CN111710611A - Method for reducing fracture of central area of copper-clad ceramic substrate - Google Patents

Method for reducing fracture of central area of copper-clad ceramic substrate Download PDF

Info

Publication number
CN111710611A
CN111710611A CN202010517503.1A CN202010517503A CN111710611A CN 111710611 A CN111710611 A CN 111710611A CN 202010517503 A CN202010517503 A CN 202010517503A CN 111710611 A CN111710611 A CN 111710611A
Authority
CN
China
Prior art keywords
copper foil
edge
reinforcing rib
longitudinal
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010517503.1A
Other languages
Chinese (zh)
Inventor
王彬
贺贤汉
陈天华
童辉
吴春兰
戴洪兴
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JIANGSU FULEDE SEMICONDUCTOR TECHNOLOGY Co.,Ltd.
Original Assignee
Shanghai Shenhe Thermo Magnetics Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Shenhe Thermo Magnetics Electronics Co Ltd filed Critical Shanghai Shenhe Thermo Magnetics Electronics Co Ltd
Priority to CN202010517503.1A priority Critical patent/CN111710611A/en
Publication of CN111710611A publication Critical patent/CN111710611A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4871Bases, plates or heatsinks

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

The invention discloses a method for reducing fracture of a central area of a copper-clad ceramic substrate, wherein the substrate is rectangular and comprises an upper short edge, a lower short edge, a left long edge and a right long edge; a plurality of substrate graphs can be arranged on the substrate, and when the substrate graphs are designed, longitudinal copper foil reinforcing ribs and transverse copper foil reinforcing ribs are additionally arranged at the center of the substrate graphs; the rigidity of the substrate is improved by adding the longitudinal and transverse copper foil reinforcing ribs at the center of the pattern of the DBC substrate, so that the substrate ceramic is prevented from being broken along the center of the substrate ceramic after being pressed in the production process, and the product yield is improved.

Description

Method for reducing fracture of central area of copper-clad ceramic substrate
Technical Field
The invention belongs to the field of DBC substrate manufacturing, relates to application of a DBC substrate, and particularly relates to a method for reducing fracture of a central area of a copper-clad ceramic substrate.
Background
In order to reduce the thermal resistance of a copper-clad ceramic substrate (DBC) and improve the heat dissipation performance of the copper-clad ceramic substrate, DBC manufacturers achieve the requirement by reducing the thickness of the ceramic sheet. However, after the thickness of the ceramic sheet is reduced, the corresponding mechanical strength is correspondingly reduced. In the actual production process, although the peripheral edges of the substrate are provided with the process edges for protecting the ceramic at the edges from being damaged and cracked, in the processing process of each procedure after etching, especially in the processes of solder resist printing, surface nickel gold plating, laser cutting and the like, because the thickness of the ceramic is too thin, the product is easy to break along the longitudinal or transverse area of the center of the plate surface after being pressed, and the product is scrapped. See fig. 1.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a method for reducing the fracture of the central area of a copper-clad ceramic substrate, which improves the rigidity of the substrate by adding longitudinal and transverse copper foil reinforcing ribs at the center of a DBC substrate graph, prevents the substrate ceramic from fracturing along the center after being pressed in the production process, and improves the yield of products.
The technical scheme of the invention is as follows: a method for reducing the fracture of the central area of a copper-clad ceramic substrate is disclosed, wherein the substrate is rectangular and comprises an upper short edge, a lower short edge, a left long edge and a right long edge; the base plate can be arranged with a plurality of base plate graphs, and when the base plate graphs are designed, a longitudinal copper foil reinforcing rib and a transverse copper foil reinforcing rib are added at the center of the base plate graphs.
Furthermore, the thickness of the ceramic sheet of the substrate is 0.25 mm-1.0 mm, the length of the long side of the substrate is 180 mm-200 mm, and the length of the short side of the substrate is 130 mm-150 mm.
Further, go up minor face edge and be provided with technology limit, minor face edge is provided with down technology limit down, long limit edge is provided with left technology limit on a left side, long limit edge is provided with right technology limit on a right side.
Furthermore, the longitudinal copper foil reinforcing ribs are positioned on the longitudinal central line of the substrate.
Further, the length of the longitudinal copper foil reinforcing rib extends from the upper technical edge to the lower technical edge of the substrate.
Furthermore, the distance between the longitudinal copper foil reinforcing rib and the upper process edge and the distance between the longitudinal copper foil reinforcing rib and the lower process edge are both 0.5 mm-1.5 mm, and the width of the longitudinal copper foil reinforcing rib is 3mm-8 mm.
Furthermore, the transverse copper foil reinforcing ribs are positioned on the transverse central line of the substrate and are divided into two blocks which are symmetrical left and right, one block is arranged on the left side of the longitudinal copper foil reinforcing ribs, and the other block is arranged on the right side of the longitudinal copper foil reinforcing ribs.
Furthermore, the distance between the transverse copper foil reinforcing rib on the left side and the left technical side and the distance between the transverse copper foil reinforcing rib on the left side and the longitudinal reinforcing rib are both 0.5 mm-1.5 mm, and the width is 3 mm-6 mm; the distance between the transverse copper foil reinforcing rib on the right side and the right technical side and the distance between the transverse copper foil reinforcing rib on the right side and the longitudinal reinforcing rib are both 0.5 mm-1.5 mm, and the width is 3 mm-6 mm.
Furthermore, the width of the upper technical edge and the width of the lower technical edge are 5 mm-15 mm.
Furthermore, the width of the left technical side and the right technical side is 5 mm-15 mm.
The invention has the beneficial effects that:
1. for a DBC substrate with a ceramic chip with the thickness of 0.25 mm-1.0 mm, when the pattern of the DBC substrate is designed, longitudinal and transverse copper foil reinforcing ribs are added in the center of the pattern, the rigidity of a mother board is improved by the copper foil reinforcing ribs, and the ceramic is prevented from being broken along the center after the mother board is pressed in the production process.
2. The longitudinal copper foil reinforcing ribs penetrate through the whole board surface from top to bottom, and the transverse reinforcing ribs are symmetrically divided into a left section and a right section by taking the longitudinal reinforcing ribs as the left section and the right section, so that after the laser cutting process is completed, the substrate is easily broken into small pieces from the longitudinal direction, and the product yield of the laser cutting process is improved.
Drawings
FIG. 1 shows that the ceramic is too thin, and the product is easy to break along the longitudinal or transverse area of the center of the plate surface after being pressed, so that the product is scrapped.
FIG. 2 shows a longitudinal copper foil reinforcing rib designed at the center of the substrate pattern, and a left section and a right section of transverse reinforcing ribs are designed by taking the longitudinal copper foil reinforcing rib as symmetry.
In the figure: 1 is a fracture area, 2 is a longitudinal reinforcing rib, and 3 is a transverse reinforcing rib.
Detailed Description
The invention is further described below with reference to the accompanying drawings.
In the embodiment, the longitudinal and transverse copper foil reinforcing ribs are added at the center of the pattern of the DBC substrate to improve the rigidity of the substrate, so that the problem that the substrate ceramic is broken along the center of the substrate ceramic after being pressed in the production process is solved, and the product yield is improved.
The design steps of this example are as follows:
1. when designing the substrate pattern, longitudinal and transverse copper foil reinforcing ribs are added at the center of the pattern. The base plate is rectangular and comprises an upper short edge, a lower short edge, a left long edge and a right long edge. The ceramic plate thickness of the substrate is 0.38mm (the method is basically applicable to DBC with the ceramic plate thickness in the range of 0.25 mm-1.0 mm), the length of the long side of the substrate is 180 mm-200 mm, and the length of the short side of the substrate is 130 mm-150 mm. Go up minor face edge and be provided with the technology limit, minor face edge is provided with down the technology limit down, long limit edge is provided with left technology limit on a left side, long limit edge is provided with right technology limit on a right side. The width of the upper technical edge and the lower technical edge is 7mm (the width can be in the range of 5 mm-15 mm). The width of the left technical side and the right technical side is 7mm (the width can be in the range of 5 mm-15 mm).
2. Longitudinal copper foil reinforcing rib design
a) The width of the longitudinal copper foil reinforcing rib is 5mm (the width can be within the range of 3mm-8 mm).
b) The length extends from the upper process edge A1 to the lower process edge A2, both being 1mm (here, the width may range from 0.5mm to 1.5 mm) from A1, A2. The width is 5 mm.
3. Designing a transverse copper foil reinforcing rib:
a) the longitudinal reinforcing rib is used as a center and is symmetrically divided into a left section and a right section.
b) The left section of reinforcing rib extends rightwards from the left technical edge B1 of the edge of the substrate to the longitudinal reinforcing rib, the distance B between the left section of reinforcing rib and the B1 and the distance B between the left section of reinforcing rib and the longitudinal reinforcing rib are both 1mm (the width of the left section of reinforcing rib ranges from 0.5mm to 1.5 mm), and the width of the left section of reinforcing rib ranges from 5mm (the width of the left section of reinforcing rib ranges from 3mm to 8.
c) The right section of reinforcing rib extends leftwards from the right technical edge B2 of the edge of the substrate to the longitudinal reinforcing rib, the distance between the right section of reinforcing rib and the B2 and the distance between the right section of reinforcing rib and the longitudinal reinforcing rib are both 1mm (the width of the right section of reinforcing rib ranges from 0.5mm to 1.5 mm), and the width of the right section of reinforcing rib ranges from 5mm (the width of the right section of reinforcing rib ranges from 3mm to 8 mm). See fig. 2.
Through the longitudinal and transverse copper foil reinforcing ribs designed at the center of the substrate, the defect that the substrate ceramic is broken along the center of the substrate ceramic after being pressed in the production process due to the excessively thin thickness of the ceramic can be reduced, and the product yield is improved.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims (10)

1. A method for reducing the fracture of the central area of a copper-clad ceramic substrate is characterized by comprising the following steps: the substrate is rectangular and comprises an upper short edge, a lower short edge, a left long edge and a right long edge; the base plate can be arranged with a plurality of base plate graphs, and when the base plate graphs are designed, a longitudinal copper foil reinforcing rib and a transverse copper foil reinforcing rib are added at the center of the base plate graphs.
2. The method for reducing the breakage of the central area of the copper-clad ceramic substrate according to claim 1, wherein the method comprises the following steps: the thickness of the ceramic sheet of the substrate is 0.25 mm-1.0 mm, the length of the long side of the substrate is 180 mm-200 mm, and the length of the short side of the substrate is 130 mm-150 mm.
3. The method for reducing the breakage of the central area of the copper-clad ceramic substrate according to claim 1 or 2, wherein: go up minor face edge and be provided with the technology limit, minor face edge is provided with down the technology limit down, long limit edge is provided with left technology limit on a left side, long limit edge is provided with right technology limit on a right side.
4. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 3, wherein: the longitudinal copper foil reinforcing ribs are positioned on the longitudinal central line of the substrate.
5. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 4, wherein: the length of the longitudinal copper foil reinforcing rib extends from the upper technical edge to the lower technical edge of the substrate.
6. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 5, wherein: the distance between the longitudinal copper foil reinforcing rib and the upper process edge and the distance between the longitudinal copper foil reinforcing rib and the lower process edge are both 0.5 mm-1.5 mm, and the width is 3mm-8 mm.
7. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 4, wherein: the transverse copper foil reinforcing ribs are positioned on the transverse central line of the substrate and are divided into two blocks which are symmetrical left and right, one block is arranged on the left side of the longitudinal copper foil reinforcing ribs, and the other block is arranged on the right side of the longitudinal copper foil reinforcing ribs.
8. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 7, wherein: the distance between the transverse copper foil reinforcing rib on the left side and the left technical side and the distance between the transverse copper foil reinforcing rib on the left side and the longitudinal reinforcing rib are both 0.5-1.5 mm, and the width is 3-6 mm; the distance between the transverse copper foil reinforcing rib on the right side and the right technical side and the distance between the transverse copper foil reinforcing rib on the right side and the longitudinal reinforcing rib are both 0.5 mm-1.5 mm, and the width is 3 mm-6 mm.
9. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 3, wherein: the width of the upper technical edge and the lower technical edge is 5 mm-15 mm.
10. The method for reducing the cracking of the central area of the copper-clad ceramic substrate according to claim 3, wherein: the width of the left technical side and the right technical side is 5 mm-15 mm.
CN202010517503.1A 2020-06-09 2020-06-09 Method for reducing fracture of central area of copper-clad ceramic substrate Pending CN111710611A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010517503.1A CN111710611A (en) 2020-06-09 2020-06-09 Method for reducing fracture of central area of copper-clad ceramic substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010517503.1A CN111710611A (en) 2020-06-09 2020-06-09 Method for reducing fracture of central area of copper-clad ceramic substrate

Publications (1)

Publication Number Publication Date
CN111710611A true CN111710611A (en) 2020-09-25

Family

ID=72538978

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010517503.1A Pending CN111710611A (en) 2020-06-09 2020-06-09 Method for reducing fracture of central area of copper-clad ceramic substrate

Country Status (1)

Country Link
CN (1) CN111710611A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103025048A (en) * 2011-09-22 2013-04-03 常州紫寅电子电路有限公司 Ultra-thin anti-fracture printed circuit board
CN104411100A (en) * 2014-12-16 2015-03-11 南通富士通微电子股份有限公司 Making method of substrate with support
CN206422972U (en) * 2017-01-24 2017-08-18 昆山市鸿运通多层电路板有限公司 A kind of hydrocarbon circuit board of high-strength ceramic using the formula design of paving copper
CN110379793A (en) * 2019-07-08 2019-10-25 上海申和热磁电子有限公司 One kind covering copper ceramic substrate motherboard structure

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103025048A (en) * 2011-09-22 2013-04-03 常州紫寅电子电路有限公司 Ultra-thin anti-fracture printed circuit board
CN104411100A (en) * 2014-12-16 2015-03-11 南通富士通微电子股份有限公司 Making method of substrate with support
CN206422972U (en) * 2017-01-24 2017-08-18 昆山市鸿运通多层电路板有限公司 A kind of hydrocarbon circuit board of high-strength ceramic using the formula design of paving copper
CN110379793A (en) * 2019-07-08 2019-10-25 上海申和热磁电子有限公司 One kind covering copper ceramic substrate motherboard structure

Similar Documents

Publication Publication Date Title
JP7426971B2 (en) Silicon nitride ceramic assembly substrate
EP3939760B1 (en) Nitride ceramic substrate production method and nitride ceramic base material
CN115884952A (en) Method for producing a cermet substrate and cermet substrate produced by means of said method
CN111710611A (en) Method for reducing fracture of central area of copper-clad ceramic substrate
KR101514172B1 (en) Wiring board, multi-pattern wiring board, and method for producing same
KR101280250B1 (en) Metal-bonded ceramic substrate
KR101733442B1 (en) Warpage-preventing structure of substrate
CN210052738U (en) Copper-clad ceramic substrate mother board structure
JPH01133395A (en) Mass production of metal base circuit substrates
JP4511311B2 (en) Multi-circuit board and electronic device
JP2007243088A (en) Multilayer ceramic substrate and its manufacturing method
KR101068263B1 (en) substrate strip
CN108428674B (en) Composite substrate and method for manufacturing same
JP6005462B2 (en) Ceramic parts and manufacturing method thereof
TWI663897B (en) Metal plate for circuit substrate, circuit substrate, power module, metal plate molded product, and method for manufacturing circuit substrate
JP4721926B2 (en) Multiple wiring board
JP2011233687A (en) Multipiece wiring board
JP4458999B2 (en) Multi-circuit board, electronic component storage package and electronic device
JP2006173368A (en) Ceramic substrate
JP2019047005A (en) Multi-cavity ceramic substrate and manufacturing method thereof
JP2007227846A (en) Processing board, and method of manufacturing product board
JP2006210655A (en) Multiple wiring board
JP2002171035A (en) Large-scaled circuit board
JP2003273272A (en) Ceramic board and its manufacturing method
JP2005340541A (en) Multiple patterning ceramic substrate

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right
TA01 Transfer of patent application right

Effective date of registration: 20201112

Address after: 224200 No. 18 Hongda Road, Chengdong New District, Dongtai City, Yancheng City, Jiangsu Province

Applicant after: JIANGSU FULEDE SEMICONDUCTOR TECHNOLOGY Co.,Ltd.

Address before: 200444 Baoshan District, Baoshan City Industrial Park Road, No., Hill Road, No. 181

Applicant before: SHANGHAI SHENHE THERMO-MAGNETICS ELECTRONICS Co.,Ltd.

WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20200925