CN112000997B - Irradiation-resistant reinforcement method for optical module control application specific integrated circuit - Google Patents
Irradiation-resistant reinforcement method for optical module control application specific integrated circuit Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 35
- 230000003287 optical effect Effects 0.000 title claims abstract description 33
- 230000002787 reinforcement Effects 0.000 title abstract description 13
- 230000006870 function Effects 0.000 claims description 16
- 230000005855 radiation Effects 0.000 claims description 12
- 230000003014 reinforcing effect Effects 0.000 claims description 8
- 230000006641 stabilisation Effects 0.000 claims 2
- 238000011105 stabilization Methods 0.000 claims 2
- 230000002159 abnormal effect Effects 0.000 abstract description 2
- 238000004891 communication Methods 0.000 description 6
- 238000013461 design Methods 0.000 description 6
- 230000003471 anti-radiation Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
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- 238000005728 strengthening Methods 0.000 description 1
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- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/76—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information in application-specific integrated circuits [ASIC] or field-programmable devices, e.g. field-programmable gate arrays [FPGA] or programmable logic devices [PLD]
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Abstract
The invention provides an anti-irradiation reinforcement method of an optical module control application specific integrated circuit, which can carry out rationality judgment on read data of a storage module and remove abnormal data to obtain effective data, and determine output data according to the number and the type of the effective data.
Description
Technical Field
The invention belongs to the technical field of anti-radiation data communication, and particularly relates to an anti-radiation reinforcement method of an optical module control application specific integrated circuit.
Background
With the development of optical communication technology and the higher and higher requirements of data exchange of a client load system on communication bandwidth, more and more clients use optical transceiver module products in a space system, and a space vehicle works in a complex space radiation environment and has high requirements on the irradiation resistance of the optical module products.
The control chip is a device which is necessary to be used in the design of the high-speed optical module, and the existing irradiation-resistant universal controller such as a singlechip or an FPGA can realize the function control of the aerospace optical module, but still can not meet the practical application requirements.
The control chip applied to the optical communication product is generally based on a singlechip platform, uses ADC (analog to digital converter), I2C (input to output) communication, temperature sensing, built-in storage and the like of the singlechip, performs function development on the basis of a software design platform of the singlechip, and has defect risks in software design. The singlechip is based on a central processing unit, and has low real-time speed, stability, electromagnetic interference resistance and poor radiation resistance. The control of the optical module by adopting the FPGA architecture has similar defects when being used in an aerospace environment.
In addition, the control chip of the existing optical communication product generally adopts a traditional three-mode redundancy judging method, which generally means that three modules execute the same operation at the same time, and a plurality of the same outputs are used as the correct outputs for voting the same, and the method is generally called as three-out-of-two. The judgment is direct judgment of the data, the correctness of the data is not judged, and when the irradiation effect occurs and three data deviate at the same time, the data cannot be effectively output.
Disclosure of Invention
The invention aims at the problems in the prior art, provides an anti-irradiation reinforcement method of an optical module control application specific integrated circuit, and solves the technical problem that when three data are deviated at the same time due to irradiation interference in the process of reading the data, effective output cannot be performed.
In order to achieve the technical purpose, the invention is realized by adopting the following technical scheme:
a method for reinforcing the anti-radiation of an optical module control application specific integrated circuit comprises the following steps:
when the integrated circuit is in a normal working state, reading data stored in the same storage address of the storage module to obtain n data;
comparing the n data with the corresponding threshold value respectively to obtain effective data in the threshold value range;
and determining output data according to the number and the type of the effective data, wherein n is a natural number greater than 2.
According to the irradiation-resistant reinforcement method of the optical module control application specific integrated circuit, when the effective data is one, the effective data is directly output;
outputting a maximum value or a minimum value or an average value of the effective data according to the type of the effective data when the effective data is two-n or outputting the same effective data when the effective data includes a plurality of the same effective data.
According to the irradiation-resistant reinforcement method of the optical module control application specific integrated circuit, the maximum value or the minimum value or the average value of the effective data or a plurality of same effective data are output according to the storage address, and the storage address corresponds to the type.
The optical module controls the irradiation-resistant strengthening method of the application specific integrated circuit, and n=3.
According to the irradiation-resistant reinforcement method for the optical module control application specific integrated circuit, the data stored in the same storage address of the storage module are read for multiple times and averaged to obtain one data.
The method for reinforcing the irradiation resistance of the optical module control application specific integrated circuit comprises the following steps:
PROM, which is used to store the key data of basic function under worst irradiation;
e2PROM for storing important data capable of providing all functions;
and the SRAM is used for caching the data output by the PROM and the E2 PROM.
The irradiation-resistant reinforcement method for the optical module control application specific integrated circuit comprises the steps of entering a safe working state when the irradiation dose exceeds a normal working range when the integrated circuit is in a normal working state, and closing all functions except a main I2C and self-checking.
According to the irradiation-resistant reinforcement method for the optical module control application specific integrated circuit, when the integrated circuit is in a safe working state, temperature compensation configuration is not carried out according to a temperature value.
According to the method for reinforcing the optical module controlled application specific integrated circuit under the irradiation resistance, when the integrated circuit is in a safe working state and the irradiation dose is recovered to a normal working range, the integrated circuit enters a normal working state.
The optical module controls the irradiation-resistant reinforcement method of the special integrated circuit, and the integrated circuit is used for receiving the external trigger signal and entering a safe working state or a normal working state according to the external trigger signal.
Compared with the prior art, the invention has the advantages and positive effects that: the method for reinforcing the irradiation resistance of the optical module control application specific integrated circuit can carry out rationality judgment on the data of the read storage module and remove abnormal data to obtain effective data, and determines output data according to the number and the type of the effective data.
Other features and advantages of the present invention will become apparent upon review of the detailed description of the invention in conjunction with the drawings.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a memory module architecture according to an embodiment of the invention.
Fig. 2 is a flowchart of a method for reinforcing an integrated circuit in a normal operating state according to an embodiment of the present invention.
Fig. 3 is a flowchart illustrating a switching between a normal operation state and a safe operation state of an integrated circuit according to an embodiment of the present invention.
Detailed Description
Preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are merely for explaining the technical principles of the present invention, and are not intended to limit the scope of the present invention.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more clear, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
The irradiation-resistant reinforcement method of the optical module control application specific integrated circuit effectively solves the problem that the irradiation-resistant optical module product cannot use the traditional microcontroller in the aerospace environment. The method can realize miniaturized design meeting the irradiation resistance index requirement in the aerospace environment, replace the traditional microcontroller, cancel the embedded software design, improve the electromagnetic interference resistance, the space irradiation resistance, the real-time response speed and other performances of the controller, and can meet the irradiation resistance requirement of the integrated circuit in the aerospace environment and realize effective control of the driving chip in the optical module. The design and development of the irradiation-resistant optical module product in the aerospace environment can be realized through the embodiment, and the requirements of various load data transmission of the aerospace system are met.
Specifically, the following specifically describes a method for reinforcing the optical module control application specific integrated circuit according to this embodiment:
when the integrated circuit is in a normal working state, the data stored in the same storage address of the storage module are read to obtain n data, wherein n is a natural number greater than 2.
In order to reduce the interference of irradiation in the data reading process, preferably, the data stored in the same memory address of the memory module is read for a plurality of times and averaged to obtain one data. For example, ten times of reading and averaging are carried out on the data stored by the same storage address of the storage module to obtain one data; and then ten times of reading and averaging the data stored by the same storage address of the storage module to obtain another data, and the like until n data are obtained.
And comparing the n data with the corresponding threshold values respectively to obtain the effective data in the threshold value range. Wherein, the storage address corresponds to the determined data type, each data type corresponds to the determined threshold value, thus, the corresponding threshold value is obtained according to the storage address, and the obtained n data are compared with the threshold value corresponding to the storage address. The threshold value is a predetermined normal data range.
And determining output data according to the number and the type of the obtained effective data.
Specifically, when the valid data is one, the valid data is directly output.
When the valid data is two-n, outputting the maximum value or the minimum value or the average value of the valid data according to the type of the valid data or outputting the same valid data when the valid data includes a plurality of the same valid data.
The type of the valid data generally corresponds to the storage address, and thus, the present embodiment outputs the maximum value or the minimum value or the average value of the valid data or a plurality of the same valid data according to the storage address, and the storage address corresponds to the type of the data. The types of valid data may be data having a clear physical meaning and data having no clear physical meaning. The data having a clear physical meaning may be, for example, current data, voltage data, temperature data, etc. Of course, the present invention is not limited to the specific physical meanings described above.
This embodiment is described by taking n=3 as an example:
and comparing the three data with the corresponding threshold values respectively to obtain the number of the effective data in the threshold value range.
When the valid data is one, the valid data is directly output.
When the number of the valid data is two, outputting the maximum value or the minimum value or the average value of the valid data according to the type of the valid data.
For example, an average value is output for valid data types that have no explicit physical meaning, and a maximum value or a minimum value is output for valid data types that have explicit physical meaning according to the requirements of the data type. For example, temperature data requires output of a maximum value, and voltage data and current data require output of a minimum value. Of course, the output maximum or minimum is determined according to the specific requirements of the data type, and the present invention is not limited.
When the valid data is three, outputting the maximum value or the minimum value or the average value of the valid data according to the type of the valid data or outputting the same valid data when the valid data includes a plurality of the same valid data.
Specifically, when at least two valid data are identical, the same valid data are output.
When all three valid data are different, outputting an average value for the valid data types without the explicit physical meaning, and outputting a maximum value or a minimum value for the valid data types with the explicit physical meaning according to the requirement of the data types. For example, temperature data requires output of a maximum value, and voltage data and current data require output of a minimum value. Of course, the output maximum or minimum is determined according to the specific requirements of the data type, and the present invention is not limited.
In order to meet the miniaturization design of the integrated circuit and meet the irradiation index requirements, as shown in fig. 1, the memory module of the embodiment comprises a three-memory architecture of PROM, E2PROM and SRAM.
PROM is used to store key data of basic function under worst irradiation, and ensure chip to provide basic function under worst irradiation.
And the E2PROM is used for storing important data capable of providing all functions and guaranteeing all functions of the chip.
And the SRAM is used for caching the data output by the PROM and the E2 PROM.
When reading data, the data stored in the PROM and the E2PROM are firstly buffered in the SRAM.
As shown in fig. 2, taking n=3 as an example, the flow of the method for reinforcing the optical module control asic according to the present embodiment is specifically described:
s1, when the integrated circuit is in a normal working state, reading data stored in the same storage address of the storage module to obtain n data.
S2, comparing the n data with the corresponding threshold value respectively to obtain the effective data in the threshold value range.
And S3, when the effective data is judged to be one, the step S6 is carried out, and otherwise, the step S41 is carried out.
S41, when judging that the number of the effective data is two, the method proceeds to step S42, otherwise, the method proceeds to step S51.
S42, judging whether the effective data has definite physical meaning, if so, proceeding to step S43, otherwise proceeding to step S44.
S43, taking the maximum value or the minimum value according to the requirement of the physical meaning, and entering step S6.
S44, taking an average value, and entering a step S6.
S51, when the number of the effective data is three, the step S52 is entered, otherwise, the reading error is prompted.
S52, judging that at least two effective data are the same, and entering a step S53, otherwise, entering a step S54, wherein the three effective data are different.
S53, taking the same effective data, and proceeding to step S6.
S54, judging whether the effective data has definite physical meaning, if so, proceeding to step S55, otherwise proceeding to step S56.
S55, taking the maximum value or the minimum value according to the requirement of the physical meaning, and entering step S6.
S56, taking an average value, and entering a step S6.
S6, outputting.
In order to ensure that the integrated circuit is not damaged when the irradiation dose is too large, the original function can be recovered after the excessive irradiation. When the integrated circuit is in a normal working state, the embodiment enters a safe working state when the irradiation dose exceeds a normal working range, all functions except the main I2C and the self-checking are closed, and temperature compensation configuration is not carried out according to a temperature value. When the integrated circuit is in a safe working state, and the irradiation dose is recovered to a normal working range, the integrated circuit enters a normal working state.
The irradiation dose is monitored by the integrated circuit working state monitoring module, when the temperature and the working current are out of standard, the irradiation dose is considered to exceed the normal working range, and when the temperature and the working current are out of standard, the irradiation dose is considered to be in the normal working range.
Specifically, when the detected temperature and current value exceed the normal working range but do not reach the degree of damaging the chip, the chip enters a safe working state, the main I2C configures the peripheral chip as a standard value, temperature compensation configuration is not carried out according to the temperature value, all functions except the main I2C and self-detection are closed, and the chip is protected in real time; and after the self-checking temperature and the current are recovered to be normal, the safety working state is exited after a period of time, and the normal working state is entered.
Of course, the integrated circuit may also be used to directly receive an external trigger signal, and enter a safe working state or a normal working state according to the external trigger signal. Specifically, the integrated circuit chip is provided with a functional pin for receiving an external trigger signal.
As shown in fig. 3, the flow of switching between the normal operation state and the safe operation state of the integrated circuit of the present embodiment is specifically described:
s1, the integrated circuit is in a normal working state.
S2, monitoring the temperature and the working current.
S3, when the temperature and the working current exceed the standards, or an external trigger signal is received, the step S4 is carried out, otherwise, the step S2 is carried out.
S4, the integrated circuit is in a safe working state.
And S5, monitoring the temperature and the working current.
S6, when the temperature and the working current are not out of standard, or an external trigger signal is received, entering a step S1, otherwise, entering a step S5.
The external trigger signals in step S3 and step S6 may be the same signal or two signals, preferably two signals.
Aiming at the radiation-resistant reinforcement requirement of the logic redundancy of the integrated circuit, the embodiment provides a three-memory architecture comprising a PROM, an E2PROM and an SRAM. A three-storage architecture logic design superior to three-mode redundancy (TMR) is provided for three stored data outputs, so that the controller can be applied to an aerospace environment and meets the requirements of radiation resistance indexes.
In addition, the radiation resistance of the chip in the safe working state is reinforced, so that the integrated circuit can enter a safe working mode when the radiation index exceeds the design index, the integrated circuit cannot be damaged when the radiation dose is exceeded, and the integrated circuit can recover the normal function after the excessive radiation environment is passed.
The above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be apparent to one skilled in the art that modifications may be made to the technical solutions described in the foregoing embodiments, or equivalents may be substituted for some of the technical features thereof; such modifications and substitutions do not depart from the spirit and scope of the corresponding technical solutions.
Claims (8)
1. A method for reinforcing the irradiation resistance of an optical module control application specific integrated circuit is characterized in that:
when the integrated circuit is in a normal working state, reading data stored in the same storage address of the storage module for multiple times and taking an average value to obtain data, and obtaining n data;
comparing the n data with the corresponding threshold value respectively to obtain effective data in the threshold value range; the storage address corresponds to the determined data types, each data type corresponds to the determined threshold value, the corresponding threshold value is obtained according to the storage address, and the obtained n data are compared with the threshold value corresponding to the storage address; the threshold value is a normal data range determined in advance;
determining output data according to the number and the type of the effective data, wherein n is a natural number greater than 2;
when the effective data is one, directly outputting the effective data;
outputting a maximum value or a minimum value or an average value of the effective data according to the type of the effective data when the effective data is two-n or outputting the same effective data when the effective data includes a plurality of the same effective data.
2. The method according to claim 1, wherein a maximum value or a minimum value or an average value of the effective data or a plurality of the same effective data is outputted according to the memory address, the memory address corresponding to the type.
3. The method of radiation protection and stabilization of an optical module control asic according to claim 2, wherein n = 3.
4. The method of radiation protection and stabilization of an optical module control asic of claim 1, wherein the memory module comprises:
PROM, which is used to store the key data of basic function under worst irradiation;
e2PROM for storing important data capable of providing all functions;
and the SRAM is used for caching the data output by the PROM and the E2 PROM.
5. The method of claim 1, wherein when the integrated circuit is in a normal operating state, and when the radiation dose exceeds the normal operating range, the integrated circuit enters a safe operating state, and all functions except the main I2C and the self-test are turned off.
6. The method of claim 5, wherein the integrated circuit is configured without temperature compensation according to a temperature value when the integrated circuit is in a safe operating state.
7. The method of claim 5, wherein the integrated circuit enters a normal operating state when the radiation dose is restored to a normal operating range while the integrated circuit is in a safe operating state.
8. The method of claim 1, wherein the integrated circuit is configured to receive an external trigger signal, and enter a safe operating state or a normal operating state according to the external trigger signal.
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| JP2010128808A (en) * | 2008-11-27 | 2010-06-10 | Hitachi Ltd | Storage control apparatus |
| CN207149259U (en) * | 2017-09-13 | 2018-03-27 | 湖南斯北图科技有限公司 | A kind of satellite data radioresistance storage device of reinforcing |
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| JP2010128808A (en) * | 2008-11-27 | 2010-06-10 | Hitachi Ltd | Storage control apparatus |
| CN207149259U (en) * | 2017-09-13 | 2018-03-27 | 湖南斯北图科技有限公司 | A kind of satellite data radioresistance storage device of reinforcing |
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