CN111739457A - Gamma debugging system and gamma debugging method - Google Patents
Gamma debugging system and gamma debugging method Download PDFInfo
- Publication number
- CN111739457A CN111739457A CN202010630617.7A CN202010630617A CN111739457A CN 111739457 A CN111739457 A CN 111739457A CN 202010630617 A CN202010630617 A CN 202010630617A CN 111739457 A CN111739457 A CN 111739457A
- Authority
- CN
- China
- Prior art keywords
- signal
- display panel
- frequency
- calibration module
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 27
- 230000000694 effects Effects 0.000 claims abstract description 6
- 230000005540 biological transmission Effects 0.000 claims description 42
- 108010037490 Peptidyl-Prolyl Cis-Trans Isomerase NIMA-Interacting 4 Proteins 0.000 description 12
- 102100031653 Peptidyl-prolyl cis-trans isomerase NIMA-interacting 4 Human genes 0.000 description 12
- 108010059419 NIMA-Interacting Peptidylprolyl Isomerase Proteins 0.000 description 9
- 102100026114 Peptidyl-prolyl cis-trans isomerase NIMA-interacting 1 Human genes 0.000 description 9
- 102000007315 Telomeric Repeat Binding Protein 1 Human genes 0.000 description 9
- 108010033711 Telomeric Repeat Binding Protein 1 Proteins 0.000 description 9
- 101150087393 PIN3 gene Proteins 0.000 description 8
- 239000013078 crystal Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 230000027455 binding Effects 0.000 description 4
- 238000009739 binding Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 101100190527 Arabidopsis thaliana PIN5 gene Proteins 0.000 description 2
- 101100190530 Arabidopsis thaliana PIN8 gene Proteins 0.000 description 2
- 241001637516 Polygonia c-album Species 0.000 description 2
- 238000004590 computer program Methods 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 241001270131 Agaricus moelleri Species 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/2007—Display of intermediate tones
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Controls And Circuits For Display Device (AREA)
Abstract
The invention discloses a gamma debugging system and a gamma debugging method. The gamma debugging system comprises lighting equipment, a tearing effect TE signal calibration module and an image acquisition module, wherein the TE signal calibration module acquires a TE signal of the display panel to be tested through the lighting equipment and sends adjustment information to the lighting equipment according to the frequency of the TE signal sent by the display panel to be tested; the lighting equipment adjusts the frequency of the TE signal sent by the display panel to be tested according to the adjustment information; and the image acquisition equipment acquires the display parameters of the display panel to be detected according to the adjustment result meeting the preset condition, wherein the display parameters are acquired within the time length of one frame. According to the embodiment of the invention, the gamma debugging time can be shortened.
Description
Technical Field
The invention relates to the technical field of display, in particular to a gamma debugging system and a gamma debugging method.
Background
In general, gamma debugging is performed on each display panel before the display panel is shipped from a factory. The gamma debugging of the display panel may be performed by adjusting a voltage signal of the display panel or adjusting a duty ratio of a light emission control signal (EM) of the display panel.
Different display panels send the frequency of Tearing Effect (TE) signal to have difference, and at present through the duty cycle of the luminous control signal (EM) of adjusting display panel, carry out gamma debugging in-process to display panel, in order to guarantee the precision of gamma debugging, can only two frames gather display panel's display parameter once, lead to gamma debugging time longer.
Disclosure of Invention
The embodiment of the invention provides a gamma debugging system and a gamma debugging method, which can shorten the gamma debugging time.
In a first aspect, an embodiment of the present invention provides a gamma debugging system, including a lighting device, a tear-effect TE signal calibration module, and an image acquisition module, where the TE signal calibration module acquires a TE signal of a display panel to be tested through the lighting device, and sends adjustment information to the lighting device according to a frequency at which the TE signal is sent by the display panel to be tested;
the lighting equipment adjusts the frequency of the TE signal sent by the display panel to be tested according to the adjustment information;
and the image acquisition equipment acquires the display parameters of the display panel to be detected according to the adjustment result meeting the preset condition, wherein the display parameters are acquired within the time length of one frame.
In a possible implementation manner of the first aspect, the TE signal calibration module calculates an interval duration of two adjacent TE signals, and sends the adjustment information to the lighting device according to the interval duration.
In a possible implementation manner of the first aspect, the preset condition includes a preset frequency range, the TE signal calibration module determines that the sending frequency of the TE signal is smaller than a minimum value of the preset frequency range, and the TE signal calibration module sends the first adjustment information to the lighting device; or,
the TE signal calibration module determines that the sending frequency of the TE signal is larger than the maximum value of the preset frequency range, and the TE signal calibration module sends second adjustment information to the lighting equipment;
or,
the TE signal calibration module determines that the sending frequency of the TE signal is within a preset frequency range, and sends stop adjustment information to the lighting equipment.
In a possible implementation manner of the first aspect, the TE signal calibration module includes a first pin, a second pin, and a third pin, and the TE signal calibration module sends the first adjustment information through the first pin, sends the second adjustment information through the second pin, and sends the stop adjustment information through the third pin.
In a possible implementation manner of the first aspect, the lighting device sends adjustment completion information to the TE signal calibration module after adjusting the frequency of the TE signal sent by the display panel to be tested each time;
the TE signal calibration module further comprises a fourth pin and a fifth pin, the TE signal calibration module receives adjustment completion information through the fourth pin, and the TE signal calibration module receives a TE signal through the fifth pin.
In a possible implementation manner of the first aspect, the first adjustment information, the second adjustment information, the non-adjustment information, and the adjustment completion information are all high level signals or all low level signals.
In a possible implementation manner of the first aspect, before the lighting device obtains the TE signal sent by the display panel to be tested, the lighting device further transmits the first grayscale picture to the display panel to be tested to light the display panel to be tested.
In a second aspect, an embodiment of the present invention provides a gamma debugging method, including:
receiving a TE signal, wherein the TE signal is sent by a display panel to be tested;
judging whether the sending frequency of the TE signal is within a preset frequency range or not;
if the sending frequency of the TE signal is not in the preset frequency range, adjusting the sending frequency of the TE signal until the adjusted sending frequency is in the preset frequency range;
and performing gamma debugging on the display panel to be tested by adopting a mode of acquiring the display parameters of the display panel to be tested once within one frame of time.
In a possible implementation manner of the second aspect, the determining whether the transmission frequency of the TE signal is within a preset frequency range includes:
calculating the interval duration of two adjacent TE signals;
and judging whether the sending frequency of the TE signal is in a preset frequency range or not according to the interval duration.
In a possible implementation manner of the second aspect, if the transmission frequency of the TE signal is not within the preset frequency range, the adjusting the transmission frequency of the TE signal includes:
if the sending frequency of the TE signal is smaller than the minimum value of the preset frequency range, increasing the sending frequency of the TE signal;
and if the sending frequency of the TE signal is greater than the maximum value of the preset frequency range, reducing the sending frequency of the TE signal.
According to the gamma debugging system and the gamma debugging method provided by the embodiment of the invention, the TE signal calibration module acquires a TE signal sent by the display panel to be tested, and sends adjustment information according to the sending frequency of the TE signal and the phase point lamp equipment; and the lighting equipment adjusts the frequency of the TE signal sent by the display panel to be tested according to the adjustment information. And the image acquisition equipment acquires the display parameters of the display panel to be detected according to the adjustment result meeting the preset condition, wherein the display parameters are acquired within the time length of one frame. That is, after the frequency of the TE signal sent by the display panel to be tested meets the preset condition, the image acquisition device may acquire the display parameters of the display panel to be tested in a frame-by-frame acquisition manner. The frequency of the TE signal sent by the display panel to be tested can be adjusted to accord with preset conditions through the TE signal calibration module and the lighting equipment, the TE signal can be sent by the display panel to be tested with accurate sending frequency, so that the image acquisition equipment can acquire data in a frame-acquisition mode, and the sub-pixel positions in a luminous state in the display panel to be tested are the same when the image acquisition equipment acquires display parameters at each time, so that the gamma debugging time can be shortened while the gamma debugging effect is ensured.
Drawings
Other features, objects and advantages of the invention will become apparent from the following detailed description of non-limiting embodiments thereof, when read in conjunction with the accompanying drawings, in which like reference characters designate the same or similar parts throughout the figures thereof, and which are not to scale.
FIG. 1 is a schematic diagram illustrating a gamma debugging system according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram illustrating an example of a TE signal calibration module and a lighting device;
fig. 3 shows an interaction timing diagram of an exemplary TE signal calibration module and a lighting device;
fig. 4 shows a flowchart of a gamma debugging method provided by yet another example.
Detailed Description
Features and exemplary embodiments of various aspects of the present invention will be described in detail below, and in order to make objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not to be construed as limiting the invention. It will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present invention by illustrating examples of the present invention.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
For example, the gamma debugging may be performed on the display panel by adjusting a duty ratio of an emission control signal (EM) of the display panel, that is, by adjusting an emission time period of sub-pixels of the display panel. The EM signal may be a square wave signal. Illustratively, the sub-pixels of the display panel emit light when the EM signal is low, and do not emit light when the EM signal is high. The light emitting duration of the sub-pixel (i.e., the duty ratio of the EM signal) can be controlled by controlling the durations of the high level and the low level of the EM signal within the duration of one frame. For example, if the display panel includes 100 rows of sub-pixels and the duty ratio of the EM signal is 50%, 50 rows of sub-pixels of the display panel are in the light-emitting state and the other 50 rows of sub-pixels are in the non-light-emitting state in each frame period. Taking the refresh frequency of the display panel as 60Hz as an example, ideally, the frequency of sending the TE signal by the display panel is 60Hz, i.e. sending the TE signal every 1/60 seconds. However, there is a difference in the frequency at which different display panels transmit the TE signal, which may be greater or less than 60 Hz.
