CN111781423A - On-line resistance value detection circuit and detection method based on conduction test board - Google Patents

On-line resistance value detection circuit and detection method based on conduction test board Download PDF

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CN111781423A
CN111781423A CN202010622845.XA CN202010622845A CN111781423A CN 111781423 A CN111781423 A CN 111781423A CN 202010622845 A CN202010622845 A CN 202010622845A CN 111781423 A CN111781423 A CN 111781423A
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circuit
resistor
resistance
voltage
measured
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CN111781423B (en
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张婉如
刘苏苏
陈厚军
瞿畅
张小萍
张平
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Nantong University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

Abstract

The invention discloses an on-line resistance value detection circuit and a detection method based on a conduction test board, which comprises a measured wire beam spot, a harness resistance value measurement circuit, a double N-type channel AO6800, an upper computer, an HC595 circuit, a 5V power supply and GND, wherein the harness resistance value measurement circuit consists of an STM32 microcontroller, a detection circuit, a voltage acquisition circuit, a serial/parallel port and a parallel/serial port conversion circuit, the measured wire beam spot is completely connected into the detection circuit, the positive and negative ends REF + and REF-of reference voltage of the voltage acquisition circuit are respectively connected into the 5V power supply and the GND, voltage data acquired by the voltage acquisition circuit is transmitted into the STM32 microcontroller for processing and conversion, and the acquired voltage value is transmitted into the upper computer through a serial port. The invention solves the problem that the conduction test bench can not simultaneously measure the conduction test and the resistance test of the wire harness, and avoids the problem of increased detection cost and detection time caused by the increase of detection stations.

Description

On-line resistance value detection circuit and detection method based on conduction test board
Technical Field
The invention relates to the technical field of automotive electronics detection, in particular to an on-line resistance value detection circuit and a detection method based on a conduction test board.
Background
With the rapid development of information technology and the improvement of the living standard of people, people put higher requirements on the safety, comfort and diversified functions of automobiles, which also leads to the more diversification of electronic equipment carried by automobiles. Automotive wiring harnesses are becoming increasingly complex as carriers for interconnecting electronic devices. In order to ensure the safety and reliability of the production of the wire harness, the quality detection of a wire harness manufacturer is the precondition of leaving the factory.
The resistance value parameter of the wire harness is an important index for detecting the quality of the wire harness, and the failure of accurately measuring the resistance value is very easy to bury hidden danger for safe driving of an automobile, thereby causing serious tragedies which may cause car damage and death.
The traditional detection method for automobile wire harness manufacturers is that detection tools such as a multimeter and a buzzer are used for detecting the lap-joint resistance on the wire harness one by one in a manual point-overlapping mode, and the detection method is time-consuming, labor-consuming and extremely low in reliability. Under the condition that the production of the wire harness is increasingly complicated, the detection method is easy to cause the missing detection of the resistor. The conventional automobile wiring harness conduction test board mainly detects whether the wiring harness has faults such as short circuit, open circuit and dislocation, and a small number of test boards can detect whether the resistance of the wiring harness exists or not and cannot accurately measure the resistance value of the wiring harness.
Disclosure of Invention
The invention aims to provide a circuit and a method for detecting the resistance value of an on-line resistor based on a conduction test board, so as to solve the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme: an on-line resistance value detection circuit based on a conduction test board comprises a measured wire beam spot, a wire harness resistance value measurement circuit, a double N-type channel AO6800, an upper computer, an HC595 circuit, a 5V power supply and GND, wherein the wire harness resistance value measurement circuit consists of an STM32 microcontroller, a detection circuit, a voltage acquisition circuit, a serial/parallel port and a parallel/serial port conversion circuit, the measured wire beam spot is connected into the detection circuit, the measured wire beam spot is connected with a source level OUT1, an OUT2 and an STM … … OUTN where the double N-type channel AO6800 is located, the STM32 microcontroller processes serial port information sent by the upper computer, drives the HC595 circuit to supply power to grid electrodes IN1, IN2 and … … INn of the positive and negative wire beam spots where resistors are located, a reference voltage REF end + and a REF-GND end of the voltage acquisition circuit are respectively connected into the 5V power supply and the GND, voltage data acquired by the voltage acquisition circuit are transmitted to the STM32 microcontroller for processing and, the conversion formula of the voltage data is as follows:
Figure BDA0002563775520000021
wherein DOUTFor collected voltage data, VOUTAnd the acquired voltage value is transmitted to an upper computer through a serial port for the converted voltage value.
Preferably, the voltage acquisition circuit is constituted by TLC1543, said voltage acquisition circuit comprising 11 acquisition channels for acquiring a plurality of OUT points.
Preferably, TLC1543 is 10 bit resolution and 10us conversion time.
Preferably, the position of the resistance on the measured wire beam spot is located in a wire harness branch or a wire harness trunk, the resistance on the wire harness branch is the wire harness branch resistance, and the resistance on the wire harness trunk is the wire harness trunk resistance.
Preferably, the branch resistance of the wire harness consists of a trunk circuit, a branch circuit and a resistance R to be measuredXComposition of resistance R to be measuredXThe wire harness branch is positioned in the wire harness branch, is connected with the wire harness resistance value measuring circuit, and removes the resistor R to be measuredXBesides, the rest reference resistors are all 1k omega, the upper computer obtains the actual physical addresses 0001(OUT1), 0002(OUT2) and 0003(OUT3) … … of each wire harness through the serial port, and the resistors R to be detected are searched by using a breadth-first algorithmXSelecting a minimum physical address 0001 from the left physical address set, wherein a unique physical address 0007 exists on the right side of the branch resistor of the wiring harness;
the upper computer issues the physical addresses (0001 and 0007) on the left side and the right side to an STM32 microcontroller, the STM32 microcontroller supplies power to a 0001(OUT1) line beam spot, and the voltage acquisition circuit is used for acquiring the voltage value V of the physical addresses (0001 and 0007)OUT1And VOUT7Resistance R to be measuredXThe resistance value of (a) is obtained from ohm's law, and the formula is as follows:
Figure BDA0002563775520000031
wherein VOUT1Is the voltage value of physical address 0001, VOUT7Is the voltage value of the physical address 0007, R7Is a reference resistance value.
Preferably, the wire harness trunk circuit resistor comprises a trunk circuit, a branch circuit and a resistor R to be testedXComposition of resistance R to be measuredXThe main line of the wire harness is connected with a resistance value measuring circuit of the wire harness resistor, and when the resistor R to be measuredXWhen the device is positioned in the trunk line of the wire harness, the upper computer will test the resistance RXThe left physical address is issued to the STM32 microcontroller, the STM32 microcontroller obtains all voltage values of 0001(OUT1) -0007 (OUT7), the voltage values of 0002-0006 are the same, and the resistor R to be tested has the same voltage valueXThe number N of right side lapping points is 6, and the resistance R to be measuredXThe resistance values were measured as follows:
Figure BDA0002563775520000032
the method for detecting the resistance value of the on-line resistor based on the conduction test board adopts an on-line resistor resistance detection circuit based on the conduction test board, and comprises the following steps of:
step 1: all the measured wire beam spots are connected into a wire harness resistance value measuring circuit;
step 2: connecting the measured line beam spot with source levels OUT1, OUT2 and … … OUTN of the double N-type channel AO 6800;
and step 3: the STM32 microcontroller drives the HC595 circuit to supply power to the gates IN1, IN2 and … … INn of the AO6800 of the test point at which the resistor is located by processing the relevant serial port information such as the resistor relevant test point number, the resistor resistance value and the like sent by the upper computer;
and 4, step 4: connecting positive and negative ends REF + and REF-of a reference voltage of a wire harness resistance value measuring circuit to a 5V power supply and a GND respectively to meet voltage acquisition requirements;
and 5: the collected voltage data is transmitted to an STM32 microcontroller for processing and conversion;
step 6: the converted voltage value is transmitted to an upper computer through a serial port;
and 7: the upper computer sends the physical address of the resistor to be tested to an STM32 microcontroller;
and 8: the STM32 microcontroller supplies power to the line beam spot where the resistance to be measured is located, and acquires the voltage value of the physical address by using the voltage acquisition circuit;
step 9: calculating the resistance value of the measured resistor based on the ohm law according to the measured voltage value and the measured voltage difference;
step 10: and the upper computer displays the calculated resistance value of the resistor on a screen in real time.
Compared with the prior art, the invention has the beneficial effects that:
(1) the invention realizes the function of simultaneously detecting the conduction of the wire harness and the resistance on line, avoids secondary detection, improves the detection efficiency, and solves the problems of time and labor consumption, low reliability, high false detection rate and the like caused by the traditional manual detection of the resistance of the wire harness.
(2) The method is simple and easy to understand, and solves the problem that the traditional manual detection has high requirements on professional quality of detection personnel.
(3) The invention solves the problem that the existing automobile wire harness conduction test bench can only test whether the resistor exists or not and cannot accurately measure the resistance value of the resistor.
(4) The invention solves the problem of narrow resistance value measuring range and low measuring precision.
(5) The invention solves the problem that the conduction test bench can not simultaneously measure the conduction test and the resistance test of the wire harness, and avoids the problem of increased detection cost and detection time caused by the increase of detection stations.
(6) In the testing process, the resistance value of the tested resistor can be displayed in real time in the software of the upper computer, so that the resistance value testing device is convenient to observe and is visual.
(7) The invention effectively solves the problem that when the number of the wiring harness lap points of the resistor is too large, workers cannot simultaneously put the sheaths of the complex wiring harnesses into the conduction test bench in the detection process, and the resistance value of the resistor to be detected is influenced.
(8) The resistance testing range is (10 omega, 5K omega), the resistance testing range is very wide, and the resistance error rate of the resistance detection is within +/-3%, so that the resistance testing method meets the detection standard.
Drawings
FIG. 1 is a schematic diagram of an electrical resistance measurement circuit;
FIG. 2 is a schematic diagram of a harness branch resistance;
fig. 3 is a schematic diagram of the trunk resistance of the wiring harness.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention provides a technical scheme that: the wiring harness resistance value is measured by taking a common conduction test table of a wiring harness manufacturer as a platform, supplying 5V voltage to a single wire in turn and then detecting the voltage of the rest wires, and calculating the measured resistance value by measuring the measured differential pressure based on the ohm law.
As shown in fig. 1, the wiring harness resistance value measuring circuit is composed of an STM32 microcontroller, a detection circuit, a voltage acquisition circuit, a serial/parallel port and a parallel/serial port conversion circuit. The measured beam spots are all connected to the measuring circuit, namely, the source levels OUT1, OUT2 and … … OUTN on which the double N-type channel AO6800 is located. The STM32 microcontroller drives the HC595 circuit to supply power to the gates IN1, IN2 and … … INn of the AO6800 of the test point at which the resistor is located by processing the relevant serial port information such as the resistor relevant test point number, the resistor resistance value and the like sent by the upper computer. According to the operating principle of the MOS transistor switching circuit, when the gate voltage > the drain voltage, the MOS transistor is turned on, and the source OUT outputs the drain voltage. The voltage acquisition circuit in the measurement circuit consists of TLC1543, which contains 11 acquisition channels that can acquire multiple OUT points. As the voltage to be acquired is less than 5V, the positive and negative ends REF + and REF-of the reference voltage of the chip are respectively connected to a 5V power supply and GND so as to meet the voltage acquisition requirement. The TLC1543 has the characteristics of high precision (10-bit resolution) and high speed (10us conversion time), and is an important guarantee for the precision of the resistance value of the measured resistor. The collected voltage data is transmitted to an STM32 microcontroller by DOUT for processing and conversion, and the voltage conversion formula is as follows:
Figure BDA0002563775520000061
the collected voltage value is transmitted to an upper computer through a serial port.
The position of the resistor on the wire harness is generally divided into two cases: branch resistance and trunk resistance as shown in fig. 2 and 3. For both cases, separate discussion and calculation is required.
As shown in fig. 2, (a) is a wiring harness branch resistance topological diagram, (b) is a wiring harness branch resistance equivalent circuit diagram, and the wiring harness branch resistance diagram shown in (a) is composed of trunk circuits, branch circuits and resistors to be tested RXThe three parts are as follows. Resistance R to be measuredXThe branch part of the wire harness resistor is connected into the measuring circuit shown in figure 1, and the equivalent circuit is shown in figure 2 (b).
Wherein except the resistor R to be measuredXBesides, all the other reference resistances are 1k Ω. The upper computer obtains the actual physical addresses 0001(OUT1), 0002(OUT2) and 0003(OUT3) … … of each wiring harness through a serial port, then searches the left physical address set of the resistor to be tested by using a breadth-first algorithm and selects the minimum physical address 0001, and only the unique physical address 0007 exists on the right side of the branch resistor of the wiring harness all the time. The upper computer issues physical addresses (0001, 0007) on the left side and the right side to an STM32 microcontroller, the STM32 microcontroller supplies power to 0001(OUT1) line beam spot, and a voltage acquisition circuit is used for acquiring a voltage value V of the physical addressesOUT1And VOUT7. Resistance RXThe resistance values can be obtained from ohm's law as follows:
Figure BDA0002563775520000062
R7is a reference resistance value.
As shown in FIG. 3, (a) is a wiring harness trunk resistance topological graph, and (b) is a wiring harness trunk resistance equivalent circuitThe schematic diagram of the resistance of the trunk circuit of the wiring harness shown in (a) comprises a trunk circuit, branch circuits and a resistance R to be measuredXThe three parts are as follows. Resistance R to be measuredXAnd (b) the main circuit part of the wire harness resistor is connected into the measuring circuit shown in fig. 1, and the equivalent circuit of the main circuit part is shown in fig. 3 (b). When the resistor to be tested is located in the trunk circuit of the wire harness, the upper computer only sends the physical address of the left side of the resistor to be tested to the STM32 microcontroller. The STM32 microcontroller needs to obtain all voltage values from 0001(OUT1) to 0007(OUT7), ideally, the voltage values from 0002 to 0006 are the same, the number N of right-side lapping points of the resistor to be tested is 6, and the resistor to be tested R isXThe resistance values were measured as follows:
Figure BDA0002563775520000071
if the resistance to be measured is 120 omega, the lower computer returns to VOUT1(5.00)，VOUT2(2.90)，VOUT3(2.91)，VOUT4(2.89)，VOUT5(2.90)，VOUT6(2.90)，VOUT7(2.90), the measured resistance 120.68 Ω was obtained by substituting the data into the equation, with an error in the range of 1%.
However, this measurement formula is realized under the ideal condition that the measured wire harness is simultaneously connected to the conduction test bench, and in actual use, a worker cannot simultaneously put the sheaths of the complex wire harnesses into the conduction test bench, and the voltage value of the non-inserted wire harness is 0.00V. Therefore, the number N of right-side grounding points of the resistor is not determined by theory but determined by the actual return value of the lower computer. E.g. if the lower computer returns to VOUT1(5.00)，VOUT2(3.67)，VOUT3(3.67)，VOUT4(3.67)，VOUT5(0.00)，VOUT6(0.00)，VOUT7(0.00), the number of the overlap points is known from data, N is 3, and the overlap points are substituted into the formula (3), so that the resistance to be measured is 120.79 omega, and the error is within the range of 1%. The detection method avoids the problem that the resistors cannot be measured because the number of the resistor overlapping points is too large and the resistors cannot be simultaneously inserted into the sheath.
The upper computer displays the calculated resistance on a screen in real time, and the image is visual.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (7)

1. The utility model provides a based on switch on testboard on-line resistance detection circuitry which characterized in that: comprises a measured wire beam spot, a wire harness resistance value measuring circuit, a double N-type channel AO6800, an upper computer, an HC595 circuit, a 5V power supply and GND, the wiring harness resistance value measuring circuit consists of an STM32 microcontroller, a detection circuit, a voltage acquisition circuit, a serial/parallel port and a parallel/serial port conversion circuit, all measured wire beam spots are connected into the detection circuit, the measured beam spot is connected with the source levels OUT1, OUT2, … … OUTN on which the double N-type channel AO6800 is located, the STM32 microcontroller drives the HC595 circuit to supply power to the grid electrodes IN1, IN2 and … … INn of the AO6800 of the measured line spot where the resistor is located by processing serial port information sent by the upper computer, the positive and negative ends REF + and REF-of the reference voltage of the voltage acquisition circuit are respectively connected to a 5V power supply and a GND, voltage data acquired by the voltage acquisition circuit are transmitted to the STM32 microcontroller for processing and conversion, and the conversion formula of the voltage data is as follows:
Figure FDA0002563775510000011
wherein DOUTFor collected voltage data, VOUTAnd the acquired voltage value is transmitted to an upper computer through a serial port for the converted voltage value.
2. The on-line resistance detection circuit based on the conduction test bench according to claim 1, wherein: the voltage acquisition circuit is composed of TLC1543, and the voltage acquisition circuit comprises 11 acquisition channels for acquiring a plurality of OUT points.
3. The on-line resistance detection circuit based on the conduction test bench according to claim 2, wherein: the TLC1543 was 10 bit resolution and 10us switching time.
4. The on-line resistance detection circuit based on the conduction test bench according to claim 1, wherein: the position of the resistor on the measured wire beam spot is positioned in a wire harness branch or a wire harness trunk, the resistor on the wire harness branch is the wire harness branch resistor, and the resistor on the wire harness trunk is the wire harness trunk resistor.
5. The on-line resistor resistance detection circuit based on the conduction test bench according to claim 4, wherein: the branch resistance of the wire harness consists of a trunk circuit, a branch circuit and a resistor R to be testedXComposition of resistance R to be measuredXThe wire harness branch is positioned in the wire harness branch, is connected with the wire harness resistance value measuring circuit, and removes the resistor R to be measuredXBesides, the rest reference resistors are all 1k omega, the upper computer obtains the actual physical addresses 0001(OUT1), 0002(OUT2) and 0003(OUT3) … … of each wire harness through the serial port, and the resistors R to be detected are searched by using a breadth-first algorithmXSelecting a minimum physical address 0001 from the left physical address set, wherein a unique physical address 0007 exists on the right side of the branch resistor of the wiring harness;
the upper computer issues the physical addresses (0001 and 0007) on the left side and the right side to an STM32 microcontroller, the STM32 microcontroller supplies power to a 0001(OUT1) line beam spot, and the voltage acquisition circuit is used for acquiring the voltage value V of the physical addresses (0001 and 0007)OUT1And VOUT7Resistance R to be measuredXThe resistance value of (a) is obtained from ohm's law, and the formula is as follows:
Figure FDA0002563775510000021
wherein VOUT1Is the voltage value of physical address 0001, VOUT7Is the voltage value of the physical address 0007, R7Is a reference resistance value.
6. The on-line resistor resistance detection circuit based on the conduction test bench according to claim 4, wherein: the wire harnessThe main circuit resistor comprises a main circuit, a branch circuit and a resistor R to be testedXComposition of resistance R to be measuredXThe main line of the wire harness is connected with a resistance value measuring circuit of the wire harness resistor, and when the resistor R to be measuredXWhen the device is positioned in the trunk line of the wire harness, the upper computer will test the resistance RXThe left physical address is issued to the STM32 microcontroller, the STM32 microcontroller obtains all voltage values of 0001(OUT1) -0007 (OUT7), the voltage values of 0002-0006 are the same, and the resistor R to be tested has the same voltage valueXThe number N of right side lapping points is 6, and the resistance R to be measuredXThe resistance values were measured as follows:
Figure FDA0002563775510000022
7. a method for detecting the resistance value of an on-line resistor based on a conduction test board is characterized in that the circuit for detecting the resistance value of the on-line resistor based on the conduction test board, which is disclosed by claims 1-6, is adopted, and the method comprises the following steps:
step 1: all the measured wire beam spots are connected into a wire harness resistance value measuring circuit;
step 2: connecting the measured line beam spot with source levels OUT1, OUT2 and … … OUTN of the double N-type channel AO 6800;
and step 3: the STM32 microcontroller drives the HC595 circuit to supply power to the gates IN1, IN2 and … … INn of the AO6800 of the test point at which the resistor is located by processing the relevant serial port information such as the resistor relevant test point number, the resistor resistance value and the like sent by the upper computer;
and 4, step 4: connecting positive and negative ends REF + and REF-of a reference voltage of a wire harness resistance value measuring circuit to a 5V power supply and a GND respectively to meet voltage acquisition requirements;
and 5: the collected voltage data is transmitted to an STM32 microcontroller for processing and conversion;
step 6: the converted voltage value is transmitted to an upper computer through a serial port;
and 7: the upper computer sends the physical address of the resistor to be tested to an STM32 microcontroller;
and 8: the STM32 microcontroller supplies power to the line beam spot where the resistance to be measured is located, and acquires the voltage value of the physical address by using the voltage acquisition circuit;
step 9: calculating the resistance value of the measured resistor based on the ohm law according to the measured voltage value and the measured voltage difference;
step 10: and the upper computer displays the calculated resistance value of the resistor on a screen in real time.
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