CN112000997A - Anti-irradiation reinforcing method for optical module control special integrated circuit - Google Patents
Anti-irradiation reinforcing method for optical module control special integrated circuit Download PDFInfo
- Publication number
- CN112000997A CN112000997A CN202010820000.1A CN202010820000A CN112000997A CN 112000997 A CN112000997 A CN 112000997A CN 202010820000 A CN202010820000 A CN 202010820000A CN 112000997 A CN112000997 A CN 112000997A
- Authority
- CN
- China
- Prior art keywords
- data
- integrated circuit
- module control
- radiation
- optical module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 43
- 230000003287 optical effect Effects 0.000 title claims abstract description 34
- 230000003014 reinforcing effect Effects 0.000 title claims abstract description 20
- 230000006870 function Effects 0.000 claims description 16
- 230000005855 radiation Effects 0.000 claims description 16
- 230000002787 reinforcement Effects 0.000 claims description 4
- 238000012360 testing method Methods 0.000 claims description 3
- 238000005510 radiation hardening Methods 0.000 claims 7
- 230000002159 abnormal effect Effects 0.000 abstract description 2
- 230000008569 process Effects 0.000 description 8
- 238000013461 design Methods 0.000 description 7
- 238000004891 communication Methods 0.000 description 6
- 238000012935 Averaging Methods 0.000 description 3
- 230000003471 anti-radiation Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/76—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information in application-specific integrated circuits [ASIC] or field-programmable devices, e.g. field-programmable gate arrays [FPGA] or programmable logic devices [PLD]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Computer Security & Cryptography (AREA)
- Software Systems (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
The invention provides an anti-irradiation reinforcing method of an optical module control special integrated circuit, which can be used for reasonably judging the read data of a storage module and eliminating abnormal data to obtain effective data, and determining output data according to the number and the type of the effective data.
Description
Technical Field
The invention belongs to the technical field of anti-irradiation data communication, and particularly relates to an anti-irradiation reinforcing method for an integrated circuit special for optical module control.
Background
With the development of optical communication technology and the increasing demand of data exchange of a customer load system on communication bandwidth, more and more customers use optical transceiver module products in an aerospace system, and a spacecraft works in a complex aerospace radiation environment and has a high requirement on the anti-irradiation capacity of the optical module products.
The control chip is a device which must be used in the design of the high-speed optical module, and the existing anti-irradiation general controller such as a single chip microcomputer or an FPGA can realize the function control of the aerospace optical module, but can not meet the actual application requirements.
The control chip applied to optical communication products is generally based on a single chip microcomputer platform, ADC, I2C communication, temperature sensing, built-in storage and the like of the single chip microcomputer are applied, a software design platform based on the single chip microcomputer is used for function development, and the risk of defects in software design exists. The singlechip is based on the central processing unit, and has low real-time speed, stability, electromagnetic interference resistance and poor irradiation resistance. The control of the optical module by adopting the FPGA framework has similar defects when used in an aerospace environment.
In addition, the control chip of the existing optical communication product generally adopts a traditional triple modular redundancy judgment method, which generally means that three modules execute the same operation at the same time, and the majority of the same outputs are used as the correct outputs for voting the same, which is generally called as two out of three. The judgment is a direct judgment of the data, the correctness of the data is not judged, and when the irradiation effect occurs and the three data have deviation at the same time, the effective output cannot be carried out.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides an anti-irradiation reinforcing method for an optical module control special integrated circuit, which solves the technical problem that when three data are simultaneously deviated due to irradiation interference in the data reading process, effective output cannot be carried out.
In order to achieve the technical purpose, the invention adopts the following technical scheme:
an anti-irradiation reinforcement method of an optical module control application specific integrated circuit comprises the following steps:
when the integrated circuit is in a normal working state, reading data stored in the same storage address of the storage module to obtain n data;
comparing the n data with corresponding threshold values respectively to obtain effective data within the threshold value range;
and determining output data according to the number and the type of the effective data, wherein n is a natural number greater than 2.
According to the method for reinforcing the radiation resistance of the optical module control application specific integrated circuit, when the effective data is one, the effective data is directly output;
when the effective data is two-n, outputting the maximum value, the minimum value or the average value of the effective data according to the type of the effective data or outputting the same effective data when the effective data comprises a plurality of same effective data.
According to the method for reinforcing the radiation resistance of the optical module control application specific integrated circuit, the maximum value or the minimum value or the average value of the effective data or a plurality of same effective data are output according to the storage address, and the storage address corresponds to the type.
The method for reinforcing the radiation resistance of the light module control application specific integrated circuit is as described above, wherein n = 3.
The method for reinforcing the radiation resistance of the optical module control special integrated circuit reads data stored in the same storage address of the storage module for multiple times and obtains one datum after averaging.
The method for reinforcing the radiation resistance of the optical module control application specific integrated circuit comprises the following steps:
the PROM is used for storing core key data which can provide basic functions under the worst irradiation condition;
e2PROM, which is used to store important data that can provide all functions;
and the SRAM is used for caching the externally output data of the PROM and the E2 PROM.
According to the method for reinforcing the radiation resistance of the optical module control application specific integrated circuit, when the integrated circuit is in a normal working state and the irradiation dose exceeds a normal working range, the integrated circuit enters a safe working state, and all functions except the main I2C and self-test are closed.
According to the irradiation-resistant reinforcing method of the optical module control application-specific integrated circuit, when the integrated circuit is in a safe working state, temperature compensation configuration is not carried out according to a temperature value.
According to the method for reinforcing the radiation resistance of the optical module control application specific integrated circuit, when the integrated circuit is in a safe working state and the irradiation dose is restored to a normal working range, the integrated circuit enters a normal working state.
According to the irradiation-resistant reinforcing method of the optical module control application specific integrated circuit, the integrated circuit is used for receiving an external trigger signal and enters a safe working state or a normal working state according to the external trigger signal.
Compared with the prior art, the invention has the advantages and positive effects that: the invention relates to an anti-irradiation reinforcing method of an optical module control special integrated circuit, which can reasonably judge the read data of a storage module and eliminate abnormal data to obtain effective data, and determines output data according to the number and the type of the effective data.
Other features and advantages of the present invention will become more apparent from the following detailed description of the invention when taken in conjunction with the accompanying drawings.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a diagram of a memory module architecture according to an embodiment of the present invention.
Fig. 2 is a flowchart of an anti-radiation reinforcing method for integrated circuits in normal operation according to an embodiment of the present invention.
Fig. 3 is a flowchart illustrating a switching process between a normal operating state and a safe operating state of an integrated circuit according to an embodiment of the present invention.
Detailed Description
Preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only for explaining the technical principle of the present invention, and are not intended to limit the scope of the present invention.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention.
The anti-irradiation reinforcing method of the optical module control special integrated circuit effectively solves the problem that a traditional microcontroller cannot be used by an anti-irradiation optical module product in an aerospace environment. The embodiment can realize the miniaturization design meeting the requirement of the anti-radiation index in the aerospace environment, replace the traditional microcontroller, cancel the embedded software design, improve the performances of the controller such as anti-electromagnetic interference capability, anti-space radiation capability, real-time response speed and the like, meet the requirement of the integrated circuit on anti-radiation in the aerospace environment, and realize the effective control on the driving chip in the optical module. The design and development of the anti-irradiation light module product in the aerospace environment can be realized through the embodiment, and the requirement of various load data transmission of the aerospace system is met.
Specifically, the following describes a method for reinforcing the radiation resistance of the asic for controlling an optical module in this embodiment:
when the integrated circuit is in a normal working state, reading data stored in the same storage address of the storage module to obtain n data, wherein n is a natural number greater than 2.
In order to reduce the interference of irradiation on the data reading process, preferably, the data stored in the same storage address of the storage module is read for multiple times and averaged to obtain one data. For example, ten times of reading data stored in the same storage address of the storage module and averaging to obtain one data; and reading the data stored in the same storage address of the storage module for ten times, averaging to obtain another data, and repeating the steps until n data are obtained.
And comparing the n data with corresponding threshold values respectively to obtain effective data within the threshold value range. The storage address corresponds to the determined data type, and each data type corresponds to the determined threshold, so that the corresponding threshold is obtained according to the storage address, and the obtained n data are compared with the threshold corresponding to the storage address. The threshold is a predetermined normal data range.
And determining output data according to the number and the type of the obtained effective data.
Specifically, when the valid data is one, the valid data is directly output.
When the valid data is two-n, the maximum value, the minimum value, or the average value of the valid data is output according to the type of the valid data or the same valid data is output when the valid data includes a plurality of same valid data.
The type of valid data generally corresponds to the memory address, and therefore, the present embodiment outputs the maximum value, the minimum value, the average value, or a plurality of same valid data according to the memory address, and the memory address corresponds to the type of data. The types of valid data may be data with a definite physical meaning and data without a definite physical meaning. The data with a well-defined physical meaning may be, for example, current data, voltage data, temperature data, etc. Of course, the present invention is not limited to the specific physical meanings described above.
This embodiment is described with n =3 as an example:
and comparing the three data with corresponding threshold values respectively to obtain the number of effective data in the threshold value range.
And when the valid data is one, directly outputting the valid data.
When the valid data is two, the maximum value or the minimum value or the average value of the valid data is output according to the type of the valid data.
For example, the average value is output for valid data types without clear physical meaning, and the maximum value or the minimum value is output for valid data types with clear physical meaning according to the requirement of the data type. For example, temperature data requires a maximum output, voltage data and current data requires a minimum output. Of course, the maximum value or the minimum value of the output is determined according to the specific requirements of the data type, and the invention is not limited.
When the valid data is three, a maximum value, a minimum value, or an average value of the valid data is output according to the type of the valid data or the same valid data is output when the valid data includes a plurality of the same valid data.
Specifically, when at least two valid data are the same, the same valid data is output.
When the three effective data are different, outputting an average value for the effective data type without clear physical meaning, and outputting a maximum value or a minimum value for the effective data type with clear physical meaning according to the requirement of the data type. For example, temperature data requires a maximum output, voltage data and current data requires a minimum output. Of course, the maximum value or the minimum value of the output is determined according to the specific requirements of the data type, and the invention is not limited.
In order to satisfy the miniaturization design of the integrated circuit and the requirement of the radiation resistance index, as shown in fig. 1, the memory module of the embodiment includes three memory architectures of PROM, E2PROM, and SRAM.
The PROM is used for storing core key data which can provide basic functions under the worst irradiation condition, and ensuring that the chip can provide the basic functions under the worst irradiation condition.
And the E2PROM is used for storing important data capable of providing all functions and ensuring all functions of the chip.
And the SRAM is used for caching the externally output data of the PROM and the E2 PROM.
When reading data, firstly, the data stored in the PROM and the E2PROM are cached in the SRAM.
As shown in fig. 2, taking n =3 as an example, a flow of the method for reinforcing the radiation resistance of the optical module control asic of the present embodiment is specifically described:
and S1, when the integrated circuit is in a normal working state, reading the data stored in the same storage address of the storage module to obtain n data.
And S2, comparing the n data with the corresponding threshold values respectively to obtain the effective data in the threshold value range.
S3, when the valid data is judged to be one, the step S6 is executed, otherwise, the step S41 is executed.
S41, when the two effective data are judged, the step S42 is proceeded, otherwise, the step S51 is proceeded.
S42, judging whether the valid data has clear physical meaning, if yes, entering step S43, otherwise entering step S44.
S43, the maximum value or the minimum value is obtained according to the requirement of the physical meaning, and the process proceeds to step S6.
S44, an average value is obtained, and the process proceeds to step S6.
S51, when the number of the effective data is three, the step S52 is entered, otherwise, a reading error is prompted.
S52, judging that at least two effective data are the same, and entering the step S53, otherwise, the three effective data are different, and entering the step S54.
S53, the same valid data is obtained, and the process goes to step S6.
S54, judging whether the valid data has clear physical meaning, if yes, entering step S55, otherwise entering step S56.
S55, the maximum value or the minimum value is obtained according to the requirement of the physical meaning, and the process proceeds to step S6.
S56, an average value is obtained, and the process proceeds to step S6.
And S6, outputting.
In order to ensure that the integrated circuit is not damaged when the irradiation dose is too large, the original function can be recovered after excessive irradiation. In the embodiment, when the integrated circuit is in a normal working state and the irradiation dose exceeds a normal working range, the integrated circuit enters a safe working state, all functions except the main I2C and self-test are closed, and temperature compensation configuration is not performed according to a temperature value. When the integrated circuit is in a safe working state and the irradiation dose returns to a normal working range, the integrated circuit enters a normal working state.
Wherein, the irradiation dose is monitored through integrated circuit operating condition monitoring module, when temperature and operating current all exceed standard, think that the irradiation dose exceeds normal working range, think that the irradiation dose is in normal working range when temperature and operating current do not exceed standard.
Specifically, when the detected temperature and current values exceed the normal working range but do not reach the degree of damaging the chip, the chip enters a safe working state, the main I2C configures the peripheral chip as a standard value, temperature compensation configuration is not performed according to the temperature value, all functions except the main I2C and self-checking are closed, and the chip is protected in real time; and after the self-checking temperature and the current are recovered to be normal, the safety working state is delayed for a period of time, and the normal working state is entered.
Of course, the integrated circuit may also be configured to directly receive an external trigger signal, and enter a safe operating state or a normal operating state according to the external trigger signal. Specifically, the integrated circuit chip has a functional pin for receiving an external trigger signal.
As shown in fig. 3, a flow of switching between the normal operating state and the safe operating state of the integrated circuit of the embodiment is specifically described:
and S1, the integrated circuit is in a normal working state.
And S2, monitoring the temperature and the working current.
S3, when the temperature and the working current exceed the standard, or the external trigger signal is received, the method goes to step S4, otherwise, the method goes to step S2.
And S4, the integrated circuit is in a safe working state.
And S5, monitoring the temperature and the working current.
S6, when the temperature and the working current do not exceed the standard or an external trigger signal is received, the method goes to step S1, otherwise, the method goes to step S5.
The external trigger signals in steps S3 and S6 may be the same signal or two signals, preferably two signals.
The embodiment provides a three-storage framework comprising PROM, E2PROM and SRAM aiming at the anti-irradiation reinforcement requirement of the logic redundancy of the integrated circuit. A three-storage-architecture logic design superior to Triple Modular Redundancy (TMR) is provided for three kinds of stored data output, so that the controller can be applied to an aerospace environment and meet the requirement of radiation resistance indexes.
In addition, the embodiment can enable the integrated circuit to enter a safe working mode when the irradiation index exceeds the design index through the irradiation resistance reinforcement of the safe working state of the chip, the integrated circuit cannot be damaged when the irradiation dose exceeds the design index, and the integrated circuit can recover the normal function after the excessive irradiation environment passes.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions.
Claims (10)
1. An anti-irradiation reinforcing method of an optical module control special integrated circuit is characterized in that:
when the integrated circuit is in a normal working state, reading data stored in the same storage address of the storage module to obtain n data;
comparing the n data with corresponding threshold values respectively to obtain effective data within the threshold value range;
and determining output data according to the number and the type of the effective data, wherein n is a natural number greater than 2.
2. The method for radiation-hardening of an optical module control asic according to claim 1, wherein when the valid data is one, the valid data is directly output;
when the effective data is two-n, outputting the maximum value, the minimum value or the average value of the effective data according to the type of the effective data or outputting the same effective data when the effective data comprises a plurality of same effective data.
3. The method for radiation-hardening a light module control asic according to claim 2, characterized in that a maximum or minimum or average of the valid data or a plurality of identical valid data is output according to the memory address, which corresponds to the type.
4. The method for radiation-hardening a light module control asic according to claim 3, wherein n = 3.
5. The method according to claim 1, wherein the data stored in the same memory address of the memory module is read a plurality of times and averaged to obtain one data.
6. The method for radiation-hardening of a light module control asic according to claim 1, wherein the memory module comprises:
the PROM is used for storing core key data which can provide basic functions under the worst irradiation condition;
e2PROM, which is used to store important data that can provide all functions;
and the SRAM is used for caching the externally output data of the PROM and the E2 PROM.
7. The method for radiation-resistant reinforcement of an optical module control asic according to claim 1, wherein when the ic is in a normal operating state, and when the radiation dose exceeds a normal operating range, the ic enters a safe operating state, and all functions except the main I2C and self-test are turned off.
8. The method for radiation-hardening of an optical module control asic according to claim 7, wherein the temperature compensation configuration is not performed according to a temperature value when the ic is in a safe operating state.
9. The method for radiation-hardening of an optical module control asic according to claim 7, wherein the integrated circuit enters a normal operation state when the integrated circuit is in a safe operation state and the radiation dose returns to a normal operation range.
10. The method for radiation-hardening of an optical module control asic according to claim 1, wherein the ic is configured to receive an external trigger signal and enter a safe operating state or a normal operating state according to the external trigger signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010820000.1A CN112000997B (en) | 2020-08-14 | 2020-08-14 | Irradiation-resistant reinforcement method for optical module control application specific integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010820000.1A CN112000997B (en) | 2020-08-14 | 2020-08-14 | Irradiation-resistant reinforcement method for optical module control application specific integrated circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112000997A true CN112000997A (en) | 2020-11-27 |
| CN112000997B CN112000997B (en) | 2024-03-01 |
Family
ID=73472544
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010820000.1A Active CN112000997B (en) | 2020-08-14 | 2020-08-14 | Irradiation-resistant reinforcement method for optical module control application specific integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112000997B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112667536A (en) * | 2021-01-22 | 2021-04-16 | 中航海信光电技术有限公司 | Anti-irradiation design architecture and control method of optical module control special integrated circuit |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010128808A (en) * | 2008-11-27 | 2010-06-10 | Hitachi Ltd | Storage control apparatus |
| CN207149259U (en) * | 2017-09-13 | 2018-03-27 | 湖南斯北图科技有限公司 | A kind of satellite data radioresistance storage device of reinforcing |
-
2020
- 2020-08-14 CN CN202010820000.1A patent/CN112000997B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010128808A (en) * | 2008-11-27 | 2010-06-10 | Hitachi Ltd | Storage control apparatus |
| CN207149259U (en) * | 2017-09-13 | 2018-03-27 | 湖南斯北图科技有限公司 | A kind of satellite data radioresistance storage device of reinforcing |
Non-Patent Citations (2)
| Title |
|---|
| 何晓垒;张凤军;唐骁;: "小型化抗辐照DWDM光收发模块研究", 光通信技术, no. 07 * |
| 张凤军;唐骁;陈坚;: "基于Ansys热仿真的航天光模块的热设计", 光通信技术, no. 03 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112667536A (en) * | 2021-01-22 | 2021-04-16 | 中航海信光电技术有限公司 | Anti-irradiation design architecture and control method of optical module control special integrated circuit |
| CN112667536B (en) * | 2021-01-22 | 2023-06-09 | 青岛兴航光电技术有限公司 | Irradiation-resistant design architecture of optical module control application specific integrated circuit and control method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112000997B (en) | 2024-03-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8732532B2 (en) | Memory controller and information processing system for failure inspection | |
| US8934779B2 (en) | Operational status indicators in an optical transceiver using dynamic thresholds | |
| US10678634B2 (en) | Method and apparatus of using parity to detect random faults in memory mapped configuration registers | |
| US9952579B2 (en) | Control device | |
| EP1721397B1 (en) | Integrated post-amplifier, laser driver, and controller | |
| US20230350746A1 (en) | Fault-tolerant system with multi-core cpus capable of being dynamically configured | |
| US20050219886A1 (en) | Memory device with built-in test function and method for controlling the same | |
| CN112000997A (en) | Anti-irradiation reinforcing method for optical module control special integrated circuit | |
| CN109756103B (en) | Power supply and distribution control system and control method for space flight verification platform | |
| US8935566B2 (en) | Plug-in card storage device and error correction control method thereof | |
| CN105607974A (en) | High-reliability multicore processing system | |
| CN111381660B (en) | Power supply control system and method of multi-node server based on CPLD (complex programmable logic device) | |
| CN112751688B (en) | Flow control processing method of OTN (optical transport network) equipment, electronic equipment and storage medium | |
| WO2021081755A1 (en) | Systems, circuits, and methods for determining status of fuse or relay | |
| US11535179B2 (en) | Vehicle communication system | |
| JP5644859B2 (en) | Bus control device and bus control method | |
| CN112667536B (en) | Irradiation-resistant design architecture of optical module control application specific integrated circuit and control method | |
| Shen et al. | Research on anti-SEU strategy for remote sensing camera based on SRAM-FPGA | |
| KR20200069900A (en) | Software-based reconfiguration unit within the satellite | |
| CN113568790B (en) | Chip detection method, detection device and electronic equipment | |
| CN112817361A (en) | High-precision high-stability constant current source circuit | |
| WO2024131848A1 (en) | System-on-chip and automobile | |
| US20230411971A1 (en) | Power management system, micro-controller unit, battery management system, and battery | |
| US20200356435A1 (en) | System and method to provide safety partition for automotive system-on-a-chip | |
| JP6807165B2 (en) | Power control system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 266061 7th floor, A6 / F, Hisense R & D center, 399 Songling Road, Laoshan District, Qingdao City, Shandong Province Applicant after: Qingdao Xinghang Photoelectric Technology Co.,Ltd. Address before: 266061 7th floor, A6 / F, Hisense R & D center, 399 Songling Road, Laoshan District, Qingdao City, Shandong Province Applicant before: HISENSE & JONHON OPTICAL-ELECTRICAL TECHNOLOGIES Co.,Ltd. |
|
| CB02 | Change of applicant information | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |