CN111537820A - Device for realizing double-hole automatic test of product pin signal by using NI board card - Google Patents
Device for realizing double-hole automatic test of product pin signal by using NI board card Download PDFInfo
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- CN111537820A CN111537820A CN202010404345.9A CN202010404345A CN111537820A CN 111537820 A CN111537820 A CN 111537820A CN 202010404345 A CN202010404345 A CN 202010404345A CN 111537820 A CN111537820 A CN 111537820A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
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Abstract
The invention provides a device for realizing double-hole automatic test of product pin signals by using an NI board card, which comprises: the device comprises a product connector counter-hand piece, a double-hole clamp part (1), a double-hole clamp switching connector, an instrument control loop part (2) and an upper computer control part (3); the double-hole clamp component (1) is connected with the instrument control loop component (2); the instrument control loop component (2) is connected with the upper computer control component (3); the double-cavity clamp component (1) comprises: a dual-cavity clamp member; the double-cavity clamp component (1) comprises: a dual-cavity clamp member, a tested product connector; the product connector counter-hand piece is connected with the tested product connector; the tested product connector is connected with a double-cavity clamp adapter connector; the double-cavity clamp adapter connector is connected with the instrument control loop component (2). The invention greatly reduces the beat of the test time by adopting a structure of simultaneously testing two holes.
Description
Technical Field
The invention relates to the technical field of automatic testing, in particular to a device for realizing double-hole automatic testing of a product pin signal by utilizing an NI board card.
Background
With the rapid change of automation technology, a device for automatically testing a pin signal of a product by using a NI board card is urgently needed in the prior art.
Patent document CN110087177A discloses a Mic Flex acoustic production line automatic test system, which includes: the box and set up in the inside test system of box, the box side is equipped with feed inlet and discharge gate, test system includes: the automatic feeding and discharging device comprises a rack, a feeding and discharging mechanism arranged on the right side of the rack, a manipulator arranged in the center of the rack, a film sticking machine arranged on the rack, and an FR testing machine and an SL testing machine arranged on the left side of the rack, wherein the feeding and discharging mechanism comprises a feeding machine and a discharging machine, a plurality of material trays are arranged in the feeding machine and the discharging machine, and the feeding machine and the discharging machine are respectively corresponding to a feeding port and a discharging port. The invention realizes the automatic performance test of the microphone flexible piece, reduces the labor intensity and improves the test efficiency. Meanwhile, defective products with different problems can be classified in the detection process, and statistics and subsequent processing of the defective products are facilitated. The patent does not well realize the pin signal of the dual-cavity automatic test product.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a device for automatically testing a product pin signal by using an NI board card.
The device for realizing the automatic double-hole product pin signal test by using the NI board card provided by the invention comprises: the product connector comprises a hand piece, a double-hole clamp part 1, a double-hole clamp switching connector, an instrument control loop part 2 and an upper computer control part 3; the double-hole clamp component 1 is connected with an instrument control loop component 2; the instrument control loop component 2 is connected with the upper computer control component 3; the double-hole jig member 1 includes: a dual-cavity clamp member; the double-hole jig member 1 includes: a dual-cavity clamp member, a tested product connector; the product connector counter-hand piece is connected with the tested product connector; the tested product connector is connected with a double-cavity clamp adapter connector; the dual-cavity clamp adaptor connector is connected to the instrument control circuit part 2. After the tested product is put into the clamp, the pressing structure can act and press downwards, so that the product connector on the clamp can be inserted into the product connector counter-element, and the connector can supply power to the product, communicate or input and output signals. The wiring harness on the connector is connected to a double-cavity clamp switching connector on the equipment, and the double-cavity clamp switching connector is connected with the instrument control loop component 2.
Preferably, the instrument control loop assembly 2 comprises: a product power supply; the product power supply is connected with the double-hole clamp adapter connector to supply the working voltage required by the product power-on process; the product power supply is connected with the upper computer control part 3, and the upper computer can control the on and off of the power supply in a program control mode.
Preferably, the instrument control loop assembly 2 comprises: a CAN communication box; the CAN communication box is connected with a double-hole clamp adapter connector; the CAN communication box is connected with the upper computer control component 3; therefore, the product is connected with the upper computer control component 3 during testing, and the upper computer and the product CAN be communicated by CAN command sending and receiving.
