CN111708705A - Method, device, equipment and medium for testing automatic repair function of BIOS - Google Patents
Method, device, equipment and medium for testing automatic repair function of BIOS Download PDFInfo
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- CN111708705A CN111708705A CN202010567715.0A CN202010567715A CN111708705A CN 111708705 A CN111708705 A CN 111708705A CN 202010567715 A CN202010567715 A CN 202010567715A CN 111708705 A CN111708705 A CN 111708705A
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Abstract
The application discloses a method and a device for testing the automatic repair function of a BIOS (basic input output System), electronic equipment and a computer readable storage medium, wherein the method is applied to a BIOS chip and comprises the following steps: after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware; storing the damaged BIOS firmware; and restarting the system so as to perform the BIOS automatic repair function test. According to the method and the device, the preset simulation program which is preset in the BIOS chip is triggered and executed based on the preset IPMI instruction, the main module of the BIOS firmware can be efficiently, automatically and accurately damaged, the BIOS chip is prevented from being disassembled and assembled, and a tester does not need to consult a developer to manually position and damage the main module of the firmware, so that the test efficiency and the applicability can be greatly improved, and meanwhile, the accuracy of data positioning of the main module is also improved.
Description
Technical Field
The present disclosure relates to the field of computer technologies, and in particular, to a method and an apparatus for testing an automatic repair function of a BIOS, an electronic device, and a computer-readable storage medium.
Background
A Basic Input Output System (BIOS) is an important firmware program on a motherboard of a device such as a server. Generally, in order to ensure the normal operation of the BIOS chip, in a home-made server at present, designers generally develop an automatic recovery function, i.e., a BIOS recovery function, for the BIOS chip. Based on the function, when the file in the BIOS chip is damaged, the file can be automatically repaired, and the running safety of the device program is effectively guaranteed.
Accordingly, the testing of BIOS recovery function also naturally becomes an important item in the server product testing phase. However, in the related art, after consulting a professional BIOS developer, a tester generally uses a third-party tool to destroy a specific area of the BIOS specified by the developer, and burns a destroyed BIOS file into a BIOS chip with a burner, and installs the BIOS chip to a server to power on and start up again, so as to successfully perform self-repair by using a recovery function after the BIOS chip is powered on.
Therefore, the method is more suitable for the condition that the BIOS chip on the mainboard is convenient to fetch, otherwise, the method is very troublesome. In addition, because the division of the internal area of the BIOS file is constantly changing and is generally known only by professional developers, the method consumes more man-hours of testers to consult with the developers, which is inconvenient for long-term development of test work and affects test efficiency.
In view of the above, it is an important need for those skilled in the art to provide a solution to the above technical problems.
Disclosure of Invention
The application aims to provide a method and a device for testing the automatic repair function of the BIOS, electronic equipment and a computer readable storage medium, so that the test efficiency and the operation convenience are effectively improved.
In order to solve the above technical problem, in a first aspect, the present application discloses a method for testing an automatic repair function of a BIOS, which is applied to a BIOS chip, and includes:
after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware;
saving the damaged BIOS firmware;
and restarting the system so as to perform the BIOS automatic repair function test.
Optionally, the calling the preset emulation program to destroy the main module of the BIOS firmware includes:
searching the main module of the BIOS firmware based on the preset simulation program;
and deleting the main module based on the preset simulation program.
Optionally, the calling the preset emulation program to destroy the main module of the BIOS firmware includes:
searching the main module of the BIOS firmware based on the preset simulation program;
and deleting the first character string in the main module based on the preset simulation program.
Optionally, the restarting the system to perform the BIOS automatic repair function test includes:
the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
In a second aspect, the present application further discloses an automatic repair function testing apparatus for a BIOS, including:
the calling unit is used for calling a preset simulation program to destroy a main module of the BIOS firmware after receiving a preset IPMI instruction sent by the substrate management controller;
the storage unit is used for storing the damaged BIOS firmware;
and the restarting unit is used for restarting the system so as to carry out the BIOS automatic repair function test.
