CN111750988A - Trigger sampling device and method of elasto-modulation spectrometer - Google Patents

Trigger sampling device and method of elasto-modulation spectrometer Download PDF

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CN111750988A
CN111750988A CN202010787845.5A CN202010787845A CN111750988A CN 111750988 A CN111750988 A CN 111750988A CN 202010787845 A CN202010787845 A CN 202010787845A CN 111750988 A CN111750988 A CN 111750988A
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李克武
王志斌
张敏娟
胡将
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North University of China
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    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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    • G01J3/027Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract

The invention belongs to the technical field of data sampling of an elastic light modulation spectrometer, and particularly relates to a trigger sampling device and a trigger sampling method of the elastic light modulation spectrometer. The invention carries out zero-crossing detection on the reference interference pattern to generate a trigger square wave signal which is used as a clock signal to trigger the ADC acquisition module, thereby realizing equal optical path difference sampling of the interference pattern. The method is used for data sampling of the photoelastic modulation spectrometer.

Description

Trigger sampling device and method of elasto-modulation spectrometer
Technical Field
The invention belongs to the technical field of data sampling of an elastic light modulation spectrometer, and particularly relates to a trigger sampling device and method of the elastic light modulation spectrometer.
Background
The spectrometer is divided into two types of light splitting and modulation according to the working principle, one of the light splitting type spectrometers is a dispersion type spectrometer composed of a prism, the resolution ratio of the dispersion type spectrometer is low, the dispersion type spectrometer is sensitive to temperature and humidity, and the environment requirement is strict, and the other type of the dispersion type spectrometer composed of gratings adopts advanced grating carving and copying technology, so that the resolution ratio is improved, the measurement wave band is widened, and the environment requirement is reduced. The modulation type spectrometer is a Fourier transform spectrometer and has wide measurement range, high precision and high resolution. At present, in infrared and visible light wave bands, a Fourier transform spectrometer with a Michelson interferometer structure is generally adopted, a movable mirror needs to be pushed to complete spectrum measurement, the measurement speed is limited, generally, single measurement time cannot break through ms magnitude, and the movable mirror is mechanically pushed and swept and is sensitive to environmental vibration. The elasto-optical modulation Fourier transform spectrometer is used as a spectral measurement technology with high speed, high sensitivity and wide spectral range, overcomes the defect, has wide application in the fields of chemical analysis, environmental remote sensing, military and the like, and has potential application value and development prospect in the fields of transient spectral detection such as transient temperature measurement, spectral measurement in an explosion process and the like.
However, the photoelastic modulation spectrometer (PEM-FTS) has disadvantages, and first, the sampling rate is high when the spectral resolution is high. When the modulation frequency of the interferometer is tens of kHz, the resolution is 32cm-1When the signal source is in the left and right, the highest frequency of the signal source is hundreds of megahertz, and the sampling frequency of the signal source also reaches hundreds of megahertz; secondly, the data such as the elastic-optical modulation interference signals acquired by the interference signals acquired in an equal-time mode are non-uniformly distributed on a standard grid, a Fast Fourier Transform (FFT) algorithm cannot be directly utilized, a non-uniform discrete Fourier transform algorithm is utilized to restore the spectrum, the calculated amount is large, the real-time requirement is not met, in short, when the high spectral resolution is realized,the data processing technology of the interference signal of the elasto-optical modulation Fourier transform spectrometer has a difficult problem.
Disclosure of Invention
Aiming at the technical problems that the sampling rate of the elastic modulation type spectrometer is low, the calculated amount is large, and the real-time performance is not satisfied, the invention provides the trigger sampling device and method of the elastic modulation type spectrometer, which are high in sampling precision, small in calculated amount and strong in real-time performance.