If the TE signal sent by the display panel is not 60Hz, and the duty ratio of the EM signal is still 50%, for example, if the image capturing device performs data capturing in the manual mode (1 frame 1 capturing), for example, at the time of the first frame capturing, the sub-pixels in the 1 st to 50 th rows may be in the light-emitting state, at the time of the second frame capturing, the sub-pixels in the 3 rd to 52 th rows may be in the light-emitting state, at the time of the third capturing, the sub-pixels in the 5 th to 54 th rows may be in the light-emitting state, and the like. That is, the position of the sub-pixel in the display panel in the light-emitting state is different each time the acquisition is performed, so that black blocks with different proportions are acquired each time, which affects the accuracy of gamma adjustment. Therefore, in order to ensure the accuracy of gamma debugging, the image acquisition device can only adopt an INT (2 frame 1 acquisition) mode for data acquisition, resulting in a long gamma debugging time.
In order to solve the above problems, embodiments of the present invention provide a gamma debugging system and a gamma debugging method, and embodiments of the gamma debugging method and the gamma debugging apparatus will be described below with reference to the accompanying drawings.
Fig. 1 is a schematic structural diagram illustrating a gamma debugging system according to an embodiment of the present invention. As shown in fig. 1, the gamma debugging system according to the embodiment of the present invention may include a lighting device 1, a TE signal calibration module 2, and an image acquisition module 3. The gamma debugging system is used for carrying out gamma debugging on the display panel 4 to be tested. The display panel to be tested may be an Organic Light Emitting Diode (OLED) display panel or a liquid crystal display panel.
The TE signal calibration module 2 obtains the TE signal sent by the display panel to be tested 4 through the lighting device 1, and sends adjustment information to the lighting device 1 according to the frequency of the TE signal sent by the display panel to be tested. The lighting device 1 adjusts the frequency at which the display panel 4 to be measured transmits the TE signal according to the adjustment information. The image acquisition equipment 3 acquires display parameters of the display panel 4 to be detected according to the adjustment result meeting the preset condition, wherein the display parameters are acquired within the duration of one frame.
According to the embodiment of the invention, the frequency of the TE signal sent by the display panel to be tested can be adjusted to accord with the preset condition through the TE signal calibration module and the lighting equipment, the display panel to be tested can be ensured to send the TE signal at a more accurate sending frequency, so that the image acquisition equipment can be ensured to acquire data in a frame-by-frame acquisition mode, and the positions of the sub-pixels in the luminous state in the display panel to be tested are ensured to be the same when the image acquisition equipment acquires the display parameters every time, so that the gamma debugging effect can be ensured, and meanwhile, the gamma debugging time can be shortened.
Exemplarily, the lighting device 1 may be a lighting engine (PG). For example, the gray scale range that the display panel 4 to be tested can display is 0 to 255. When the gamma debugging is performed on the display panel to be tested, some gray scale binding points are usually selected from the 0-255 gray scales. For example, 60, 128, 255 gray levels, etc. are selected as gray level tie points. First, the lighting device 1 transmits a first gray scale picture to the display panel 4 to be tested to light the display panel 4 to be tested. The first gray scale picture is a gray scale binding picture. The first gray scale picture is transmitted to the display panel 4 to be tested through the lighting equipment 1, and the gamma debugging of the display panel to be tested under any gray scale can be conveniently realized.
Illustratively, the image capture device 3 may be a color analyzer. Specifically, the model of the color analyzer may be CA410 or CA 310.
Illustratively, the gamma debugging system provided by the invention can also comprise a Personal Computer (PC) 5. The PC5 transmits the first grayscale picture to the lighting device 1. Also, the PC5 acquires the display parameters acquired by the image acquisition apparatus 3 and analyzes the display parameters. For example, the display parameter is the actual display brightness of the display panel 4 to be tested at the 255 gray scale, the 255 gray scale corresponds to the target brightness, the PC5 may compare the actual display brightness acquired by the image acquisition device 3 with the target brightness, and adjust the duty ratio of the EM signal of the display panel to be tested according to the comparison result.
After the display panel 4 to be tested is lit, a TE signal is sent to the lighting device 1 at a fixed frequency. For example, the refresh frequency of the display panel 4 to be tested is 60Hz, and ideally, the frequency of the TE signal sent by the display panel 4 to be tested is also 60 Hz. However, there is a difference between different display panels, and the frequency of sending the TE signal by the display panel 4 to be tested is not necessarily 60 Hz.
The TE signal calibration module 2 obtains the TE signal sent by the display panel 4 to be tested through the lighting device 1. That is, after the lighting device 2 acquires the TE signal sent by the display panel 4 to be tested, the received TE signal is immediately sent to the TE signal calibration module 2. It should be understood that the frequency at which the lighting device 2 transmits the TE signal is the same as the frequency at which the display panel 4 to be tested transmits the TE signal.
The TE signal calibration module 2 may receive a plurality of TE signals for a certain period of time. The TE signal calibration module 2 may calculate an interval duration of two adjacent TE signals, and send adjustment information to the lighting device 1 according to the interval duration of the two adjacent TE signals. The adjustment information includes information for adjusting the frequency at which the display panel 4 to be tested transmits the TE signal. The TE signal may be a high level signal. Specifically, the TE signal may include a rising edge and a falling edge, and the TE signal calibration module 2 may calculate an interval duration of the rising edge of two adjacent TE signals, or calculate an interval duration of the falling edge of two adjacent TE signals.
