CN111884677B - Method and device for testing frequency hopping rate in built-in test of frequency hopping communication equipment - Google Patents
Method and device for testing frequency hopping rate in built-in test of frequency hopping communication equipment Download PDFInfo
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- CN111884677B CN111884677B CN202010712451.3A CN202010712451A CN111884677B CN 111884677 B CN111884677 B CN 111884677B CN 202010712451 A CN202010712451 A CN 202010712451A CN 111884677 B CN111884677 B CN 111884677B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/69—Spread spectrum techniques
- H04B1/713—Spread spectrum techniques using frequency hopping
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Abstract
The invention discloses a method and a device for testing frequency hopping rate in built-in test of frequency hopping communication equipment, wherein the method comprises the following steps: step S1: controlling the communication device to be in a transmitting state; step S2: starting a frequency modulation rate test, acquiring a schematic diagram of a frequency hopping signal and a schematic diagram of a frequency hopping rate, and finding out a carrier signal with frequency hopping in a certain period of time of each frequency hopping period T; step S3: and carrying out power detection on the frequency hopping signal, and carrying out frequency counting on the detected waveform to obtain the frequency hopping rate. The testing device is used for implementing the method. The invention has the advantages of simple principle, good test effect, easy realization and the like.
Description
Technical Field
The invention mainly relates to the technical field of detection of communication equipment, in particular to a method and a device for testing frequency hopping rate in built-in test of frequency hopping communication equipment.
Background
In communication equipment, frequency hopping communication technology is widely used to improve the interference rejection of a system, and testing of indexes related to frequency hopping communication is a subject of study in the academic world. Generally, the test metrics for frequency hopping communications include: the method comprises the following steps that frequency hopping rate, frequency hopping bandwidth, frequency hopping frequency set, frequency changing time, frequency hopping power and frequency hopping sensitivity are adopted, the most basic index of the indexes is the frequency hopping rate, and for the test of the frequency hopping rate, two traditional test methods are generally adopted, namely, a modulation domain analyzer is adopted to observe the change relation of time frequency of a transmitter for testing; and secondly, an oscilloscope is adopted to observe the emission waveform of the transmitter for testing.
In order to improve the testability and maintainability of communication equipment, built-in test technology has been widely used, and the communication equipment also puts higher requirements on the design of built-in test due to the limitations of volume, weight, power consumption and the like, so the design of built-in test for frequency hopping rate must also take the volume, weight and power consumption into consideration. The two testing methods in the above-mentioned conventional sense are mainly performed by a general-purpose testing instrument, which is almost impossible to be applied in built-in testing, so that other convenient means which have small volume and low power consumption and satisfy the frequency hopping rate testing must be considered.
The working principle of frequency hopping communication is as follows: the carrier frequency of the signals transmitted by the two parties of the transceiver is discretely changed according to a predetermined rule, that is, the carrier frequency used in the communication is randomly jumped under the control of the pseudo-random change code. In terms of implementation of communication technology, "frequency hopping" is a communication method that uses a code sequence for multi-frequency shift keying. The frequency hopping technique is employed to ensure secrecy and interference resistance of communication. Compared with fixed frequency communication, frequency hopping communication is more concealed and is difficult to intercept. As long as the opposite side does not know the carrier frequency hopping rule, the communication content of the opposite side is difficult to intercept. Meanwhile, frequency hopping communication also has good anti-interference capability, and normal communication can be carried out on other non-interfered frequency points even if some frequency points are interfered. The frequency hopping rate in frequency hopping communication is an important basic index, and the performance measurement is generally performed by using a modulation domain analyzer or an oscilloscope.
The modulation domain test technology is a new test technology field appearing at the end of the 20 th century, is mainly used for describing the relation between the frequency or the phase of a signal and the time, is very suitable for the test of frequency hopping parameters in communication equipment, and is shown in a test connection block diagram and a time-frequency characteristic diagram in figure 1. The hopping frequency f, the hopping period T, the dwell time T1, and the frequency change time T2 at each time point can be directly read out from fig. 1, and the hopping rate can be directly converted from the reciprocal 1/T of the hopping period T.
5.1.15 of GJB238A-97 relates to a method for frequency hopping rate test using an oscilloscope, as shown in fig. 2, where the frequency hopping period can be read directly by the oscilloscope, or the frequency hopping rate can be displayed directly by adjusting the time trace of the oscilloscope.
Fig. 1 and 2 show frequency hopping rate tests performed by external general-purpose instruments, but in the internal test of the frequency hopping rate of the communication device, due to the limitations of volume, power consumption and weight, functions of a modulation domain analyzer and an oscilloscope cannot be directly integrated into the communication device, and a technology capable of solving the problem of the internal test of the frequency hopping rate index of the communication device is urgently needed.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: aiming at the technical problems in the prior art, the invention provides a method and a device for testing the frequency hopping rate in the built-in test of the frequency hopping communication equipment, which have the advantages of simple principle, good test effect and easy realization.
In order to solve the technical problems, the invention adopts the following technical scheme:
a method for testing frequency hopping rate in built-in test of frequency hopping communication equipment comprises the following steps:
step S1: controlling the communication device to be in a transmitting state;
step S2: starting a frequency modulation rate test, acquiring a schematic diagram of a frequency hopping signal and a schematic diagram of a frequency hopping rate, and finding out a carrier signal with frequency hopping in a certain period of time of each frequency hopping period T;
step S3: and carrying out power detection on the frequency hopping signal, and carrying out frequency counting on the detected waveform to obtain the frequency hopping rate.
A device for testing frequency hopping rate in a test within a frequency hopping communications apparatus, comprising:
the preprocessing unit is used for carrying out power attenuation and signal conditioning on the frequency hopping signal;
the power detection unit is used for detecting the frequency hopping signal, generating a radio frequency waveform signal and sending the radio frequency waveform signal to the amplifying and shaping module;
and the frequency counting unit is used for testing the frequency hopping rate of the amplified and shaped signal.
As a further improvement of the device of the invention: the pre-processing unit comprises a power attenuation module, an impedance conversion module and an input protection module which are connected in sequence.
As a further improvement of the device of the invention: three circuit parts of impedance transformation, input protection and power detection are also included IN the power detection unit and the power detection unit clock from the input of the frequency hopping signal RF _ IN to the output of the power detection RFL.
As a further improvement of the device of the invention: the impedance transformation circuit comprises a pi-type resistance network used for matching with the impedance of the power detection circuit.
As a further improvement of the device of the invention: the input protection circuit comprises a 1N4148 diode and is used for protecting the high-power input damage power detection circuit.
As a further improvement of the device of the invention: the power detection circuit comprises a single-chip integrated power detection chip AD8361 and a peripheral resistance-capacitance circuit.
As a further improvement of the device of the invention: after the RFL signal output by the power detection circuit is amplified and shaped by the amplifying and shaping module, an FH signal is output to the frequency counting unit to count the frequency hopping rate, and the numerical value is read by the main control unit to finish the test process of the frequency hopping rate.
As a further improvement of the device of the invention: the frequency counting circuit is realized by adopting an FPGA circuit, the temperature compensation crystal oscillator adopts a clock reference with high stability of 20MHz, and the C8051F020 singlechip adopted by the main control module is used for controlling and reading the value.
As a further improvement of the device of the invention: the testing device is integrated inside the communication equipment.
Compared with the prior art, the invention has the advantages that:
the method and the device for testing the frequency hopping rate in the built-in test of the frequency hopping communication equipment have the advantages that the principle is simple, the test effect is good, the implementation is easy, the test scheme with a simple structure is designed for solving the problem of the built-in test of the frequency hopping rate, the method and the device have the advantages that the miniaturized low-power-consumption design of the monolithic integrated power detection circuit and the FPGA frequency counting circuit is adopted, and the requirements of the communication equipment on the volume, the power consumption and the weight of the built-in test circuit can be met through the design.
Drawings
FIG. 1 is a schematic diagram of a prior art test of a modulation domain analyzer; wherein figure (a) is a test connection block diagram; graph (b) is a time-frequency characteristic graph displayed by the modulation domain analyzer.
FIG. 2 is a schematic diagram of a prior art oscilloscope test; wherein figure (a) is a test connection block diagram; graph (b) is a time-amplitude characteristic graph displayed on an oscilloscope.
FIG. 3 is a schematic diagram of the testing principle of the testing method of the present invention.
Fig. 4 is a schematic diagram of the topology of the testing device of the present invention in a specific application.
Fig. 5 is a schematic diagram of waveforms of nodes in a frequency hopping rate test process performed by the testing apparatus of the present invention in a specific application.
Fig. 6 is a schematic diagram of the impedance transformation, input protection and power detection circuitry of the test apparatus of the present invention in a particular application.
FIG. 7 is a schematic diagram of an amplification and shaping circuit in a particular application of the test apparatus of the present invention.
FIG. 8 is a schematic diagram of a frequency counter circuit in a particular application of the test apparatus of the present invention.
FIG. 9 is a schematic diagram of the software flow of the testing apparatus according to the present invention in a specific application.
Detailed Description
The invention will be described in further detail below with reference to the drawings and specific examples.
As shown in fig. 3, the method for testing the frequency hopping rate in the built-in test of the frequency hopping communication device of the present invention includes the steps of:
step S1: controlling the communication device to be in a transmitting state;
step S2: starting a frequency modulation rate test, acquiring a schematic diagram of a frequency hopping signal and a schematic diagram of a frequency hopping rate, and finding out a carrier signal with frequency hopping in a certain period of time of each frequency hopping period T;
step S3: and carrying out power detection on the frequency hopping signal, and carrying out frequency counting on the detected waveform to obtain the frequency hopping rate.
Fig. 3 is a schematic diagram of a frequency hopping signal and a schematic diagram of a frequency hopping rate in a specific application example of the test method of the present invention, in which (i) a carrier signal with frequency hopping exists within time T1 of each frequency hopping period T, and (ii) the frequency hopping signal is in an off state within time T2, so that power detection is performed on the frequency hopping signal by using the rule that the power of the frequency hopping signal exists "sometimes" in time, and the frequency hopping rate is obtained by performing frequency counting on a detected waveform. The invention adopts the mode of detecting the power of the frequency hopping signal and counting the frequency of the waveform after the power detection, thereby solving the problem that the frequency hopping rate test needs to adopt a universal instrument for testing.
As shown in fig. 4, the present invention further provides a device for testing the frequency hopping rate in the built-in test of the frequency hopping communication equipment, wherein the left part in the figure is an internal functional block diagram of the communication equipment, the communication equipment comprises a power amplifying unit, a power coupling unit, a frequency modulation transmitter module, a main control module, an antenna, etc., and also comprises an in-machine test circuit part which is the built-in test part of the frequency hopping rate of the present invention. The right part of the figure is a frequency hopping rate test apparatus of the present invention, including:
the preprocessing unit is used for carrying out power attenuation and signal conditioning on the frequency hopping signal; the pre-processing unit comprises a power attenuation module, an impedance conversion module and an input protection module.
The power detection unit is used for detecting the frequency hopping signal, generating a radio frequency waveform signal and sending the radio frequency waveform signal to the amplifying and shaping module;
and the frequency counting unit is used for testing the frequency hopping rate of the amplified and shaped signal.
As shown in fig. 5, the detailed description of waveforms of nodes in the frequency hopping rate built-in test circuit in fig. 4 is provided, wherein the nodes are input radio frequency waveforms before power detection, and the basic characteristics of frequency hopping signals can be seen from the waveforms, namely, the power of the signals fluctuates; secondly, the frequency of the signal is also hopped in different hopping periods. And the node II is a waveform after power detection, and the size of the frequency hopping rate can be visually seen from the waveform. The third node is the waveform after shaping and amplification, and aims to meet the requirements of a frequency counter on the amplitude, rising and falling edges and the like of an input test signal.
Fig. 6-8 are schematic diagrams showing a specific implementation circuit of the device for testing the frequency hopping rate IN the built-IN test of the frequency hopping communication equipment according to the present invention, IN a specific application example, wherein fig. 6 implements the function from the input of the frequency hopping signal rfin to the output of the power detection RFL, and three circuit parts of impedance transformation, input protection and power detection are further included IN the middle. The impedance conversion circuit is mainly composed of a pi-type resistance network, and realizes impedance matching with the power detection circuit; the input protection circuit mainly comprises a 1N4148 diode and aims to protect the high-power input damage power detection circuit; the power detection circuit is composed of a single-chip integrated power detection chip AD8361 and a peripheral resistance-capacitance circuit, the working voltage of the AD8361 is 2.7V to 5.5V, the power consumption of 3V power supply is 3.3mW, the power consumption is very low, the area of the chip is 3.1mm multiplied by 4.9mm, the occupied area is very small, and the requirements of power consumption and volume of built-in test can be met.
As shown in fig. 7, the amplifying and shaping function of the signals after power detection is realized, and after the RFL signals output by the power detection are amplified and shaped, the FH signals are output to the frequency counting unit in fig. 8 to count the frequency hopping rate, and the main control unit in fig. 8 reads the values to complete the testing process of the frequency hopping rate.
As shown in fig. 8, the schematic diagram of the frequency counting circuit in the specific application example is shown, the hardware of the frequency counting is mainly realized by using an FPGA circuit, the design of this time uses an Altera FPGA with the model of EP1K30T144-2, the temperature compensation crystal oscillator uses a 20MHz clock reference with high stability, and the main control module uses a C8051F020 single chip microcomputer to perform control and numerical reading.
In other embodiments, the monolithic integrated power detection circuit AD8361 adopted in the present invention may also perform the power detection function by using other power detection chips with the same function. The frequency counting module is realized by adopting an FPGA of Altera, and other frequency counting chip circuits can be adopted to complete similar functions.
As shown in fig. 9, it is a software flowchart for implementing the frequency hopping rate test in the specific application example, and the test process includes six steps, which are respectively start of the test, control of the communication device in the transmission state, start of the frequency hopping rate test, reading of the test data, stop of the transmission of the communication device, and completion of the test.
The above is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above-mentioned embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that modifications and embellishments within the scope of the invention may be made by those skilled in the art without departing from the principle of the invention.
Claims (10)
1. A method for testing frequency hopping rate in built-in test of frequency hopping communication equipment is characterized by comprising the following steps:
step S1: controlling the communication device to be in a transmitting state;
step S2: starting a frequency hopping rate test, acquiring a schematic diagram of a frequency hopping signal and a schematic diagram of a frequency hopping rate, and finding out a carrier signal with frequency hopping in a certain period of time of each frequency hopping period T; a carrier signal with frequency hopping exists in the time T1 of each frequency hopping period T, and the frequency hopping signal is in an off state in the time T2, and the rule that the power of the frequency hopping signal exists 'sometimes' in time is utilized;
step S3: and carrying out power detection on the frequency hopping signal, and carrying out frequency counting on the detected waveform to obtain the frequency hopping rate.
2. A frequency hopping rate testing device in a frequency hopping communication device built-in test is characterized by comprising:
the preprocessing unit is used for carrying out power attenuation and signal conditioning on the frequency hopping signal;
the power detection unit is used for detecting the frequency hopping signal, generating a radio frequency waveform signal and sending the radio frequency waveform signal to the amplifying and shaping module;
the frequency counting unit is used for testing the frequency hopping rate of the amplified and shaped signal;
the carrier signal with frequency hopping exists in the time T1 of each frequency hopping period T, the frequency hopping signal is in an off state in the time T2, the power of the frequency hopping signal is detected by utilizing the rule that the power of the frequency hopping signal exists 'sometimes' in time, and the frequency hopping rate is obtained by carrying out frequency counting on the detected waveform.
3. The apparatus according to claim 2, wherein the preprocessing unit comprises a power attenuation module, an impedance transformation module, and an input protection module, which are connected in sequence.
4. The apparatus for testing frequency hopping rate IN a built-IN test of a frequency hopping communication device according to claim 2, wherein said power detection unit is configured to perform a function from an input of a frequency hopping signal RF _ IN to an output of a power detection RFL, and said power detection unit further comprises an impedance transformation circuit, an input protection circuit and a power detection circuit.
5. The apparatus for testing frequency hopping rate in a built-in test of a frequency hopping communication device according to claim 4, wherein said impedance transformation circuit includes pi-type resistor network for performing impedance matching with a power detection circuit.
6. The apparatus for testing frequency hopping rate in a built-in test of a frequency hopping communication device as set forth in claim 4, wherein said input protection circuit includes a 1N4148 diode for preventing a high power input from damaging the power detection circuit.
7. The apparatus for testing frequency hopping rate in the built-in test of frequency hopping communication device according to claim 4, wherein said power detection circuit comprises a monolithic power detection chip AD8361 and a peripheral resistor-capacitor circuit.
8. The device as claimed in claim 4, wherein the power detection circuit outputs an enveloped frequency hopping FH signal to the frequency counting unit for counting the frequency hopping rate after amplifying and shaping the RFL signal by the amplifying and shaping module, and the main control unit reads the value to complete the testing process of the frequency hopping rate.
9. The device according to claim 2, wherein the frequency counting unit is implemented by using an FPGA circuit, the temperature compensation crystal oscillator uses a clock reference with high stability of 20MHz, and the main control module uses a C8051F020 single chip microcomputer to perform control and numerical reading.
10. The apparatus for testing frequency hopping rate in a frequency hopping communications device built-in test according to any one of claims 2 to 9, wherein said testing apparatus is integrated inside a communications device.
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| CN101662328A (en) * | 2009-09-23 | 2010-03-03 | 成都林海电子有限责任公司 | Performance detector of portable ultrashort wave frequency hopping station |
| CN102315890B (en) * | 2011-09-28 | 2015-05-13 | 吴成海 | Frequency hopping performance detection card type structure module based on PXI bus |
| CN102820936A (en) * | 2012-02-23 | 2012-12-12 | 沈阳理工大学 | Distributed type differential frequency hopping communication test system |
| CN105262504B (en) * | 2015-11-11 | 2018-02-16 | 中国电子科技集团公司第四十一研究所 | The time and frequency measurement circuit and method of a kind of wide interval frequency hopping signal |
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