CN111768920A - Method for representing processing uniformity of Bi-system high-temperature superconducting wire or strip - Google Patents
Method for representing processing uniformity of Bi-system high-temperature superconducting wire or strip Download PDFInfo
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Abstract
The invention discloses a method for representing the processing uniformity of a Bi-based high-temperature superconducting wire or strip, which is used for testing the resistance of the Bi-based high-temperature superconducting wire or strip at different positions based on a room-temperature resistance testing principle by a four-wire method and then representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip through the resistance difference at different positions. The method for testing the room temperature resistance based on the four-wire method is adopted to detect the samples of the primary wire, the secondary wire, the composite wire or the strip or the Bi-system high-temperature superconducting composite wire or the strip in the processing process of the Bi-system high-temperature superconducting wire or the strip, and the processing uniformity in different processing stages is represented by the resistance difference at different positions, so that the real-time monitoring of the processing uniformity in the preparation process of the Bi-system high-temperature superconducting wire or the strip is realized, and a guide direction is provided for optimizing the processing parameters in the preparation process of the Bi-system high-temperature superconducting wire or the strip and improving the processing uniformity of the wire.
Description
Technical Field
The invention belongs to the field of performance test and characterization of high-temperature superconducting wires and strips, and particularly relates to a method for characterizing the processing uniformity of Bi-series high-temperature superconducting wires or strips.
Background
The uniformity of the macroscopic current carrying performance and the mechanical property of the Bi-series high-temperature superconducting wire strip is the key of the engineering application. In addition, core wire leakage is a key problem which prevents the Bi-based high-temperature superconducting wire strip from being applied to the magnet technology. The good processing uniformity of the wire or the strip can effectively reduce the core breaking rate, and is vital to the improvement of the macroscopic current carrying performance and the uniformity of the mechanical property of the Bi-series high-temperature superconducting wire strip; meanwhile, the good processing uniformity can ensure the uniformity of the deformation of the silver matrix, and effectively reduce the leakage probability of the core wire.
The uniformity of wire or strip processing depends largely on the uniformity of silver matrix deformation. The cross section size of the silver in different positions of the same wire or strip is an important parameter reflecting the processing uniformity of the wire or strip; meanwhile, adjusting the size of the cross section of silver in the wire or strip is also an important method for improving the processing uniformity of the wire or strip. Thus, comparing the cross-sectional size of the silver in different wires or strips can provide a fundamental data support for improving the processing uniformity of the wires or strips.
The method for testing the processing uniformity of the Bi-based high-temperature superconducting wire or strip which is disclosed and reported at present is very limited.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide a method for characterizing the processing uniformity of Bi-based high-temperature superconducting wire or strip, aiming at the defects of the prior art. The method is based on a four-wire method for testing the room temperature resistance, a primary wire, a secondary wire, a composite wire or strip or a Bi-system high-temperature superconducting composite wire or strip sample in the Bi-system high-temperature superconducting wire or strip processing process is detected, the processing uniformity in different processing stages is represented by the resistance difference at different positions, the real-time monitoring of the processing uniformity in the Bi-system high-temperature superconducting wire or strip preparation process is realized, and a guide direction is provided for optimizing the processing parameters in the Bi-system high-temperature superconducting wire or strip preparation process and improving the processing uniformity of the wire.
In order to solve the technical problems, the invention adopts the technical scheme that: a method for representing the processing uniformity of a Bi-based high-temperature superconducting wire or strip is characterized in that the method is used for testing the resistance of the Bi-based high-temperature superconducting wire or strip at different positions based on a room-temperature resistance testing principle by a four-wire method, and then the processing uniformity of the Bi-based high-temperature superconducting wire or strip is represented by the resistance difference at different positions.
The method for testing the room temperature resistance by adopting the four-wire method is accurate, quick, simple to operate, safe and nondestructive by obtaining the room temperature resistance of the Bi-based high-temperature superconducting wire or strip at different positions, comparing the room temperature resistance and representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip through the resistance difference at different positions.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized by comprising the following steps of:
the method comprises the following steps that firstly, a first lead, a second lead, a third lead and a fourth lead are sequentially wound and fixed on a section bar, the fixing positions of the first lead, the second lead, the third lead and the fourth lead on the section bar are set as a 1 st position, and the distance between the fixing point of the second lead on the section bar and the fixing point of the third lead on the section bar is determined to be L; the section is a Bi-series high-temperature superconducting wire or strip;
step two, passing through the first conducting wireAnd a fourth lead is loaded with current I and forms a loop with the section bar, then the voltage U between the second lead and the third lead is measured, and the resistance R of the section bar with the length of L at the 1 st position is calculated according to the ohm law R which is U/I1；
Step three, integrally adjusting the winding fixing positions of the first lead, the second lead, the third lead and the fourth lead on the section bar in sequence, ensuring that the distance L between the fixing point of the second lead on the section bar and the fixing point of the third lead on the section bar is unchanged until the position i is adjusted, wherein i is a natural number and is not less than 2, respectively calculating the resistance of the section bar with the length L at different positions after adjustment according to the loading and measuring process in the step two until the resistance R is obtainedi；
Step four, obtaining the resistance R according to the step two and the step three1～RiAnd calculating to obtain the average resistance value R of the section bar with the length LaThen calculating the resistance of the section bar with the length L at each position and the average value R of the resistanceaDegree of deviation D ofiWherein Di is ═ Ra-Ri|/Ra× 100% and a degree of deviation DiMaximum value of (1) is the maximum deviation degree DmSelecting the maximum deviation DmThe processing uniformity of the Bi system high-temperature superconducting wire or strip from the profile is represented.