According to the embodiment of the invention, the TE signal calibration module 2 can accurately calculate the sending frequency of the TE signal, so that the frequency of the TE signal sent by the display panel to be tested is accurately adjusted.
It should be understood that the frequency of sending the TE signals by the display panel 4 to be tested is fixed, i.e. the interval duration of any two adjacent TE signals is the same. The TE signal calibration module 2 may calculate the interval duration of any two adjacent TE signals to determine the transmission frequency of the TE signal. For example, if the interval duration of two adjacent TE signals is t, the transmission frequency of the TE signal is considered to be 1/t. The TE signal calibration module 2 may compare the calculated transmission frequency 1/t of the TE signal with a preset condition, and transmit adjustment information to the lighting device 1 according to the comparison result.
In some alternative embodiments, the preset condition may include a preset frequency range. The range may be centered on the refresh frequency value of the display panel 4 to be tested. Illustratively, the refresh frequency of the display panel 4 to be tested is 60Hz, and the preset frequency range may be set to be 60Hz ± eHz. To ensure the adjustment accuracy, e can be set relatively small. For example, e may be 0.2.
For example, the TE signal calibration module 2 determines that the sending frequency 1/t of the TE signal is smaller than the minimum value of the preset frequency range, and the TE signal calibration module 2 sends the first adjustment information to the lighting device 1. That is, the first adjustment information indicates that the transmission frequency of the TE signal is less than the minimum value of the preset frequency range. Further, the lighting device 1 adjusts the frequency of the TE signal transmitted by the display panel 4 to be measured according to the first adjustment information. Since the first adjustment information indicates that the transmission frequency of the TE signal is less than the minimum value of the preset frequency range, the lighting device 1 may increase the transmission frequency of the TE signal.
For example, the TE signal calibration module 2 determines that the transmission frequency 1/t of the TE signal is greater than the maximum value of the preset frequency range, and the TE signal calibration module 2 transmits the second adjustment information to the lighting device 1. That is, the second adjustment information indicates that the transmission frequency of the TE signal is greater than the maximum value of the preset frequency range. Further, the lighting device 1 adjusts the frequency of the TE signal transmitted by the display panel 4 to be measured according to the second adjustment information. Since the second adjustment information indicates that the transmission frequency of the TE signal is greater than the maximum value of the preset frequency range, the lighting device 1 may reduce the transmission frequency of the TE signal.
For example, the TE signal calibration module 2 determines that the transmission frequency of the TE signal is within the preset frequency range, and the TE signal calibration module 2 transmits the stop adjustment information to the lighting device 1. That is, the transmission frequency of the TE signal meets the requirement, and the lighting device 1 does not need to adjust the frequency of the TE signal transmitted by the display panel 4 to be tested.
It should be understood that, after the lighting device 1 adjusts the frequency of the TE signal transmitted by the display panel 4 to be tested, the TE signal calibration module 2 continues to calculate the adjusted transmission frequency of the TE signal, and compares the adjusted transmission frequency with the preset frequency range, if the adjusted transmission frequency is still not within the preset frequency range, the TE signal calibration module 2 continues to transmit the adjustment information to the lighting device 1 until the adjusted transmission frequency of the TE signal is within the preset frequency range, and the lighting device 1 does not need to adjust the frequency of the TE signal transmitted by the display panel 4 to be tested. Namely, the TE signal calibration module 2 sends adjustment information to the lighting device 1 according to the frequency of the TE signal sent by the display panel to be tested, and the lighting device 1 adjusts the frequency of the TE signal sent by the display panel to be tested according to the adjustment information, which is a continuously cyclic process, and the stop condition is that the frequency of the TE signal sent by the display panel to be tested is within the preset frequency range.
According to the embodiment of the present invention, the TE signal calibration module 2 transmits different adjustment information to the lighting device 1 according to the actual condition of the transmission frequency of the TE signal, so that the lighting device 1 can adjust the transmission frequency of the TE signal more accurately.
Illustratively, the display panel 4 to be tested includes an Integrated Circuit (IC), a crystal oscillator module is disposed on the IC, and the display panel 4 to be tested can control the sending frequency of the TE signal through the crystal oscillator module. In the above embodiment, the lighting device 1 may adjust the register value of the crystal module of the display panel 4 to be tested, thereby adjusting the transmission frequency of the TE signal. After the lighting device 1 adjusts the transmission frequency of the TE signal to meet the preset frequency range, the register value meeting the condition is burned into the display panel 4 to be tested.
For example, the resolution of the display panel 4 to be tested is 1080 × 2340, the refresh frequency of the display panel 4 to be tested is 60Hz, the frequency of the TE signal sent by the display panel 4 to be tested should also be 60Hz, at this time, the duration of one frame is 16.67ms, the duration of one line is 16.67ms/2340, that is, the duration of one line is 7.1us, and the refresh frequency of the display panel 4 to be tested is generated by an Oscillator (OSC) module, for example, the OSC is 103MHz, and then the relationship (1) should be satisfied:
duration of one line (1) (1/103 MHz). n ═ n
Where n is the register value of the IC of the display panel 4 to be tested. Specifically, the lighting device 1 may adjust the specific value of n to obtain a transmission frequency of the TE signal that meets the requirement. For example, to adjust the transmission frequency of the TE signal to 60Hz, n should correspond to (1/103MHz) × n ═ 7.1 us.
Fig. 2 is a schematic structural diagram illustrating an example of a TE signal calibration module and a lighting device. In some alternative embodiments, as shown in fig. 2, the TE signal calibration module 2 may include a first PIN1, a second PIN2, and a third PIN 3. The TE signal calibration module 2 may transmit the first adjustment information through the first PIN1, the second adjustment information through the second PIN2, and the stop adjustment information through the third PIN 3. Namely, the first PIN1, the second PIN2 and the third PIN3 are all data transmission PINs of the TE signal calibration module 2. Through setting up different pins, send different adjustment information, can avoid the mutual interference between the different information.
In some optional embodiments, after adjusting the frequency of the TE signal sent by the display panel to be tested 4 each time, the lighting device 1 sends adjustment completion information to the TE signal calibration module 2. The TE signal calibration module 2 detects whether the transmission frequency of the adjusted TE signal is within a preset frequency range. Thus, the TE signal calibration module 2 can be prevented from sending out wrong adjustment information according to the sending frequency of the TE signal before adjustment.
Referring to fig. 2, the TE signal calibration module 2 further includes a fourth PIN4 and a fifth PIN5, the TE signal calibration module 2 receives the adjustment completion information through the fourth PIN4, and the TE signal calibration module 2 receives the TE signal through the fifth PIN 5. It should be understood that the TE signal is originally sent out by the display panel 4 to be tested, and only the TE signal calibration module 2 receives the TE signal sent out by the display panel 4 to be tested through the lighting device 1.
The fourth PIN4 and the fifth PIN5 are both data receiving PINs of the TE signal calibration module 2. Through setting up different pins, receive different information, can avoid the mutual interference between the different information.
In some optional embodiments, the first adjustment information, the second adjustment information, the non-adjustment information, and the adjustment completion information may all be high level signals or all be low level signals. Fig. 3 shows an interaction timing diagram of an exemplary TE signal calibration module and a lighting device. In fig. 3, the first adjustment information, the second adjustment information, the non-adjustment information, and the adjustment completion information are all high level signals as an example.
As described above, the first PIN1, the second PIN2 and the third PIN3 are all data transmission PINs of the TE signal calibration module 2, and their initial levels may all be low. The fourth PIN4 is a data receiving PIN of the TE signal calibration module 2 and is set to Floating by default. For example, the TE signal calibration module 2 and the lighting device 1 work as follows, taking the preset frequency range as 60Hz as an example.
The TE signal calibration module 2 detects that the sending frequency of the TE signal is less than 60Hz, the TE signal calibration module 2 sends a high level signal to the lighting device 1 through the first PIN1, after the lighting device 1 receives the high level signal from the first PIN1, the register value of the crystal oscillator module of the display panel 4 to be tested is adjusted to increase the sending frequency of the TE signal, and after the adjustment is completed, the high level signal is sent to the fourth PIN4 of the TE signal calibration module 2.
After receiving the high level signal through the fourth PIN4, the TE signal calibration module 2 continues to detect the transmission frequency of the TE signal. Illustratively, after receiving the high level signal through the fourth PIN4, the TE signal calibration module 2 continues to detect that the sending frequency of the TE signal is greater than 60Hz, the TE signal calibration module 2 sends the high level signal to the lighting device 1 through the second PIN2, after receiving the high level signal from the second PIN2, the lighting device 1 adjusts the register value of the crystal module of the display panel 4 to be tested to reduce the sending frequency of the TE signal, and sends the high level signal to the fourth PIN4 of the TE signal calibration module 2 after the adjustment is completed.
The TE signal calibration module 2 and the lighting device 1 continuously repeat the above process until the TE signal calibration module 2 detects that the sending frequency of the TE signal is equal to 60Hz after receiving the high level signal through the fourth PIN 4. At this time, the TE signal calibration module 2 sends a high level signal to the lighting device 1 through the third PIN3, and after the lighting device 1 receives the high level signal from the third PIN3, the adjustment of the register value of the crystal oscillator module of the display panel 4 to be tested is stopped. And the lighting device 1 stops sending a high level signal to the fourth PIN4 of the TE signal calibration module 2.
To sum up, if the first PIN1 is a high level signal, and the second PIN2 and the third PIN3 are low level signals, the lighting device 1 needs to increase the transmission frequency of the TE signal, and the fourth PIN4 is a high level signal, and informs the TE signal calibration module 2 to continue to detect the transmission frequency of the TE signal.
The second PIN2 is a high level signal, the first PIN1 and the third PIN3 are low level signals, the lighting device 1 needs to reduce the transmission frequency of the TE signal, and the fourth PIN4 is a high level signal, and informs the TE signal calibration module 2 to continue to detect the transmission frequency of the TE signal.
The third PIN3 is a high level signal, and the first PIN1 and the second PIN2 are low level signals, so that the lighting device 1 does not need to adjust the transmission frequency of the TE signal, and the fourth PIN4 is a low level signal, which informs the TE signal calibration module 2 that the transmission frequency of the TE signal is no longer detected.
Illustratively, the TE signal calibration module 2 may be a Micro Controller Unit (MCU). Its model may be C8051F 340.
Illustratively, after receiving the high signal from the third PIN3, the lighting device 1 may notify the image pickup device 3 to perform image pickup. Or, after the TE signal calibration module 2 detects that the sending frequency of the TE signal meets the requirement, it informs the image acquisition device 3 to perform image acquisition.
The inventor of the present application has experimentally proved that, according to the embodiment of the present invention, the transmission frequency of the TE signal can be adjusted to be within the predetermined frequency range in about 3 seconds.
For example, to perform gamma debugging when the refresh frequency of the display panel to be tested is 60Hz, for example, there are 7 groups of gammas in the EM signal section, each group of gammas has 15 gray level bindings, each gray level binding is debugged (tunning)10 times, in the related art, the image acquisition apparatus performs data acquisition in the INT mode (i.e., 2-frame 1 acquisition), the required time T1 is 7 × 15 × 10 × 0.01667 × 2, and the required time T1 is about 35 seconds. According to the gamma debugging system provided by the embodiment of the invention, the image acquisition device performs data acquisition in a manual mode (i.e. 1 frame 1 acquisition), and the required time T2 is 7 × 15 × 10 × 0.01667, and the required time T2 is about 17.5 seconds. Therefore, the gamma debugging system provided by the embodiment of the invention can greatly shorten the gamma debugging time, thereby improving the production capacity of a production line.
The embodiment of the invention also provides a gamma debugging method. Fig. 4 shows a flowchart of a gamma debugging method provided by yet another example. As shown in fig. 4, the gamma debugging method provided by the embodiment of the present invention includes the following steps:
According to the gamma debugging method provided by the embodiment of the invention, the frequency of the TE signal sent by the display panel to be tested can be adjusted to be within the preset frequency range, the display panel to be tested can be ensured to send the TE signal at a more accurate sending frequency, so that the image acquisition equipment can be ensured to acquire data in a frame-by-frame acquisition mode, and the positions of the sub-pixels in the luminous state in the display panel to be tested are ensured to be the same when the image acquisition equipment acquires the display parameters every time, so that the gamma debugging effect can be ensured, and the gamma debugging time can be shortened.
For example, the step 110 and the step 120 may be performed by the TE signal calibration module 2. The above step 130 may be performed by the lighting device 1. The image acquisition module 3 may complete the data acquisition in step 140, and the lighting device 1, the TE signal calibration module 2, the image acquisition module 3, and the PC5 cooperate with each other to complete the gamma debugging of the display panel to be tested.
It should be understood that the present application does not adjust the TE signal itself, but adjusts the transmission frequency of the TE signal. For example, the TE signal may be a 1.8v level signal, and the TE signal itself is not adjusted in size.
In some optional embodiments, step 120 may specifically include:
step 121, calculating the interval duration of two adjacent TE signals;
and step 122, judging whether the sending frequency of the TE signal is in a preset frequency range or not according to the interval duration.
According to the embodiment of the invention, the sending frequency of the TE signal can be accurately calculated, so that the frequency of the TE signal sent by the display panel to be tested is accurately adjusted.
In some optional embodiments, in step 130, if the sending frequency of the TE signal is not within the preset frequency range, the step of adjusting the sending frequency of the TE signal may specifically include:
step 131, if the sending frequency of the TE signal is smaller than the minimum value of the preset frequency range, increasing the sending frequency of the TE signal;
in step 132, if the sending frequency of the TE signal is greater than the maximum value of the preset frequency range, the sending frequency of the TE signal is decreased.
If the sending frequency of the TE signal is smaller than the minimum value of the preset frequency range, it indicates that the sending frequency of the TE signal is too small, and the sending frequency of the TE signal is increased, so that the sending frequency of the TE signal can meet the requirement as soon as possible. If the sending frequency of the TE signal is greater than the maximum value of the preset frequency range, it indicates that the sending frequency of the TE signal is too large, and the sending frequency of the TE signal is reduced, so that the sending frequency of the TE signal can meet the requirement as soon as possible.
An embodiment of the present invention further provides a computer-readable storage medium, where the computer-readable storage medium has computer program instructions stored thereon; the computer program instructions, when executed by a processor, implement any of the gamma debugging methods in the above embodiments. The program or code segments may be stored in a machine-readable medium or transmitted by a data signal carried in a carrier wave over a transmission medium or a communication link. A "machine-readable medium" may include any medium that can store or transfer information. Examples of a machine-readable medium include electronic circuits, semiconductor memory devices, ROM, flash memory, Erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, Radio Frequency (RF) links, and so forth. The code segments may be downloaded via computer networks such as the internet, intranet, etc. According to embodiments of the present application, the computer-readable storage medium may be a non-transitory computer-readable storage medium.
In accordance with the above-described embodiments of the present invention, these embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best utilize the invention and various embodiments with various modifications as are suited to the particular use contemplated. The invention is limited only by the claims and their full scope and equivalents.
Claims (10)
1. A gamma debugging system is characterized by comprising lighting equipment, a tearing effect TE signal calibration module and an image acquisition module, wherein the TE signal calibration module acquires a TE signal of a display panel to be tested through the lighting equipment and sends adjustment information to the lighting equipment according to the frequency of the TE signal sent by the display panel to be tested;
the lighting equipment adjusts the frequency of the TE signal sent by the display panel to be tested according to the adjustment information;
the image acquisition equipment acquires the display parameters of the display panel to be detected according to the adjustment result meeting the preset condition, wherein the display parameters are acquired within the duration of one frame.
2. The gamma debugging system of claim 1, wherein the TE signal calibration module calculates an interval duration between two adjacent TE signals, and sends the adjustment information to the lighting device according to the interval duration.
3. The gamma debugging system of claim 1, wherein the preset conditions include a preset frequency range, the TE signal calibration module determines that the transmission frequency of the TE signal is less than a minimum value of the preset frequency range, and the TE signal calibration module transmits first adjustment information to the lighting device; or,
the TE signal calibration module determines that the sending frequency of the TE signal is greater than the maximum value of the preset frequency range, and the TE signal calibration module sends second adjustment information to the lighting equipment; or,
and the TE signal calibration module determines that the sending frequency of the TE signal is within the preset frequency range, and sends stop adjustment information to the lighting equipment.
4. The gamma debugging system of claim 3, wherein the TE signal calibration module comprises a first pin, a second pin, and a third pin, and the TE signal calibration module sends the first adjustment information via the first pin, the second adjustment information via the second pin, and the stop adjustment information via the third pin.
5. The gamma debugging system of claim 3, wherein the lighting device sends adjustment completion information to the TE signal calibration module after adjusting the frequency of the TE signal sent by the display panel to be tested each time;
the TE signal calibration module further comprises a fourth pin and a fifth pin, the TE signal calibration module receives the adjustment completion information through the fourth pin, and the TE signal calibration module receives the TE signal through the fifth pin.
6. The gamma debugging system of claim 5, wherein the first adjustment information, the second adjustment information, the non-adjustment information, and the adjustment completion information are all high signals or all low signals.
7. The gamma debugging system of claim 1, wherein the lighting device further transmits a first gray-scale picture to the display panel to be tested to light the display panel to be tested before the lighting device obtains the TE signal transmitted by the display panel to be tested.
8. A gamma debugging method, comprising:
receiving a TE signal, wherein the TE signal is sent by a display panel to be tested;
judging whether the sending frequency of the TE signal is within a preset frequency range or not;
if the sending frequency of the TE signal is not in the preset frequency range, adjusting the sending frequency of the TE signal until the adjusted sending frequency is in the preset frequency range;
and performing gamma debugging on the display panel to be tested in a mode of acquiring the display parameters of the display panel to be tested once within the time length of one frame.
9. The gamma debugging method of claim 8, wherein the determining whether the transmission frequency of the TE signal is within a preset frequency range comprises:
calculating the interval duration of two adjacent TE signals;
and judging whether the sending frequency of the TE signal is in the preset frequency range or not according to the interval duration.
10. The gamma debugging method of claim 8, wherein if the transmission frequency of the TE signal is not within the predetermined frequency range, the adjusting the transmission frequency of the TE signal comprises:
if the sending frequency of the TE signal is smaller than the minimum value of the preset frequency range, increasing the sending frequency of the TE signal;
and if the sending frequency of the TE signal is greater than the maximum value of the preset frequency range, reducing the sending frequency of the TE signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010630617.7A CN111739457B (en) | 2020-07-03 | 2020-07-03 | Gamma debugging system and gamma debugging method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010630617.7A CN111739457B (en) | 2020-07-03 | 2020-07-03 | Gamma debugging system and gamma debugging method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111739457A true CN111739457A (en) | 2020-10-02 |
| CN111739457B CN111739457B (en) | 2022-04-12 |
Family
ID=72652694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010630617.7A Active CN111739457B (en) | 2020-07-03 | 2020-07-03 | Gamma debugging system and gamma debugging method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111739457B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113112946A (en) * | 2021-04-19 | 2021-07-13 | 昆山国显光电有限公司 | Gamma debugging method, device and equipment |
| CN113129832A (en) * | 2021-04-20 | 2021-07-16 | 京东方科技集团股份有限公司 | Display panel, driving method thereof, gamma adjusting method and display device |
| US11668995B2 (en) | 2020-11-26 | 2023-06-06 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Optical compensation method for display screen, storage medium, and electronic device |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005057474A (en) * | 2003-08-04 | 2005-03-03 | Sharp Corp | Projection type image display device |
| CN104376823A (en) * | 2014-09-30 | 2015-02-25 | 南京中电熊猫液晶显示科技有限公司 | Gamma voltage regulating device and method |
| CN205229603U (en) * | 2015-12-10 | 2016-05-11 | 昆山龙腾光电有限公司 | Liquid crystal disply device's test system of lighting a lamp |
| CN105702215A (en) * | 2016-04-26 | 2016-06-22 | 京东方科技集团股份有限公司 | Gamma voltage correction method and device |
| CN105793915A (en) * | 2013-10-10 | 2016-07-20 | 三星电子株式会社 | Display driving circuit, display device, and portable terminal including the display driving circuit and the display device |
| CN107039010A (en) * | 2017-05-09 | 2017-08-11 | 深圳市华星光电技术有限公司 | The automatic repair system of gamma curve and gamma curve self-repairing method |
| KR20180015309A (en) * | 2016-08-02 | 2018-02-13 | 삼성디스플레이 주식회사 | Liquid crystal display |
| CN109686307A (en) * | 2019-01-04 | 2019-04-26 | 京东方科技集团股份有限公司 | Generation method and device, display panel, the display device of gamma reference voltage |
| CN110312125A (en) * | 2018-03-27 | 2019-10-08 | 松下液晶显示器株式会社 | Quality adjustment device, image quality adjustment system and image quality adjustment method |
-
2020
- 2020-07-03 CN CN202010630617.7A patent/CN111739457B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005057474A (en) * | 2003-08-04 | 2005-03-03 | Sharp Corp | Projection type image display device |
| CN105793915A (en) * | 2013-10-10 | 2016-07-20 | 三星电子株式会社 | Display driving circuit, display device, and portable terminal including the display driving circuit and the display device |
| CN104376823A (en) * | 2014-09-30 | 2015-02-25 | 南京中电熊猫液晶显示科技有限公司 | Gamma voltage regulating device and method |
| CN205229603U (en) * | 2015-12-10 | 2016-05-11 | 昆山龙腾光电有限公司 | Liquid crystal disply device's test system of lighting a lamp |
| CN105702215A (en) * | 2016-04-26 | 2016-06-22 | 京东方科技集团股份有限公司 | Gamma voltage correction method and device |
| KR20180015309A (en) * | 2016-08-02 | 2018-02-13 | 삼성디스플레이 주식회사 | Liquid crystal display |
| CN107039010A (en) * | 2017-05-09 | 2017-08-11 | 深圳市华星光电技术有限公司 | The automatic repair system of gamma curve and gamma curve self-repairing method |
| CN110312125A (en) * | 2018-03-27 | 2019-10-08 | 松下液晶显示器株式会社 | Quality adjustment device, image quality adjustment system and image quality adjustment method |
| CN109686307A (en) * | 2019-01-04 | 2019-04-26 | 京东方科技集团股份有限公司 | Generation method and device, display panel, the display device of gamma reference voltage |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11668995B2 (en) | 2020-11-26 | 2023-06-06 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Optical compensation method for display screen, storage medium, and electronic device |
| CN113112946A (en) * | 2021-04-19 | 2021-07-13 | 昆山国显光电有限公司 | Gamma debugging method, device and equipment |
| CN113129832A (en) * | 2021-04-20 | 2021-07-16 | 京东方科技集团股份有限公司 | Display panel, driving method thereof, gamma adjusting method and display device |
| CN113129832B (en) * | 2021-04-20 | 2022-08-23 | 京东方科技集团股份有限公司 | Gamma adjustment method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111739457B (en) | 2022-04-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111739457B (en) | Gamma debugging system and gamma debugging method | |
| CN108550345B (en) | Gamma correction method and device, display device, computer storage medium | |
| CN107799066B (en) | Compensation method of display panel, driving device, display device and storage medium | |
| CN106981266A (en) | The optical compensation method of display device and display device | |
| KR101641901B1 (en) | Setting System of Gamma Of Display Device And Setting Method Thereof | |
| KR101362169B1 (en) | Gamma correction system and correction method the same | |
| US10522067B2 (en) | Apparatus and method for adjusting display characters of display device | |
| CN110164371A (en) | The gamma correction method and device of display module | |
| CN107886920B (en) | Method and system for obtaining correct Mura compensation data | |
| KR101295342B1 (en) | Smart electronic display control system and method for compensating luminance of led | |
| KR101853065B1 (en) | Luminance Correction System for Organic Light Emitting Display Device and Luminance Correction method thereof | |
| US20090027313A1 (en) | Imaging device | |
| CN106847173A (en) | A kind of OLED modules gamma curve adjusting method and device | |
| US20170004754A1 (en) | Dot correction method and system for led display device | |
| CN102097052A (en) | Organic light emitting display device and driving voltage correction method thereof | |
| KR101336977B1 (en) | Liquid crystal display and driving method thereof | |
| US10510288B2 (en) | Dot correction method and system for LED display device | |
| CN106257574B (en) | Device for determining drive voltage | |
| US10621924B2 (en) | Display panel driving circuit and method for capturing driving circuit error information thereof | |
| CN113744704B (en) | Brightness adjusting method and device for display panel | |
| CN115035849A (en) | Gamma debugging method, device, equipment and storage medium of display panel | |
| CN114203090A (en) | Gamma debugging method, device and storage medium | |
| CN113112946B (en) | Gamma debugging method, device and equipment | |
| US11721264B2 (en) | Display driving device, display device, and method of driving display device | |
| US11842680B2 (en) | Semiconductor device and electronic apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |