CN112014362A - Time-resolved fluorescence measuring system of microscopic imaging full-spectrum high-voltage module - Google Patents
Time-resolved fluorescence measuring system of microscopic imaging full-spectrum high-voltage module Download PDFInfo
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- 238000005259 measurement Methods 0.000 claims abstract description 34
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
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Abstract
The invention relates to the field of optical detection of samples, in particular to a microscopic imaging full-spectrum high-voltage module time-resolved fluorescence measurement system, wherein a white light source, a diamond anvil cell, an objective lens, a beam splitting sheet and a transmission fluorescence reflector are sequentially arranged in a line, during microscopic imaging, a movable reflector moves to a position between the beam splitting sheet and the transmission fluorescence reflector, white light emitted by the white light source sequentially passes through the diamond anvil cell, the objective lens and the beam splitting sheet and then is reflected into the microscopic imaging system through the movable reflector, during measurement, the movable reflector moves out, a laser beam emitted by a pulse laser source is emitted into the beam splitting sheet, the reflected light part is converged on the diamond anvil cell through the objective lens, fluorescence radiated by a sample is emitted into the beam splitting sheet through the objective lens, and the transmitted fluorescence part is reflected by the transmission fluorescence reflector and then is emitted into a spectrometer through a focusing mirror. The invention realizes the focusing of the selected area by using microscopic imaging before measurement and can realize the measurement of the full-spectrum time-resolved fluorescence of the high-voltage module.
Description
Technical Field
The invention relates to the field of optical detection of samples, in particular to a microscopic imaging full-spectrum high-voltage module time-resolved fluorescence measurement system.
Background
The time-resolved fluorescence measurement system is a process of exciting a sample molecular characteristic spectrum by using exciting light, then collecting light intensity of fluorescence radiated by the sample molecular characteristic spectrum after different time delays, and the measurement of the time-resolved fluorescence can assist in analyzing the chemical characteristics of molecules.
The measuring method of time-resolved fluorescence includes optical Kerr-gate measuring method, time-resolved single photon counting method, etc. Time-resolved fluorescence measurements are typically performed using time-resolved single photon counting methods, taking into account the simplicity and maintainability of the system.
On the premise of adopting a time-resolved single photon counting method, in the process of measuring time-resolved fluorescence, excitation pulse light which is not subjected to focusing treatment is generally incident into a measured sample, an objective lens collects time-resolved fluorescence information of the measured sample in a cuvette from a direction which forms an angle of 90 degrees with the incident direction of the excitation pulse light, the method is widely applied to time-resolved fluorescence measurement, such as an ultra-fast time-resolved fluorescence spectrometer with a HORIBA brand and a time-resolved fluorescence spectrometer with a Newport brand and a TRFLS (TRFLS), and the method can be combined with a monochromator or a spectrometer to measure the full-spectrum time-resolved fluorescence information of the measured sample.
However, in the process of measuring a sample of a high-voltage module, particularly in the process of measuring a sample packaged in a diamond anvil cell, the device cannot realize corresponding functions. The diamond anvil cell is for the cell of the bright light of four sides, and its logical light bore is little, and only several hundred microns, the excitation light of unfocusing can't arouse the sample in the diamond anvil cell to only collinear business turn over light direction in the diamond anvil cell, the method of 90 orientation collection time-resolved fluorescence information can't be applied to the time-resolved fluorescence measurement of diamond anvil cell sample, in addition because do not contain the imaging system that focuses among the current measurement system, often leads to the unable accurate incident diamond of inciting pulse light to on the diamond anvil cell.
In the field of microscopic fluorescence imaging, a time-resolved single photon counting method is also adopted, for example, a PicoQuan brand time-resolved confocal fluorescence microscope system with the model of MicroTime200 utilizes focused pulse laser to irradiate a sample on a glass slide, an objective system carries out backward collection on time-resolved fluorescence information of the sample, and a photodiode is used for collecting the fluorescence information. However, the objective lens system of the method has short working distance, the requirement of diamond on the testing distance of the anvil cannot be met, and the collected fluorescence information cannot be subjected to wavelength division detection due to low fluorescence information acquisition efficiency, so that the system cannot obtain time-resolved fluorescence information of a full spectrum.
Therefore, in view of the prior art, both standard time-resolved fluorescence measurement equipment and microscopic fluorescence imaging equipment cannot meet the requirement of full-spectrum time-resolved fluorescence measurement of a high-voltage module sample, especially measurement of a sample packaged in an anvil by a diamond.
Disclosure of Invention
The invention aims to provide a microscopic imaging full-spectrum time-resolved fluorescence measurement system for a high-voltage module, which utilizes microscopic imaging to realize selected area focusing before measurement and can realize measurement of full-spectrum time-resolved fluorescence of a high-voltage module sample.
The purpose of the invention is realized by the following technical scheme:
a microscopic imaging full-spectrum high-voltage module time-resolved fluorescence measurement system comprises a pulse laser source, a beam splitting sheet, an objective lens, a diamond anvil cell, a white light source, a movable reflector, a transmission fluorescence reflector, a focusing mirror, a spectrometer and a microscopic imaging system, wherein the white light source, the diamond anvil cell, the objective lens, the beam splitting sheet and the transmission fluorescence reflector are sequentially arranged in a line, when a sample area of the diamond anvil cell is subjected to microscopic imaging, the movable reflector moves to a position between the beam splitting sheet and the transmission fluorescence reflector, white light emitted by the white light source sequentially passes through the diamond anvil cell, the objective lens and the beam splitting sheet and is reflected into the microscopic imaging system through the movable reflector, when the sample area of the diamond anvil cell is measured, the movable reflector moves out, a laser beam emitted by the pulse laser source is emitted into the beam splitting sheet, and a reflected light part of the laser beam is emitted into the objective lens, and the fluorescence of the sample subjected to excitation radiation is changed into parallel fluorescence beams through the objective lens and is emitted into the beam splitting sheet, and the transmission fluorescence part of the parallel fluorescence beams is reflected by the transmission fluorescence reflecting mirror and then emitted into the focusing mirror, and is focused by the focusing mirror and then emitted into the spectrometer.
The movable mirror has two degrees of freedom of movement and rotation.
The movable reflector is driven and adjusted through a driving mechanism, the driving mechanism comprises a movable driving device, a lead screw, a nut, a movable plate and a rotation driving device, the lead screw passes through the movable driving device for driving to rotate, the nut is installed on the lead screw, the movable plate is fixedly connected with the nut, the rotation driving device is arranged on the movable plate, and the movable reflector passes through the rotation driving device for driving to rotate.
And encoders are arranged at the rear ends of the mobile driving device and the rotary driving device.
And a light guide shell is arranged on a light propagation path between the beam splitter and the transmission fluorescent reflector, and the movable reflector enters and exits the light guide shell.
The diamond anvil cell is arranged on a support frame, the support frame is arranged on a flat plate moving table of a three-dimensional moving mechanism, and the flat plate moving table has X, Y, Z degrees of freedom.
The support frame is V style of calligraphy structure, and diamond anvil cell is placed between the V type groove of support frame.
The spectrometer is connected with a first computer through a first data transmission line.
The microscopic imaging system comprises a camera and a second computer, wherein the camera is connected with the second computer through a second data transmission line.
And a light shielding plate is arranged on one side of the beam splitting sheet, which is far away from the pulse laser light source.
The invention has the advantages and positive effects that:
1. the invention is provided with the movable reflector, when the movable reflector moves to a light propagation path between the beam splitting sheet and the transmission fluorescent reflector, white light emitted by a white light source is reflected by the movable reflector and then emitted into a microscopic imaging system for imaging, so that the region selection and focusing can be carried out, the movable reflector moves out of the light propagation path between the beam splitting sheet and the transmission fluorescent reflector during measurement, and the pulse laser source is started to carry out full-spectrum time-resolved fluorescence measurement on a sample region of the anvil by the diamond, thereby ensuring the accurate injection of pulse laser and making up for the technical blank that the time-resolved fluorescence of a high-voltage module cannot be measured in the prior art.
2. The movable reflector is driven and adjusted by a driving mechanism, and has two degrees of freedom of movement and rotation, so that the conversion between imaging and measuring procedures can be accurately and quickly realized, the imaging light path correction can also be realized, and the microscopic imaging accuracy is ensured.
3. The diamond anvil cell of the invention can be adjusted in position by a three-dimensional moving mechanism with X, Y, Z three degrees of freedom, thereby facilitating the adjustment of microscopic imaging.
Drawings
Figure 1 is a schematic structural view of the present invention,
figure 2 is a schematic view of the diamond anvil configuration of figure 1,
figure 3 is a schematic view of the movable mirror of figure 1,
fig. 4 is a schematic view of a driving mechanism of the movable mirror in fig. 3.
The device comprises a pulse laser light source 1, a beam splitting sheet 2, an objective lens 3, a shading plate 4, a second computer 5, a diamond anvil 6, a movable reflector 7, a base 701, a transmission fluorescence reflector 8, a focusing mirror 9, a spectrometer 10, a first data transmission line 11, a second data transmission line 12, a support frame 13, a first computer 14, a white light source 15, a camera lens 16, a camera 17, a light guide shell 18, a light through hole 181, a reflector through hole 182, a moving driving device 19, a lead screw 20, a screw nut 21, a moving plate 22 and a rotation driving device 23.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in figure 1, the invention comprises a pulse laser source 1, a beam splitting sheet 2, an objective lens 3, a diamond anvil cell 6, a white light source 15, a movable reflector 7, a transmission fluorescence reflector 8, a focusing mirror 9, a spectrometer 10 and a microscopic imaging system, wherein the white light source 15, the diamond anvil cell 6, the objective lens 3, the beam splitting sheet 2 and the transmission fluorescence reflector 8 are sequentially arranged in a line, when the microscopic imaging is carried out on a sample area of the diamond anvil cell 6, the movable reflector 7 is moved to a position between the beam splitting sheet 2 and the transmission fluorescence reflector 8, the white light emitted by the white light source 15 passes through the diamond anvil cell 6, the objective lens 3 and the beam splitting sheet 2 in sequence and is reflected into the microscopic imaging system through the movable reflector 7, when the sample area of the diamond anvil cell 6 is measured, the movable reflector 7 is moved out, the laser beam emitted by the pulse laser source 1 is emitted into the beam splitting sheet 2, and the reflected light part of the laser beam is emitted into the objective lens 3 and converged in the sample area of the diamond anvil 6 through the objective lens 3, the fluorescence of the sample subjected to excitation radiation is changed into parallel fluorescence beams through the objective lens 3 and emitted into the beam splitting sheet 2, and the transmitted fluorescence part of the parallel fluorescence beams is emitted into the focusing mirror 9 after being reflected by the transmitted fluorescence reflector 8 and is emitted into the spectrometer 10 after being focused by the focusing mirror 9.
As shown in fig. 3, the movable mirror 7 has two degrees of freedom of movement and rotation, a light guide housing 18 is arranged on a light propagation path between the beam splitter 2 and the transmission fluorescent reflector 8, the movable mirror 7 can be moved in and out of the light guide housing 18, wherein when a sample area of the diamond anvil 6 is subjected to microscopic imaging, the movable mirror 7 is moved into the light guide housing 18 and is rotationally adjusted to a proper angle to ensure the microscopic imaging system to image, and when a sample area of the diamond anvil 6 is measured, the movable mirror 7 is moved out of the light guide housing 18. In this embodiment, the light guide housing 18 is a cage-type cubic structure, and the light guide housing 18 is provided with a light through hole 181 for light to enter and exit and a reflector through hole 182 for the movable reflector 7 to enter and exit.
As shown in fig. 4, the movable mirror 7 is driven and adjusted by a driving mechanism, the driving mechanism includes a movable driving device 19, a lead screw 20, a nut 21, a moving plate 22 and a rotation driving device 23, the movable driving device 19 and the lead screw 20 are both disposed on a bottom plate, the lead screw 20 is driven to rotate by the movable driving device 19, the nut 21 is mounted on the lead screw 20, the moving plate 22 is fixedly connected with the nut 21, the moving plate 22 is provided with the rotation driving device 23, and a base 701 of the movable mirror 7 is fixedly connected with an output shaft of the rotation driving device 23. When the mechanism works, the screw rod 20 is driven to rotate by the movement driving device 19, so that the screw nut 21 is driven to move, the moving plate 22 is driven to move and adjust the position of the movable reflector 7, and the rotation driving device 23 is used for driving the movable reflector 7 to rotate and adjust the angle after the position of the movable reflector is determined. In this embodiment, the movement driving device 19 and the rotation driving device 23 are both speed reduction motors, and the rear ends of the movement driving device 19 and the rotation driving device 23 are both provided with encoders, wherein the encoders at the rear ends of the movement driving device 19 can accurately control the movement distance of the screw 21 by detecting the number of rotation turns and calculating by a system, so as to accurately control the movement distances of the movable plate 22 and the movable mirror 7, the encoders at the rear ends of the rotation driving device 23 are used for controlling the rotation angle of the movable mirror 7, and the encoders are commercially available products.
As shown in fig. 2, the diamond anvil cell 6 is disposed on a supporting frame 13, and the supporting frame 13 is disposed on a flat plate moving table of a three-dimensional moving mechanism, the three-dimensional moving mechanism can drive the supporting frame 13 to adjust along the direction X, Y, Z, so as to adjust the position of the sample area on the diamond anvil cell 6, the white light source 15 is also disposed on the flat plate moving table, and during microscopic imaging, the white light source 15 moves along with the diamond anvil cell 6, and the imaging effect is not affected. The three-dimensional moving mechanism is a commercially available product, and in the embodiment, the manufacturer of the three-dimensional moving mechanism is Thorlabs corporation, and the model of the three-dimensional moving mechanism is PT 3/M.
As shown in fig. 2, in the present embodiment, the supporting frame 13 is in a V-shaped structure, the diamond anvil 6 is placed between the V-shaped grooves of the supporting frame 13, and the supporting frame 13 may be in other supporting structures.
As shown in fig. 1, the spectrometer 10 is connected to a first computer 14 through a first data transmission line 11, and the spectrometer 10 analyzes incident fluorescence and transmits the analyzed incident fluorescence to the first computer 14 for processing, and displays the relevant full-spectrum time-resolved fluorescence data on a display screen of the first computer 14.
As shown in fig. 1, the microscopic imaging system includes a camera 17 and a second computer 5, the camera 17 is connected to the second computer 5 through a second data transmission line 12, when microscopic imaging is performed on the sample area of the anvil 6 by the diamond, white light emitted by a white light source 15 is reflected by a movable mirror 7 and then enters a camera lens 16 at the front end of the camera 17, and imaging data of the camera 17 is transmitted to the second computer 5 and processed to display imaging information on a display screen of the second computer 5.
As shown in fig. 1, a light shielding plate 4 is disposed on a side of the beam splitting plate 2 away from the pulse laser light source 1, and after the laser beam passes through the beam splitting plate 2, the transmitted light is blocked by the light shielding plate 4 and is cut off.
The working principle of the invention is as follows:
as shown in figure 1, the movable reflector 7 is arranged between the beam splitting sheet 2 and the transmission fluorescence reflector 8, and before the diamond anvil 6 is subjected to full-spectrum time-resolved fluorescence measurement, the diamond anvil 6 sample area can be subjected to microscopic imaging, so that the selection of an excitation area and the focusing of pulse laser are realized.
As shown in fig. 1, when a sample area of the anvil 6 is microscopically imaged by the diamond, the movable reflector 7 moves to a light propagation path between the beam splitting plate 2 and the transmission fluorescent reflector 8, the white light emitted by the white light source 15 illuminates the sample area of the anvil 6, after the sample area is illuminated, the light passes through the objective lens 3 and is reflected by the movable reflector 7 to enter the camera lens 16 at the front end of the camera 17, wherein the beam splitting plate 2 has a transmission effect on the light without affecting the imaging process of the system, the imaging data of the camera 17 is transmitted to the second computer 5 and is processed to display the imaging information on the display screen of the second computer 5, and an operator can directly observe the camera 17 on the display screen of the second computer 5 in real time to obtain the imaging information. In this embodiment, the sample area of the diamond anvil cell 6 is a circular area with a diameter of 100 to 150 microns, after the sample area of the diamond anvil cell 6 is illuminated by the white light source 15, a circular bright area seen on the display screen of the second computer 5 is the sample area of the diamond anvil cell 6, and in addition, in the microscopic imaging process, the pulse laser source 1 can be in a power-on state, so that after the laser beam emitted by the pulse laser source 1 is split by the beam splitting sheet 2, a reflected light part of the laser beam is focused on the sample area of the diamond anvil cell 6 through the objective lens 3, because the sample area is not completely transparent, the pulse laser focused on the sample area of the diamond anvil cell 6 has a scattering phenomenon on the sample area, which makes it possible to observe a scattering spot on the display screen of the second computer 5 in the microscopic imaging process, the scattering spot is a spot where the converged pulse laser strikes the sample area of the diamond anvil cell 6, in the case of correct focusing, the ratio of the scattering spot diameter of the condensed pulsed laser to the sample area diameter of the diamond anvil 6 displayed on the display screen of the second computer 5 was 1: 12 to 1: 18, if the flat plate moving table of the three-dimensional moving mechanism for bearing the diamond anvil cell 6 is adjusted at this time, it can be observed from the display screen of the second computer 5 that the size of the scattering light spot changes with the progress of the adjustment, and the position with the minimum light spot is the position where the focus of the convergent pulse laser and the diamond anvil cell 6 are best overlapped, and this process can be realized by adjusting the X direction of the flat plate moving table, and if the Y direction and the Z direction of the flat plate moving table of the three-dimensional moving mechanism (as shown in fig. 1, the Z direction is the direction perpendicular to the plane where the X direction and the Y direction are located) are adjusted at this time, the focus of the convergent pulse laser can be adjusted to hit the position of the sample area of the diamond anvil cell 6, and the sample area of the diamond anvil cell 6 can be excited by selecting the area.
In addition, as shown in fig. 3 to 4, the movable reflector 7 is driven and adjusted by a driving mechanism and has two degrees of freedom of movement and rotation, wherein after the movable reflector 7 is moved in place, the imaging optical path correction can be realized through the degree of freedom of rotation, so as to ensure that the diamond anvil 6 is imaged and falls on a photoelectric detector of the camera 17.
After the selection of the excitation area and the focusing of the pulse laser are finished, the full-spectrum time-resolved fluorescence measurement is carried out on the sample area of the anvil cell 6 by the diamond.
As shown in fig. 1, when the diamond anvil 6 is used for full-spectrum time-resolved fluorescence measurement, the movable reflector 7 moves outward and is separated from the light propagation path between the beam splitter 2 and the transmission fluorescence reflector 8, and at this time, the light can directly enter the transmission fluorescence reflector 8 after passing through the beam splitter 2. During measurement, parallel laser beams emitted by a pulse laser source 1 are incident to a splitting surface of a splitting sheet 2, the splitting sheet 2 divides the incident laser beams into a transmission light part and a reflection light part according to a splitting ratio of 50:50, a light shielding plate 4 is arranged on one side, far away from the pulse laser source 1, of the splitting sheet 2, after the laser beams pass through the splitting sheet 2, the transmission light part of the laser beams is shielded and cut off by the light shielding plate 4, the reflection light part is reflected by the splitting sheet 2 and then enters an objective lens 3, the parallel laser beams are changed into convergent laser beams under the action of the objective lens 3, the convergent laser beams are focused in a sample area of a diamond anvil 6, a test sample in the sample area is excited to radiate fluorescence, the part, opposite to the incident direction of the convergent laser beams, of the fluorescence is changed into parallel fluorescence beams under the action of the objective lens 3, and the parallel fluorescence beams are incident to the splitting surface of the splitting sheet 2, the beam splitting sheet 2 splits incident parallel fluorescent light beams into transmission fluorescent light and reflection fluorescent light according to a splitting ratio of 50:50, wherein the transmission fluorescent light directly irradiates to a transmission fluorescent reflector 8, is reflected to a focusing mirror 9 by the transmission fluorescent reflector 8, is focused by the focusing mirror 9 and then irradiates to a spectrometer 10, the spectrometer 10 analyzes the incident fluorescent light, data analyzed by the spectrometer 10 is transmitted to the first computer 14 for processing, and related full-spectrum time resolution fluorescent data is displayed on a display screen of the first computer 14.
In this embodiment, the pulsed laser light source 1 is preferably a picosecond pulsed laser, the central wavelength of the emitted laser is 405nm, the pulse width is 20 picoseconds, the spectrometer 10 is preferably a grating spectrometer, the beam splitting sheet 2 is preferably a dielectric film beam splitting sheet with a 50:50 splitting ratio, the objective lens 3 is preferably an objective lens with a focal length of 200 mm, and the white light source 15 is preferably an LED white light source. The pulse laser light source 1, the spectrometer 10, the beam splitting sheet 2, the objective lens 3, the white light source 15, the transmission fluorescent reflector 8 and the focusing mirror 9 are all known in the art and are all commercially available products.
Claims (10)
1. A microscopic imaging full-spectrum high-voltage module time-resolved fluorescence measurement system is characterized in that: the device comprises a pulse laser source (1), a beam splitting sheet (2), an objective lens (3), a diamond anvil cell (6), a white light source (15), a movable reflector (7), a transmission fluorescence reflector (8), a focusing mirror (9), a spectrometer (10) and a microscopic imaging system, wherein the white light source (15), the diamond anvil cell (6), the objective lens (3), the beam splitting sheet (2) and the transmission fluorescence reflector (8) are sequentially arranged in a line, when microscopic imaging is carried out on a sample area of the diamond anvil cell (6), the movable reflector (7) is moved to a position between the beam splitting sheet (2) and the transmission fluorescence reflector (8), white light emitted by the white light source (15) sequentially passes through the diamond anvil cell (6), the objective lens (3) and the beam splitting sheet (2) and then is reflected by the movable reflector (7) to be injected into the microscopic imaging system, when the sample area of the diamond anvil cell (6) is measured, the movable reflecting mirror (7) is moved out, a laser beam emitted by the pulse laser light source (1) is emitted into the beam splitting sheet (2), the reflected light part of the laser beam is emitted into the objective lens (3) and converged in the sample area of the diamond anvil cell (6) through the objective lens (3), the fluorescence of the sample subjected to excitation radiation is changed into a parallel fluorescence beam through the objective lens (3) and emitted into the beam splitting sheet (2), the transmitted fluorescence part of the parallel fluorescence beam is emitted into the focusing mirror (9) after being reflected by the transmitted fluorescence reflecting mirror (8), and is emitted into the spectrometer (10) after being focused by the focusing mirror (9).
2. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 1, wherein: the movable mirror (7) has two degrees of freedom of movement and rotation.
3. The microscopic imaging full-spectral high-voltage module time-resolved fluorescence measurement system according to claim 2, characterized in that: but movable reflecting mirror (7) are adjusted through a actuating mechanism drive, actuating mechanism is including removing drive arrangement (19), lead screw (20), screw (21), movable plate (22) and rotation drive arrangement (23), lead screw (20) pass through it is rotatory to remove drive arrangement (19) drive, screw (21) install in on lead screw (20), movable plate (22) with screw (21) link firmly be equipped with rotation drive arrangement (23) on movable plate (22), just but movable reflecting mirror (7) pass through rotation drive arrangement (23) drive rotates.
4. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 3, wherein: and encoders are arranged at the rear ends of the mobile driving device (19) and the rotary driving device (23).
5. The microscopic imaging full-spectral high-voltage module time-resolved fluorescence measurement system according to claim 2, characterized in that: a light guide shell (18) is arranged on a light propagation path between the beam splitter (2) and the transmission fluorescent reflector (8), and the movable reflector (7) enters and exits the light guide shell (18).
6. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 1, wherein: the diamond anvil cell (6) is arranged on a support frame (13), the support frame (13) is arranged on a flat plate moving table of a three-dimensional moving mechanism, and X, Y, Z degrees of freedom are arranged on the flat plate moving table.
7. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 6, wherein: the support frame (13) is of a V-shaped structure, and the diamond anvil cell (6) is placed between the V-shaped grooves of the support frame (13).
8. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 1, wherein: the spectrometer (10) is connected to a first computer (14) via a first data transmission line (11).
9. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 1, wherein: the microscopic imaging system comprises a camera (17) and a second computer (5), wherein the camera (17) is connected with the second computer (5) through a second data transmission line (12).
10. The microscopic imaging full-spectrum high-pressure module time-resolved fluorescence measurement system of claim 1, wherein: a light shielding plate (4) is arranged on one side of the beam splitting sheet (2) far away from the pulse laser light source (1).
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