CN111781532A - Circuit and method for realizing aging experiment of three-phase inverter power module - Google Patents

Circuit and method for realizing aging experiment of three-phase inverter power module Download PDF

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CN111781532A
CN111781532A CN202010663081.9A CN202010663081A CN111781532A CN 111781532 A CN111781532 A CN 111781532A CN 202010663081 A CN202010663081 A CN 202010663081A CN 111781532 A CN111781532 A CN 111781532A
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dut
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CN111781532B (en
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王磊
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Beijing Jiaotong University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G01R31/42—AC power supplies

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Abstract

The invention relates to a circuit and a method for realizing a three-phase inverter power module aging experiment, wherein the circuit comprises the following components: the device comprises a voltage sensor on a three-phase alternating current input side, a current sensor on the three-phase alternating current input side, a pre-charging contactor on the three-phase alternating current input side, a line contactor on the three-phase alternating current input side, a three-phase voltage regulator, an alternating current side reactor, a direct current contactor, a direct current pre-charging resistor, a direct current discharging resistor, a discharging contactor, a direct current side voltage sensor, a direct current side current sensor, a plurality of test accompanying transformers and a plurality of test accompanying modules. According to the invention, any alternating current side voltage characteristic can be realized by controlling the DUT, the amplitude and the power factor of alternating current of the DUT are controlled by the accompanying module, any alternating current side group wave current characteristic of the DUT can be simulated without using corresponding actual alternating current side equipment, so that the aging experiment process is simple and the universal adaptability is good.

Description

Circuit and method for realizing aging experiment of three-phase inverter power module
Technical Field
The invention relates to a circuit and a method for realizing an aging experiment of a three-phase inverter power module under the actual load working condition.
Background
The three-phase inverter power module comprises a radiating fin, heat-conducting silicone grease, a power bus bar, a power switch device and a driving component thereof, a direct-current side supporting capacitor, a voltage and current sensor and the like. Only with respect to the aging experiment of the power switch device of the three-phase inverter power module, the main problem is that the aging experiment of the power device under the actual topology or the physical composition of the three-phase inverter power module cannot be realized; on the other hand, the aging test under the actual load or the actual working condition cannot be realized. Therefore, in the aging experiment of the current power device, the aging experiment result realized by aiming at the single power switch device (the IGBT module is the most common), is difficult to be applied to the service life estimation or service life prediction of the IGBT module under the actual topology, the actual physical composition of the three-phase inverter power module or the actual load working condition, so that the service life of the IGBT module under the actual topology, the actual physical composition of the three-phase inverter power module or the actual load working condition is difficult to be accurately predicted or estimated through the existing aging experiment result. Very similar problems exist for supporting capacitors, voltage current sensors, thermally conductive silicone grease, power switching device drive components, etc. on a three-phase inverter power module. The aging test circuit well solves the aging test problem of the three-phase inverter power module component under the actual topology and the actual load working condition, and the aging service life of the three-phase inverter power module component tested and completed by the circuit and the method is high in fitting precision due to the fact that the actual topology is adopted and the actual load working condition is based on, and good accuracy is achieved in reappearing the actual application scene.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a circuit and a method for realizing an aging experiment of a three-phase inverter power module, which can support the aging experiment of the three-phase inverter power module under the actual topology, the actual physical constitution mode and the actual heat dissipation condition.
In order to achieve the above purposes, the technical scheme adopted by the invention is as follows:
a circuit for realizing three-phase inverter power module aging experiments comprises: the device comprises a voltage sensor UA1 on a three-phase alternating current input side, current sensors LA 1-3 on the three-phase alternating current input side, a three-phase alternating current input side pre-charging contactor KP1, a three-phase alternating current input side line contactor KC1, a three-phase voltage regulator T1, alternating current side reactors L1-3, a direct current contactor Kdc1, a direct current pre-charging resistor Rc0, a direct current discharging resistor Rd, a discharging contactor Kd, a direct current side voltage sensor Udc1, a direct current side current sensor Idc1, a plurality of test-accompanying transformers and a plurality of test-accompanying modules;
three pairs of contacts of a three-phase alternating current input side pre-charging contactor KP1 are connected with pre-charging excitation resistors RP 1-3, or two pairs of contacts are selected randomly to be connected with the pre-charging excitation resistors; the alternating-current side reactors L1-3 are used for controlling the amplitude and the phase of alternating-current side current of the three-phase inverter power module; the three-phase voltage regulator T1 is used for adjusting the amplitude of the alternating-current side voltage of the three-phase inverter power module;
a voltage sensor UA1 at the three-phase alternating current input side and current sensors LA 1-3 at the three-phase alternating current input side are arranged at the three-phase alternating current input end; the three-phase alternating current input side pre-charging contactor KP1 and the three-phase alternating current input side line contactor KC1 are installed between current sensors LA 1-3 of the three-phase alternating current input side and the input side of a three-phase voltage regulator T1, and the output side of the three-phase voltage regulator T1 is connected with the input sides of alternating current side reactors L1-3 and the primary sides of a plurality of test-accompanying transformers respectively;
the output sides of the alternating-current side reactors L1-3 are connected with the alternating-current side of the three-phase inverter power module, the direct-current side positive electrode of the three-phase inverter power module is connected to the positive electrode P of the direct-current bus through a direct-current contactor Kdc1 and a direct-current side current sensor Idc1, and the direct-current side negative electrode of the three-phase inverter power module is connected to the negative electrode N of the direct-current bus; a direct current pre-charging resistor Rc0 is connected in parallel to the direct current contactor Kdc 1; the direct-current side voltage sensor Udc1 is used for detecting the direct-current side voltage of the three-phase inverter power module, one end of the detection end is connected to the direct-current side anode of the three-phase inverter power module, and the other end is connected to the direct-current side cathode of the three-phase inverter power module; the discharging contactor Kd is connected with the direct current discharging resistor Rd in series, one end of the direct current discharging resistor Rd after the series connection is connected with the other end of the direct current side voltage sensor Udc1 and the direct current side negative electrode of the three-phase inverter power module respectively, and one end of the discharging contactor Kd is connected with the direct current side current sensor Idc1 and the positive electrode P of the direct current bus respectively;
each group of secondary sides of the accompanying transformer corresponds to an accompanying module; each group of secondary sides of the accompanying transformer is connected to one end of an alternating current reactor, and the other end of the alternating current reactor is connected to the alternating current side of a three-phase bridge arm of the accompanying module; the direct-current side of a three-phase bridge arm of the accompanying and testing module is connected into a supporting capacitor bank, and each capacitor in the supporting capacitor bank is connected with a power resistor in parallel;
the voltage of the direct current side of each test accompanying module is measured by a Hall type voltage sensor, and the current of the direct current side is measured by a Hall type current sensor; the positive electrode of the direct current side of the test accompanying module is connected to the positive electrode P of the direct current bus through a Hall type current sensor, and the negative electrode of the direct current side of the test accompanying module is connected to the negative electrode N of the direct current bus; a direct current side switch is installed between the accompanying module and the Hall type current sensor, and the direct current side switch is connected with a resistor in parallel.
The test-accompanying transformer is a single-primary-side single-secondary-side test-accompanying transformer or a single-primary-side multi-secondary-side test-accompanying transformer; the output line voltages of each group of secondary sides of the single-primary-side multi-secondary-side accompanying transformer have the same effective value and adopt a delta or star connection method.
When the transformer has two sets of secondary sides, the two sets of secondary sides adopt delta and star connection respectively.
The accompanying module is in a circuit form of connecting two three-phase bridge topologies in series or in a multi-level circuit topology form.
When the number of the test accompanying modules is larger than or equal to 2, a double-pole double-throw manual isolating switch is arranged between each two adjacent test accompanying modules and the direct-current bus so as to realize the manual switching of the series connection and parallel connection of the test accompanying modules.
The resistance value of the direct current discharge resistor Rd is not more than 1K omega; the resistance value of the power resistor is 1-100K omega.
The capacitor of the support capacitor bank adopts a film capacitor; the nominal voltage of the capacitors supporting the capacitor bank, the capacitor capacity, the number of capacitors and the connection mode of the capacitors are selected according to the voltage level of the three-phase inverter power module.
The voltage sensor UA1 on the three-phase alternating current input side is used for detecting three-phase alternating current input voltage; the current sensors LA 1-3 at the three-phase alternating current input side are used for detecting three-phase alternating current input current; the dc-side current sensor Idc1 is used to detect the value of dc current flowing into/out of the three-phase inverter power module.
The circuit for realizing the aging experiment of the three-phase inverter power module is carried out according to the following processes in the starting and normal working processes:
adjusting the output voltage of T1 to the AC side voltage required by the DUT, switching off KP1, KC1, Kdc1 and Kd, switching off the DC side switches of the test accompanying module, blocking 6 paths of IGBT driving pulses of the DUT, and blocking 6 paths of IGBT driving pulses of the test accompanying module;
closing → KP1, and starting pre-excitation on the AC side;
→ after waiting for a certain time, KC1 is closed, then after 1s, KP1 is opened;
→ Kdc1 is closed, the dc side switches of the attendant module are all closed;
determining the switching frequency of a power switching device in the DUT according to the working characteristics of the DUT, and carrying out voltage closed-loop control on the DUT by the designation of a user, wherein the sampling point of a voltage ring is the voltage of an output end line of T1 or the voltage of a UAC bus, and the given value of the voltage ring is the AC side line voltage amplitude U actually required in the DUT aging test processndThe frequency of the alternating current side of the DUT is also set according to the actual requirement of the DUT aging test;
the test accompanying module adopts a single current loop control mode, the current loops are divided into an active current loop and a reactive current loop, the given values of the two current loops are determined according to the number of the test accompanying modules and the alternating current requirement of the DUT aging experiment, and if the amplitude of the alternating current requirement is IndThe grid side power factor requirement is PF3The given value of the active current loop of each test-accompanying module is
Figure BDA0002579334670000051
Wherein N is the number of the test accompanying modules, and the given value of the reactive current loop of each test accompanying module is
Figure BDA0002579334670000052
When the network side power factor requirement is 1, the given value of the active current loop of each test assisting module is
Figure BDA0002579334670000053
The given value of the reactive current loop of each test assistant module is 0; the feedback values of the active current loop and the reactive current loop are the active current component and the reactive current component of the line current of the three-phase alternating current reactor connected in front of the three-phase bridge arm in each test accompanying module, and in the process of obtaining the active current component and the reactive current component, the conversion angle required by the PARK and inverse PARK conversion is taken as the conversion angle required by the PARK and inverse PARK conversion of the DUT voltage loop.
The circuit for realizing the aging experiment of the three-phase inverter power module is carried out according to the following processes under the abnormal condition:
KP1 is disconnected, KC1 is disconnected, Kdc1 is disconnected, Kd is disconnected, all direct-current side switches of the test accompanying module are disconnected, 6 paths of IGBT driving pulses of a DUT are blocked, and 6 paths of IGBT driving pulses of the test accompanying module are blocked;
closed → Kd, emergency discharge;
kd is off when the direct-current voltages detected by the hall type voltage sensors are all lower than 30V.
The DUT aging experiment method based on the circuit for realizing the aging experiment of the three-phase inverter power module comprises the following steps:
① determining PF according to the load condition of DUT1Or PF2Determining Und、IndIt is to be noted thatndNot constant but varying with time, IndThe value of (A) or the time-varying rule is given by the user; PF (particle Filter)1For ac network side power factor, PF2Is a power factor of the AC valve side, UndThe actual required AC lateral line voltage amplitude, I, in the DUT aging test processndThe amplitude of the alternating current side is actually required in the DUT aging test process;
② determining U based on DUT performance and usage requirementsdc1Determining UT1And IDUTmaxThen, the number of the test assisting modules is determined according to the direct-current voltage of each test assisting module, and when the double-pole double-throw manual isolating switch is used, the position of the double-pole double-throw manual isolating switch is determined according to the direct-current voltage of each test assisting module and the Udc1The voltage level of (3), manually switching; u shapedc1Is the straight of DUTCurrent side voltage, UT1AC side voltage required for DUTDUTmaxThe maximum value of the AC side line current amplitude of the DUT in the aging experiment process;
accessing a DUT or a device to be tested containing the DUT into the circuit on the premise of ensuring the actual use condition of the DUT as much as possible;
fourthly, the control circuit enters a corresponding normal working mode to carry out an aging experiment of the components in the DUT;
testing the aging level of the components in the DUT by the prior art means in the aging experiment process, and obtaining a complete aging rule of the components according to the aging life end condition specified by a user.