Optionally, the calling unit is specifically configured to:
searching the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.
Optionally, the calling unit is specifically configured to:
searching the main module of the BIOS firmware based on the preset simulation program; and deleting the first character string in the main module based on the preset simulation program.
Optionally, the restarting unit is specifically configured to:
the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
In a third aspect, the present application also discloses an electronic device, including:
a memory for storing a computer program;
a processor for executing the computer program to implement the steps of any of the above described methods for automatic repair function testing of a BIOS.
In a fourth aspect, the present application further discloses a computer-readable storage medium, in which a computer program is stored, and the computer program is used to implement the steps of any one of the methods for testing an automatic repair function of a BIOS described above when the computer program is executed by a processor.
The method for testing the automatic repair function of the BIOS, which is provided by the application, is applied to a BIOS chip and comprises the following steps: after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware; saving the damaged BIOS firmware; and restarting the system so as to perform the BIOS automatic repair function test.
Therefore, the method for testing the automatic repair function of the BIOS provided in the embodiment of the present application triggers and executes the preset simulation program preset in the BIOS chip based on the preset IPMI instruction, and can efficiently, automatically, and accurately destroy the main module of the BIOS firmware, so as to perform the test of the automatic repair function of the BIOS. On the one hand, the BIOS chip is prevented from being disassembled and assembled by the method, the method is suitable for various mainboard structures, and on the other hand, because the development work of the preset simulation program in the method can be completed by BIOS firmware developers together in the firmware development stage, the testers only need to directly observe the test result in the test stage, the main module destroying the firmware is not needed to be manually positioned by consulting the developers, the test efficiency is improved, and the data positioning error of the main module is avoided. The automatic repair function testing device of the BIOS, the electronic device and the computer readable storage medium provided by the application also have the beneficial effects.
Drawings
In order to more clearly illustrate the technical solutions in the prior art and the embodiments of the present application, the drawings that are needed to be used in the description of the prior art and the embodiments of the present application will be briefly described below. Of course, the following description of the drawings related to the embodiments of the present application is only a part of the embodiments of the present application, and it will be obvious to those skilled in the art that other drawings can be obtained from the provided drawings without any creative effort, and the obtained other drawings also belong to the protection scope of the present application.
FIG. 1 is a flowchart illustrating a method for testing an automatic repair function of a BIOS according to an embodiment of the present disclosure;
FIG. 2 is a block diagram of an automatic repair function testing apparatus for a BIOS according to an embodiment of the present disclosure;
fig. 3 is a block diagram of an electronic device according to an embodiment of the present disclosure.
Detailed Description
The core of the application is to provide a method and a device for testing the automatic repair function of the BIOS, an electronic device and a computer readable storage medium, so as to effectively improve the test efficiency and the convenience of operation.
In order to more clearly and completely describe the technical solutions in the embodiments of the present application, the technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
A Basic Input Output System (BIOS) is an important firmware program on a motherboard of a device such as a server. Generally, in order to ensure the normal operation of the BIOS chip, in a home-made server at present, designers generally develop an automatic recovery function, i.e., a BIOS recovery function, for the BIOS chip. Based on the function, when the file in the BIOS chip is damaged, the file can be automatically repaired, and the running safety of the device program is effectively guaranteed.
Accordingly, the testing of BIOS recovery function also naturally becomes an important item in the server product testing phase. However, in the related art, after consulting a professional BIOS developer, a tester generally uses a third-party tool to destroy a specific area of the BIOS specified by the developer, and burns a destroyed BIOS file into a BIOS chip with a burner, and installs the BIOS chip to a server to power on and start up again, so as to successfully perform self-repair by using a recovery function after the BIOS chip is powered on.
Therefore, the method is more suitable for the condition that the BIOS chip on the mainboard is convenient to fetch, otherwise, the method is very troublesome. In addition, because the division of the internal area of the BIOS file is constantly changing and is generally known only by professional developers, the method consumes more man-hours of testers to consult with the developers, which is inconvenient for long-term development of test work and affects test efficiency. In view of this, the present application provides a BIOS auto-repair function test scheme, which can effectively solve the above problems.
Referring to fig. 1, an embodiment of the present application discloses a method for testing an automatic repair function of a BIOS, which is applied to a BIOS chip and mainly includes:
s101: after receiving a preset IPMI instruction sent by the baseboard management controller, calling a preset simulation program to destroy a main module of the BIOS firmware.
S102: and saving the damaged BIOS firmware.
S103: and restarting the system so as to perform the BIOS automatic repair function test.
Specifically, the method for testing the automatic repair function of the BIOS provided in the embodiment of the present application may be performed automatically based on data interaction between a Baseboard Management Controller (BMC) and a BIOS chip, so that it is not necessary for related testers to manually destroy data integrity of the BIOS chip by using a third-party tool or the like, thereby more effectively avoiding operations of picking and installing the BIOS chip on a motherboard, and saving unnecessary labor cost.
Specifically, in the embodiment of the present application, a preset IPMI (Intelligent Platform Management Interface) instruction is defined and set in advance for communication between the BMC and the BIOS chip, and a preset simulation program is developed in advance in the BIOS chip. The IPMI command is specifically used for instructing the BIOS chip to call and execute the predetermined simulation program.
The preset model program is specifically used for destroying the main module of the BIOS firmware when being executed, so that the data integrity of the BIOS chip is destroyed, and the automatic recovery function is tested under the condition.
After the purpose of destroying the data integrity of the BIOS firmware is achieved by executing the preset simulation program, the damaged BIOS firmware can be stored, and then the system is restarted. After the BIOS is electrified and restarted, the BIOS recovery function automatically verifies the integrity of data and then automatically repairs the data after detecting that the data are damaged, and a tester can obtain a test result about the automatic repair function.
The method for testing the automatic repair function of the BIOS, provided by the embodiment of the application, is applied to a BIOS chip and comprises the following steps: after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware; storing the damaged BIOS firmware; and restarting the system so as to perform the BIOS automatic repair function test.
Therefore, the method for testing the automatic repair function of the BIOS provided in the embodiment of the present application triggers and executes the preset simulation program preset in the BIOS chip based on the preset IPMI instruction, and can efficiently, automatically, and accurately destroy the main module of the BIOS firmware, so as to perform the test of the automatic repair function of the BIOS. On the one hand, the BIOS chip is prevented from being disassembled and assembled by the method, the method is suitable for various mainboard structures, and on the other hand, because the development work of the preset simulation program in the method can be completed by BIOS firmware developers together in the firmware development stage, the testers only need to directly observe the test result in the test stage, the main module destroying the firmware is not needed to be manually positioned by consulting the developers, the test efficiency is improved, and the data positioning error of the main module is avoided.
As a specific embodiment, the method for testing an automatic repair function of a BIOS according to the embodiment of the present application, based on the above contents, calls a preset simulation program to destroy a main module of a BIOS firmware, and includes:
searching a main module of the BIOS firmware based on a preset simulation program;
and deleting the main module based on a preset simulation program.
Specifically, in order to test the automatic repair function of the BIOS firmware, the data integrity of the BIOS firmware needs to be destroyed first. And in particular the main module of the BIOS firmware that needs to be corrupted. Therefore, in this embodiment, the preset simulation program may specifically include a corresponding positioning search subroutine, so as to be used for searching the main module of the BIOS firmware. In addition, the preset simulation program may further include a corresponding deletion subroutine for performing data deletion.
In this embodiment, when the deletion subroutine deletes data of the main module, all data of the entire main module may be directly deleted.
As a specific embodiment, the method for testing an automatic repair function of a BIOS according to the embodiment of the present application, based on the above contents, calls a preset simulation program to destroy a main module of a BIOS firmware, and includes:
searching a main module of the BIOS firmware based on a preset simulation program;
and deleting the first character string in the main module based on a preset simulation program.
In this embodiment, the preset simulation program also specifically includes a search subroutine for searching the main module, and a deletion subroutine for deleting data. As will be readily understood by those skilled in the art, as an important module in the BIOS firmware, the main module of the BIOS firmware is used to perform the related BIOS initialization after power-on operation, so that any loss of a portion of data in the main module will destroy the data integrity of the BIOS firmware. In view of this, the deletion subroutine in the present embodiment specifically deletes only the first character string in the main module.
It is easily understood that other specific deletion modes can be set by those skilled in the art, for example, only deleting the second character string, … …, the last character string, etc. in the main module, which is not limited in the present application.
As a specific embodiment, the method for testing an automatic repair function of a BIOS according to the embodiment of the present application restarts a system to perform an automatic repair function test of the BIOS on the basis of the foregoing contents, and includes:
the system is restarted for BIOS auto repair function testing based on a pre-stored full BIOS firmware backup.
Specifically, before the BIOS automatic repair function test is performed, a storage device, such as a flash disk and a hard disk, in which a complete BIOS firmware backup is stored, may be connected to the motherboard, so that after the motherboard is restarted and powered on, the complete BIOS firmware backup in the storage device is used to perform data integrity verification on the damaged BIOS firmware in the BIOS chip, and thus perform automatic repair.
Referring to fig. 2, an embodiment of the present application discloses an automatic repair function testing apparatus for a BIOS, which mainly includes:
the calling unit 201 is configured to call a preset simulation program to destroy a main module of the BIOS firmware after receiving a preset IPMI instruction sent by the baseboard management controller;
a saving unit 202, configured to save the damaged BIOS firmware;
and the restarting unit 203 is used for restarting the system so as to perform the BIOS automatic repair function test.
Therefore, the device for testing the automatic repair function of the BIOS disclosed in the embodiment of the present application triggers and executes the preset simulation program preset in the BIOS chip based on the preset IPMI instruction, and can efficiently, automatically and accurately destroy the main module of the BIOS firmware, so as to perform the test of the automatic repair function of the BIOS. On the one hand, the BIOS chip is prevented from being disassembled and assembled by the method, the method is suitable for various mainboard structures, and on the other hand, because the development work of the preset simulation program in the method can be completed by BIOS firmware developers together in the firmware development stage, the testers only need to directly observe the test result in the test stage, the main module destroying the firmware is not needed to be manually positioned by consulting the developers, the test efficiency is improved, and the data positioning error of the main module is avoided.
For the details of the automatic repair function testing apparatus of BIOS, reference may be made to the detailed description of the automatic repair function testing method of BIOS, which is not repeated herein.
As a specific embodiment, on the basis of the foregoing, the call unit 201 of the automatic repair function testing apparatus for a BIOS disclosed in the embodiment of the present application is specifically configured to:
searching a main module of the BIOS firmware based on a preset simulation program; and deletes the main module based on a preset simulation program.
As a specific embodiment, on the basis of the foregoing, the call unit 201 of the automatic repair function testing apparatus for a BIOS disclosed in the embodiment of the present application is specifically configured to:
searching a main module of the BIOS firmware based on a preset simulation program; and deleting the first character string in the main module based on a preset simulation program.
As a specific embodiment, the automatic repair function testing apparatus for a BIOS disclosed in the embodiment of the present application, on the basis of the foregoing content, the restarting unit 203 is specifically configured to:
the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
Referring to fig. 3, an embodiment of the present application discloses an electronic device, including:
a memory 301 for storing a computer program;
a processor 302 for executing the computer program to implement the steps of:
after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware; saving the damaged BIOS firmware; and restarting the system so as to perform the BIOS automatic repair function test.
In one embodiment, the computer subroutines stored in memory 301 when executed by processor 302 are specifically for: searching the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.
In one embodiment, the computer subroutines stored in memory 301 when executed by processor 302 are specifically for: searching the main module of the BIOS firmware based on the preset simulation program; and deleting the first character string in the main module based on the preset simulation program.
In one embodiment, the computer subroutines stored in memory 301 when executed by processor 302 are specifically for: the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
Further, an embodiment of the present application also discloses a computer-readable storage medium, in which a computer program is stored, and the computer program is used for implementing the following steps when being executed by a processor:
after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware; saving the damaged BIOS firmware; and restarting the system so as to perform the BIOS automatic repair function test.
In one embodiment, the computer subprogram stored in the computer readable storage medium is specifically adapted to, when executed by the processor: searching the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.
In one embodiment, the computer subprogram stored in the computer readable storage medium is specifically adapted to, when executed by the processor: searching the main module of the BIOS firmware based on the preset simulation program; and deleting the first character string in the main module based on the preset simulation program.
In one embodiment, the computer subprogram stored in the computer readable storage medium is specifically adapted to, when executed by the processor: the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
For details of the electronic device and the computer-readable storage medium, reference may be made to the foregoing detailed description of the method for testing an automatic repair function of a BIOS, and details thereof are not repeated here.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. For the equipment disclosed by the embodiment, the description is relatively simple because the equipment corresponds to the method disclosed by the embodiment, and the relevant parts can be referred to the method part for description.
It is further noted that, throughout this document, relational terms such as "first" and "second" are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The technical solutions provided by the present application are described in detail above. The principles and embodiments of the present application are explained herein using specific examples, which are provided only to help understand the method and the core idea of the present application. It should be noted that, for those skilled in the art, without departing from the principle of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall into the protection scope of the present application.
Claims (10)
1. A BIOS automatic repair function test method is applied to a BIOS chip and comprises the following steps:
after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware;
saving the damaged BIOS firmware;
and restarting the system so as to perform the BIOS automatic repair function test.
2. The automatic repair function test method according to claim 1, wherein the calling the predetermined simulation program to destroy the main module of the BIOS firmware comprises:
searching the main module of the BIOS firmware based on the preset simulation program;
and deleting the main module based on the preset simulation program.
3. The automatic repair function test method according to claim 1, wherein the calling the predetermined simulation program to destroy the main module of the BIOS firmware comprises:
searching the main module of the BIOS firmware based on the preset simulation program;
and deleting the first character string in the main module based on the preset simulation program.
4. The automatic repair function test method according to any one of claims 1 to 3, wherein restarting the system for performing the BIOS automatic repair function test includes:
the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
5. An automatic repair function test device for a BIOS, comprising:
the calling unit is used for calling a preset simulation program to destroy a main module of the BIOS firmware after receiving a preset IPMI instruction sent by the substrate management controller;
the storage unit is used for storing the damaged BIOS firmware;
and the restarting unit is used for restarting the system so as to carry out the BIOS automatic repair function test.
6. The automatic repair function test device according to claim 5, wherein the call unit is specifically configured to:
searching the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.
7. The automatic repair function test device according to claim 5, wherein the call unit is specifically configured to:
searching the main module of the BIOS firmware based on the preset simulation program; and deleting the first character string in the main module based on the preset simulation program.
8. The automatic repair function test device according to any one of claims 5 to 7, wherein the restart unit is specifically configured to:
the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.
9. An electronic device, comprising:
a memory for storing a computer program;
a processor for executing the computer program to implement the steps of the method for automatic repair function testing of a BIOS as claimed in any one of claims 1 to 4.
10. A computer-readable storage medium, in which a computer program is stored, which, when being executed by a processor, is configured to carry out the steps of the method for automatic repair function testing of a BIOS according to any one of claims 1 to 4.
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