CN111812446A - PCB testing method and device - Google Patents
PCB testing method and device Download PDFInfo
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- CN111812446A CN111812446A CN202010780468.2A CN202010780468A CN111812446A CN 111812446 A CN111812446 A CN 111812446A CN 202010780468 A CN202010780468 A CN 202010780468A CN 111812446 A CN111812446 A CN 111812446A
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- 238000012360 testing method Methods 0.000 title claims abstract description 383
- 239000000523 sample Substances 0.000 claims abstract description 82
- 238000000034 method Methods 0.000 claims description 14
- 238000010998 test method Methods 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 239000002184 metal Substances 0.000 abstract description 7
- 229910052751 metal Inorganic materials 0.000 abstract description 7
- 238000010586 diagram Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Abstract
The invention discloses a PCB testing method and a PCB testing device, and relates to the technical field of metal-based printed circuit board manufacturing. The PCB testing method is applied to equipment with n flying probe testers connected in series, a testing network is divided through a testing host, the total testing network is divided into m × n testing sub-areas, the number of the testing sub-areas corresponds to the number of total testing shafts, and each testing shaft is responsible for one testing sub-area; when testing is carried out, the testing shaft of each flying probe testing machine is correspondingly detected in different testing sub-areas along with the advance of the PCB, when all flying probe testing machines pass through, all the testing sub-areas are also tested, namely, the testing of the PCB to be tested is finished, the whole testing method is efficient, and continuous automatic testing can be carried out.
Description
Technical Field
The invention relates to the technical field of metal-based printed circuit board manufacturing, in particular to a PCB testing method and device.
Background
With the development of the electronic industry, customers seek higher and higher heat dissipation performance of PCB products, and metal-based thick copper plates are increasingly applied to high-power lighting and power supply products due to high-efficiency heat dissipation performance. As an electronic product, the electrical performance of the electronic product is indispensable to be detected, the traditional method is to open a test jig to perform high-voltage and on-off tests, the test method is suitable for batch tests, but a large number of test jigs need to be manufactured, the cost is high, and a large amount of space is needed to store the test jigs, so that a method which does not need the test jig and meets continuous automatic tests needs to be designed through innovation.
The traditional PCB testing method has the advantages that a testing jig is required to be used for testing, the production period of the testing jig is required, a large amount of production cost is required, in addition, the volume of the testing jig is large (one model needs 1-2 testing jigs), therefore, a large amount of storage space is required to be occupied, personnel are consumed for management, information in the testing process needs to be recorded manually, omission or mistakes are easy to occur, and the whole testing cost and management are troublesome.
Disclosure of Invention
The technical problem to be solved by the embodiments of the present invention is to overcome some defects in the background art, and to provide an automatic, efficient and accurate PCB testing method and apparatus
In order to solve the above problem, an embodiment of the present invention provides the following technical solutions:
in a first aspect, the present invention provides a PCB testing method, which is applied to a testing host of a PCB testing system, where the PCB testing system includes a board loader, n flying-pin testers, a conveyer and a testing host, the conveyer is sequentially connected to the board loader, the n flying-pin testers and the board loader, the testing host is respectively connected to the n flying-pin testers, the n flying-pin testers are connected in series, each flying-pin tester includes m testing shafts, and the PCB testing method includes:
the test host acquires a total test network of the PCB to be tested;
the testing host machine averagely divides the total testing network of the PCB to be tested into m testing areas;
the test host machine divides each test area into n sub-test areas on average;
in the process that the conveying device sequentially conveys the PCB to be tested through the n flying probe testing machines, the testing host sequentially controls the n flying probe testing machines to test the PCB to be tested, wherein each testing shaft of each flying probe testing machine respectively tests one sub-testing area of the PCB to be tested, the testing time of each sub-testing area is the same, and n and m are positive integers larger than 1.
The technical scheme is that the test host acquires the total test network of the PCB to be tested, and the method comprises the following steps:
the test host receives a two-dimensional code sent by a code reader, wherein the two-dimensional code is read by the code reader on a PCB to be tested;
the test host acquires the serial number of the PCB to be tested according to the two-dimensional code;
and the test host reads the total test network of the PCB to be tested according to the serial number of the PCB to be tested.
The further technical scheme is that the PCB test further comprises:
the test host receives test results sent by each flying probe test machine;
and the test host binds and stores the test result sent by each flying probe test machine with the two-dimensional code.
The further technical scheme is that the PCB test further comprises:
the test host judges whether the test results sent by the flying probe test machines have unqualified items or not;
and if the test result sent by each flying probe test machine contains an unqualified item, the test host stores the serial number of the PCB to be tested into a preset unqualified record table and sends prompt information to a user.
The further technical scheme is that n and m are equal to 4.
The invention also provides a PCB testing device, which is applied to a testing host of a PCB testing system, wherein the PCB testing system comprises a plate placing machine, a plate receiving machine, n flying probe testing machines, a conveying device and a testing host, the conveying device is sequentially connected with the plate placing machine, the n flying probe testing machines and the plate receiving machine, the testing host is respectively connected with the n flying probe testing machines, the n flying probe testing machines are connected in series, each flying probe testing machine comprises m testing shafts, and the PCB testing device comprises:
the first acquisition unit is used for acquiring a total test network of the PCB to be tested;
the first dividing unit is used for averagely dividing the total test network of the PCB to be tested into m test areas;
the second dividing unit is used for respectively averagely dividing each test area into n sub-test areas;
and the control unit is used for sequentially controlling the n flying probe testing machines to test the PCB to be tested in the process that the conveying device sequentially conveys the PCB to be tested through the n flying probe testing machines, wherein each testing shaft of each flying probe testing machine respectively tests one sub-testing area of the PCB to be tested, the testing time of each sub-testing area is the same, and n and m are positive integers greater than 1.
The further technical solution is that the first obtaining unit includes:
the first receiving unit is used for receiving the two-dimensional code sent by the code reader, and the two-dimensional code is read by the code reader on the PCB to be tested;
the second obtaining unit is used for obtaining the serial number of the PCB to be tested according to the two-dimensional code;
and the reading unit is used for reading the total test network of the PCB to be tested according to the serial number of the PCB to be tested.
The further technical scheme is that the PCB testing device further comprises:
the second receiving unit is used for receiving the test results sent by the flying probe testing machines;
and the storage unit is used for binding and storing the test result sent by each flying probe test machine and the two-dimensional code.
The further technical scheme is that the PCB testing device further comprises:
the judging unit is used for judging whether the test results sent by the flying probe testing machines contain unqualified items or not;
and the prompting unit is used for storing the serial number of the PCB to be tested into a preset unqualified record table and sending prompting information to a user if the testing result sent by each flying probe testing machine has an unqualified item.
The further technical scheme is that n and m are equal to 4.
Compared with the prior art, the embodiment of the invention can achieve the following technical effects:
the PCB testing method provided by the invention adopts n flying probe testing machines connected in series, divides a testing network, divides a total testing network into m × n testing sub-areas, the number of the testing sub-areas corresponds to the number of total testing shafts, and each testing shaft is responsible for one testing sub-area; when testing is carried out, the testing shaft of each flying probe testing machine is correspondingly detected in different testing sub-areas along with the advance of the PCB, when all flying probe testing machines pass through, all the testing sub-areas are also tested, namely, the testing of the PCB to be tested is finished, the whole testing method is efficient, and continuous automatic testing can be carried out.
The PCB testing device provided by the invention adopts n flying probe testing machines which are connected in series, the conveying device can convey a PCB from a board loading machine to a testing platform of each flying probe testing machine through the conveying device, the PCB is conveyed to a board collecting machine after the testing is finished, the whole testing process is carried out automatically, the PCB to be tested is detected in different testing subareas through testing shafts of all the flying probe testing machines along with the conveying of the conveying device, and when all the flying probe testing machines pass, all the testing subareas are also tested, so that the testing of the PCB to be tested is finished.
Drawings
FIG. 1 is a schematic diagram of a total test network of a PCB to be tested dividing a test area in a PCB test device provided by the present invention;
FIG. 2 is a schematic diagram of a sub-test area divided by a test area of a PCB to be tested in the PCB test device provided by the present invention;
FIG. 3 is a schematic diagram of a PCB testing apparatus provided by the present invention, in which a plurality of PCBs to be tested are continuously tested;
fig. 4 is a schematic diagram of a PCB testing apparatus provided in the present invention.
Reference numerals
The PCB testing device comprises a PCB to be tested 10, a testing area 11, a sub-testing area 12, a testing shaft 20, a trigger placing machine 30 and a trigger receiving machine 40.
Detailed Description
The technical solutions in the embodiments will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, wherein like reference numerals represent like elements in the drawings. It is apparent that the embodiments to be described below are only a part of the embodiments of the present invention, and not all of them. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
The embodiment of the invention provides a PCB test method, which is applied to a test host of a PCB test system, wherein the PCB test system comprises a plate placing machine, a plate receiving machine, n flying probe testers, a transmission device and a test host, the transmission device is sequentially connected with the plate placing machine, the n flying probe testers and the plate receiving machine, the test host is respectively connected with the n flying probe testers, the n flying probe testers are connected in series, each flying probe tester comprises m test shafts, and the PCB test method comprises the following steps:
the test host acquires a total test network of the PCB to be tested;
the testing host machine averagely divides the total testing network of the PCB to be tested into m testing areas;
the test host machine divides each test area into n sub-test areas on average;
in the process that the conveying device sequentially conveys the PCB to be tested through the n flying probe testing machines, the testing host sequentially controls the n flying probe testing machines to test the PCB to be tested, wherein each testing shaft of each flying probe testing machine respectively tests one sub-testing area of the PCB to be tested, the testing time of each sub-testing area is the same, and n and m are positive integers larger than 1.
In a specific embodiment, the obtaining, by the test host, a total test network of the PCB to be tested includes:
the test host receives a two-dimensional code sent by a code reader, wherein the two-dimensional code is read by the code reader on a PCB to be tested;
the test host acquires the serial number of the PCB to be tested according to the two-dimensional code;
and the test host reads the total test network of the PCB to be tested according to the serial number of the PCB to be tested.
It can be understood that, before testing, a unique two-dimensional code is engraved on the process edge of each PCB to be tested by using laser, and the two-dimensional code has the function of uniquely identifying an identity and contains information such as a serial number and a type of the PCB to be tested.
Before entering the testing machine, the PCB to be tested passes through the code reader, the code reader identifies the two-dimensional code and automatically transmits data to the testing host, the serial number of the PCB to be tested of the testing host reads the total testing network of the PCB to be tested, the total testing network of the data is calculated through special software, and the total testing network is automatically and averagely divided into m testing areas.
The special software is software which is developed by a flying probe tester supplier and automatically partitions test data, and is used for automatically partitioning a test network into a plurality of test areas according to the test network so as to ensure that the test time of each test area is the same.
The invention has the innovative points that n flying probe testers are connected in series, the total test network is automatically divided into n test areas (test networks), and each flying probe tester correspondingly tests one test area (test network); for a single minute testing machine, according to the data partition testing mode, the corresponding testing area (testing network) is further partitioned into m testing sub-areas, so that the testing axes are correspondingly tested in the testing sub-areas at the same time, and the testing time of each testing sub-area is ensured to be the same. The board on each flying needle testing machine moves forwards at the same time, so that the aims of automatic loading and unloading, automatic circulation and automatic recording are fulfilled;
in an embodiment, the PCB testing further comprises:
the test host receives test results sent by each flying probe test machine;
and the test host binds and stores the test result sent by each flying probe test machine with the two-dimensional code.
In an embodiment, the PCB testing further comprises:
the test host judges whether the test results sent by the flying probe test machines have unqualified items or not;
and if the test result sent by each flying probe test machine contains an unqualified item, the test host stores the serial number of the PCB to be tested into a preset unqualified record table and sends prompt information to a user.
For a bad board in the test process, the test host stores the serial number of the PCB to be tested into a preset disqualification recording table, the serial number can be automatically associated and recorded through the two-dimensional code, the prompt information can be marked striking information, and the repair or the scrapping is confirmed manually after the PCB is taken off a machine table;
in one embodiment, n and m are both equal to 4.
The testing method is also suitable for the metal substrate, and for the metal substrate, because whether the short circuit and the electric leakage problem exist between the circuit and the metal needs to be detected, 2 conductive columns are arranged at the edge of the PCB and communicated with the metal base surface, and when the flying probe test is carried out, the communication condition of the conductive columns and the test shaft is detected.
Referring to fig. 1 to 4, the present invention further provides a PCB testing apparatus, which is applied to a testing host of a PCB testing system, wherein the PCB testing system includes a trigger loader 30, a trigger loader 40, n flying probe testing machines, a transport apparatus and a testing host, the transport apparatus is sequentially connected to the trigger loader 30, the n flying probe testing machines and the trigger loader 40, the testing host is respectively connected to the n flying probe testing machines, the n flying probe testing machines are connected in series, each flying probe testing machine includes m testing shafts 20, and the PCB testing apparatus includes:
the first obtaining unit is used for obtaining a total test network of the PCB10 to be tested;
the first dividing unit is used for averagely dividing the total test network of the PCB10 to be tested into m test areas 11;
a second dividing unit, configured to divide each test area into n sub-test areas 12 on average;
and the control unit is used for sequentially controlling the n flying probe testing machines to test the PCB to be tested in the process that the conveying device sequentially conveys the PCB to be tested 10 to the n flying probe testing machines, wherein each testing shaft 20 of each flying probe testing machine respectively tests one sub-testing area 12 of the PCB to be tested 10, the testing time of each sub-testing area 12 is the same, and n and m are positive integers greater than 1.
In a specific embodiment, the first obtaining unit includes:
the first receiving unit is used for receiving the two-dimensional code sent by the code reader, and the two-dimensional code is read by the code reader on the PCB10 to be tested;
the second obtaining unit is used for obtaining the serial number of the PCB10 to be tested according to the two-dimensional code;
and the reading unit is used for reading the total test network of the PCB to be tested 10 according to the serial number of the PCB to be tested.
In a specific embodiment, the PCB testing apparatus further includes:
the second receiving unit is used for receiving the test results sent by the flying probe testing machines;
and the storage unit is used for binding and storing the test result sent by each flying probe test machine and the two-dimensional code.
In a specific embodiment, the PCB testing apparatus further includes:
the judging unit is used for judging whether the test results sent by the flying probe testing machines contain unqualified items or not;
and the prompting unit is used for storing the serial number of the PCB to be tested into a preset unqualified record table and sending prompting information to a user if the testing result sent by each flying probe testing machine has an unqualified item.
In a particular embodiment, n and m are both equal to 4.
In a specific embodiment, the PCB testing apparatus provided in the embodiment of the present invention designs a 4-axis horizontal flying probe testing machine (with a high-voltage function), and the 4 flying probe testing machines are connected in series (if only one flying probe testing machine is used, the testing speed cannot meet the requirement), and the board receiving machine, the board placing machine and the conveying device are matched to achieve the effect of automatic high-speed and continuous testing of the PCB, and the function of automatically collecting production records is achieved, so that the production efficiency is high, and the production cost is low. The PCB testing device of the embodiment of the invention adds a transmission function to a working platform of a horizontal flying probe testing machine, and boards can be automatically transmitted among a board placing machine, the flying probe testing machine and a board collecting machine; in addition, the test data realizes the automatic partition function through software, so that the test of one fourth of the area by each flying probe tester is ensured, and each flying probe tester synchronously tests the responsible area, thereby realizing the purpose of synchronously testing and synchronously transmitting.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, while the invention has been described with respect to the above-described embodiments, it will be understood that the invention is not limited thereto but may be embodied with various modifications and changes.
While the invention has been described with reference to specific embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A PCB test method is characterized in that the method is applied to a test host of a PCB test system, the PCB test system comprises a plate placing machine, a plate receiving machine, n flying probe testers, a conveying device and a test host, the conveying device is sequentially connected with the plate placing machine, the n flying probe testers and the plate receiving machine, the test host is respectively connected with the n flying probe testers, each flying probe tester comprises m test shafts, and the PCB test method comprises the following steps:
the test host acquires a total test network of the PCB to be tested;
the testing host machine averagely divides the total testing network of the PCB to be tested into m testing areas;
the test host machine divides each test area into n sub-test areas on average;
in the process that the conveying device sequentially conveys the PCB to be tested through the n flying probe testing machines, the testing host sequentially controls the n flying probe testing machines to test the PCB to be tested, wherein each testing shaft of each flying probe testing machine respectively tests one sub-testing area of the PCB to be tested, the testing time of each sub-testing area is the same, and n and m are positive integers larger than 1.
2. The PCB testing method of claim 1, wherein the testing host obtains a total testing network of the PCB to be tested, comprising:
the test host receives a two-dimensional code sent by a code reader, wherein the two-dimensional code is read by the code reader on a PCB to be tested;
the test host acquires the serial number of the PCB to be tested according to the two-dimensional code;
and the test host reads the total test network of the PCB to be tested according to the serial number of the PCB to be tested.
3. The PCB testing method of claim 2, wherein the PCB testing further comprises:
the test host receives test results sent by each flying probe test machine;
and the test host binds and stores the test result sent by each flying probe test machine with the two-dimensional code.
4. The PCB testing method of claim 3, wherein the PCB testing further comprises:
the test host judges whether the test results sent by the flying probe test machines have unqualified items or not;
and if the test result sent by each flying probe test machine contains an unqualified item, the test host stores the serial number of the PCB to be tested into a preset unqualified record table and sends prompt information to a user.
5. A PCB testing method as claimed in any of claims 1-4, wherein n and m are both equal to 4.
6. The PCB testing device is characterized in that the PCB testing device is applied to a testing host of a PCB testing system, the PCB testing system comprises a board placing machine, a board receiving machine, n flying needle testing machines, a conveying device and a testing host, the conveying device is sequentially connected with the board placing machine, the n flying needle testing machines and the board receiving machine, the testing host is respectively connected with the n flying needle testing machines, each flying needle testing machine comprises m testing shafts, and the PCB testing device comprises:
the first acquisition unit is used for acquiring a total test network of the PCB to be tested;
the first dividing unit is used for averagely dividing the total test network of the PCB to be tested into m test areas;
the second dividing unit is used for respectively averagely dividing each test area into n sub-test areas;
and the control unit is used for sequentially controlling the n flying probe testing machines to test the PCB to be tested in the process that the conveying device sequentially conveys the PCB to be tested through the n flying probe testing machines, wherein each testing shaft of each flying probe testing machine respectively tests one sub-testing area of the PCB to be tested, the testing time of each sub-testing area is the same, and n and m are positive integers greater than 1.
7. The PCB testing device of claim 6, wherein the first obtaining unit comprises:
the first receiving unit is used for receiving the two-dimensional code sent by the code reader, and the two-dimensional code is read by the code reader on the PCB to be tested;
the second obtaining unit is used for obtaining the serial number of the PCB to be tested according to the two-dimensional code;
and the reading unit is used for reading the total test network of the PCB to be tested according to the serial number of the PCB to be tested.
8. The PCB testing apparatus of claim 7, further comprising:
the second receiving unit is used for receiving the test results sent by the flying probe testing machines;
and the storage unit is used for binding and storing the test result sent by each flying probe test machine and the two-dimensional code.
9. The PCB testing apparatus of claim 8, further comprising:
the judging unit is used for judging whether the test results sent by the flying probe testing machines contain unqualified items or not;
and the prompting unit is used for storing the serial number of the PCB to be tested into a preset unqualified record table and sending prompting information to a user if the testing result sent by each flying probe testing machine has an unqualified item.
10. A PCB testing device according to any of claims 6-9, wherein n and m are both equal to 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010780468.2A CN111812446A (en) | 2020-08-05 | 2020-08-05 | PCB testing method and device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010780468.2A CN111812446A (en) | 2020-08-05 | 2020-08-05 | PCB testing method and device |
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| CN111812446A true CN111812446A (en) | 2020-10-23 |
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| CN202010780468.2A Pending CN111812446A (en) | 2020-08-05 | 2020-08-05 | PCB testing method and device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112540287A (en) * | 2020-11-28 | 2021-03-23 | 苏州浪潮智能科技有限公司 | Flying probe testing method and device for printed circuit board assembly |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030020504A1 (en) * | 2001-07-26 | 2003-01-30 | Abdulky Obaida A. | Universal flying probe fixture |
| CN109738789A (en) * | 2019-01-02 | 2019-05-10 | 大族激光科技产业集团股份有限公司 | Flying probe tester test method, device, flying probe tester and storage medium |
| CN110844586A (en) * | 2019-11-06 | 2020-02-28 | 南京协辰电子科技有限公司 | Material conveying device and PCB production system |
-
2020
- 2020-08-05 CN CN202010780468.2A patent/CN111812446A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030020504A1 (en) * | 2001-07-26 | 2003-01-30 | Abdulky Obaida A. | Universal flying probe fixture |
| CN109738789A (en) * | 2019-01-02 | 2019-05-10 | 大族激光科技产业集团股份有限公司 | Flying probe tester test method, device, flying probe tester and storage medium |
| CN110844586A (en) * | 2019-11-06 | 2020-02-28 | 南京协辰电子科技有限公司 | Material conveying device and PCB production system |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112540287A (en) * | 2020-11-28 | 2021-03-23 | 苏州浪潮智能科技有限公司 | Flying probe testing method and device for printed circuit board assembly |
| CN112540287B (en) * | 2020-11-28 | 2022-05-13 | 苏州浪潮智能科技有限公司 | Flying probe testing method and device for printed circuit board assembly |
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Application publication date: 20201023 |
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| RJ01 | Rejection of invention patent application after publication |