CN111555802A - Debugging method for optical power and extinction ratio of optical module - Google Patents
Debugging method for optical power and extinction ratio of optical module Download PDFInfo
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07955—Monitoring or measuring power
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0799—Monitoring line transmitter or line receiver equipment
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Abstract
The invention discloses a debugging method of optical power and extinction ratio of an optical module, which can adjust the optical power of the optical module to a required specification only by three steps by adjusting a digital resistor twice, and can adjust the extinction ratio to the required specification only by one step on the basis of optical power adjustment.
Description
Technical Field
The invention relates to the technical field of optical modules, in particular to a method for debugging the optical power and extinction ratio of an optical module.
Background
The optical power (Po) and the Extinction Ratio (ER) of the optical module are the two most important parameters of the transmitting end of the optical module, and the required optical power and the required extinction ratio are different in different application places.
Aiming at different application fields, parameters of a transmitting end of an optical module which leaves a factory need to be adjusted to be within a corresponding specification range, and the current mainstream debugging means is to adjust the magnitude of a driving current by adjusting the resistance value of a digital resistor in a system, so that the purposes of controlling the optical power (Po) and the Extinction Ratio (ER) of the optical module are achieved, specifically: the method comprises the steps of presetting a basic resistance value of a digital resistor, changing the resistance value by adjusting the size of the digital resistor, further influencing the driving current value of the optical module, and then enabling the driving current and the optical power to be in a direct proportion relation, thereby achieving the purpose of adjusting the optical power of the optical module; the extinction ratio debugging process is similar.
In the process, the adjustment steps of the digital resistor in the size of the step diameter are uncertain, continuous debugging is needed in the process, and an optical power value is needed to be read once when each step diameter is adjusted, so that the optical power can be adjusted to be within a specification range, the process is complicated and tedious, and the labor cost is high; in the debugging process, a large amount of occupied optical oscilloscopes are needed, the oscilloscopes are the most important and expensive devices in the production process of the optical modules, and the utilization rate of the oscilloscopes is extremely low due to the debugging method.
Disclosure of Invention
The purpose of the invention is as follows: in order to overcome the defects of the existing method, the debugging method of the optical power and the extinction ratio of the optical module is provided, so that the debugging time is greatly saved, the utilization rate of the oscilloscope is improved, the production cost of the optical module is effectively reduced, and the yield of the optical module in unit time is improved.
The technical scheme is as follows: a debugging method for optical power of an optical module comprises the following steps:
step 1: acquiring an initial resistance parameter setting value and a corresponding monitoring current value Bias1 in a manual optical power adjustment mode of an optical module, and adjusting a digital resistor once to obtain an adjusted resistance parameter setting value and a corresponding monitoring current value Bias 2; calculating a relation between the digital resistor APCsetDAC and the monitoring current Bias according to the following formula:
offset0＝APCset DAC_initial-slop0*Bias1 (2)
APC setDAC＝slop0*Bias+offset0 (3)
in the formula, APCset DAC _ initial represents an initial resistance parameter setting value, and APCset DAC _ adjust represents a difference value between the adjusted resistance parameter setting value and the initial resistance parameter setting value;
step 2: resistance parameter setting values corresponding to the minimum monitoring current value Bias _ target _ min and the maximum monitoring current value Bias _ target _ max are obtained through calculation according to the formula (3), and the digital resistance is adjusted according to the corresponding resistance parameter setting values to obtain a corresponding output average light power value TXPower; the relation between the resistance parameter setting value APCsetDAC and the average optical power TXPower of the digital resistor is calculated according to the following formula and is expressed as follows:
offset1＝TXpower'-slopI*APCset DAC' (5)
TXpower＝slop1*APCsetDAC+offset1 (6)
in the formula, TXpower 'represents an average optical power value obtained when Bias _ target _ max, TXpower "represents an average optical power value obtained when Bias _ target _ min, and APCsetDAC' and APCsetDAC" represent resistance parameter setting values corresponding to Bias _ target _ max and Bias _ target _ min, respectively;
obtaining a resistance parameter setting value required by a target average optical power value TX power _ target according to the formula (6);
and step 3: and (3) writing the resistance parameter setting value obtained by calculation in the step (2) into an APCsetDAC register to finish optical power adjustment.
Further, the step 2 further comprises:
calculating a monitoring current value Bias corresponding to the target average light power value TX power _ target according to the following formula;
TX power＝slop2*Bias+offset2 (7)
in the formula (I), the compound is shown in the specification,
offset2＝TXpower'-slope2*Bias_target_max (9)
TXpower 'represents the average optical power value obtained when Bias _ target _ max, TXpower "represents the average optical power value obtained when Bias _ target _ min, and APCsetDAC' and APCsetDAC" represent the resistance parameter setting values corresponding to Bias _ target _ max and Bias _ target _ min, respectively.
Further, the step 3 specifically operates as follows:
if the Bias is less than the Bias _ min, the Bias _ min is used for carrying out inverse calculation to obtain an APCset DAC value, and the APCset DAC value is written into an APCset DAC register;
if the Bias is larger than the Bias _ max, the APCset DAC value is obtained through inverse calculation of the Bias _ max, and the APCset DAC value is written into an APCset DAC register;
if the Bias is more than or equal to the Bias _ min and the Bias is less than or equal to the Bias _ max, writing APCset DAC corresponding to the TXPower _ target into an APCset DAC register;
and judging whether the current output optical power of the optical module is within the target optical power value specification, if so, recording the current MCU temperature and APCset DAC value, and otherwise, reporting errors.
The invention relates to a method for quickly debugging the optical power of an optical module, which has the principle that a relation between a direct current resistor APCsetDAC (amplitude modulation digital converter) and an output average optical power TXpower value is obtained by recording 2 times of direct current resistor APCsetDAC and calculating, a direct current resistor value corresponding to a target TXpower is obtained through the relation, and the direct current resistor value is written into a module to obtain a target optical power value;
the invention also discloses a debugging method of the extinction ratio of the optical module, which comprises the following steps:
step 1: the optical module works in a manual mode, and a power value P1 at an input low level and a power value P2 at an input high level are obtained through calculation according to the following formula;
ER_target＝10*log10(P2/P1) (10)
TXpower＝(P2+P1)/2 (11)
in the formula, ER _ target is a target extinction ratio, and TXpower is an average light power value output by a current light module;
step 2: respectively calculating corresponding Bias by substituting the power value P1 at the input low level and the power value P2 at the input high level which are obtained by the calculation in the step 1 into TX power in the formula (7)P1、BiasP2；
TXpower＝slop2*Bias+offset2 (7)
And step 3: and calculating to obtain an MOD _ set value corresponding to the ER _ target according to the following formula, and finishing the extinction ratio adjustment:
Imod＝ BiasP2- BiasP1(12)
Imod＝0.027*MOD_set (13)
in the formula, Imod represents an ac current value, and MOD _ set represents a resistance parameter set value corresponding to the ac current.
Further, the method also comprises the following steps:
and 4, step 4: acquiring the extinction ratio ER of the currently output optical module corresponding to the MOD _ set value obtained in the step (3), judging whether the extinction ratio ER of the currently output optical module enters an interval from ER _ min to ER _ max, and if so, writing the current MCU temperature and the MOD _ set value into a corresponding register to finish the debugging of the extinction ratio; if ER is less than ER _ min, switching to the step 5; if ER is larger than ER _ max, adjusting MOD _ set according to an iterative method, enabling ER to enter an interval between ER _ min and ER _ max, recording the current MCU temperature and the alternating current resistance MOD _ set value, and writing the MCU temperature and the MOD _ set value into a corresponding register to finish the debugging of the extinction ratio;
and 5: step-by-step increasing MOD _ set, judging whether the increased MOD _ set exceeds MOD _ set _ max, and if so, further judging whether the extinction ratio ER corresponding to the current MOD _ set enters an interval between ER _ min and ER _ max; if the interval is entered, recording the corresponding MCU temperature and MOD _ set value, and writing the MCU temperature and the MOD _ set value into corresponding registers to finish the debugging of the extinction ratio; if the interval is not entered, setting MOD _ set to 0, and proceeding to step 6; if the increased MOD _ set does not exceed the MOD _ set _ max, further judging whether the extinction ratio ER corresponding to the current MOD _ set enters an interval from ER _ min to ER _ max, if so, recording the corresponding MCU temperature and MOD _ set value, writing the MCU temperature and the MOD _ set value into a corresponding register, completing the debugging of the extinction ratio, and if not, circularly executing the step 5;
step 6; reducing the APCset DAC value obtained by optical power debugging of the optical module according to a step value, judging whether the optical power TX power corresponding to the reduced APCset DAC value is in a TX power _ min-TX power _ max interval, if so, setting MOD _ set to MOD _ set _ max, further judging whether the extinction ratio corresponding to MOD _ set _ max enters an ER _ min-ER _ max interval, if so, recording the current MCU temperature and MOD _ set value, and writing the MCU temperature and the MOD _ set value into corresponding registers to finish the debugging of the extinction ratio; if the interval between ER _ min and ER _ max is not entered, repeating the step 6; and if the TX power corresponding to the reduced APCset DAC value is not within the interval from TX power _ min to TXPower _ max, error reporting is carried out, and debugging is finished.
The invention discloses a debugging method of extinction ratio of an optical module, which is characterized in that according to the power value P2 input under all 1, the power value P1 input under all 0 and the relation between input transmitting end average light power TXPower and P1 and P2, the Bias value corresponding to P1 and P2 is solved through the relation between power and Bias, finally, the alternating current resistance MOD _ set value required by a target ER is calculated through the relation between direct current Bias and alternating current MOD, and the MOD _ set value is written into a module, so that the target ER value can be obtained.
Has the advantages that: by adopting the debugging method, the optical power of the module can be adjusted to the required specification range only by 3 steps, the extinction ratio can be adjusted to the range only by 1 step, the great use of oscilloscopes in the traditional debugging process is liberated, the time and labor cost spent in the batch production process are reduced, and the effective improvement of the yield in unit time is realized.
Drawings
Fig. 1 is a flowchart of debugging an optical module in the present invention.
Detailed Description
The technical solution of the present invention will be further explained with reference to the accompanying drawings and examples.
Example 1:
this embodiment provides an optical power debugging method for an optical module, where APCset refers to optical power adjustment, Txfault is a determination bit for determining whether a sending end is working, APCset DAC _ initial refers to an initial value of a resistance parameter setting, APCset DAC _ adjust refers to an adjustment value of the resistance parameter, Bias _ target _ min and Bias _ target _ max refer to upper and lower limits of a target monitoring current value, and a specific debugging process is as follows:
step 1: entering APCset manual mode;
step 2: detecting whether TX fault appears, if yes, clearing the fault, then rechecking, if not, clearing the fail, otherwise, debugging;
and step 3: pre-conditioning: the resistance parameter setting value is equal to the initial value APCset DAC _ initial, the monitoring current value is recorded as Bias1, the digital resistance is adjusted to make the resistance parameter setting value equal to the initial value APCset DAC _ initial + APCset DAC _ adjust, and the monitoring current value Bias2 is recorded at the moment. According to the above two recorded values, the parameters slop0 and offset0 are obtained by substituting the following equations:
offSet0＝APCset DAC_initial-slop0*Bias1 (2)
APC setDAC＝slop0*Bias+offset0 (3)
and 4, step 4: linear region fitting: resistance parameter setting values respectively corresponding to the Bias _ target _ min and the Bias _ target _ max are obtained through calculation, the resistance parameter setting values are respectively written into APCset DAC registers, and the average optical power TX power and APCset are respectively recorded
offset1＝TXpower'-slop1*APCset DAC' (5)
TXpower＝slop1*APCset DAC+offset1 (6)
offset2＝TXpower'-slope2*Bias_target_max (9)
TX power＝slop2*Bias+offset2 (7)
In the formula, TXpower 'represents an average optical power value obtained when Bias _ target _ max, TXpower "represents an average optical power value obtained when Bias _ target _ min, and APCsetDAC' and APCsetDAC" represent resistance parameter setting values corresponding to Bias _ target _ max and Bias _ target _ min, respectively;
calculating by adopting an equation (6) to obtain a resistance parameter setting value and a Bias corresponding to the target average optical power TX power _ target, and judging:
if the Bias is less than the Bias _ min, the resistance parameter setting value is calculated reversely by the Bias _ min and is written into an APCset DAC register;
if the Bias is larger than the Bias _ max, the Bias _ max is used for calculating the resistance parameter setting value in a reverse mode, and the resistance parameter setting value is written into an APCset DAC register;
and if the Bias is more than or equal to the Bias _ min and the Bias is less than or equal to the Bias _ max, writing a resistance parameter setting value corresponding to the target optical power TX power _ target.
Actually measuring the optical power and judging: and judging whether the average optical power value output by the current optical module is within a target optical power value specification (TX power _ min-TX power _ max), if not, reporting fail, and if so, recording the current MCU temperature and APCset DAC value.
Example 2:
when the optical module is at a low temperature of-40 ℃, after the target optical power in a normal temperature state is achieved by adopting the step of embodiment 1, recording the current temperature of the MCU and the resistance parameter setting value APCset DAC, calculating the resistance parameter setting value APCset DAC corresponding to-40 ℃ based on the resistance parameter setting value obtained by normal temperature debugging, and writing the resistance parameter setting value APCset DAC into the LUT;
fitting a curve of the APCset DAC with the temperature of 40 ℃ below zero and the APCset DAC value at the normal temperature, and writing the corresponding value into the low temperature of the APCLUT register.
Example 3:
when the optical module is at a high temperature of 85 ℃, after the target optical power in a normal temperature state is debugged by adopting the steps of embodiment 1, the current MCU temperature and the resistance parameter setting value APCset DAC are recorded. And calculating the ADC value of the high-temperature test temperature +5 ℃ from the point obtained by normal-temperature debugging, writing the ADC value into the LUT, and continuing the value of the high-temperature test temperature +5 ℃ when the ADC value exceeds the high-temperature test temperature +5 ℃.
Fitting a curve of the APCset DAC with the temperature of 85 ℃ and the APCset DAC value of the normal temperature, and writing the corresponding value into the normal-temperature to high-temperature section of the APCLUT register.
Example 4:
in the method for debugging the extinction ratio of the optical module in this embodiment, TX Power is an average optical Power value, P2 is a Power value when the input is a high level, and P1 is a Power value when the input is a low level, and the debugging process is as follows:
step 1: the optical module works in a manual mode;
step 2: and measuring an average light power TX power value and a target extinction ratio ER _ target required to be debugged. P2 and P1 were calculated using the following formulas:
ER_target＝10*log10(P2/P1) (10)
TX power＝(P2+P1)/2 (11)
according to the P1 and P2 values, the relation between the TX power and the Bias in the embodiment 1 is utilized, the relation is as follows, P1 and P2 are substituted into the TXPower in the following formula to respectively calculate the corresponding BiasP1、BiasP2；
TX power＝slop2*Bias+offset2 (7)
And then the MOD _ set value corresponding to the ER _ target is calculated by using the following formula:
Imod＝BiasP2-BiasP1(12)
Imod＝0.027*MOD_set (13)
in the formula, Imod represents an ac current value, and MOD _ set represents a resistance parameter set value corresponding to the ac current.
And step 3: acquiring the extinction ratio ER of the currently output optical module corresponding to the MOD _ set value obtained in the step 2, judging whether the extinction ratio ER of the currently output optical module enters an interval from ER _ min to ER _ max, and if so, writing the current MCU temperature and the MOD _ set value into a corresponding register to finish the debugging of the extinction ratio; if ER is less than ER _ min, switching to the step 5; if ER is larger than ER _ max, adjusting MOD _ set according to an iterative method, enabling ER to enter an interval between ER _ min and ER _ max, recording the current MCU temperature and the alternating current resistance MOD _ set value, and writing the MCU temperature and the MOD _ set value into a corresponding register to finish the debugging of the extinction ratio;
and 4, step 4: step-by-step increasing MOD _ set, judging whether the increased MOD _ set exceeds MOD _ set _ max, and if so, further judging whether the extinction ratio ER corresponding to the current MOD _ set enters an interval between ER _ min and ER _ max; if the interval is entered, recording the corresponding MCU temperature and MOD _ set value, and writing the MCU temperature and the MOD _ set value into corresponding registers to finish the debugging of the extinction ratio; if the interval is not entered, setting MOD _ set to 0, and proceeding to step 5; if the increased MOD _ set does not exceed the MOD _ set _ max, further judging whether the extinction ratio ER corresponding to the current MOD _ set enters an interval from ER _ min to ER _ max, if so, recording the corresponding MCU temperature and MOD _ set value, writing the MCU temperature and the MOD _ set value into a corresponding register, completing the debugging of the extinction ratio, and if not, circularly executing the step 4;
step 5; reducing the APCset DAC value obtained by optical power debugging of the optical module according to a step value, judging whether the optical power TX power corresponding to the reduced APCset DAC value is in a TX power _ min-TX power _ max interval, if so, setting MOD _ set to MOD _ set _ max, further judging whether the extinction ratio corresponding to MOD _ set _ max enters an ER _ min-ER _ max interval, if so, recording the current MCU temperature and MOD _ set value, and writing the MCU temperature and the MOD _ set value into corresponding registers to finish the debugging of the extinction ratio; if the interval between ER _ min and ER _ max is not entered, repeating the step 5; and if the TX power corresponding to the reduced APCset DAC value is not within the interval from TX power _ min to TXPower _ max, error reporting is carried out, and debugging is finished.
