CN111811431A - Three-dimensional scanner, three-dimensional scanning system and method - Google Patents
Three-dimensional scanner, three-dimensional scanning system and method Download PDFInfo
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- CN111811431A CN111811431A CN202010535015.3A CN202010535015A CN111811431A CN 111811431 A CN111811431 A CN 111811431A CN 202010535015 A CN202010535015 A CN 202010535015A CN 111811431 A CN111811431 A CN 111811431A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
Abstract
The utility model relates to a three-dimensional scanner, three-dimensional scanning system and method, belong to the industrial detection technology field, the three-dimensional scanner that this disclosure provided, because the work depth of field of the pattern projector is adjustable, and the work depth of field of image acquisition sensor and the work depth of field adaptation of pattern projector, when scanning the object that awaits measuring of different sizes, can adjust the pattern projector to corresponding work depth of field, and do not need to use other scanners, thereby improved scanning speed. In addition, because the three-dimensional scanner in the disclosure can scan objects to be measured with different sizes, a machine has multiple purposes, and other scanners do not need to be additionally purchased, thereby effectively reducing the cost.
Description
Technical Field
The disclosure relates to the technical field of industrial detection, in particular to a three-dimensional scanner, a three-dimensional scanning system and a three-dimensional scanning method.
Background
Three-dimensional scanning technology is generally applied to the field of industrial detection, however, the existing optical three-dimensional scanning system is limited by technology and can only be applied to one field of industrial detection. For example, in the conventional scanning field, when a large workpiece is scanned, the scanning efficiency is low due to the small single scanning area of the existing optical three-dimensional scanning system; and because a large amount of data generated by multiple scanning needs to be spliced, the accumulated error is large, and the scanning speed and precision can not meet the detection requirement. In the field of precision workpiece scanning, the existing optical three-dimensional scanning system has low scanning sensitivity, so that details are distorted or even lost when the workpiece is scanned, and the detection requirement cannot be met.
The inventor finds that in the prior art, different three-dimensional scanning techniques are generally selected when detecting workpieces with different sizes, so that many users have to use different types of scanning systems to meet the detection requirements of workpieces with different sizes. Because the scanning system cost is higher to need to switch different scanning systems when detecting different size work pieces, thereby lead to detection efficiency lower, also increased the complexity of detection process simultaneously.
Disclosure of Invention
The present disclosure provides a three-dimensional scanner, a three-dimensional scanning system and a method thereof to solve at least one of the problems in the background art.
In order to achieve the above object, in a first aspect, the embodiments of the present disclosure provide a three-dimensional scanner, which includes a pattern projector and a pattern acquisition sensor, wherein the pattern projector is configured to project a specific optical pattern onto a surface of an object to be measured, the pattern acquisition sensor is configured to acquire an image of the surface of the object to be measured, an operating depth of field of the pattern projector is adjustable, and the operating depth of field of the pattern acquisition sensor is adapted to the operating depth of field of the pattern projector.
In some embodiments, the pattern projector comprises at least two projectors, the at least two projectors comprise projectors with different working depths, and one of the at least two projectors is selected to work through control switching to adjust the working depths of the pattern projectors and/or
The pattern projector includes a projector including an adjustable lens to adjust an operating depth of field of the pattern projector by controlling at least one of a focal length and an aperture of the adjustable lens.
In some embodiments, the pattern projector comprises at least two projection light sources, and the wavelength bands of the light projected by the at least two projection light sources are all the same, or are partially the same, or are all different.
In some embodiments, an image acquisition sensor comprises:
the size of the sensing chip is determined according to the focal length, the aperture value, the working distance and the working depth of field of a lens used by the image acquisition sensor under various working depth of field, and the working depth of field of the image acquisition sensor is not less than the maximum working depth of field of the pattern projector;
the image acquisition sensor comprises an adjustable lens, and the working depth of field of the image acquisition sensor is adjusted by adjusting at least one of the focal length and the aperture of the lens.
In some embodiments, the three-dimensional scanner further comprises:
the band-pass filter is used for filtering the light projected by the pattern projector and/or the light collected by the image collecting sensor; and/or
The light supplementing light source is used for supplementing light to the surface of the object to be detected when the image acquisition sensor acquires the image of the surface of the object to be detected; and/or
And the power supply module comprises a portable mobile power supply and is used for supplying power to the three-dimensional scanner.
In a second aspect, the present disclosure provides a three-dimensional scanning system, which includes a three-dimensional scanner and an upper computer, where the three-dimensional scanner is in transmission connection with the upper computer, the three-dimensional scanner is the three-dimensional scanner in the first aspect of the present disclosure, the three-dimensional scanner includes a pattern projector and an image acquisition sensor, and the pattern projector and the image acquisition sensor are respectively in transmission connection with the upper computer;
the pattern projector adjusts the working depth of field according to a first control signal sent by the upper computer;
the three-dimensional scanner scans an object to be measured based on the current working depth of field, the pattern projector projects a specific optical pattern to the surface of the object to be measured, and the image acquisition sensor synchronously acquires an image of the surface of the object to be measured and transmits the image to the upper computer;
and the upper computer obtains the three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected, which is acquired by the three-dimensional scanner.
In some embodiments, the three-dimensional scanning information of the object to be measured is obtained by at least one of spatial positioning, three-dimensional modeling, and photogrammetric calculation of the object to be measured;
wherein, the host computer includes following at least one:
the 3D pose calculator is used for extracting two-dimensional characteristic points from the image of the surface of the object to be detected and carrying out space positioning on the object to be detected according to the two-dimensional characteristic points;
the point cloud reconstruction calculator is used for extracting two-dimensional characteristic points from the image of the surface of the object to be detected and carrying out three-dimensional modeling on the object to be detected according to the two-dimensional characteristic points;
and the photogrammetry calculator is used for photogrammetry calculation on the object to be measured according to the image on the surface of the object to be measured.
In some embodiments, the three-dimensional scanning system further comprises:
and the working depth of field prompter is used for displaying the current working depth of field of the three-dimensional scanner.
In a third aspect, the present disclosure provides a three-dimensional scanning method, including:
sending a first control signal to the pattern projector, and controlling the pattern projector to adjust the working depth of field;
sending a second control signal to the pattern projector, and controlling the pattern projector to project a specific optical pattern onto the surface of the object to be measured;
sending a third control signal to the image acquisition sensor to control the image acquisition sensor to acquire an image of the surface of the object to be detected;
and obtaining the three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected.
In some embodiments, the three-dimensional scanning information of the object to be measured is obtained by at least one of spatial positioning, three-dimensional modeling, and photogrammetric calculation of the object to be measured;
obtaining three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected comprises the following steps:
extracting two-dimensional characteristic points from the image of the surface of the object to be detected, and carrying out space positioning on the object to be detected according to the two-dimensional characteristic points; and/or
Extracting two-dimensional characteristic points from the image of the surface of the object to be detected, and carrying out three-dimensional modeling on the object to be detected according to the two-dimensional characteristic points; and/or
And carrying out photogrammetry calculation on the object to be measured according to the image of the surface of the object to be measured.
From the above technical contents, it can be seen that the present disclosure has the following beneficial effects:
according to the three-dimensional scanner provided by the embodiment of the disclosure, because the working depth of field of the pattern projector is adjustable, and the working depth of field of the image acquisition sensor and the working depth of field of the pattern projector are left-off, when objects to be detected with different sizes are scanned, the pattern projector can be adjusted to the corresponding working depth of field without using other scanners, and thus the scanning speed is increased. In addition, because the three-dimensional scanner in the embodiment of the disclosure can scan objects to be measured with different sizes, a machine with multiple purposes is realized, additional purchase of other scanners is not needed, and the cost is effectively reduced.
Drawings
To more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present disclosure, and other drawings can be obtained by those skilled in the art according to the drawings.
Fig. 1 is a block diagram of a three-dimensional scanner according to an embodiment of the present disclosure;
fig. 2 is a block diagram of a three-dimensional scanner according to an embodiment of the present disclosure;
fig. 3 is a block diagram of a three-dimensional scanning system according to an embodiment of the present disclosure;
fig. 4 is a schematic flow chart of a three-dimensional scanning method according to an embodiment of the present disclosure.
Detailed Description
In order that the above objects, features and advantages of the present disclosure can be more clearly understood, the present disclosure will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the embodiments described are only a few embodiments of the present disclosure, and not all embodiments. The specific embodiments described herein are merely illustrative of the disclosure and are not intended to be limiting. All other embodiments derived by one of ordinary skill in the art from the described embodiments of the disclosure are intended to be within the scope of the disclosure.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.
Aiming at the problem that when a workpiece is subjected to conventional scanning in the industrial detection field, the single scanning area of the existing optical three-dimensional scanning system is small, so that the scanning efficiency is low; and because need splice a large amount of data that many times of scans produced, thus lead to the accumulative error big, the speed and the precision of scanning can't satisfy the problem that detects the demand. And when the workpiece is precisely scanned, the scanning sensitivity of the existing optical three-dimensional scanning system is low, so that the problem of detail distortion and even loss when the workpiece is scanned is caused. According to the three-dimensional scanner, the three-dimensional scanning system and the three-dimensional scanning method, the working depth of field of the pattern projector is adjustable, and the working depth of field of the image acquisition sensor is matched with the working depth of field of the pattern projector, so that when objects to be detected with different sizes are scanned, the pattern projector can be adjusted to the corresponding working depth of field without using other scanners, and the scanning speed is improved. In addition, because the three-dimensional scanner in the embodiment of the disclosure can scan objects to be measured with different sizes, a machine with multiple purposes is realized, additional purchase of other scanners is not needed, and the cost is effectively reduced.
Specifically, in a first aspect, fig. 1 is a structural block diagram of a three-dimensional scanner provided in an embodiment of the present disclosure, as shown in fig. 1, including a pattern projector 100 and a pattern acquisition sensor 200, where the pattern projector 100 is configured to project a specific optical pattern onto a surface of an object to be measured, the pattern acquisition sensor 200 is configured to acquire an image of the surface of the object to be measured, an operating depth of field of the pattern projector 100 is adjustable, the operating depth of field of the pattern acquisition sensor 200 is adapted to the operating depth of field of the pattern projector 100, and no matter how the operating depth of field of the pattern projector 100 changes, a portion of the optical pattern projected by the pattern projector 100 within the operating depth of field thereof can be clearly imaged by the image acquisition sensor 200.
In the embodiment of the disclosure, the three-dimensional scanner is further provided with a control circuit board, which is respectively connected with the pattern projector and the image acquisition sensor, and is used for controlling the pattern projector and the pattern acquisition sensor to work.
The working depth of field of the pattern projector in the embodiment of the disclosure is adjustable, when objects to be measured with different sizes are scanned, the working depth of field of the pattern projector can be adjusted, so that the pattern projector projects a specific optical pattern onto the surface of the object to be measured in different working depth of field modes, the image acquisition sensor synchronously acquires images on the surface of the object to be measured, the working depth of field of the pattern acquisition sensor is matched with the working depth of field of the pattern projector, and the image acquisition sensor can acquire clear images of the surface of the object to be measured in the working depth of field range of the pattern projector no matter how the working depth of field of the pattern projector is adjusted. The specific optical pattern may be, for example, a cross-line pattern formed by light emitted by the pattern projector, and the cross-line pattern may be included in an image of the surface of the object to be measured acquired by the subsequent image acquisition sensor, so as to improve the accuracy of the subsequent calculator for extracting the two-dimensional feature points from the image of the surface of the object to be measured.
It should be noted that the specific optical pattern emitted by the pattern projector in the embodiment of the present disclosure may be other patterns, and the embodiment of the present disclosure is not particularly limited.
According to the three-dimensional scanner provided by the embodiment of the disclosure, as the working depth of field of the pattern projector is adjustable, and the working depth of field of the image acquisition sensor is matched with the working depth of field of the pattern projector, when objects to be measured with different sizes are scanned, the pattern projector can be adjusted to the corresponding working depth of field without using other scanners, so that the scanning speed is improved. In addition, because the three-dimensional scanner in the embodiment of the disclosure can scan objects to be measured with different sizes, a machine with multiple purposes is realized, and the cost for purchasing different scanners is effectively reduced.
In some embodiments, the pattern projector 100 includes at least two projectors, and the at least two projectors include projectors with different depths of operation, and one of the at least two projectors is selected to operate by controlling the switching to adjust the depth of operation of the pattern projector 100. It is understood that the pattern projector 100 includes a first projector and a second projector, the first projector having an operating depth different from the operating depth of the second projector, and the first projector operating or the second projector operating is selected by controlling the switching to adjust the operating depth of the pattern projector 100. Of course, the pattern projector 100 may include three or four or more projectors, where the depth of operation of some of the projectors is different or the depth of operation of each projector is different. And/or
The pattern projector 100 comprises a projector including an adjustable lens, and the depth of field of the pattern projector 100 is adjusted by controlling at least one of a focal length and an aperture of the adjustable lens. In this embodiment, the adjustment of the working depth of field can be achieved by only one projector.
In the embodiment of the present disclosure, the pattern projector may be composed of a plurality of projectors, each projector includes an independent projection light source and an independent lens, the projection light source and the lens determine an operating depth of field of the projector, and it is seen that each projector has its own operating depth of field.
In addition, when the pattern projector includes a plurality of projectors, the projectors may employ either an adjustable lens or a fixed focus lens.
It should be noted that the laser array may be formed by combining pairs of lasers of the same type, so that the light emitted from the laser array may form a cross-line pattern, or project an optical pattern through a single laser, and the embodiment of the present disclosure is not limited in particular.
In some embodiments, the pattern projector 100 includes at least two projection light sources that project light in the same wavelength band, or in part, or in different wavelength bands.
In the embodiment of the disclosure, the pattern projector includes a plurality of projectors, each projector includes a plurality of projection light sources, and the wavelength bands of the light projected by the plurality of projection light sources in each projector are all different, for example, each projector includes a projection light source capable of projecting an infrared wavelength band, a projection light source capable of projecting a red wavelength band, and a projection light source capable of projecting a blue wavelength band, so that the pattern projector can perform wavelength band selection on the projected light in a single working depth of field mode, the projected light can adopt the same wavelength band in different working depth of field modes, or adopt different wavelength bands, that is, the working depth of field and the wavelength bands can be freely selected and combined, so that the three-dimensional scanner is suitable for scanning of diversified scenes. Of course, the configuration of the plurality of projectors in the pattern projector to the projection light sources may be the same or different, one of the projection light sources in one wavelength band may be set singly in some projectors, and some projectors may combine the projection light sources in different wavelength bands.
For example, the pattern projector according to the embodiment of the present disclosure may be configured with five working depth of field modes, the first working depth of field mode corresponds to a depth of field of 4000mm, the second working depth of field mode corresponds to a depth of field of 2000mm, the third working depth of field mode corresponds to a depth of field of 1000mm, the fourth working depth of field mode corresponds to a depth of field of 250mm, and the fifth working depth of field mode corresponds to a depth of field of 100 mm. The projectors corresponding to the first working depth of field mode, the second working depth of field mode and the third working depth of field mode all adopt projection light sources for projecting infrared bands; the projector corresponding to the fourth working depth of field mode adopts a projection light source for projecting red light wave band; the projector corresponding to the fifth working depth of field mode adopts a projection light source for projecting a blue light wave band.
When the pattern projector is in a first working depth of field mode, the projector with the first working depth of field works, and a projection light source of the projector projects light rays of an infrared band; when the pattern projector is in a second working depth of field mode, the projector with the second working depth of field works, and a projection light source of the projector projects light rays of an infrared band; when the pattern projector is in a third working depth of field mode, the projector with the third working depth of field works, and a projection light source of the projector projects light rays in an infrared band; when the pattern projector is in the fourth working depth of field mode, the projector with the fourth working depth of field works, and a projection light source of the projector projects a red light wave band; when the pattern projector is in the fifth depth of field mode, the projector with the fifth depth of field operates, and the projection light source of the projector projects a blue light band. The pattern projector can be switched from one working depth of field working mode to another working depth of field working mode through control, namely, the pattern projector can select any working depth of field working mode to work.
It should be noted that, for the non-adjustable lens, the working distance is not adjustable, and is limited by the focal length of the lens, the pattern projector includes a plurality of projectors with different working depths of field, the working distance of each projector is different, and the working distance of each projector is fixed and cannot be adjusted; the working distance of the adjustable lens is adjustable, and when the focal length and/or the aperture of the lens are adjusted, the working distance and the working depth of field are changed accordingly. In addition, the pattern projector in the embodiment of the present disclosure may set two, three, and multiple working depth of field modes according to actual requirements, and the depth of field corresponding to each working depth of field mode may also be set according to actual requirements, which is not limited in the embodiment of the present disclosure.
In some embodiments, image capture sensor 200 comprises:
a sensing chip, the size of which is determined according to the focal length, the aperture value, the working distance, and the working depth of field of the lens of the image capturing sensor 200, the working depth of field of the image capturing sensor 200 is not less than the maximum working depth of field of the pattern projector 100. No matter how the working depth of field of the pattern projector 100 changes, the working depth of field of the pattern projector 100 always falls within the working depth of field of the image acquisition sensor 200, so that the image acquisition sensor 200 can acquire clear images of a part of the optical pattern projected by the pattern projector 100 within the working depth of field of the part, that is, the working depth of field of the image acquisition sensor 200 is matched with the working depth of field of the pattern projector 100. And/or
The image capturing sensor 200 includes an adjustable lens, and the working depth of field of the image capturing sensor 200 is adjusted by adjusting at least one of a focal length and an aperture of the lens.
The image capturing sensor in the embodiment of the present disclosure may be an adjustable lens, and the adjustment of the working depth of field of the image capturing sensor is achieved by adjusting at least one of a focal length and an aperture of the lens. The image acquisition sensor in the embodiment of the present disclosure may also be a fixed focus lens, and by the above limitation on the size of the sensor chip, the adaptation with the working depth of field of the pattern projector may be satisfied without adjusting the working depth of field of the image acquisition sensor.
According to the optical imaging depth of field calculation method, the depth of field is related to the focal length, the aperture value and the working distance of the lens, and the size of the sensing chip is related to the depth of field. The larger the size of the sensing chip is, the larger the working depth of field of the corresponding image acquisition sensor is.
It should be noted that the working distance of the lens in the embodiment of the present disclosure is an inherent parameter of the lens, and refers to a distance between the rear end of the lens and an object to be measured when the lens can clearly image (focus) in a certain working depth of field mode.
In order to enable one sensing chip to be provided with one lens, the coverage of the image acquisition sensor on multiple working depths of field of the pattern projector can be met (namely, the scanner comprises multiple working depth of field modes, under the multiple working depth of field modes, the working depths of field of the pattern projector are different, but under any depth of field mode, the working depths of field of the pattern acquisition sensor all cover the working depths of field of the pattern projector), so that the complexity and the weight of the design of a three-dimensional scanning system are reduced, the practicability of equipment is increased, and the working depths of field of the image acquisition sensor are not less than the maximum working depths of field of the pattern projector. The minimum size of the sensor chip can be calculated according to the focal length, the aperture value, the working distance and the working depth of field in the maximum working depth of field mode of the lens adopted by the image acquisition sensor, namely the size of the sensor chip is not smaller than the minimum size.
In some embodiments, the lens in pattern projector 100 and the adjustable lens in image capture sensor 200 are motorized zoom lenses or liquid lenses.
As a specific example, the lens in the embodiment of the present disclosure may adopt a motorized zoom lens and a liquid lens. The electric zoom lens is convenient to operate, the zooming process is stable, and the effect is good. The liquid lens adjusts the focal length by changing the pressure of the liquid, and compared with the traditional zoom system, the liquid lens has a compact structure, can reduce the volume of the system, is easy to produce and can reduce the production cost.
It should be noted that the lens in the embodiment of the present disclosure may also adopt other types of zoom lenses, and the embodiment of the present disclosure is not particularly limited.
In some embodiments, the three-dimensional scanner further comprises:
a band pass filter for filtering light projected by the pattern projector 100 and/or light collected by the image collection sensor 200.
In order to reduce the interference of the light environment noise to the measurement signal, the three-dimensional scanner in the embodiment of the disclosure is further provided with a band pass filter, which can filter light in a wavelength band other than the light projected by the specific projection light source in the pattern projector, for example, the band pass filter can filter light in an infrared wavelength band, a red light wavelength band, and light in a wavelength band other than a blue light wavelength band.
In the embodiment of the present disclosure, when the depth of field corresponding to the first working depth of field mode is 4000mm, the depth of field corresponding to the second working depth of field mode is 2000mm, and the depth of field corresponding to the third working depth of field mode is 1000mm, light in the infrared band is required, and therefore light outside the infrared band needs to be filtered; when the depth of field corresponding to the fourth operating depth of field mode is 250mm, light rays in a red light wave band are required, and therefore light rays outside the red light wave band need to be filtered; when the depth of field corresponding to the fifth working depth of field mode is 100mm, light rays in a blue light band are required, and therefore light rays outside the blue light band need to be filtered.
In addition, when the image acquisition sensor acquires an image of the surface of the object to be measured, there is interference of light environment noise on the measurement signal, so that it is also necessary to filter light rays outside a specific wavelength band acquired by the image acquisition sensor.
It should be noted that the band pass filter may be a band pass filter, and is disposed in the pattern projector and the image capturing sensor, and the band pass filter may also be a multi-band pass filter, which may allow light of various wavelengths to pass through, so as to minimize the light environment noise.
In some embodiments, as shown in fig. 2, the three-dimensional scanner further comprises:
and the light supplementing light source 300 is used for supplementing light to the surface of the object to be detected when the image acquisition sensor 200 acquires the image of the surface of the object to be detected.
When the working environment of the three-dimensional scanner is dark and the light is insufficient, a light source needs to be supplemented. In the embodiment of the present disclosure, the supplementary light source is disposed around the image capturing sensor, so that in a dark environment, the image capturing sensor can normally capture an image of the surface of the object to be measured.
In some embodiments, the three-dimensional scanner further comprises a power module comprising a portable mobile power source for powering the three-dimensional scanner.
In a second aspect, fig. 3 is a structural block diagram of a three-dimensional scanning system provided in an embodiment of the present disclosure, as shown in fig. 3, the three-dimensional scanning system includes a three-dimensional scanner 1 and an upper computer 2, the three-dimensional scanner 1 is in transmission connection with the upper computer 2, the three-dimensional scanner 1 is the three-dimensional scanner in the first aspect of the embodiment of the present disclosure, the three-dimensional scanner 1 includes a pattern projector and an image acquisition sensor, and the pattern projector and the image acquisition sensor are respectively in transmission connection with the upper computer 2;
the pattern projector adjusts the working depth of field according to a first control signal sent by the upper computer 2;
the three-dimensional scanner 1 scans an object to be measured based on the current working depth of field, the pattern projector projects a specific optical pattern to the surface of the object to be measured, and the image acquisition sensor synchronously acquires an image of the surface of the object to be measured and transmits the image to the upper computer 2;
the upper computer 2 obtains three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected, which is acquired by the three-dimensional scanner 1.
In the embodiment of the present disclosure, in order to reduce the calculation amount of the three-dimensional scanner, the processing of the image of the surface of the object to be measured may be performed in the upper computer. In addition, a control circuit board is further arranged in the three-dimensional scanner, the pattern projector and the image acquisition sensor are respectively connected with the control circuit board, the control circuit board is in signal connection with an upper computer, the upper computer sends a control instruction to the three-dimensional scanner, and the three-dimensional scanner operates according to the control instruction of the upper computer. For example, the pattern projector projects a specific optical pattern, the pattern acquisition sensor acquires an image of the surface of the object to be measured and uploads the image to the upper computer, and the upper computer processes the image of the surface of the object to be measured, so that scanning information of the object to be measured is obtained. The three-dimensional scanner does not need to be provided with a corresponding processor, so that the volume of the three-dimensional scanner is effectively reduced, the portability of the three-dimensional scanner is improved, the performance of the upper computer is not limited by the three-dimensional scanner, and the selection can be carried out according to the performance.
In some embodiments, the three-dimensional scanning information of the object to be measured is obtained by at least one of spatial positioning, three-dimensional modeling, and photogrammetric calculation of the object to be measured;
wherein, host computer 2 includes following at least one:
the 3D pose calculator is used for extracting two-dimensional characteristic points from the image of the surface of the object to be detected and carrying out space positioning on the object to be detected according to the two-dimensional characteristic points;
the point cloud reconstruction calculator is used for extracting two-dimensional characteristic points from the image of the surface of the object to be detected and carrying out three-dimensional modeling on the object to be detected according to the two-dimensional characteristic points;
and the photogrammetry calculator is used for photogrammetry calculation on the object to be measured according to the image on the surface of the object to be measured.
In the embodiment of the present disclosure, the upper computer may perform various operations according to actual requirements. The 3D pose calculator can perform space positioning on the object to be detected in real time. The 3D pose calculator can extract 2D positioning points according to the images of the surface of the object to be detected, which are acquired by the image acquisition sensor, wherein the positioning points can be artificial mark points or characteristic points of the texture of the object to be detected. And then the 3D pose calculator performs multi-camera stereo matching and three-dimensional reconstruction on the object to be detected according to a stereo vision principle, so as to calculate a coordinate set of a positioning point under a three-dimensional scanner coordinate system. And then, calculating the position and pose of the three-dimensional scanner under the coordinate system of the object to be detected by utilizing the coordinate set of the positioning point under the coordinate system of the three-dimensional scanner and the coordinate set of the known positioning point under the coordinate system of the object to be detected according to a coordinate transformation principle, wherein the position and pose of the three-dimensional scanner are used for describing the distance of the three-dimensional scanner relative to the object to be detected, so that the spatial positioning of the object to be detected is completed.
Specifically, the 3D pose calculator extracts two-dimensional feature points of an image of the surface of an object to be detected acquired by the image acquisition sensor to obtain a two-dimensional feature point set, converts the two-dimensional feature point set into a three-dimensional feature point set by using a stereoscopic vision principle, performs data registration by using corresponding three-dimensional feature point sets in different coordinate systems at different moments to obtain the pose relationship among three-dimensional data fragments at different moments, further obtains the distance of the three-dimensional scanner relative to the object to be detected, and splices the three-dimensional data fragments obtained at different moments to the same coordinate system.
It should be noted that other methods may also be used to perform spatial positioning on the object to be measured, for example, the 3D pose calculator may also perform spatial positioning according to the geometric features of the surface of the object to be measured, and the embodiment of the present disclosure is not limited specifically.
Different from a 3D pose calculator which is mainly used for carrying out space positioning on an object to be measured in real time, the point cloud reconstruction calculator in the embodiment of the disclosure can carry out three-dimensional modeling on the object to be measured through a stereoscopic vision principle according to two-dimensional feature points obtained in different working depth of field modes to obtain single-frame three-dimensional measurement data. Because the three-dimensional scanner in the embodiment of the disclosure has multiple working depth of field modes, single-frame three-dimensional measurement data with different spatial resolutions and different measurement area sizes can be obtained, thereby realizing different scanning speeds and accuracies and meeting multiple scanning requirements such as fast scanning, ordinary scanning, fine scanning and the like.
The photogrammetry calculator may perform photogrammetry calculations. Specifically, the three-dimensional scanner acquires the image of the surface of the object to be measured at the farthest end of the working distance to obtain the scanning area as large as possible (such as 4 times the area of the normal scanning area), and the positioning point of the surface of the object to be measured is subjected to three-dimensional reconstruction according to the photogrammetry principle. Because the scanning area of single photogrammetry is far larger than the normal scanning area range, the acquired data volume can be greatly reduced, so that the splicing times of data are reduced, and the accumulated error caused by data splicing is further effectively reduced. In addition, the positioning point coordinate set obtained by photogrammetry calculation can also be used for defining a coordinate system of the object to be measured, so that the overall measurement precision of the object to be measured is improved.
In some embodiments, the three-dimensional scanning system further comprises:
and the working depth of field prompter is used for displaying the current working depth of field of the three-dimensional scanner 1.
The working depth of field prompter can prompt the current working depth of field of the three-dimensional scanner, such as the distance between the lens and the object to be detected, for the user, so that the working distance of the three-dimensional scanner can be adjusted according to the distance displayed by the working depth of field prompter, and a clearer image can be acquired.
It should be noted that the depth of field prompter may be set in the three-dimensional scanner or the upper computer according to actual requirements, and the embodiment of the present disclosure is not limited specifically.
In a third aspect, fig. 4 is a schematic flow chart of a three-dimensional scanning method provided in the embodiment of the present disclosure, as shown in fig. 4, including:
s401, sending a first control signal to the pattern projector, and controlling the pattern projector to adjust the working depth of field;
s402, sending a second control signal to the pattern projector, and controlling the pattern projector to project a specific optical pattern onto the surface of the object to be measured;
s403, sending a third control signal to the image acquisition sensor to control the image acquisition sensor to acquire an image of the surface of the object to be detected;
s404, obtaining three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected.
In the embodiment of the disclosure, the three-dimensional scanner is controlled by the upper computer to work. The method comprises the steps that firstly, an upper computer sends a first control signal to a three-dimensional scanner to control a pattern projector to adjust the working depth of field, and the working depth of field of an image acquisition sensor is matched with the working depth of field of the pattern projector. And then the upper computer respectively sends a second control signal to the pattern projector to enable the pattern projector to project a specific optical pattern to the surface of the object to be detected, and sends a third control signal to the image acquisition sensor to enable the image acquisition sensor to acquire the image of the surface of the object to be detected. And finally, processing the image of the surface of the object to be detected by the upper computer to obtain the three-dimensional scanning information of the object to be detected.
According to the three-dimensional scanning method provided by the embodiment of the disclosure, the working depth of field of the image acquisition sensor is adapted to the working depth of field of the pattern projector by adjusting the working depth of field of the pattern projector, and when objects to be detected with different sizes are scanned, the pattern projector is adjusted to the corresponding working depth of field without using other scanners, so that the scanning speed is improved. In addition, the three-dimensional scanning method provided by the embodiment of the disclosure can scan objects to be detected with different sizes, so that one machine has multiple purposes, other scanners do not need to be additionally purchased, and the cost is effectively reduced.
In some embodiments, the three-dimensional scanning information of the object to be measured is obtained by at least one of spatial positioning, three-dimensional modeling, and photogrammetric calculation of the object to be measured;
obtaining three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected comprises the following steps:
extracting two-dimensional characteristic points from the image of the surface of the object to be detected, and carrying out space positioning on the object to be detected according to the two-dimensional characteristic points; and/or
Extracting two-dimensional characteristic points from the image of the surface of the object to be detected, and carrying out three-dimensional modeling on the object to be detected according to the two-dimensional characteristic points; and/or
And carrying out photogrammetry calculation on the object to be measured according to the image of the surface of the object to be measured.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than others, combinations of features of different embodiments are meant to be within the scope of the disclosure and form different embodiments.
Those skilled in the art will appreciate that the description of each embodiment has a respective emphasis, and reference may be made to the related description of other embodiments for those parts of an embodiment that are not described in detail.
Although the embodiments of the present disclosure have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present disclosure, and such modifications and variations fall within the scope defined by the appended claims.
Claims (10)
1. A three-dimensional scanner comprises a pattern projector and a pattern acquisition sensor, wherein the pattern projector is used for projecting a specific optical pattern onto the surface of an object to be measured, and the pattern acquisition sensor is used for acquiring the image of the surface of the object to be measured.
2. The three-dimensional scanner according to claim 1, wherein the pattern projector comprises at least two projectors, the at least two projectors comprise projectors with different working depths of field, and one of the at least two projectors is selected to work by controlling switching to adjust the working depths of field of the pattern projector, and/or
The pattern projector includes a projector including an adjustable lens, and the working depth of field of the pattern projector is adjusted by controlling and adjusting at least one of a focal length and an aperture of the lens.
3. The three-dimensional scanner according to claim 2, wherein the pattern projector comprises at least two projection light sources, and the wavelength bands of the light projected by the at least two projection light sources are all the same, or are partially the same, or are all different.
4. The three-dimensional scanner of claim 1, wherein said image acquisition sensor comprises
The size of the sensing chip is determined according to the focal length, the aperture value, the working distance and the working depth of field of a lens of the image acquisition sensor, and the working depth of field of the image acquisition sensor is not less than the maximum working depth of field of the pattern projector; and/or
The image acquisition sensor comprises an adjustable lens, and the working depth of field of the image acquisition sensor is adjusted by adjusting at least one of the focal length and the aperture of the lens.
5. The three-dimensional scanner of claim 1, further comprising:
the band-pass filter is used for filtering the light projected by the pattern projector and/or the light collected by the image collecting sensor; and/or
The light supplementing light source is used for supplementing light to the surface of the object to be detected when the image acquisition sensor acquires the image of the surface of the object to be detected; and/or
And the power supply module comprises a portable mobile power supply and is used for supplying power to the three-dimensional scanner.
6. A three-dimensional scanning system comprises a three-dimensional scanner and an upper computer, wherein the three-dimensional scanner is in transmission connection with the upper computer, and the three-dimensional scanner is the three-dimensional scanner of any one of claims 1 to 5, the three-dimensional scanner comprises a pattern projector and an image acquisition sensor, and the pattern projector and the image acquisition sensor are respectively in transmission connection with the upper computer;
the pattern projector adjusts the working depth of field according to a first control signal sent by the upper computer;
the three-dimensional scanner scans an object to be detected based on the current working depth of field, the pattern projector projects a specific optical pattern to the surface of the object to be detected, and the image acquisition sensor synchronously acquires an image of the surface of the object to be detected and transmits the image to the upper computer;
and the upper computer obtains the three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected, which is acquired by the three-dimensional scanner.
7. The three-dimensional scanning system of claim 6, wherein the three-dimensional scanning information of the object under test is obtained by at least one of spatial localization, three-dimensional modeling, and photogrammetric calculations of the object under test;
wherein, the host computer includes following at least one:
the 3D pose calculator is used for extracting two-dimensional characteristic points from the image of the surface of the object to be detected and carrying out space positioning on the object to be detected according to the two-dimensional characteristic points;
the point cloud reconstruction calculator is used for extracting two-dimensional characteristic points from the image of the surface of the object to be detected and carrying out three-dimensional modeling on the object to be detected according to the two-dimensional characteristic points;
and the photogrammetry calculator is used for performing photogrammetry calculation on the object to be measured according to the image on the surface of the object to be measured.
8. The three-dimensional scanning system of claim 6, further comprising:
and the working depth of field prompter is used for displaying the current working depth of field of the three-dimensional scanner.
9. A three-dimensional scanning method, comprising:
sending a first control signal to the pattern projector, and controlling the pattern projector to adjust the working depth of field;
sending a second control signal to the pattern projector, and controlling the pattern projector to project a specific optical pattern onto the surface of the object to be measured;
sending a third control signal to the image acquisition sensor to control the image acquisition sensor to acquire the image of the surface of the object to be detected;
and obtaining the three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected.
10. The method of claim 9, wherein the three-dimensional scanning information of the object to be measured is obtained by at least one of spatial localization, three-dimensional modeling, and photogrammetric calculations of the object to be measured;
the obtaining of the three-dimensional scanning information of the object to be detected according to the image of the surface of the object to be detected comprises:
extracting two-dimensional characteristic points from the image of the surface of the object to be detected, and carrying out space positioning on the object to be detected according to the two-dimensional characteristic points; and/or
Extracting two-dimensional characteristic points from the image of the surface of the object to be detected, and carrying out three-dimensional modeling on the object to be detected according to the two-dimensional characteristic points; and/or
And carrying out photogrammetry calculation on the object to be measured according to the image on the surface of the object to be measured.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112747671A (en) * | 2020-12-10 | 2021-05-04 | 北京天远三维科技股份有限公司 | Three-dimensional detection system and three-dimensional detection method |
| CN113156778A (en) * | 2021-04-28 | 2021-07-23 | 苏州赛源光学科技有限公司 | Illumination module convenient to adjust depth of field |
| CN116206069A (en) * | 2023-04-28 | 2023-06-02 | 思看科技(杭州)股份有限公司 | Image data processing method and device in three-dimensional scanning and three-dimensional scanner |
-
2020
- 2020-06-12 CN CN202010535015.3A patent/CN111811431A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112747671A (en) * | 2020-12-10 | 2021-05-04 | 北京天远三维科技股份有限公司 | Three-dimensional detection system and three-dimensional detection method |
| CN113156778A (en) * | 2021-04-28 | 2021-07-23 | 苏州赛源光学科技有限公司 | Illumination module convenient to adjust depth of field |
| CN116206069A (en) * | 2023-04-28 | 2023-06-02 | 思看科技(杭州)股份有限公司 | Image data processing method and device in three-dimensional scanning and three-dimensional scanner |
| CN116206069B (en) * | 2023-04-28 | 2023-10-13 | 思看科技(杭州)股份有限公司 | Image data processing method and device in three-dimensional scanning and three-dimensional scanner |
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