CN111735610A - Method and device for measuring refractive index of optical waveguide group - Google Patents

Method and device for measuring refractive index of optical waveguide group Download PDF

Info

Publication number
CN111735610A
CN111735610A CN202010533296.9A CN202010533296A CN111735610A CN 111735610 A CN111735610 A CN 111735610A CN 202010533296 A CN202010533296 A CN 202010533296A CN 111735610 A CN111735610 A CN 111735610A
Authority
CN
China
Prior art keywords
optical
optical waveguide
refractive index
coupling
network analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202010533296.9A
Other languages
Chinese (zh)
Other versions
CN111735610B (en
Inventor
顾晓文
王琛全
钱广
牛斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CETC 55 Research Institute
Original Assignee
CETC 55 Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CETC 55 Research Institute filed Critical CETC 55 Research Institute
Priority to CN202010533296.9A priority Critical patent/CN111735610B/en
Publication of CN111735610A publication Critical patent/CN111735610A/en
Application granted granted Critical
Publication of CN111735610B publication Critical patent/CN111735610B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power

Abstract

The invention discloses a method and a device for measuring the refractive index of an optical waveguide group, wherein the method comprises the following steps: outputting the optical carrier to an optical single-side band modulator, and loading a radio-frequency signal output by a first port of the vector network analyzer to the modulator to modulate the optical carrier; the modulated optical signal is coupled into the first optical waveguide, coupled and output into the photoelectric detector through the optical waveguide chip, the detected signal is input into a second port of the vector network analyzer, and the loop is utilized to carry out straight-through calibration of the vector network analyzer; coupling the modulated optical signal to a second optical waveguide with different length, coupling and outputting the optical signal to a photoelectric detector through an optical waveguide chip after the optical waveguide is transmitted, inputting the detected signal to a second port of a vector network analyzer, and testing from the vector network analyzer to obtain a response S at the moment21(ii) a The group refractive index of the optical waveguide is calculated. The invention can simultaneously satisfy the group refractive index measurement of the end face coupling waveguide and the vertical grating coupling waveguide, and has simple and accurate calculation.

Description

Method and device for measuring refractive index of optical waveguide group
Technical Field
The invention belongs to the technical field of integrated photonic device measurement, and particularly relates to a method and a device for measuring the refractive index of an optical waveguide group.
Background
In an integrated photonic device, an optical waveguide is the most basic structure for constructing a photonic integrated device and a chip, and is a basic construction unit for further constructing other passive, active photonic and optoelectronic devices, such as an optical delay line, a beam splitter/combiner, an arrayed waveguide grating, a mach-zehnder interferometer, a micro-ring resonator, a modulator, an optical switch, and the like. The basic function of the optical waveguide is to realize low-loss and low-distortion transmission of light waves, and the refractive index of the waveguide is one of the most important indexes, which determines the key geometric dimension of the integrated photonic device.
The effective and group indices of refraction are of primary concern in optical waveguide devices. The effective refractive index, also known as the effective refractive index of the waveguide mode, mainly determines the mode of light wave transmission in the optical waveguide and the required geometrical structure. The group refractive index is defined as the ratio of the optical speed in vacuum to the group speed in the medium, so that the group speed of the optical wave in the optical waveguide is represented, and the group speed corresponds to the group delay and is one of the most important parameters for designing and preparing the optical delay line.
The traditional group refractive index measuring method mainly comprises an optical pulse delay measuring method, a Mach-Zehnder interference spectral response measuring method and a micro-ring resonance spectrum measuring method, and the three methods have respective advantages and disadvantages. The optical pulse method needs a pulse light source and a delay measuring instrument, the precision of the optical pulse method is limited by the length of a light waveguide, the central wavelength of an optical pulse and the repetition frequency, and the precision is limited; the Mach-Zehnder interference method needs to prepare a Mach-Zehnder interference structure and has extremely high requirements on the measurement precision of spectral response; the micro-ring resonance method requires the preparation of an all-pass type micro-ring resonator, and also requires high-precision spectral measurement.
Disclosure of Invention
The invention aims to provide a method and a device for measuring the refractive index of an optical waveguide group, which solve the problems of low precision and poor universality of the traditional method for measuring the refractive index of the optical waveguide group.
The technical solution for realizing the purpose of the invention is as follows: a method for measuring the refractive index of an optical waveguide group comprises the following steps:
1) the continuous wave laser outputs an optical carrier signal to the optical single-side band modulator, and a radio frequency signal output by a first port of the vector network analyzer is loaded to the optical single-side band modulator to modulate an optical wave;
2) the modulated optical signal is coupled into a first optical waveguide, the optical waveguide is coupled and output into a photoelectric detector through an optical waveguide chip after being transmitted, the detected signal is input into a second port of the vector network analyzer, and the loop is utilized to carry out straight-through calibration of the vector network analyzer;
3) testing a second optical waveguide after calibration, wherein the length of the second optical waveguide is different from that of the first optical waveguide; coupling the modulated optical signal into the second optical waveguide, coupling and outputting the optical signal into a photoelectric detector through an optical waveguide chip after the optical waveguide is transmitted, inputting the detected signal into a second port of the vector network analyzer, and testing the vector network analyzer to obtain a response S at the moment21Including an amplitude response and a phase response;
4) the slope of the phase response curve, i.e., the phase shift amount per unit frequency, was calculated and recorded as α, and the formula of the relationship between the refractive index of the optical waveguide group and the phase shift amount was used
Figure BDA0002536185770000021
And calculating the group refractive index of the optical waveguides, wherein L is the length difference of the two optical waveguides, and c is the speed of light in vacuum.
The invention also provides a device for measuring the refractive index of the optical waveguide group, which comprises a continuous wave laser, an optical single-side band modulator, an optical waveguide chip, a photoelectric detector and a vector network analyzer, wherein the optical waveguide chip comprises two optical waveguides with different lengths;
after being modulated by the optical single-side band modulator, an optical signal is coupled with the coupling input port through the coupling input optical fiber, the optical signal is output to the coupling output optical fiber through the coupling output port after being transmitted by the optical waveguide, and is connected with the photoelectric detector for photoelectric conversion, and the detected signal is input to two ports of the vector network analyzer to obtain the response of the optical waveguide.
Compared with the prior art, the invention has the beneficial effects that: (1) calibrating and measuring the response S of a second optical waveguide by means of optical waveguide feed-through21And calculating the group refractive index of the optical waveguide by its phase response, due to S21The measuring method is simple, and the sweep frequency range of the vector network analyzerIn addition, the phase response curve is a straight line, and the accuracy of the obtained slope value is extremely high, so that the refractive index measurement precision of the optical waveguide group obtained by calculation is high; (2) the invention is suitable for first-order dispersion optical waveguides, and common optical waveguides including silicon-on-insulator waveguides, silicon nitride optical waveguides, lithium niobate optical waveguides and the like are suitable for first-order dispersion models; (3) the invention can simultaneously satisfy the group refractive index measurement of the end face coupling waveguide and the vertical grating coupling waveguide, and has simple and accurate calculation.
Drawings
FIG. 1 is a schematic view of an apparatus for measuring refractive index of an optical waveguide group.
In the figure: 1 is a continuous wave laser, 2 is an optical fiber, 3 is an optical single-sideband modulator, 4 is an optical waveguide chip, 5 is a coupling-in optical fiber, 6 is a coupling-out optical fiber, 7 is a coupling-in port, 8 is a coupling-out port, 9 is a first optical waveguide, 10 is a second optical waveguide, 11 is a photodetector, 12 is a vector network analyzer, 13 is a high-frequency cable of a first port of the vector network analyzer, 14 is a high-frequency cable of a second port of the vector network analyzer, 15 is a first port of the vector network analyzer, and 16 is a second port of the vector network analyzer.
Detailed Description
A method for measuring the refractive index of an optical waveguide group comprises the following steps:
1) the continuous wave laser outputs an optical carrier signal to the optical single-side band modulator, and a radio frequency signal output by a first port of the vector network analyzer is loaded to the optical single-side band modulator to modulate an optical wave;
2) the modulated optical signal is coupled into a first optical waveguide, the optical waveguide is coupled and output into a photoelectric detector through an optical waveguide chip after being transmitted, the detected signal is input into a second port of the vector network analyzer, and the loop is utilized to carry out straight-through calibration of the vector network analyzer;
3) the second optical waveguide is tested after calibration, namely, the modulated optical signal is coupled into the second optical waveguide with different length, the optical waveguide is coupled and output into the photoelectric detector through the optical waveguide chip after transmission, the detected signal is input into a second port of the vector network analyzer, and the second port is connected with the vector network analyzerThe response S at the moment is obtained by testing in a network analyzer21Including an amplitude response and a phase response;
4) the slope of the phase response curve, i.e., the phase shift amount per unit frequency, was calculated and recorded as α, and the formula of the relationship between the refractive index of the optical waveguide group and the phase shift amount was used
Figure BDA0002536185770000031
And calculating the group refractive index of the optical waveguides, wherein L is the length difference of the two optical waveguides, and c is the speed of light in vacuum.
In the step 2) or 3), the modulated optical signal is coupled with the coupling input port 7 of the optical waveguide chip through the coupling input optical fiber 5, and the optical wave is transmitted through the optical waveguide, is output to the coupling output optical fiber 6 through the coupling output port 8 of the optical waveguide chip, and is then input to the photoelectric detector 11 for photoelectric conversion.
The optical waveguide chip is connected with the coupling optical fiber in a horizontal end face coupling or vertical grating coupling mode.
In the step 4), the derivation process of the method for measuring the refractive index of the optical waveguide group is as follows:
group refractive index n of optical waveguide in first-order dispersion modelgCan be expressed as:
Figure BDA0002536185770000032
in the formula neffIs effective refractive index, λ is optical wavelength, λ0The refractive index is related to the wavelength of light for the wavelength corresponding to the desired group refractive index.
Light waves propagating in the waveguide, their phases
Figure BDA0002536185770000034
Can be expressed as:
Figure BDA0002536185770000033
in the method, after through calibration, L in the above formula is the length difference L of the two optical waveguides L ═ L2-L1
The phase derivation for the above equation can be found:
Figure BDA0002536185770000041
in addition, the following steps:
Figure BDA0002536185770000042
then:
Figure BDA0002536185770000043
further simplification can be achieved:
Figure BDA0002536185770000044
where c is the speed of light in vacuum.
And the slope of the phase response curve is α
Figure BDA0002536185770000045
Thus, the group index can be expressed as:
Figure BDA0002536185770000046
for ease of calculation, α in the formula is in rad/Hz.
As shown in fig. 1, the present invention further provides a measuring apparatus for the method for measuring the refractive index of the optical waveguide group, which includes a continuous wave laser 1, an optical single-sideband modulator 3, an optical waveguide chip 4, a photodetector 11 and a vector network analyzer 12; the optical waveguide chip 4 comprises two optical waveguides with the lengths of 1000 microns and 2000 microns respectively, namely a first optical waveguide 9 and a second optical waveguide 10;
after being modulated by the optical single-sideband modulator, optical signals are coupled by the coupling input optical fiber 5 and the coupling input port 7, the optical signals are output to the coupling output optical fiber 6 by the coupling output port 8 after being transmitted by the optical waveguide, and are subjected to photoelectric conversion by the photoelectric detector 11, and the detected signals are input to the two ports 16 of the vector network analyzer to obtain the response of the optical waveguide.
The optical waveguides 9 and 10 are connected with the coupling input optical fiber 5 and the coupling output optical fiber 6 at the coupling input port 7 and the coupling output port 8 through a horizontal end face or vertical grating coupling mode.
The working mode of the measuring device is as follows: the continuous wave laser 1 outputs an optical carrier signal to the optical single-side band modulator 3, and a radio frequency signal output by a first port 15 of the vector network analyzer is loaded to the optical single-side band modulator 3 to modulate an optical wave; the modulated optical signal is coupled into a first optical waveguide 9, the optical waveguide is coupled and output into a photoelectric detector 11 through an optical waveguide chip 4 after being transmitted, the detected signal is input into a second port 16 of the vector network analyzer, and the loop is utilized to carry out straight-through calibration of the vector network analyzer; testing the second optical waveguide 10 after calibration, coupling the modulated optical signal into the second optical waveguide 10, coupling and outputting the optical signal into the photoelectric detector 11 through the optical waveguide chip 4 after optical waveguide transmission, inputting the detected signal into the second port 16 of the vector network analyzer, and testing from the vector network analyzer to obtain the response S at the moment21Including an amplitude response and a phase response.
The optical vector network analyzer based optical waveguide group refractive index measuring method provided by the invention has high measuring precision and is suitable for measuring various optical waveguide devices.
The technical solution of the present invention is further explained with reference to the drawings and the embodiments.
Example 1
A method for measuring the refractive index of an optical waveguide group used for a horizontal end face coupling optical waveguide is disclosed, as shown in figure 1, a measuring device of the method comprises a continuous wave laser 1, an optical single-sideband modulator 3, an optical waveguide chip 4, a photoelectric detector 11 and a vector network analyzer 12; after being modulated by the optical single-sideband modulator, optical signals are coupled by the coupling input optical fiber 5 and the coupling input port 7, the optical signals are output to the coupling output optical fiber 6 by the coupling output port 8 after being transmitted by the optical waveguide, and are subjected to photoelectric conversion by the photoelectric detector 11, and the detected signals are input to the two ports 16 of the vector network analyzer to obtain the response of the optical waveguide.
The optical waveguide chip 4 comprises two optical waveguides with the lengths of 1000 micrometers and 2000 micrometers respectively.
The optical waveguides 9, 10 are connected with the coupling optical fibers 5, 6 at the coupling input port 7 and the coupling output port 8 in a horizontal end face coupling mode.
The measuring method comprises the following steps:
1) the continuous wave laser outputs an optical carrier signal to the optical single-side band modulator, and a radio frequency signal output by a first port of the vector network analyzer is loaded to the modulator to modulate an optical wave;
2) the modulated optical signal is coupled to a first optical waveguide with the length of 1000 microns through an optical fiber end face, the relative position of the optical fiber and the waveguide end face is adjusted to obtain maximum-efficiency optical coupling, after the optical waveguide is transmitted, the waveguide output end is coupled with the optical fiber and input into a photoelectric detector for photoelectric conversion, the detected signal is input into a second port of a vector network analyzer, and the loop is utilized to carry out straight-through calibration of the vector network analyzer;
3) testing a second optical waveguide with the length of 2000 microns after calibration, namely coupling the modulated optical signal into the second optical waveguide, and testing from a vector network analyzer to obtain the S at the moment21Including an amplitude response and a phase response;
4) the slope of the phase response curve, i.e., the phase shift amount per unit frequency, was calculated and recorded as α, and the formula of the relationship between the refractive index of the optical waveguide group and the phase shift amount was used
Figure BDA0002536185770000061
The group refractive index of the optical waveguide is calculated.
Wherein, L is 2000-.
The principle of the calculation formula of the method for measuring the refractive index of the optical waveguide group in the embodiment is described in detail as follows:
group refractive index n of optical waveguide in first-order dispersion modelgCan be expressed as:
Figure BDA0002536185770000062
in the formula neffIs effective refractive index, λ is optical wavelength, λ0The refractive index is related to the wavelength of light for the wavelength corresponding to the desired group refractive index.
Light waves propagating in the waveguide, their phases
Figure BDA0002536185770000066
Can be expressed as:
Figure BDA0002536185770000063
in the method, after through calibration, L in the above formula is the length difference L of the two optical waveguides L ═ L2-L1
The phase derivation for the above equation can be found:
Figure BDA0002536185770000064
in addition, the following steps:
Figure BDA0002536185770000065
then:
Figure BDA0002536185770000071
further simplification can be achieved:
Figure BDA0002536185770000072
where c is the speed of light in vacuum.
And the slope of the phase response curve is α
Figure BDA0002536185770000073
Thus, the group index can be expressed as:
Figure BDA0002536185770000074
for ease of calculation, α in the formula is in rad/Hz.
Example 2
A measuring method of refractive index of optical waveguide group for grating vertical coupling optical waveguide is disclosed, as shown in FIG. 1, the measuring device comprises a continuous wave laser 1, an optical single-sideband modulator 3, an optical waveguide chip 4, a photoelectric detector 11 and a vector network analyzer 12;
the continuous wave laser 1 is connected with an optical single-side band modulator 3 through an optical fiber 2, the optical single-side band modulator 3 is connected with a coupling input optical fiber 5, an output optical fiber 6 is connected with a photoelectric detector 11, and the photoelectric detector 11 is connected with a second port 16 of the vector network analyzer through a high-frequency cable 14 of the second port of the vector network analyzer. The port one 15 of the vector network analyzer is connected with the optical single sideband modulator 3 through the high frequency cable 13 of the port one of the vector network analyzer.
After being modulated by the optical single-sideband modulator, optical signals are coupled by the first coupling optical fiber 5 and the coupling input port 7, the optical signals are output to the second coupling optical fiber 6 by the coupling output port 8 after being transmitted by the optical waveguide and are subjected to photoelectric conversion by the photoelectric detector 11, and the detected signals are input to the two ports 16 of the vector network analyzer to obtain the response of the optical waveguide.
The optical waveguide chip 4 comprises two optical waveguides with the lengths of 1000 micrometers and 2000 micrometers respectively.
The optical waveguides 9, 10 are connected with the coupling optical fibers 5, 6 at the coupling input port 7 and the coupling output port 8 in a grating vertical coupling mode.
The measuring method comprises the following steps:
1) the continuous wave laser outputs an optical carrier signal to the optical single-side band modulator, and a radio frequency signal output by a first port of the vector network analyzer is loaded to the modulator to modulate an optical wave;
2) the modulated optical signal is vertically coupled into a first optical waveguide with the length of 1000 microns through a grating, the relative position of the optical fiber and the grating is adjusted to obtain maximum-efficiency optical coupling, after the optical waveguide is transmitted, the grating at the output end of the waveguide is coupled with the optical fiber and is input into a photoelectric detector for photoelectric conversion, the detected signal is input into a second port of a vector network analyzer, and the loop is utilized for straight-through calibration of the vector network analyzer;
3) testing a second optical waveguide with the length of 2000 microns after calibration, namely coupling the modulated optical signal into the second optical waveguide, and testing from a vector network analyzer to obtain the S at the moment21Including an amplitude response and a phase response;
4) the slope of the phase response curve, i.e., the phase shift amount per unit frequency, was calculated and recorded as α, and the formula of the relationship between the refractive index of the optical waveguide group and the phase shift amount was used
Figure BDA0002536185770000081
The group refractive index of the optical waveguide is calculated.
Wherein, L is 2000-.
The calculation formula principle of the embodiment 2 is the same as that of the embodiment 1, except that the optical signal is coupled through the vertical coupling grating at the two ends of the optical waveguide.

Claims (6)

1. A method for measuring the refractive index of an optical waveguide group is characterized by comprising the following steps:
1) the continuous wave laser outputs an optical carrier signal to the optical single-side band modulator, and a radio frequency signal output by a first port of the vector network analyzer is loaded to the optical single-side band modulator to modulate an optical wave;
2) the modulated optical signal is coupled into a first optical waveguide, the optical waveguide is coupled and output into a photoelectric detector through an optical waveguide chip after being transmitted, the detected signal is input into a second port of the vector network analyzer, and the loop is utilized to carry out straight-through calibration of the vector network analyzer;
3) testing a second optical waveguide after calibration, wherein the length of the second optical waveguide is different from that of the first optical waveguide; will be modulatedOptical signals are coupled into a second optical waveguide, the optical signals are coupled and output into a photoelectric detector through an optical waveguide chip after being transmitted, detected signals are input into a second port of the vector network analyzer, and the response S at the moment is obtained through testing in the vector network analyzer21Including an amplitude response and a phase response;
4) the slope of the phase response curve, i.e., the phase shift amount per unit frequency, was calculated and recorded as α, and the formula of the relationship between the refractive index of the optical waveguide group and the phase shift amount was used
Figure FDA0002536185760000011
And calculating the group refractive index of the optical waveguides, wherein L is the length difference of the two optical waveguides, and c is the speed of light in vacuum.
2. The method for measuring the refractive index of the optical waveguide group according to claim 1, wherein in step 2) or 3), the modulated optical signal is coupled with the coupling input port of the optical waveguide chip through the coupling input optical fiber, and the optical wave is transmitted through the optical waveguide, then is output to the coupling output optical fiber through the coupling output port of the optical waveguide chip, and is then connected to the photoelectric detector for photoelectric conversion.
3. The method for measuring the refractive index of an optical waveguide group according to claim 1, wherein in the step 4), the method for calculating the refractive index of an optical waveguide group is as follows:
group refractive index n of optical waveguide in first-order dispersion modelgExpressed as:
Figure FDA0002536185760000012
in the formula neffIs effective refractive index, λ is optical wavelength, λ0The wavelength corresponding to the desired group refractive index, the refractive index being related to the wavelength of the light;
light waves propagating in the waveguide, their phases
Figure FDA0002536185760000013
Expressed as:
Figure FDA0002536185760000021
after through calibration, L in the above formula is the length difference L of the two optical waveguides2-L1
The phase derivation for the above equation can be found:
Figure FDA0002536185760000022
in addition, the following steps:
Figure FDA0002536185760000023
then:
Figure FDA0002536185760000024
further simplification can be achieved:
Figure FDA0002536185760000025
and the slope of the phase response curve is α
Figure FDA0002536185760000026
Thus, the group refractive index is expressed as:
Figure FDA0002536185760000027
4. the device for measuring the refractive index of the optical waveguide group is characterized by comprising a continuous wave laser (1), an optical single-sideband modulator (3), an optical waveguide chip (4), a photoelectric detector (11) and a vector network analyzer (12), wherein the optical waveguide chip (4) comprises two optical waveguides with different lengths;
after being modulated by the optical single-sideband modulator (3), optical signals are coupled with the coupling input port (7) through the coupling input optical fiber (5), the optical signals are transmitted through the optical waveguide and then output to the coupling output optical fiber (6) through the coupling output port (8), the optical signals are connected with the photoelectric detector (11) for photoelectric conversion, and the detected signals are input to the second port (16) of the vector network analyzer to obtain the response of the optical waveguide.
5. The apparatus of claim 4, wherein the two optical waveguides have lengths of 1000 microns and 2000 microns, respectively.
6. The device for measuring the refractive index of an optical waveguide group according to claim 4, wherein two optical waveguides with different lengths are connected with the input coupling fiber (5) and the output coupling fiber (6) at the coupling input port and the coupling output port in a horizontal end face coupling or grating vertical coupling mode.
CN202010533296.9A 2020-06-12 2020-06-12 Method and device for measuring refractive index of optical waveguide group Active CN111735610B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010533296.9A CN111735610B (en) 2020-06-12 2020-06-12 Method and device for measuring refractive index of optical waveguide group

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010533296.9A CN111735610B (en) 2020-06-12 2020-06-12 Method and device for measuring refractive index of optical waveguide group

Publications (2)

Publication Number Publication Date
CN111735610A true CN111735610A (en) 2020-10-02
CN111735610B CN111735610B (en) 2022-06-28

Family

ID=72650125

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010533296.9A Active CN111735610B (en) 2020-06-12 2020-06-12 Method and device for measuring refractive index of optical waveguide group

Country Status (1)

Country Link
CN (1) CN111735610B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114665957A (en) * 2022-03-22 2022-06-24 中国电子科技集团公司第三十八研究所 System and method for measuring refractive index of optical fiber

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006071431A (en) * 2004-09-01 2006-03-16 Optical Comb Institute Inc Optical resonator measuring device and method
CN102638305A (en) * 2012-03-29 2012-08-15 南京航空航天大学 Optical single-side band modulation based optical device measuring method and optical single-side band modulation based optical device measuring device
US20120243828A1 (en) * 2011-03-23 2012-09-27 Kabushiki Kaisha Toshiba Ring optical modulator
CN103091072A (en) * 2012-12-25 2013-05-08 南京航空航天大学 Optical device measuring method and measuring device based on optical single side band modulating
CN104198435A (en) * 2014-09-16 2014-12-10 北京航空航天大学 Device and method for measuring group refractive index of photonic bandgap fibers based on frequency modulated continuous waves
CN105339778A (en) * 2013-06-28 2016-02-17 佳能株式会社 Method for measuring refractive index, refractive index measuring device, and method for producing optical element
CN105572072A (en) * 2015-12-21 2016-05-11 中国科学院长春光学精密机械与物理研究所 Transparent optical material group refractive index measuring device and method
CN105874314A (en) * 2014-04-15 2016-08-17 华为技术有限公司 Optical waveguide group velocity delay measurement device and method
CN109387356A (en) * 2018-08-31 2019-02-26 中国电子科技集团公司第五十五研究所 A kind of transmission loss of optical waveguide measurement method
CN110243572A (en) * 2019-06-28 2019-09-17 中兴光电子技术有限公司 A kind of optical waveguide group index test device and method

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006071431A (en) * 2004-09-01 2006-03-16 Optical Comb Institute Inc Optical resonator measuring device and method
US20120243828A1 (en) * 2011-03-23 2012-09-27 Kabushiki Kaisha Toshiba Ring optical modulator
JP2012198465A (en) * 2011-03-23 2012-10-18 Toshiba Corp Ring optical modulator
CN102638305A (en) * 2012-03-29 2012-08-15 南京航空航天大学 Optical single-side band modulation based optical device measuring method and optical single-side band modulation based optical device measuring device
CN103091072A (en) * 2012-12-25 2013-05-08 南京航空航天大学 Optical device measuring method and measuring device based on optical single side band modulating
CN105339778A (en) * 2013-06-28 2016-02-17 佳能株式会社 Method for measuring refractive index, refractive index measuring device, and method for producing optical element
CN105874314A (en) * 2014-04-15 2016-08-17 华为技术有限公司 Optical waveguide group velocity delay measurement device and method
CN104198435A (en) * 2014-09-16 2014-12-10 北京航空航天大学 Device and method for measuring group refractive index of photonic bandgap fibers based on frequency modulated continuous waves
CN105572072A (en) * 2015-12-21 2016-05-11 中国科学院长春光学精密机械与物理研究所 Transparent optical material group refractive index measuring device and method
CN109387356A (en) * 2018-08-31 2019-02-26 中国电子科技集团公司第五十五研究所 A kind of transmission loss of optical waveguide measurement method
CN110243572A (en) * 2019-06-28 2019-09-17 中兴光电子技术有限公司 A kind of optical waveguide group index test device and method

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
FENGJIE ZHOU, ET AL: "A Tunable Microwave-Photonic Notch Filter Based On Single Silicon Ring Resonator", 《2018 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP)》 *
S. FOTEINOPOULOU AND C. M. SOUKOULIS: "Negative refraction and left-handed behavior in two-dimensional photonic crystals", 《PHYSICAL REVIEW B》 *
潘时龙等: "超高分辨率光矢量分析技术", 《光电子技术》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114665957A (en) * 2022-03-22 2022-06-24 中国电子科技集团公司第三十八研究所 System and method for measuring refractive index of optical fiber

Also Published As

Publication number Publication date
CN111735610B (en) 2022-06-28

Similar Documents

Publication Publication Date Title
KR101000974B1 (en) Measurement Method of Chromatic Dispersion of Optical Beam Waveguide Using Interference Fringe Measurement system
CN102628893B (en) System and method for measuring photonic integration microwave frequency
CN102281107A (en) Dispersion measuring device and method for fiber optical device
CN108614126B (en) Angular velocity measurement device and method based on wideband adjustable optical-electronic oscillator
CN101319878B (en) Method and device for high-precision large-range measuring size of optical fiber
CN107515017A (en) A kind of optical frequency domain reflectometer of light wave frequency shift modulation
CN107884876B (en) Light polarization state detection chip based on waveguide grating coupler
CN109387356B (en) Optical waveguide transmission loss measuring method
CN113315573B (en) Optical-assisted broadband microwave instantaneous frequency measurement method
CN100533095C (en) Optical waveguides ring-shaped resonant cavity elementary structure parameter test device and its method
CN105547336A (en) Fiber grating sensing demodulation device and method on the basis of photoelectric oscillation loop
CN101290248B (en) Single-mode infra-red wavemeter based on Mach-Zehnder Interferometer filtering principle
CN102121851B (en) Method for measuring length difference of array fibers
CN114777904A (en) Vibration measurement device and method based on filtering integrated optical chip
CN111735610B (en) Method and device for measuring refractive index of optical waveguide group
CN109238658B (en) Method for measuring delay parameter of optical delay device
CN108645601B (en) A kind of the probe beam deflation device and its measurement method of optical microcavity
CN104375354A (en) Dimmable differential equation solver based on interference couplers and silica-based micro-ring resonant cavity
CN116481670A (en) Sapphire optical fiber Fabry-Perot temperature sensing system based on microwave photon interference optical fiber loop and virtual reflecting surface structure and demodulation method
CN112129229B (en) Quasi-distributed displacement measuring device and method based on photoelectric oscillator
CN212300381U (en) Fiber grating sensing demodulation device based on frequency shift interference fiber ring-down
CN112147628B (en) Remote displacement measuring device and method based on photoelectric oscillator
Xiao et al. Ring-resonator-coupled Mach-Zehnder interferometers for integrated photonics by 3D direct laser writing
Guo et al. Three-axis Interferometric Fiber Optic Gyroscope with Silica Integrated Coupler Chip
CN201242428Y (en) Apparatus for measuring optical fiber length rapidly

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant