CN111693252B - Lamp test control system and lamp test method - Google Patents
Lamp test control system and lamp test method Download PDFInfo
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- CN111693252B CN111693252B CN202010505179.1A CN202010505179A CN111693252B CN 111693252 B CN111693252 B CN 111693252B CN 202010505179 A CN202010505179 A CN 202010505179A CN 111693252 B CN111693252 B CN 111693252B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/20—Controlling the colour of the light
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/30—Driver circuits
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection
Abstract
The invention discloses a lamp test control system and a lamp test method, wherein the lamp test control system comprises an upper computer, a controller and a lamp, wherein the upper computer is connected with the controller, and the controller is connected with the lamp; the controller can control a plurality of channels of the chip corresponding to the lamp, the controller is provided with a software control rod, and the control rod adjusts data corresponding to each channel of the chip in real time to control the irradiation effect of the lamp. The lamp test control system and the lamp test method provided by the invention are suitable for testing intelligent lamps such as LED lamps, are convenient to use, can realize updating of chip channel data through the software control rod, accurately find lamp test parameters corresponding to the optimal irradiation effect of the lamp and effectively improve the efficiency of lamp test.
Description
Technical Field
The invention belongs to the technical field of lamp detection, and relates to a lamp test control system and a lamp test method.
Background
The LED lighting fixture is a general term for LED lighting fixtures, and refers to a fixture capable of transmitting light, distributing and changing light distribution of an LED light source, and includes all components required for fixing and protecting the LED light source except the LED light source, and circuit accessories necessary for connecting with a power supply.
The LED lamp test mainly tests the color and brightness of the lamp and the smoothness of the color change of the lamp. Due to different suppliers, the channel brightness and the light mixing effect corresponding to the chip of the LED lamp are different, and in addition, the irradiation effect of the LED lamp is different under the influence of external factors of a use field. Therefore, the corresponding setting parameters of the LED lamp need to be determined through testing to achieve the optimal illumination effect.
In the prior art, a lamp testing control system is generally a DMX512 console, and is a management tool framework for controlling light based on an industrial standard for data transmission between a light controller and a lamp device, and is limited to stage lighting control, so that the application range of the lamp testing system is effectively reduced.
Therefore, it is desirable to design a lamp testing control system and a lamp testing method to solve the existing technical problems.
Disclosure of Invention
The invention aims to solve at least part of technical problems in the prior art to a certain extent, and provides a lamp test control system and a lamp test method, which are suitable for testing intelligent lamps such as LED lamps and the like, are convenient to use, can update chip channel data through a software control rod, accurately find lamp test parameters corresponding to the optimal illumination effect of the lamp and effectively improve the lamp test efficiency.
In order to solve the technical problem, the lamp test control system provided by the invention comprises an upper computer, a controller and a lamp, wherein the upper computer is connected with the controller, and the controller is connected with the lamp; the controller can control a plurality of channels of the chip corresponding to the lamp, the controller is provided with a software control rod, and the control rod adjusts data corresponding to each channel of the chip in real time to control the irradiation effect of the lamp.
Preferably, the controller includes a data setting interface, and the lever for modifying the channel data is located in the data setting interface.
Preferably, the number of the control rods is matched with the number of the channels of the corresponding chip of the lamp.
Preferably, after the control rod modifies the channel data, the controller updates the corresponding buffer data and analyzes the updated data to convert the updated data into a chip timing sequence to control the lamp.
Meanwhile, the invention also discloses a lamp testing method which uses the lamp testing control system; which comprises the following steps:
s1, setting fixture test parameters F (C, F), where C is a color parameter, C = G (R, G, B, W), and F is a fixture test frequency;
s2, loading lamp test parameters F (C, F) by the upper computer;
s3, the controller selects lamp test parameters and sends the parameters to the lamp to be tested to carry out lamp test;
s4, the controller records and compares the test results;
and S5, determining lamp test parameters corresponding to the optimal illumination effect.
Preferably, after the controller modifies the channel data of the chip corresponding to the lamp through the control rod, the controller updates the lamp test parameters to perform the lamp test.
Preferably, the color parameter C is obtained by referring to a color temperature table, wherein each parameter in G (R, G, B, W) is changed in a decreasing or increasing order to form a color parameter file; and the lamp test parameter file is loaded by an upper computer and used for carrying out lamp test.
Preferably, the selectable modes for lamp test include a normally-on mode, a flashing mode and a color temperature curve mode.
Preferably, the normally-on mode is that the controller sends the selected lamp test parameters every sending period; in a normally bright mode, the color parameters are adjustable; the flash explosion mode is that the selected lamp test parameters are sent every even cycle, and the lamp black screen parameters are sent in the odd cycle; in the burst mode, the color parameters are adjustable.
Preferably, the lamp test parameters and the lamp irradiation effects are stored in a database in a correlated manner, and the upper computer has a machine learning module based on a neural network and automatically generates the lamp test parameters according to the lamp irradiation effects.
The invention has the beneficial effects that:
the lamp test control system and the lamp test method provided by the invention are suitable for testing intelligent lamps such as LED lamps, have wide application range, can realize the updating of chip channel data through a software control rod so as to accurately find lamp test parameters corresponding to the optimal irradiation effect of the lamp and effectively improve the efficiency of lamp test.
Drawings
The above advantages of the present invention will become more apparent and more readily appreciated from the detailed description set forth below when taken in conjunction with the drawings, which are intended to be illustrative, not limiting, of the invention and in which:
FIG. 1 is a block diagram of a lamp test control system according to the present invention;
FIG. 2 is a flow chart of a lamp testing method according to the present invention;
FIG. 3 is a schematic diagram of another embodiment of a lamp test control system according to the present invention;
fig. 4 is a flowchart of a lamp testing method corresponding to the lamp testing control system shown in fig. 3.
Detailed Description
Fig. 1 to fig. 4 are related schematic diagrams of a lamp testing control system and a lamp testing method according to the present application, and the present invention is described in detail below with reference to specific embodiments and accompanying drawings.
The examples described herein are specific embodiments of the present invention, are intended to be illustrative and exemplary in nature, and are not to be construed as limiting the scope of the invention. In addition to the embodiments described herein, those skilled in the art will be able to employ other technical solutions which are obvious based on the disclosure of the claims and the specification of the present application, and these technical solutions include technical solutions which make any obvious replacement or modification for the embodiments described herein.
The drawings in the present specification are schematic views to assist in explaining the concept of the present invention, and schematically show the shapes of respective portions and their mutual relationships. It is noted that the drawings are not necessarily to the same scale so as to clearly illustrate the structures of the various elements of the embodiments of the invention. Like reference numerals are used to denote like parts.
The invention discloses a module schematic diagram of a lamp test control system, which is shown in fig. 1 and comprises an upper computer 10, a controller 20 and a lamp 30, wherein the upper computer 10 is connected with the controller 20, and the controller 20 is connected with the lamp 30; the controller 20 can control a plurality of channels of the chip corresponding to the lamp 30, the controller 20 is provided with a software control rod, and the control rod adjusts data corresponding to each channel of the chip in real time to control the irradiation effect of the lamp 30.
As an embodiment of the present invention, the controller 20 includes a data setting interface in which a lever for modifying channel data is located. The number of the control rods is matched with the number of the channels of the corresponding chip of the lamp 30. After the control stick modifies the channel data, the controller 20 updates the corresponding buffer data and analyzes the updated data to convert into a chip timing sequence to control the lamp 30. The tester realizes the updating of chip channel data through the software control rod so as to accurately find the lamp test parameters corresponding to the optimal lamp irradiation effect, and the lamp test efficiency is effectively improved.
The lamp test control system is not limited to stage lamp test, is also suitable for testing intelligent lamps such as LED lamps and the like, and effectively improves the range of lamp test.
Meanwhile, the invention also discloses a lamp testing method which uses the lamp testing control system; the flow chart, as shown in fig. 2, includes the following steps:
s1, setting fixture test parameters F (C, F), where C is a color parameter, C = G (R, G, B, W), and F is a fixture test frequency;
s2, loading lamp test parameters F (C, F) by the upper computer;
s3, the controller selects lamp test parameters and sends the parameters to the lamp to be tested to carry out lamp test;
s4, the controller records and compares the test results;
and S5, determining lamp test parameters corresponding to the optimal illumination effect.
As an embodiment of the present invention, after the controller modifies the channel data of the chip corresponding to the lamp 30 through the control rod, the controller 20 updates the lamp test parameters to perform the lamp test.
The color parameter C is obtained by contrasting a color temperature table, wherein each parameter in G (R, G, B and W) is changed according to a descending or ascending sequence to form a color parameter file; and the lamp test parameter file is loaded by an upper computer and used for carrying out lamp test.
In step S1, the color parameter C is obtained by referring to a color temperature table, in which G (R, G, B, W) is changed in descending or ascending order to form a color parameter file. Specifically, if the color parameter C is yellow, it may be set to (255, 255, 0, 255); since the lamp and the use place are different, and the lamp irradiation effect is different from the ideal irradiation effect, each parameter in the color parameters needs to be finely adjusted, so that the lamp irradiation effect approaches to the ideal irradiation effect.
The selectable modes of the lamp test comprise a normally-on mode, a flashing mode and a color temperature curve mode. The normally-on mode is that the controller sends selected lamp test parameters in each sending period; in a normally bright mode, the color parameters are adjustable; the flash explosion mode is that the selected lamp test parameters are sent every even cycle, and the lamp black screen parameters are sent in the odd cycle; in the burst mode, the color parameters are adjustable. And the color temperature curve mode is to sequentially send data corresponding to the color temperature according to the selected starting color temperature and the selected ending color temperature.
Fig. 3 is a schematic diagram of another embodiment of the lamp testing control system according to the present invention, which further includes an irradiation effect detection portion 40, where the irradiation effect detection portion 40 is configured to collect an irradiation effect of the lamp 30 and transmit the irradiation effect to the controller 20.
Fig. 4 is a flowchart of another embodiment of a lamp testing method according to the present invention, which includes the following steps:
s101, setting a lamp test parameter F (C, F), wherein C is a color parameter, C = G (R, G, B, W), and F is a lamp test frequency;
s102, loading lamp test parameters F (C, F) by an upper computer;
s103, selecting lamp test parameters by the controller and sending the lamp test parameters to the lamp to be tested to carry out lamp test;
s104, the irradiation effect detection part acquires the irradiation effect of the lamp;
s105, judging whether the difference value between the acquired irradiation effect and the ideal test result is within an allowable range;
specifically, the irradiation effect of the test lamp is collected by the irradiation effect detection part 40 and transmitted to the controller 20, the irradiation effect collected by the irradiation effect detection part 40 is compared with an ideal test result, and the controller 20 adjusts the color parameter in the lamp test parameter according to the comparison result of the irradiation effect and the ideal test result.
S106, if the difference value between the acquired irradiation effect and the ideal test result is not within the allowable range, optimizing the lamp test parameters based on the test result;
and S107, if the difference value between the acquired irradiation effect and the ideal test result is within an allowable range, the controller stores corresponding lamp test parameters.
As an embodiment of the present invention, the irradiation effect detection part 40 is an illuminometer, which is arranged opposite to the lamp to be tested, and is used for collecting the irradiation effect of the lamp; the irradiation effect detection part 40 is connected with the controller to transmit the irradiation effect of the lamp.
As another embodiment of the present invention, the controller further includes a storage unit for storing historical test data, and if the model of the lamp to be tested is previously tested and the previous test data is stored, the controller directly retrieves the ideal previous test data, i.e., the controller can perform debugging on the basis of the previous test data, thereby effectively improving the efficiency of testing the lamp.
As an embodiment of the present invention, the lamp test parameters and the lamp irradiation effect are stored in a database in association with each other, and the upper computer has a neural network-based machine learning module that automatically generates the lamp test parameters according to the lamp irradiation effect. In order to shorten the period of Model training, the inventor of the present application proposes a distributed neural network training method based on block-by-Block Model Update Filtering (BMUF). The method is applied to a distributed computing framework which comprises a plurality of computing nodes, training data are cut into training data slices in advance, and the number of the cut slices is the same as that of the computing nodes participating in computing. The computing node refers to a computing node under a distributed framework, and bears computing tasks in distributed model training, and is generally a computer Process (Process) which represents a concept of a basic execution unit of an application program in a memory environment. Equivalently slicing the training data according to the number of the calculated nodes; and setting each training data slice to different computing nodes respectively to complete the configuration of the training data. The specific implementation belongs to the common technical means of those skilled in the art, and the specific implementation is not used for limiting the protection scope of the present application, and is not described herein again.
The tester can input the lamp irradiation effect into the upper computer through the information acquisition module such as the camera module according to the requirement of the lamp irradiation effect, and the upper computer automatically recommends lamp test parameters through the machine learning module based on the neural network. Because the neural network is optimized and calculated based on historical measurement data, the recommended lamp test parameters are close to ideal values. The tester can debug on the basis of recommending the lamp test parameters, and the lamp test efficiency is effectively improved.
Compared with the defects and shortcomings of the prior art, the lamp test control system and the lamp test method provided by the invention are suitable for testing intelligent lamps such as LED lamps, are convenient to use, can update chip channel data through the software control rod, accurately find lamp test parameters corresponding to the optimal irradiation effect of the lamp and effectively improve the lamp test efficiency.
The present invention is not limited to the above embodiments, and any other products in various forms can be obtained by the teaching of the present invention, but any changes in the shape or structure thereof, which are the same as or similar to the technical solutions of the present invention, fall within the protection scope of the present invention.
Claims (5)
1. A lamp testing method is characterized in that a lamp testing control system is used and comprises an upper computer, a controller and a lamp, wherein the upper computer is connected with the controller, and the controller is connected with the lamp; the controller can control a plurality of channels of a chip corresponding to the lamp, is provided with a software control rod, adjusts data corresponding to each channel of the chip in real time to control the irradiation effect of the lamp, comprises a data setting interface, the control rod for modifying the data corresponding to the channel is positioned on the data setting interface, the number of the control rods is matched with the number of the channels corresponding to the chip of the lamp, and after the control rod modifies the data corresponding to the channel, the controller updates corresponding buffer data and analyzes the updated data so as to convert the data into a chip time sequence to control the lamp, and comprises the following steps:
s1, setting fixture test parameters F (C, F), where C is a color parameter, C = G (R, G, B, W), and F is a fixture test frequency;
s2, loading the lamp test parameters F (C, F) by the upper computer;
s3, the controller selects the lamp test parameters F (C, F) and sends the parameters F (C, F) to the lamp to be tested to carry out lamp test;
s4, the F (C, F) controller records and compares the test results;
s5, determining the lamp test parameters corresponding to the optimal irradiation effect,
after the controller modifies the data corresponding to the channel of the chip corresponding to the lamp through the control rod, the controller updates lamp test parameters to carry out lamp test, and the color parameter C is obtained by contrasting a color temperature table, wherein each parameter in G (R, G, B and W) is changed according to a descending or ascending sequence to form a color parameter file; and the color parameter file and the lamp test frequency form a lamp test parameter file, and the lamp test parameter file is loaded by an upper computer and used for carrying out lamp test.
2. A lamp testing method is characterized in that a lamp testing control system is used and comprises an upper computer, a controller, a lamp and an irradiation effect detection part, wherein the upper computer is connected with the controller, and the controller is connected with the lamp; the illumination effect detection part is used for acquiring the illumination effect of the lamp and transmitting the illumination effect to the controller, the controller can control a plurality of channels of the chip corresponding to the lamp, the controller is provided with a software control rod, the control rod adjusts data corresponding to each channel of the chip in real time to control the illumination effect of the lamp, the controller comprises a data setting interface, the control rod for modifying the data corresponding to the channel is positioned on the data setting interface, the number of the control rods is matched with the number of the channels corresponding to the chip, after the control rod modifies the data corresponding to the channel, the controller updates corresponding buffer data and analyzes the updated data to convert the updated data into a chip time sequence to control the lamp, and the illumination effect detection part comprises the following steps:
s101, setting a lamp test parameter F (C, F), wherein C is a color parameter, C = G (R, G, B, W), and F is a lamp test frequency;
s102, loading the lamp test parameters F (C, F) by the upper computer;
s103, the controller selects lamp test parameters and sends the lamp test parameters to the lamp to be tested to carry out lamp test;
s104, the irradiation effect detection part acquires the irradiation effect of the lamp to be tested;
s105, judging whether the difference value between the acquired irradiation effect and the ideal test result is within an allowable range;
specifically, the irradiation effect of the lamp to be tested is acquired by the irradiation effect detection part and transmitted to the controller, the irradiation effect acquired by the irradiation effect detection part is compared with an ideal test result, the controller adjusts the color parameter in the lamp test parameters according to the comparison result of the irradiation effect and the ideal test result,
s106, if the difference value between the acquired irradiation effect and the ideal test result is not within the allowable range, optimizing the lamp test parameters based on the test result;
s107, if the difference value between the acquired irradiation effect and the ideal test result is in an allowable range, the controller stores corresponding lamp test parameters,
the irradiation effect detection part is an illuminometer, is arranged right opposite to the lamp to be tested and is used for detecting the irradiation effect of the lamp to be tested; the irradiation effect detection part is connected with the controller to transmit the irradiation effect of the lamp to be tested.
3. The lamp testing method of claim 2, wherein the controller further comprises a storage unit for storing test data, and if the model of the lamp to be tested is previously tested and the previous test data is stored, the controller directly retrieves the ideal previous test data, i.e. performs debugging on the basis of the previous test data.
4. The lamp testing method of claim 2, wherein the lamp testing parameters and the lighting effects are stored in a database in correlation, and the upper computer has a neural network-based machine learning module that automatically generates the lamp testing parameters according to the lighting effects.
5. The lamp testing method according to claim 4, wherein a tester inputs the irradiation effect into an upper computer according to the requirement of the irradiation effect, and the upper computer automatically recommends lamp testing parameters through a machine learning module based on a neural network.
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| CN112135384B (en) * | 2020-09-28 | 2023-02-24 | 江门市征极光兆科技有限公司 | Automatic testing device and method for WIFI lamp |
| CN115065984A (en) * | 2022-06-21 | 2022-09-16 | 江苏旭耀光电技术有限公司 | Stability test method and system for landscape lighting control system |
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