Three-dimensional reconstruction method for micro-nano level structure of porous composite material
Technical Field
The invention relates to the technical field of three-dimensional reconstruction, in particular to a three-dimensional reconstruction method for a micro-nano structure of a porous composite material.
Background
At present, two main technical methods are available for three-dimensional reconstruction of micro-nano structures of composite materials. One is a synchrotron micro-CT scanning system that uses an industrial X-ray generator or synchrotron as the X-ray generator to scan the composite material layer by layer. While modern micro-CT scanning systems can obtain digitized three-dimensional reconstruction data with a resolution of 5um and higher, the resolution is far from adequate for micro-nano scale microstructures. Another digital three-dimensional reconstruction scanning technique relies on a focused ion beam-scanning electron microscope (FIB-SEM) dual-beam technique, which can achieve a resolution of up to 3nm, but this method requires the help of complex image processing techniques to filter out interference caused by pore background in the electron microscope image when processing the microstructure of the porous material, so that the accuracy of three-dimensional reconstruction is greatly affected. Especially for porous composites, the disturbing effects caused by this pore background will be more severe, so this technique is limited to three-dimensional reconstruction of the micro-nano-scale structure of the densified material. In addition, the traditional method needs to adopt mechanical grinding, the original structure of the material is affected by external force in the process, the micro-nano scale porous material is mechanically damaged, and the processed material area cannot be restored. At present, the existing method can not realize accurate three-dimensional reconstruction of the micro-nano structure of the porous composite material temporarily.
Disclosure of Invention
Aiming at the technical problems, the invention discloses a three-dimensional reconstruction method for a micro-nano structure of a porous composite material, which can accurately reconstruct the micro-nano structure of various functional porous composite materials.
In this regard, the invention adopts the following technical scheme:
a three-dimensional reconstruction method for a porous composite micro-nano structure, comprising the steps of:
step S1, filling pores of a sample to be tested by adopting a mixture containing epoxy resin and a curing agent under a vacuum condition; wherein, the epoxy resin is cold-inlaid epoxy resin which can be used for vacuum impregnation, namely, the viscosity is lower; further, the ambient temperature is room temperature;
s2, before the epoxy resin is completely cured, taking out a sample to be tested from the incompletely cured resin, and directly polishing the section of the material by using an ion beam polishing machine; further, the curing temperature was room temperature.
And S3, observing and selecting a polished cross section area by using an electron microscope, alternately cutting and scanning a sample by adopting a focused ion beam-scanning electron microscope (FIB-SEM) double-beam technology to obtain a continuous two-dimensional image stream, then carrying out alignment treatment on the two-dimensional image stream, carrying out shadow correction on an image, carrying out material area segmentation on the two-dimensional image according to the material contrast difference, and finally reconstructing a micro-nano three-dimensional structure of the porous composite material based on the segmented two-dimensional digital image.
According to the technical scheme, epoxy resin enters a composite material micro-nano structure to be filled under vacuum, and then a high-power ion beam polishing instrument is used for polishing the surface of a required sample, so that the conventional mechanical polishing step of a cured resin block is omitted, meanwhile, the damage in the mechanical polishing process is avoided, and the gap caused by the tearing of the boundary between the resin and a solid material is prevented; finally, the sample is alternately cut and scanned by a focused ion beam-scanning electron microscope (FIB-SEM) double-beam technology, and the scanned image can be displayed because the epoxy resin and the composite material are different in material, so that three-dimensional reconstruction is realized.
As a further improvement of the present invention, in step S1, the sample to be measured is immersed in a mixture containing an epoxy resin and a curing agent for pore filling, or the mixture containing an epoxy resin and a curing agent is used for pore filling by flowing over the surface of the sample to be measured.
As a further improvement of the invention, when the mixture of the epoxy resin and the curing agent flows through the surface of the sample to be tested for pore filling, the flow rate of the mixture of the epoxy resin and the curing agent is not more than 0.25mm/s.
As a further improvement of the present invention, in step S1, the vacuum degree is 0.1 to 0.15 atm. The vacuum level needs to be strictly controlled, and too high a pressure can lead to incomplete filling, and too low a pressure can lead to resin boiling and also to air bubbles.
As a further improvement of the present invention, step S1 further comprises allowing the filled sample to be measured to stand for 2 hours under an atmosphere of 0.1 to 0.15atm, and then curing.
As a further improvement of the present invention, in step S1, the epoxy resin is EpoFix Kit cold-set epoxy resin.
As a further improvement of the invention, in the step S2, the epoxy resin is firstly cured for 1-3 hours at room temperature, and when the hardness of the epoxy resin reaches 15-25% of the hardness of the epoxy resin which is completely cured, a sample is taken out of the resin which is not completely cured, and the curing is continued.
As a further improvement of the present invention, after finishing the polishing in step S2, the surface of the sample to be tested is subjected to carbon spraying treatment.
Compared with the prior art, the invention has the beneficial effects that:
by adopting the technical scheme of the invention, the cost of three-dimensional reconstruction of the micro-nano structure of the material is greatly reduced, and the background image in the hole is perfectly converted into a black background with zero contrast under the observation of an electron microscope by selecting proper resin and a filling process method. Meanwhile, the invention avoids the mechanical damage of the traditional mechanical grinding process to the micro-nano scale porous material, furthest keeps the original structure of the material from being influenced by external force, realizes the accurate three-dimensional reconstruction of the micro-nano scale structure of the porous composite material, and provides an accurate digital model for the quantitative research of the micro-nano scale structure of the material.
Drawings
FIG. 1 is a schematic diagram of a two-dimensional graphics stream obtained in example 1 of the present invention.
Fig. 2 is a three-dimensional creation chart obtained in embodiment 1 of the present invention.
FIG. 3 is a three-dimensional reconstruction after treatment obtained in example 1 of the present invention.
FIG. 4 is a partial schematic view of a three-dimensional reconstruction after processing obtained in example 1 of the present invention.
FIG. 5 is a partial schematic view of the three-dimensional reconstruction after treatment obtained in comparative example 1 of the present invention.
FIG. 6 is a partial schematic representation of the processed three-dimensional reconstruction obtained in comparative example 2 of the present invention.
Detailed Description
Preferred embodiments of the present invention are described in further detail below.
Example 1
A three-dimensional reconstruction method for a porous composite material micro-nano structure aims at three-dimensional reconstruction of a nickel-yttria stabilized zirconia metal-ceramic composite material and comprises the following steps:
(1) Slowly flowing the mixture of the low-viscosity epoxy resin and the curing agent through the surface of the sample at a speed of below 0.25mm/s under the vacuum condition at room temperature to fill the pores of the sample material; wherein the atmospheric pressure of the vacuum condition is 0.1-0.15atm, too low a vacuum (> 0.15 atm) results in incomplete filling, while too high a vacuum (< 0.1 atm) results in boiling of the resin, and also the introduction of bubbles. After filling, the sample was allowed to stand under an atmosphere of 0.1-0.15atm for 2 hours to ensure complete removal of the microbubbles.
The epoxy resin is cold-inlaid epoxy resin of Danish Tel EpoFix Kit, and the resin is completely solidified at room temperature for 12 hours without shrinkage, and is particularly suitable for vacuum impregnation and transparent in material.
(2) After curing for 2.5 hours at room temperature, when the hardness reached 20% of the hardness after complete curing, the sample was taken from the resin that was not completely cured and curing was continued for 12 hours. And directly taking out the sample before the resin is completely cured, and directly polishing the cross section of the material by using an ion beam polishing machine.
And after the solidification is finished, carrying out carbon spraying treatment on the surface of the sample to form a conductive layer, so that electron microscope observation is facilitated.
(3) Observing and selecting a proper polished section area by using an electron microscope, and alternately cutting and scanning a sample by adopting a focused ion beam-scanning electron microscope (FIB-SEM) double-beam technology to obtain a continuous two-dimensional image stream, as shown in figure 1; then, the cut picture stream is aligned by adopting an image registration technology, the image is subjected to shading correction by adopting a gray level processing technology, the two-dimensional picture is subjected to material region segmentation according to the material contrast difference, and finally, the micro-nano three-dimensional structure of the porous composite material is reconstructed based on the segmented two-dimensional digitized image, as shown in fig. 2, and the method can be adopted as the method in the prior art. Further, the processing can be performed at a later stage to obtain a three-dimensional reconstruction after the processing shown in fig. 3, and the partial schematic diagram is shown in fig. 4.
Comparative example 1
In this comparative example, unlike example 1, when filling is performed, the atmospheric pressure of the vacuum condition is greater than 0.2atm, and the obtained partial schematic diagram of the three-dimensional reconstruction is shown in fig. 5, and it can be seen that some places remain in the partial schematic diagram, and the filling is insufficient, so that the three-dimensional reconstruction of the internal structure of the material is greatly disturbed.
Comparative example 2
In this comparative example, the same type of acrylic cold set resin AK-5000 was used to fill the voids of the sample, as in example 1. Acrylic resin AK-5000 is a translucent resin with short curing time and extremely low shrinkage. The acrylic resin has good permeability to cracks and pores.
The partial schematic diagram of the three-dimensional reconstruction obtained in this comparative example is shown in fig. 6, in which the color depth varies in the place indicated by the arrow, and the structure of this part is such that the acrylic resin cannot sufficiently fill the voids and thus the resin holes remain after the resin is cured.
As can be seen from comparison of fig. 4, fig. 5 and fig. 6, the three-dimensional graph obtained by adopting the technical scheme of the invention has accurate reaction on the micro-nano structure inside the composite material, and the background image in the pore is perfectly converted into the black background with zero contrast under the observation of an electron microscope, so that the interference effect caused by the pore background can be completely solved.
The foregoing is a further detailed description of the invention in connection with the preferred embodiments, and it is not intended that the invention be limited to the specific embodiments described. It will be apparent to those skilled in the art that several simple deductions or substitutions may be made without departing from the spirit of the invention, and these should be considered to be within the scope of the invention.