Claims (5)
1. A method for debugging optical power of an optical module is characterized in that: the method comprises the following steps:
step 1: acquiring an initial resistance parameter setting value and a corresponding monitoring current value Bias1 in a manual optical power adjustment mode of an optical module, and adjusting a digital resistor once to obtain an adjusted resistance parameter setting value and a corresponding monitoring current value Bias 2; calculating a relation between the digital resistor APCsetDAC and the monitoring current Bias according to the following formula:
offset0＝APCset DAC_initial-slop0*Biasl (2)
APC setDAC＝slop0*Bias+offset0 (3)
in the formula, APCset DAC _ initial represents an initial resistance parameter setting value, and APCset DAC _ adjust represents a difference value between the adjusted resistance parameter setting value and the initial resistance parameter setting value;
step 2: resistance parameter setting values corresponding to the minimum monitoring current value Bias _ target _ min and the maximum monitoring current value Bias _ target _ max are obtained through calculation according to the formula (3), and the digital resistance is adjusted according to the corresponding resistance parameter setting values to obtain a corresponding output average light power value TXPower; the relation between the resistance parameter setting value APCsetDAC and the average optical power TXPower of the digital resistor is calculated according to the following formula and is expressed as follows:
offset1＝TXpower’-slop1*APCset DAC’ (5)
TXpower＝slop1*APCsetDAC+offset1 (6)
in the formula, TXpower 'represents an average optical power value obtained when Bias _ target _ max, TXpower "represents an average optical power value obtained when Bias _ target _ min, and APCsetDAC' and APCsetDAC" represent resistance parameter setting values corresponding to Bias _ target _ max and Bias _ target _ min, respectively;
obtaining a resistance parameter setting value required by a target average optical power value TX power _ target according to the formula (6);
and step 3: and (3) writing the resistance parameter setting value obtained by calculation in the step (2) into an APCsetDAC register to finish optical power adjustment.
2. The method for adjusting optical power of an optical module according to claim 1, wherein: the step 2 further comprises:
calculating a monitoring current value Bias corresponding to the target average light power value TX power _ target according to the following formula;
TX power＝slop2*Bias+offset2 (7)
in the formula (I), the compound is shown in the specification,
offset2＝TXpower’-slope2*Bias_target_max (9)
TXpower 'represents the average optical power value obtained when Bias _ target _ max, TXpower "represents the average optical power value obtained when Bias _ target _ min, and APCsetDAC' and APCsetDAC" represent the resistance parameter setting values corresponding to Bias _ target _ max and Bias _ target _ min, respectively.
3. The method for adjusting optical power of an optical module according to claim 2, wherein: the step 3 specifically operates as follows:
if the Bias is less than the Bias _ min, the Bias _ min is used for carrying out inverse calculation to obtain an APCset DAC value, and the APCset DAC value is written into an APCset DAC register;
if the Bias is larger than the Bias _ max, the APCset DAC value is obtained through inverse calculation of the Bias _ max, and the APCset DAC value is written into an APCset DAC register;
if the Bias is more than or equal to the Bias _ min and the Bias is less than or equal to the Bias _ max, writing APCset DAC corresponding to the TXPower _ target into an APCset DAC register;
and judging whether the current output optical power of the optical module is within the target optical power value specification, if so, recording the current MCU temperature and APCset DAC value, and otherwise, reporting errors.
4. A method for debugging the extinction ratio of an optical module is characterized by comprising the following steps: the method comprises the following steps:
step 1: the optical module works in a manual mode, and a power value P1 at an input low level and a power value P2 at an input high level are obtained through calculation according to the following formula;
ER_target＝10*log10(P2/P1) (10)
TXpower＝(P2+P1)/2 (11)
in the formula, ER _ target is a target extinction ratio, and TXpower is an average light power value obtained by actual measurement of a current light module;
step 2: respectively calculating corresponding Bias by substituting the power value P1 at the input low level and the power value P2 at the input high level which are obtained by the calculation in the step 1 into TX power in the formula (7)P1、BiasP2；
TXpower＝slop2*Bias+offset2 (7)
And step 3: and calculating to obtain an MOD _ set value corresponding to the ER _ target according to the following formula, and finishing the extinction ratio adjustment:
Imod＝BiasP2-BiasP1(12)
Imod＝0.027*MOD_set (13)
in the formula, Imod represents an ac current value, and MOD _ set represents a resistance parameter set value corresponding to the ac current.
5. The method for adjusting the extinction ratio of an optical module according to claim 4, wherein: further comprising:
and 4, step 4: acquiring the extinction ratio ER of the currently output optical module corresponding to the MOD _ set value obtained in the step (3), judging whether the extinction ratio ER of the currently output optical module enters an interval from ER _ min to ER _ max, and if so, writing the current MCU temperature and the MOD _ set value into a corresponding register to finish the debugging of the extinction ratio; if ER is less than ER _ min, switching to the step 5; if ER is larger than ER _ max, adjusting MOD _ set according to an iterative method, enabling ER to enter an interval between ER _ min and ER _ max, recording the current MCU temperature and the alternating current resistance MOD _ set value, and writing the MCU temperature and the MOD _ set value into a corresponding register to finish the debugging of the extinction ratio;
and 5: step-by-step increasing MOD _ set, judging whether the increased MOD _ set exceeds MOD _ set _ max, and if so, further judging whether the extinction ratio ER corresponding to the current MOD _ set enters an interval between ER _ min and ER _ max; if the interval is entered, recording the corresponding MCU temperature and MOD _ set value, and writing the MCU temperature and the MOD _ set value into corresponding registers to finish the debugging of the extinction ratio; if the interval is not entered, setting MOD _ set to 0, and proceeding to step 6; if the increased MOD _ set does not exceed the MOD _ set _ max, further judging whether the extinction ratio ER corresponding to the current MOD _ set enters an interval from ER _ min to ER _ max, if so, recording the corresponding MCU temperature and MOD _ set value, writing the MCU temperature and the MOD _ set value into a corresponding register, completing the debugging of the extinction ratio, and if not, circularly executing the step 5;
step 6; reducing the APCset DAC value obtained by optical power debugging of the optical module according to a step value, judging whether the optical power TX power corresponding to the reduced APCset DAC value is in a TX power _ min-TX power _ max interval, if so, setting MOD _ set to MOD _ set _ max, further judging whether the extinction ratio corresponding to MOD _ set _ max enters an ER _ min-ER _ max interval, if so, recording the current MCU temperature and MOD _ set value, and writing the MCU temperature and the MOD _ set value into corresponding registers to finish the debugging of the extinction ratio; if the interval between ER _ min and ER _ max is not entered, repeating the step 6; and if the TX power corresponding to the reduced APCset DAC value is not within the interval from TX power _ min to TXPower _ max, error reporting is carried out, and debugging is finished.
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| CN114216658A (en) * | 2021-12-15 | 2022-03-22 | 无锡市德科立光电子技术股份有限公司 | Optical module extinction ratio debugging method based on calculation |
| CN114244429A (en) * | 2021-11-17 | 2022-03-25 | 武汉兴思为光电科技有限公司 | Optical module debugging method and system and electronic equipment |
| CN115913345A (en) * | 2022-11-21 | 2023-04-04 | 四川天邑康和通信股份有限公司 | Method for debugging optical power and extinction ratio of DFB laser based on PON |
| CN117129730A (en) * | 2023-10-23 | 2023-11-28 | 福弼通科技有限公司 | Imaging system for sampling oscilloscope |
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| CN115913345A (en) * | 2022-11-21 | 2023-04-04 | 四川天邑康和通信股份有限公司 | Method for debugging optical power and extinction ratio of DFB laser based on PON |
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