In order to solve the technical problems, the invention adopts the technical scheme that:
a trigger sampling device of an elastic light modulation spectrometer comprises a detected radiation target, a telescope, a polarizer, a reference laser, an elastic light modulator, a silicon light detector, an analyzer, an infrared detector, a preprocessing module, an ADC (analog to digital converter) acquisition module, a zero-crossing comparison module, an amplification filtering module and a drive and spectrum restoration processing module controlled by an FPGA (field programmable gate array), wherein the telescope, the polarizer and the elastic light modulator are sequentially arranged on one side of the detected radiation target, the analyzer and the infrared detector are sequentially arranged on one side of the elastic light modulator, the reference laser and the silicon light detector are respectively arranged on two reflection light paths of the elastic light modulator, the silicon light detector is connected with the amplification filtering module, the amplification filtering module is connected with the zero-crossing comparison module, the infrared detector is connected with the preprocessing module, and the preprocessing module and the zero-crossing comparison module are both connected on the ADC acquisition module, the ADC acquisition module is connected with the drive and spectrum recovery processing module controlled by the FPGA, and the drive and spectrum recovery processing module controlled by the FPGA is connected with the elastic optical modulator.
The reference laser adopts a helium-neon laser, and the wavelength of the reference laser is 632.8 nm.
The maximum conversion signal frequency of the zero-crossing comparison module is not less than 155 MHz.
The wavelength range of the detected radiation target is 1.2-14 mu m.
The preprocessing module comprises a large bandwidth amplifier and a filter, the large bandwidth amplifier is connected with the filter, the large bandwidth amplifier is connected with an infrared detector, and the filter is connected with an ADC (analog-to-digital converter) acquisition module.
A trigger sampling method of an elastic light modulation spectrometer comprises the following steps: the spectrum emitted by the measured radiation target is focused to the polarizer through the telescope, the polarized light is polarized through the polarizer, the polarized light sequentially enters the polarization analyzer and the infrared detector through the elastic optical modulator and is converted into a first electric signal, the first electric signal is amplified and filtered through the preprocessing module and then enters the ADC (analog to digital converter) acquisition module, the reference laser emits reference laser, the reference laser enters the silicon optical detector through the elastic optical modulator and is converted into a second electric signal, the second electric signal is converted into a square wave signal through the amplifying and filtering module and the zero-crossing comparison module and serves as a sampling clock of the ADC acquisition module, the ADC acquisition module is triggered to perform equal optical path difference sampling on the first electric signal converted by the infrared detector, and finally the spectrum is recovered through the drive controlled by the FPGA and the spectrum.
Compared with the prior art, the invention has the following beneficial effects:
1. the method takes the laser with the short wavelength as a reference light source to generate a reference interference pattern, carries out zero-crossing detection on the reference interference pattern to generate a trigger square wave signal, and takes the trigger square wave signal as a clock signal to trigger an ADC (analog to digital converter) acquisition module to realize equal-optical path difference sampling of the interference pattern, and the method can overcome the problems of recovery of a spectrum by a non-uniform discrete Fourier transform algorithm corresponding to the equal-time sampling, large calculated amount, poor real-time performance and the like;
2. the invention can uniformly distribute the acquired data on the standard grid, meet the Cartesian grid condition, directly carry out the fast Fourier transform algorithm to carry out spectrum recovery, and meet the requirements of high-speed and transient spectrum detection;
3. the method comprises the steps of sampling an interferogram, sampling the interferogram at equal optical path difference intervals in the process that a movable mirror of a Fourier transform interferometer moves from a negative maximum optical path difference point to a positive maximum optical path difference point, and performing Fourier transform on the whole interferogram by forming a complete interferogram by collected data to obtain a spectrogram in a certain frequency spectrum range;
4. the invention adopts a short-wavelength laser as a reference light source for sampling and calibration, has good autocorrelation, and in the moving process of the moving mirror, a laser interference signal is an extended cosine wave, aiming at the spectral measurement application of short-wave, medium-wave and long-wave infrared, when the wavelength range is 1.2-14 mu m, the short-wavelength reference laser interference signal is used for triggering sampling under the condition of equal optical path difference, at least twice sampling data is obtained in one period, and the spectrum can be restored with high precision.
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FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a waveform diagram of a reference laser interference signal according to the present invention;
FIG. 3 is a waveform diagram illustrating the conversion of a reference laser signal into a square wave according to the present invention;
FIG. 4 is a waveform diagram of triggered sampling of an interferogram according to the present invention.
Wherein: the system comprises a radiation target to be detected 1, a telescope 2, a polarizer 3, a reference laser 4, an elastic optical modulator 5, a silicon optical detector 6, an analyzer 7, an infrared detector 8, a preprocessing module 9, an ADC (analog-to-digital converter) acquisition module 10, a zero-crossing comparison module 11, an amplification filtering module 12 and a driving and spectrum restoration processing module 13, wherein the radiation target to be detected is controlled by an FPGA (field programmable gate array).
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
A trigger sampling device of an elastic light modulation spectrometer is disclosed, as shown in figure 1, and comprises a radiation target 1 to be detected, a telescope 2, a polarizer 3, a reference laser 4, an elastic light modulator 5, a silicon light detector 6, a polarization analyzer 7, an infrared detector 8, a preprocessing module 9, an ADC (analog-to-digital converter) acquisition module 10, a zero-crossing comparison module 11, an amplification filtering module 12 and a FPGA (field programmable gate array) controlled driving and spectrum restoration processing module 13, wherein the telescope 2, the polarizer 3 and the elastic light modulator 5 are sequentially arranged on one side of the radiation target 1 to be detected, the polarization analyzer 7 and the infrared detector 8 are sequentially arranged on one side of the elastic light modulator 5, the reference laser 4 and the silicon light detector 6 are respectively arranged on two reflection light paths of the elastic light modulator 5, the silicon light detector 6 is connected with the amplification filtering module 12, the amplification filtering module 12 is connected with the zero-crossing comparison module 11, the zero-, the interference signal is positive above the reference level and 0 below it, so the reference laser interference signal can be converted into a series of rectangular waves. The infrared detector 8 is connected with a preprocessing module 9, the preprocessing module 9 and the zero-crossing comparison module 11 are both connected to an ADC acquisition module 10, the ADC acquisition module 10 is connected to a drive and spectrum recovery processing module 13 controlled by the FPGA, and the drive and spectrum recovery processing module 13 controlled by the FPGA is connected to the elastic optical modulator 5.
Further, preferably, the reference laser 4 is a narrow linewidth he-ne laser, and the wavelength of the reference laser 4 is 632.8 nm.
Further, it is preferable that the maximum converted signal frequency of the zero-crossing comparison module 11 is not less than 155 MHz.
Further, preferably, the wavelength range of the detected radiation target 1 is 1.2-14 μm, under the condition of equal optical path difference, the short-wavelength reference laser interference signal is used for triggering sampling, at least twice sampling data is obtained in one period, and the high-precision spectrum recovery can be realized.
Further, the preprocessing module 9 includes a large bandwidth amplifier and a filter, the large bandwidth amplifier is connected with the infrared detector 8, and the filter is connected with the ADC acquisition module 10.
A trigger sampling device method of an elastic light modulation spectrometer comprises the following steps: the spectrum emitted by a measured radiation target is focused on a polarizer through a telescope, the polarized light is polarized by the polarizer, the polarized light sequentially enters an analyzer through an elastic optical modulator, is converted into a first electric signal by an infrared detector, is amplified and filtered by a preprocessing module, then enters an ADC (analog to digital converter) acquisition module, the reference laser emits reference laser, the reference laser enters a silicon optical detector through the elastic optical modulator and is converted into a second electric signal, the second electric signal is converted into a square wave signal serving as a sampling clock of the ADC acquisition module through an amplifying and filtering module and a zero-crossing comparison module, the ADC acquisition module is triggered to perform equal optical path difference sampling on the first electric signal converted by the infrared detector, and finally, the spectrum is recovered through a driving and spectrum recovery processing module controlled by an FPGA (. In the process of sampling the interferogram, equal optical path difference sampling of the interferogram is realized, that is, interference data are acquired at equal optical path difference intervals instead of at equal time intervals, so that the problems of large calculated amount, poor real-time performance and the like caused by spectrum restoration by a non-uniform discrete Fourier transform algorithm corresponding to the equal time sampling are solved.
Examples
Electro-optical, magneto-optical, acousto-optical, elasto-optical modulators, which tune the refractive index of a material by electrical, magnetic, ultrasonic or stress, etc., may be used as interferometers in Fourier Transform Spectrometers (FTS). Among them, the application potential of the photoelastic modulator in the FTS is great. Elasto-optical modulation is an artificial birefringence phenomenon based on the elasto-optical effect. The PEM is primarily composed of a driver to generate the driving force and an elasto-optic birefringent crystal, which is typically driven by a piezoelectric driver. The basic working principle is that the optical element and the piezoelectric driver are coupled in a certain mode, a periodic stress is applied through the piezoelectric driver, so that the optical element and the piezoelectric driver perform periodic reciprocating motion in opposite directions, the whole elastic optical modulator generally works in a fundamental frequency mode, wherein v is the sound velocity in a material, and the whole vibration process of the boundary of the optical element and the piezoelectric driver belongs to simple harmonic vibration.
In the photoelastic modulation spectrometer, fourier transform is performed on an interference signal, and the power spectrum distribution of an incident beam is restored as follows:
Figure BDA0002622663310000061
first, in the photoelastic modulation spectrometer, an interferogram detected by a detector is continuously changed, and in order to realize the fourier transform described in the above formula, the interferogram needs to be sampled. During the process that a moving mirror of the Fourier transform interferometer moves from a negative maximum optical path difference point to a positive maximum optical path difference point, the interferogram is sampled at equal optical path difference intervals, and the collected data can form a complete interferogram. Fourier transform is carried out on the whole interference pattern, and a spectrogram in a certain frequency spectrum range can be obtained.
From the relation between the optical path difference and the wavelength
Figure BDA0002622663310000062
The sampling point number is inversely proportional to the wavelength at a certain optical path difference.
If the spectral resolution of the system is required to be 32cm-1When a reference laser is a He-Ne laser of 632.8nm, the maximum optical path difference is 0.312mm, and the data amount acquired in one cycle is 0.312 × 10, N3If the wavelength of the measured radiation target is 1.2 microns, the quantity of data which can be collected in one period is 2 times of that of the reference laser interference signal, and the data can be used for spectrum restoration, so that the accuracy of restoring the spectrogram is improved.
In fig. 1, a reference laser interference signal from a reference laser needs to pass through a signal conditioning circuit and then, after passing through a silicon photodetector, then, the signal is amplified and filtered to obtain a useful signal, at the moment, the signal is required to be converted into a square wave signal through zero-crossing comparison to be used as a sampling clock of an ADC (analog to digital converter) acquisition module to sample the previous signal which is subjected to adjustable amplification and filtering, when the wavelength range is 1.2-14 mu m for the application of short-wave, medium-wave and long-wave infrared spectrum measurement, the number of points which can be collected in one period is more, the interference data after AD conversion can directly realize the spectrum reconstruction of the incident signal by utilizing FFT after the interference data is preprocessed, the method is characterized in that a sampling clock of an ADC acquisition module chip is not generated by a special clock circuit, is provided by an interference signal, and samples the measured interference pattern in an equal optical path difference mode. As shown in fig. 2, the reference laser interference signal is amplified, filtered, compared with zero crossing, and then converted into a square wave signal as shown in fig. 3, and the square wave signal is sent to the clock input of the ADC converter, as shown in fig. 4, and the interference signal is sampled.
The phase difference of the photoelastic modulation Fourier transform interferogram changes in a sine mode, and when monochromatic light is used as a radiation source, the generated interferogram is a cosine wave with density changing. Therefore, when the polychromatic light is used as a radiation source, the equal optical path difference sampling of the elastic optical modulation Fourier transform interference pattern can be realized by using the short-wavelength laser as a reference laser, generating a square wave signal when the laser interference signal crosses zero, and using the square wave signal as a clock of the ADC acquisition module to realize the equal optical path difference sampling of the polychromatic light interference signal. In the equal optical path difference sampling, a reference laser interference signal needs to be converted into an electric signal through a silicon photodetector, and the electric signal is converted into a square wave signal through a zero comparison technology and serves as a sampling clock of an ADC (analog to digital converter) acquisition module.
The zero-crossing comparison module is used for setting a reference level, the interference signal is positive when being higher than the reference level, and is 0 when being lower than the reference level, so that the reference laser interference signal can be converted into a series of rectangular waves. Therefore, the reference laser interference signal is converted into the square wave signal to trigger the ADC acquisition module to acquire, and the reference laser interference signal is acquired once through each square wave signal and is equivalent to a sampling CLOCK serving as the ADC acquisition module, so that equal optical path difference sampling of the interference pattern is realized.
The invention has the advantages that interference data of short-wave, medium-wave and long-wave infrared spectrums after being triggered and sampled by short-wave reference laser interference signals are preprocessed, spectrum reconstruction of incident signals can be realized by directly utilizing FFT (fast Fourier transform algorithm), and sampling is carried out in an equal optical path difference mode in the spectrum interference sampling process, namely interference data are acquired at equal optical path difference intervals instead of interference data are acquired at equal time intervals. The method has the advantages that the problems of large calculation amount, poor real-time performance and the like caused by the fact that the spectrum is restored by a non-uniform discrete Fourier transform algorithm corresponding to isochronous sampling can be avoided, and therefore the accuracy of the restored spectrogram is influenced. Secondly, a reference laser with a short wavelength is used as a reference laser for sampling and calibration, such as a 632.8nm laser. The reference laser is a narrow-band spectrum, has good autocorrelation, and is used for measuring short-wave, medium-wave and long-wave infrared spectrums, when the wavelength range is 1.2-14 mu m, under the condition of equal optical path difference, the short-wavelength reference laser interference signal is used for triggering sampling, at least twice sampling data is obtained in one period, and the high-precision spectrum recovery can be realized.
Although only the preferred embodiments of the present invention have been described in detail, the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art, and all changes are encompassed in the scope of the present invention.

Claims (6)

1. The utility model provides a trigger sampling device of photoelastic modulation type spectrum appearance which characterized in that: the device comprises a detected radiation target (1), a telescope (2), a polarizer (3), a reference laser (4), an elastic light modulator (5), a silicon light detector (6), an analyzer (7), an infrared detector (8), a preprocessing module (9), an ADC (analog to digital converter) acquisition module (10), a zero-crossing comparison module (11), an amplification filtering module (12) and a FPGA (field programmable gate array) controlled driving and spectrum restoration processing module (13), wherein the telescope (2), the polarizer (3) and the elastic light modulator (5) are sequentially arranged on one side of the detected radiation target (1), the analyzer (7) and the infrared detector (8) are sequentially arranged on one side of the elastic light modulator (5), the reference laser (4) and the silicon light detector (6) are respectively arranged on two reflection light paths of the elastic light modulator (5), and the silicon light detector (6) is connected with the amplification filtering module (12), the device comprises an amplifying and filtering module (12), an infrared detector (8), a preprocessing module (9), a zero-crossing comparison module (11), an ADC (analog to digital converter) acquisition module (10), an FPGA (field programmable gate array) controlled driving and spectrum restoration processing module (13), and an elasto-optical modulator (5) connected with the FPGA controlled driving and spectrum restoration processing module (13), wherein the infrared detector (8) is connected with the preprocessing module (9), the preprocessing module (9) and the zero-crossing comparison module (11) are both connected to the ADC acquisition module (10).
2. The triggered sampling device of claim 1, wherein: the reference laser (4) adopts a helium-neon laser with a narrow line width, and the wavelength of the reference laser (4) is 632.8 nm.
3. The triggered sampling device of claim 1, wherein: the maximum conversion signal frequency of the zero-crossing comparison module (11) is not less than 155 MHz.
4. The triggered sampling device of claim 1, wherein: the wavelength range of the detected radiation target (1) is 1.2-14 mu m.
5. The triggered sampling device of claim 1, wherein: the preprocessing module (9) comprises a large bandwidth amplifier and a filter, the large bandwidth amplifier is connected with the filter, the large bandwidth amplifier is connected with an infrared detector (8), and the filter is connected with an ADC (analog to digital converter) acquisition module (10).
6. A trigger sampling method of an elastic light modulation spectrometer is characterized in that: comprises the following steps: the spectrum emitted by the measured radiation target is focused to the polarizer through the telescope, the polarized light is polarized through the polarizer, the polarized light sequentially enters the polarization analyzer and the infrared detector through the elastic optical modulator and is converted into a first electric signal, the first electric signal is amplified and filtered through the preprocessing module and then enters the ADC (analog to digital converter) acquisition module, the reference laser emits reference laser, the reference laser enters the silicon optical detector through the elastic optical modulator and is converted into a second electric signal, the second electric signal is converted into a square wave signal through the amplifying and filtering module and the zero-crossing comparison module and serves as a sampling clock of the ADC acquisition module, the ADC acquisition module is triggered to perform equal optical path difference sampling on the first electric signal converted by the infrared detector, and finally the spectrum is recovered through the drive controlled by the FPGA and the spectrum.
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