CN111639015A - STDF (Standard template distribution function) rapid increment analysis method capable of adjusting analysis period and analysis point - Google Patents
STDF (Standard template distribution function) rapid increment analysis method capable of adjusting analysis period and analysis point Download PDFInfo
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Abstract
The invention discloses an STDF fast increment analysis method capable of adjusting analysis period and analysis point, which comprises the following steps: the method comprises the following steps: reading of the STDF file: in the real-time analysis process of the test data of the same lot, the same STDF file is read for multiple times in a circulating way; step two: saving a file pointer: and storing the current file pointer position after the analysis is finished each time, directly jumping to the current position for the next time to continue the analysis backwards, placing the file pointer stored each time at the end of a complete record and the position where the next record starts, directly starting the analysis from the next record head next time, and storing the pointer at the end of the last complete record if the last record is incomplete. In the invention, the analysis period is adaptively adjusted according to the information of the test time in the PRR record of the STDF in the analysis process, and the analysis process is adjusted to the time gap of loading and unloading in real time, thereby avoiding the influence of the analysis process on the test time.
Description
Technical Field
The invention relates to the technical field of semiconductor testing, in particular to an STDF fast increment analysis method capable of adjusting analysis period and analysis point.
Background
The current real-time monitoring system of the test equipment generally has three mainstream data acquisition modes, GPIB hardware realization, SECS-GEM protocol realization and a method for analyzing test data in real time, wherein the former two methods have large investment and complex realization, and the real-time test data analysis method basically does not need extra investment.
1. By analyzing the data file in the temporary text format, the data file in the text format is in a non-standard data format, the text data formats of different testing machines are different, and in addition, even if the testing platforms are the same, the data formats are changed due to different testing programs, so the analysis method is not universal, and the analyzer needs to be updated continuously to achieve compatibility. And the test data in the text format for starting the tester additionally occupies the CPU, the memory and the hard disk resources of the tester computer.
2. The method is also realized by uploading the STDF file in real time or splitting the STDF and uploading the STDF in real time (one rough analysis is carried out during the splitting of the STDF, the STDF is required to be merged and then completely analyzed again after being uploaded to a background), and in the splitting and uploading process, the original data blocks are completely uploaded to include unnecessary redundant data, so that the data transmission cannot be simplified according to requirements, the method is not flexible enough, and the data transmission efficiency is not high enough.
3. The existing data analysis method generally refers to a fixed frequency access test data file, and cannot adapt to data generated by various test programs, the test time of different test programs can be from dozens of milliseconds to dozens of seconds under the normal condition that the test time is different, if the access data is too frequent, the efficiency of a testing machine is influenced, the testing machine is blocked, the side length of the test time is long, and the longer the test time is, the higher the cost is.
In order to solve the existing problems, an STDF fast incremental analysis method capable of adjusting an analysis period and an analysis point is proposed.
