CN111722977A - System inspection method and device and electronic equipment - Google Patents
System inspection method and device and electronic equipment Download PDFInfo
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Abstract
The embodiment of the invention provides a system inspection method, a system inspection device and electronic equipment, wherein the system inspection method comprises the following steps: acquiring current index data from a system to be inspected in preset time, wherein the preset time is a time period when the working load of the system to be inspected is smaller than a preset load; acquiring target index data of a system to be inspected; determining the change characteristics of any current index data and any target index data of a system to be inspected; and sequencing the current index data and the corresponding change characteristics based on the change characteristics of the current index data and the attribute characteristics of the current index data to obtain routing inspection information, wherein the routing inspection information is used for determining the inspection result of the system to be routed. The system inspection method provided by the embodiment of the invention can reduce the operation pressure of the system to be inspected, realize the high-efficiency inspection of the system and improve the inspection accuracy.
Description
Technical Field
The invention relates to the technical field of computers, in particular to a system patrol method, a system patrol device and electronic equipment.
Background
With the increasing development of computer technology, it is important to know the failure point or the point to be improved of a system by timely mastering the dynamics of various application systems.
In the process of performing system operation and maintenance, because an operation and maintenance system usually contains a large amount of index data, in order to discover key-concerned index data, operation and maintenance personnel are often required to search records and analyze according to different application systems, or a report system is used to derive the index data, and then professional personnel perform analysis and comparison to obtain key indexes and change details, so as to obtain system bottleneck points and change trends.
However, due to the fact that the number of application systems is large, index data are complex, efficiency is low through a manual recording, searching and comparing mode of operation and maintenance personnel, a more visual icon can only be obtained through report form derivation, manual identification of the operation and maintenance personnel is still needed, efficiency of the manual identification mode is low, and accuracy is low.
Disclosure of Invention
Embodiments of the present invention provide a system inspection method, an apparatus, and an electronic device, which overcome the above problems or at least partially solve the above problems.
In a first aspect, an embodiment of the present invention provides a system inspection method, where the system inspection method includes: acquiring current index data from a system to be inspected in preset time, wherein the preset time is a time period when the working load of the system to be inspected is smaller than a preset load; acquiring target index data of a system to be inspected; determining the change characteristics of any current index data and any target index data of a system to be inspected; and sequencing the current index data and the corresponding change characteristics based on the change characteristics of the current index data and the attribute characteristics of the current index data to obtain routing inspection information, wherein the routing inspection information is used for determining the inspection result of the system to be routed.
In some embodiments, the obtaining target index data of the system to be inspected includes: acquiring historical index data formed by a system to be inspected in a week unit, and taking the average value of the historical index data of each week as the target index data.
In some embodiments, the determining a change characteristic of any one of the current index data and any one of the target index data of the system to be inspected includes: aligning the starting point of any current index data of the system to be inspected with the starting point of any target index data; and obtaining the change characteristics of any current index data and any target index data of the system to be inspected based on the average absolute percentage error.
In some embodiments, the obtaining, based on the average absolute percentage error, a change characteristic of any one of the current index data and any one of the target index data of the system to be inspected includes:
the following formula is used:
obtaining the change characteristics of any current index data and any target index data of the system to be inspected; wherein the historyiThe ith data point, current, representing any one of the target index dataiAnd n represents any target index data and any current index which has n data points.
In some embodiments, the predetermined time is a manually set point in time.
In some embodiments, the predetermined time is a time period for automatically judging that the workload of the system to be inspected is less than a preset load.
In some embodiments, the system to be inspected is multiple, and the system inspection method includes: and sequencing the systems to be inspected to obtain an inspection list based on the weight characteristics of the systems to be inspected.
In a second aspect, an embodiment of the present invention provides a system inspection device, where the system inspection device includes: the system comprises a first acquisition unit, a second acquisition unit and a control unit, wherein the first acquisition unit is used for acquiring current index data from a system to be inspected in preset time, and the preset time is a time period when the workload of the system to be inspected is smaller than a preset load; the second acquisition unit is used for acquiring target index data of the system to be patrolled and examined; the processing unit is used for determining the change characteristics of any current index data and any target index data of the system to be inspected; the determining unit is used for sequencing the current index data and the corresponding change characteristics based on the change characteristics of the current index data and the attribute characteristics of the current index data to obtain routing inspection information, and the routing inspection information is used for determining an inspection result of a system to be routed.
In a third aspect, an embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor executes the computer program to implement the steps of the system inspection method according to any one of the embodiments of the first aspect.
In a fourth aspect, an embodiment of the present invention provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the steps of the system inspection method according to any one of the embodiments of the first aspect.
According to the system inspection method provided by the embodiment of the invention, the current index data is obtained in the preset time, and the inspection information is obtained by sequencing according to the change characteristics of the current index data and the target index data and the attribute characteristics of the current index data, so that the operation pressure of the system to be inspected can be reduced, the efficient inspection of the system is realized, and the inspection accuracy is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a flow chart of a system inspection method according to an embodiment of the present invention;
fig. 2 is a flowchart of acquiring target index data of the system inspection method according to the embodiment of the present invention;
FIG. 3 is a flow chart of a system inspection method of the embodiment of the present invention to obtain variation characteristics;
FIG. 4 is a schematic structural diagram of a system inspection device according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The system inspection method according to the embodiment of the invention is described below with reference to fig. 1 to 3.
As shown in fig. 1, the system inspection method according to the embodiment of the present invention includes the following steps S100 to S400.
Step S100, current index data are obtained from the system to be inspected in preset time, and the preset time is a time period when the work load of the system to be inspected is smaller than a preset load.
It can be understood that the system to be inspected may be a business system of practical application such as a marketing system, a management system, and a financial system, and may also be a software app system of a mobile device such as a mobile phone and a tablet, and the embodiment of the present invention is not particularly limited. The embodiment of the invention acquires current index data from the system to be inspected in preset time, wherein the current index data is the latest index data acquired from the system to be inspected, such as: the index data is obtained in a week unit, the current index data is the index data obtained in the week, the preset time is a time period when the workload of the system to be inspected is smaller than the preset load, for example, the preset workload can be 50% of the full load, that is, the time period is the time when the system to be inspected is idle, the idle time can include the time when the system to be inspected does not work, that is, the workload is 0, and the operation pressure of the system to be inspected can be reduced by obtaining the data in the idle time.
It should be mentioned that the predetermined time may be a time point set manually, that is, a time point at which the working load of the system is smaller than the preset load is judged by the staff according to the working rule of the system to be inspected, a time point is set manually, and the current index data is obtained when the time point arrives; meanwhile, the predetermined time may be a time period in which the workload of the system to be inspected is automatically determined to be smaller than the preset load, that is, the device automatically determines according to the working state, and automatically acquires the current index data when the workload of the system to be inspected is smaller than the preset load.
And S200, acquiring target index data of the system to be patrolled.
It can be understood that the target index data is index data formed by the system to be inspected before the current time point, and the obtained target index data of the system to be inspected can be used as a reference for analyzing the current index data.
And S300, determining the change characteristics of any current index data and any target index data of the system to be inspected.
It should be noted that, each current index data in the system to be inspected is compared with the corresponding target index data, so as to obtain a change characteristic of each current index data compared with the target index data, where the change characteristic may be a change rate of the current index data and the target index data, or an euclidean distance between the current index data and the target index data, that is, an absolute value of a difference between the current index data and the target index data.
And S400, sequencing the current index data and the corresponding change characteristics based on the change characteristics of each current index data and the attribute characteristics of each current index data to obtain routing inspection information, wherein the routing inspection information is used for determining the inspection result of the system to be routed.
It can be understood that the attribute feature represents the importance degree of the current index data in the system to be detected, the current index data with high importance degree needs to be displayed at the position as far as possible, and the change feature also needs to be used as the basis for sorting, so that the current index data and the corresponding change feature are sorted by combining the change feature and the attribute feature of the current index data, so as to form the inspection information, the combination mode can be that the change feature and the attribute feature of the current index data are multiplied, the current index data and the corresponding change feature are sorted according to the multiplication result of the current index data and the attribute feature, the result obtained by sorting is the inspection information, the inspection information can be displayed in a visual chart mode, the dynamic state of the system to be detected can be clearly displayed through the chart, and the important index data can be displayed at the position where the eye is exposed at the same time, the inspection result of the system to be inspected can be displayed conveniently.
According to the embodiment of the invention, the current index data are acquired in the preset time, and the routing inspection information is obtained by sequencing according to the change characteristics of the current index data and the target index data and the attribute characteristics of the current index data, so that the operation pressure of a system to be routed inspected can be reduced, the efficient routing inspection of the system is realized, and the routing inspection accuracy is improved.
As shown in fig. 2, in some embodiments, the step S200: the method for acquiring the target index data of the system to be inspected comprises the following steps S210 and S220.
And step S210, acquiring historical index data formed by the system to be patrolled in week units.
It is understood that index data is acquired from the system to be inspected in units of weeks, and thus a plurality of historical index data are formed before the current index data.
In step S220, the average value of the historical index data for each week is set as target index data.
It is to be understood that, here, the historical index data of each week are averaged in a one-to-one correspondence, and the obtained average is taken as the target index data. The error can be reduced by averaging, so that the accuracy of the system inspection result is improved.
As shown in fig. 3, in some embodiments, the step S300: determining the change characteristics of any current index data and any target index data of the system to be inspected, comprising the following steps S310 and S320.
Step S310, aligning the starting point of any current index data of the system to be inspected with the starting point of any target index data.
It can be understood that any current index data and any target index data are in the form of a sequence and have a plurality of data points, each data point of any current index data and any target index data corresponds to one another, a starting point of any current index data of the system to be inspected is aligned with a starting point of any target index data, if some data points behind the starting point of any current index data and any target index data of the system to be inspected are vacant, corresponding matching can not be performed, a matching stage of the data points is directly skipped, and then the subsequent data points without vacant conditions can be aligned. .
And S320, obtaining the change characteristics of any current index data and any target index data of the system to be inspected based on the average absolute percentage error.
It can be understood that the change characteristic in step 300 may be a change rate, and the change rate may be obtained by calculating a Mean Absolute Percentage Error (MAPE) between any current index data and any target index data, and the change rate calculated by the MAPE can accurately represent the change condition of the current index data, so as to further improve the accuracy of the system inspection result.
The following formula may be employed:
obtaining the change characteristics of any current index data and any target index data of the system to be inspected; wherein the historyiThe ith data point, current, representing any target index dataiAnd the ith data point represents any current index data, and n represents any target index data and any current index has n data points.
In some embodiments, the number of the systems to be inspected is multiple, and the system inspection method comprises the following steps: and sequencing the systems to be inspected to obtain an inspection list based on the weight characteristics of the systems to be inspected.
It can be understood that the weight features represent the importance degree of the system to be inspected, the plurality of systems to be inspected are inspected at the same time, and are sorted according to the weight features, so that the systems to be inspected are arranged at the front position with high importance degree, and an inspection list is obtained, and each system to be inspected in the inspection list further comprises a plurality of current index data and corresponding change features, which are obtained in step S400, and are sorted to obtain inspection information.
According to the embodiment of the invention, the plurality of systems to be patrolled are sequenced according to the weight characteristics, so that the patrolling result can be more clearly presented, and the accuracy of the patrolling result is improved.
The system inspection device provided by the embodiment of the invention is described below, and the system inspection device described below and the system inspection method described above can be referred to correspondingly.
As shown in fig. 4, the system inspection device provided in the embodiment of the present invention includes: a first acquisition unit 410, a second acquisition unit 420, a processing unit 430 and a determination unit 440.
The first obtaining unit 410 is configured to obtain current index data from the system to be inspected at a predetermined time, where the predetermined time is a time period when a workload of the system to be inspected is less than a preset load.
The second obtaining unit 420 is configured to obtain target index data of the system to be inspected.
The processing unit 430 is configured to determine a change characteristic of any current index data and any target index data of the system to be inspected.
The determining unit 440 is configured to sort the current index data and the corresponding change features to obtain inspection information based on the change features of each current index data and the attribute features of each current index data, where the inspection information is used to determine an inspection result of the system to be inspected.
The system inspection device provided by the embodiment of the invention is used for executing the system inspection method, and the specific implementation mode of the system inspection device is consistent with the implementation mode of the method, so that the detailed description is omitted here.
Fig. 5 illustrates a physical structure diagram of an electronic device, which may include, as shown in fig. 5: a processor (processor)510, a communication Interface (Communications Interface)520, a memory (memory)530, and a communication bus 550, wherein the processor 510, the communication Interface 520, and the memory 530 communicate with each other via the communication bus 550. Processor 510 may call logic instructions in memory 530 to perform a system tour inspection method comprising: acquiring current index data from a system to be inspected in preset time, wherein the preset time is a time period when the working load of the system to be inspected is smaller than a preset load; acquiring target index data of a system to be inspected; determining the change characteristics of any current index data and any target index data of a system to be inspected; and sequencing the current index data and the corresponding change characteristics based on the change characteristics of each current index data and the attribute characteristics of each current index data to obtain inspection information, wherein the inspection information is used for determining the inspection result of the system to be inspected.
It should be noted that, when being implemented specifically, the electronic device in this embodiment may be a server, a PC, or other devices, as long as the structure includes the processor 510, the communication interface 520, the memory 530, and the communication bus 550 shown in fig. 5, where the processor 510, the communication interface 520, and the memory 530 complete mutual communication through the communication bus 550, and the processor 510 may call the logic instructions in the memory 530 to execute the above method. The embodiment does not limit the specific implementation form of the electronic device.
Furthermore, the logic instructions in the memory 530 may be implemented in the form of software functional units and stored in a computer readable storage medium when the software functional units are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
Further, an embodiment of the present invention discloses a computer program product, the computer program product includes a computer program stored on a non-transitory computer readable storage medium, the computer program includes program instructions, when the program instructions are executed by a computer, the computer can execute the system inspection method provided by the above method embodiments, the method includes: acquiring current index data from a system to be inspected in preset time, wherein the preset time is a time period when the working load of the system to be inspected is smaller than a preset load; acquiring target index data of a system to be inspected; determining the change characteristics of any current index data and any target index data of a system to be inspected; and sequencing the current index data and the corresponding change characteristics based on the change characteristics of each current index data and the attribute characteristics of each current index data to obtain inspection information, wherein the inspection information is used for determining the inspection result of the system to be inspected.
In another aspect, an embodiment of the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program is implemented to perform the system inspection method provided in the foregoing embodiments when executed by a processor, and the method includes: acquiring current index data from a system to be inspected in preset time, wherein the preset time is a time period when the working load of the system to be inspected is smaller than a preset load; acquiring target index data of a system to be inspected; determining the change characteristics of any current index data and any target index data of a system to be inspected; and sequencing the current index data and the corresponding change characteristics based on the change characteristics of each current index data and the attribute characteristics of each current index data to obtain inspection information, wherein the inspection information is used for determining the inspection result of the system to be inspected.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A system polling method, comprising:
acquiring current index data from a system to be inspected in preset time, wherein the preset time is a time period when the working load of the system to be inspected is smaller than a preset load;
acquiring target index data of a system to be inspected;
determining the change characteristics of any current index data and any target index data of a system to be inspected;
and sequencing the current index data and the corresponding change characteristics based on the change characteristics of the current index data and the attribute characteristics of the current index data to obtain routing inspection information, wherein the routing inspection information is used for determining the inspection result of the system to be routed.
2. The system inspection method according to claim 1, wherein the obtaining of target index data of the system to be inspected includes:
acquiring historical index data formed by a system to be inspected in a week unit;
and taking the average value of the historical index data of each week as the target index data.
3. The system inspection method according to claim 1, wherein the determining of the change characteristics of any one of the current index data and any one of the target index data of the system to be inspected includes:
aligning the starting point of any current index data of the system to be inspected with the starting point of any target index data;
and obtaining the change characteristics of any current index data and any target index data of the system to be inspected based on the average absolute percentage error.
4. The system inspection method according to claim 3, wherein the obtaining of the change characteristics of any one of the current index data and any one of the target index data of the system to be inspected based on the average absolute percentage error includes:
the following formula is used:
obtaining the change characteristics of any current index data and any target index data of the system to be inspected;
wherein the historyiThe ith data point, current, representing any one of the target index dataiAnd n represents any target index data and any current index which has n data points.
5. The system inspection method according to any one of claims 1 to 4, wherein the predetermined time is a manually set point in time.
6. The system inspection method according to any one of claims 1 to 4, wherein the predetermined time is a time period during which it is automatically determined that the workload of the system to be inspected is less than a preset load.
7. The system inspection method according to any one of claims 1 to 4, wherein the number of the systems to be inspected is multiple, and the system inspection method comprises the following steps: and sequencing the systems to be inspected to obtain an inspection list based on the weight characteristics of the systems to be inspected.
8. The utility model provides a system inspection device which characterized in that includes:
the system comprises a first acquisition unit, a second acquisition unit and a control unit, wherein the first acquisition unit is used for acquiring current index data from a system to be inspected in preset time, and the preset time is a time period when the workload of the system to be inspected is smaller than a preset load;
the second acquisition unit is used for acquiring target index data of the system to be patrolled and examined;
the processing unit is used for determining the change characteristics of any current index data and any target index data of the system to be inspected;
the determining unit is used for sequencing the current index data and the corresponding change characteristics based on the change characteristics of the current index data and the attribute characteristics of the current index data to obtain routing inspection information, and the routing inspection information is used for determining an inspection result of a system to be routed.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor when executing the program performs the steps of the system inspection method according to any one of claims 1 to 7.
10. A non-transitory computer readable storage medium having stored thereon a computer program, wherein the computer program when executed by a processor implements the steps of the system inspection method according to any one of claims 1 to 7.
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