Preferably, the instrument control loop assembly 2 comprises: NI board card; the NI board card is connected with a double-hole clamp adapter connector; the method mainly tests waveform indexes such as voltage, frequency and duty ratio of a product pin; the NI board card is connected with the upper computer control component 3; so that the upper computer can obtain the test data of the NI 6259.
Preferably, the NI board card adopts an NI PCI-6259 model; supporting 32 AI analog inputs and 4 AO analog outputs.
Preferably, the instrument control loop assembly 2 comprises: DIO board card; the DIO board card is connected with a connector of the double-hole clamp, and is mainly used for collecting the states of various sensors in the clamp and simultaneously electrifying a clamp electromagnetic valve or switching a relay loop; the DIO board card is connected with the upper computer control part 3; the upper computer can acquire the state information of the sensor on the DIO and can also send an instruction to execute corresponding relay switching.
Preferably, the upper computer control part 3 includes: processor components such as computers, displays, software processing components, printers, and scanning guns; the processor section includes: an industrial personal computer and a PCI/PCI-E board card; for example, an NI6259 board is inserted into a PCI slot.
Preferably, the upper computer control part 3 includes: a software processing component; the software processing component adopts an automatic testing program platform written by NILabview.
Preferably, the upper computer control part 3 includes: a display; the display is coupled to the processor assembly.
Preferably, the upper computer control part 3 includes: a printer and a scanning gun; the printer is connected with the processor component; the scan gun is coupled to the processor assembly.
The printer is used for printing out test failure information or error information if a test fails after the test is finished. When a product is tested, the scanning gun scans the bar code of the tested product into the computer, so that bar code information can be stored into the test report when the test report is stored, and the test report of the tested product can be found through the bar code. The display interfaces of the two computers are displayed on a display through the split screen, and the printer parallel ports of the two computers pass through the 2 ports and the 1 port, and are finally combined on a printer.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention adopts the structure of simultaneously testing the two holes, so that the beat of the testing time is greatly reduced;
2. by adopting the NI PCI6259 board card, all signal indexes of all pins of the product to be tested can be tested in the same time, the testing time is reduced, and the tested values are sent to the upper computer and output to a test report;
3. according to the invention, by adopting the NI PCI6259 board card, when a product signal is tested, according to the product test requirement, for inputting special signals to certain pins of a product, the PCI6259 board card can be controlled by upper computer software to generate the required signals;
4. according to the invention, the Labview upper computer is connected with the plurality of test instruments to test the tested object, all test data can be obtained through testing and stored in the computer, and the problem of uniform test report data collection is solved;
5. the invention has reasonable structural layout and convenient use and overcomes the defects of the prior art.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
fig. 1 is a schematic view of the overall structure of the present invention.
In the figure:
double-hole clamp component 1 upper computer control component 3
Instrument control circuit part 2
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.
As shown in fig. 1, the apparatus for implementing dual-cavity automated testing of product pin signals by using an NI board according to the present invention includes: the product connector comprises a hand piece, a double-hole clamp part 1, a double-hole clamp switching connector, an instrument control loop part 2 and an upper computer control part 3; the double-hole clamp component 1 is connected with an instrument control loop component 2; the instrument control loop component 2 is connected with the upper computer control component 3; the double-hole jig member 1 includes: a dual-cavity clamp member; the double-hole jig member 1 includes: a dual-cavity clamp member, a tested product connector; the product connector counter-hand piece is connected with the tested product connector; the tested product connector is connected with a double-cavity clamp adapter connector; the dual-cavity clamp adaptor connector is connected to the instrument control circuit part 2. After the tested product is put into the clamp, the pressing structure can act and press downwards, so that the product connector on the clamp can be inserted into the product connector counter-element, and the connector can supply power to the product, communicate or input and output signals. The wiring harness on the connector is connected to a double-cavity clamp switching connector on the equipment, and the double-cavity clamp switching connector is connected with the instrument control loop component 2.
Preferably, the instrument control loop assembly 2 comprises: a product power supply; the product power supply is connected with the double-hole clamp adapter connector to supply the working voltage required by the product power-on process; the product power supply is connected with the upper computer control part 3, and the upper computer can control the on and off of the power supply in a program control mode.
Preferably, the instrument control loop assembly 2 comprises: a CAN communication box; the CAN communication box is connected with a double-hole clamp adapter connector; the CAN communication box is connected with the upper computer control component 3; therefore, the product is connected with the upper computer control component 3 during testing, and the upper computer and the product CAN be communicated by CAN command sending and receiving.
Preferably, the instrument control loop assembly 2 comprises: NI board card; the NI board card is connected with a double-hole clamp adapter connector; the method mainly tests waveform indexes such as voltage, frequency and duty ratio of a product pin; the NI board card is connected with the upper computer control component 3; so that the upper computer can obtain the test data of the NI 6259.
Preferably, the NI board card adopts an NI PCI-6259 model; supporting 32 AI analog inputs and 4 AO analog outputs.
Preferably, the instrument control loop assembly 2 comprises: DIO board card; the DIO board card is connected with a connector of the double-hole clamp, and is mainly used for collecting the states of various sensors in the clamp and simultaneously electrifying a clamp electromagnetic valve or switching a relay loop; the DIO board card is connected with the upper computer control part 3; the upper computer can acquire the state information of the sensor on the DIO and can also send an instruction to execute corresponding relay switching.
Preferably, the upper computer control part 3 includes: processor components such as computers, displays, software processing components, printers, and scanning guns; the processor section includes: an industrial personal computer and a PCI/PCI-E board card; for example, an NI6259 board is inserted into a PCI slot.
Preferably, the upper computer control part 3 includes: a software processing component; the software processing component adopts an automatic testing program platform written by NILabview.
Preferably, the upper computer control part 3 includes: a display; the display is coupled to the processor assembly.
Preferably, the upper computer control part 3 includes: a printer and a scanning gun;
the printer is connected with the processor component;
the scan gun is coupled to the processor assembly.
The printer is used for printing out test failure information or error information if a test fails after the test is finished. When a product is tested, the scanning gun scans the bar code of the tested product into the computer, so that bar code information can be stored into the test report when the test report is stored, and the test report of the tested product can be found through the bar code. The display interfaces of the two computers are displayed on a display through the split screen, and the printer parallel ports of the two computers pass through the 2 ports and the 1 port, and are finally combined on a printer.
Specifically, in one embodiment, an apparatus for implementing dual-cavity automated testing of product pin signals using an NI board includes: the device comprises a double-hole clamp, a measured object 1, an instrument control loop 2 and an upper computer control 3. Wherein: the double-hole clamp and the measured object 1 are connected with an instrument control loop 2, and the instrument control loop 2 is connected with an upper computer control 3.
Two cave anchor clamps and testee 1 include: two cave anchor clamps structures, inside mainly has: tested products and connectors of the tested products. After the product is put into and added, the pressing structure can act and press downwards, so that the product connector on the clamp can be inserted into the product connector counter-element, and the connector can supply power to the product, communicate or input and output signals. The wiring harness on the connector is connected to a switching connector on the equipment, and the switching connector is connected with the instrument control loop 2.
The instrument control circuit 2 includes: the device comprises a product power supply, a CAN communication box, an NI board card and a DIO board card. The product power supply is connected with the double-hole clamp adapter connector, the working voltage required when the product is electrified is supplied, meanwhile, the product power supply is also connected with the upper computer control 3, and the upper computer can program the on and off of the power supply. The CAN communication box is connected with the double-hole clamp adapter connector and also connected with the upper computer control 3, so that the product is connected with the upper computer control 3 during testing, and the upper computer and the product CAN realize communication through CAN instruction sending and receiving. The NI board card selects an NI PCI-6259 model, supports 32 paths of AI analog inputs and 4 paths of AO analog outputs, is connected with a double-hole clamp adapter connector, mainly tests waveform indexes such as voltage, frequency and duty ratio of product pins, and is also connected with an upper computer control 3, so that the upper computer can obtain test data of NI 6259. The DIO board card is connected with the connector of the double-hole clamp, the states of various sensors in the clamp are mainly collected and simultaneously electrified with the electromagnetic valve of the clamp or switched with the relay loop, the clamp is also connected with an upper computer control 3, and the upper computer can acquire the state information of the sensors on the DIO and also can send instructions to execute corresponding relay switching.
The upper computer control 3 includes: computer and display, computer software, printer and scanning gun. The computer is an industrial personal computer and NI6259 board cards are inserted into some PCI or PCI-E board cards, such as PCI slots. The computer software is an automatic test program platform written by adopting NI Labview. The printer is used for printing out test failure information or error information if a test fails after the test is finished. When a product is tested, the scanning gun scans the bar code of the tested product into the computer, so that bar code information can be stored into the test report when the test report is stored, and the test report of the tested product can be found through the bar code. The display interfaces of the two computers are displayed on a display through the split screen, and the printer parallel ports of the two computers pass through the 2 ports and the 1 port, and are finally combined on a printer.
Specifically, in one embodiment, in an application of the device for automatically testing the pin signals of the product through the NI board card, firstly, testing software on all instruments and computers is opened, and a testing program corresponding to the model of the product module is selected from the software to prepare for automatic testing; the method comprises the following steps that 1 measured object (hereinafter, the measured object is referred to as the measured object) of a product module is placed on a double-hole clamp, 1 measured object can be placed on the double-hole clamp, 2 measured objects can be placed on the double-hole clamp at the same time, and after the product is placed, an automatic scanning gun can automatically scan a bar code on the measured object; then two hands are needed to trigger two photoelectric switches on the testing device, and the pressing structure can act and press down; when the press is completed, the program enters the automatic testing link. The computer firstly controls the power supply of the product to electrify the tested object. The software of the upper computer CAN establish communication connection with the product through a CAN communication box in the instrument control loop 2, and CAN detect the software and hardware versions of the product and other internal information of the object to be detected; the CAN instruction is utilized to enable the product to enter a test mode or switch to a corresponding mode to test, at the moment, a pin signal of the product is transmitted to a PCI6259 board card, and the board card receives the waveform and then processes and transmits the waveform to upper computer software; if special signals are required to be input into certain pins of the product, the PCI6259 board card can be controlled by the upper computer software to generate required signals to the appointed pins of the product and test the result. And upper and lower limits are set in the upper computer test software to judge whether the test value of the product is in the range or not. If the tested object is tested to be qualified, the computer displays that the test is qualified, the pressing structure rises and resets, and the test report automatically exists in the computer at the moment so as to conveniently check the test data; if the test fails, the computer displays that the test fails, the printer automatically prints a test failure error bar, and meanwhile, a test report is also stored. And after the test is finished, allowing the tested object to be manually taken out to wait for the next test of the tested object.
The invention adopts the structure of simultaneously testing the two holes, so that the beat of the testing time is greatly reduced; by adopting the NI PCI6259 board card, all signal indexes of all pins of the product to be tested can be tested in the same time, the testing time is reduced, and the tested values are sent to the upper computer and output to a test report; according to the invention, by adopting the NIPCI6259 board card, when a product signal is tested, special signals can be input to certain pins of a product according to the product test requirements, and the PCI6259 board card can be controlled by upper computer software to generate the required signals; according to the invention, the Labview upper computer is connected with the plurality of test instruments to test the tested object, all test data can be obtained through testing and stored in the computer, and the problem of uniform test report data collection is solved; the invention has reasonable structural layout and convenient use and overcomes the defects of the prior art.
The invention adopts an NI board card and a double-hole automatic program to automatically and simultaneously test parameters such as voltage values, output waveforms or frequencies and the like of pins of two automobile electronic products, and the NI board card is sent to an upper computer and output to a test report after testing the numerical values.
In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present application and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.
The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.
Claims (10)
1. The utility model provides an utilize NI integrated circuit board to realize device of two cave automatic test product pin signals which characterized in that includes: the device comprises a product connector counter-hand piece, a double-cavity clamp part (1), a double-cavity clamp switching connector, an instrument control loop part (2) and an upper computer control part (3);
the double-hole clamp component (1) is connected with the instrument control loop component (2);
the instrument control loop component (2) is connected with the upper computer control component (3);
the double-cavity clamp component (1) comprises: a dual-cavity clamp member;
the double-cavity clamp component (1) comprises: a dual-cavity clamp member, a tested product connector;
the product connector counter-hand piece is connected with the tested product connector;
the tested product connector is connected with a double-cavity clamp adapter connector;
the double-cavity clamp adapter connector is connected with the instrument control loop component (2).
2. The apparatus for implementing dual-cavity automated test product pin signals using NI board card according to claim 1, wherein the instrument control loop unit (2) comprises: a product power supply;
the product power supply is connected with a double-cavity clamp adapter connector;
the product power supply is connected with the upper computer control component (3).
3. The apparatus for implementing dual-cavity automated test product pin signals using NI board card according to claim 1, wherein the instrument control loop unit (2) comprises: a CAN communication box, an NI board card and a DIO board card;
the CAN communication box is connected with a double-hole clamp adapter connector;
the CAN communication box is connected with an upper computer control component (3).
4. The apparatus for implementing dual-cavity automated test product pin signals using NI board card according to claim 1, wherein the instrument control loop unit (2) comprises: NI board card;
the NI board card is connected with a double-hole clamp adapter connector;
the NI board card is connected with the upper computer control component (3).
5. The apparatus of claim 4 for implementing dual-cavity automated test of product pin signals using an NI board, wherein the NI board is NI PCI-6259.
6. The apparatus for implementing dual-cavity automated test product pin signals using NI board card according to claim 1, wherein the instrument control loop unit (2) comprises: DIO board card;
the DIO board card is connected with a connector of the double-hole clamp;
and the DIO board card is connected with an upper computer control part (3).
7. The apparatus for implementing dual-cavity automated product pin signal testing by using NI board card according to claim 1, wherein the upper computer control unit (3) comprises: a processor component;
the processor section includes: industrial personal computer, PCI/PCI-E board card.
8. The apparatus for implementing dual-cavity automated product pin signal testing by using NI board card according to claim 1, wherein the upper computer control unit (3) comprises: a software processing component;
the software processing component adopts an automatic testing program platform written by NI Labview.
9. The apparatus for implementing dual-cavity automated product pin signal testing by using NI board card according to claim 7, wherein the upper computer control unit (3) comprises: a display;
the display is coupled to the processor assembly.
10. The apparatus for implementing dual-cavity automated product pin signal testing by using NI board card according to claim 7, wherein the upper computer control unit (3) comprises: printers, scanning guns;
the printer is connected with the processor component;
the scan gun is coupled to the processor assembly.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010404345.9A CN111537820A (en) | 2020-05-13 | 2020-05-13 | Device for realizing double-hole automatic test of product pin signal by using NI board card |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010404345.9A CN111537820A (en) | 2020-05-13 | 2020-05-13 | Device for realizing double-hole automatic test of product pin signal by using NI board card |
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| CN202010404345.9A Pending CN111537820A (en) | 2020-05-13 | 2020-05-13 | Device for realizing double-hole automatic test of product pin signal by using NI board card |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848864A (en) * | 2021-10-22 | 2021-12-28 | 延锋伟世通汽车电子有限公司 | Automatic test equipment of vehicle-mounted domain controller module |
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| CN104931819A (en) * | 2015-06-02 | 2015-09-23 | 立讯精密工业股份有限公司 | High-frequency automatic test system and method |
| CN205864745U (en) * | 2016-07-25 | 2017-01-04 | 延锋伟世通（重庆）汽车电子有限公司 | Asynchronous pair of cave automobile audio Auto-Test System |
| CN110275511A (en) * | 2019-06-25 | 2019-09-24 | 中国第一汽车股份有限公司 | Automatic test equipment suitable for power motor controller hardware |
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- 2020-05-13 CN CN202010404345.9A patent/CN111537820A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201788271U (en) * | 2010-09-21 | 2011-04-06 | 天津渤海易安泰电子半导体测试有限公司 | Double-station finished battery testing system |
| CN104931819A (en) * | 2015-06-02 | 2015-09-23 | 立讯精密工业股份有限公司 | High-frequency automatic test system and method |
| CN205864745U (en) * | 2016-07-25 | 2017-01-04 | 延锋伟世通（重庆）汽车电子有限公司 | Asynchronous pair of cave automobile audio Auto-Test System |
| CN110275511A (en) * | 2019-06-25 | 2019-09-24 | 中国第一汽车股份有限公司 | Automatic test equipment suitable for power motor controller hardware |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113848864A (en) * | 2021-10-22 | 2021-12-28 | 延锋伟世通汽车电子有限公司 | Automatic test equipment of vehicle-mounted domain controller module |
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Application publication date: 20200814 |
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