CN113506535B - Binding point selection method, device, equipment and medium for gamma debugging - Google Patents

Binding point selection method, device, equipment and medium for gamma debugging Download PDF

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CN113506535B
CN113506535B CN202110860229.2A CN202110860229A CN113506535B CN 113506535 B CN113506535 B CN 113506535B CN 202110860229 A CN202110860229 A CN 202110860229A CN 113506535 B CN113506535 B CN 113506535B
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points
selecting
voltage
gamma
point
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CN113506535A (en
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黄学琳
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Hefei Visionox Technology Co Ltd
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Hefei Visionox Technology Co Ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/02Improving the quality of display appearance
    • G09G2320/0271Adjustment of the gradation levels within the range of the gradation scale, e.g. by redistribution or clipping
    • G09G2320/0276Adjustment of the gradation levels within the range of the gradation scale, e.g. by redistribution or clipping for the purpose of adaptation to the characteristics of a display device, i.e. gamma correction
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/06Adjustment of display parameters
    • G09G2320/0673Adjustment of display parameters for control of gamma adjustment, e.g. selecting another gamma curve

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  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Picture Signal Circuits (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

The application discloses a binding point selecting method, device, equipment and medium for gamma debugging. The method comprises the following steps: acquiring a voltage-current (Id-Vg) curve of a driving transistor of a pixel circuit of a display panel; selecting a plurality of points on the Id-Vg curve, wherein the difference value of the slopes of at least two adjacent points in the plurality of points is within a first preset range; and taking the gray-scale values corresponding to the multiple points as binding points for gamma debugging. According to the embodiment of the application, the gamma debugging time can be reduced, and the production efficiency is improved.

Description

Binding point selection method, device, equipment and medium for gamma debugging
Technical Field
The application relates to the technical field of display, in particular to a binding point selecting method, device, equipment and medium for gamma debugging.
Background
In the related art, the brightness perceived by human eyes is not linearly related to the actual display brightness of the display panel. In low brightness environments, the human eye is more sensitive to changes in brightness, and in high brightness environments, the other way around. This characteristic of the human eye is called Gamma (Gamma) characteristic. Due to the non-linear perception of brightness by human eyes, if we need to obtain a uniformly changing brightness feeling, the brightness displayed by the display panel needs to be adjusted to adapt to the Gamma characteristic of human eyes. The non-linear parameter of the brightness and the gray scale degree of the display panel can be called as a Gamma parameter, and a curve drawn according to the Gamma parameter is called as a Gamma curve. The Gamma parameter describes the non-linear relationship between the brightness and the gray scale, i.e. the non-linear relationship between the brightness and the input voltage of the data line.
Before the display panel leaves the factory, gamma debugging needs to be carried out on the display panel, however, the gray scale that the display panel can display is more, if gamma debugging is carried out on each gray scale, the gamma debugging time is longer, and the production efficiency is affected.
Disclosure of Invention
The embodiment of the application provides a binding point selecting method, device, equipment and medium for gamma debugging, which can reduce the gamma debugging time and improve the production efficiency.
In a first aspect, an embodiment of the present application provides a gamma debugging method, which includes: acquiring a voltage-current curve of a driving transistor of a pixel circuit of a display panel; selecting a plurality of points on the voltage-current curve, wherein the difference value of the slopes of at least two adjacent points in the plurality of points is within a first preset range; and taking the gray-scale values corresponding to the multiple points as the binding points of gamma debugging.
In a possible implementation manner of the first aspect, selecting a plurality of points on the voltage-current curve, where a difference between slopes of at least two adjacent points of the plurality of points is within a first preset range, includes:
a plurality of points are selected on the voltage-current curve, and the difference value of the slopes of any two adjacent points in the plurality of points is within a first preset range.
In a possible implementation of the first aspect, selecting a plurality of points on the voltage-current curve includes:
the voltage-current curve is divided into a plurality of sections, and at least one point is selected in each section of the plurality of sections.
In a possible embodiment of the first aspect, the dividing the voltage-current curve into a plurality of segments, at least one point being selected in each of the plurality of segments, includes:
dividing the voltage-current curve into a plurality of sections according to the slope of each point on the voltage-current curve, wherein the plurality of sections comprise at least one first section and at least one second section, the slope of each point in the first section is positive or negative, and the slope of each point in the second section comprises positive and negative;
at least one point is selected in the first segment, at least two points are selected in the second segment, and the number of the points selected in the second segment is larger than that of the points selected in the first segment.
In a possible implementation manner of the first aspect, the selecting at least one point in the first segment includes:
two points are selected at the first segment, and the two selected points are two end points of the first segment.
In a possible implementation manner of the first aspect, before taking the corresponding gray-scale values of the plurality of points as the binding points of the gamma debugging, the method further includes:
and determining the corresponding gray-scale values of the multiple points according to the corresponding grid voltages of the multiple points on the voltage-current curve and the corresponding relation between the preset data voltage and the gray-scale values.
In a possible implementation of the first aspect, selecting a plurality of points on the voltage-current curve includes:
selecting a plurality of points on the voltage-current curve, wherein the number of the points is less than or equal to 15;
preferably, the gray-scale values corresponding to the plurality of points include a minimum gray-scale value and a maximum gray-scale value of the display panel.
In a second aspect, an embodiment of the present application provides a gamma-debugging bind point selecting device, including:
the curve acquisition module is used for acquiring a voltage-current curve of a driving transistor of a pixel circuit of the display panel;
the selection module is used for selecting a plurality of points on the voltage-current curve, and the difference value of the slopes of at least two adjacent points in the plurality of points is within a first preset range;
and the binding point determining module is used for taking the gray-scale values corresponding to the multiple points as the binding points for gamma debugging.
In a third aspect, an embodiment of the present application provides a gamma-debugging bind point selecting device, including a processor, a memory, and a computer program stored on the memory and executable on the processor, where the computer program, when executed by the processor, implements the gamma-debugging bind point selecting method according to any one of the embodiments of the first aspect.
In a fourth aspect, embodiments of the present application provide a computer-readable storage medium, on which a program or instructions are stored, where the program or instructions, when executed by a processor, implement the steps of the gamma-debugged bind point selecting method according to any one of the embodiments of the first aspect.
According to the binding point selecting method, device, equipment and medium for gamma debugging provided by the embodiment of the application, on one hand, only the gray-scale values of part of points are selected as the binding points for gamma debugging, and compared with the method that each gray scale of a display panel is used as the binding points for gamma debugging, the number of the binding points can be greatly reduced, so that the gamma debugging time is shortened, and the production efficiency is improved; on the other hand, some gray scales are not selected randomly as binding points for gamma debugging, but are selected according to slopes of each point on a voltage-current (Id-Vg) curve of the driving transistor, and a difference value between slopes of at least two adjacent points of the selected points is within a first preset range, that is, slopes of at least two adjacent points are similar, a gate voltage Vg and a current Id corresponding to a point between the points with similar slopes can be regarded as linearly changing, the gate voltage Vg corresponds to a data voltage Vdata, and the data voltage Vdata corresponds to a gray scale value, so that a gray scale value between two adjacent points with similar slopes and the data voltage Vdata can also be regarded as linearly changing, and thus, a data voltage corresponding to a gray scale between adjacent binding points calculated according to a linear difference algorithm is more accurate, that is, a gray scale value corresponding to a point with similar slope is selected as a binding point for gamma debugging, so that a finally debugged gamma curve more conforms to a target gamma curve.
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Other features, objects, and advantages of the present application will become apparent from the following detailed description of non-limiting embodiments thereof, when read in conjunction with the accompanying drawings, in which like reference characters designate the same or similar parts throughout the figures thereof, and which are not to scale.
FIG. 1 is a flow chart illustrating a method for selecting a binding point for gamma debugging according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of a pixel circuit according to an embodiment of the present application;
FIG. 3 illustrates a schematic diagram of an Id-Vg curve for a drive transistor provided in one embodiment of the present application;
FIG. 4 is a schematic structural diagram illustrating a gamma-debugged bind point selecting apparatus according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a gamma-debugged bind point selecting device according to an embodiment of the present application.
Detailed Description
Features of various aspects and exemplary embodiments of the present application will be described in detail below, and in order to make objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by illustrating examples thereof.
It should be noted that, in this document, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising 8230; \8230;" comprises 8230; "does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
Before explaining the technical solutions provided in the embodiments of the present application, in order to facilitate understanding of the embodiments of the present application, the present application first specifically describes the problems existing in the prior art:
as mentioned above, the display panel can generally display images with various gray scales, and if the display panel is an 8-bit display panel, the display panel has 0-255 gray scales with 256 levels, that is, the display panel can display any one of the 0-255 gray scale images. In order to make human eyes obtain uniform brightness change feeling, gamma debugging needs to be performed on the display panel, however, since the display panel has a large number of gray scales, if gamma debugging is performed on each gray scale, the gamma debugging time is long, and the production efficiency is affected.
In view of the above technical problems, embodiments of the present application provide a gamma debugging binding point selecting method, a gamma debugging binding point selecting device, a gamma debugging binding point selecting apparatus, and a computer readable storage medium, and various embodiments of a gamma debugging binding point selecting method, a gamma debugging binding point selecting device, a gamma debugging binding point selecting apparatus, and a computer readable storage medium will be described below with reference to the accompanying drawings.
The embodiment of the application provides a binding point selecting method for gamma debugging, which can be executed by a binding point selecting device for gamma debugging. Fig. 1 is a flowchart illustrating a binding selection method for gamma debugging according to an embodiment of the present application. As shown in fig. 1, the method for selecting a binding for gamma debugging provided in the embodiment of the present application includes steps 110 to 130.
Step 110, obtain a voltage-current (Id-Vg) curve of a driving transistor of a pixel circuit of a display panel.
Step 120, a plurality of points are selected on the Id-Vg curve, and the difference between the slopes of at least two adjacent points of the plurality of points is within a first preset range.
And step 130, taking the gray-scale values corresponding to the multiple points as binding points for gamma debugging.
According to the binding point selecting method for gamma debugging provided by the embodiment of the application, on one hand, only the gray-scale values corresponding to part of points are selected as binding points for gamma debugging, and compared with the method that each gray scale of a display panel is used as a binding point for gamma debugging, the number of the binding points can be greatly reduced, so that the gamma debugging time is shortened, and the production efficiency is improved; on the other hand, some gray scales are not selected randomly as binding points for gamma debugging, but are selected according to slopes of each point on an Id-Vg curve of the driving transistor, and a difference value between slopes of at least two adjacent points of the selected points is within a first preset range, that is, the slopes of the at least two adjacent points are similar, a gate voltage Vg and a current Id corresponding to a point between the points with the similar slopes can be regarded as linearly changing, the gate voltage Vg corresponds to a data voltage Vdata, and the data voltage Vdata corresponds to a gray scale value, so that the gray scale value between the adjacent points with the similar slopes and the data voltage Vdata can also be regarded as linearly changing, and thus, the data voltage corresponding to the gray scale between the adjacent binding points calculated according to a linear difference algorithm is more accurate, that is, the gray scale value corresponding to the similar slope is selected as the point for gamma debugging, so that the finally debugged gamma curve better conforms to the target gamma curve.
Illustratively, the display panel may be an Organic Light-Emitting Diode (OLED) display panel. The display panel may include a plurality of pixel circuits, and the plurality of pixel circuits may be distributed in an array in a display area of the display panel.
It is understood that the driving transistor is included in the pixel circuit regardless of the structure of the pixel circuit. As shown in fig. 2, taking an example that a pixel circuit of a display panel includes transistors T1 to T7, a storage capacitor Cst, and a light emitting element D, wherein Vdata represents a data signal, SCAN1 represents a first SCAN signal, SCAN2 represents a second SCAN signal, VREF represents a reference signal, VREF may also be referred to as a reset voltage signal, VDD represents a positive voltage signal, VSS represents a negative voltage signal, the reference signal VREF may be a negative voltage signal, and the SCAN signal and a light emission control signal EMIT are pulse signals. The connection relationship of the elements of the pixel circuit is shown in fig. 2, and will not be described in detail here. In the pixel circuit shown in fig. 2, the transistor T1 is a driving transistor, and the other transistors are switching transistors. Herein, only the Id-Vg curve of the drive transistor may be acquired. Fig. 2 is merely an example, and is not intended to limit the specific structure of the pixel circuit.
The display panel includes a plurality of pixel circuits, each including a driving transistor. The drive transistors of the respective pixel circuits are usually prepared at the same time, and therefore, the Id-Vg curves of the drive transistors of the respective pixel circuits can be regarded as the same. For example, in step 110, an Id-Vg curve of the driving transistor of any one pixel circuit of the display panel may be obtained.
As shown in fig. 2, an Id-Vg graph of the drive transistor is illustrated. The abscissa in fig. 2 represents the gate voltage Vg of the drive transistor, which may be in volts (V), and the ordinate represents the current Id of the drive transistor, which may be in amperes (a). Wherein the ordinate 1.0E-06 represents 1.0 x 10 -6 1.0E-07 denotes 1.0 x 10 -7 The other ordinate is analogized in the same way.
It can be understood that, since the luminance of the light emitting element is in positive correlation with the current of the driving transistor, and the larger the gray scale value is, the larger the corresponding luminance is, the larger the gray scale value corresponding to the point where the current Id is larger on the Id-Vg curve is, the smaller the gray scale value corresponding to the point where the current Id is smaller is.
Prior to step 110, the Id-Vg curve of the drive transistors of the pixel circuits of the display panel may be determined. Illustratively, the step of determining the Id-Vg curve of the drive transistor may comprise: connecting the source and drain of the driving transistor with different fixed voltages respectively; changing the grid voltage Vg of the driving transistor and obtaining the current Id of the driving transistor under each grid voltage Vg; and determining an Id-Vg curve of the driving transistor according to the corresponding relation between the grid voltage Vg and the current Id.
Of course, the Id-Vg curve of the driving transistor may be determined in other ways, which is not limited in this application.
In some optional embodiments, step 120 may specifically include: and selecting a plurality of points on the Id-Vg curve, wherein the difference of the slopes of any two adjacent points in the plurality of points is within a first preset range.
For example, the first preset range may be determined based on practical experience. For example, the first preset ranges corresponding to different models and different batches of products may be different, and the specific numerical values in the first preset ranges are not limited in the present application.
As an example, the first preset range may be [ -7.93 × 10 [ ] -9 ,7.93*10 -9 ]. For example, the first predetermined range is [ -4.98 x 10 [) -9 ,4.98*10 -9 ]。
For example, the total number of points to be selected may be determined first, and taking 10 points to be selected as an example, the difference between the slopes of any two adjacent points in the 10 points may be within the first preset range.
Illustratively, prior to step 120, the slope of each point on the Id-Vg curve may be obtained. For example, a function expression of the Id-Vg curve may be obtained, then a derivative function of the function expression of the Id-Vg curve is determined, the abscissa values of the points are substituted into the derivative function, and the calculated value is the slope corresponding to each point. For another example, the Id-Vg curve can be directly input into software capable of obtaining the slope of the curve, and then the slope of each point on the Id-Vg curve can be directly read by the software.
In the embodiment of the application, the difference value of the slopes of any two adjacent points in the selected plurality of points is controlled within the first preset range, so that the data voltage corresponding to the gray scale between any two adjacent binding points calculated according to the linear difference algorithm can be ensured to be more accurate, the selected binding points are further more accurate, and the finally debugged gamma curve is more in line with the target gamma curve.
In some optional embodiments, the selecting a plurality of points on the Id-Vg curve in step 120 may specifically include: and dividing the Id-Vg curve into multiple sections, and selecting at least one point in each section of the multiple sections.
For example, as shown in FIG. 3, the Id-Vg curve may be divided into seven segments, OA, AB, BC, CD, DE, and EO'. At least one point may be selected for each segment.
As described above, the larger the gray scale value corresponding to the larger the current Id on the Id-Vg curve is, the smaller the gray scale value corresponding to the smaller the current Id is, that is, the abscissa and the gray scale value of each point on the curve are corresponding, if the selected points are all concentrated on a certain section of the Id-Vg curve, the selected binding points are too concentrated, that is, the gray scale values corresponding to the binding points are too concentrated, and the data voltages corresponding to the gray scales other than the binding points are usually calculated according to the data voltages corresponding to the binding points and a linear difference algorithm, if the binding points are too concentrated, the data voltages corresponding to the gray scales other than the binding points are not calculated accurately enough. In the embodiment of the application, the Id-Vg curve is segmented, at least one point is selected in each segment, and the selected binding points are prevented from being too concentrated, so that the problem that the data voltage corresponding to the gray scales outside the binding points is not accurate enough is solved.
In some optional embodiments, the Id-Vg curve is divided into multiple segments, and at least one point is selected in each of the multiple segments, which may specifically include: dividing the Id-Vg curve into a plurality of sections according to the slope of each point on the Id-Vg curve, wherein the plurality of sections comprise at least one first section and at least one second section, the slope of each point in the first section is positive or negative, and the slope of each point in the second section comprises positive and negative; at least one point is selected in the first segment, at least two points are selected in the second segment, and the number of the points selected in the second segment is larger than that of the points selected in the first segment.
It will be appreciated that the first segment is relatively flat and the second segment is relatively jittered. The first segment may be understood as a flat segment in the Id-Vg curve and the second segment may be understood as a jittering segment in the Id-Vg curve.
For the second segment with larger slope jitter, the number of points that can be selected in the second segment is larger than the number of points selected in the first segment. For example, with continued reference to fig. 4, since the slope jitter of the points in the AB and BC segments is small, the AB and BC segments may be the first segments, and the slope jitter of the points in the CD and DE segments is large, the CD and DE segments may be the second segments. The number of points selected in the CD and DE sections may be greater than the number of points selected in the AB and BC sections.
Illustratively, where the Id-Vg curve includes a plurality of first segments, the number of points selected within each first segment may be equal. When the Id-Vg curve includes a plurality of second segments, the number of points selected within each second segment may be equal. For example, two points may be selected in each of the AB and BC sections, and three points may be selected in each of the CD and DE sections.
In the embodiment of the application, because the slope jitter of the inner points of the second section is large, the number of the points selected in the second section is large, namely the number of the binding points selected in the second section is large, so that the data voltage corresponding to gray scales except the binding points in the second section calculated according to a linear difference algorithm can be ensured to be more accurate, the selected binding points are further more accurate, and the finally debugged gamma curve is more in line with the target gamma curve.
For example, the second segment may be further divided for each second segment. For example, the second segment is divided into a plurality of subsegments, the plurality of subsegments include at least one first subsegment and at least one second subsegment, the slopes of each point in the first subsegment are both positive numbers or both negative numbers, and the slopes of each point in the second segment include positive numbers and negative numbers. The first subsection may be understood as a gentle section in the second subsection and the second subsection may be understood as a jittered section in the second subsection. Further, the selecting at least two points in the second segment may specifically include: at least two points are selected in the first subsection. That is, points are only selected in the first subsection in the second subsection and no longer in the second subsection.
In some optional embodiments, selecting at least one point in the first segment may specifically include: two points are selected at the first segment, and the two selected points are two end points of the first segment.
Because the slope jitter of the inner point of the first section is small, the inner point of the first section can be approximate to a straight line, and by selecting two end points of the first section as the binding points, the data voltage corresponding to the gray scale except the binding points in the first section calculated according to the linear difference algorithm can be ensured to be more accurate, so that the selected binding points are further more accurate, and the finally debugged gamma curve is more consistent with the target gamma curve.
For example, for two adjacent first segments, for example, the AB segment and the BC segment, an intersection of the two first segments may be selected as a common point of the two first segments.
In some optional embodiments, the selecting a plurality of points on the Id-Vg curve in step 120 may specifically include: and selecting a plurality of points on the Id-Vg curve, wherein the number of the plurality of points is less than or equal to 15.
Points on the Id-Vg curve correspond to gray-scale values, the number of the selected points is smaller than or equal to 15, namely the number of the selected binding points is smaller than or equal to 15, so that the problems that the gamma curve finally debugged cannot accord with the target gamma curve due to too long gamma debugging time and too few binding points can be avoided.
In some optional embodiments, the selected gray-scale values corresponding to the plurality of points include a minimum gray-scale value and a maximum gray-scale value of the display panel.
For example, still taking the display panel with 8bit as an example, the minimum gray scale value of the display panel is 0 gray scale, and the maximum gray scale value is 255 gray scale. The gray scale values corresponding to the selected multiple points comprise 0 gray scale and 255 gray scale.
As described above, the data voltages corresponding to the gray scales other than the tie points are generally calculated by using the linear difference method, and thus, in the case where the selected tie points include the minimum gray scale value and the maximum gray scale value of the display panel, the data voltages corresponding to the gray scales other than the tie points can be more accurately calculated.
In some optional embodiments, before step 130, the method for selecting a binding point for gamma debugging provided by the embodiments of the present application may further include: and determining the gray-scale values corresponding to the selected points according to the gate voltages (Vg) corresponding to the selected points on the Id-Vg curve and the corresponding relationship between the preset data voltages and the gray-scale values.
For example, the correspondence relationship between the data voltage and the gray scale value under the target gamma curve may be set according to data of a large number of products of the same type, that is, empirically. After the good point is selected on the Id-Vg curve, the gate voltage (Vg) corresponding to the selected point may be determined first, then the data voltage equal to the gate voltage (Vg) corresponding to the selected point is determined in the correspondence relationship between the data voltage and the gray scale value, and the gray scale value corresponding to the data voltage equal to the gate voltage (Vg) corresponding to the selected point is used as the gray scale value corresponding to the selected point.
For example, the gamma value of the target gamma curve may be 2.2, which is not limited in this application.
For example, if there is no data voltage equal to the gate voltage (Vg) corresponding to the selected point in the correspondence relationship between the data voltage and the gray scale value, the data voltage having the minimum absolute value of the difference between the gate voltages (Vg) corresponding to the selected point may be determined in the correspondence relationship between the data voltage and the gray scale value, and the gray scale value corresponding to the data voltage having the minimum absolute value of the difference may be used as the gray scale value corresponding to the selected point.
According to the embodiment of the application, the gray-scale value corresponding to the selected point can be quickly determined through the preset corresponding relation between the data voltage and the gray-scale value.
In some alternative embodiments, after step 130, gamma debugging may be performed on the selected bindings.
Illustratively, the specific steps of performing gamma debugging on any selected binding point include: and determining the target data voltage corresponding to the binding points of the display panel according to the display parameter requirements corresponding to the binding points of the display panel.
For example, the step of determining the target data voltage corresponding to the binding point may specifically include: setting initial data voltage corresponding to the binding points; acquiring actual display parameters of the display panel under the initial data voltage and display parameter requirements corresponding to the binding points of the display panel, judging whether the actual display parameters meet the display parameter requirements, if not, adjusting the initial data voltage until the actual display parameters of the display panel under the adjusted initial data voltage meet the display parameter requirements, and taking the adjusted initial data voltage as target data voltage corresponding to the binding points of the display panel.
It can be understood that if the actual display parameters of the display panel under the initial data voltage meet the display parameter requirements, the initial data voltage does not need to be adjusted, and the initial data voltage can be directly used as the target data voltage corresponding to the binding point of the display panel.
Illustratively, if the difference between the actual display parameter and the display parameter requirement is within a preset range, the actual display parameter is considered to meet the display parameter requirement; and if the difference value between the actual display parameter and the display parameter requirement is out of the preset range, the actual display parameter is considered to be not in accordance with the display parameter requirement. The preset range may be a relatively small range, for example, the preset range is zero, or the difference between the actual display parameter and the display parameter requirement is not recognized by human eyes within the preset range.
Illustratively, the actual display parameter, the display parameter requirement may be at least one of a luminance value and a color coordinate.
For example, the initial data voltage set may be equal to the gate voltage (Vg) corresponding to the binding point.
It should be noted that the above embodiments may be combined with each other without contradiction.
The embodiment of the application further provides a binding point selecting device for gamma debugging. As shown in fig. 4, a gamma-debugging binding point selecting apparatus 500 provided in this embodiment of the present application includes a curve obtaining module 501, a selecting module 502, and a binding point determining module 503.
A curve obtaining module 501, configured to obtain a voltage-current (Id-Vg) curve of a driving transistor of a pixel circuit of a display panel;
a selecting module 502, configured to select multiple points on the Id-Vg curve, where a difference between slopes of at least two adjacent points of the multiple points is within a first preset range;
and a binding point determining module 503, configured to use the gray-scale values corresponding to the multiple points as binding points for gamma debugging.
According to the binding point selecting device for gamma debugging provided by the embodiment of the application, on one hand, only the gray-scale values of part of points are selected as the binding points for gamma debugging, and compared with the method that each gray scale of a display panel is used as the binding points for gamma debugging, the number of the binding points can be greatly reduced, so that the longer time for gamma debugging is reduced, and the production efficiency is improved; on the other hand, some gray scales are not selected randomly as binding points for gamma debugging, but are selected according to the slopes of each point on the Id-Vg curve of the driving transistor, and the difference between the slopes of at least two adjacent points of the selected points is within the first preset range, that is, the slopes of at least two adjacent points are similar, the gate voltage Vg and the current Id corresponding to the points between the points with similar slopes can be regarded as linear changes, the gate voltage Vg corresponds to the data voltage Vdata, and the data voltage Vdata corresponds to the gray scale value, so that the gray scale value between two adjacent points with similar slopes and the data voltage Vdata can also be regarded as linear changes, the data voltage corresponding to the gray scale between the adjacent binding points calculated according to the linear difference algorithm is more accurate, that is, the gray scale value corresponding to the slope is selected as the binding point for gamma debugging, so that the final debugging curve better conforms to the target gamma curve.
In some optional embodiments, the selecting module 502 is specifically configured to:
and selecting a plurality of points on the Id-Vg curve, wherein the difference value of the slopes of any two adjacent points in the plurality of points is within a first preset range.
In some optional embodiments, the selecting module 502 is specifically configured to:
and dividing the Id-Vg curve into a plurality of sections, and selecting at least one point in each section of the plurality of sections.
In some optional embodiments, the selecting module 502 is specifically configured to:
dividing the Id-Vg curve into a plurality of sections according to the slope of each point on the Id-Vg curve, wherein the plurality of sections comprise at least one first section and at least one second section, the slope of each point in the first section is positive or negative, and the slope of each point in the second section comprises positive and negative;
at least one point is selected in the first section, at least two points are selected in the second section, and when a plurality of points are selected in the first section, the number of points selected in the second section is greater than the number of points selected in the first section.
In some optional embodiments, the selecting module 502 is specifically configured to:
two points are selected at the first segment, and the two selected points are two end points of the first segment.
In some optional embodiments, the apparatus further comprises a grayscale value determination module to:
and determining the corresponding gray-scale values of the multiple points according to the gate voltages (Vg) corresponding to the multiple points on the Id-Vg curve and the corresponding relation between the preset data voltage and the gray-scale values.
In some optional embodiments, the selecting module 502 is specifically configured to:
selecting a plurality of points on the Id-Vg curve, wherein the number of the points is less than or equal to 15;
preferably, the gray-scale values corresponding to the multiple points include a minimum gray-scale value and a maximum gray-scale value of the display panel.
The binding point selecting device for gamma debugging in the embodiment of the application may be a device, or may be a component, an integrated circuit, or a chip in an electronic device. The device can be mobile electronic equipment or non-mobile electronic equipment. By way of example, the mobile electronic device may be a mobile phone, a tablet computer, a notebook computer, a palm top computer, a vehicle-mounted electronic device, a wearable device, an ultra-mobile personal computer (UMPC), a netbook or a Personal Digital Assistant (PDA), and the like, and the non-mobile electronic device may be a server, a Network Attached Storage (NAS), a Personal Computer (PC), a Television (TV), a teller machine or a self-service machine, and the like, and the embodiments of the present application are not particularly limited.
The binding point selecting device for gamma debugging in the embodiment of the present application may be a device having an operating system. The operating system may be an Android (Android) operating system, an ios operating system, or other possible operating systems, and embodiments of the present application are not limited specifically.
The binding point selecting device for gamma debugging provided by the embodiment of the application can realize each process realized by the method embodiment of fig. 1, and is not repeated here for avoiding repetition.
Fig. 5 shows a hardware structure diagram of a gamma-debugged binding point selecting device provided in an embodiment of the present application.
The bind point selecting device 900 in gamma debugging may comprise a processor 901 and a memory 902 in which computer program instructions are stored.
Specifically, the processor 901 may include a Central Processing Unit (CPU), or an Application Specific Integrated Circuit (ASIC), or may be configured as one or more Integrated circuits implementing the embodiments of the present invention.
Memory 902 may include a mass storage for data or instructions. By way of example, and not limitation, memory 902 may include a Hard Disk Drive (HDD), floppy Disk Drive, flash memory, optical Disk, magneto-optical Disk, tape, or Universal Serial Bus (USB) Drive or a combination of two or more of these. Memory 902 may include removable or non-removable (or fixed) media, where appropriate. The memory 902 may be internal or external to the integrated gateway disaster recovery device, where appropriate. In a particular embodiment, the memory 902 is a non-volatile solid-state memory. In a particular embodiment, the memory 902 includes Read Only Memory (ROM). Where appropriate, the ROM may be mask-programmed ROM, programmable ROM (PROM), erasable PROM (EPROM), electrically Erasable PROM (EEPROM), electrically Alterable ROM (EAROM), or flash memory, or a combination of two or more of these.
The processor 901 reads and executes the computer program instructions stored in the memory 902 to implement any one of the gamma debug binding point selection methods in the above embodiments.
In one example, the gamma debugged bind point select device may also include a communication interface 903 and a bus 910. As shown in fig. 5, the processor 901, the memory 902, and the communication interface 903 are connected via a bus 910 to complete communication with each other.
The communication interface 903 is mainly used for implementing communication between modules, apparatuses, units and/or devices in the embodiment of the present invention.
Bus 910 includes hardware, software, or both to couple the components of the compensation voltage determination device to each other. By way of example, and not limitation, a bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Enhanced Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), a Hypertransport (HT) interconnect, an Industry Standard Architecture (ISA) bus, an infiniband interconnect, a Low Pin Count (LPC) bus, a memory bus, a Micro Channel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a video electronics standards association local (VLB) bus, or other suitable bus or a combination of two or more of these. Bus 910 can include one or more buses, where appropriate. Although specific buses have been described and shown in the embodiments of the invention, any suitable buses or interconnects are contemplated by the invention.
The gamma-debugging binding point selecting device can execute the gamma-debugging binding point selecting method in the embodiment of the application, thereby realizing the gamma-debugging binding point selecting method and the gamma-debugging binding point selecting device described in conjunction with fig. 1 and 4.
An embodiment of the present application further provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the method for selecting a binding point for gamma debugging in the foregoing embodiment can be implemented, and the same technical effect can be achieved. The computer-readable storage medium may include a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, which is not limited herein.
By way of example, computer-readable storage media may comprise non-transitory readable storage media.
In accordance with the embodiments of the present application as described above, these embodiments are not exhaustive and do not limit the application to the specific embodiments described. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the application and its practical application, to thereby enable others skilled in the art to best utilize the application and its various modifications as are suited to the particular use contemplated. The application is limited only by the claims and their full scope and equivalents.

Claims (11)

1. A binding point selecting method for gamma debugging is characterized by comprising the following steps:
acquiring a voltage-current curve of a driving transistor of a pixel circuit of a display panel;
selecting a plurality of points on the voltage-current curve, wherein the difference value of the slopes of at least two adjacent points in the plurality of points is within a first preset range;
and taking the gray-scale values corresponding to the multiple points as the binding points of gamma debugging.
2. The method of claim 1, wherein the selecting a plurality of points on the voltage-current curve, and the difference between the slopes of at least two adjacent points of the plurality of points is within a first preset range comprises:
and selecting a plurality of points on the voltage-current curve, wherein the difference value of the slopes of any two adjacent points in the plurality of points is within the first preset range.
3. The method of claim 1, wherein the selecting a plurality of points on the voltage-current curve comprises:
and dividing the voltage-current curve into a plurality of sections, and selecting at least one point in each section of the plurality of sections.
4. The method of claim 3, wherein the dividing the voltage-current curve into a plurality of segments, at least one point being selected in each of the plurality of segments, comprises:
dividing the voltage-current curve into a plurality of sections according to the slopes of all points on the voltage-current curve, wherein the plurality of sections comprise at least one first section and at least one second section, the slopes of all points in the first section are positive numbers or negative numbers, and the slopes of all points in the second section comprise positive numbers and negative numbers;
at least one point is selected in the first section, at least two points are selected in the second section, and the number of the points selected in the second section is larger than that of the points selected in the first section.
5. The method for selecting a binding point for gamma debugging according to claim 4, wherein said selecting at least one point in the first segment comprises:
two points are selected from the first segment, and the two selected points are two end points of the first segment.
6. The method of claim 1, wherein before the determining the gray-scale values corresponding to the plurality of points as the gamma-debugged binding points, the method further comprises:
and determining the gray-scale values corresponding to the plurality of points according to the corresponding grid voltages of the plurality of points on the voltage-current curve and the corresponding relation between the preset data voltage and the gray-scale value.
7. The method of claim 1, wherein the selecting a plurality of points on the voltage-current curve comprises:
and selecting a plurality of points on the voltage-current curve, wherein the number of the points is less than or equal to 15.
8. The method of claim 7, wherein the gray-scale values corresponding to the plurality of points comprise a minimum gray-scale value and a maximum gray-scale value of the display panel.
9. A bind point selecting device for gamma adjustment, the device comprising:
the curve acquisition module is used for acquiring a voltage-current curve of a driving transistor of a pixel circuit of the display panel;
the selecting module is used for selecting a plurality of points on the voltage-current curve, and the difference value of the slopes of at least two adjacent points in the plurality of points is within a first preset range;
and the binding point determining module is used for taking the gray-scale values corresponding to the plurality of points as the binding points of gamma debugging.
10. A gamma-debugged bind point selecting apparatus comprising a processor, a memory, and a computer program stored on the memory and executable on the processor, the computer program, when executed by the processor, implementing the gamma-debugged bind point selecting method according to any one of claims 1 to 8.
11. A computer-readable storage medium, on which a program or instructions are stored, which when executed by a processor, implement the steps of the gamma-debugged bind point selection method according to any one of claims 1 to 8.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101689348A (en) * 2007-07-11 2010-03-31 索尼公司 Display device and method for driving display device
WO2016127639A1 (en) * 2015-02-11 2016-08-18 京东方科技集团股份有限公司 Driving method for pixel circuit and driving device for pixel circuit
CN110491330A (en) * 2019-09-26 2019-11-22 昆山国显光电有限公司 A kind of gamma adjusting method, device and display device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI299843B (en) * 2005-10-14 2008-08-11 Novatek Microelectronics Corp Display device and gray-scale voltage generating device thereof
KR20150071549A (en) * 2013-12-18 2015-06-26 삼성디스플레이 주식회사 Display device and display device driving method using the same
CN104091575A (en) * 2014-06-26 2014-10-08 京东方科技集团股份有限公司 Gamma voltage generating circuit, generating method and data driver
CN109064966B (en) * 2018-10-31 2021-08-27 武汉天马微电子有限公司 Driving method and driving chip of display panel and display device
CN110767138B (en) * 2019-01-31 2020-12-04 昆山国显光电有限公司 Gamma adjusting method and device for display panel and display equipment
KR102659619B1 (en) * 2019-07-10 2024-04-23 삼성디스플레이 주식회사 Display device and method of driving the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101689348A (en) * 2007-07-11 2010-03-31 索尼公司 Display device and method for driving display device
WO2016127639A1 (en) * 2015-02-11 2016-08-18 京东方科技集团股份有限公司 Driving method for pixel circuit and driving device for pixel circuit
CN110491330A (en) * 2019-09-26 2019-11-22 昆山国显光电有限公司 A kind of gamma adjusting method, device and display device

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