The invention has the beneficial effects that:
1. the circuit can support the aging experiment of the three-phase inverter power module under the actual topology, the actual physical constitution mode and the actual heat dissipation condition, and can realize the load working condition of the DUT under the actual application scene, thereby ensuring that the aging experiment result is as close to the actual application scene as possible, and further ensuring that the aging experiment result can be directly applied to the service condition evaluation, the service life prediction and the like of the DUT and the internal components under the actual application scene on site;
2. the circuit can realize any alternating current side voltage characteristic by controlling the DUT, can simulate any DUT alternating current side base wave current characteristic by controlling the amplitude and the power factor of the DUT alternating current through the test accompanying module, and does not need to use corresponding actual alternating current side equipment (such as a load resistor, a load alternating current reactor or an alternating current capacitor and series and parallel connection of the load resistor, the load alternating current reactor or the alternating current capacitor), so that the aging experiment process is simple and the universal adaptability is good.
Drawings
The invention has the following drawings:
FIG. 1 is a schematic circuit diagram of a power loop topology of one embodiment of the present invention.
Fig. 2 is a schematic circuit diagram of a power loop topology according to another embodiment of the invention.
Fig. 3 is a schematic diagram of a multi-secondary-side test-assistant transformer replaced by a single secondary-side test-assistant transformer.
Fig. 4 is a schematic circuit diagram of a test-accompanying transformer with a single primary side and multiple secondary sides.
Fig. 5 is a schematic diagram of a two-level test-assistant module circuit replaced with a three-level test-assistant module circuit (for example, in the form of an NPC circuit).
FIG. 6 illustrates the AC side and DC side dependent variables of the DUT.
FIG. 7 specifies the AC network side power factor
Figure BDA0002579334670000081
And is
Figure BDA0002579334670000085
The DUT AC side vector relationship graph.
FIG. 8 specifies the AC grid side power factor
Figure BDA0002579334670000082
And is
Figure BDA0002579334670000086
The DUT AC side vector relationship graph.
FIG. 9 specifies the AC network side power factor
Figure BDA0002579334670000083
And is
Figure BDA0002579334670000087
The DUT AC side vector relationship graph.
FIG. 10 specifies the AC grid side power factor
Figure BDA0002579334670000084
And is
Figure BDA0002579334670000088
The DUT AC side vector relationship graph.
FIG. 11 specifies the AC valve side power factor PF2(cos phi) and 0. ltoreq. phi<DUT ac side vector at 90 deg. is plotted.
FIG. 12 specifies the AC valve side power factor PF2(cos phi) and phi is not more than 90 DEG<Graph of DUT ac side vector magnitude at 180 deg..
FIG. 13 specifies the AC valve side power factor PF2(cos phi) and phi is not more than 180 DEG<DUT ac side vector relationship plot at 270 °.
FIG. 14 specifies the AC valve side power factor PF2(cos phi) and 270 DEG to phi<Graph of DUT ac side vector magnitude at 360 deg..
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
The patent provides a circuit and a method for realizing an aging experiment of a three-phase inverter power module under the actual load working condition. In the circuit, the AC side load of the tested three-phase inverter power module is simulated and realized by the accompanying converter, and the AC side load which is simulated and realized can be correspondingly changed according to the change conditions of the AC current amplitude, the power factor and the like under the actual load working condition of the three-phase inverter power module, so that the aging experiment of the three-phase inverter power module under the high-precision actual application scene can be realized. In addition, the test-accompanying converter adopts a form that a plurality of test-accompanying modules are driven in series and parallel in a multiple mode, on one hand, the output voltage level of the test-accompanying converter is improved through the series connection of the test-accompanying modules, therefore, the three-phase inverter power module can support various direct current supply modes with direct current nominal voltages of DC 500V-DC 600V, DC750V, DC1500V, DC1650V, DC3200V and nearby voltage values, on the other hand, the current output capacity of the auxiliary test converter is improved through the parallel connection of the auxiliary test modules, and can ensure that the aging speed of the test accompanying module is not enough to influence the test result in the aging process of the DUT through the redundancy of the capacity, meanwhile, the series-parallel connection of the test accompanying modules with small capacity reduces the manufacturing cost of the whole circuit to a certain extent, and because the aging experiment process needs to be continuously carried out, the parallel connection of a plurality of accompanying modules is adopted, and the reliability of the operation of the circuit can also be improved.
The patent relates to a circuit and a method for realizing an aging experiment under the actual load working condition of a three-phase inverter power module, wherein the circuit and the method have the following structures on the power loop level:
1. in fig. 1, T1 is a three-phase voltage regulator, an output voltage range of the three-phase voltage regulator is selected according to a maximum possible range of an alternating voltage of a three-phase inverter power module (hereinafter abbreviated as DUT), T1 is used for adjusting an amplitude of an alternating-current side voltage of the DUT, or when the cost requirement is stricter and the DUT is a single product for a long time, a fixed transformer may be used, UA1 is a voltage sensor on an input voltage side of a three-phase AC380V, a form of measuring a line voltage between two phases in the diagram is shown, and the line voltage between three phases may also be measured at the same time to realize detection of the input voltage, thereby controlling an operation of KP 1. KP1 is a three-phase AC380V input side pre-charging contactor, and KC1 is a three-phase AC input side line contactor. During normal starting, first, KP1 is closed to realize pre-excitation of T1 and other transformers in the circuit, and then, after waiting for a sufficient time (which may be several seconds generally, and is determined by T1 and specific parameters of other transformers in the circuit, and may be given by manufacturers of T1 and other transformers in the circuit), KC1 is closed to cut off pre-excitation pre-charging resistors connected to KP 1. In the figure 1, three pairs of contacts of KP1 are all connected with pre-charging excitation resistors RP 1-3, two pairs of contacts can be selected at will to be connected with the pre-charging excitation resistors, and the pre-charging excitation resistors also have similar pre-excitation effects. In FIG. 1, L1-3 are AC side reactors connected to a module under test (DUT), based on the control of the IGBT module driving pulse in the DUT by the control unit, the AC side voltage of the DUT is controlled, and the amplitude and phase of the AC side current of the DUT are controlled by L1-3. The direct current contactor Kdc1 is connected in parallel with an Rc0 direct current pre-charging resistor, one end of a Kdc1 main contact is connected to a positive electrode P of a direct current bus, when Kdc1 is not closed, direct current voltage of the positive electrode P can be pre-charged to a support capacitor on the direct current side of the DUT through the Rc0, and when Kdc1 is closed, the positive electrode on the direct current side of the DUT is directly connected to the positive electrode P of the direct current bus. The direct current side voltage sensor Udc1 is used for detecting the direct current side voltage of the DUT, one end of the detection end is connected to the positive electrode of the direct current side of the DUT, the other end is connected to the negative electrode of the direct current side of the DUT, the direct current side current sensor Idc1 is used for detecting the direct current value flowing into/out of the DUT, when the system is in emergency shutdown or normal shutdown, the discharge contactor Kd carries out protective discharge through the direct current discharge resistor Rd (the resistance value of the Rd is not recommended to exceed 1k ohm for ensuring the rapidity of the protective discharge), but under the normal working condition, when the circuit runs, the Kd is not closed. The control signal of Kd and the control signal of KC1 are interlocked with each other, when Kd is closed, KC1 is automatically disconnected, and the Rd is selected to be generally only used for supporting the safe discharge of the capacitor, so that the heat capacity is small, and the Rd is prevented from being burnt due to abnormal input.
The circuit is provided with a plurality of test accompanying modules, such as PS1, PS2, PS3, PS4 … … and the like, and the number of groups of the test accompanying modules is determined by the capacity of the DUT and can be freely increased and decreased. The structure of each test accompanying module is completely the same. For example, in the PS1, the primary three phases of the transformer T2 are first tested by connecting to a three-phase bus of an ac ring network, then a group of secondary sides of the transformer T2 are connected to one ends of the L4 to 6, and the other ends of the L4 to 6 are connected to a three-phase bridge arm of the PS 1. PS2, PS3 and PS4 have similar connection methods, and the difference is that two groups of three-phase reactors L4-6 and L7-9 of PS1 and PS2 are respectively connected to two pairs of secondary sides of an auxiliary transformer T2, two groups of three-phase reactors L10-12 and L13-15 of PS3 and PS4 are respectively connected to two pairs of secondary sides of the auxiliary transformer T3, and L4-6, L7-9, L10-12 and L13-15 are all alternating current reactors, and the functions of the reactors are similar to those of L1-3. The auxiliary transformer T2 and T3 have two groups of secondary sides, the effective values of output line voltages of the two groups of secondary sides are the same, delta (delta connection) and star connection are adopted respectively, and then the output line voltages are connected into L4-6, L7-9, L10-12 and L13-15 respectively. The direct current sides of three-phase bridge arms corresponding to PS1, PS2, PS3 and PS4 are respectively connected with supporting capacitor groups such as CM 1-4, CM 5-8, CM 9-12 and CM 13-16, and the series-parallel connection form of capacitors shown by CM 1-4, CM 5-8, CM 9-12 and CM 13-16 is only schematic, and different capacitor nominal voltages, capacitor capacities, capacitor numbers and capacitor connection modes can be flexibly selected according to the voltage level of a DUT. Each capacitor should be connected with a power resistor in parallel, the recommended resistance value is 1 k-100 k ohms, and the power resistor is used for discharging the capacitor under the condition of system outage and equalizing voltage when the capacitors work in series. The aging experiment circuit generally recommends the adoption of a film capacitor, which is mainly because the film capacitor has longer service life than an electrolytic capacitor and is more beneficial to the development of the aging experiment. Other associated capacitors in the circuit are also recommended to use film capacitors rather than electrolytic capacitors, and although this may result in increased circuit cost, it is necessary for aging experiments because the lifetime of the IGBT module is likely to be higher than that of the electrolytic capacitors. The dc-side voltages of PS1 to PS4 are measured by hall-type voltage sensors Udc2, Udc3, Udc4, Udc5, respectively, and the dc-side currents are measured by hall-type current sensors Idc2, Idc3, Idc4, Idc5, respectively.
In fig. 1, GL2, GL3 and GL4 are double-pole double-throw manual isolating switches, and GL2, GL3 and GL4 can realize the manual switching in series and parallel of two test modules connected with the switches, such as PS1 and PS2, PS2 and PS3, and PS3 and PS4, so as to adapt to different voltage levels on the dc side of the DUT. PS, PS can be designed to all support DC voltage range of DC 500-DC 900, when GL, GL is in upper position, the a, b of GL, GL is connected to c, e, i.e. the DC sides of PS, PS are parallel-connected and operated, then the DC voltage between DC buses PN of said circuit is DC 500-DC 900, can support aging test of DUT whose DC nominal voltage is DC750, when GL, GL is in upper position, GL is in lower position, the a, b of GL, GL is connected to c, e, a, b of GL is connected to d, f, i.e. the DC sides of PS, PS are parallel-operated, and after PS is parallel-connected with PS, then the part of PS is parallel-connected with PS is series-operated, then the DC voltage between DC buses PN of said circuit is DC 1000-DC 1800, DC1500 and DC1650, when GL is in upper position, GL, its DC sides are parallel-connected with C, E, then the DC sides of PS are parallel-connected with PS are parallel-operated, then the DC sides of said circuit are parallel-connected with PS, then connected with, With GL4 in the down orientation and GL3 in the up orientation, GL2, GL4 have a, b connected to d, f, GL3 have a, b connected to c, e, that is, the DC sides of PS1 and PS2 are connected in series, the DC sides of PS3 and PS4 are connected in series, and PS1 is connected in series with PS2 and then connected in parallel with the parts of PS3 and PS4, the DC voltage between the DC busses PN of the circuit at this time is DC1000V to DC1800V, can support the aging experiment of the DUT with DC1500V and DC1650V as the DC nominal voltage, when GL2, GL3, GL4 are in the down orientation, a, b of GL2, GL3, GL4 are connected to d, f, that is, the direct current sides of PS1, PS2, PS3 and PS4 are connected in series, so that the direct current voltage between the direct current buses PN of the circuit at this time is DC2000V to DC3600V, the aging test of the DUT with the DC nominal voltage of about DC3200V can be supported, and the related upper position and lower position conversion of GL2, GL3 and GL4 should be carried out under the condition that the circuit is not electrified. Kdc3 and Rc1, Kdc4 and Rc2, Kdc5 and Rc3, and Kdc6 and Rc4 enable dc-side precharging of PS1, PS2, PS3, PS4, respectively.
Note that GL 2-GL 4 are not required. When the DC voltage of the DUT is constant, the DC sides of PS 1-PS 4 can be directly fixed to the corresponding connection modes, and GL 2-GL 4 can be omitted. The number of the test assisting modules is not fixed to 4, and the number of the test assisting modules may be any number according to the magnitude of the dc voltage of the DUT and the magnitude of the dc voltage of a single test assisting module.
2. Fig. 2 is a schematic diagram of another power topology of the circuit. In fig. 2, the voltage level of the dc side of the DUT is low, so the dc side of the test-accompanying module is connected in parallel without using the series operating mode of the rectifier unit. In addition, the test-accompanying transformers T2, T3 and T4 of the test-accompanying module may be in the form of a transformer with a plurality of secondary sides, or may be in the form of a single secondary-side transformer, and fig. 2 is a form of a single secondary-side transformer. The form of adopting single secondary side transformer has the advantages that on one hand, the design of the transformer is more flexible, the single volume and the cost of the transformer are less, and the requirement on an experimental site is lower. One possible alternative to replacing the two secondary side test transformers of fig. 1 with two single secondary side test transformers is shown in fig. 3. In addition, in fig. 1 or fig. 2, the transformer to which the test assistant module is connected may also be a single primary side or a plurality of secondary side test assistant transformers. It should be noted that, no matter whether a single-primary-side multi-secondary-side test-accompanying transformer or a single-primary-side single-secondary-side test-accompanying transformer is adopted, the connection forms of the secondary windings of the test-accompanying transformers can be the same or different, and the implementation given in fig. 1 or fig. 2 is not strictly necessary.
A plurality of single-secondary-side test accompanying transformers can also be replaced by a single-primary-side multi-secondary-side test accompanying transformer in a unified mode, so that the circuit complexity is reduced. After the test-accompanying transformer with single primary side and multiple secondary sides is adopted, the circuit structure is shown in fig. 4.
In addition, in order to enable the circuit to support a higher voltage on the dc side of the DUT, fig. 1 takes the form of a circuit with two accompanying modules connected in series in a three-phase bridge topology. In addition, a three-level or even more circuit topology may be used to achieve a higher DUT DC voltage, an alternative approach is shown in FIG. 5. In fig. 5, a circuit topology in the companion module is implemented using an NPC (diode clamped) three-level topology. The test-assistant module circuit realized by adopting the topologies is also in the protection scope of the patent.
Meanwhile, there is a mature technology, each three-phase ac reactor in the circuit is made into a transformer in front of each three-phase ac reactor in a form of increasing secondary side inductance, T2, T3, and T4 in fig. 2 adopt the form of the transformer, and a system circuit topology designed by adopting the method is also in the protection scope of the patent.
3. Method for determining relevant electric quantity value range in system
In the context of figure 6, it is shown,
Figure BDA0002579334670000151
outputs a vector, U, corresponding to the three-phase AC voltage for the secondary side of T1T1For the corresponding peak value of the line voltage,
Figure BDA0002579334670000152
for vectors corresponding to the three-phase AC voltage at the AC side of the DUT, UDUTFor the corresponding peak value of the line voltage,
Figure BDA0002579334670000153
vector corresponding to three-phase alternating current at alternating side of DUTDUTIs the corresponding line current peak value, j omega L is the complex impedance corresponding to L1-3, j is the imaginary exponential unit, omega is the angular frequency of the DUT alternating side voltage, the angular frequency is 100 pi corresponding to 50Hz, L is the inductance corresponding to L1-3, IdIs the active component of the three-phase AC current at the AC side of the DUTqIs the reactive component of the three-phase ac current on the ac side of the DUT. If orderIDUTmaxIs the maximum value of the AC side line current amplitude, PF, of the DUT in the aging experiment process1For the AC network side power factor, PF, to be realized in the DUT aging experiment process2The power factor of the AC valve side required to be realized in the DUT aging experiment process is specified by a user, and PF1And PF2Are all numbers between-1 and 1,
Figure BDA0002579334670000157
is composed of
Figure BDA0002579334670000155
And
Figure BDA0002579334670000156
an included angle; PF (particle Filter)2＝cosφ，φ＝arccos(PF1) Phi is
Figure BDA0002579334670000159
And
Figure BDA0002579334670000158
the included angle of (a).
3.1T 1 output voltage value taking method and DUT alternating current side current value taking range calculation method
Although the following method is illustrated with a constant voltage and frequency (50Hz), it should be noted that the related values are also applicable to other modes. DUT required AC side voltage UT1The calculation method is as follows: u shapeT1Should be at UT1min<UT1<UT1maxA medium value, wherein UT1minCan be 0.5-0.8UT1maxOr selected by the user according to the capacity of T1, wherein
3.1.1 when the AC network side power factor is specified
Figure BDA0002579334670000161
Time of flight
① when
Figure BDA0002579334670000162
And
Figure BDA0002579334670000163
angle of (2)
Figure BDA0002579334670000164
Is taken as
Figure BDA0002579334670000165
While, UT1maxThe calculation is performed according to equation (1), as shown in fig. 7:
Figure BDA0002579334670000166
② when
Figure BDA0002579334670000167
And
Figure BDA0002579334670000168
the included angle phi is less than or equal to 90 DEG<At 180 deg., UT1maxThe calculation is performed according to equation (2), as shown in FIG. 8
Figure BDA0002579334670000169
③ when
Figure BDA00025793346700001610
And
Figure BDA00025793346700001611
angle of (2)
Figure BDA00025793346700001612
Is taken as
Figure BDA00025793346700001613
While, UT1maxThe calculation is performed according to equation (3), as shown in FIG. 9
Figure BDA00025793346700001614
④ when
Figure BDA00025793346700001615
And
Figure BDA00025793346700001616
angle of (2)
Figure BDA00025793346700001617
Is taken as
Figure BDA00025793346700001618
While, UT1maxThe calculation was performed according to equation (4), as shown in FIG. 10
Figure BDA00025793346700001619
3.1.2 when the AC valve side power factor PF is specified2(cos phi) time
① when
Figure BDA00025793346700001620
And
Figure BDA00025793346700001621
the included angle phi is not less than 0 phi<At 90 deg., UT1maxThe calculation is performed according to equation (5), as shown in fig. 11:
Figure BDA00025793346700001622
② when
Figure BDA00025793346700001623
And
Figure BDA00025793346700001624
the included angle phi is less than or equal to 90 DEG<At 180 deg., UT1maxThe calculation is performed according to equation (6), as shown in FIG. 12
Figure BDA00025793346700001625
③ when
Figure BDA0002579334670000171
And
Figure BDA0002579334670000172
the included angle phi is less than or equal to 180 DEG<At 270 deg., UT1maxThe calculation was performed according to equation (7), as shown in FIG. 13
Figure BDA0002579334670000173
④ when
Figure BDA0002579334670000174
And
Figure BDA0002579334670000175
the included angle phi is less than or equal to 270 DEG<At 360 deg., UT1maxThe calculation is performed according to equation (8), as shown in FIG. 14
Figure BDA0002579334670000176
In the formulae (1) to (8), UDUTmaxAnd IDUTmaxThe value of (A) is required to satisfy the following relationship
① if the maximum AC side active capacity and power factor of DUT that the aging experiment needs to realize are given in advance, P is usedDUTmaxRepresenting the maximum ac side active capacity that the burn-in test of the DUT needs to achieve, the following relationship exists:
Figure BDA0002579334670000177
② if the DUT maximum AC side capacity that the aging experiment needs to realize is given in advance, it is SDUTmaxRepresenting the maximum ac side capacity that the DUT's burn-in test needs to achieve, the following relationship exists:
Figure BDA0002579334670000178
③ should satisfy
Figure BDA0002579334670000179
Usually UDUTmaxCan take the value of
Figure BDA00025793346700001710
Or taking into account a reliability factor K, 0<K<1 is taken as
Figure BDA00025793346700001711
Wherein U isdc1For the DC side voltage of the DUT, I is determined by equations (9) to (11)DUTmaxThe value of (a).
3.2 method for calculating value range of Direct Current (DC) side current required by DUT (device under test)
DC side voltage U required by DUTdc1The constant value can be maintained during burn-in, as determined by the operational parameters of the DUT itself. In determining UDUTmax、UT1、IDUTmaxThen, the DC current I for DUT aging experimentdc_DUTMaximum value of (1)dc_DUTmaxCan be calculated from equation (8):
Figure BDA0002579334670000181
4. normal operation of the circuit
In the starting and normal processes, the following action processes are carried out:
the output voltage of the T1 is adjusted to the AC side voltage required by the DUT (the calculation method of the output voltage of the T1 is described later), KP1 is turned off, KC1 is turned off, Kdc1 is turned off, Kd is turned off, all DC side switches of the test-accompanying module are turned off, 6 paths of IGBT driving pulses of the DUT are blocked, and 6 paths of IGBT driving pulses of the test-accompanying module are blocked.
→ start of ac side pre-excitation (KP1 closed);
→ after waiting for a certain time (the resistance value of RP 1-3 and the total amount of the DC-side support capacitance of each test-accompanying module and DUT are selected, at least the DC-side support capacitance of each test-accompanying module and DUT is charged to more than 80% of the DC voltage required by the DUT in the time), KC1 is closed, and KP1 is opened after 1s (can be specified by a user);
→ Kdc1 is closed, the dc side switches of the attendant module are all closed;
determining the switching frequency of a power switching device in the DUT according to the working characteristics of the DUT, and carrying out voltage closed-loop control on the DUT by the designation of a user, wherein the sampling point of a voltage ring is the voltage of an output end line of T1 or the voltage of a UAC bus, and the given value of the voltage ring is the AC side line voltage amplitude U actually required in the DUT aging test processndThe frequency of the alternating current side of the DUT is set according to the actual requirement of the DUT aging test, the accompanying modules such as PS 1-PS 4 adopt a single current loop control mode, the current loops are divided into an active current loop and a reactive current loop, the given values of the two current loops are determined according to the number of the accompanying modules and the alternating current requirement of the DUT aging test, and if the amplitude of the alternating current requirement is IndThe power factor requirement is PF3(taking the network side power factor as an example), the given value of the active current loop of each test assistant module is
Figure BDA0002579334670000191
Wherein N is the number of the test accompanying modules, and the given value of the reactive current loop of each test accompanying module is
Figure BDA0002579334670000192
Wherein N is the number of the accompanying modules. Taking the circuit in fig. 1 as an example, when the network side power factor requirement is 1, the given value of the active current loop of each test-assistant module is
Figure BDA0002579334670000193
The given value of the reactive current loop of each test assistant module is 0. The feedback values of the active current loop and the reactive current loop are the active current component and the reactive current component of the line current of the three-phase alternating current reactor connected in front of the three-phase bridge arm in each test accompanying module, and in the process of obtaining the active current component and the reactive current component, the conversion angle required by PARK and inverse PARK conversion is taken as the PA of the DUT voltage loopAnd the RK and the PARK are converted into required conversion angles, namely instantaneous values of space rotation vector electrical angles of three-phase voltages at sampling points of the UAC.
5. Normal operation of circuit in abnormal condition
The circuit of fig. 1, in an abnormal situation (when an overcurrent, overvoltage, or short-circuit fault occurs inside), operates according to the following operation procedure:
KP1 is disconnected, KC1 is disconnected, Kdc1 is disconnected, Kd is disconnected, all direct-current side switches of the test accompanying module are disconnected, 6 paths of IGBT driving pulses of a DUT are blocked, and 6 paths of IGBT driving pulses of the test accompanying module are blocked;
closed → Kd, emergency discharge;
on the other hand, when the dc voltages detected by the hall type voltage sensors are all lower than 30V (user-specifiable), Kd is off.
6. DUT aging experiment process based on circuit
The DUT aging experiment process based on the circuit is as follows:
① determining PF according to the load condition of DUT1Or PF2Determining Und、IndNote that, in general, IndMay not be constant but vary with time, IndThe value of (b) or the time-varying law may be given by the user;
② determining U based on DUT performance and usage requirementsdc1Determining UT1And IDUTmaxThen, the number of the test assisting modules is determined according to the DC voltage of each test assisting module, and when a disconnecting switch similar to GL 2-GL 4 in FIG. 1 is used, the position of the disconnecting switch is determined according to the DC voltage of each test assisting module and Udc1The voltage level of (3), manually switching;
thirdly, the DUT or the device to be tested containing the DUT is accessed into the circuit according to the figure 1 and the figure 2 or other possible composition modes of the circuit on the premise of ensuring the actual use conditions (heat dissipation conditions, ventilation air ducts and physical installation conditions) of the DUT as much as possible;
fourthly, the control circuit enters a corresponding normal working mode to carry out an aging experiment of the components in the DUT;
testing the aging level of the components in the DUT by the existing mature technology means in the aging experiment process, and obtaining a complete aging rule of the components according to the aging life end condition specified by the user (the aging rule can be the correlation between the aging characteristic parameters and the working time, the working process, the load working condition, the external condition and the like, and the specific condition is specified by the user).
1. The circuit can simulate the AC side voltage characteristic of a DUT (device under test) by controlling the DUT, can simulate the AC side fundamental wave current characteristic of the DUT by combining an AC reactor with a test accompanying module, and can realize the simulation of the AC side voltage characteristic and the AC fundamental wave current characteristic of the DUT under any actual load working condition;
2. the circuit can realize the aging experiment of a DUT with higher capacity by a plurality of test accompanying modules which are connected in series and in parallel and adopting a test accompanying module with lower capacity, and the circuit supports wide range of internal direct-current voltage and is flexible to use;
3. according to the circuit disclosed by the patent, although the electric power of the DUT aging experiment can be higher, the electric energy mainly circulates between the DUT and the test accompanying module, and the energy requirement of the external power supply is lower in a dragging mode, so that the aging experiment of the DUT with higher electric power can be realized under the condition of lower external electric power requirement. The aging test method for the twin-drag is the protection point of the patent. In this patent, the opposite dragging is mainly achieved by the ac side power supply.
4. The circuit structure of the circuit, the related design method and the control method are protection points of the patent.
The above embodiments are merely illustrative, and not restrictive, and those skilled in the relevant art can make various changes and modifications without departing from the spirit and scope of the invention, and therefore all equivalent technical solutions also belong to the scope of the invention.
Those not described in detail in this specification are within the skill of the art.

Claims (10)

1. A circuit for realizing aging experiments of a three-phase inverter power module is characterized by comprising: the device comprises a voltage sensor UA1 on a three-phase alternating current input side, current sensors LA 1-3 on the three-phase alternating current input side, a three-phase alternating current input side pre-charging contactor KP1, a three-phase alternating current input side line contactor KC1, a three-phase voltage regulator T1, alternating current side reactors L1-3, a direct current contactor Kdc1, a direct current pre-charging resistor Rc0, a direct current discharging resistor Rd, a discharging contactor Kd, a direct current side voltage sensor Udc1, a direct current side current sensor Idc1, a plurality of test-accompanying transformers and a plurality of test-accompanying modules;
three pairs of contacts of a three-phase alternating current input side pre-charging contactor KP1 are connected with pre-charging excitation resistors RP 1-3, or two pairs of contacts are selected randomly to be connected with the pre-charging excitation resistors; the alternating-current side reactors L1-3 are used for controlling the amplitude and the phase of alternating-current side current of the three-phase inverter power module; the three-phase voltage regulator T1 is used for adjusting the amplitude of the alternating-current side voltage of the three-phase inverter power module;
a voltage sensor UA1 at the three-phase alternating current input side and current sensors LA 1-3 at the three-phase alternating current input side are arranged at the three-phase alternating current input end; the three-phase alternating current input side pre-charging contactor KP1 and the three-phase alternating current input side line contactor KC1 are installed between current sensors LA 1-3 of the three-phase alternating current input side and the input side of a three-phase voltage regulator T1, and the output side of the three-phase voltage regulator T1 is connected with the input sides of alternating current side reactors L1-3 and the primary sides of a plurality of test-accompanying transformers respectively;
the output sides of the alternating-current side reactors L1-3 are connected with the alternating-current side of the three-phase inverter power module, the direct-current side positive electrode of the three-phase inverter power module is connected to the positive electrode P of the direct-current bus through a direct-current contactor Kdc1 and a direct-current side current sensor Idc1, and the direct-current side negative electrode of the three-phase inverter power module is connected to the negative electrode N of the direct-current bus; a direct current pre-charging resistor Rc0 is connected in parallel to the direct current contactor Kdc 1; the direct-current side voltage sensor Udc1 is used for detecting the direct-current side voltage of the three-phase inverter power module, one end of the detection end is connected to the direct-current side anode of the three-phase inverter power module, and the other end is connected to the direct-current side cathode of the three-phase inverter power module; the discharging contactor Kd is connected with the direct current discharging resistor Rd in series, one end of the direct current discharging resistor Rd after the series connection is connected with the other end of the direct current side voltage sensor Udc1 and the direct current side negative electrode of the three-phase inverter power module respectively, and one end of the discharging contactor Kd is connected with the direct current side current sensor Idc1 and the positive electrode P of the direct current bus respectively;
each group of secondary sides of the accompanying transformer corresponds to an accompanying module; each group of secondary sides of the accompanying transformer is connected to one end of an alternating current reactor, and the other end of the alternating current reactor is connected to the alternating current side of a three-phase bridge arm of the accompanying module; the direct-current side of a three-phase bridge arm of the accompanying and testing module is connected into a supporting capacitor bank, and each capacitor in the supporting capacitor bank is connected with a power resistor in parallel;
the voltage of the direct current side of each test accompanying module is measured by a Hall type voltage sensor, and the current of the direct current side is measured by a Hall type current sensor; the positive electrode of the direct current side of the test accompanying module is connected to the positive electrode P of the direct current bus through a Hall type current sensor, and the negative electrode of the direct current side of the test accompanying module is connected to the negative electrode N of the direct current bus; and a direct current side switch is arranged between the test accompanying module and the Hall type current sensor, and each direct current side switch is connected with a resistor in parallel.
2. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein: the test-accompanying transformer is a single-primary-side single-secondary-side test-accompanying transformer or a single-primary-side multi-secondary-side test-accompanying transformer; the output line voltages of each group of secondary sides of the single-primary-side multi-secondary-side accompanying transformer have the same effective value and adopt a delta or star connection method.
3. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 2, wherein: when the transformer has two sets of secondary sides, the two sets of secondary sides adopt delta and star connection respectively.
4. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein: the accompanying module is in a circuit form of connecting two three-phase bridge topologies in series or in a multi-level circuit topology form.
5. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein: when the number of the test accompanying modules is larger than or equal to 2, a double-pole double-throw manual isolating switch is arranged between each two adjacent test accompanying modules and the direct-current bus so as to realize the manual switching of the series connection and parallel connection of the test accompanying modules.
6. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein: the resistance value of the direct current discharge resistor Rd is not more than 1K omega; the resistance value of the power resistor is 1-100K omega.
7. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein: the capacitor of the support capacitor bank adopts a film capacitor; the nominal voltage of the capacitors supporting the capacitor bank, the capacitor capacity, the number of capacitors and the connection mode of the capacitors are selected according to the voltage level of the three-phase inverter power module.
8. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein the circuit for implementing the aging test of the three-phase inverter power module is implemented during the starting and normal operation according to the following procedures:
adjusting the output voltage of T1 to the AC side voltage required by the DUT, switching off KP1, KC1, Kdc1 and Kd, switching off the DC side switches of the test accompanying module, blocking 6 paths of IGBT driving pulses of the DUT, and blocking 6 paths of IGBT driving pulses of the test accompanying module;
KP1 is closed, and AC side pre-excitation is started;
after waiting for a certain time, KC1 is closed, and KP1 is opened after 1 s;
kdc1 is closed, and all the direct current side switches of the test accompanying modules are closed;
the switching frequency of the power switching device in the DUT is determined based on the operating characteristics of the DUT, and is specified by the user for voltage closed-loop control of the DUTThe sampling point of the voltage ring is the voltage of an output end line of T1 or the voltage of a UAC bus, and the given value of the voltage ring is the AC side line voltage amplitude U actually required in the DUT aging test processndThe frequency of the alternating current side of the DUT is also set according to the actual requirement of the DUT aging test;
the test accompanying module adopts a single current loop control mode, the current loops are divided into an active current loop and a reactive current loop, the given values of the two current loops are determined according to the number of the test accompanying modules and the alternating current requirement of the DUT aging experiment, and if the amplitude of the alternating current requirement is IndThe grid side power factor requirement is PF3The given value of the active current loop of each test-accompanying module is
Figure FDA0002579334660000042
Wherein N is the number of the test accompanying modules, and the given value of the reactive current loop of each test accompanying module is
Figure FDA0002579334660000041
When the network side power factor requirement is 1, the given value of the active current loop of each test assisting module is
Figure FDA0002579334660000043
The given value of the reactive current loop of each test assistant module is 0; the feedback values of the active current loop and the reactive current loop are the active current component and the reactive current component of the line current of the three-phase alternating current reactor connected in front of the three-phase bridge arm in each test accompanying module, and in the process of obtaining the active current component and the reactive current component, the conversion angle required by the PARK and inverse PARK conversion is taken as the conversion angle required by the PARK and inverse PARK conversion of the DUT voltage loop.
9. The circuit for implementing the aging test of the three-phase inverter power module as claimed in claim 1, wherein the circuit for implementing the aging test of the three-phase inverter power module is implemented according to the following procedures in case of an abnormal condition:
KP1 is disconnected, KC1 is disconnected, Kdc1 is disconnected, Kd is disconnected, all direct-current side switches of the test accompanying module are disconnected, 6 paths of IGBT driving pulses of a DUT are blocked, and 6 paths of IGBT driving pulses of the test accompanying module are blocked;
kd is closed, and emergency discharge is carried out;
and when the direct current voltage detected by the Hall voltage sensor is lower than 30V, Kd is disconnected.
10. A DUT aging test method based on the circuit for implementing an aging test of a three-phase inverter power module according to any one of claims 1 to 9, comprising the steps of:
① determining PF according to the load condition of DUT1Or PF2Determining Und、IndIt is to be noted thatndNot constant but varying with time, IndThe value of (A) or the time-varying rule is given by the user; PF (particle Filter)1For ac network side power factor, PF2Is a power factor of the AC valve side, UndThe actual required AC lateral line voltage amplitude, I, in the DUT aging test processndThe amplitude of the alternating current side is actually required in the DUT aging test process;
② determining U based on DUT performance and usage requirementsdc1Determining UT1And IDUTmaxThen, the number of the test assisting modules is determined according to the direct-current voltage of each test assisting module, and when the double-pole double-throw manual isolating switch is used, the position of the double-pole double-throw manual isolating switch is determined according to the direct-current voltage of each test assisting module and the Udc1The voltage level of (3), manually switching; u shapedc1Is the DC side voltage of the DUT, UT1AC side voltage required for DUTDUTmaxThe maximum value of the AC side line current amplitude of the DUT in the aging experiment process;
accessing a DUT or a device to be tested containing the DUT into the circuit on the premise of ensuring the actual use condition of the DUT as much as possible;
fourthly, the control circuit enters a corresponding normal working mode to carry out an aging experiment of the components in the DUT;
testing the aging level of the components in the DUT by the prior art means in the aging experiment process, and obtaining a complete aging rule of the components according to the aging life end condition specified by a user.
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