The invention adopts a four-wire method to test the room temperature resistance of different positions in the Bi system high temperature superconducting wire or strip, and then obtains the maximum deviation degree D of the resistance of the Bi system high temperature superconducting wire or stripmThe method is used for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip, so that a basis is provided for adjusting the silver-over ratio in the processing parameters by monitoring and comparing the processing uniformity of the Bi-based high-temperature superconducting wire or strip with the same processing parameters but different thicknesses of the silver sleeves, or a guide direction is provided for adjusting the processing parameters by monitoring and comparing the processing uniformity of the Bi-based high-temperature superconducting wire or strip prepared by different processing parameters, the processing uniformity of the Bi-based high-temperature superconducting wire or strip is finally improved, the overall current-carrying performance and the mechanical property of the Bi-based high-temperature superconducting wire or strip are improved, and the engineering application process of the Bi-based high-temperature superconducting wire or; in addition, the first and second substrates are,the length range of the section bar suitable for measurement by adopting the conducting wire is large, the operation is simple, the sampling spoon is convenient and flexible, and the requirement on equipment is not high.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that the first lead, the second lead, the third lead and the fourth lead in the first step are all made of copper; the length of the section is not less than 5cm, and the section is a sample cut from a primary wire, a secondary wire, a composite wire or strip in the processing process of the Bi-based high-temperature superconducting wire or strip, or the Bi-based high-temperature superconducting composite wire or strip; in the step one, L is more than or equal to 1cm, the measurement precision of L is not less than 0.01cm when L is more than or equal to 1cm and less than 10cm, and the measurement precision of L is not less than 0.1cm when L is more than or equal to 10 cm. The lead made of the preferred material has good conductivity and is easy to obtain; the sectional material with the optimal length has small overall error in the subsequent characterization process, and the precision of the test result of each parameter is improved; the method is suitable for each process wire rod after the Bi-series high-temperature superconducting wire rod or the belt material is processed, and the process detection process is established by detecting the uniformity of each process wire rod, so that the processing uniformity of a final product is ensured; the measuring length is flexibly selected according to the sectional material, so that the processing uniformity of different sectional materials is conveniently obtained; meanwhile, the measurement precision is selected according to the measurement length so as to reduce errors introduced by measurement as much as possible and ensure the accuracy of the characterization method.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that in the second step, if the current I is a variable current and the voltage U is a variable voltage, the U-I is fitted to obtain a fitting curve, and the slope of the fitting curve is the resistance R of the section with the length L at the 1 st position1. The resistance measuring method of the invention is various.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that the current I in the step two is a variable current, a divider resistor with the resistance value r is arranged in series in a loop formed by the first lead, the fourth lead and the profile, and the voltage U of the series resistor is obtained0And U are both variable voltage, for U- (U)0/r) are fitted to obtainFitting a curve having a slope of resistance R of the profile of length L at position 11. The preferable resistance measuring methods are various, and the application range of the characterization method is further widened.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that the maximum deviation D in the fourth stepmWhen the maximum deviation degree D is larger than 5 percent of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the sectional material is poormWhen the processing uniformity of the Bi-based high-temperature superconducting wire or strip is less than 5% of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the sectional material is good.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized by comprising the following steps of:
firstly, sequentially winding and fixing a section on a take-up reel, a first shaft conductor, a second shaft conductor, a third shaft conductor, a fourth shaft conductor and a pay-off reel, setting the fixed positions of the first shaft conductor, the second shaft conductor, the third shaft conductor and the fourth shaft conductor on the section as a 1 st position, and determining the distance between a contact tangent point of the second shaft conductor on the section and a contact tangent point of the third shaft conductor on the section to be L'; the section is a Bi-series high-temperature superconducting wire or strip;
step two, loading current I ' through the first shaft conductor and the fourth shaft conductor, forming a loop with the sectional material, measuring voltage U ' between the second shaft conductor and the third shaft conductor, and calculating resistance R ' of the sectional material with the length L ' at the 1 st position according to ohm's law R ═ U/I1′；
Step three, sequentially and simultaneously rotating a take-up reel and a pay-off reel, integrally adjusting the winding fixing positions of the first shaft conductor, the second shaft conductor, the third shaft conductor and the fourth shaft conductor on the section bar respectively, ensuring that the distance L' between the contact tangent point of the second shaft conductor on the section bar and the contact tangent point of the third shaft conductor on the section bar is unchanged until the j position is adjusted, wherein j is a natural number and is more than or equal to 2, and pressing the take-up reel and the pay-off reel according to the conditions that j is a natural number and isRespectively calculating the resistance of the section with the length L' at different positions after adjustment according to the loading and measuring process in the step two until the resistance R is obtainedj′；
Step four, obtaining the resistance R according to the step two and the step three1′～Rj' calculating to obtain the average resistance value R of the section bar with the length La' then calculating the resistance at each position and the average value of the resistance RaDegree of deviation D of `i', wherein Di′＝|Ra′-Rj′|/Ra' × 100%, and degree of deviation DiThe maximum value in is the maximum deviation Dm', selecting the maximum deviation Dm' characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the sectional material.
The invention adopts a four-wire method to test the room temperature resistance of different positions in the Bi-series high-temperature superconducting wire or strip, uses the shaft conductors to replace the wires for measurement, and enables the section to be folded and unfolded by fixing the position of each shaft conductor so as to measure the resistance of the section at different positions, thereby facilitating the continuous measurement of the section and being suitable for the section with larger length.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that the first shaft conductor, the second shaft conductor, the third shaft conductor and the fourth shaft conductor are all made of copper; the length of the section is not less than 50cm, and the section is a sample cut from a primary wire, a secondary wire, a composite wire or strip in the processing process of the Bi-based high-temperature superconducting wire or strip, or the Bi-based high-temperature superconducting composite wire or strip; the L ' is not less than 1cm, the measurement precision of the L ' is not lower than 0.01cm when the L ' is not less than 1cm and not more than 10cm, and the measurement precision of the L ' is not lower than 0.1cm when the L ' is not less than 10 cm. The shaft conductor made of the preferred material has good conductivity and is easy to obtain; the shaft conductor is suitable for continuous measurement, so that the overall error of the section with the optimal length in the subsequent characterization process is small, and the precision of the test result of each parameter is improved; the method is suitable for each process wire rod after the Bi-series high-temperature superconducting wire rod or the belt material is processed, and the process detection process is established by detecting the uniformity of each process wire rod, so that the processing uniformity of a final product is ensured; the measuring length is flexibly selected according to the sectional material, so that the processing uniformity of different sectional materials is conveniently obtained; meanwhile, the measurement precision is selected according to the measurement length so as to reduce errors introduced by measurement as much as possible and ensure the accuracy of the characterization method.
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that in the second step, if the current I ' is a variable current, the voltage U ' is a variable voltage, the U ' -I ' is fitted to obtain a fitting curve, and the slope of the fitting curve is the resistance R of the section with the length L ' at the 1 st position1′。
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that the current I' in the step two is a variable current, a divider resistor with a resistance value r is arranged in series in a loop formed by the first axial conductor, the fourth axial conductor and the profile, and the voltage U of the series resistor is obtained0Both ' and U ' are of varying voltage, for U ' - (U)0'/R) is fitted to obtain a fitted curve, the slope of the fitted curve is the resistance R of the section bar with the length L' at the 1 st position1′。
The method for representing the processing uniformity of the Bi-based high-temperature superconducting wire or strip is characterized in that the maximum deviation D in the fourth stepmWhen the value is more than 5% of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the sectional material is poor, and when the maximum deviation degree D is larger than the preset value, the maximum deviation degree D ismWhen the value is less than 5% of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the sectional material is good.
The processing technology of the Bi-based high-temperature superconducting wire rod comprises the following steps: and filling Bi series powder into a primary silver tube, drawing to obtain a primary wire, filling the primary wire into a secondary silver tube, assembling, drawing to obtain a secondary wire, filling the secondary wire into a third silver alloy tube, assembling, drawing to obtain a composite wire, and performing heat treatment to form a texture structure to obtain the Bi series high-temperature superconducting wire.
The processing technology of the Bi-series high-temperature superconducting tape comprises the following steps: and (2) filling Bi series powder into the primary silver tube, drawing to obtain a primary wire, filling the primary wire into the secondary silver alloy tube, assembling, drawing to obtain a secondary wire, rolling the secondary wire by a rolling mill to obtain a composite strip, and performing heat treatment to form a texture structure to obtain the Bi series high-temperature superconducting strip.
Compared with the prior art, the invention has the following advantages:
1. the method for testing the room temperature resistance based on the four-wire method detects the primary wire, the secondary wire, the composite wire or the strip in the processing process of the Bi-based high-temperature superconducting wire or strip, or the Bi-based high-temperature superconducting composite wire or strip sample, represents the processing uniformity in different processing stages through the resistance difference at different positions, realizes the real-time monitoring of the processing uniformity in the preparation process of the Bi-based high-temperature superconducting wire or strip, and provides a guide direction for optimizing the processing parameters in the preparation process of the Bi-based high-temperature superconducting wire or strip and improving the processing uniformity of the wire.
2. The method is accurate and rapid, is simple to operate, is safe and nondestructive, can realize the on-line continuous monitoring of the processing uniformity of the Bi-based high-temperature superconducting wire or strip by combining the measuring method of the axial conductor, and is convenient for the processing uniformity evaluation of the Bi-based high-temperature superconducting wire or strip.
3. The invention provides an effective quantitative index for evaluating the processing uniformity of the Bi-system high-temperature superconducting wire or strip, namely the maximum deviation Dm of the wire resistance, provides a quantifiable exact index for evaluating the processing uniformity of the wire or strip, and facilitates the comparative analysis of the processing uniformity of different wires or strips.
4. The invention provides basis and direction for optimizing processing parameters and silver tube size in the processing process of the Bi-system high-temperature superconducting wire or strip by monitoring and comparing the processing uniformity of different Bi-system high-temperature superconducting wires or strips, is beneficial to improving the processing uniformity of the Bi-system high-temperature superconducting wire or strip, improves the overall current-carrying performance and mechanical property of the Bi-system high-temperature superconducting wire or strip, and promotes the engineering application process of the Bi-system high-temperature superconducting wire or strip.
The technical solution of the present invention is further described in detail by the accompanying drawings and examples.
Drawings
Fig. 1 is a schematic view showing the test of Bi-based high-temperature superconducting wires according to examples 1, 3, 4, 5, 7 and 9 of the present invention.
Fig. 2 is a schematic view of a Bi-based high-temperature superconducting wire according to example 2 of the present invention.
Fig. 3 is a schematic view showing a test of a Bi-based high-temperature superconducting wire according to example 6 of the present invention.
FIG. 4 is a schematic view showing the test of the Bi-based high temperature superconducting tape according to example 8 of the present invention.
Description of reference numerals:
1 — a first conductive line; 2-a second conductive line; 3-a third wire;
4-a fourth wire; 5-section bar; 6-a first axial conductor;
7-a second shaft conductor; 8-a third axis conductor; 9-a fourth axis conductor;
10, taking up a reel; 11-a pay-off reel.
Detailed Description
Example 1
The embodiment comprises the following steps:
firstly, a sample with the length of 100cm is intercepted at the head end of a primary wire (with the length of 10m) in the processing process of a Bi2212 high-temperature superconducting wire to serve as a section bar 5, then a first lead 1, a second lead 2, a third lead 3 and a fourth lead 4 are sequentially wound and fixed on the section bar 5, the fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 are determined as the 1 st position (within the range of 0-20 cm from the head end of the section bar 5), and the distance L between the fixing point of the second lead 2 on the section bar 5 and the fixing point of the third lead 3 on the section bar 5 is determined to be 10.0 cm; the first lead wire 1, the second lead wire 2, the third lead wire 3 and the fourth lead wire 4 are all made of copper;
step two, loading current I through the first lead wire 1 and the fourth lead wire 4 and forming a loop with the section bar 5, and then measuring the voltage U and the current between the second lead wire 2 and the third lead wire 3I is current increased at a constant speed, the current I is 0-1A, the increase amplitude is 0.1A/s, the corresponding obtained voltage U is changed voltage, U-I is fitted to obtain a fitting curve, the slope of the fitting curve is 0.00211, namely the resistance R of the section 5 with the length of 10.0cm at the 1 st position10.00211 Ω; the test schematic of this example is shown in FIG. 1;
step three, the winding and fixing positions of the first wire 1, the second wire 2, the third wire 3 and the fourth wire 4 on the section bar 5 are sequentially adjusted to the 2 nd position (within the range of 20 cm-40 cm from the head end of the section bar 5), the 3 rd position (within the range of 40 cm-60 cm from the head end of the section bar 5), the 4 th position (within the range of 60 cm-80 cm from the head end of the section bar 5) and the 5 th position (within the range of 80 cm-100 cm from the head end of the section bar 5), the distance L between the fixing point of the second wire 2 on the section bar 5 and the fixing point of the third wire 3 on the section bar 5 is ensured to be constant at 10.0cm, and the resistance of the section bar 5 with the length of 10.0cm at the 2 nd position-5 th position after adjustment is respectively calculated and sequentially to be R according to the loading and measuring processes in the step two2＝0.00214Ω，R3＝0.00234Ω，R40.00233 Ω and R5＝0.00215Ω；
Step four, obtaining the resistance R according to the step two and the step three1～R5And calculating to obtain the average value R of the resistance of the section 5 with the length of 10.0cma0.00221, the resistance of the profile 5 with a length of 10.0cm at each position was then calculated together with the average value of the resistance RaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D is obtainediMaximum deviation D being the maximum value ofm4.5%, indicating that the processing uniformity of the primary wire rod in the processing process of the Bi2212 high-temperature superconducting wire rod from the section bar 5 is good.
Example 2
The embodiment comprises the following steps:
firstly, intercepting a sample with the length of 60cm at the head end of a secondary wire (with the length of 6m) in the processing process of a Bi2212 high-temperature superconducting wire as a section bar 5, then sequentially winding and fixing a first lead 1, a second lead 2, a third lead 3 and a fourth lead 4 on the section bar 5, setting the fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 as the 1 st position (within the range of 0-20 cm from the head end of the section bar 5), and determining that the distance L between the fixing point of the second lead 2 on the section bar 5 and the fixing point of the third lead 3 on the section bar 5 is 10.0 cm; the first lead wire 1, the second lead wire 2, the third lead wire 3 and the fourth lead wire 4 are all made of copper;
step two, adding a divider resistor with a resistance value r of 0.001 omega into a loop of the first copper wire 1, the fourth copper wire 4 and the section bar 5, loading a current I through the first copper wire 1 and the fourth copper wire 4, forming a loop with the section bar 5, and measuring the voltage at two ends of the divider resistor to be U0Measuring the voltage U between the second lead wire 2 and the third lead wire 3, wherein the current I is the current which increases at a constant speed, the current I is 0-1A, the increasing amplitude is 0.1A/s, the correspondingly obtained voltage U is the changing voltage, and the voltage U- (U) is measured0/r) fitting to obtain a fitted curve, wherein the slope of the fitted curve is 7.91384 × 10-4I.e. the resistance R of the profile 5 at position 1 with a length of 10.0cm1＝7.91384×10-4Omega; the test schematic of this embodiment is shown in FIG. 2;
step three, the winding and fixing positions of the first wire 1, the second wire 2, the third wire 3 and the fourth wire 4 on the section bar 5 are sequentially adjusted to the 2 nd position (within the range of 20 cm-40 cm from the head end of the section bar 5) and the 3 rd position (within the range of 40 cm-60 cm from the head end of the section bar 5) integrally, the distance L between the fixing point of the second wire 2 on the section bar 5 and the fixing point of the third wire 3 on the section bar 5 is ensured to be unchanged at 10.0cm, and according to the loading and measuring process in the step two, the resistances of the section bar 5 with the lengths of 10.0cm at the 2 nd position and the 3 rd position after adjustment are respectively calculated and obtained and are R sequentially2＝8.08842×10-4Ω，R3＝8.15882×10-4Ω；
Step four, obtaining the resistance R according to the step two and the step three1～R3And calculating to obtain the average value R of the resistance of the section 5 with the length of 10.0cma＝8.05369×10-4Omega, then the resistance of the profile 5 of length 10.0cm at each position is calculated together with the average value R of the resistanceaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D is obtainediMaximum deviation D being the maximum value ofm1.74%, indicating that the processing uniformity of the secondary wire rod in the processing process of the Bi2212 high-temperature superconducting wire rod from the section bar 5 is good.
Each wire of this embodiment can also adopt and correspond an axial conductor to replace, the section bar 5 that adopts can use the secondary wire rod (length is 6m) after processing is accomplished, section bar 5 twines in proper order and fixes on take-up reel 10, first axial conductor 6, second axial conductor 7, third axial conductor 8, fourth axial conductor 9 and drawing drum 11, through rotating take-up reel 10 and drawing drum 1 simultaneously, adjust the winding fixed position of first axial conductor 6, second axial conductor 7, third axial conductor 8 and fourth axial conductor 9 on section bar 5 respectively, then carry out corresponding resistance measurement and the processing homogeneity sign of secondary wire rod.
Example 3
The embodiment comprises the following steps:
firstly, respectively cutting samples with the length of 20cm from the head end and the tail end of a third wire (with the length of 14m) in the processing process of a Bi2212 high-temperature superconducting wire as a section bar 5, then sequentially winding and fixing a first lead 1, a second lead 2, a third lead 3 and a fourth lead 4 on the section bar 5, and setting the fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 as a 1 st position (the sample with the length of the head end of the third wire being 20 cm), and ensuring that the distance L between the fixing point of the second lead 2 on the section bar 5 and the fixing point of the third lead 3 on the section bar 5 is 10.0 cm; the first lead wire 1, the second lead wire 2, the third lead wire 3 and the fourth lead wire 4 are all made of copper;
step two, loading current I through the first lead wire 1 and the fourth lead wire 4 and forming a loop with the section bar 5, then measuring voltage U between the second lead wire 2 and the third lead wire 3, wherein the current I is current increased at a constant speed, the current I is 0-1A, the increase amplitude is 0.1A/s, the correspondingly obtained voltage U is change voltage, fitting the U-I to obtain a fitting curve, the slope of the fitting curve is 0.00311, namely the resistance R of the section bar 5 with the length of 10.0cm at the 1 st position is10.00311 Ω; the test of this example is schematically shown inFIG. 1;
step three, the winding and fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 are adjusted to the position 2 integrally (a sample with the length of the tail end of the wire rod being 20cm for three times), the distance L between the fixing point of the second lead 2 on the section bar 5 and the fixing point of the third lead 3 on the section bar 5 is ensured to be 10.0cm, and according to the loading and measuring processes in the step two, the resistance R of the section bar 5 with the length of 10.0cm at the position 2 after adjustment is obtained through calculation respectively2＝0.00315Ω；
Step four, obtaining the resistance R according to the step two and the step three1And R2And calculating to obtain the average value R of the resistance of the section 5 with the length of 10.0cma0.00313, the resistance of the profile 5 with a length of 10.0cm at each position was then calculated together with the average value of the resistance RaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D is obtainediMaximum deviation D being the maximum value ofm0.64%, indicating that the processing uniformity of the third wire rod in the processing process of the Bi2212 high-temperature superconducting wire rod from the profile 5 is good.
Example 4
The embodiment comprises the following steps:
step one, cutting a sample (marked as A) with the length of 40cm from the head end and the tail end of two Bi2212 high-temperature superconducting wires (marked as A and B respectively, wherein the first silver tube thickness of A is smaller than the first silver tube thickness of B) with the same processing parameters, but different first silver tube thicknesses and the same second silver tube and third silver alloy tube in the processing process of the third wire (the length is 50m)1、A2And B1、B2) As the section bar 5, the first wire 1, the second wire 2, the third wire 3 and the fourth wire 4 are sequentially wound and fixed on the section bar 5A, and the fixed positions of the first wire 1, the second wire 2, the third wire 3 and the fourth wire 4 on the section bar 5A are defined as the 1 st position (namely, A1Within 0-20 cm) of the head end of the second wire 2, and ensuring that the distance L between the fixed point of the second wire 2 on the section bar 5 and the fixed point of the third wire 3 on the section bar 5 is 10.0 cm; the first guideThe wire 1, the second conducting wire 2, the third conducting wire 3 and the fourth conducting wire 4 are all made of copper;
step two, loading current I through the first lead 1 and the fourth lead 4 and forming a loop with the section bar 5, then measuring voltage U between the second lead 2 and the third lead 3, wherein the current I is current increasing at a constant speed, the current I is 0-1A, the increasing amplitude is 0.1A/s, the correspondingly obtained voltage U is changing voltage, fitting U-I to obtain a fitting curve, the slope of the fitting curve is 0.00389, namely the resistance R of the section bar 5 with the length of 10.0cm at the 1 st position of A10.00389 Ω; the test schematic of this example is shown in FIG. 1;
step three, sequentially adjusting the winding fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 to the 2 nd position of A (namely A)1Head end of 20 cm-40 cm), position 3 (i.e. A)2Within 0-20 cm of the head end) and the 4 th position (i.e., A)2Within the range of 20cm to 40 cm) of the head end of the profile 5, and ensuring that the distance L between the fixed point of the second lead 2 on the profile 5 and the fixed point of the third lead 3 on the profile 5 is 10.0cm, respectively calculating and obtaining the resistances of the profile 5 with the lengths of 10.0cm at the 2 nd position to the 4 th position after adjustment as R in sequence according to the loading and measuring processes in the step two2＝0.00389Ω，R30.00393 Ω and R4＝0.00394Ω；
The winding fixing positions of the first wire 1, the second wire 2, the third wire 3 and the fourth wire 4 on the section bar 5 are integrally adjusted to the 1 st position of B (namely B)1Head end of 0 cm-20 cm), position 2 (i.e. B)1Head end of 20 cm-40 cm), position 3 (i.e. B)2Within 0-20 cm of the head end) and the 4 th position (i.e., B)2Within the range of 20 cm-40 cm) of the head end of the section bar, and ensuring that the distance L between the fixed point of the second lead 2 on the section bar 5 and the fixed point of the third lead 3 on the section bar 5 is 10.0cm, respectively calculating the resistance of the section bar 5 with the length of 10.0cm at the 1 st position to the 4 th position of the B as R in sequence according to the loading and measuring process in the step two1＝0.00351Ω，R2＝0.00352Ω，R30.00352 Ω and R4＝0.00352Ω；
Step four, obtaining the resistance R of A and B according to the step two and the step three1～R4The average value R of the resistance of the section 5 of which the length A is 10.0cm is calculatedaAverage resistance value R of profile 5 with length of 10.0cm B (0.00391;)a0.00352, the resistance of the profile 5 having a length of 10.0cm at each of the positions a and B and the average value R of the resistance were then calculatedaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D of A was obtainediMaximum deviation D being the maximum value ofm0.70%, degree of deviation D of BiMaximum deviation D being the maximum value ofm0.21%, which indicates that the processing uniformity of the Bi-based high-temperature superconducting wires from the A source and the B source in the section 5 is better, wherein the processing uniformity of the Bi-based high-temperature superconducting wires from the B source is better, thereby indicating that the increase of the wall thickness of the silver tube at one time is beneficial to improving the processing uniformity of the Bi-based high-temperature superconducting wires.
Example 5
The embodiment comprises the following steps:
step one, intercepting samples (marked as A) with the length of 40cm (marked as A) at the head end and the tail end of three-time wire rods (the length of 50m) in the processing process of two Bi2212 high-temperature superconducting wire rods (marked as A and B respectively, wherein A adopts an eight-die wire drawing machine for processing, and B adopts a single-die wire drawing machine for processing) with different processing parameters and similar silver tube thicknesses1、A2And B1、B2) As the section bar 5, the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 are sequentially wound and fixed on A in the section bar 5, and the position of fixing the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on A in the section bar 5 is defined as the 1 st position (namely, A1Within 0-20 cm) of the head end of the second wire 2, and determining that the distance L between the fixed point of the second wire 2 on the section bar 5 and the fixed point of the third wire 3 on the section bar 5 is 10.0 cm; the first lead wire 1, the second lead wire 2, the third lead wire 3 and the fourth lead wire 4 are all made of copper;
step two, loading current I through the first lead 1 and the fourth lead 4 and forming a loop with the section bar 5, and then measuring the second lead 2 and the third lead 4The voltage U between the leads 3, the current I are current increasing at a constant speed, the current I is 0-1A, the increasing amplitude is 0.1A/s, the voltage U obtained correspondingly is changing voltage, the U-I is fitted to obtain a fitting curve, the slope of the fitting curve is 0.00336, namely the resistance R of the section 5 with the length of 10.0cm at the 1 st position of A10.00336 Ω; the test schematic of this example is shown in FIG. 1;
step three, sequentially adjusting the winding fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 to the 2 nd position of A (namely A)1Head end of 20 cm-40 cm), position 3 (i.e. A)2Within 0-20 cm of the head end) and the 4 th position (i.e., A)2Within the range of 20cm to 40 cm) of the head end of the profile 5, and ensuring that the distance L between the fixed point of the second lead 2 on the profile 5 and the fixed point of the third lead 3 on the profile 5 is 10.0cm, respectively calculating and obtaining the resistances of the profile 5 with the lengths of 10.0cm at the 2 nd position to the 4 th position after adjustment as R in sequence according to the loading and measuring processes in the step two2＝0.00336Ω，R30.00369 Ω and R4＝0.00362Ω；
The winding fixing positions of the first wire 1, the second wire 2, the third wire 3 and the fourth wire 4 on the section bar 5 are integrally adjusted to the 2 nd position of B (namely B)1Head end of 0 cm-20 cm), position 2 (i.e. B)1Head end of 20 cm-40 cm), position 3 (i.e. B)2Within 0-20 cm of the head end) and the 4 th position (i.e., B)2Within the range of 20 cm-40 cm) of the head end of the second lead 2, and the distance L between the fixed point of the second lead 2 on the section bar 5 and the fixed point of the third lead 3 on the section bar 5 is ensured to be 10.0cm, and according to the loading and measuring processes in the step two, the resistances of the section bars 5 with the lengths of 10.0cm at the 1 st position to the 4 th position of the B are respectively calculated and sequentially R1＝0.00351Ω，R2＝0.00352Ω，R30.00352 Ω and R4＝0.00352Ω；
Step four, obtaining the resistance R of A and B according to the step two and the step three1～R4The average value R of the resistance of the section 5 of which the length A is 10.0cm is calculatedaOf section 5 with a length of 10.0cm, B0.00336Average value of resistance Ra0.00352, the resistance of the profile 5 having a length of 10.0cm at each of the positions a and B and the average value R of the resistance were then calculatedaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D of A was obtainediMaximum deviation D being the maximum value ofm5.20%, degree of deviation D of BiMaximum deviation D being the maximum value ofmWhen the average value is 0.21%, the processing uniformity of the Bi-based high-temperature superconducting wire rod from the B source in the profile 5 is good, so that the single-mode drawing machine is favorable for improving the processing uniformity of the Bi-based high-temperature superconducting wire rod.
Example 6
Firstly, a sample with the length of 600cm is cut out from a tertiary wire (with the length of 500m) in the processing process of a Bi2212 high-temperature superconducting wire to serve as a section bar 5, then the section bar 5 is sequentially wound and fixed on a take-up reel 10, a first shaft conductor 6, a second shaft conductor 7, a third shaft conductor 8, a fourth shaft conductor 9 and a pay-off reel 11, the fixing positions of the first shaft conductor 6, the second shaft conductor 7, the third shaft conductor 8 and the fourth shaft conductor 9 on the section bar 5 are determined as the 1 st position (the end of the take-up reel is 90.0 cm-210.0 cm), and the distance L' between the contact tangent point of the second shaft conductor 7 on the section bar 5 and the contact tangent point of the third shaft conductor 8 on the section bar 5 is determined to be 100; the first shaft conductor 6, the second shaft conductor 7, the third shaft conductor 8 and the fourth shaft conductor 9 are all made of copper;
secondly, loading current I ' through the first shaft conductor 6 and the fourth shaft conductor 9 and forming a loop with the section bar 5, then measuring voltage U ' between the second shaft conductor 7 and the third shaft conductor 8, wherein the current I ' is current increasing at a constant speed, the current I ' is 0-1A, the increasing amplitude is 0.1A/s, the correspondingly obtained voltage U ' is changing voltage, fitting U ' -I ' to obtain a fitting curve, the slope of the fitting curve is 0.03881, namely the resistance R of the section bar 5 with the length of 100.0cm at the 1 st position1' -0.03881 Ω; the test schematic of this embodiment is shown in FIG. 3;
step three, sequentially and simultaneously rotating the take-up reel 10 and the pay-off reel 1 to respectively arrange the first shaft conductor 6, the second shaft conductor 7, the third shaft conductor 8 and the fourth shaft conductor 9 on the same lineThe winding fixing positions on the section bar 5 are adjusted to the 2 nd position (190.0 cm-310.0 cm from the take-up reel end), the 3 rd position (290.0 cm-410.0 cm from the take-up reel end) and the 4 th position (390.0 cm-510.0 cm from the take-up reel end), the distance L' between the contact tangent point of the second shaft conductor 7 on the section bar 5 and the contact tangent point of the third shaft conductor 8 on the section bar 5 is ensured to be unchanged at 1000.0cm, and according to the loading and measuring process in the step two, the resistances of the section bar 5 with the lengths of 100.0cm at the 2 nd position to the 4 th position after adjustment are respectively calculated to be R in sequence2′＝0.03963Ω，R3' 0.03311 omega, and R4′＝0.03037Ω；
Step four, obtaining the resistance R according to the step two and the step three1′～R4', calculating to obtain the average value R of the resistance of the section 5 with the length of 1000.0cma0.03548, the resistance of the profile 5 is then calculated at each position over a length of 1000.0cm, and the average value R of the resistanceaDegree of deviation D ofi', wherein Di′＝|Ra′-Rj′|/Ra' × 100%, the deviation D was obtainedi' maximum value of, i.e. maximum deviation value Dm' - (14.40%) indicates that the Bi-based high-temperature superconducting wire rod derived from the form 5 is poor in processing uniformity.
Example 7
The embodiment comprises the following steps:
firstly, a sample with the length of 50cm is cut from a high-temperature superconducting wire material of a Bi2212 composite wire material after high-pressure heat treatment to be used as a section bar 5, then a first lead 1, a second lead 2, a third lead 3 and a fourth lead 4 are sequentially wound and fixed on the section bar 5, the fixed positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 are determined as a 1 st position (within the range of 0-5 cm from the head end of the section bar 5), and the distance L between the fixed point of the second lead 2 on the section bar 5 and the fixed point of the third lead 3 on the section bar 5 is determined to be 3.00 cm; the first lead wire 1, the second lead wire 2, the third lead wire 3 and the fourth lead wire 4 are all made of copper;
step two, loading current I through the first lead wire 1 and the fourth lead wire 4 and forming a loop with the section bar 5, and then measuring the current I between the second lead wire 2 and the third lead wire 3The voltage U and the current I are currents which increase at a constant speed, the current I is 0-1A, the increasing amplitude is 0.1A/s, the voltage U obtained correspondingly is a changing voltage, the U-I is fitted to obtain a fitting curve, the slope of the fitting curve is 0.00102, namely the resistance R of the section 5 with the length of 3.00cm at the 1 st position10.00102 Ω; the test schematic of this embodiment is shown in FIG. 4;
step three, the winding and fixing positions of a first wire 1, a second wire 2, a third wire 3 and a fourth wire 4 on the section bar 5 are integrally adjusted to a 2 nd position (within a range of 5 cm-10 cm from the head end of the section bar 5), a 3 rd position (within a range of 10 cm-15 cm from the head end of the section bar 5), a 4 th position (within a range of 15 cm-20 cm from the head end of the section bar 5), a 5 th position (within a range of 20 cm-25 cm from the head end of the section bar 5), a 6 th position (within a range of 25 cm-30 cm from the head end of the section bar 5), a 7 th position (within a range of 30 cm-35 cm from the head end of the section bar 5), an 8 th position (within a range of 35 cm-40 cm from the head end of the section bar 5), a 9 th position (within a range of 40 cm-45 cm from the head end of the section bar 5) and a 10 th position (within a range of 45 cm-50 cm from the head end of the section bar 5) in sequence, and the distance L between the fixing point of the second wire 2 on, respectively calculating the resistances of the adjusted 2 nd to 10 th positions of the section bars 5 with the lengths of 3.00cm according to the loading and measuring processes in the step two, wherein the resistances are sequentially R2＝0.00103Ω，R3＝0.00108Ω，R4＝0.00103Ω，R5＝0.00103Ω，R6＝0.00104Ω，R7＝0.00106Ω，R8＝0.00108Ω，R90.00104 Ω and R10＝0.00104Ω；
Step four, obtaining the resistance R according to the step two and the step three1～R10And calculating to obtain the average resistance value R of the section 5 with the length of 3.00cma0.00105, the resistance of the profile 5 with a length of 3.00cm at each position was then calculated together with the average value of the resistance RaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D is obtainediMaximum deviation D being the maximum value ofmWhen the percentage was 3.35%, the processing uniformity of the composite wire rod derived from profile 5 was good.
Example 8
The embodiment comprises the following steps:
firstly, randomly intercepting 6 samples with the length of 20cm from a Bi2223 high-temperature superconducting strip as a profile 5, sequentially winding and fixing a first lead 1, a second lead 2, a third lead 3 and a fourth lead 4 on the 1 st sample of the profile 5, fixing the positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the profile 5 as the 1 st position, and determining that the distance L between the fixing point of the second lead 2 on the profile 5 and the fixing point of the third lead 3 on the profile 5 is 10.00 cm; the first lead wire 1, the second lead wire 2, the third lead wire 3 and the fourth lead wire 4 are all made of copper;
step two, loading current I through the first lead 1 and the fourth lead 4 and forming a loop with the section bar 5, measuring voltage U between the second lead 2 and the third lead 3, wherein the current I is current increased at a constant speed, the current I is 0-1A, the increase amplitude is 0.1A/s, the correspondingly obtained voltage U is change voltage, fitting U-I to obtain a fitting curve, the slope of the fitting curve is 0.00216, namely the resistance R of the section bar 5 with the length of 10.00cm at the 1 st position is10.00216 Ω; the test schematic of this example is shown in FIG. 1;
step three, the winding fixing positions of the first lead 1, the second lead 2, the third lead 3 and the fourth lead 4 on the section bar 5 are sequentially adjusted to the 2 nd position (namely, the 2 nd sample), the 3 rd position (namely, the 3 rd sample), the 4 th position (namely, the 4 th sample), the 5 th position (namely, the 5 th sample) and the 6 th position (namely, the 6 th sample) integrally, the distance L between the fixing point of the second lead 2 on the section bar 5 and the fixing point of the third lead 3 on the section bar 5 is ensured to be constant to be 10.00cm, and the resistance of the section bar 5 with the length of 10.00cm at the 2 nd position to the 6 th position after adjustment is obtained through calculation according to the loading and measuring process in the step two, and the resistance R of the section bar 5 with the length of 10.00cm is sequentially2＝0.00218Ω，R3＝0.00216Ω，R4＝0.00218Ω、R50.00218 Ω and R6＝0.00217Ω；
Step four, obtaining the resistance R according to the step two and the step three1～R6Calculating the lengthAverage value R of resistance of section bar 5 with degree of 10.00cma0.00217, the resistance of the profile 5 with a length of 10.00cm at each position was then calculated together with the average value of the resistance RaDegree of deviation D ofiWherein D isi＝|Ra-Ri|/Ra× 100%, the deviation D is obtainediMaximum deviation D being the maximum value ofm0.54%, indicating that the processing uniformity of the Bi2223 high-temperature superconducting tape from the profile 5 is good.
Example 9
The present embodiment is different from embodiment 1 in that: in the first step, the distance between the fixed points of the second lead 2 and the third lead 3 on the section bar 5 is 1.00 cm.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention in any way. Any simple modification, change and equivalent changes of the above embodiments according to the technical essence of the invention are still within the protection scope of the technical solution of the invention.
Claims (11)
1. A method for representing the processing uniformity of a Bi-based high-temperature superconducting wire or strip is characterized in that the method is used for testing the resistance of the Bi-based high-temperature superconducting wire or strip at different positions based on a room-temperature resistance testing principle by a four-wire method, and then the processing uniformity of the Bi-based high-temperature superconducting wire or strip is represented by the resistance difference at different positions.
2. The method for characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip according to claim 1, wherein the method comprises the following steps:
firstly, a first lead (1), a second lead (2), a third lead (3) and a fourth lead (4) are sequentially wound and fixed on a section bar (5), the fixed positions of the first lead (1), the second lead (2), the third lead (3) and the fourth lead (4) on the section bar (5) are determined as a 1 st position, and the distance between the fixed point of the second lead (2) on the section bar (5) and the fixed point of the third lead (3) on the section bar (5) is determined as L; the section (5) is a Bi-series high-temperature superconducting wire or strip;
and step two, loading current I through the first lead (1) and the fourth lead (4) and forming a loop with the section bar (5), measuring voltage U between the second lead (2) and the third lead (3), and calculating resistance R of the section bar (5) with the length L at the 1 st position according to ohm law R which is U/I1；
Step three, the winding fixing positions of the first lead (1), the second lead (2), the third lead (3) and the fourth lead (4) on the section bar (5) are adjusted integrally in sequence, the distance L between the fixing point of the second lead (2) on the section bar (5) and the fixing point of the third lead (3) on the section bar (5) is ensured to be unchanged until the position i is adjusted, wherein i is a natural number and i is not less than 2, the resistances of the section bar (5) with the length L at different positions after adjustment are respectively calculated according to the loading and measuring processes in the step two until the resistance R is obtainedi；
Step four, obtaining the resistance R according to the step two and the step three1～RiAnd calculating the average resistance value R of the section bar (5) with the length LaThen, the resistance of the profile (5) of length L at each position is calculated together with the average value R of the resistanceaDegree of deviation D ofiWherein Di is ═ Ra-Ri|/Ra× 100% and a degree of deviation DiMaximum value of (1) is the maximum deviation degree DmSelecting the maximum deviation DmThe processing uniformity of the Bi system high-temperature superconducting wire or strip from the profile (5) is represented.
3. The method for characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip according to claim 2, wherein in the first step, the first conducting wire (1), the second conducting wire (2), the third conducting wire (3) and the fourth conducting wire (4) are all made of copper; the length of the section (5) is not less than 5cm, and the section (5) is a sample cut from a primary wire, a secondary wire, a composite wire or strip in the processing process of the Bi-based high-temperature superconducting wire or strip, or the Bi-based high-temperature superconducting composite wire or strip; in the step one, L is more than or equal to 1cm, the measurement precision of L is not less than 0.01cm when L is more than or equal to 1cm and less than 10cm, and the measurement precision of L is not less than 0.1cm when L is more than or equal to 10 cm.
4. The method for characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip according to claim 2, wherein in the second step, if the current I is a variable current and the voltage U is a variable voltage, the U-I is fitted to obtain a fitted curve, and the slope of the fitted curve is the resistance R of the section (5) with the length L at the 1 st position1。
5. The method according to claim 2, wherein the current I in step two is a variable current, and a divider resistor with a resistance r is arranged in series in a loop formed by the first lead (1), the fourth lead (4) and the profile (5), so that a voltage U of the series resistor is a voltage U of the series resistor0And U are both variable voltage, for U- (U)0/R) is fitted to obtain a fitted curve, the slope of which is the resistance R of the section (5) of length L at the 1 st position1。
6. The method according to claim 2, wherein the maximum deviation D in the fourth step ismWhen the processing uniformity of the Bi-based high-temperature superconducting wire or strip is more than 5 percent of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the section (5) is poor, and when the maximum deviation degree D is higher than the preset value of the processing uniformity of the Bi-based high-mWhen the processing uniformity of the Bi-based high-temperature superconducting wire or strip is less than 5% of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the section (5) is good.
7. The method for characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip according to claim 1, wherein the method comprises the following steps:
firstly, a section bar (5) is sequentially wound and fixed on a take-up reel (10), a first shaft conductor (6), a second shaft conductor (7), a third shaft conductor (8), a fourth shaft conductor (9) and a pay-off reel (11), the fixed positions of the first shaft conductor (6), the second shaft conductor (7), the third shaft conductor (8) and the fourth shaft conductor (9) on the section bar (5) are determined as a 1 st position, and the distance between a contact tangent point of the second shaft conductor (7) on the section bar (5) and a contact tangent point of the third shaft conductor (8) on the section bar (5) is determined to be L'; the section (5) is a Bi-series high-temperature superconducting wire or strip;
step two, loading current I 'through the first shaft conductor (6) and the fourth shaft conductor (9) to form a loop with the profile (5), measuring the voltage U' between the second shaft conductor (7) and the third shaft conductor (8), and calculating the resistance R 'of the profile (5) with the length L' at the 1 st position according to the ohm law R which is U/I1′；
Step three, sequentially and simultaneously rotating a take-up reel (10) and a pay-off reel (11), integrally adjusting the winding fixing positions of the first shaft conductor (6), the second shaft conductor (7), the third shaft conductor (8) and the fourth shaft conductor (9) on the section bar (5) respectively, ensuring that the distance L 'between the contact tangent point of the second shaft conductor (7) on the section bar (5) and the contact tangent point of the third shaft conductor (8) on the section bar (5) is unchanged until the j position is adjusted, wherein j is a natural number and is not less than 2, respectively calculating the resistance of the section bar (5) with the length L' at different positions after adjustment according to the loading and measuring processes in the step two until the resistance R is obtainedj′；
Step four, obtaining the resistance R according to the step two and the step three1′～Rj', calculating the average value R of the resistance of the profile (5) of length La' then calculating the resistance at each position and the average value of the resistance RaDegree of deviation D of `i', wherein Di′＝|Ra′-Rj′|/Ra' × 100%, and degree of deviation DiThe maximum value in is the maximum deviation Dm', selecting the maximum deviation Dm' characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the profile (5).
8. The method for characterizing the processing uniformity of the Bi-based high-temperature superconducting wire or strip according to claim 7, wherein the first axial conductor (6), the second axial conductor (7), the third axial conductor (8) and the fourth axial conductor (9) are all made of copper; the length of the section (5) is not less than 50cm, and the section (5) is a sample cut from a primary wire, a secondary wire, a composite wire or strip in the processing process of the Bi-based high-temperature superconducting wire or strip, or the Bi-based high-temperature superconducting composite wire or strip; the L ' is not less than 1cm, the measurement precision of the L ' is not lower than 0.01cm when the L ' is not less than 1cm and not more than 10cm, and the measurement precision of the L ' is not lower than 0.1cm when the L ' is not less than 10 cm.
9. The method according to claim 7, wherein in the second step, if the current I ' is a variable current and the voltage U ' is a variable voltage, and the fitting curve is obtained by fitting the voltage U ' -I ', and the slope of the fitting curve is the resistance R of the section (5) with the length L ' at the 1 st position1′。
10. The method according to claim 7, wherein the current I' in step two is a variable current, and a divider resistor with a resistance r is arranged in series in a loop formed by the first axial conductor (6), the fourth axial conductor (9) and the profile (5), so that the voltage U of the series resistor is equal to the voltage U of the series resistor0Both ' and U ' are of varying voltage, for U ' - (U)0'/R) is fitted to obtain a fitted curve, the slope of which is the resistance R of the profile (5) of length L' at position 11′。
11. The method according to claim 7, wherein the maximum deviation D in the fourth step ismWhen the value is more than 5% of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the section (5) is poor, and when the maximum deviation degree D is largermWhen the processing uniformity of the Bi-based high-temperature superconducting wire or strip is less than 5% of the preset value of the processing uniformity of the Bi-based high-temperature superconducting wire or strip, the processing uniformity of the Bi-based high-temperature superconducting wire or strip from the profile (5) is good.
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