Disclosure of Invention
In order to achieve the purpose, the invention adopts the following technical scheme:
an STDF fast increment analysis method capable of adjusting analysis period and analysis point includes the following steps:
the method comprises the following steps: reading of the STDF file: in the real-time analysis process of the test data of the same lot, the same STDF file is read for multiple times in a circulating way;
step two: saving a file pointer: storing the current file pointer position after each analysis is finished, directly jumping to the current position for the next time to continue the backward analysis, placing the file pointer stored each time at the end of a complete record and the beginning of the next record, directly starting the analysis from the head of the next record next time, and storing the pointer at the end of the last complete record if the last record is incomplete;
step four: analyzing the STDF file, wherein the position of a file pointer saved each time is at the end of the last PRR of a pair (or a group) of complete PIR/PRR pairs, if the last group of data currently analyzed is incomplete (no PRR or lack of PRR or the last PRR record is incomplete), the last group of data is ignored, the saved file pointer points to the end of the last pair (or the group) of complete PIR/PRR pairs, and the current group of incomplete data is left for the next analysis;
step five: simplifying data to be transmitted by the network according to requirements: the analyzed data is transmitted to the server through the network and stored in the database, so that the web server can display the real-time data in the database to the webpage foreground, the occupation of network resources can be reduced by simplifying the transmitted data, and the timeliness of system updating is improved;
step six: self-adaptive adjustment of the analysis period: when the STDF is analyzed in real time, the tester also adds new test data to the end of the STDF, so that the same STDF data file (only an incremental part is analyzed) needs to be repeatedly analyzed according to a frequency, and newly added information is continuously acquired to realize data updating of the real-time monitoring system, a fixed analysis period is generally set, and the fixed analysis period is generally set to be about 1-2 s in order to ensure the system to be refreshed in time;
step seven: analyzing and testing time: after the test data of the front chips are analyzed, relatively accurate test time can be taken out from the data, if the test time is longer than the expected refreshing time, the analyzed test time can be used as a new analysis period, so that the self-adaptive adjustment of the analysis frequency is realized, and the method is suitable for STDF data generated by test programs of different test platforms and different test times;
step eight: the STDF analysis method comprises the following two steps of:
the first step is as follows: acquiring the feeding and discharging time: analyzing a certain amount of chip data, calculating the average value of the feeding and discharging time, starting a timer in an analyzing program in order to calculate the feeding and discharging time, and calculating the feeding and discharging time by combining the time of the timer and the test time after analyzing a certain amount of chip data to obtain a calculation formula: i is (L-sigma t)/n, wherein i represents the loading and unloading time, n represents the number of tested chips, t represents the testing time, and L represents the time of the timer;
step two, adjusting the obtained feeding and discharging time: and calculating the time for feeding and discharging for multiple times through multiple groups of data, and then taking the minimum value to be more approximate to the time for actual feeding and discharging.
Step nine: analysis period: after the test time and the feeding and discharging time are known, the analysis time point is moved to the time gap of feeding and discharging, and then the test time plus the discharging time is used as a default analysis period to ensure that the time gap of feeding and discharging is formed at each analysis time point.
Step ten: automatically adjusting the time gap from the analysis point to the feeding and discharging: when the analysis point is not in the time gap of loading and unloading, the analysis point is advanced by some (delta t is i/2) at each later analysis point, the delta t is the variation of the test time, after one or more times of adjustment (when the test is stable, the adjustment times are at most: 2t/i), the analysis point can return to the time gap of loading and unloading, and then the default analysis time interval is recovered.
Compared with the prior art, the invention has the beneficial effects that:
first, based on the general test data of STDF, the universality is very strong and the investment is very small.
Secondly, the analysis time cannot be influenced by the enlargement of the STDF file in an incremental reading mode, the rapid real-time analysis of each time can be ensured, and the resource occupation of a computer of the testing machine is reduced.
Thirdly, the analysis is carried out at the tester end, and the data to be transmitted can be freely selected according to the requirement, so that the transmission efficiency is improved.
Fourthly, in the analysis process, the analysis period is adaptively adjusted according to the information of the test time in the PRR record of the STDF, and the analysis process is adjusted to the time gap of loading and unloading in real time, so that the influence of the analysis process on the test time is avoided;
fifthly, the real-time rapid analysis of the STDF data file is realized by an incremental analysis method, the time consumption of each analysis can be reduced to below 1% of the test time after the incremental analysis is used, and the influence on the test time is greatly reduced, wherein the key point is the pointing position of the stored file pointer.
Sixthly, the analysis process is adjusted to be completed in the time gap of feeding and discharging through an algorithm of real-time self-adaptive adjustment of the analysis period and the analysis time point, so that the influence of real-time analysis on the test time is completely eliminated.
Seventh, since the STDF real-time parsing at the tester end is realized, the data to be transmitted can be simplified to improve the data transmission efficiency and the timeliness of system updating.
Drawings
Fig. 1 is a block diagram of a conventional semiconductor device real-time monitoring and alarm system of an STDF fast incremental analysis method capable of adjusting an analysis period and an analysis point according to the present invention;
fig. 2 is a flowchart of incremental parsing of an STDF data file in an STDF fast incremental parsing method capable of adjusting parsing period and parsing point according to the present invention;
FIG. 3 is a schematic diagram of a file pointer storage location in a multi-parsing process when reading the STDF in increments in the STDF fast increment parsing method capable of adjusting parsing period and parsing point according to the present invention;
fig. 4 is a schematic diagram of automatically adjusting the analysis process to the loading and unloading time gap in the STDF fast incremental analysis method capable of adjusting the analysis period and the analysis point according to the present invention.
Fig. 5 is a schematic diagram of multiple analyses in a long test time process in an STDF fast incremental analysis method capable of adjusting an analysis period and an analysis point according to the present invention;
fig. 6 is an efficiency analysis chart of incremental analysis in the STDF fast incremental analysis method of the present invention, which can adjust the analysis period and the analysis point;
fig. 7 is a graph comparing the analysis time and the loading and unloading time in the STDF fast incremental analysis method capable of adjusting the analysis period and the analysis point according to the present invention;
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention.
Referring to fig. 1 to 7, an STDF fast incremental parsing method capable of adjusting a parsing period and a parsing point includes the following steps:
the method comprises the following steps: reading of the STDF file: in the real-time analysis process of the same batch of lot test data, the same STDF file is read for multiple times in a circulating mode, specifically, only newly added data after the last analysis is read each time, and the data analyzed before is not repeatedly analyzed;
step two: saving a file pointer: storing the current file pointer position after each analysis is finished, directly jumping to the current position for the next time to continue the backward analysis, placing the file pointer stored each time at the end of a complete record and the beginning of the next record, directly starting the analysis from the head of the next record next time, and storing the pointer at the end of the last complete record if the last record is incomplete;
step four: analyzing the STDF file, wherein the position of a file pointer saved each time is at the end of the last PRR of a pair (or a group) of complete PIR/PRR pairs, if the last group of data currently analyzed is incomplete (no PRR or lack of PRR or the last PRR record is incomplete), the last group of data is ignored, the saved file pointer points to the end of the last pair (or the group) of complete PIR/PRR pairs, and the current group of incomplete data is left for the next analysis;
now turning to the analysis speed analysis of STDF after incremental reading, we assume that the current STDF file size is 50MB, the full parsing time is about 5 seconds (we assume 4.5 seconds), while the incremental parsing time of one piece of data is only about 1ms (only 0.02% of the full parsing), which in practical cases becomes much smaller as the STDF data file size increases, referring to fig. 6. Meanwhile, the ratio of the incremental analysis time to the chip test time is less than 1%, which means that the analysis time is very small relative to the test time after the incremental analysis is applied, so that the influence of the test time caused by the occupation of computer resources of a test machine by STDF analysis is greatly reduced, the real-time analysis of each time can be ensured to be rapid, and the occupation of the resources of the test machine computer is reduced.
Step five: simplifying data to be transmitted by the network according to requirements: the analyzed data is transmitted to the server through the network and stored in the database, so that the web server can display the real-time data in the database to the foreground of the web page, wherein the network transmission of the data is also a very time-consuming link, if we need a background server for transmitting all the test item results, the overhead of the network transmission is very huge, but the transmission of complete test data is not required in a general real-time system at all, for example, a test machine state monitoring system and a real-time e-summary system only need to transmit 'judgment result' information in real time, some real-time monitoring systems can monitor the results of some key test items, which need to transmit the test results of some key test items at the same time, but are only the key test items, and other test items do not need (for example, only 2 key test items need to be monitored in 1000 test items), because the real-time analysis is completed at the tester end, only the data needed in the analyzed data can be transmitted to the background (the ratio of the needed data to the total amount of data is very small), but other large amount of data does not need to be transmitted, the number of the mode of only transmitting necessary data is much smaller than that of the mode of transmitting STDF to the background analysis in real time, the analysis is performed at the tester end, the data needed to be transmitted can be freely selected according to the requirements, the network overhead is reduced, and the transmission efficiency and the system real-time performance are improved.
Step six: self-adaptive adjustment of the analysis period: when the STDF is analyzed in real time, the tester also adds new test data to the end of the STDF, so that the same STDF data file (only the incremental part is analyzed) needs to be repeatedly analyzed according to a frequency, and new information is continuously obtained to update the data of the real-time monitoring system, generally, a fixed analysis period is set, and generally, the fixed analysis period is set to about 1-2 s in order to ensure the system is refreshed in time. Specifically, referring to fig. 5, if the analysis period is fixed to 2 seconds, in some cases where the test time is long, multiple analyses may occur during one test, and most of the analyses are useless because the data of one test is not complete. However, the multiple analyses inevitably occupy the computer resources of the tester, and influence is brought to the testing time. Although the time of each analysis is short after the incremental analysis is applied, the influence on the test time is very small. We still want to remove these meaningless frequent parses. If the resolution period is set too long, such as 10s resolution once, then update timeliness is again not guaranteed for cases of short test time. It is desirable to automatically adjust the resolution period based on the test time. When the test time is shorter than the expected refresh time interval (such as 2 seconds), we use the "expected refresh time" as the resolution period; if the test time is longer than the refresh interval, we use the test time as the resolution period.
Step seven: analyzing and testing time: after the test data of the front chips are analyzed, relatively accurate test time can be taken out from the data, if the test time is longer than the expected refreshing time, the analyzed test time can be used as a new analysis period, so that the self-adaptive adjustment of the analysis frequency is realized, and the method is suitable for STDF data generated by test programs of different test platforms and different test times;
step eight: the STDF is analyzed through the time gap of feeding and discharging: the method comprises the following two steps:
the first step is as follows: acquiring the feeding and discharging time: analyzing a certain amount of chip data, calculating an average value of loading and unloading time, starting a timer in an analysis program for calculating the loading and unloading time, analyzing a certain amount of chip data, and calculating the loading and unloading time by combining the time of the timer and the test time to obtain a calculation formula (i ═ L- Σ t)/n), wherein i represents the loading and unloading time, n represents the number of chips to be tested, t represents the test time, and L represents the time of the timer;
step two, adjusting the obtained feeding and discharging time: and calculating the time for feeding and discharging for multiple times through multiple groups of data, then taking the minimum value, adaptively adjusting the analysis period according to the information of the test time in the PRR record of the STDF in the analysis process, and adjusting the analysis process to the time gap for feeding and discharging in real time, thereby avoiding the influence of the analysis process on the test time.
Specifically, the testing process of each chip can be divided into two segments, namely loading and unloading time (hereinafter denoted by i) and testing time (hereinafter denoted by t), wherein the loading and unloading time generally has a relationship with the type of the sorting machine, and the testing time is related to the testing program of the product. The feeding time is the time for picking and placing the chip by the sorting machine, the time is generally 0.1-0.7 seconds, the testing machine is not tested in the time, namely the testing machine is idle, and if the analysis time can be controlled in the time gap of the feeding and the discharging, the analysis of the testing machine has no influence on the testing time. It can be seen from the comparison of data in fig. 7 that, if incremental analysis is used, the time of each analysis is only about 1% of the loading and unloading time, so that the time gap can be fully used to complete the analysis without any influence on the test time.
Step nine: analysis period: after the test time and the feeding and discharging time are known, the analysis time point is moved to the time gap of feeding and discharging, and then the test time plus the discharging time is used as a default analysis period to ensure that the time gap of feeding and discharging is formed at each analysis time point.
Step ten: automatically adjusting the time gap from the analysis point to the feeding and discharging: when the analysis point is not in the time gap of loading and unloading, the analysis point is advanced by some (delta t is i/2) at each later analysis point, the delta t is the variation of the test time, after one or more times of adjustment (when the test is stable, the adjustment times are at most: 2t/i), the analysis point can return to the time gap of loading and unloading, and then the default analysis time interval is recovered.
In the invention, firstly, based on the STDF general test data, the universality is very strong and the investment is very small; secondly, the analysis time cannot be influenced by the enlargement of the STDF file in an incremental reading mode, the rapid real-time analysis of each time can be ensured, and the resource occupation of a computer of a testing machine is reduced; moreover, the analysis is carried out at the tester end, and the data to be transmitted can be freely selected according to the requirements, so that the transmission efficiency is improved; and finally, in the analysis process, the analysis period is adaptively adjusted according to the information of the test time in the PRR record of the STDF, and the analysis process is adjusted to the time gap of loading and unloading in real time, so that the influence of the analysis process on the test time is avoided, and the test time is reduced.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (1)
1. An STDF fast increment analysis method capable of adjusting analysis period and analysis point is characterized by comprising the following steps:
the method comprises the following steps: reading of the STDF file: analyzing the test data of the same lot in real time, namely circularly reading the same STDF for multiple times;
step two: saving a file pointer: storing the current file pointer position after each analysis is finished, directly jumping to the current position for the next time to continue the backward analysis, placing the file pointer stored each time at the end of a complete record and the beginning of the next record, directly starting the analysis from the head of the next record next time, and storing the pointer at the end of the last complete record if the last record is incomplete;
step four: analyzing the STDF file, wherein the position of the file pointer saved each time is at the last PRR end of a complete PIR/PRR pair, if the last group of data analyzed currently is incomplete, the last group of data is ignored, the saved file pointer points to the end of the last complete PIR/PRR pair, and the incomplete group of data is left for next analysis;
step five: simplifying data to be transmitted by the network according to requirements: the analyzed data is transmitted to a server through a network and is stored in a database, so that the web server can display the real-time data in the database to a webpage foreground;
step six: self-adaptive adjustment of the analysis period: when the STDF is analyzed in real time, the tester also adds new test data to the end of the STDF, so that the same STDF data file needs to be repeatedly analyzed according to a frequency, only an incremental part is analyzed, and newly added information is continuously acquired to realize data updating of the real-time monitoring system, a fixed analysis period is generally set, and the fixed analysis period is generally set to be about 1-2 s in order to ensure the system to be refreshed in time;
step seven: analyzing and testing time: after analyzing the test data of the front chips, relatively accurate test time can be taken out from the data, and if the test time is longer than the expected refreshing time, the analyzed test time can be used as a new analysis period;
step eight: the STDF analysis method comprises the following two steps of:
the first step is as follows: acquiring the feeding and discharging time: analyzing a certain amount of chip data, calculating the average value of the feeding and discharging time, starting a timer in an analyzing program in order to calculate the feeding and discharging time, and calculating the feeding and discharging time by combining the time of the timer and the test time after analyzing a certain amount of chip data to obtain a calculation formula: i is (L-sigma t)/n, wherein i represents the loading and unloading time, n represents the number of tested chips, t represents the testing time, and L represents the duration of a timer;
step two, adjusting the obtained feeding and discharging time: and calculating the time for feeding and discharging for multiple times through multiple groups of data, and taking the minimum value.
Step nine: analysis period: after the test time and the feeding and discharging time are known, the analysis time point is moved to the time gap of feeding and discharging, and then the test time plus the discharging time are used as a default analysis period to enable the time gap of feeding and discharging to be formed at each analysis time point.
Step ten: automatically adjusting the time gap from the analysis point to the feeding and discharging: when the analysis point is not in the time gap of loading and unloading, the analysis point at the later time is advanced, and when the test is stable, the adjustment times are at most: 2t/i, after adjustment, the analysis point can return to the time gap of feeding and discharging, and then the default analysis time interval is recovered.
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