CN111856174A - Full electronic interlock test system and method - Google Patents
Full electronic interlock test system and method Download PDFInfo
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- CN111856174A CN111856174A CN201910348553.9A CN201910348553A CN111856174A CN 111856174 A CN111856174 A CN 111856174A CN 201910348553 A CN201910348553 A CN 201910348553A CN 111856174 A CN111856174 A CN 111856174A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention provides a full-electronic interlocking test system and a method, wherein in the system, an upper computer test control module sends a first control instruction to a program-controlled power supply and sends a second control instruction to a program-controlled incubator; the program-controlled power supply receives a first control instruction, controls the full-electronic interlocking execution module to start or stop, and supplies power to the full-electronic interlocking execution module for testing after the full-electronic interlocking execution module is started; the program control incubator receives a second control instruction in the test process and adjusts the internal temperature of the program control incubator; the temperature acquisition module acquires temperature test data of the full-electronic interlocking execution module and feeds the temperature test data back to the upper computer test control module. According to the invention, when the performance of the all-electronic interlocking execution module is tested at the limit environmental temperature, no external equipment is needed, and the all-electronic interlocking execution module is correspondingly controlled by adopting the programmable power supply in a programmed mode, so that the integration and automation degree of the test system is effectively improved, and the test effect is improved.
Description
Technical Field
The invention relates to the technical field of rail transit, in particular to a full-electronic interlocking test system and a full-electronic interlocking test method.
Background
In the related technology, for testing of the full electronic interlock, hardware simulation of the trackside equipment is generally realized by means of hardware-in-loop simulation, wherein the hardware-in-loop simulation simulates the running state of a controlled object by running a simulation model through a real-time processor, is connected with the tested full electronic interlock through an input/output interface, then carries out instruction control on the full electronic interlock through test software running on an industrial personal computer, reads feedback of the real-time state, downloads a simulation model to a hardware simulation platform, and controls measurement and excitation of input and output signals, so that automatic closing test of the full electronic interlock is realized.
The inventor finds that the technology needs external equipment when performing some necessary scene tests (for example, testing the performance of the fully electronic interlock at the extreme environment temperature), and needs to switch test scenes by manpower, so that the integration and automation degree of the technology is not high, and the test effect is influenced.
Disclosure of Invention
The present invention is directed to solving, at least to some extent, one of the technical problems in the related art.
Therefore, the invention aims to provide a system and a method for testing the full-electronic interlocking, which can perform corresponding control on the full-electronic interlocking execution module in a programmed mode by adopting a program control power supply without external equipment when the performance of the full-electronic interlocking execution module is expressed under the test limit environment temperature, so that the integration and automation degree of the test system is effectively improved, and the test effect is improved.
In order to achieve the above object, an all-electronic interlock testing system according to an embodiment of the first aspect of the present invention includes: the system comprises an upper computer test control module, a full-electronic interlocking execution module, a program-controlled incubator, a temperature acquisition module and a program-controlled power supply, wherein the upper computer test control module is respectively connected with the program-controlled power supply and the program-controlled incubator and is used for sending a first control instruction to the program-controlled power supply and sending a second control instruction to the program-controlled incubator; the program-controlled power supply is used for receiving the first control instruction sent by the upper computer test control module, controlling the full electronic interlocking execution module to start or stop according to the first control instruction, and supplying power to the full electronic interlocking execution module for testing after the full electronic interlocking execution module is started; the all-electronic interlocking execution module is arranged inside the program-controlled incubator, and the program-controlled incubator is used for receiving the second control instruction sent by the upper computer test control module in the test process and adjusting the temperature inside the program-controlled incubator based on the second control instruction; the temperature acquisition module is used for acquiring temperature test data of the all-electronic interlocking execution module and feeding the temperature test data back to the upper computer test control module, wherein the temperature test data of the all-electronic interlocking execution module is changed along with the adjustment of the temperature inside the program control incubator.
In the all-electronic interlocking test system provided by the embodiment of the first aspect of the invention, the upper computer test control module sends a first control instruction to the program-controlled power supply and sends a second control instruction to the program-controlled incubator; the program-controlled power supply receives a first control instruction, controls the full-electronic interlocking execution module to start or stop, and supplies power to the full-electronic interlocking execution module for testing after the full-electronic interlocking execution module is started; the program control incubator receives a second control instruction in the test process and adjusts the internal temperature of the program control incubator; the temperature acquisition module acquires the temperature test data of the all-electronic interlocking execution module, the temperature test data is fed back to the upper computer test control module, external equipment is not needed when the performance of the all-electronic interlocking execution module is expressed under the test limit environment temperature, and the program control power supply is adopted to perform corresponding control on the all-electronic interlocking execution module in a programmed mode, so that the integration and automation degree of the test system is effectively improved, and the test effect is improved.
In order to achieve the above object, an all-electronic interlock testing method according to an embodiment of the second aspect of the present invention includes: receiving a first control instruction sent by an upper computer test control module, controlling a full electronic interlocking execution module to start or stop according to the first control instruction, and supplying power to the full electronic interlocking execution module for testing after the full electronic interlocking execution module is started; in the testing process, receiving a second control instruction sent by the upper computer testing control module, and adjusting the temperature inside the program-controlled incubator based on the second control instruction, wherein the all-electronic interlocking execution module is arranged inside the program-controlled incubator; the method comprises the steps of collecting temperature test data of the all-electronic interlocking execution module, and feeding the temperature test data back to the upper computer test control module, wherein the temperature test data of the all-electronic interlocking execution module is changed along with the adjustment of the temperature in the program control incubator.
In the full-electronic interlocking test method provided by the embodiment of the second aspect of the invention, by receiving the first control instruction sent by the upper computer test control module, controlling the full-electronic interlocking execution module to start or stop, supplying power to the full-electronic interlocking execution module for testing after the full-electronic interlocking execution module is started, receiving the second control instruction sent by the upper computer test control module and adjusting the temperature in the program control incubator during the test process, acquiring the temperature test data of the full-electronic interlocking execution module, feeding the temperature test data back to the upper computer test control module, when the performance of the full-electronic interlocking execution module is expressed under the test limit environmental temperature, no external equipment is needed, and the full-electronic interlocking execution module is correspondingly controlled by adopting a program control power supply in a programmed mode, so that the integration and automation degree of the test system is effectively improved, and the test effect is improved.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a schematic structural diagram of an all-electronic interlock test system according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of an all-electronic interlock test system according to another embodiment of the present invention;
fig. 3 is a schematic flow chart of a full electronic interlock testing method according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention. On the contrary, the embodiments of the invention include all changes, modifications and equivalents coming within the spirit and terms of the claims appended hereto.
Fig. 1 is a schematic structural diagram of an all-electronic interlock test system according to an embodiment of the present invention.
Referring to fig. 1, the system 100 includes: the system comprises an upper computer test control module 101, a full electronic interlocking execution module 102, a program-controlled incubator 103, a temperature acquisition module 104 and a program-controlled power supply 105.
In the embodiment of the invention, the upper computer test control module 101 is respectively connected with the program-controlled power supply 105 and the program-controlled incubator 103, and is used for sending a first control instruction to the program-controlled power supply 105 and sending a second control instruction to the program-controlled incubator 103.
The first control instruction is used for controlling the all-electronic interlocking execution module 102 to start or stop, and the second control instruction is used for adjusting the temperature inside the program control incubator 103.
The first control instruction may be generated by triggering a graphical operation interface of the upper computer test control module 101 by a test user, or may also be generated by pushing an instruction input by the test user at the monitoring terminal 110 side to the monitoring server 109 through the monitoring terminal 110, and the monitoring server 109 controls the instruction generated by the upper computer test control module 101 according to the instruction.
The upper computer test control module 101 in the embodiment of the present invention may be arranged in an industrial personal computer, and is responsible for controlling the program-controlled incubator 103 and the program-controlled power supply 105 in a test process, performing an automatic test according to a test requirement, and reporting the running state (e.g., operating current, board temperature, etc.) of the all-electronic interlock execution module 102 and each test data obtained by testing the all-electronic interlock execution module 102 to the monitoring server 109.
In some embodiments, the industrial personal computer connects the upper computer test control module 101 with the program-controlled incubator 103 through an ethernet-supported switch (which may be referred to as a first switch 106) and by using a network cable and a communication serial bus that support ethernet data transmission, connects the program-controlled power supply 105 with the upper computer test control module 101, and sets the all-electronic interlock execution module 102 inside the program-controlled incubator 103, so as to control the all-electronic interlock execution module 102 inside the program-controlled incubator 103, and read an operating state and corresponding test data fed back by the all-electronic interlock execution module 102, thereby forming a closed-loop test.
In the embodiment of the present invention, the upper computer test control module 101 may specifically be, but is not limited to, an upper computer test application program, and the upper computer test application program may be run in an industrial personal computer.
In some embodiments, the functions provided by the upper computer testing application program through the graphical operation interface may be as follows: a test configuration function, which enables a test engineer to perform configuration editing on a test environment, a test case and the like to be executed, and can store the contents of the configuration editing; a test process control function, which controls the test process, including generating a corresponding control command (e.g., a first control command and/or a second control command), controlling the start or stop of the all-electronic interlocking execution module 102, and controlling the start of the test, the pause of the test, the loop test, the termination of the test, etc.; a real-time graphical test result display function, which enables the upper computer test control module 101 to record and analyze the test data and generate a formatted test report after receiving the corresponding test data (where the formatted test report is a test report generated by combining the result of recording and analyzing the test data according to a test report template); the configuration and downloading functions of the hardware-in-the-loop simulation model can download program codes for configuring interface models and load simulation of all daughter boards of the all-electronic interlocking execution module 102 to the real-time controller, so as to realize automatic configuration of the high-precision program-controlled power supply 105, the program-controlled incubator 103, the temperature acquisition module 104 and the like according to the program codes; reading corresponding test data and operation states of the tested full electronic interlocking execution module 102; the functions of reporting corresponding test data and running state, receiving and executing the instructions issued by the monitoring server 109, providing corresponding functions through a graphical operation interface, and facilitating use.
The program-controlled power supply 105 is configured to receive a first control instruction sent by the upper computer test control module 101, control the all-electronic interlocking execution module 102 to start or stop according to the first control instruction, and supply power to the all-electronic interlocking execution module 102 for testing after the all-electronic interlocking execution module 102 is started.
The programmable power supply 105 in the embodiment of the present invention may perform power supply configuration on the tested all-electronic interlock execution module 102 under the control of the upper computer test control module 101 of the industrial personal computer, and may include, for example, voltage setting, current limiting setting, power supply starting, power supply cutting, current measurement, and the like.
In some embodiments, the programmable power supply 105 is further configured to receive a third control instruction of the upper computer test control module 101 during power supply, and adjust a power supply parameter (for example, a power supply parameter is working current or working voltage) according to the third control instruction, so as to implement dynamic adjustment of the working current or working voltage according to the third control instruction, and during the dynamic adjustment, the actual test requirement may be analyzed to determine a plurality of target working currents and a plurality of target working voltages, and the actual working current of the all-electronic interlock execution module 102 is respectively adjusted to each target working current, or the actual working voltage of the all-electronic interlock execution module 102 is respectively adjusted to each target working voltage, so as to test performance of the all-electronic interlock execution module 102 under different target working currents and target working voltages.
In some embodiments, the programmable power supply 105 collects the electrical test data output by the all-electronic interlock execution module 102 under different adjusted power supply parameters, and feeds the electrical test data back to the upper computer test control module 101.
The electrical test data may be used to describe, among other things, the performance of the all-electronic interlock execution module 102, such as, for example, power consumption current conditions.
In the embodiment of the present invention, the all-electronic interlock execution module 102 is disposed inside the program-controlled incubator 103, and the program-controlled incubator 103 is configured to receive a second control instruction sent by the upper computer test control module 101 during a test process, and adjust the temperature inside the program-controlled incubator 103 based on the second control instruction.
The program control incubator 103 in the embodiment of the invention can realize the simulation of the test temperature environment under the control of the upper computer test control module 101, wherein the simulation of the test temperature is not limited to the simulation of the conventional test temperature, and can also realize the simulation of the limit test temperature, and the simulation of the limit test temperature is realized under the control of the upper computer test control module 101, so that external equipment is not needed, and the integration degree of a test system is improved.
In some embodiments, the upper computer test control module 101 may analyze the test requirement during the test process to obtain at least one target temperature, generate corresponding second control instructions according to the target temperatures, and send the second control instructions to the program-controlled incubator 103 according to a preset time interval, where the second control instructions are used to adjust the temperature inside the program-controlled incubator 103 to the corresponding target temperature.
The target temperature is a temperature that needs to be analyzed according to test requirements and based on which the performance of the all-electronic interlock execution module 102 is to be tested.
In some embodiments, since the upper computer test control module 101 may run a program code, analyze the test requirement in an automated execution manner to obtain at least one target temperature, and further perform control adjustment on the temperature inside the program control incubator 103, the automated control adjustment manner may be referred to as a programming manner.
In the embodiment of the invention, because the full-electronic interlock execution module 102 is arranged in the program-controlled incubator 103, the upper computer test control module 101 adjusts the temperature inside the program-controlled incubator 103 in a programmed manner, and the simulation of the test temperature is not limited to the simulation of the conventional test temperature, but also can realize the simulation of the limit test temperature, thereby realizing the high integration and automation of the full-electronic interlock test system 100 without external equipment when the performance of the full-electronic interlock execution module 102 at the limit test temperature is tested, realizing the automatic switching between the conventional test temperature and the limit test temperature in a programmed manner, and releasing partial manpower.
The temperature acquisition module 104 in the embodiment of the present invention is configured to acquire temperature test data of the all-electronic interlocking execution module 102, and feed back the temperature test data to the upper computer test control module 101, where the temperature test data of the all-electronic interlocking execution module 102 changes with adjustment of the temperature inside the program control temperature box 103.
Wherein, the temperature acquisition module 104 can be connected with the fully electronic interlock execution module 102 through a thermocouple wire.
In the embodiment of the present invention, the temperature acquisition module 104 may acquire temperature test data output by each daughter board card at different adjusted target temperatures under the control of the upper computer test control module 101, and the temperature test data may be specifically used to describe the heating condition of each daughter board card, which is not limited thereto.
In the embodiment of the invention, the upper computer test control module 101 outputs a first control instruction, a second control instruction and a third control instruction based on a set program, and each control instruction is correspondingly issued to the program-controlled power supply 105 or the program-controlled incubator 103 to supply power to the all-electronic interlocking execution module 102, so that shutdown and restart of the all-electronic interlocking execution module 102, and simulation of a limit electrical parameter and a limit test temperature are realized, so that the temperature of the program-controlled incubator 103 can simulate extremely high and extremely low limit test temperatures, and switching between different electrical parameters and different target temperatures based on the set program can be realized, and test performance of each electrical parameter and the target temperature can be recorded in real time, so that the automation degree is effectively improved, and the test efficiency is improved.
In the embodiment of the invention, the upper computer test control module 101 controls the programmable power supply 105 to detect the power consumption and current condition of the tested full-electronic interlocking execution module, the upper computer test control module 101 controls the temperature acquisition module 104 to acquire the heating condition of each daughter card of the full-electronic interlocking execution module 102, and through the acquired two-aspect test data, whether the full-electronic interlocking execution module 102 runs safely and comprehensively can be known in real time, and the test data can be analyzed to obtain the temperature and current power consumption change curve so as to analyze the test reliability.
In some embodiments, the system according to the embodiments of the present invention may further include a hardware-in-loop simulation module 107, which is connected to the program control incubator 103, wherein the hardware-in-loop simulation module 107 is configured to implement hardware simulation of the trackside device, and the hardware-in-loop simulation module 107 is configured to run a simulation model with a real-time processor to simulate an operating state of the controlled object.
In this embodiment of the present invention, the all-electronic interlocking execution module 102 is composed of a plurality of all-electronic interlocking execution units, where the plurality of all-electronic interlocking execution units mainly include: the system comprises an LED annunciator control unit (which can be called an annunciator unit for short), a single-track turnout interface control unit (which can be called a turnout unit for short), a tight stop interface control unit (which can be called a tight stop unit for short), a shaft counting interface control unit (which can be called a shaft counting unit for short), a shielding door interface control unit (which can be called a shielding door unit for short) and a relay safety input unit (which can be called a safety input unit for short).
The fully electronic interlocking execution module 102 in the embodiment of the present invention adopts a two-by-two-out-of-two structure, two systems run in parallel, and the two systems are synchronized through an inter-system communication channel, when one system fails, the system is removed, so that the normal operation and output of the other system are not affected, and during the specific execution, the other system can be notified that a failure event occurs.
In some embodiments, when the upper computer tests the control module 101, a corresponding test case may be obtained through analysis in combination with an actual test requirement, so as to test the all-electronic interlocking execution module 102 based on the corresponding test case.
The corresponding test cases correspond to all the fully-electronic interlocked execution units in the fully-electronic interlocked execution module 102, and the fully-electronic interlocked execution units are respectively tested based on the corresponding test cases, where the test cases include a test case common to all the fully-electronic interlocked execution units and a test case specific to each fully-electronic interlocked execution unit.
As an example, the test case may be exemplified as follows:
1. general test case:
the method comprises the following steps of power-on reset and self-test, module configuration test, periodic self-test, module software downloading, updating and debugging function test, double Central Processing Unit (CPU) communication function test, firmware version information acquisition function test, double-system synchronous test and double-system switching test.
2. Specific test cases:
for the semaphore unit: the total number of the signal lamps is 6, and the signal lamps can control 2 three-display signal lamps or 3 two-display signal lamps simultaneously.
The test case comprises a signal machine unit shutdown function test, a signal lamp unit control function and state message read-back test, a signal lamp unit current state acquisition function test, a signal machine state acquisition function test and a red light safety protection function test.
Aiming at the turnout unit: the system comprises 3 paths of excitation power supply input acquisition of 24V and 8 paths of switch control voltage output of 24V.
The test case is as follows: and testing the control function and the state read-back function of the turnout unit.
For the axle counting unit: the method comprises the steps of outputting 2 paths of axle counting pre-reset voltages and collecting 4 paths of 24V axle counting occupied state power supplies.
The test case is as follows: and testing a track occupation state acquisition function and testing a track pre-reset control function and a state read-back function of the axle counting unit.
For the emergency stop unit: including 6-way emergency stop button acquisition inputs. And 2, connecting the input of the power supply of the interface with the power supply of the station.
The test case is as follows: and testing the state acquisition function of the emergency stop button, and testing the recovery control function and the state read-back function of the emergency stop unit.
For the shield door unit: the power supply comprises 2 paths of input of a shielding door interface power supply and 6 paths of output of a shielding door drive control power supply.
The test case is as follows: and testing the control function and the state reporting function of the shielding door unit.
For the relay safety input unit: the method comprises the step of acquiring 8 external input signals by an input relay state.
The test case is as follows: and the safety input unit inputs the acquisition function and the state reporting function test.
In one embodiment of the present invention, referring to fig. 2, further comprising:
the first switch 106, the program control incubator 103, the temperature acquisition module 104 and the program control power supply 105 are respectively communicated with the upper computer test control module 101 through the first switch 106.
In one embodiment of the present invention, referring to fig. 2, further comprising: the monitoring server 109 is configured to receive each test data transmitted by the upper computer test control module 101, perform analysis processing according to each test data, and transmit a test result obtained through the analysis processing to the monitoring terminal 110, where each test data is temperature test data and/or electrical test data.
In some embodiments, the upper computer test control module 101 receives the temperature test data and/or the electrical test data, and synchronously transmits the temperature test data and/or the electrical test data to the monitoring server 109, so that the monitoring server 109 receives each test data transmitted by the upper computer test control module 101.
Wherein the first switch 106 and the second switch 108 support ethernet-based communications.
The industrial personal computer in the embodiment of the present invention may be configured with at least two network cards, and the at least two network cards are respectively in communication connection with a first switch 106 and a second switch 108, where the first switch 106 is used to implement data communication between the upper computer test control module 101 and the program control incubator 103, the temperature acquisition module 104, and the program control power supply 105, and the second switch 108 is used to implement data communication between the upper computer test control module 101 and the monitoring server 109, which may be specifically referred to the following description.
In the embodiment of the present invention, an Internet Protocol Address (IP) may be configured for each full electronic interlock execution unit in the full electronic interlock execution module 102, and during the test, each full electronic interlock execution unit is identified by the IP Address, and corresponding test data of the corresponding full electronic interlock execution unit is obtained.
In one embodiment of the present invention, referring to fig. 2, further comprising: the monitoring terminal 110 is provided with a function of,
the monitoring terminal 110 communicates with the monitoring server 109, and the monitoring terminal 110 is configured to receive the test result, display the test result, and respond to a target operation of the test user on the test result.
In the testing process of the embodiment of the invention, each all-electronic interlocking execution unit reports real-time temperature test data and electric test data to the upper computer test control module 101 through the Ethernet, the upper computer test control module 101 synchronously uploads the temperature test data and the electric test data to the monitoring server 109 through the Ethernet, and the monitoring server 109 is accessed to the Internet.
The architecture between the monitoring Server 109 and the monitoring terminal 110 in the embodiment of the present invention is a B/S (Browser/Server) architecture, based on this architecture, the monitoring Server 109 may generate a test monitoring application website, and load the test monitoring application website in the Browser, so as to display the temperature test data and the electrical test data of each all-electronic interlocking execution unit in real time in the test monitoring application website, and also may display the operating state of each all-electronic interlocking execution unit in the test process, and also may generate a formatted test report according to a test report template in combination with the result of recording and analyzing the temperature test data and the electrical test data, display the formatted test report, and provide a download link to the formatted test report.
In the embodiment of the invention, through the execution steps, a test user can know the test condition of each all-electronic interlocking execution unit currently being tested in real time by accessing a test monitoring application website through a computer or a terminal arbitrarily accessed to the internet, and an interface for respectively controlling and configuring each all-electronic interlocking execution unit is provided in the test monitoring application website.
The monitoring server 109 in the embodiment of the present invention may further store temperature test data, electrical test data, and a test exception log during a historical test, and based on the temperature test data, the electrical test data, and the test exception log during the historical test, a convenient and efficient solution path is provided when tracing an exception problem.
The monitoring server 109 may also use a database to manage data related to the test user and the authority account password corresponding to the test user, and provide a graphical user interface to implement test control on each all-electronic interlocking execution unit.
In the embodiment of the invention, the monitoring terminal 110 is adopted to realize remote monitoring, so that the testing labor cost is effectively saved, the monitoring server 109 is adopted to automatically analyze and process according to each test data, the intelligent and automatic analysis and processing of each test data are realized, the testing safety is effectively improved, and the method is suitable for executing long-term reliability testing, so that a testing user can conveniently know the test data and the running state of each all-electronic interlocking execution unit in real time through a mobile phone or a personal computer and set and control the test data and the running state.
When analyzing that the all-electronic interlocking test system 100 is in an unsafe abnormal state, the monitoring server 109 in the embodiment of the present invention may also automatically trigger to cut off the program-controlled power supply 105, and close the program-controlled incubator to ensure that the all-electronic interlocking test system 100 is not damaged, thereby effectively improving the test safety.
In this embodiment, the upper computer test control module sends a first control instruction to the program-controlled power supply and sends a second control instruction to the program-controlled incubator; the program-controlled power supply receives a first control instruction, controls the full-electronic interlocking execution module to start or stop, and supplies power to the full-electronic interlocking execution module for testing after the full-electronic interlocking execution module is started; the program control incubator receives a second control instruction in the test process and adjusts the internal temperature of the program control incubator; the temperature acquisition module acquires the temperature test data of the all-electronic interlocking execution module, the temperature test data is fed back to the upper computer test control module, external equipment is not needed when the performance of the all-electronic interlocking execution module is expressed under the test limit environment temperature, and the program control power supply is adopted to perform corresponding control on the all-electronic interlocking execution module in a programmed mode, so that the integration and automation degree of the test system is effectively improved, and the test effect is improved.
Fig. 3 is a schematic flow chart of a full electronic interlock testing method according to an embodiment of the present invention.
Referring to fig. 3, the method includes:
s301: the method comprises the steps of receiving a first control instruction sent by an upper computer test control module, controlling a full electronic interlocking execution module to start or stop according to the first control instruction, and supplying power to the full electronic interlocking execution module for testing after the full electronic interlocking execution module is started.
S302: in the testing process, a second control instruction sent by the upper computer testing control module is received, the temperature inside the program-controlled incubator is adjusted based on the second control instruction, and the full-electronic interlocking execution module is arranged inside the program-controlled incubator.
S303: the method comprises the steps of collecting temperature test data of the all-electronic interlocking execution module, and feeding the temperature test data back to the upper computer test control module, wherein the temperature test data of the all-electronic interlocking execution module is changed along with the adjustment of the temperature inside the program control incubator.
Optionally, in some embodiments, in the test process, the test requirement is analyzed to obtain at least one target temperature, and a corresponding second control instruction is generated according to each target temperature; and respectively sending each second control instruction to the program control incubator according to a preset time interval, wherein each second control instruction is used for adjusting the temperature in the program control incubator to be the corresponding target temperature.
Optionally, in some embodiments, in the power supply process, a third control instruction of the upper computer test control module is received, and the power supply parameter of the programmable power supply is dynamically adjusted according to the third control instruction.
Optionally, in some embodiments, electrical test data of the all-electronic interlock execution module under corresponding power supply parameters is collected and fed back to the upper computer test control module.
Optionally, in some embodiments, each piece of test data transmitted by the upper computer test control module is received, analysis processing is performed according to each piece of test data, and a test result obtained through the analysis processing is transmitted to the monitoring terminal, where each piece of test data is temperature test data and/or electrical test data.
Optionally, in some embodiments, the test result is received, the test result is displayed, and the target operation of the test user on the test result is responded.
It should be noted that the foregoing explanation of the embodiment of the all-electronic interlock test system in fig. 1-2 also applies to the all-electronic interlock test method in this embodiment, and the implementation principle is similar and will not be described herein again.
In the embodiment, by receiving the first control instruction sent by the upper computer test control module and controlling the full electronic interlocking execution module to start or stop, and powering the all-electronic interlocking performing module for testing after the all-electronic interlocking performing module is started, in the test process, a second control instruction sent by the upper computer test control module is received, the temperature in the program control incubator is adjusted, the temperature test data of the full electronic interlocking execution module is collected, the temperature test data is fed back to the test control module of the upper computer, so that when the performance of the full electronic interlocking execution module is expressed under the test limit environment temperature, no external equipment is needed, and the program-controlled power supply is adopted to correspondingly control the full-electronic interlocking execution module in a programmed mode, so that the integration and automation degree of the test system is effectively improved, and the test effect is improved.
It should be noted that the terms "first," "second," and the like in the description of the present invention are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. In addition, in the description of the present invention, "a plurality" means two or more unless otherwise specified.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.
It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (14)
1. A full electronic interlocking test system is characterized by comprising an upper computer test control module, a full electronic interlocking execution module, a program control incubator, a temperature acquisition module and a program control power supply, wherein,
the upper computer test control module is respectively connected with the program-controlled power supply and the program-controlled incubator and is used for sending a first control instruction to the program-controlled power supply and sending a second control instruction to the program-controlled incubator;
the program-controlled power supply is used for receiving the first control instruction sent by the upper computer test control module, controlling the full electronic interlocking execution module to start or stop according to the first control instruction, and supplying power to the full electronic interlocking execution module for testing after the full electronic interlocking execution module is started;
the full electronic interlocking execution module is arranged inside the program control incubator;
The program-controlled incubator is used for receiving the second control instruction sent by the upper computer test control module in the test process and adjusting the temperature in the program-controlled incubator based on the second control instruction;
the temperature acquisition module is used for acquiring temperature test data of the all-electronic interlocking execution module and feeding the temperature test data back to the upper computer test control module, wherein the temperature test data of the all-electronic interlocking execution module is changed along with the adjustment of the temperature inside the program control incubator.
2. The all-electronic interlock test system according to claim 1, wherein,
the upper computer test control module is used for analyzing the test requirements in the test process to obtain at least one target temperature, generating corresponding second control instructions according to the target temperatures respectively, and sending the second control instructions to the program control incubator respectively according to a preset time interval, wherein the second control instructions are used for adjusting the temperature inside the program control incubator to the corresponding target temperature.
3. The all-electronic interlock test system according to claim 1, wherein,
And the program-controlled power supply is also used for receiving a third control instruction of the upper computer test control module in the power supply process and adjusting power supply parameters according to the third control instruction.
4. The all-electronic interlock test system according to claim 3, wherein,
the program-controlled power supply is also used for collecting electric test data of the all-electronic interlocking execution module under corresponding power supply parameters and feeding the electric test data back to the upper computer test control module.
5. The all-electronic interlock test system according to claim 1, further comprising:
the program-controlled incubator, the temperature acquisition module and the program-controlled power supply are communicated with the upper computer test control module through the first exchanger respectively.
6. The all-electronic interlock test system according to claim 4, further comprising: a second switch and a monitoring server, wherein,
the upper computer test control module is communicated with the monitoring server through the second switch;
the monitoring server is used for receiving the test data transmitted by the upper computer test control module, analyzing and processing the test data according to the test data, and transmitting a test result obtained by analyzing and processing the test data to the monitoring terminal, wherein the test data are the temperature test data and/or the electrical test data.
7. The all-electronic interlock test system according to claim 6, wherein,
and the upper computer test control module receives the temperature test data and/or the electric test data and synchronously transmits the temperature test data and/or the electric test data to the monitoring server.
8. The all-electronic interlock test system according to claim 6, wherein,
the monitoring terminal is communicated with the monitoring server and used for receiving the test result, displaying the test result and responding to the target operation of the test user on the test result.
9. An all electronic interlock test method, comprising:
receiving a first control instruction sent by an upper computer test control module, controlling a full electronic interlocking execution module to start or stop according to the first control instruction, and supplying power to the full electronic interlocking execution module for testing after the full electronic interlocking execution module is started;
in the testing process, receiving a second control instruction sent by the upper computer testing control module, and adjusting the temperature inside the program-controlled incubator based on the second control instruction, wherein the all-electronic interlocking execution module is arranged inside the program-controlled incubator;
The method comprises the steps of collecting temperature test data of the all-electronic interlocking execution module, and feeding the temperature test data back to the upper computer test control module, wherein the temperature test data of the all-electronic interlocking execution module is changed along with the adjustment of the temperature in the program control incubator.
10. The all-electronic interlock test method according to claim 9, further comprising:
in the testing process, analyzing the testing requirement to obtain at least one target temperature, and respectively generating corresponding second control instructions according to the target temperatures;
and respectively sending each second control instruction to the program-controlled incubator according to a preset time interval, wherein each second control instruction is used for adjusting the temperature in the program-controlled incubator to be a corresponding target temperature.
11. The all-electronic interlock test method according to claim 9, further comprising:
and in the power supply process, receiving a third control instruction of the upper computer test control module, and dynamically adjusting the power supply parameters of the program control power supply according to the third control instruction.
12. The all-electronic interlock test method according to claim 11, further comprising:
And acquiring electrical test data of the all-electronic interlocking execution module under corresponding power supply parameters, and feeding the electrical test data back to the upper computer test control module.
13. The all-electronic interlock test method according to claim 12, further comprising:
receiving the test data transmitted by the upper computer test control module, analyzing and processing the test data according to the test data, and transmitting a test result obtained by analyzing and processing the test data to the monitoring terminal, wherein the test data are the temperature test data and/or the electrical test data.
14. The all-electronic interlock test method according to claim 13, further comprising:
and receiving the test result, displaying the test result, and responding to the target operation of the test user on the test result.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113835413A (en) * | 2021-09-22 | 2021-12-24 | 交控科技股份有限公司 | Interlocking automation test system, method, device and storage medium |
| CN113852668A (en) * | 2021-08-31 | 2021-12-28 | 通号城市轨道交通技术有限公司 | Data interaction method and device for interlocking equipment and axle counting equipment |
| CN114357747A (en) * | 2021-12-24 | 2022-04-15 | 中铁二院工程集团有限责任公司 | Electromagnetic compatibility simulation method of axle counting system based on hardware-in-loop |
| CN114691493A (en) * | 2022-02-28 | 2022-07-01 | 福建星云电子股份有限公司 | Lithium battery testing method and system |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5703482A (en) * | 1994-08-01 | 1997-12-30 | Motorola, Inc. | Apparatus for testing electronic devices in hostile media |
| US7742359B2 (en) * | 2004-12-30 | 2010-06-22 | Hynix Semiconductor Inc. | Calibration circuit of a semiconductor memory device and method of operating the same |
| CN203054627U (en) * | 2013-02-04 | 2013-07-10 | 合肥华德利科学器材有限公司 | Interconnected control system for three temperature sensors of water-resisting thermotank |
| CN203689506U (en) * | 2013-11-29 | 2014-07-02 | 天津铁路信号有限责任公司 | Full-electronic computer interlocking execution unit test system based on PXI technology |
| EP2839300A1 (en) * | 2012-04-17 | 2015-02-25 | Bombardier Transportation GmbH | Train test platform |
| CN107831392A (en) * | 2017-11-29 | 2018-03-23 | 卡斯柯信号有限公司 | A kind of all-electronin interlocks hardware intelligent test system |
| CN108427126A (en) * | 2018-01-31 | 2018-08-21 | 交通运输部水运科学研究所 | The test method and device of baseband chip property at high and low temperature |
| CN109318948A (en) * | 2017-07-31 | 2019-02-12 | 比亚迪股份有限公司 | Computer locking system |
| CN109600446A (en) * | 2018-12-21 | 2019-04-09 | 中国铁道科学研究院集团有限公司通信信号研究所 | A kind of all-electronin interlocking Remote Monitoring and Diagnosis System based on narrowband Internet of Things |
-
2019
- 2019-04-28 CN CN201910348553.9A patent/CN111856174B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5703482A (en) * | 1994-08-01 | 1997-12-30 | Motorola, Inc. | Apparatus for testing electronic devices in hostile media |
| US7742359B2 (en) * | 2004-12-30 | 2010-06-22 | Hynix Semiconductor Inc. | Calibration circuit of a semiconductor memory device and method of operating the same |
| EP2839300A1 (en) * | 2012-04-17 | 2015-02-25 | Bombardier Transportation GmbH | Train test platform |
| CN203054627U (en) * | 2013-02-04 | 2013-07-10 | 合肥华德利科学器材有限公司 | Interconnected control system for three temperature sensors of water-resisting thermotank |
| CN203689506U (en) * | 2013-11-29 | 2014-07-02 | 天津铁路信号有限责任公司 | Full-electronic computer interlocking execution unit test system based on PXI technology |
| CN109318948A (en) * | 2017-07-31 | 2019-02-12 | 比亚迪股份有限公司 | Computer locking system |
| CN107831392A (en) * | 2017-11-29 | 2018-03-23 | 卡斯柯信号有限公司 | A kind of all-electronin interlocks hardware intelligent test system |
| CN108427126A (en) * | 2018-01-31 | 2018-08-21 | 交通运输部水运科学研究所 | The test method and device of baseband chip property at high and low temperature |
| CN109600446A (en) * | 2018-12-21 | 2019-04-09 | 中国铁道科学研究院集团有限公司通信信号研究所 | A kind of all-electronin interlocking Remote Monitoring and Diagnosis System based on narrowband Internet of Things |
Non-Patent Citations (3)
| Title |
|---|
| GUAN HONG ET.AL: "Control strategy and reliability study of iLOCK high-speed railway interlocking system", 《 2011 INTERNATIONAL CONFERENCE ON REMOTE SENSING, ENVIRONMENT AND TRANSPORTATION ENGINEERING》 * |
| 于潇: "计算机联锁全电子执行单元的监测和模拟仿真测试系统", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 * |
| 张琳: "全电子执行单元仿真测试平台的研究", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113852668A (en) * | 2021-08-31 | 2021-12-28 | 通号城市轨道交通技术有限公司 | Data interaction method and device for interlocking equipment and axle counting equipment |
| CN113835413A (en) * | 2021-09-22 | 2021-12-24 | 交控科技股份有限公司 | Interlocking automation test system, method, device and storage medium |
| CN114357747A (en) * | 2021-12-24 | 2022-04-15 | 中铁二院工程集团有限责任公司 | Electromagnetic compatibility simulation method of axle counting system based on hardware-in-loop |
| CN114357747B (en) * | 2021-12-24 | 2023-05-30 | 中铁二院工程集团有限责任公司 | Hardware-in-loop based axle counting system electromagnetic compatibility simulation method |
| CN114691493A (en) * | 2022-02-28 | 2022-07-01 | 福建星云电子股份有限公司 | Lithium battery testing method and system |
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