CN111812454A - Automatic alignment and correction method and system based on wave recording data - Google Patents
Automatic alignment and correction method and system based on wave recording data Download PDFInfo
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention relates to an automatic alignment and correction method and system based on wave recording data, and belongs to the technical field of relay protection of power systems. The method comprises the steps of firstly, primarily selecting a fault starting time point T0 through judging the position of a sudden change point, then, reversely deducing and correcting T0 of wave recording data on two sides by utilizing the principle that the peak values on the two sides are the same through the time difference between the T0 and the peak values of adjacent voltage and current, and accurately determining the double-end distance measurement synchronous alignment point. The method realizes synchronous alignment of the wave recording data at two sides, overcomes the influence of common factors such as zero crossing point, gradual change development, large harmonic wave and distortion and the like on the simple judgment of the fault starting point, eliminates the time deviation possibly generated by alignment by directly judging the fault starting point, and is beneficial to improving the accuracy and reliability of double-end distance measurement.
Description
Technical Field
The invention belongs to the technical field of relay protection of power systems, and particularly relates to an automatic alignment and correction method and system based on wave recording data.
Background
The key factor of double-end distance measurement based on the wave recording data is that accurate synchronous alignment points are found by the wave recording data on the two sides. The existing method for synchronously aligning the wave recording data on two sides mainly comprises a self-contained time mark alignment method and an alignment method for judging the starting time of a fault. The self-contained time mark alignment method is limited by external factors such as clock synchronization precision and the like, so that the risk is extremely high and the reliability is poor; the alignment method for judging the starting moment of the fault has the advantages of strong autonomy, flexibility and maneuverability, and is more suitable for practical application.
However, there are also unstable factors in determining the fault starting time, such as zero crossing point, gradual change of development, large harmonic and distortion of the fault starting time, which all affect the determination of the fault starting time to different degrees. Taking the recording data with a sampling rate of 1000Hz as an example, the judgment error of only 1 sampling point will generate 18 degrees phase angle deviation of the data on both sides, which will have serious influence on the double-end ranging result. Therefore, how to overcome the defects of the prior art is a problem which needs to be solved in the technical field of power system relay protection at present.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a method and a system for automatically judging a fault starting time point based on wave recording data and realizing alignment correction by using adjacent wave crests. The method selects the most obvious and unique peak characteristic signal in the wave recording sampling curve as the alignment reference points at two sides, and reversely deduces and corrects the fault starting time point T0 by using the principle that the time difference between the peak value and T0 is the same, thereby realizing the synchronous alignment of the wave recording data at two sides, overcoming the influence of common factors such as zero crossing point, gradual change development, large harmonic wave and distortion and the like which are possibly applied to the simple judgment of the fault starting point, eliminating the time deviation which is possibly generated by directly judging the fault starting time point for alignment, and being beneficial to improving the accuracy and the reliability of double-end distance measurement.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
an automatic alignment and correction method based on recorded wave data comprises the following steps:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
Further, in the step (3), preferably, the N-side fault start time point NT0 is corrected with the M-side fault start time point MT0 as a reference, and the corrected value NT 0' of NT0 is set, where the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.1.1) instantaneous curve correction method based on I0 sampling:
NT0’=NT0+(NdetT_I0-MdetT_I0)；
(3.1.2) curve correction method based on Ix sampling instantaneous value:
NT0’=NT0-(NdetT_Ix-MdetT_Ix)；
(3.1.3) instantaneous value curve correction method based on Ux sampling:
NT0’=NT0-(NdetT_Ux-MdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.1.1) - (3.1.3) is as follows:
a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
c) otherwise, curve correction based on Ux sampling transients is used.
Further, preferably, the data windows used by I0 for the effective values of the fundamental wave in a) and b) are T length on the right side of T0, and the data window used by Ix is T length on the left side of T0.
Further, in the step (3), preferably, the M-side fault start time point MT0 is corrected with the N-side fault start time point NT0 as a reference, and the corrected value of MT0 is MT 0', the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.2.1) instantaneous curve correction method based on I0 sampling:
MT0’=MT0+(MdetT_I0-NdetT_I0)；
(3.2.2) curve correction method based on Ix sampling instantaneous value:
MT0’=MT0-(MdetT_Ix-NdetT_Ix)；
(3.2.3) instantaneous value curve correction method based on Ux sampling:
MT0’=MT0-(MdetT_Ux-NdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.2.1) - (3.2.3) is as follows:
(a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
(b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
(c) otherwise, curve correction based on Ux sampling transients is used.
Further, it is preferable that the (a) and (b) fundamental effective values use data windows of T0 right side T length for I0, and use data windows of T0 left side T length for Ix.
The invention also provides an automatic aligning and correcting system based on the wave recording data, which comprises the following components:
the data acquisition module is used for sequentially taking sampling points from the ith sampling point to the right along the T axis by taking T as an interval from the ith sampling point on a sampling current instantaneous value curve, and taking 3 sampling points in total, wherein the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
the first processing module is used for calculating the mutation points of the A, B, C three-phase current instantaneous value curves Ia, Ib and Ic according to the current instantaneous values of the obtained sampling points, and calculating the mutation points of the zero-phase self-generated current instantaneous value curve I0 to obtain comprehensive T0;
and the recording data alignment correction module is used for correcting the fault starting time point on the other side by taking the obtained comprehensive T0 point on any side of the two sides of the fault line as a reference.
The invention also provides an electronic device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor executes the program to realize the steps of the automatic alignment and correction method based on the wave recording data.
The present invention further provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the above-described automatic alignment and correction method based on recorded data.
Setting the two sides of a fault line as an M side and an N side respectively, namely stations at two ends of a power transmission line respectively; the station is a transformer substation or a power plant, and a wave recorder and a protection device are arranged in the station.
Compared with the prior art, the invention has the beneficial effects that:
(1) an uncertain area at the starting moment of the fault is avoided, and instead, the adjacent peak value is directly positioned, the peak value belongs to a determined and unique signal, and the reliability is high;
(2) the method is not influenced by the difference of sampling rates of wave recording data on two sides; the recording data at two sides can independently judge the starting time point of the fault by using the inherent sampling rate of the recording data, respectively calculate the time difference between the starting point of the fault and the adjacent peak value, and the two sides can finish the correction of the respective starting points of the fault only by comparing the time difference;
(3) the fault tolerance rate of the fault judgment on the fault starting time point is high; the fault starting point is automatically corrected through adjacent peak values, so that the deviation of 1/4 cycles at most at the fault starting point can be borne;
(4) the correction certainty is high; three levels of zero-phase current, phase current and phase voltage are adopted for correction, so that the accuracy is ensured to the maximum extent, and the reliability is also ensured to 100%;
(5) the method is suitable for realizing computer programming and realizes the double-end ranging target without human intervention.
Drawings
FIG. 1 is a schematic diagram of a fault recording sampling instantaneous value curve; wherein, Ua: a phase voltage instantaneous value curve; ia: a phase current instantaneous value curve; i0: zero-phase self-generated current transient curve; t: sampling period; t0: a fault starting time point, namely an alignment reference point; detT _ Ua: time difference between T0 and Ua at the first peak on the left side of T0; detT _ Ia: time difference between the first peak at the left side of T0 of T0 and Ia; detT _ I0: time difference between the first peak to the right of T0 of T0 and I0;
FIG. 2 is a schematic diagram illustrating the sampling point positions for determining the mutation point T0;
FIG. 3 is a schematic diagram of A, B, C three-phase current and self-generated zero-phase current;
FIG. 4 is a schematic structural diagram of an automatic alignment and correction system based on recorded wave data according to the present invention;
fig. 5 is a schematic structural diagram of an electronic device according to the present invention.
Detailed Description
The present invention will be described in further detail with reference to examples.
It will be appreciated by those skilled in the art that the following examples are illustrative of the invention only and should not be taken as limiting the scope of the invention. The examples do not specify particular techniques or conditions, and are performed according to the techniques or conditions described in the literature in the art or according to the product specifications. The materials or equipment used are not indicated by manufacturers, and all are conventional products available by purchase.
Example 1
An automatic alignment and correction method based on recorded wave data comprises the following steps:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
Example 2
An automatic alignment and correction method based on recorded wave data comprises the following steps:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
In the step (3), correcting the N-side fault starting time point NT0 by taking the M-side fault starting time point MT0 as a reference, and setting a corrected value NT 0' of NT0, wherein the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.1.1) instantaneous curve correction method based on I0 sampling:
NT0’=NT0+(NdetT_I0-MdetT_I0)；
(3.1.2) curve correction method based on Ix sampling instantaneous value:
NT0’=NT0-(NdetT_Ix-MdetT_Ix)；
(3.1.3) instantaneous value curve correction method based on Ux sampling:
NT0’=NT0-(NdetT_Ux-MdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.1.1) - (3.1.3) is as follows:
a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
c) otherwise, curve correction based on Ux sampling transients is used.
Correcting an M-side fault starting time point MT0 by taking an N-side fault starting time point NT0 as a reference, wherein the corrected value of MT0 is MT 0', the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.2.1) instantaneous curve correction method based on I0 sampling:
MT0’=MT0+(MdetT_I0-NdetT_I0)；
(3.2.2) curve correction method based on Ix sampling instantaneous value:
MT0’=MT0-(MdetT_Ix-NdetT_Ix)；
(3.2.3) instantaneous value curve correction method based on Ux sampling:
MT0’=MT0-(MdetT_Ux-NdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.2.1) - (3.2.3) is as follows:
(a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
(b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
(c) otherwise, curve correction based on Ux sampling transients is used.
Example 3
An automatic alignment and correction method based on recorded wave data comprises the following steps:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
In the step (3), correcting the N-side fault starting time point NT0 by taking the M-side fault starting time point MT0 as a reference, and setting a corrected value NT 0' of NT0, wherein the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.1.1) instantaneous curve correction method based on I0 sampling:
NT0’=NT0+(NdetT_I0-MdetT_I0)；
(3.1.2) curve correction method based on Ix sampling instantaneous value:
NT0’=NT0-(NdetT_Ix-MdetT_Ix)；
(3.1.3) instantaneous value curve correction method based on Ux sampling:
NT0’=NT0-(NdetT_Ux-MdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.1.1) - (3.1.3) is as follows:
a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
c) otherwise, curve correction based on Ux sampling transients is used.
Correcting an M-side fault starting time point MT0 by taking an N-side fault starting time point NT0 as a reference, wherein the corrected value of MT0 is MT 0', the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.2.1) instantaneous curve correction method based on I0 sampling:
MT0’=MT0+(MdetT_I0-NdetT_I0)；
(3.2.2) curve correction method based on Ix sampling instantaneous value:
MT0’=MT0-(MdetT_Ix-NdetT_Ix)；
(3.2.3) instantaneous value curve correction method based on Ux sampling:
MT0’=MT0-(MdetT_Ux-NdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.2.1) - (3.2.3) is as follows:
(a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
(b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
(c) otherwise, curve correction based on Ux sampling transients is used.
Wherein, the effective values of the fundamental wave in (a) and (b), the data window used by I0 is T length on right side of T0, and the data window used by Ix is T length on left side of T0.
As shown in fig. 4, an automatic aligning and correcting system based on recording data includes:
the data acquisition module 101 is configured to sequentially take sampling points from the ith sampling point to the right along a T axis at intervals of T on a sampling current instantaneous value curve, wherein 3 sampling points are taken, and corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
the first processing module 102 is configured to perform catastrophe point calculation on the A, B, C three-phase current instantaneous value curves Ia, Ib, and Ic according to the current instantaneous values of the obtained sampling points, and calculate a catastrophe point of the zero-phase self-generated current instantaneous value curve I0 at the same time to obtain a comprehensive T0;
and the recording data alignment correction module 103 is used for correcting the fault starting time point on the other side by taking the obtained comprehensive T0 point on any side of the two sides of the fault line as a reference.
In the embodiment of the present invention, on the sampling current instantaneous value curve, the data acquisition module 101 sequentially takes 3 sampling points from the ith sampling point to the right along the T axis with T as an interval from the ith sampling point, and the corresponding sampling current instantaneous values are respectively marked as V1, V2, and V3; then, the first processing module 102 performs catastrophe point calculation on the A, B, C three-phase current instantaneous value curves Ia, Ib and Ic according to the current instantaneous values of the obtained sampling points, and calculates catastrophe points of a zero-phase self-generated current instantaneous value curve I0 to obtain a comprehensive T0; finally, the recording data alignment correction module 103 corrects the failure start time point on the other side based on the obtained comprehensive T0 point on any one side of the two sides of the failure line.
According to the automatic alignment and correction system based on the wave recording data, provided by the embodiment of the invention, an uncertain area of the starting time of the fault is avoided, instead, the adjacent peak value is directly positioned, the peak value belongs to a determined and unique signal, the reliability is high, the influence of the sampling rate difference of the wave recording data on two sides is avoided, the fault tolerance rate of the fault judgment at the starting time point of the fault is high, and the system is easy to popularize and apply.
The system provided by the embodiment of the present invention is used for executing the above method embodiments, and for details of the process and the details, reference is made to the above embodiments, which are not described herein again.
Fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present invention, and referring to fig. 5, the electronic device may include: a processor (processor)201, a communication Interface (communication Interface)202, a memory (memory)203 and a communication bus 204, wherein the processor 201, the communication Interface 202 and the memory 203 complete communication with each other through the communication bus 204. The processor 201 may call logic instructions in the memory 203 to perform the following method:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
In addition, the logic instructions in the memory 203 may be implemented in the form of software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In another aspect, an embodiment of the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program is implemented to perform the automatic alignment and correction method based on recorded wave data provided in the foregoing embodiments, for example, the method includes:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Examples of the applications
As shown in fig. 1, the substations on both sides of the transmission line collect voltage and current signals in real time, convert the voltage and current signals into secondary current and secondary voltage sampling instantaneous values through CT and PT, and store the secondary current and secondary voltage sampling instantaneous values by the in-station wave recorder and the protection device to form static wave recording data. Taking an a-phase fault as an example, a typical fault voltage, fault current and zero-phase current are shown in fig. 1.
(1) Single-phase sampling instantaneous value curve judgment mutation point T0
The method comprises the following steps:
a) as shown in fig. 2, on the sampling current instantaneous value curve, 3 sampling points are taken along the T axis in sequence from the ith sampling point (the initial value of i is 1, i.e. the first sampling point) at intervals of T, and are respectively marked as Pi, Pi + T, Pi +2T, and the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
b) the current instantaneous value of the sampled three points is calculated by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 =
iii) the difference between det1 and det12 is denoted as detV, detV = | det1-det2
c) If detV <0.1, the following decision is made:
i) if i >15T, T0= ∞ (infinity), abandoning the current side T0 to wait for correction of the side in step (2);
ii) otherwise, i takes the next point to the right along the t axis, and repeats the steps a), b) and c);
d) otherwise, if detV >0.1, T0= i + 2T.
(2) Three-phase current and zero-phase current catastrophe point comprehensive T0
The method comprises the following steps:
a) self-generating zero phase current. The method is calculated by adding A, B, C three-phase current instantaneous values point by point, and the formula is as follows:
I0=(Ia+Ib+Ic)；
the self-produced I0 curve is shown in fig. 3.
b) And (2) according to the method for judging the mutation point T0 by the single-phase sampling instantaneous value curve in the step (1), calculating the mutation points of Ia, Ib, Ic and I0 in sequence, and respectively marking 4 calculated results as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0.
c) The integration T0 takes the minimum of the 4 results of step b), i.e.
T0=min{T0_Ia，T0_Ib，T0_Ic，T0_I0}
(3) The two-side recording data respectively judge the starting time point T0 of the fault
Let both sides be M side and N side respectively, the term definition of relevant trouble oscillography is as table 1.
TABLE 1 two-sided Fault recording information expression symbol definition
The method comprises the following steps:
NT0 was corrected based on MT0, and the corrected values of NT0 were: NT 0'.
The method comprises the following steps:
1) curve correcting method based on I0 sampling instantaneous value
NT0’=NT0+(NdetT_I0-MdetT_I0)
2) Ia sampling based instantaneous value curve correction method
NT0’=NT0-(NdetT_Ia-MdetT_Ia)
3) Ua sampling-based instantaneous value curve correction method
NT0’=NT0-(NdetT_Ua-MdetT_Ua)
The logic of the using condition of the correction method 1) 2) 3) is as follows:
a) at the time T0, if the effective value of the secondary fundamental wave of the I0 is larger than 1/2 of the effective value of the Ia fundamental wave, a curve correction method based on the I0 sampling instantaneous value is used;
b) otherwise, if the secondary fundamental wave effective value of Ia is greater than 0.1A, using a curve correction method based on Ia sampling instantaneous values;
c) otherwise, using a curve correction method based on the Ua sampling instantaneous value;
d) the effective values of the fundamental waves in the steps a) and b), the data window used by I0 is T0 right side T length, and the data window used by Ia is T0 left side T length.
The second method comprises the following steps:
correcting MT0 by taking NT0 as a reference, and setting the corrected value of MT0 as follows: MT 0'.
The method comprises the following steps:
1) curve correcting method based on I0 sampling instantaneous value
MT0’=MT0+(MdetT_I0-NdetT_I0)
2) Ia sampling based instantaneous value curve correction method
MT0’=MT0-(MdetT_Ia-NdetT_Ia)
3) Ua sampling-based instantaneous value curve correction method
MT0’=MT0-(MdetT_Ua-NdetT_Ua)
The logic of the using condition of the correction method 1) 2) 3) is as follows:
a) at the time T0, if the effective value of the secondary fundamental wave of the I0 is larger than 1/2 of the effective value of the Ia fundamental wave, a curve correction method based on the I0 sampling instantaneous value is used;
b) otherwise, if the secondary fundamental wave effective value of Ia is greater than 0.1A, using a curve correction method based on Ia sampling instantaneous values;
c) otherwise, using a curve correction method based on the Ua sampling instantaneous value;
d) the effective values of the fundamental waves in the steps a) and b), the data window used by I0 is T0 right side T length, and the data window used by Ia is T0 left side T length.
Specifically, the following description is provided: the method is that the fault phase is assumed to be A, and the fault voltage and the fault current are taken to be Ua and Ia, and similarly, if the fault phase is B, the fault voltage and the fault current are taken to be Ub and Ib; and if the fault phase is C, the fault voltage and the fault current are Uc and Ic. Are within the scope of the patented process.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (8)
1. An automatic alignment and correction method based on recorded wave data is characterized by comprising the following steps:
step (1), judging a mutation point T0 by a single-phase sampling instantaneous value curve:
(1.1) on a sampling current instantaneous value curve, sampling points are sequentially taken from the ith sampling point to the right along the T axis at intervals of T from the ith sampling point, and 3 sampling points are taken in total and are respectively marked as Pi and Pi + T, Pi + 2T; namely, the ith sampling point is taken as the first point; the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
(1.2) calculating the instantaneous value of the current at three sampled points by the following steps
i) The difference between V1 and V2 is recorded as det1, then det1= | V1-V2 |;
ii) the difference between V2 and V3 is denoted as det2, then det2= | V2-V3 |;
iii) the difference between det1 and det12 is denoted as detV, then detV = | det1-det2 |;
(1.3) if detV <0.1, the following judgment is performed:
i) if i >15T, T0= ∞, abandoning T0 on the same side to wait for correction of the contralateral side in step (2);
ii) if not, taking the next point from i to the right along the t axis, and repeating the steps (1.1) - (1.3);
(1.4) otherwise, if detV >0.1, T0= i + 2T;
step (2), three-phase current and zero-phase current catastrophe point comprehensive T0:
carrying out mutation point calculation on A, B, C three-phase current instantaneous value curves Ia, Ib and Ic in sequence by adopting the method in the step (1), simultaneously calculating mutation points of a zero-phase self-generated current instantaneous value curve I0, and respectively marking 4 results obtained by calculation as T0_ Ia, T0_ Ib, T0_ Ic and T0_ I0;
wherein I0= (Ia + Ib + Ic);
the synthesis T0 takes the minimum of 4 results, i.e.
Integrated T0= min { T0_ Ia, T0_ Ib, T0_ Ic, T0_ I0 };
setting the two sides of the fault line as an M side and an N side respectively, and correcting the starting time point of the fault at the other side by taking the M-side comprehensive T0 point obtained in the step (2) as a reference or the N-side comprehensive T0 point as a reference; the M-side integrated T0 point is denoted as MT0, and the N-side integrated T0 point is denoted as NT 0.
2. The recording data-based automatic alignment and correction method of claim 1, wherein: in the step (3), correcting the N-side fault starting time point NT0 by taking the M-side fault starting time point MT0 as a reference, and setting a corrected value NT 0' of NT0, wherein the fault phase is X, and the fault voltage and the fault current are Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.1.1) instantaneous curve correction method based on I0 sampling:
NT0’=NT0+(NdetT_I0-MdetT_I0)；
(3.1.2) curve correction method based on Ix sampling instantaneous value:
NT0’=NT0-(NdetT_Ix-MdetT_Ix)；
(3.1.3) instantaneous value curve correction method based on Ux sampling:
NT0’=NT0-(NdetT_Ux-MdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.1.1) - (3.1.3) is as follows:
a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
c) otherwise, curve correction based on Ux sampling transients is used.
3. The recording data-based automatic alignment and correction method of claim 2, wherein: a) and b) the effective value of the fundamental wave, wherein I0 uses a data window with a T length on the right side of T0, and Ix uses a data window with a T length on the left side of T0.
4. The recording data-based automatic alignment and correction method of claim 1, wherein: in the step (3), correcting the M-side fault starting time point MT0 by taking the N-side fault starting time point NT0 as a reference, setting the corrected value of MT0 as MT 0', setting the fault phase as X, and setting the fault voltage and the fault current as Ux and Ix; x is A, B or C; the method comprises the following steps:
(3.2.1) instantaneous curve correction method based on I0 sampling:
MT0’=MT0+(MdetT_I0-NdetT_I0)；
(3.2.2) curve correction method based on Ix sampling instantaneous value:
MT0’=MT0-(MdetT_Ix-NdetT_Ix)；
(3.2.3) instantaneous value curve correction method based on Ux sampling:
MT0’=MT0-(MdetT_Ux-NdetT_Ux)；
wherein MdetT _ Ux represents the time difference between the first peak value on the left side of T0 of M side T0 and Ux;
NdetT _ Ux represents the time difference between the first peak on the left side of T0 of the N side T0 and Ux;
MdetT _ Ix represents the time difference between the first peak on the left side of T0 of M side T0 and Ix;
NdetT _ Ix represents the time difference between the first peak on the left side of T0 of the N side T0 and Ix;
MdetT _ I0 represents the time difference between the first peak on the right side of T0 of M side T0 and I0;
NdetT _ I0 represents the time difference of the first peak on the right side of T0 between T0 and I0 on the N side;
the logic of the use conditions of the correction methods (3.2.1) - (3.2.3) is as follows:
(a) at the time T0, if the effective value of the secondary fundamental wave of I0 is larger than 1/2 of the effective value of the Ix fundamental wave, a curve correction method based on I0 sampling instantaneous values is used;
(b) otherwise, if the secondary fundamental wave effective value of Ix is greater than 0.1A, using a curve correction method based on Ix sampling instantaneous values;
(c) otherwise, curve correction based on Ux sampling transients is used.
5. The recording data-based automatic alignment and correction method of claim 4, wherein: (a) and (b) the effective value of the fundamental wave, wherein I0 uses a data window with a T length on the right side of T0, and Ix uses a data window with a T length on the left side of T0.
6. An automatic alignment and correction system based on recorded wave data, comprising:
the data acquisition module is used for sequentially taking sampling points from the ith sampling point to the right along the T axis by taking T as an interval from the ith sampling point on a sampling current instantaneous value curve, and taking 3 sampling points in total, wherein the corresponding sampling current instantaneous values are respectively marked as V1, V2 and V3;
the first processing module is used for calculating the mutation points of the A, B, C three-phase current instantaneous value curves Ia, Ib and Ic according to the current instantaneous values of the obtained sampling points, and calculating the mutation points of the zero-phase self-generated current instantaneous value curve I0 to obtain comprehensive T0;
and the recording data alignment correction module is used for correcting the fault starting time point on the other side by taking the obtained comprehensive T0 point on any side of the two sides of the fault line as a reference.
7. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor executes the program to implement the steps of the method for automatic alignment and correction based on recorded wave data according to any one of claims 1 to 5.
8. A non-transitory computer readable storage medium having stored thereon a computer program, wherein the computer program when executed by a processor implements the steps of the method for automatic alignment and rectification based on oscillometric data according to any of claims 1-5.
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