CN111965427A - Testing device for piezoelectric device - Google Patents

Testing device for piezoelectric device Download PDF

Info

Publication number
CN111965427A
CN111965427A CN202010723814.3A CN202010723814A CN111965427A CN 111965427 A CN111965427 A CN 111965427A CN 202010723814 A CN202010723814 A CN 202010723814A CN 111965427 A CN111965427 A CN 111965427A
Authority
CN
China
Prior art keywords
rod
pressing block
electrode
base
rod part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010723814.3A
Other languages
Chinese (zh)
Inventor
范晓荣
董显林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Ceramics of CAS
Original Assignee
Shanghai Institute of Ceramics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Ceramics of CAS filed Critical Shanghai Institute of Ceramics of CAS
Priority to CN202010723814.3A priority Critical patent/CN111965427A/en
Publication of CN111965427A publication Critical patent/CN111965427A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals

Abstract

The present invention provides a testing device for a piezoelectric device, comprising: the electrode base comprises two electrode blocks which are insulated and respectively connected with the access end of the test equipment and a pressing block arranged above the electrode blocks, and positive and negative leads of a tested electric device are connected between the electrode blocks and the pressing block; a base connected with the electrode holder, wherein a mounting hole is formed in the base, and a mandril protruding from the upper surface of the base and a spring sleeved in an inner hole of the mandril and capable of enabling the mandril to rebound upwards are arranged in the mounting hole; the pressing rod capable of rotating around the shaft between the pressing block and the ejector rod to play a role of leverage comprises a first rod part and a second rod part, wherein the first rod part is positioned on one side of the shaft, close to the ejector rod, the lower surface of the first rod part is in contact with the top of the ejector rod, the second rod part is positioned on the other side of the shaft, close to the pressing block, and the second rod part is connected with the pressing block. The invention can effectively improve the testing efficiency.

Description

Testing device for piezoelectric device
Technical Field
The invention relates to the field of testing of piezoelectric devices, in particular to a testing device of a piezoelectric device.
Background
In the existing piezoelectric device, especially the two-terminal piezoelectric device led out by a lead, when testing the electrical performance, usually, an impedance analyzer (such as Agilent 4294A) is used to clamp the positive and negative leads into a testing fixture, such as a 16047E-shaped fixture, and the positive and negative leads are fixed by two screws, and both the positive and negative leads need to be loosened and tightened.
Disclosure of Invention
In view of the above, an object of the present invention is to provide a test apparatus for a piezoelectric device, which can effectively improve test efficiency.
To this end, the present invention provides a piezoelectric device testing apparatus comprising: the electrode base comprises two electrode blocks which are insulated and respectively connected with the access end of the test equipment and a pressing block arranged above the electrode blocks, and positive and negative leads of a tested electric device are connected between the electrode blocks and the pressing block; a base connected with the electrode holder, wherein a mounting hole is formed in the base, and a mandril protruding from the upper surface of the base and a spring sleeved in an inner hole of the mandril and capable of enabling the mandril to rebound upwards are arranged in the mounting hole; the pressing rod capable of rotating around the shaft between the pressing block and the ejector rod to play a role of leverage comprises a first rod part and a second rod part, wherein the first rod part is positioned on one side of the shaft, close to the ejector rod, the lower surface of the first rod part is in contact with the top of the ejector rod, the second rod part is positioned on the other side of the shaft, close to the pressing block, and the second rod part is connected with the pressing block.
According to the invention, the electrical connection between the positive and negative leads of the tested sample and the access end of the testing device can be simply and conveniently realized only by pressing and loosening the first rod part of the pressure lever, so that the testing efficiency can be effectively improved, and the requirement of mass production testing is met.
Preferably, the two electrode blocks are respectively connected with the access end of the test equipment through positive and negative leads.
Preferably, an inner cavity for wiring the positive and negative electrode leads is further formed on one surface of the base adjacent to the electrode holder. Therefore, the connection between the electrode block of the electrode holder and the access end of the test equipment can be effectively realized through a simple structure.
Preferably, the electrode holder is connected to the base by a fastener.
Preferably, the pressing block is connected to the second rod portion of the pressing rod by a fastener. Therefore, the linkage of the pressing block and the pressing rod can be effectively realized.
Preferably, the test device is an impedance analyzer.
Drawings
Fig. 1 is a schematic structural view showing an embodiment of a test apparatus for a piezoelectric device according to the present invention;
FIG. 2 is a cross-sectional view A-A of FIG. 1;
FIG. 3 is a schematic view showing an application of the testing apparatus shown in FIG. 1, wherein some components thereof are omitted for clarity of illustrating a connection state of the testing apparatus;
reference numerals:
1. a base;
2. a spring;
3. a hexagon socket head cap screw;
4. a bolt;
5. an electrode holder;
6. briquetting;
7. a top rod;
8. a shaft;
9. a pressure lever;
9a, a first rod part;
9b, a second rod part;
10. a bolt;
11. positive and negative electrode leads;
12. a metal electrode block;
13. an inner cavity;
14. and (6) testing the equipment.
Detailed Description
The present invention is further described below in conjunction with the following embodiments and the accompanying drawings, it being understood that the drawings and the following embodiments are illustrative of the invention only and are not limiting thereof.
The present invention relates to a testing device for a piezoelectric device, comprising: the electrode seat comprises two electrode blocks which are insulated and respectively connected with the access end of the test equipment and a pressing block arranged above the electrode blocks, and positive and negative leads of the tested electric device are connected between the electrode blocks and the pressing block; a base connected with the electrode base, wherein a mounting hole is formed in the base, and a mandril protruding from the upper surface of the base and a spring which is sleeved in an inner hole of the mandril and can enable the mandril to rebound upwards are arranged in the mounting hole; the pressing rod capable of rotating around the shaft between the pressing block and the ejector rod to play a role of leverage comprises a first rod part which is positioned on one side of the shaft close to the ejector rod and the lower surface of which is contacted with the top of the ejector rod, and a second rod part which is positioned on the other side of the shaft close to the pressing block and is connected with the pressing block. The test equipment may be any test equipment suitable for piezoelectric devices, such as impedance analyzers, with an access terminal.
The invention changes the screw fixing connection of two terminals of the existing piezoelectric device into the spring bayonet connection, thereby on one hand, avoiding the damage of the clamp, and importantly, greatly improving the test efficiency of the product and meeting the requirement of mass production test. The testing device mainly comprises two parts: one part is a spring control clamping part mainly formed by the ejector rod, the spring, the pressure rod and the pressing block, so that the quick clamping function of the positive and negative leads is realized, and the other part is an electrode seat part, so that the function of connecting the positive and negative leads into a test device is realized.
Fig. 1 to 3 show an embodiment of a test apparatus for a piezoelectric device according to the present invention. As shown in fig. 1 to 3, the piezoelectric device testing apparatus according to the present embodiment includes a base 1, and the base 1 may have a substantially rectangular parallelepiped shape, for example. An electrode holder 5 is attached to one end of the base 1. The electrode holder 5 may be mounted to the base 1 by fasteners. For example, in the present embodiment, connection holes are provided at positions corresponding to the electrode holder 5 and the base 1, respectively, wherein the connection holes in the electrode holder 5 are through holes penetrating the electrode holder 5. Fasteners (e.g., hexagon socket head cap screws 3) are inserted into the connection holes of both the electrode holder 5 and the base 1 in order from the electrode holder 5 side to mount the electrode holder 5 to the base 1. The electrode seat 5 and the base 1 are combined together to realize the mounting and the taking of the piezoelectric device to be tested.
Specifically, the electrode holder 5 mainly includes a metal electrode block for connecting to the access terminals (e.g., positive and negative electrodes) of the testing device such as an impedance analyzer, so as to implement the testing function. As shown in fig. 3, the metal electrode block may be divided into two parts by an insulating material to form two-part metal electrode blocks 12 for positive and negative electrodes separated by the insulating material. As also shown in fig. 3, the metal electrode block 12 may be connected to the access terminal of the impedance analyzer through positive and negative leads 11, respectively. In this embodiment, an Agilent4294A type impedance analyzer may be used as the impedance analyzer. As shown in fig. 1 to 3, a pressing block 6 is provided above the electrode holder 5, i.e., above the metal electrode block 12, and positive and negative leads of the sample to be measured can be inserted between the metal electrode block 12 and the pressing block 6. Therefore, the positive electrode and the negative electrode of the sample to be measured can be connected with the access end of the impedance analyzer through the metal electrode block 12 and the positive electrode lead 11 and the negative electrode lead 11 respectively.
As shown in fig. 2 and 3, an inner cavity 13 recessed in a direction away from the electrode holder 5 is further formed on a surface of the base 1 adjacent to the electrode holder 5, and an opening communicating with the outside is further formed above the inner cavity 13. A bolt 4 is attached to a surface of the electrode holder 5 opposite to the cavity 13, and a screw portion of the bolt 4 is inserted into the electrode holder 5. Specifically, the shank portion of the bolt 4 is inserted into the metal electrode block 12 of the electrode holder 5, and the head portion of the bolt 4 protrudes from the electrode holder 5 and is accommodated in the inner cavity 13. Although only one bolt 4 is illustrated, it should be understood that two bolts 4 are attached to the present embodiment and inserted into the two metal electrode blocks 12, respectively. Therefore, the bolt 4 is connected to the positive and negative metal electrode blocks 12 of the electrode holder 5 and to the positive and negative lead wires 11 connected to the impedance analyzer. In this embodiment, the positive and negative leads 11 connected to the bolt 4 may extend through an opening above the cavity 13, and further connect to the access end of the impedance analyzer. By means of the structure, the metal electrode block 12 of the electrode seat 5 can be effectively connected with the access end of the impedance analyzer through a simple structure, and further, the electric connection between the positive and negative electrode leads of the tested sample accessed between the metal electrode block 12 and the pressing block 6 and the access end of the impedance analyzer is effectively realized.
A mounting hole is formed in the base 1 at a position of the base 1 apart from the electrode holder 5, and the spring 2 and the plunger 7 are mounted in the mounting hole. The top rod 7 protrudes upward from the upper surface of the base 1. The spring 2 is sleeved in the inner hole of the mandril 7 to form an elastic whole. The top of the push rod 7 is in contact with the first rod part 9a of the press rod 9, and the first rod part 9a of the press rod 9 can be pushed up by the push rod 7. The second rod portion 9b of the pressure lever 9 is connected to the above-mentioned pressing block 6. Specifically, the pressing block 6 and the second rod portion 9b of the pressing rod 9 may be connected together by a bolt 10, so that the pressing block 6 and the pressing rod 9 are linked. The pressing lever 9 is formed to be rotatable about the shaft 8. The shaft 8 is located at a position between the press block 6 and the ram 7. In the present embodiment, the shaft 8 is attached to the base 1 through a shaft mount. Specifically, the first rod portion 9a and the second rod portion 9b are connected by a bushing around the shaft 8, so that the two rod portions of the pressing rod 9 form a lever mechanism capable of rotating around the shaft 8. When one rod part of the pressing rod 9 is lifted by the rotation of the pressing rod 9 around the shaft 8, the other rod part of the pressing rod 9 is lowered. The length of the second lever portion 9b may be greater than the length of the first lever portion 9a, so that the force acting on the second lever portion 9b can be made small.
Further, the spring 2 has the function that the ejector rod 7 can rebound after being pressed down, and jacks up the first rod part 9a of the compression rod 9, so that the second rod part 9b of the compression rod 9 drives the pressing block 6 to clamp the positive and negative leads of the sample to be tested in a linkage manner; the ejector rod 7 is used for realizing the loosening and clamping of the pressing block 6, when the ejector rod 7 is pressed down, the pressing block 6 is loosened through the linkage effect of the pressing rod 9, and the positive and negative leads of the tested sample can be loaded and taken; after the mandril 7 rebounds, the pressing block 6 clamps the positive and negative leads of the tested sample through the linkage action of the pressing rod 9.
Specifically, when the testing device of the present embodiment is used, the first rod portion 9a of the pressing rod 9 is pressed to press the push rod 7, and the pressing block 6 is driven by the second rod portion 9b of the pressing rod 9 to lift up in a linkage manner to loosen the pressing block 6, at this time, the positive and negative leads of the sample to be tested can be placed between the metal electrode block 12 and the pressing block 6, then the first rod portion 9a of the pressing rod 9 is loosened to rebound the pressed push rod 7 under the action of the spring 2, so as to jack up the first rod portion 9a of the pressing rod 9, and the pressing block 6 is driven by the second rod portion 9b of the pressing rod 9 in a linkage manner to press the positive and negative leads of the sample to be tested tightly. Therefore, the positive and negative leads of the tested sample are effectively connected between the metal electrode block 12 and the pressing block 6, and the positive and negative leads of the tested sample are electrically connected with the connecting end of the impedance analyzer. Similarly, the positive and negative electrode leads of the sample to be tested can be taken out by pressing the first rod portion 9a of the pressing rod 9 to release the pressing block 6. Therefore, the electrical connection between the positive and negative leads of the tested sample and the positive and negative electrodes of the impedance analyzer can be simply and conveniently realized only by pressing and loosening the first rod part 9a of the pressure lever 9, the assembly and the disassembly are convenient and quick, the testing efficiency can be effectively improved, and the requirement of mass production testing is met.
As the present invention may be embodied in several forms without departing from the spirit of essential characteristics thereof, the present embodiments are therefore illustrative and not restrictive, since the scope of the invention is defined by the appended claims rather than by the description herein, and all changes that fall within metes and bounds of the claims, or equivalence of such metes and bounds thereof are therefore intended to be embraced by the appended claims.

Claims (6)

1. A test apparatus for a piezoelectric device, comprising:
the electrode base comprises two electrode blocks which are insulated and respectively connected with the access end of the test equipment and a pressing block arranged above the electrode blocks, and positive and negative leads of a tested electric device are connected between the electrode blocks and the pressing block;
a base connected with the electrode holder, wherein a mounting hole is formed in the base, and a mandril protruding from the upper surface of the base and a spring sleeved in an inner hole of the mandril and capable of enabling the mandril to rebound upwards are arranged in the mounting hole;
the pressing rod capable of rotating around the shaft between the pressing block and the ejector rod to play a role of leverage comprises a first rod part and a second rod part, wherein the first rod part is positioned on one side of the shaft, close to the ejector rod, the lower surface of the first rod part is in contact with the top of the ejector rod, the second rod part is positioned on the other side of the shaft, close to the pressing block, and the second rod part is connected with the pressing block.
2. A test apparatus for a piezoelectric device according to claim 1,
the two electrode blocks are respectively connected with the access end of the test equipment through positive and negative leads.
3. A test apparatus for a piezoelectric device according to claim 1 or 2,
and an inner cavity for wiring the positive and negative electrode leads is formed on one surface of the base adjacent to the electrode holder.
4. A test apparatus of a piezoelectric device according to any one of claims 1 to 3,
the electrode holder is connected with the base through a fastener.
5. The testing apparatus for a piezoelectric device according to any one of claims 1 to 4, wherein the pressing block is connected to the second rod portion of the pressing rod by a fastener.
6. A test apparatus for a piezoelectric device according to any one of claims 1 to 5, wherein the test equipment is an impedance analyzer.
CN202010723814.3A 2020-07-24 2020-07-24 Testing device for piezoelectric device Pending CN111965427A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010723814.3A CN111965427A (en) 2020-07-24 2020-07-24 Testing device for piezoelectric device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010723814.3A CN111965427A (en) 2020-07-24 2020-07-24 Testing device for piezoelectric device

Publications (1)

Publication Number Publication Date
CN111965427A true CN111965427A (en) 2020-11-20

Family

ID=73362546

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010723814.3A Pending CN111965427A (en) 2020-07-24 2020-07-24 Testing device for piezoelectric device

Country Status (1)

Country Link
CN (1) CN111965427A (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202102013U (en) * 2011-04-01 2012-01-04 天津渤海易安泰电子半导体测试有限公司 Tooling fixture for testing finished product of polymer battery
CN203011955U (en) * 2012-12-07 2013-06-19 东莞新能德科技有限公司 Lithium battery test clamp
CN105137318A (en) * 2015-09-21 2015-12-09 中国科学院电工研究所 Crimping type electric power semiconductor module test tooling
CN105415045A (en) * 2015-12-11 2016-03-23 昌河飞机工业(集团)有限责任公司 Linkage lever pressing device
US20160370405A1 (en) * 2015-01-29 2016-12-22 Boe Technology Group Co., Ltd. Electrical device testing fixture
JP2020094824A (en) * 2018-12-10 2020-06-18 矢崎総業株式会社 Impedance measurement device and impedance measurement method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202102013U (en) * 2011-04-01 2012-01-04 天津渤海易安泰电子半导体测试有限公司 Tooling fixture for testing finished product of polymer battery
CN203011955U (en) * 2012-12-07 2013-06-19 东莞新能德科技有限公司 Lithium battery test clamp
US20160370405A1 (en) * 2015-01-29 2016-12-22 Boe Technology Group Co., Ltd. Electrical device testing fixture
CN105137318A (en) * 2015-09-21 2015-12-09 中国科学院电工研究所 Crimping type electric power semiconductor module test tooling
CN105415045A (en) * 2015-12-11 2016-03-23 昌河飞机工业(集团)有限责任公司 Linkage lever pressing device
JP2020094824A (en) * 2018-12-10 2020-06-18 矢崎総業株式会社 Impedance measurement device and impedance measurement method

Similar Documents

Publication Publication Date Title
CN201654074U (en) Testing clamp
CN201340434Y (en) Test jig used in mounting type packaged semiconductor power device
JP4274832B2 (en) Contact unit
CN216285580U (en) Integrated circuit power-on test equipment
KR20090093738A (en) Contact probe
CN110380243B (en) High strength cable junction board structure with waterproof performance
CN109298305B (en) Testing device and method for crimping type IGBT module sub-module
CN217443396U (en) OLED aging test fixture
WO2022111629A1 (en) Wiring terminal and electric connector
CN111965427A (en) Testing device for piezoelectric device
WO2016093113A1 (en) Electric component socket
CN102608476A (en) Golden finger electrical measurement jig
CN213633714U (en) Radio frequency test probe module for flexible circuit board
CN212622717U (en) Withstand voltage test tool for circulator/isolator
CN202522586U (en) Golden finger electrical logging tool
CN210019067U (en) Movable safety switch device for follower cup
KR100809578B1 (en) Contact probe
CN211789661U (en) Needle type contactor
CN203133221U (en) Testing tool used for wire harness conduction tester
CN202102013U (en) Tooling fixture for testing finished product of polymer battery
CN203825153U (en) Integrated circuit testing device
KR102637143B1 (en) Test apparatus for package
CN212277108U (en) Switch terminal processing stamping device
CN214409142U (en) Quick detection tool of heavy current terminal
CN210037906U (en) Pressing device suitable for test piece of diode classification tester

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20201120