under stress condition, and calculating the average value of the reverse recovery current of the fast soft recovery diodes to obtain a plurality of groups of set temperature-reverse recovery current for (T) Is provided with ，I rr ) Denotes, T Is provided with Indicating a set temperature, I rr Representing reverse recovery current, and for the resulting sets (T) Is provided with ，I rr ) Curve fitting was carried out to obtain 50% I FM Testing a reverse recovery current and temperature correlation curve under a stress condition;
the method for evaluating the verification of the steady-state power safety working area comprises the following steps:
(6.1) applying initial conditions to a plurality of fast soft recovery diodes for 168 hours, namely testing the initial conditions to be I F ＝I FM T =168h, ensuring the environmental condition as I by the heat dissipation device FM Corresponding temperature condition T, testing the plurality of fast soft recovery diodes according to an electrical characteristic table until 168h is reached after the test is finished, and judging whether the device fails or not;
(6.2) if at least one of the fast soft recovery diodes fails, it indicates that none of the fast soft recovery diodes can reach the maximum rated value (I) of the forward rectified current FM ) The safe working area of (1);
if the fast soft recovery diodes are not failed, the fact that the fast soft recovery diodes can reach the maximum rated value (I) of the forward rectifying current is shown FM ) The safe working area of (1), the test is continued, and the test condition is changed to I' F ＝I FM +ΔI F Step size Δ I F Selecting 2% of FM ～10％I FM T =168h, the heat sink is kept unchanged, i.e. the temperature condition and I of the test FM Corresponding temperature conditions T are not necessarily the same until the test is finished, and the plurality of fast soft recovery diodes are tested according to the electrical characteristic table to judge whether the device fails or not;
(6.3) if at least one of the fast soft recovery diodes fails, it indicates that the fast soft recovery diodes can reach the maximum rated value (I) of the forward rectifying current FM ) But the maximum rated value of the forward rectifying current of the device is designed to have a small margin, and the limit value of the forward rectifying current of the device is greater than I FM Is less than I F ＝I FM +ΔI F ；
If the fast soft recovery diode does not fail, the fast soft recovery diode can reach the forward rectification current I FM +ΔI F The test is continued, and the test conditions are changed to I " F ＝I FM +2ΔI F ，ΔI F For step size, t =168h, keep the heat sink unchanged, i.e. thisTemperature conditions of the sub-tests and I FM Corresponding temperature conditions T are not necessarily the same until the test is finished, and the plurality of fast soft recovery diodes are tested according to the electrical characteristic table to judge whether the device fails or not;
(6.4) performing tests and tests according to the step (6.3), increasing the step length until at least one of the fast soft recovery diodes fails, and realizing the evaluation of the limiting capacity of the forward rectifying current of the fast soft recovery diode;
t is T C Or T A ；
T C When the forward rectifying current of the fast soft recovery diode is at the maximum rated value (I) FM ) The highest temperature of the tube shell of the time-fast soft recovery diode;
T A when the forward rectifying current of the fast soft recovery diode is at the maximum rated value (I) FM ) The highest temperature of the environment where the fast soft recovery diode is located;
such as HFA35HB60C ultrafast soft recovery diode from IR corporation, the maximum rated value of the forward rectified current is 30A, corresponding to a temperature condition T C =100 ℃, namely ensuring the temperature T of the fast soft recovery diode shell C =100 ℃, the maximum value of the rectifying current of the fast soft recovery diode is 30A, and the steady-state power safety working area verifies the maximum rated value (I) of the forward rectifying current of the fast soft recovery diode FM ) And its corresponding temperature condition T (T) C Or T A ) Set as initial conditions of the test, T (T) is ensured by the heat sink C Or T A ) And must guarantee T C Or T A Stability of (2);
the method for evaluating the verification of the safe working area of the transient power comprises the following steps:
(7.1) applying initial conditions to a plurality of fast soft recovery diodes 500 times, namely testing the initial conditions to be I F ＝I FSM 500 times, maintaining the surge time interval in the initial condition to ensure that the environmental condition is I FSM Corresponding ambient temperature T (T) C Or T A ) And testing the plurality of fast soft recovery diodes according to the electrical characteristic table until the test is finished, and judging whether the device is in a working state or notFailure occurs;
(7.2) if at least one of the fast soft recovery diodes fails, it indicates that none of the fast soft recovery diodes can reach the maximum rated value (I) of the forward surge current FSM ) A safe working area of (2);
if the fast soft recovery diodes are not failed, the maximum rated value (I) of the forward surge current can be reached by the plurality of fast soft recovery diodes FSM ) The safety operating area (2) of (1), the test was continued, and the test conditions were changed to I' FS ＝I FSM +ΔI FS Step size Δ I FS Selecting 2% of FSM ～10％I FSM 500 times, keeping the time interval between each surge constant, i.e. the temperature condition and I of the test FSM Corresponding ambient temperature T (T) C Or T A ) The voltage is not always the same, until the test is finished, the plurality of fast soft recovery diodes are tested according to the electrical characteristic table, and whether the device fails or not is judged;
(7.3) if at least one of the fast soft recovery diodes has failure, the fast soft recovery diodes can reach the maximum rated value (I) of the forward surge current FSM ) The maximum rated value of the forward surge current is designed to be less, and the limit value of the forward surge current of the plurality of fast soft recovery diodes is larger than I FSM Is less than I FS ＝I FSM +ΔI FS ；
If the plurality of fast soft recovery diodes are not failed, the plurality of fast soft recovery diodes can reach the forward surge current I FSM +ΔI FS The test is continued, and the test conditions are changed to I' FS ＝I FSM +2ΔI FS ，ΔI FS For step size, 500 times, the time interval between each surge is kept constant, namely the temperature condition and I of the test FSM Corresponding environmental condition T (T) C Or T A ) The parameters are not necessarily the same until the test is finished, and the fast soft recovery diodes are subjected to full parameter test to judge whether the device fails or not;
(7.4) performing test and test according to the step (7.3), increasing the step length until the fast soft recovery diode fails, and realizing the evaluation of the limiting capacity of the forward surge current of the fast soft recovery diode;
maximum rating (I) of forward surge current of fast soft recovery diode FSM ) With its corresponding temperature condition (T) C Or T A ) For example, the maximum rated value of forward surge current is 150A for an ultra-fast soft recovery diode of HFA35HB60C type by IR company, and the corresponding temperature condition is T C =25 ℃, namely ensuring the temperature T of the fast soft recovery diode shell C =25 ℃, the maximum value of the forward surge current of the fast soft recovery diode is 150A, and the transient power safety working area verifies the maximum rated value (I) of the forward surge current of the fast soft recovery diode FSM ) And its corresponding temperature condition (T) C Or T A ) Setting as initial condition of test, continuously adding 500 times of surge, and ensuring T by setting time interval between every two times of surge C Or T A And must guarantee T C Or T A Stability of (2).
The correlation curve of forward voltage and forward current and the correlation curve of reverse leakage current and reverse voltage of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature are obtained through the step (1) and the step (2), and when the aerospace model is applied, the correlation curves are continuous, so that the correlation curve (I) in the application process can be read from the curve graph F ，V F ) And (V) R ，I R ) Determining (I) according to the temperature condition and the variation range of the actual application F ，V F ) And (V) R ，I R ) The power consumption range of the device when applied to secondary power rectification, freewheeling or isolation can be calculated, so as to facilitate the subsequent calculation of thermal design or power conversion efficiency.
The fast soft recovery diode is obtained through the steps (3), (4) and (5) under the conditions of room temperature, highest rated working temperature, lowest rated working temperature, highest aerospace application environment temperature and lowest aerospace application environment temperature under the conditions of I FM Test stress and 50% by volume I FM The reverse recovery current versus temperature curve, reverse recovery time versus temperature curve and reverse recovery waveform under test stress, typically with a certain deration at 50% I for aerospace model applications FM Testing under test stress, applied according to applied temperature and applied I F The corresponding reverse recovery waveform qualitatively shows the reverse recovery softness of the device, the curve of the reverse recovery current associated with the temperature and the curve of the reverse recovery time associated with the temperature are continuous curves, the reverse recovery time and the reverse recovery current during application can be read from the curve graph, and estimation is carried out according to the reverse recovery softness, the reverse recovery time and the reverse recovery current to estimate how much influence the reverse recovery of the device has on the output voltage and whether the influence is within an acceptable range.
Verifying the steady-state power safety working area of the device through the step (6), and simultaneously obtaining the limit value of the steady-state power safety working area of the device;
the transient power safety working area of the device is verified through the step (7), the transient power safety working area of the device is obtained at the same time, the fast soft recovery diode is mainly used for rectification when the aerospace model is applied and is a key component in a secondary power supply circuit, long-term safety work of the device is very necessary, large transient pulses exist in the circuit due to startup and shutdown or crosstalk when the fast soft recovery diode is applied, the device needs to be verified in the steady-state power safety working area and the transient power safety working area, a test result is used for supporting and ensuring the safety work of the device when the device is applied, and the test result can also be used for measuring the design margin of the device.
Those skilled in the art will appreciate that the details of the invention not described in detail in the specification are within the skill of those skilled in the art.
Claims (1)
1. A method for evaluating the functional performance of a fast soft recovery diode based on safety working area verification is characterized by comprising the following steps:
(1) The method for evaluating the correlation characteristics of the forward voltage and the forward current under different temperature conditions obtains correlation curves of the forward voltage and the forward current of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature;
(2) The method for evaluating the correlation characteristics of reverse voltage resistance and reverse leakage current under different temperature conditions obtains a correlation curve of reverse leakage current and reverse voltage of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature;
(3) The method for evaluating the reverse recovery characteristics under different temperature conditions obtains the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature FM Test stress and 50% by volume I FM Testing a reverse recovery characteristic curve under stress;
(4) The method for evaluating the correlation characteristics of reverse recovery time and temperature obtains the correlation characteristics of the fast soft recovery diode under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature FM Test at stress and 50% FM Testing a reverse recovery time and temperature correlation curve under stress;
(5) The method for evaluating the correlation characteristics of the reverse recovery current and the temperature obtains the correlation characteristics of the fast soft recovery diode under the conditions of room temperature, the highest rated working temperature, the lowest rated working temperature, the highest aerospace application environment temperature and the lowest aerospace application environment temperature FM Test stress and 50% by volume I FM Testing a reverse recovery current and temperature correlation curve under stress;
(6) The method for evaluating the verification of the steady-state power safety working area obtains the limit value of the steady-state power safety working area of the fast soft recovery diode;
(7) The method for evaluating the verification of the transient power safe working area obtains the limit value of the transient power safe working area of the fast soft recovery diode;
(8) Determining (I) according to the correlation curve of the forward voltage and the forward current and the correlation curve of the reverse leakage current and the reverse voltage of the fast soft recovery diode obtained in the step (1) and the step (2) under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature, and the temperature condition and the variation range of the actual application F ，V F ) And (V) R ，I R ) The variation range of the power supply is further determined, and the power consumption range is further determined when the power supply is applied to rectification, follow current or isolation of a secondary power supply, so that guidance is provided for thermal design or power supply conversion efficiency;
(9) According to the fast soft recovery diode obtained in the step (3), the step (4) and the step (5), the fast soft recovery diode is under the conditions of room temperature, rated working highest temperature, rated working lowest temperature, aerospace application environment highest temperature and aerospace application environment lowest temperature under the condition of I FM Test stress and 50% by volume I FM Testing a reverse recovery current and temperature correlation curve and a reverse recovery time and temperature correlation curve under stress, obtaining reverse recovery time and reverse recovery current when in application from the curves, and determining the influence of reverse recovery on output voltage according to the reverse recovery time and the reverse recovery current;
(10) Verifying the steady-state power safety working area through the step (6) to obtain the limit value of the steady-state power safety working area of the fast soft recovery diode; verifying the transient power safety working area through the step (7) to obtain the transient power safety working area of the fast soft recovery diode, wherein the transient power safety working area is used for guiding the design allowance of the fast soft recovery diode;
in the step (1), the method for evaluating the correlation characteristics of the forward voltage and the forward current under different temperature conditions comprises the following steps:
(1.1) testing the forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents at room temperature, and solving the plurality of fast soft recovery diodes under each given forward current conditionObtaining a plurality of sets of forward current-forward voltage values by (I) F ，V F ) Is represented by the formula I F Denotes forward current, V F Representing forward voltages, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a correlation curve of forward voltage and forward current at room temperature;
(1.2) testing the forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents under the condition of the highest rated working temperature of the fast soft recovery diodes, solving the average voltage value of the plurality of fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) F ，V F ) Is represented by the formula I F Denotes forward current, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a forward voltage and forward current correlation curve under the condition of the rated working highest temperature of the fast soft recovery diode;
(1.3) testing the forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents under the condition of the rated working lowest temperature of the fast soft recovery diodes, solving the average voltage value of the plurality of fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) F ，V F ) Is represented by F Denotes forward current, V F Representing forward voltages, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a forward voltage and forward current correlation curve under the condition of the rated working lowest temperature of the fast soft recovery diode;
(1.4) testing the forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents under the highest temperature condition of the space navigation application environment of the fast soft recovery diodes, solving the voltage average value of the plurality of fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) F ，V F ) Is represented by the formula I F Represents a forward directionCurrent, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a forward voltage and forward current correlation curve of the fast soft recovery diode under the condition of the highest temperature of the aerospace application environment;
(1.5) testing the forward voltages of a plurality of fast soft recovery diodes under the condition of giving a plurality of forward currents under the condition of the lowest temperature of the space navigation application environment of the fast soft recovery diodes, solving the average voltage value of the plurality of fast soft recovery diodes under each given forward current condition to obtain a plurality of groups of forward current-forward voltage values, and using (I) F ，V F ) Is represented by F Denotes the forward current, V F Representing forward voltage, and for the resulting sets (I) F ，V F ) Performing curve fitting to obtain a correlation curve of forward voltage and forward current under the condition of the minimum temperature of the aerospace application environment of the fast soft recovery diode;
the value range of the given forward current is as follows: the maximum rated value of the forward rectifying current of the fast soft recovery diode is used as the maximum value of the forward current, the minimum value of the forward current is zero, and the testing step length is determined according to the application requirements of the aerospace model;
in the step (2), the method for evaluating the correlation characteristics of reverse withstand voltage and reverse leakage current under different temperature conditions comprises the following steps:
(2.1) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage at room temperature, calculating the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage at room temperature;
the range of the reverse voltage is as follows: the reverse maximum working voltage of the fast soft recovery diode is used as the maximum value of the reverse voltage, the minimum value of the reverse voltage is zero, and the test step length is determined according to the application requirements of the aerospace model;
(2.2) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage under the condition of the highest rated working temperature of the fast soft recovery diodes, solving the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using the reverse leakage currents as (V) R ，I R ) Is represented by the formula I R Represents a reverse leakage current, V R Representing reverse voltages, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of the rated working highest temperature of the fast soft recovery diode;
(2.3) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage under the condition of rated working lowest temperature of the fast soft recovery diodes, solving the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using the reverse leakage currents as (V) R ，I R ) Is represented by R Denotes reverse leakage current, V R Representing reverse voltages, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of rated working lowest temperature of the fast soft recovery diode;
(2.4) testing reverse leakage currents of a plurality of fast soft recovery diodes under the condition of given reverse voltage under the condition of highest temperature of space navigation application environment of the fast soft recovery diodes, calculating the average value of the reverse leakage currents of the plurality of fast soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents, and using the reverse leakage currents as (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltages, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain the correlation between reverse leakage current and reverse voltage of the fast soft recovery diode under the condition of highest temperature in space navigation application environmentA curve;
(2.5) testing reverse leakage currents of a plurality of rapid soft recovery diodes under the condition of given reverse voltage under the condition of the lowest temperature of space navigation application environment of the rapid soft recovery diodes, and solving the average value of the reverse leakage currents of the plurality of rapid soft recovery diodes under each given reverse voltage condition to obtain a plurality of groups of reverse voltage-reverse leakage currents for use as (V) R ，I R ) Is represented by R Represents a reverse leakage current, V R Representing reverse voltage, and for the resulting sets (V) R ，I R ) Performing curve fitting to obtain a correlation curve of reverse leakage current and reverse voltage under the condition of the aerospace application environment lowest temperature of the fast soft recovery diode;
the range of the reverse voltage is as follows: the reverse maximum working voltage of the fast soft recovery diode is used as the maximum value of the reverse voltage, the minimum value of the reverse voltage is zero, and the test step length is determined according to the application requirements of the aerospace model;
in the step (3), the method for evaluating the reverse recovery characteristics under different temperature conditions comprises the following steps:
(3.1) testing fast soft recovery diodes at room temperature I FM Test stress and 50% by volume I FM Testing the reverse recovery waveform under stress; i is FM Test stress is the maximum rating of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.2) testing the maximum rated working temperature of the fast soft recovery diode at I FM Test at stress and 50% FM Testing the reverse recovery waveform under stress; i is FM Test stress is the maximum rated value of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.3) testing the I of the fast soft recovery diode at the rated minimum working temperature of the fast soft recovery diode FM Test at stress and 50% FM Testing a reverse recovery waveform under stress; i is FM Test stress is the maximum rated value of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.4) testing the maximum temperature of the fast soft recovery diode in the aerospace application environment at I FM Test stress and 50% by volume I FM Testing the reverse recovery waveform under stress; I.C. A FM Test stress is the maximum rating of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
(3.5) testing the minimum temperature of the fast soft recovery diode in the aerospace application environment at I FM Test stress and 50% by volume I FM Testing the reverse recovery waveform under stress; I.C. A FM Test stress is the maximum rated value of the forward rectified current, 50% FM The test stress is 50% of the maximum rated value of the forward rectified current;
in the step (4), the method for evaluating the correlation characteristic between the reverse recovery time and the temperature comprises the following steps:
(4.1) at a set temperature T Is provided with Testing a plurality of fast soft recovery diodes I FM Testing the reverse recovery time under stress condition, and calculating the average value of the reverse recovery time of the fast soft recovery diodes to obtain a plurality of groups of set temperature-reverse recovery time for (T) Is provided with ，t rr ) Denotes, T Is provided with Indicating the set temperature, t rr Representing reverse recovery time, and applying the obtained groups (T) Is provided with ，t rr ) Curve fitting is carried out to obtain I FM Testing a reverse recovery time and temperature correlation curve under a stress condition;
the value range of the set temperature is as follows: the minimum value is the rated working lowest temperature of the fast soft recovery diode, the maximum value is the rated working highest temperature of the fast soft recovery diode, and the testing step length is determined according to the application requirements of the aerospace model;
(4.2) at a set temperature T Is provided with Testing several fast soft recovery diodes 50% FM Testing the reverse recovery time under stress condition, and calculating the average value of the reverse recovery time of the plurality of fast soft recovery diodesObtaining a plurality of sets of set temperature-reverse recovery times, using (T) Is provided with ，t rr ) Denotes, T Is provided with Indicating the set temperature, t rr Representing reverse recovery time, and applying the obtained groups (T) Is provided with ，t rr ) Curve fitting was carried out to obtain 50% I FM Testing a reverse recovery time and temperature correlation curve under a stress condition;
in the step (5), the method for evaluating the correlation characteristic between the reverse recovery current and the temperature comprises the following steps:
(5.1) at a set temperature T Is provided with Testing a plurality of fast soft recovery diodes I FM Testing the reverse recovery current under stress condition, and calculating the average value of the reverse recovery current of the fast soft recovery diodes to obtain a plurality of groups of set temperature-reverse recovery current for (T) Is provided with ，I rr ) Denotes, T Is provided with Indicating a set temperature, I rr Representing reverse recovery current, and for the resulting sets (T) Is provided with ，I rr ) Performing curve fitting to obtain I FM Testing a reverse recovery time and temperature correlation curve under a stress condition;
the value range of the set temperature is as follows: the minimum value is the rated working lowest temperature of the fast soft recovery diode, the maximum value is the rated working highest temperature of the fast soft recovery diode, and the testing step length is determined according to the application requirements of the aerospace model;
(5.2) at a set temperature T Is provided with Testing several fast soft recovery diodes 50% FM Testing reverse recovery current under stress condition, and calculating average value of reverse recovery current of the multiple fast soft recovery diodes to obtain multiple sets of set temperature-reverse recovery current, and using (T) Is provided with ，I rr ) Denotes, T Is provided with Indicating a set temperature, I rr Representing reverse recovery current, and for the resulting sets (T) Is provided with ，I rr ) Curve fitting was carried out to obtain 50% I FM Testing a reverse recovery current and temperature correlation curve under a stress condition;
in the step (6), the method for evaluating the verification of the steady-state power safety working area comprises the following steps:
(6.1) applying initial conditions to a plurality of fast soft recovery diodes for 168 hours, namely testing the initial conditions to be I F =I FM T =168h, ensuring the environmental condition as I by the heat dissipation device FM Corresponding temperature condition T, testing the plurality of fast soft recovery diodes according to an electrical characteristic table until 168h is reached after the test is finished, and judging whether the device fails or not;
(6.2) if at least one of the fast soft recovery diodes fails, it indicates that none of the fast soft recovery diodes can reach the maximum rated value (I) of the forward rectified current FM ) The safe working area of (1);
if the fast soft recovery diodes do not fail, the fast soft recovery diodes can reach the maximum rated value (I) of the forward rectifying current FM ) The safe working area of (1), the test is continued, and the test condition is changed to I' F =I FM +ΔI F Step size Δ I F Is selected from 2% of FM ~10%I FM T =168h, the heat sink is kept unchanged, i.e. the temperature condition and I of the test FM Corresponding temperature conditions T are not necessarily the same until the test is finished, and the plurality of fast soft recovery diodes are tested according to the electrical characteristic table to judge whether the device fails or not;
(6.3) if at least one of the fast soft recovery diodes fails, it indicates that the fast soft recovery diodes can reach the maximum rated value (I) of the forward rectifying current FM ) The maximum rated value of the forward rectifying current of the device is designed to be smaller than the design margin, and the limit value of the forward rectifying current of the device is larger than I FM Is less than I F =I FM +ΔI F ；
If the fast soft recovery diode does not lose efficacy, the fast soft recovery diode can reach the forward rectifying current I FM +ΔI F The test was continued with the test conditions being changed to I' F =I FM +2ΔI F ，ΔI F For step size, t =168h, the heat sink was kept constant, i.e. the temperature condition of this testAnd I FM Corresponding temperature conditions T are not necessarily the same until the test is finished, and the plurality of fast soft recovery diodes are tested according to the electrical characteristic table to judge whether the device fails or not;
(6.4) performing tests and tests according to the step (6.3), increasing the step length until at least one of the fast soft recovery diodes fails, and realizing the evaluation of the limiting capacity of the forward rectifying current of the fast soft recovery diode;
t is T C Or T A ；
T C When the forward rectifying current of the fast soft recovery diode is at the maximum rated value (I) FM ) The highest temperature of the tube shell of the time-fast soft recovery diode;
T A when the forward rectifying current of the fast soft recovery diode is at the maximum rated value (I) FM ) The highest temperature of the environment where the fast soft recovery diode is located;
the HFA35HB60C type ultrafast soft recovery diode of IR company has a maximum rated value of forward rectification current of 30A and a corresponding temperature condition of T C =100 ℃, namely ensuring the fast soft recovery diode package temperature T C Under the condition of =100 ℃, the maximum value of the rectified current of the fast soft recovery diode is 30A, and the steady-state power safety working area verifies the maximum rated value (I) of the forward rectified current of the fast soft recovery diode FM ) And its corresponding temperature condition T C Or T A Set as the initial condition of the test, T is ensured by the heat sink C Or T A Guarantee T C Or T A Stability of (2);
in the step (7), the method for evaluating the verification of the transient power safe operating area comprises the following steps:
(7.1) applying initial conditions to a plurality of fast soft recovery diodes 500 times, namely testing the initial conditions to be I F =I FSM 500 times, maintaining the surge time interval in the initial condition to ensure that the environmental condition is I FSM Corresponding ambient temperature T (T) C Or T A ) And testing the plurality of fast soft recovery diodes according to the electrical characteristic table until the test is finished, and judging whether the device has loss or notEffect is achieved;
(7.2) if at least one of the fast soft recovery diodes fails, it indicates that none of the fast soft recovery diodes can reach the maximum rated value (I) of the forward surge current FSM ) A safe working area of (2);
if the fast soft recovery diodes are not failed, the maximum rated value (I) of the forward surge current can be reached by the plurality of fast soft recovery diodes FSM ) The safety operating area (2) of (1), the test was continued, and the test conditions were changed to I' FS =I FSM +ΔI FS Step size Δ I FS Selecting 2% of FSM ~10%I FSM 500 times, keeping the time interval between each surge constant, i.e. the temperature condition and I of the test FSM Corresponding ambient temperature T (T) C Or T A ) The voltage is not always the same, until the test is finished, the plurality of fast soft recovery diodes are tested according to the electrical characteristic table, and whether the device fails or not is judged;
(7.3) if at least one of the fast soft recovery diodes fails, it indicates that the fast soft recovery diodes can reach the maximum rated value (I) of the forward surge current FSM ) The maximum rated value of the forward surge current is designed to be less, and the limit value of the forward surge current of the plurality of fast soft recovery diodes is larger than I FSM Is less than I FS =I FSM +ΔI FS ；
If the plurality of fast soft recovery diodes are not failed, the plurality of fast soft recovery diodes can reach the forward surge current I FSM +ΔI FS After the test was continued, the test conditions were changed to "I' FS =I FSM +2ΔI FS ，ΔI FS For step size, 500 times, the time interval between each surge is kept constant, namely the temperature condition and I of the test FSM Corresponding environmental conditions T are not necessarily the same until the test is finished, and the plurality of fast soft recovery diodes are subjected to full parameter test to judge whether the device fails or not;
(7.4) testing and testing according to the step (7.3), increasing the step length until the rapid soft recovery diode fails, and realizing the evaluation of the limit capacity of the forward surge current of the rapid soft recovery diode;
HFA35HB60C type ultrafast soft recovery diode of IR company, the maximum rated value of the forward surge current is 150A, and the corresponding temperature condition is T C =25 ℃, namely ensuring the fast soft recovery diode shell temperature T C =25 ℃, the maximum value of the forward surge current of the fast soft recovery diode is 150A, and the transient power safety working area verifies the maximum rated value (I) of the forward surge current of the fast soft recovery diode FSM ) Setting the corresponding temperature condition as the initial condition of the test, continuously adding 500 times of surge, and ensuring T by setting the time interval between every two times of surge C Or T A And must guarantee T C Or T A Stability of (2).
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