CN111912602A - Light spot divergence angle testing system and method of semiconductor laser - Google Patents

Light spot divergence angle testing system and method of semiconductor laser Download PDF

Info

Publication number
CN111912602A
CN111912602A CN202010894130.XA CN202010894130A CN111912602A CN 111912602 A CN111912602 A CN 111912602A CN 202010894130 A CN202010894130 A CN 202010894130A CN 111912602 A CN111912602 A CN 111912602A
Authority
CN
China
Prior art keywords
optical fiber
light spot
semiconductor laser
divergence angle
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010894130.XA
Other languages
Chinese (zh)
Inventor
侯长春
王兴辉
张文广
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhongjiu Optoelectronic Industry Co ltd
Original Assignee
Zhongjiu Optoelectronic Industry Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhongjiu Optoelectronic Industry Co ltd filed Critical Zhongjiu Optoelectronic Industry Co ltd
Priority to CN202010894130.XA priority Critical patent/CN111912602A/en
Publication of CN111912602A publication Critical patent/CN111912602A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/0014Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optical Couplings Of Light Guides (AREA)

Abstract

The invention discloses a light spot divergence angle testing system and a light spot divergence angle testing method of a semiconductor laser, belonging to the field of lasers, wherein the testing system comprises a bearing piece, a light source and a light source, wherein the bearing piece is used for bearing the semiconductor laser, and the output end of the semiconductor laser is connected with an optical fiber; an adjusting device, on which a gripper is arranged, the gripper is used for clamping or loosening the optical fiber, and the adjusting device can drive the gripper to move; the first lifting device is used for driving the lifting action of the adjusting device; the optical power testing component is provided with a diaphragm, and the diaphragm and the optical fiber are concentrically arranged so as to be capable of receiving light spot energy under a full light spot divergence angle; the second lifting device is used for driving the lifting action of the optical power testing component; the optical fiber position calibration device is used for acquiring the position information of the optical fiber, and the display screen is used for displaying the position information of the optical fiber, so that the test is quicker and more accurate.

Description

Light spot divergence angle testing system and method of semiconductor laser
Technical Field
The invention relates to the field of lasers, in particular to a system and a method for testing a light spot divergence angle of a semiconductor laser.
Background
A laser is a device that can emit laser light. The semiconductor laser is a laser with earlier maturity and faster development, and has the advantages of wide wavelength range, simple manufacture, low cost, easy mass production, small size, light weight and long service life, so the variety development is fast, the application range is wide and exceeds 300, the most main application field of the semiconductor laser is a Gb local area network, and the application range of the semiconductor laser covers the whole photoelectronics field and becomes the core technology of the current photoelectronics. The semiconductor laser has wide application in laser ranging, laser radar, laser communication, laser simulated weapons, laser warning, laser guidance and tracking, ignition and detonation, automatic control, detecting instruments and the like, and forms a wide market.
The semiconductor laser output optical fiber has certain NA (light spot divergence angle) transmission characteristics, and the light spot divergence angle (NA) of the semiconductor laser output optical fiber needs to be tested before use, namely the ratio of the light emitting energy of the semiconductor laser under the specified light spot divergence angle (NA) to the energy under the integral output light spot divergence angle (NA) is tested.
Disclosure of Invention
The invention aims to solve at least one technical problem in the prior art and provides a light spot divergence angle testing system of a semiconductor laser.
The technical solution of the invention is as follows:
a system for testing a spot divergence angle of a semiconductor laser, comprising:
the optical fiber laser comprises a bearing piece, a laser module and a laser module, wherein the bearing piece is used for bearing a semiconductor laser, and the output end of the semiconductor laser is connected with an optical fiber;
an adjusting device, on which a gripper is arranged, the gripper is used for clamping or loosening the optical fiber, and the adjusting device can drive the gripper to move;
the first lifting device is used for driving the lifting action of the adjusting device;
the optical power testing component is provided with a diaphragm, and the diaphragm and the optical fiber are concentrically arranged so as to be capable of receiving light spot energy under a full light spot divergence angle;
the second lifting device is used for driving the lifting action of the optical power testing component;
the optical fiber position calibration device is used for acquiring the position information of the optical fiber, and the display screen is used for displaying the position information of the optical fiber.
Preferably, the optical fiber position calibration device is an industrial high power microscope.
Preferably, the adjusting device comprises a first positioning plate, a second positioning plate, a first adjusting nut and a second adjusting nut, a first positioning block is arranged at one end of the first positioning plate, the first adjusting nut penetrates through the first positioning block and can be abutted to the second positioning plate, when the first adjusting nut is screwed down, the first adjusting nut can drive the second positioning plate to move rightwards on the first positioning plate, a second positioning block is arranged on the second positioning plate, the second adjusting nut penetrates through the second positioning block and can be abutted to the clamp holder, and when the second adjusting nut is screwed down, the second adjusting nut can drive the clamp holder to move forwards on the second positioning plate.
Preferably, the optical power test component is an optical power meter.
Preferably, the holder comprises a base, a groove capable of allowing the optical fiber to pass through is formed in the base, a fastening block is hinged to the base, and a clamping block matched with the groove is arranged on the fastening block
The invention also discloses a method for testing the divergence amplitude of the light spot of the semiconductor laser, which comprises the following steps:
the method comprises the following steps: fixing the semiconductor laser on the bearing piece, processing the output end face of the optical fiber and then fixing the optical fiber on the holder;
step two: fixing the holder on the adjusting device;
step three: the optical power testing component is arranged right ahead of the optical fiber, so that the laser power testing component can receive all light spotsThe spot energy at the divergence angle is recorded and the power value P is recorded0
Step four: calculating the distance L according to the required light spot divergence angle, and placing a diaphragm at the position of the distance L on the output end face of the optical fiber;
step five: adjusting the position of the output end face of the optical fiber to make the divergent light spot concentric with the diaphragm and recording the power value P1
Step six: power value P1/P0The energy ratio of the output light spots under different light spot divergence angles.
Preferably, in the fifth step, a specific method for adjusting the position of the output end face of the optical fiber includes: adjusting the centers of the clamped optical fiber, the diaphragm and the optical power testing component to be concentric and locked; marking the optical fiber adjusting target position on the display screen, then acquiring the position information of the optical fiber center through the optical fiber position calibration device, displaying the information on the display screen, and enabling the actual position of the optical fiber displayed on the display screen to coincide with the target position through adjusting the adjusting device.
The invention has at least one of the following beneficial effects:
(1) according to the light spot divergence angle testing system of the semiconductor laser, the problems of low visualization degree, low accuracy degree and inconvenience for quick and accurate operation of an operator of a traditional system are effectively solved by arranging the optical fiber position calibration device and the display.
(2) The power test method of the semiconductor laser is more convenient for testers to quickly and accurately test the divergence angle of the light spot.
Drawings
FIG. 1 is a schematic structural diagram of a preferred embodiment of the present invention;
FIG. 2 is a schematic view of the structure of an adjusting device in a preferred embodiment of the present invention;
FIG. 3 is a schematic view of the structure of the holder in the preferred embodiment of the present invention;
in the figure, 1-a semiconductor laser, 2-an optical fiber, 3-an adjusting device, 301-a first positioning plate, 302-a first adjusting nut, 303-a second positioning plate, 304-a second adjusting nut, 4-an optical fiber position calibrating device, 5-a clamp, 6-a diaphragm, 7-a power meter, 8-a second lifting device, 9-a first lifting device and 10-a bearing piece.
Detailed Description
Reference will now be made in detail to the present preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout.
In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper, lower, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, the meaning of a plurality of means is one or more, the meaning of a plurality of means is two or more, and larger, smaller, larger, etc. are understood as excluding the number, and larger, smaller, inner, etc. are understood as including the number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
Referring to fig. 1 to 3, a preferred embodiment of the present invention:
a system for testing a spot divergence angle of a semiconductor laser, comprising:
the semiconductor laser device comprises a bearing part 10, a laser module and a laser module, wherein the bearing part is used for bearing a semiconductor laser 1, and the output end of the semiconductor laser 1 is connected with an optical fiber 2;
an adjusting device 3, on which a gripper 5 is arranged, said gripper 5 being used for gripping or releasing said optical fiber 2, said adjusting device 3 being capable of driving said gripper 5 to move;
a first lifting device 9 for driving the lifting operation of the adjusting device 3, specifically, the first lifting device 9 is a hydraulic lifter, and may be other lifting devices capable of performing the lifting operation, but is not limited thereto;
the optical power testing component is provided with a diaphragm 6, and the diaphragm 6 is arranged concentrically with the optical fiber 2 so as to be capable of receiving light spot energy under a full light spot divergence angle;
a second lifting device 8 for driving the lifting operation of the optical power testing assembly, specifically, the second lifting device 8 is a hydraulic lifter, and may be other lifting devices capable of performing the lifting operation, but is not limited thereto;
the optical fiber position calibration device is characterized by further comprising an optical fiber position calibration device 4 and a display screen connected with the optical fiber position calibration device 4, wherein the optical fiber position calibration device 4 is used for obtaining position information of the optical fiber 2, and the display screen is used for displaying the position information of the optical fiber 2.
This embodiment is through setting up optic fibre position calibration device and display, and the visual degree that has effectively solved traditional system is low, and accurate degree is low, the operator's of not being convenient for problem of quick accurate operation.
As a preferred embodiment of the present invention, it may also have the following additional technical features:
the optical fiber position calibration device 4 is an industrial high power microscope.
The adjusting device 3 comprises a first positioning plate 301, a second positioning plate 303, a first adjusting nut 302 and a second adjusting nut 304, wherein a first positioning block is arranged at one end of the first positioning plate 301, the first adjusting nut 302 penetrates through the first positioning block and can be abutted to the second positioning plate 303, when the first adjusting nut 302 is screwed down, the first adjusting nut 302 can drive the second positioning plate 303 to move rightwards on the first positioning plate 301, a second positioning block is arranged on the second positioning plate 303, the second adjusting nut 304 penetrates through the second positioning block and can be abutted to the clamp holder 5, and when the second adjusting nut 304 is screwed down, the second adjusting nut 304 can drive the clamp holder 5 to move forwards on the second positioning plate 303.
The optical power testing component is an optical power meter.
The holder 5 comprises a base 501, a groove 503 capable of allowing the optical fiber 2 to pass through is formed in the base 501, a fastening block 502 is hinged to the base 501, and a clamping block matched with the groove 503 is arranged on the fastening block 502, so that the optical fiber 2 can be fixed conveniently.
The invention also discloses a method for testing the divergence amplitude of the light spot of the semiconductor laser, which comprises the following steps:
the method comprises the following steps: fixing the semiconductor laser 1 on the bearing member 10, processing the output end face of the optical fiber 2 and fixing the processed output end face on the clamper 5; the end face treatment is specifically as follows: the method comprises the steps of firstly stripping an optical fiber coating layer by using fiber stripping pliers, wiping residual coating layer substances by using alcohol, cutting the optical fiber by using an optical fiber cutter, and after the treatment, the cleanliness and the flatness of the end face of the optical fiber are improved, so that the test safety and the accuracy of test data are ensured.
Step two: fixing the clamper 5 on the adjusting device 3;
step three: the optical power testing component is arranged right in front of the optical fiber 2, so that the laser power testing component can receive light spot energy under a full light spot divergence angle and record a power value P0
Step four: placing the diaphragm 6 at the position of the distance L of the output end face of the optical fiber 2 according to the distance L obtained by the required light spot divergence test; sin theta is approximately equal to D/2L which is tan theta, D is the diameter of a probe of the power meter, theta is a required light spot divergence angle, and the distance L is obtained according to the required theta and D which are known quantities;
step five: the position of the output end face of the optical fiber is adjusted to make the divergent light spot concentric with the diaphragm 6, and the power value P is recorded1
Step six: power value P1/P0The energy ratio of output light spots under different NA.
In the fifth step, the specific method for adjusting the position of the output end face of the optical fiber comprises the following steps: the centers of the clamped optical fiber 2, the diaphragm 6 and the optical power testing component are adjusted to be concentric and locked; according to the calculated standard L value, marking the optical fiber adjusting target position on the display screen, then obtaining the position information of the optical fiber center through the optical fiber position calibration device 4, displaying the information on the display screen, and enabling the actual position of the optical fiber displayed on the display screen to coincide with the target position through the adjusting device 3. The method is more convenient for testers to quickly and accurately carry out NA test, and quickly and accurately detect whether the optical fiber meets the specified value.
The above additional technical features can be freely combined and used in superposition by those skilled in the art without conflict.
In the description of the embodiments of the present invention, it should be understood that "-" and "-" indicate the same range of two numerical values, and the range includes the endpoints. For example: "A-B" means a range of greater than or equal to A and less than or equal to B. "A to B" means a range of not less than A and not more than B.
In the description of the embodiments of the present invention, the term "and/or" herein is only one kind of association relationship describing an associated object, and means that there may be three kinds of relationships, for example, a and/or B, and may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
The above description is only a preferred embodiment of the present invention, and the technical solutions that achieve the objects of the present invention by basically the same means are all within the protection scope of the present invention.

Claims (7)

1. A light spot divergence angle test system of a semiconductor laser is characterized in that: the method comprises the following steps:
the optical fiber laser comprises a bearing piece (10) used for bearing a semiconductor laser (1), wherein the output end of the semiconductor laser (1) is connected with an optical fiber (2);
-an adjusting device (3) on which a gripper (5) is arranged, said gripper (5) being intended to grip or release said optical fiber (2), said adjusting device (3) being able to drive said gripper (5) in movement;
a first lifting device (9) for driving the lifting action of the adjusting device (3);
the optical power testing component is provided with a diaphragm (6), and the diaphragm (6) and the optical fiber (2) are concentrically arranged so as to be capable of receiving light spot energy under a full light spot divergence angle;
the second lifting device (8) is used for driving the lifting action of the optical power testing component;
the optical fiber position calibrating device (4) is used for acquiring the position information of the optical fiber (2), and the display screen is used for displaying the position information of the optical fiber (2).
2. The system for testing a divergence angle of a spot of a semiconductor laser as claimed in claim 1, wherein: the optical fiber position calibration device (4) is an industrial high power microscope.
3. The system for testing a divergence angle of a spot of a semiconductor laser as claimed in claim 1, wherein: the adjusting device (3) comprises a first positioning plate (301), a second positioning plate (303), a first adjusting nut (302) and a second adjusting nut (304), one end of the first positioning plate (301) is provided with a first positioning block, the first adjusting nut (302) penetrates through the first positioning block and can be abutted against the second positioning plate (303), when the first adjusting nut (302) is screwed, the first adjusting nut (302) can drive the second positioning plate (303) to move rightwards on the first positioning plate (301), a second positioning block is arranged on the second positioning plate (303), the second adjusting nut (304) penetrates through the second positioning block and can be abutted against the clamp holder (5), when the second adjusting nut (304) is screwed, the second adjusting nut (304) can drive the clamper (5) to move forwards on the second positioning plate (303).
4. The system for testing a divergence angle of a spot of a semiconductor laser as claimed in claim 1, wherein: the optical power testing component is an optical power meter.
5. The system for testing a divergence angle of a spot of a semiconductor laser as claimed in claim 1, wherein: the clamp holder (5) comprises a base (501), a groove (503) capable of allowing the optical fiber (2) to pass through is formed in the base (501), a fastening block (502) is hinged to the base (501), and a clamping block matched with the groove (503) is arranged on the fastening block (502).
6. A method for testing the divergence amplitude of a light spot of a semiconductor laser is characterized by comprising the following steps: the method comprises the following steps:
the method comprises the following steps: fixing a semiconductor laser (1) on a bearing piece (10), and fixing an optical fiber (2) on a clamp (5);
step two: fixing the clamper (5) on the adjusting device (3);
step three: the optical power testing component is arranged right in front of the optical fiber (2), so that the laser power testing component can receive light spot energy under a full light spot divergence angle and record a power value P0
Step four: according to the distance L calculated under the required light spot divergence angle, the diaphragm (6) is placed at the position of the distance L of the output end face of the optical fiber (2);
step five: the position of the output end face of the optical fiber is adjusted to make the divergent light spot concentric with the diaphragm (6) and record the power value P1
Step six: power value P1/P0And measuring the divergence angle of the light spot according to the energy ratio of the output light spot under different divergence angles of the light spot.
7. The method for testing the divergence amplitude of the light spot of the semiconductor laser as claimed in claim 6, wherein: in the fifth step, the specific method for adjusting the position of the output end face of the optical fiber comprises the following steps: the centers of the clamped optical fiber (2), the diaphragm (6) and the optical power testing assembly are adjusted to be concentric and locked; marking the optical fiber adjusting target position on the display screen, then acquiring the position information of the optical fiber center through the optical fiber position calibration device (4), displaying the information on the display screen, and enabling the actual position of the optical fiber displayed on the display screen to coincide with the target position through the adjusting device (3).
CN202010894130.XA 2020-08-31 2020-08-31 Light spot divergence angle testing system and method of semiconductor laser Pending CN111912602A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010894130.XA CN111912602A (en) 2020-08-31 2020-08-31 Light spot divergence angle testing system and method of semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010894130.XA CN111912602A (en) 2020-08-31 2020-08-31 Light spot divergence angle testing system and method of semiconductor laser

Publications (1)

Publication Number Publication Date
CN111912602A true CN111912602A (en) 2020-11-10

Family

ID=73267164

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010894130.XA Pending CN111912602A (en) 2020-08-31 2020-08-31 Light spot divergence angle testing system and method of semiconductor laser

Country Status (1)

Country Link
CN (1) CN111912602A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113029527A (en) * 2021-03-25 2021-06-25 苏州阿格斯医疗技术有限公司 Measuring device and measuring method of lateral optical fiber lens
CN114769141A (en) * 2022-03-31 2022-07-22 潍坊华光光电子有限公司 Semiconductor laser tube core power and light spot detection system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113029527A (en) * 2021-03-25 2021-06-25 苏州阿格斯医疗技术有限公司 Measuring device and measuring method of lateral optical fiber lens
CN113029527B (en) * 2021-03-25 2024-04-16 苏州阿格斯医疗技术有限公司 Measuring device and measuring method for lateral optical fiber lens
CN114769141A (en) * 2022-03-31 2022-07-22 潍坊华光光电子有限公司 Semiconductor laser tube core power and light spot detection system

Similar Documents

Publication Publication Date Title
JP6046030B2 (en) Optical fiber alignment measurement method and apparatus
CN111912602A (en) Light spot divergence angle testing system and method of semiconductor laser
TWI269346B (en) Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing
US4763980A (en) Method and apparatus for centering the core of a light guide fiber in a light guide end portion
CN212391198U (en) Light spot divergence angle test system of semiconductor laser
CN106886027B (en) Laser positioning device and laser positioning method
KR20150126787A (en) Device to position and align a rotationally-symmetrical body
CN212620612U (en) Angle inspection device for optical crystal
CN215373881U (en) Porous axiality check out test set
CN203396397U (en) Laser indicator device
US5980120A (en) Fiber array test method and apparatus
EP1269167B1 (en) Monitoring of resistance welding
CN112710631A (en) Temperature refractive index testing method based on femtosecond laser direct writing inclined fiber bragg grating
CN108801177B (en) Method for automatically adjusting verticality of microscope system and calibration slide thereof
CN112729122B (en) Femtosecond laser direct writing-based inclined chirped fiber grating sensor testing method
CN214173705U (en) Reference optical fiber unit of optical fiber spectrum telescope
CN111765854A (en) Angle inspection device and detection method for optical crystal
CN208888344U (en) A kind of test device of light emitting secondary module
CN209802273U (en) Remaining needle coaxiality detection tool
CN217034128U (en) Tool for detecting wire diameter of wire harness
CN104897372A (en) Near-field nonlinear automatic test method for multi-light-emitting-unit semiconductor laser, and device thereof
CN215725709U (en) Large-core-diameter optical fiber geometric parameter testing system
CN114623793B (en) Measuring device and measuring method
CN219239661U (en) Calibrating device of fluorescence quantitative PCR instrument
CN221484451U (en) Quick evaluation tester for environmental availability of laser tracker

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination