CN111735501B - Temperature and humidity measuring method for environmental test facility equipment - Google Patents
Temperature and humidity measuring method for environmental test facility equipment Download PDFInfo
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- CN111735501B CN111735501B CN202010684384.9A CN202010684384A CN111735501B CN 111735501 B CN111735501 B CN 111735501B CN 202010684384 A CN202010684384 A CN 202010684384A CN 111735501 B CN111735501 B CN 111735501B
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Abstract
The invention discloses a temperature and humidity measuring method for environmental test facility equipment, and relates to the technical field of temperature and humidity measuring methods. The main technical scheme of the invention is as follows: dividing the internal space of the tested equipment into N grid spaces, wherein N is a positive integer greater than or equal to 1; dividing each grid space into an upper layer, a middle layer and a lower layer, and arranging a temperature measuring point and a humidity measuring point in each layer; and detecting to obtain the temperature value of the temperature measuring point and the humidity value of the humidity measuring point in each grid space, and calculating to obtain the temperature deviation, the temperature uniformity, the temperature fluctuation, the humidity deviation, the humidity uniformity and the humidity fluctuation of the equipment to be tested. The temperature and humidity measuring method for the environmental test facility equipment solves the technical problems that accurate data cannot be obtained in the conventional temperature and humidity measuring mode, and equipment cannot be adjusted according to detected data.
Description
Technical Field
The invention relates to the technical field of temperature and humidity measurement methods, in particular to a temperature and humidity measurement method for environmental test facility equipment.
Background
For large environmental test facilities such as large refrigerators for storing food and medicine, refrigerated trucks and the like, in order to ensure the safety and reliability of stored products, the temperature and humidity conditions of the large environmental test facilities are usually monitored and verified in real time.
In the prior art, the temperature and humidity of the internal space of the environmental test facility equipment are obtained by a single-point detection mode. Although the mode is convenient, the space of the environmental test facility equipment is relatively large, the detection mode in the prior art cannot accurately obtain the accurate temperature and humidity of the internal space of the environmental test facility equipment, the temperature and humidity deviation of different regions of the internal space can be large, and the detected temperature and humidity cannot be used for guiding to adjust the temperature and humidity of the internal space of the environmental test facility equipment.
The above technical problem needs to be further solved.
Disclosure of Invention
In view of the above, the present invention provides a temperature and humidity measurement method for environmental test facilities, and mainly aims to solve the technical problems that the existing temperature and humidity measurement method cannot obtain accurate data, and cannot adjust equipment according to detected data.
The invention provides a temperature and humidity measuring method for environmental test facility equipment, which comprises the following steps:
dividing the internal space of the tested equipment into N grid spaces, wherein N is a positive integer greater than or equal to 1;
dividing each grid space into an upper layer, a middle layer and a lower layer, and setting a temperature measuring point and a humidity measuring point in each layer;
and detecting to obtain the temperature value of the temperature measuring point and the humidity value of the humidity measuring point in each grid space, and calculating to obtain the temperature deviation, the temperature uniformity, the temperature fluctuation, the humidity deviation, the humidity uniformity and the humidity fluctuation of the equipment to be tested.
The object of the present invention and the technical problems solved thereby can be further achieved by the following technical measures.
Specifically, the internal space of the device to be tested is divided into N grid spaces according to the volume of the device to be tested;
when the volume of the device under test is smaller than the first volume, the whole internal space of the device under test is taken as 1 grid space;
when the volume of the device under test is larger than or equal to the first volume and smaller than or equal to the second volume, taking the whole internal space of the device under test as 1 grid space;
and when the volume of the device to be tested is larger than the second volume, dividing the internal space of the device to be tested into two or more grid spaces according to a three-dimensional space dividing mode.
In particular, the first volume is 2m 3 The second volume is 50m 3 。
Specifically, when the volume of the device under test is smaller than the first volume, four temperature measurement points are uniformly arranged at intervals on the upper layer of the grid space, one humidity measurement point is arranged at the position of one of the temperature measurement points, one temperature measurement point and one humidity measurement point are arranged on the middle layer of the grid space, four temperature measurement points are arranged at the projection position of the lower layer of the temperature measurement points on the upper layer of the grid space, and one humidity measurement point is arranged at the position of one of the temperature measurement points on the lower layer;
the positions of the humidity measuring points on the upper layer projected on the lower layer and the positions of the humidity measuring points arranged on the lower layer are respectively close to two side walls of the tested equipment.
Specifically, when the volume of the device to be tested is greater than or equal to the first volume, five temperature measurement points are arranged in the same distribution mode on the upper layer and the lower layer of the grid space, one of the five temperature measurement points is located in the middle of the layer, and the rest four temperature measurement points surrounding the middle are arranged around the layer at uniform intervals;
the middle layer is also provided with five temperature measuring points, one temperature measuring point is arranged in the middle of the middle layer, the other four temperature measuring points surrounding the middle layer are uniformly arranged around the middle layer at intervals, and the projections of the four temperature measuring points on the upper layer are respectively positioned in the middle of two adjacent temperature measuring points surrounding the four temperature measuring points on the upper layer;
the number of the humidity measuring points is 4, one of the humidity measuring points is located at the position, close to the doorway of the tested device, of the middle layer, the other three humidity measuring points are located in the three layers respectively, and the three humidity measuring points projected on the upper layer are located on the same straight line.
In particular, according to the formula
Calculating to obtain the temperature deviation of the tested equipment;
according to the formula
Calculating and obtaining the humidity deviation of the tested equipment;
according to the formula
Calculating to obtain the temperature fluctuation degree of the tested equipment;
according to the formula
Calculating to obtain the humidity fluctuation degree of the tested equipment;
according to the formula
Calculating to obtain the temperature uniformity of the tested equipment;
according to the formula
Calculating to obtain the humidity uniformity of the tested equipment;
wherein, the Δ t d For the temperature deviation of the device under test,
setting an average value of the display values after the temperature is set for the device under test,
the average value of the temperature of all temperature measuring points in all grid spaces is taken;
the Δ h d For the humidity deviation of the device under test, the
Average value of display value after setting humidity of the tested device
Average humidity values of all humidity measurement points in all grid spaces;
the Δ t f For the temperature fluctuation degree of the device under test, the
For the maximum value of the average temperature of all temperature measurement points in each grid space of the device under test, the
The minimum value of the average temperature of all temperature measuring points in each grid space of the tested device is taken as the minimum value;
the Δ h f Is the degree of humidity fluctuation of the device under test, the
Is the maximum value of the average humidity of all humidity measurement points in each grid space of the device under test, the
The minimum value of the average humidity of all the humidity measuring points in each grid space of the tested device is taken as the value;
the Δ t u For the temperature uniformity of the device under test, n is the grid space number of the device under test
The temperature measurement value is the maximum point of the temperature average value of the ith grid space of the tested equipment; the above-mentioned
The temperature measurement value is the temperature measurement value of the minimum point of the temperature average value of the ith grid space of the tested equipment;
Δ h is u For the temperature uniformity of the device under test, the
The measured temperature value is the maximum point of the average temperature value of the ith grid space of the measured equipment; the above-mentioned
The temperature measurement value of the minimum point of the temperature average value of the ith grid space of the tested equipment is obtained, i is a positive integer larger than or equal to 1, and n is a positive integer larger than or equal to 1.
Specifically, after the tested device stably operates for 1-2 hours, the temperature deviation, the temperature uniformity, the temperature fluctuation degree, the humidity deviation, the humidity uniformity and the humidity fluctuation degree are measured.
Specifically, when the measurement of the temperature uniformity and the humidity uniformity was performed, data was collected every 3 minutes for 10 minutes.
Specifically, a mathematical model Δ t for the uncertainty assessment of the temperature deviation calibration result is established d ＝t d -t o -Δt 0 And establishing a mathematical model Δ h of said moisture deviation calibration result uncertainty assessment d ＝h d -h o -Δh 0 ；
Wherein, t is d Setting a display value after temperature for the device under test, t o For measuring the temperature of the temperature measuring point, the value of the temperature of the inspection instrument, Δ t 0 Temperature correction value for the temperature of the polling device, h d Setting a display value after humidity for the device under test, h o For measuring the humidity value of the polling device at the humidity measuring point, Δ h 0 The humidity correction value is the humidity of the polling instrument;
and to the parameter t in the mathematical model d 、t o 、Δt 0 And h d 、h o 、Δh 0 And carrying out uncertainty analysis.
In particular, said pair of parameters t in said mathematical model d 、t o 、Δt 0 And h d 、h o 、Δh 0 A method of performing an uncertainty analysis comprising:
repeatedly measuring one of the inspection instruments or the equipment to be tested under the repeated measurement condition by using the measurement standard, and quantitatively characterizing by using the experimental standard deviation S (x) of the obtained measurement value
Wherein, the x p For the p-th measured value, the measured value,
is the arithmetic mean of q measured values, q is a positive integer greater than or equal to 6, and p is a positive integer greater than or equal to 1;
standard uncertainty u introduced for repeatability of the measured device measurements 1 The above-mentioned
The standard uncertainty introduced aiming at the repeatability of the temperature and the humidity of the inspection instrument is u 2 Said
Standard uncertainty u introduced according to temperature and humidity correction values of inspection instrument 3 Obtaining the temperature and humidity correction value r according to the use instruction of the polling instrument
And obtaining u 1 、u 2 、u 3 On the basis of (1), synthesizing a standard uncertainty u c And an extended uncertainty U, said
The U = ku c And k is a parameter value.
By means of the technical scheme, the temperature and humidity measuring method for the environmental test facility equipment at least has the following advantages:
the temperature and humidity measuring method of the environmental test facility equipment provided by the embodiment of the invention divides the internal space of the equipment to be measured into N grid spaces, divides each grid space into an upper layer, a middle layer and a lower layer, and then sets a temperature measuring point and a humidity measuring point in each corresponding grid space, so that the measured temperature and humidity data can cover the whole space of the equipment to be measured, the measured temperature and humidity data are more accurate, and then the measured temperature data and humidity data are used for calculating temperature deviation, temperature uniformity, temperature fluctuation, humidity deviation, humidity uniformity, humidity fluctuation and the like, the obtained result can effectively represent the temperature and humidity conditions of the equipment to be measured, and a user can calibrate or adjust the equipment to be measured based on the calculated result.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical solutions of the present invention more clearly understood and to implement them in accordance with the contents of the description, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
Drawings
Fig. 1 is a schematic flow chart of a method for measuring temperature and humidity of environmental test facility equipment according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a method for partitioning an internal space of an environmental test facility according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of temperature measurement points and humidity measurement points arranged on an upper layer, a middle layer and a lower layer of a grid space according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of temperature measurement points and humidity measurement points arranged on the upper layer, the middle layer and the lower layer of another grid space provided by the embodiment of the invention.
Detailed Description
To further illustrate the technical means and effects of the present invention adopted to achieve the predetermined objects, the following detailed description will be given to the specific implementation, structure, characteristics and effects of the temperature and humidity measurement method for environmental test facilities and equipment according to the present invention with reference to the accompanying drawings and preferred embodiments.
The embodiment of the invention provides a temperature and humidity measuring method for environmental test facility equipment, which comprises the following steps of:
101. dividing the internal space of the tested device into N grid spaces, wherein N is a positive integer greater than or equal to 1.
Specifically, the internal space of the device to be tested can be relatively large or relatively small because the device to be tested is a storage space for refrigerating and maintaining a certain humidity, so that the grid space can be divided according to the volume of the internal space of the device to be tested, and it should be noted that the division of the grid space does not use an isolation material to divide a large space into small spaces, but the space is conceptually and virtually divided into appropriate grid spaces, so as to set temperature measurement points and humidity measurement points, and further obtain accurate temperature and humidity distribution states of the internal space of the device to be tested.
102. Each grid space is divided into an upper layer, a middle layer and a lower layer, and a temperature measuring point and a humidity measuring point are arranged in each layer.
Specifically, after the grid space is obtained through division, the temperature measuring points and the humidity measuring points are set again according to the upper layer, the middle layer and the lower layer, so that the temperature measuring points and the humidity measuring points can be uniformly distributed in the internal space of the equipment to be tested in a gathering manner, the temperature and the humidity of each position of the equipment to be tested can be measured, and the distribution condition of the temperature and the humidity of the internal space of the equipment to be tested can be accurately known.
103. And detecting to obtain the temperature value of the temperature measuring point and the humidity value of the humidity measuring point in each grid space, and calculating to obtain the temperature deviation, the temperature uniformity, the temperature fluctuation, the humidity deviation, the humidity uniformity and the humidity fluctuation of the equipment to be tested.
The temperature and humidity measuring method of the environmental test facility equipment provided by the embodiment of the invention divides the internal space of the equipment to be measured into N grid spaces, divides each grid space into an upper layer, a middle layer and a lower layer, and then sets a temperature measuring point and a humidity measuring point in each corresponding grid space, so that the measured temperature and humidity data can cover the whole space of the equipment to be measured, the measured temperature and humidity data are more accurate, and then the measured temperature data and humidity data are used for calculating temperature deviation, temperature uniformity, temperature fluctuation, humidity deviation, humidity uniformity, humidity fluctuation and the like, the obtained result can effectively represent the temperature and humidity conditions of the equipment to be measured, and a user can calibrate or adjust the equipment to be measured based on the calculated result.
In a specific implementation, the dividing manner of the internal space of the device under test may be as shown in fig. 2:
201. dividing the internal space of the device under test into N grid spaces according to the volume of the device under test.
202. When the device under test volume is smaller than the first volume, the overall internal space of the device under test is taken as 1 grid space.
203. And when the volume of the device under test is larger than or equal to the first volume and smaller than or equal to the second volume, taking the whole internal space of the device under test as 1 grid space.
204. And when the volume of the device to be tested is larger than the second volume, dividing the internal space of the device to be tested into two or more grid spaces according to a three-dimensional space dividing mode.
In particular, the first volume is preferably 2m 3 The second volume is preferably 50m 3 。
The grid space is divided into cubic spaces according to the division manner of the three-dimensional coordinate system.
In a specific implementation, after the internal space of the device under test is divided in the above manner, the temperature measurement point and the humidity measurement point may be arranged in each grid space in the following manner:
specifically, when the device under test volume is smaller than the first volume, as shown in fig. 3, four temperature measurement points "a, B, C, D" are disposed at the upper layer of the grid space at regular intervals, one humidity measurement point "C" is disposed at the position of one of the temperature measurement points, one temperature measurement point "O" and one humidity measurement point "a" are disposed at the middle layer of the grid space, four temperature measurement points "E, F, H, G" are disposed at the projection position of the upper layer of the grid space at the lower layer, and one humidity measurement point "B" is disposed at the position of one of the temperature measurement points at the lower layer; the positions of the humidity measuring points on the upper layer projected on the lower layer and the positions of the humidity measuring points arranged on the lower layer are respectively close to two side walls of the tested equipment.
When the volume of the device under test is greater than or equal to the first volume, as shown in fig. 4, five temperature measurement points "a, B, C, D, E" and "M, L, N, J, K" are disposed in the same distribution manner in both the upper and lower layers of the grid space, one of the five temperature measurement points is located in the middle of a layer, and the remaining four temperature measurement points surrounding the middle are disposed around the layer at regular intervals; the middle layer is also provided with five temperature measuring points 'F, G, H, I and O', one is arranged in the middle of the middle layer, the other four temperature measuring points surrounding the middle layer are uniformly arranged around the middle layer at intervals, and the projections of the four temperature measuring points 'A, B, C and D' on the upper layer are respectively positioned in the middle of two adjacent temperature measuring points surrounding the upper layer; the number of the humidity measuring points is 4, one of the humidity measuring points is located at the position, close to the doorway of the tested device, of the middle layer, the other three humidity measuring points are located in the three layers respectively, and the three humidity measuring points projected on the upper layer are located on the same straight line.
It should be noted that the reference numerals a to O of the respective temperature measurement points described above are used only as reference numerals to show the positions of the temperature measurement points, and are directly distinguishable from the letters in the subsequent formulas.
Furthermore, the temperature measurement point and the humidity measurement point both need to be provided with a device capable of measuring temperature or humidity, for example, a patrol instrument or a temperature and humidity sensor capable of measuring temperature and humidity can be provided, and then the temperature and humidity corresponding to each temperature measurement point and humidity measurement point can be measured.
In particular implementations, the formula may be based on
Calculating to obtain the temperature deviation of the tested equipment;
according to the formula
Calculating and obtaining the humidity deviation of the tested equipment;
according to the formula
Calculating to obtain the temperature fluctuation degree of the tested equipment;
according to the formula
Calculating to obtain the humidity fluctuation degree of the tested equipment;
according to the formula
Calculating to obtain the temperature uniformity of the tested equipment;
according to the formula
Calculating to obtain the humidity uniformity of the tested equipment;
wherein, the Δ t d Is the temperature deviation of the device under test,
setting an average value of the display values after the temperature is set for the device under test,
the average value of the temperature of all temperature measuring points in all grid spaces is taken;
the Δ h d For a deviation of the humidity of the device under test, the
Average value of display value after setting humidity of the tested device
Average humidity values of all humidity measurement points in all grid spaces;
the Δ t f For the measured deviceDegree of temperature fluctuation of the
For the maximum value of the average temperature of all temperature measurement points in each grid space of the device under test, the
The minimum value of the average temperature of all temperature measurement points in each grid space of the tested device is obtained;
the Δ h f For the degree of humidity fluctuation of the device under test, the
Is the maximum value of the average humidity of all humidity measurement points in each grid space of the device under test, the
The minimum value of the average humidity of all humidity measurement points in each grid space of the tested device is obtained;
the Δ t u For the temperature uniformity of the device under test, n is the grid space number of the device under test
The measured temperature value is the maximum point of the average temperature value of the ith grid space of the measured equipment; the described
The temperature measurement value is the temperature measurement value of the minimum point of the temperature average value of the ith grid space of the tested equipment;
the Δ h u For the temperature uniformity of the device under test, the
The temperature measurement value is the maximum point of the temperature average value of the ith grid space of the tested equipment; the above-mentioned
The temperature measurement value is the temperature measurement value of the minimum point of the temperature average value of the ith grid space of the tested equipment; the i is a positive integer greater than or equal to 1, and the n is a positive integer greater than or equal to 1.
Specifically, before the temperature and humidity measurements of each temperature measurement point and humidity measurement point are performed, the device to be tested may be stably operated for 1-2 hours, and then the temperature deviation, the temperature uniformity, the temperature fluctuation, the humidity deviation, the humidity uniformity, and the humidity fluctuation are calculated according to the above formula using the measured temperature and humidity data.
In order to obtain relatively accurate measurement data, it is preferable to collect data every 3 minutes within 10 minutes and collect ten sets of data every time.
In the implementation, since the readings of the temperature and the humidity of the device under test itself may have deviation, and the readings of the polling device may also have deviation, the deviation of the device under test and the polling device may be calibrated in the following manner based on the above method.
The specific implementation of the offset calibration is as follows:
firstly, establishing a mathematical model delta t for evaluating the uncertainty of the temperature deviation calibration result d ＝t d -t o -Δt 0 Wherein, the t d Setting a display value after temperature for the device under test, t o For measuring the temperature of the temperature measuring point, the value of the temperature of the inspection instrument, Δ t 0 The temperature correction value is the temperature of the inspection instrument; because the measurement result also has measurement uncertainty, and the main sources of the measurement uncertainty are the following three items:
(1) uncertainty introduced by repeatability of the calibration device measurements;
(2) repeatedly measuring an introduced uncertainty component by the inspection instrument;
(3) measuring uncertainty components introduced by errors by a polling instrument;
so it is necessary to measure the parameter t in the mathematical model d 、t o 、Δt 0 Carrying out uncertainty analysis;
wherein the parameter t in the pair of mathematical models d 、t o 、Δt 0 A method of performing an uncertainty analysis comprising:
repeatedly measuring one of the inspection instruments or the equipment to be tested under the repeated measurement condition by using the measurement standard, and quantitatively characterizing by using the experimental standard deviation S (x) of the obtained measurement value
Wherein, the x p For the p-th measured value, the measured value,
is the arithmetic mean of q measured values, q is a positive integer greater than or equal to 6, and p is a positive integer greater than or equal to 1;
standard uncertainty u introduced for repeatability of the measured device measurements 1 The above-mentioned
The standard uncertainty introduced aiming at the repeatability of the temperature and the humidity of the inspection instrument is u 2 Said
Standard uncertainty u introduced according to temperature and humidity correction values of inspection instrument 3 Obtaining the temperature and humidity correction value r according to the use instruction of the polling instrument
And obtaining u 1 、u 2 、u 3 On the basis of (1), synthesisStandard uncertainty u c And an extended uncertainty U, said
The U = ku c K is a parameter value, and k can take a value of 2.
Secondly, establishing a mathematical model delta h for evaluating the uncertainty of the humidity deviation calibration result d ＝h d -h o -Δh 0 (ii) a H is d Setting a display value after humidity for the device under test, h o For measuring the humidity value of the polling device of the humidity measuring point, Δ h 0 The humidity correction value is the humidity of the polling instrument; because the measurement results also have a measurement uncertainty, and the main sources of the measurement uncertainty are the following three items:
(1) uncertainty introduced by repeatability of the calibration device measurements;
(2) repeatedly measuring an introduced uncertainty component by the inspection instrument;
(3) measuring uncertainty components introduced by errors by the inspection instrument;
and to the parameter h in the mathematical model d 、h o 、Δh 0 Carrying out uncertainty analysis;
wherein the parameter h in the pair of mathematical models d 、h o 、Δh 0 A method of performing an uncertainty analysis comprising:
repeatedly measuring one of the inspection instruments or the tested equipment under the repeated measurement condition by using the measurement standard, and quantitatively characterizing by using the experimental standard deviation S (x) of the obtained measurement value
Wherein, x is p For the p-th measured value, the measured value,
is the arithmetic mean of q measured values, q is more than or equal to 6 times;
standard uncertainty u introduced for repeatability of the measured device measurements 1 Said
The standard uncertainty introduced aiming at the repeatability of the temperature and humidity values of the inspection instrument is u 2 Said
Standard uncertainty u introduced according to temperature and humidity correction values of inspection instrument 3 Obtaining the temperature and humidity correction value r according to the use instruction of the polling instrument
And obtaining u 1 、u 2 、u 3 On the basis of (1), synthesizing a standard uncertainty u c And an extended uncertainty U, said
The U = ku c And k is a parameter value.
Specifically, the above-mentioned method for obtaining uncertainty may be performed by setting a suitable temperature point for the test, for example, a temperature point of 15 ℃, 50 ℃, 100 ℃, 150 ℃, 200 ℃; and testing at a suitable humidity point, e.g., humidity point 10% RH, 30% RH, 50% RH, 70% RH, 90% RH.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of the changes or substitutions within the technical scope of the present invention, and shall cover the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. The temperature and humidity measuring method for the environmental test facility equipment is characterized by comprising the following steps of:
dividing the internal space of the tested device into N grid spaces according to the volume of the tested device, wherein N is a positive integer greater than or equal to 1;
wherein when the device under test volume is smaller than a first volume, the overall internal space of the device under test is taken as 1 grid space;
when the volume of the device under test is larger than or equal to the first volume and smaller than or equal to the second volume, taking the whole internal space of the device under test as 1 grid space;
when the volume of the tested device is larger than the second volume, the internal space of the tested device is divided into two or more grid spaces according to a three-dimensional space dividing mode;
dividing each grid space into an upper layer, a middle layer and a lower layer, and arranging a temperature measuring point and a humidity measuring point in each layer;
detecting and obtaining the temperature value of the temperature measuring point and the humidity value of the humidity measuring point in each grid space, and calculating to obtain the temperature deviation, the temperature uniformity, the temperature fluctuation, the humidity deviation, the humidity uniformity and the humidity fluctuation of the equipment to be tested;
according to the formula
Calculating to obtain the temperature deviation of the tested equipment;
according to the formula
Calculating and obtaining the humidity deviation of the tested device;
according to the formula
Calculating to obtain the temperature fluctuation degree of the tested equipment;
according to the formula
Calculating to obtain the humidity fluctuation degree of the tested equipment;
according to the formula
Calculating to obtain the temperature uniformity of the tested equipment;
according to the formula
Calculating to obtain the humidity uniformity of the tested equipment;
wherein, the Δ t d Is the temperature deviation of the device under test,
setting an average value of the display values after the temperature is set for the device under test,
the average value of the temperature of all temperature measuring points in all grid spaces is taken;
the Δ h d For the humidity deviation of the device under test, the
Average value of display value after setting humidity of the tested device
Humidity average values of all humidity measurement points in all grid spaces;
the Δ t f For the temperature fluctuation degree of the device under test, the
For the maximum value of the average temperature of all temperature measurement points in each grid space of the device under test, the
The minimum value of the average temperature of all temperature measurement points in each grid space of the tested device is obtained;
the Δ h f For the degree of humidity fluctuation of the device under test, the
Is the maximum value of the average humidity of all humidity measurement points in each grid space of the device under test, the
The minimum value of the average humidity of all humidity measurement points in each grid space of the tested device is obtained;
the Δ t u For the temperature uniformity of the device under test, n is the grid space number of the device under test
The measured temperature value is the maximum point of the average temperature value of the ith grid space of the measured equipment; the described
The temperature measurement value is the temperature measurement value of the minimum point of the temperature average value of the ith grid space of the tested equipment;
Δ h is u For the temperature uniformity of the device under test, the
The temperature measurement value is the maximum point of the temperature average value of the ith grid space of the tested equipment; the described
The measured temperature value of the minimum point of the temperature average value of the ith grid space of the tested equipment is obtained, i is a positive integer greater than or equal to 1, n is a positive integer greater than or equal to 1A positive integer.
2. The temperature and humidity measurement method of environmental test facility equipment according to claim 1,
the first volume is 2m 3 The second volume is 50m 3 。
3. The temperature and humidity measurement method of environmental test facility equipment according to claim 1,
when the volume of the device to be tested is smaller than the first volume, setting four temperature measuring points at the upper layer of the grid space at uniform intervals, setting one humidity measuring point at the position of one temperature measuring point, setting one temperature measuring point and one humidity measuring point at the middle layer of the grid space, setting four temperature measuring points at the projection position of the lower layer of the temperature measuring points at the upper layer of the grid space, and setting one humidity measuring point at the position of one temperature measuring point at the lower layer;
the positions of the humidity measuring points on the upper layer projected on the lower layer and the positions of the humidity measuring points arranged on the lower layer are respectively close to two side walls of the tested equipment.
4. The temperature and humidity measurement method of environmental test facility equipment according to claim 1,
when the volume of the tested device is larger than or equal to the first volume, five temperature measuring points are arranged on the upper layer and the lower layer of the grid space in the same distribution mode, one of the five temperature measuring points is positioned in the middle of the layer, and the other four temperature measuring points surrounding the middle are uniformly arranged around the layer at intervals;
the middle layer is also provided with five temperature measuring points, one temperature measuring point is arranged in the middle of the middle layer, the other four temperature measuring points surrounding the middle layer are uniformly arranged around the middle layer at intervals, and the projections of the four temperature measuring points on the upper layer are respectively positioned in the middle of two adjacent temperature measuring points surrounding the four temperature measuring points on the upper layer;
the number of the humidity measuring points is 4, one of the humidity measuring points is located at the position, close to the doorway of the tested device, of the middle layer, the other three humidity measuring points are located in the three layers respectively, and the three humidity measuring points projected on the upper layer are located on the same straight line.
5. The temperature and humidity measuring method of an environmental test facility according to claim 1,
and after the tested equipment stably operates for 1-2 hours, measuring the temperature deviation, the temperature uniformity, the temperature fluctuation degree, the humidity deviation, the humidity uniformity and the humidity fluctuation degree.
6. The temperature and humidity measurement method of environmental test facility equipment according to claim 1,
in making the temperature uniformity and the humidity uniformity measurements, data were collected every 3 minutes over 10 minutes.
7. The temperature and humidity measurement method of environmental test facility equipment according to claim 1,
establishing a mathematical model Δ t for uncertainty evaluation of the temperature deviation calibration result d ＝t d -t o -Δt 0 And establishing a mathematical model Δ h for uncertainty assessment of the humidity deviation calibration result d ＝h d -h o -Δh 0 ；
Wherein, t is d Setting a display value after temperature for the device under test, the t o For measuring the temperature of the temperature measuring point, the value of the temperature of the inspection instrument, Δ t 0 Temperature correction value for the temperature of the polling device, h d Setting a display value after humidity for the device under test, h o For measuring the humidity value of the polling device at the humidity measuring point, Δ h 0 The humidity correction value is the humidity of the polling instrument;
and to mathematical modelParameter t in (1) d 、t o 、Δt 0 And h d 、h o 、Δh 0 And carrying out uncertainty analysis.
8. The method of claim 7, wherein the parameter t is measured in the mathematical model d 、t o 、Δt 0 And h d 、h o 、Δh 0 A method of performing an uncertainty analysis comprising:
repeatedly measuring one of the inspection instruments or the equipment to be tested under the repeated measurement condition by using the measurement standard, and quantitatively characterizing by using the experimental standard deviation S (x) of the obtained measurement value
Wherein, x is p For the p-th measured value, the measured value,
is the arithmetic mean of q measured values, q is a positive integer greater than or equal to 6, and p is a positive integer greater than or equal to 1;
standard uncertainty u introduced for repeatability of the measured device measurements 1 Said
The standard uncertainty introduced aiming at the repeatability of the temperature and the humidity of the inspection instrument is u 2 The above-mentioned
Standard uncertainty u introduced according to temperature and humidity correction values of inspection instrument 3 Obtaining temperature and humidity correction according to the use instruction of the inspection instrumentA value r of
And obtaining u 1 、u 2 、u 3 On the basis of (1), synthesizing a standard uncertainty u c And an extended uncertainty U, said
The U = ku c And k is a parameter value.
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