CN112003617A - Analog-digital conversion device and method with substrate temperature compensation for infrared focal plane - Google Patents
Analog-digital conversion device and method with substrate temperature compensation for infrared focal plane Download PDFInfo
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- CN112003617A CN112003617A CN202010886458.7A CN202010886458A CN112003617A CN 112003617 A CN112003617 A CN 112003617A CN 202010886458 A CN202010886458 A CN 202010886458A CN 112003617 A CN112003617 A CN 112003617A
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- H03—ELECTRONIC CIRCUITRY
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- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
Abstract
The invention discloses an analog-digital conversion device with substrate temperature compensation for an infrared focal plane, which comprises: a substrate temperature acquisition correction module and a comparator module with substrate temperature compensation; the comparator module with substrate temperature compensation comprises a comparator and a current-mode DAC; the substrate temperature acquisition and correction module acquires substrate temperature data of the infrared focal plane array and extracts corresponding related correction parameters based on the substrate temperature data; the substrate temperature acquisition and correction module applies the relevant correction parameter signal to the current mode DAC, and the current mode DAC regulates and controls the tail current of the comparator based on the relevant correction parameter signal to perform substrate temperature compensation; according to the scheme, the substrate temperature acquisition and correction module is additionally arranged on the basis of the comparator, the compensation of the substrate temperature of the comparator is realized by matching with the current type DAC, the problem that the turnover delay of the comparator is inconsistent due to different temperatures is effectively solved, the offset error of the analog-to-digital converter is reduced, the precision and the signal-to-noise ratio of the loading and changing device are improved, and the uniformity of an output image is improved.
Description
Technical Field
The invention relates to the technical field of infrared focal planes, in particular to an analog-to-digital conversion device and method with substrate temperature compensation for an infrared focal plane.
Background
Compared with a refrigeration type infrared detector, the uncooled infrared focal plane detector has the advantages of no need of refrigeration, small volume, simplicity in operation, high performance, low price and the like, and is widely applied to the fields of military affairs, industry, medicine, scientific research and the like. Uncooled infrared focal plane array systems are at a key stage in the move from multi-functional modules to monolithic integration, particularly on-chip integration of analog-to-digital converters (ADCs). The performance of the improved focal plane technology is mainly influenced by crosstalk, power supply noise and interference of other mechanisms introduced into a signal channel, and a reading circuit of the on-chip integrated analog-to-digital converter has no off-chip analog signal path and has better noise performance; the digital signal output can improve the anti-interference capability of output signals, improve the response rate of a system, improve the reliability of the system and effectively improve the performance of the infrared detector assembly.
The monoclinic ADC is one of the most commonly used column level ADC structures, and because the uncooled infrared focal plane detector does not have a refrigerating device (TEC), the detector can generate heat along with the change of the ambient temperature and the working process to generate a temperature drift phenomenon, and the temperature drift phenomenon can cause the non-uniformity problem of the analog-to-digital converter, thereby influencing the precision and the signal-to-noise ratio of the ADC, leading to the reduction of the detection quality and the image distortion.
Disclosure of Invention
To solve the above technical problems, it is an object of the present invention to provide an infrared focal plane analog-to-digital converter with substrate temperature compensation, which can eliminate the influence of the substrate temperature to improve the accuracy and the signal-to-noise ratio of the analog-to-digital converter, thereby improving the uniformity of the output image.
The invention is realized by the following technical scheme:
the invention provides an analog-digital conversion device with substrate temperature compensation for an infrared focal plane, which comprises: a substrate temperature acquisition correction module and a comparator module with substrate temperature compensation;
the comparator module with substrate temperature compensation comprises a comparator and a current-mode DAC;
the substrate temperature acquisition and correction module acquires substrate temperature data of the infrared focal plane array and extracts corresponding related correction parameters based on the substrate temperature data;
and the substrate temperature acquisition and correction module applies the relevant correction parameter signal to the current-mode DAC, and the current-mode DAC regulates and controls the tail current of the comparator to perform substrate temperature compensation based on the relevant correction parameter signal.
The working principle of the scheme is as follows: the monoclinic ADC is one of the most commonly used column-level ADC structures, and because the uncooled infrared focal plane detector does not have a refrigerating device (TEC), the detector can generate heat along with the change of the ambient temperature and the heat generated during working to generate a temperature drift phenomenon, and the temperature drift phenomenon can cause the non-uniformity problem of the analog-to-digital converter, thereby influencing the precision and the signal-to-noise ratio of the ADC, leading to the reduction of the detection quality and the distortion of images; the scheme is based on a common analog-to-digital conversion device, a comparator in the analog-to-digital conversion device is improved, a substrate temperature acquisition and correction module is additionally arranged, the comparator module with substrate temperature compensation is used in a matched mode to complete current compensation of the substrate temperature, the substrate temperature acquisition and correction module is used for carrying out temperature detection on an infrared focal plane firstly, relevant correction parameters are obtained based on the substrate, a current type DAC carries out substrate temperature compensation based on tail current of a relevant correction parameter signal regulation comparator, the problem that the comparator overturning delay is inconsistent due to different temperatures is effectively eliminated, the influence of the substrate temperature is eliminated, so that the maladjustment error of the analog-to-digital converter is reduced, the signal-to-noise ratio of the analog-to-digital.
Further preferably, the substrate temperature acquisition and correction module comprises: the temperature sensor circuit, correction parameter extraction circuit and data transmission circuit.
The further optimization scheme is that the temperature sensor circuit is respectively arranged in a group at the head column and the tail column of each row of pixels of the infrared focal plane array.
The further optimization scheme is that the method further comprises the following steps: a ramp generator, a counter and a register; the slope generator is connected to the reverse input end of the comparator; the data input end of the register is connected with the output end of the counter, and the input enabling end of the register is connected with the output end of the comparator.
According to a further optimization scheme, the current-mode DAC comprises: the power supply comprises current mirrors with various current capabilities and MOSFET switches corresponding to the current mirrors one by one; the substrate temperature acquisition correction module applies the associated correction parameter signal to the MOSFET switch.
The comparator module with substrate temperature compensation comprises a comparator and a current mode DAC, wherein the comparator comprises a same-direction input end, a reverse-direction input end, a current mode DAC control tail current connecting end and an output end;
the ramp generator is used for generating a linear ramp voltage signal which is proportional to time, and is connected to the reverse input end of the comparator;
the counter is used for generating a counting signal;
the register comprises an input enabling end, a data input end and a data registering output end; the input enable end of the register is connected to the output end of the comparator, and the data input end of the register is connected to the output end of the counter;
the substrate temperature acquisition and correction module extracts related correction parameters through substrate temperature information acquired by the temperature sensor circuit, and applies related correction parameter signals to a grid electrode of a MOSFET switch of a current type DAC of the comparator through the data transmission circuit under the control of clock signals such as row and column selection, so that the current type DAC in the comparator is controlled, and the effect of substrate temperature compensation is achieved.
By applying a linear ramp voltage signal V proportional to time generated by the ramp generatortsAnd a voltage signal V to be convertedinPerforming comparison conversion, when the linear ramp voltage signal V is in direct proportion to the timetsIs equal to the voltage signal V to be convertedinWhen the output of the comparator circuit with substrate temperature current compensation is changed from high level to low level, the enable end of the register is invalid, the counter stops transmitting data to the register, and the result registered by the register is the voltage signal V to be convertedinThe corresponding digital code completes the analog-to-digital conversion and realizes the digital output.
The invention also provides an analog-to-digital conversion method with substrate temperature compensation for the infrared focal plane, which comprises the following steps:
t1, a substrate temperature acquisition and correction module acquires substrate temperature information of the infrared focal plane array and extracts related correction parameters;
t2, applying the relevant correction parameter signal to a current mode DAC by a substrate temperature acquisition and correction module, and regulating and controlling tail current of a comparator by the current mode DAC based on the relevant correction parameter signal to perform substrate temperature compensation;
t3, comparing and converting the voltage signal to be converted and a linear ramp voltage signal generated by a ramp generator in a comparator with substrate temperature compensation, and then outputting a conversion result, and registering the down-conversion result by a register;
and T4, outputting the digital code corresponding to the conversion result of the voltage signal to be converted by the register.
Further, the specific steps of T1 are:
t1.1, a substrate temperature acquisition and correction module respectively acquires temperature information of a first row of pixels and temperature information of a last row of pixels of each row of the infrared focal plane array;
t1.2, carrying out two-point fitting on the temperature values of the first row pixels and the tail row pixels of each row to obtain a relational expression between the pixels of each row and the temperature of the substrate;
t1.3, obtaining the substrate temperature of all pixels according to the relational expression between the pixels of each row and the substrate temperature;
t1.4 calculating and extracting relevant correction parameters corresponding to the pixels based on the substrate temperature of the pixels.
Further, in T3, when the voltage signal to be converted is equal to the linear ramp voltage signal generated by the ramp generator, the comparator output with substrate temperature current compensation changes from high level to low level.
The working principle of the scheme is as follows: a temperature sensor circuit is integrated at the head and the tail of each line of pixels of the infrared focal plane array, namely the total number of temperature sensor circuit modules is 2M (M is the infrared focal plane array)Row number of columns), respectively acquiring temperature information of pixels at the head and the tail of each row: t (sub)m1And T (sub)mn。
Carrying out two-point fitting on the temperature values of the first row pixels and the tail row pixels of each row to obtain a relational expression (1) between the pixels of each row and the substrate temperature:
T(sub)m,n＝km·n+bm (1)
where m represents a row variable, n represents a column variable, km、bmIs the constant coefficient corresponding to each row.
After the substrate temperature of each row and each column of the pixel is obtained, calculating and extracting correction parameters (n bits DAC data), and considering the limitation of an input port, the correction data of the DAC adopts a serial input mode and realizes the conversion of n btis data from serial to parallel through a serial-parallel conversion circuit module; after the correction data is read into the register group and stored, the correction data is applied to the grid of the MOSFET switch of the current type DAC of the comparator through the data transmission circuit under the control of a row and column selection clock signal, so that the current type DAC is controlled, and the effect of adjusting the comparator 10 in the analog-to-digital conversion process in a substrate temperature compensation point-by-point mode is achieved.
The current type DAC is controlled by an n bits MOSFET switch, and the current capacities of current mirrors contained in the current type DAC are Isub、2·Isub、22·Isub……2n-1·Isub(ii) a Applying the correction data required for the n-th column of the m-th row transmitted by the data transmission circuit to the MOSFET switch S1、S2……SnThe magnitude of the total compensation current, i.e. the magnitude of the comparator tail current source, is controlled and selected.
Compared with the prior art, the invention has the following advantages and beneficial effects:
the invention provides an analog-digital conversion device and method with substrate temperature compensation for an infrared focal plane, which integrates a temperature sensor circuit at the head and the tail of each line of pixels of an infrared focal plane array, respectively obtains the temperature information of the head and the tail of each line of pixels, performs two-point fitting on the temperature values of the head and the tail of each line of pixels to obtain a relational expression between each line of pixels of the line and the substrate temperature, and extracts a substrate temperature correction parameter; and then regulating and controlling a current type DAC in the comparator to complete the current compensation of the substrate temperature, effectively eliminating the problem of inconsistent turnover delay of the comparator caused by different temperatures, and eliminating the influence of the substrate temperature to reduce the offset error of the analog-to-digital converter and improve the signal-to-noise ratio of the analog-to-digital converter, thereby improving the uniformity of an output image.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention.
FIG. 1 is a block diagram of an analog-to-digital conversion apparatus with substrate temperature compensation in the infrared focal plane;
FIG. 2 is an assembled schematic of the temperature sensor circuit;
FIG. 3 is a flow chart of extracting substrate temperature correction data;
fig. 4 is a schematic diagram of a comparator module structure with substrate temperature compensation.
In the drawings:
10-comparator module with substrate temperature compensation, 101-current mode DAC, 102-comparator, 20-ramp generator, 30-counter, 40-register, 50-substrate temperature acquisition correction module.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
Example 1
As shown in fig. 1, the present embodiment provides an analog-to-digital conversion apparatus with substrate temperature compensation for an infrared focal plane, including: a substrate temperature acquisition correction module 50 and a comparator module 10 with substrate temperature compensation;
the comparator module with substrate temperature compensation 10 comprises a comparator 102 and a current mode DAC 101;
the substrate temperature acquisition and correction module 50 acquires substrate temperature data of the infrared focal plane array and extracts corresponding related correction parameters based on the substrate temperature data;
the substrate temperature acquisition and correction module 50 applies the relevant correction parameter signal to the current mode DAC, and the current mode DAC 101 adjusts and controls the tail current of the comparator 102 based on the relevant correction parameter signal to perform substrate temperature compensation.
This device still includes: ramp generator 20, counter 30 and register 40;
the ramp generator 20 is connected to the inverting input of the comparator 102; the data input of register 40 is connected to the output of counter 30 and the input enable of register 40 is connected to the output of the comparator. The substrate temperature acquisition correction module 50 includes: the temperature sensor circuit, correction parameter extraction circuit and data transmission circuit.
As shown in fig. 2, the temperature sensor circuit is arranged in a group respectively at the head column and the tail column of each row of picture elements of the infrared focal plane array.
As shown in fig. 4, the current mode DAC includes: the power supply comprises current mirrors with various current capabilities and MOSFET switches corresponding to the current mirrors one by one; the substrate temperature acquisition correction module applies the associated correction parameter signal to the MOSFET switch. The current capability of the current mirror included in the current-mode DAC is Isub、2·Isub、22·Isub……2n-1·Isub(ii) a Applying the correction data required for the n-th column of the m-th row transmitted by the data transmission circuit to the MOSFET switch S1、S2……SnThe magnitude of the total compensation current, i.e. the magnitude of the comparator tail current source, is controlled and selected.
Example 2
The embodiment provides an analog-to-digital conversion method with substrate temperature compensation for an infrared focal plane, which comprises the following steps:
t1, a substrate temperature acquisition and correction module acquires substrate temperature information of the infrared focal plane array and extracts related correction parameters;
t2, applying the relevant correction parameter signal to a current mode DAC by a substrate temperature acquisition and correction module, and regulating and controlling tail current of a comparator by the current mode DAC based on the relevant correction parameter signal to perform substrate temperature compensation;
t3, comparing and converting the voltage signal to be converted and a linear ramp voltage signal generated by a ramp generator in a comparator with substrate temperature compensation, and then outputting a conversion result, and registering the down-conversion result by a register;
and T4, outputting the digital code corresponding to the conversion result of the voltage signal to be converted by the register.
As shown in fig. 3, the specific steps of T1 are:
t1.1 the substrate temperature acquisition and correction module respectively acquires the temperature information T (sub) of the first row and the first column of the pixels of the infrared focal plane arraym1Temperature information T (sub) of tail row picture elementmn；
T1.2, carrying out two-point fitting on the temperature values of the first row pixels and the tail row pixels of each row to obtain a relational expression between the pixels of each row and the temperature of the substrate;
T(sub)m,n＝km·n+bm (1)
where m represents a row variable, n represents a column variable, km、bmIs the constant coefficient corresponding to each row.
T1.3, obtaining the substrate temperature of all pixels according to the relational expression between the pixels of each row and the substrate temperature;
t1.4 calculating and extracting relevant correction parameters corresponding to the pixels based on the substrate temperature of the pixels.
At T3, when the voltage signal to be converted is equal to the linear ramp voltage signal generated by the ramp generator, the comparator output with substrate temperature current compensation changes from high to low.
After the substrate temperature of each row and each column of the pixel is obtained, calculating and extracting corresponding correction parameters (n bits DAC data), considering the limitation of an input port, adopting a serial input mode for the correction data of the DAC, and realizing the conversion from serial to parallel of the n btis data through a serial-parallel conversion circuit module; after the correction parameter data is read into the register group and stored, the correction parameter signal is applied to the gate of the MOSFET switch of the current mode DAC of the comparator 10 through the data transmission circuit under the control of the row and column selection clock signal, so that the control of the n bits current mode DAC is realized, and the effect of point-by-point adjustment of the comparator 10 relative to the substrate temperature compensation in the analog-to-digital conversion process is achieved.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (8)
1. An infrared focal plane analog-to-digital conversion apparatus with substrate temperature compensation, comprising: a substrate temperature acquisition correction module and a comparator module with substrate temperature compensation;
the comparator module with substrate temperature compensation comprises a comparator and a current-mode DAC;
the substrate temperature acquisition and correction module acquires substrate temperature data of the infrared focal plane array and extracts corresponding related correction parameters based on the substrate temperature data;
and the substrate temperature acquisition and correction module applies the relevant correction parameter signal to the current-mode DAC, and the current-mode DAC regulates and controls the tail current of the comparator to perform substrate temperature compensation based on the relevant correction parameter signal.
2. The infrared focal plane analog-to-digital conversion apparatus with substrate temperature compensation of claim 1, wherein the substrate temperature acquisition correction module comprises: the temperature sensor circuit, correction parameter extraction circuit and data transmission circuit.
3. The infrared focal plane analog-to-digital conversion device with substrate temperature compensation of claim 2, wherein the temperature sensor circuit is arranged in a group respectively at the head column and the tail column of each row of pixel elements of the infrared focal plane array.
4. The infrared focal plane analog-to-digital conversion apparatus with substrate temperature compensation of claim 1, further comprising: a ramp generator, a counter and a register;
the slope generator is connected to the reverse input end of the comparator;
the data input end of the register is connected with the output end of the counter, and the input enabling end of the register is connected with the output end of the comparator.
5. The infrared focal plane analog-to-digital conversion device with substrate temperature compensation of claim 1, wherein the current mode DAC comprises: the power supply comprises current mirrors with various current capabilities and MOSFET switches corresponding to the current mirrors one by one; the substrate temperature acquisition correction module applies the associated correction parameter signal to the MOSFET switch.
6. An analog-to-digital conversion method with substrate temperature compensation for an infrared focal plane, which is characterized by comprising the following steps:
t1, a substrate temperature acquisition and correction module acquires substrate temperature information of the infrared focal plane array and extracts related correction parameters;
t2, applying the relevant correction parameter signal to a current mode DAC by a substrate temperature acquisition and correction module, and regulating and controlling tail current of a comparator by the current mode DAC based on the relevant correction parameter signal to perform substrate temperature compensation;
t3, comparing and converting the voltage signal to be converted and a linear ramp voltage signal generated by a ramp generator in a comparator with substrate temperature compensation, and then outputting a conversion result, and registering the down-conversion result by a register;
and T4, outputting the digital code corresponding to the conversion result of the voltage signal to be converted by the register.
7. The method for analog-to-digital conversion with substrate temperature compensation of an infrared focal plane according to claim 6, wherein T1 comprises the following steps:
t1.1, a substrate temperature acquisition and correction module respectively acquires temperature information of a first row of pixels and temperature information of a last row of pixels of each row of the infrared focal plane array;
t1.2, carrying out two-point fitting on the temperature values of the first row pixels and the tail row pixels of each row to obtain a relational expression between the pixels of each row and the temperature of the substrate;
t1.3, obtaining the substrate temperature of all pixels according to the relational expression between the pixels of each row and the substrate temperature;
t1.4 calculating and extracting relevant correction parameters corresponding to the pixels based on the substrate temperature of the pixels.
8. The method of claim 6, wherein when the voltage signal to be converted is equal to the linear ramp voltage signal generated by the ramp generator at T3, the output of the comparator with substrate temperature current compensation changes from high to low.
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Cited By (2)
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| CN113607283A (en) * | 2021-08-04 | 2021-11-05 | 浙江兆晟科技股份有限公司 | Temperature control method and system for improving image nonuniformity of infrared detector |
| CN115437447A (en) * | 2022-10-26 | 2022-12-06 | 电子科技大学 | MOS tube temperature sensor with low-temperature leakage compensation |
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| CN103441763A (en) * | 2013-08-19 | 2013-12-11 | 电子科技大学 | Infrared focal-plane array and analog-digital converter of reading circuit thereof |
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