CN111508801B - Method and system for adjusting electron current of cyclotron oscillation tube - Google Patents

Method and system for adjusting electron current of cyclotron oscillation tube Download PDF

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Publication number
CN111508801B
CN111508801B CN202010318007.3A CN202010318007A CN111508801B CN 111508801 B CN111508801 B CN 111508801B CN 202010318007 A CN202010318007 A CN 202010318007A CN 111508801 B CN111508801 B CN 111508801B
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Prior art keywords
tube
model
cyclotron oscillation
light spot
electron
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CN202010318007.3A
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CN111508801A (en
Inventor
赵艳珩
沈旭东
王芮
袁璟春
王冰冰
侯信磊
朱荣帅
刘鲁伟
王鹏康
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Anhui East China Institute of Optoelectronic Technology
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Anhui East China Institute of Optoelectronic Technology
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/44Factory adjustment of completed discharge tubes or lamps to comply with desired tolerances
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00Energy generation of nuclear origin
    • Y02E30/10Nuclear fusion reactors

Abstract

The embodiment of the invention provides a method and a system for adjusting electron current of a cyclotron oscillation tube, wherein the method comprises the following steps: manufacturing a model tube with the same technical parameters as the to-be-tested cyclotron oscillation tube; coating fluorescent powder on the inner wall of the electron collector on the model tube; placing the model pipe into a magnetic system for testing, and adjusting the position of the model pipe according to the observed light spot condition so as to achieve the state that the light spots are uniformly distributed; and keeping the state of the magnetic system unchanged, and replacing the model tube with the to-be-tested cyclotron oscillation tube for testing. The method solves the problem that in the prior art, the current of the electron collector cannot be adjusted by monitoring the current of the electron collector in the traditional microwave tube test because the electron collector and the resonant cavity are at the same potential.

Description

Method and system for adjusting electron current of cyclotron oscillation tube
Technical Field
The invention relates to the field of vacuum electronic devices, in particular to a method and a system for adjusting electron current of a cyclotron oscillation tube.
Background
In the field of vacuum electronics, the operating frequency of conventional microwave tubes determines the size of their high-frequency systems, and therefore, as conventional microwave tubes are developed at higher frequencies, the size must be made smaller and smaller. The size becomes smaller, which greatly limits the power capacity of the microwave tube. The gyrotron is a novel electric vacuum device based on the free electron stimulated radiation principle, and the high-frequency structure of the gyrotron is not limited by frequency due to different working principles, so that the gyrotron has wide prospects in high-power microwave application fields such as millimeter wave radars, electronic warfare, high-power microwave weapons, controlled thermonuclear fusion and the like.
However, in the prior art, since the electron collector and the resonant cavity are at the same potential, the electron current rate cannot be adjusted by monitoring the current of the electron collector as in the conventional microwave tube test.
Therefore, it is an urgent need to provide a method and system for adjusting electron current flow of a cyclotron oscillation tube, which can effectively solve the above technical problems during the use process.
Disclosure of Invention
In view of the above technical problems, an object of the present invention is to overcome the problem that the electron circulation rate cannot be adjusted by monitoring the current of the electron collector in the conventional microwave tube test due to the co-potential of the electron collector and the resonant cavity in the prior art, so as to provide a method and a system for adjusting the electron circulation of a cyclotron oscillation tube, which can effectively solve the above technical problems in the using process.
In order to achieve the above object, an embodiment of the present invention provides a method for adjusting electron current of a cyclotron oscillation tube, where the method includes:
manufacturing a model tube with the same technical parameters as the to-be-tested cyclotron oscillation tube;
coating fluorescent powder on the inner wall of the electron collector on the model tube;
placing the model pipe into a magnetic system for testing, and adjusting the position of the model pipe according to the observed light spot condition so as to achieve the state that the light spots are uniformly distributed;
and keeping the state of the magnetic system unchanged, and replacing the model pipe with the to-be-tested cyclotron oscillation pipe for testing.
Preferably, before the inner wall of the electron collector on the mold tube is coated with the phosphor, the method further comprises:
and processing scale marks on the inner wall of the electron collector on the model tube.
Preferably, the graduation marks are ring-shaped.
Preferably, the light spot is viewed by a camera from the direction of the energy delivery window of the gyrotron tube.
The invention also provides an electronic circulation adjusting system of the gyrotron oscillation tube, which comprises:
the technical parameters of the model tube are the same as those of the cyclotron oscillation tube to be tested, and fluorescent powder is coated on the inner wall of the electronic collector on the model tube and used for debugging a magnetic system;
the light spot acquisition module is used for acquiring light spot information generated by the model tube which is put into the magnetic system for testing;
an adjustment module for adjusting the position of the mold tube in the magnetic system;
and the indicating module is used for indicating the debugging completion information of the magnetic system under the condition that the light spot information reaches the uniform distribution state.
Preferably, the inner wall of the electron collector of the mold tube is processed with graduation lines.
Preferably, the graduation marks are ring-shaped.
Preferably, the light spot obtaining module is a camera, and the camera obtains the light spot information from the direction of the energy transmission window of the cyclotron oscillation tube.
Through the technical scheme, the electronic circulation adjusting method of the cyclotron oscillation tube has the beneficial effects that when the method is used, the method has the following steps: and testing the model pipe, wherein the electron beam is injected to the fluorescent powder to show a luminous effect, a light spot is observed by observing from the direction of the energy transmission window through a camera, the position of the model pipe in the magnet is adjusted through the connecting flange and the adjusting system while observing the shape of the light spot until the light spot is in a uniform shape, the state of the adjusting system is kept unchanged after the magnetic system is adjusted, and the model pipe is replaced by the to-be-tested cyclotron oscillation pipe. The method has the advantages that the electronic circulation adjusting mode is simple, convenient and visual, only one-time debugging is needed to be carried out on the magnetic system in the same tube type, and the debugging is more accurate and convenient. The problem that in the prior art, as the electron collector and the resonant cavity are at the same potential, the current of the electron collector cannot be monitored to adjust the electron flow rate in the traditional microwave tube test is solved.
Additional features and advantages of embodiments of the invention will be set forth in the detailed description which follows.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the embodiments of the invention and not to limit the embodiments of the invention. In the drawings:
FIG. 1 is a flow chart of a method for tuning the electronic flow through a cyclotron oscillation tube provided in a preferred embodiment of the present invention;
FIG. 2 is a schematic view of a cyclotron oscillation tube structure provided in a preferred embodiment of the present invention; and
fig. 3 is a schematic structural diagram of an electronic circulation adjustment system of a cyclotron oscillation tube provided in a preferred embodiment of the present invention.
Description of the reference numerals
1 cathode and 2 anode
3 electron beam 4 resonant cavity
5 electronic collector 6 superconducting magnetic field
7 energy transmission window 8 model pipe
9 light spot acquisition module 10 adjusting module
11 indicating module
Detailed Description
The following detailed description of embodiments of the invention refers to the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating embodiments of the invention, are given by way of illustration and explanation only, not limitation.
Method embodiment
As shown in fig. 1, the present invention provides a method for adjusting electron flux of a cyclotron oscillation tube, comprising:
manufacturing a model tube with the same technical parameters as the to-be-tested cyclotron oscillation tube;
coating fluorescent powder on the inner wall of the electron collector on the model tube;
placing the model pipe into a magnetic system for testing, and adjusting the position of the model pipe according to the observed light spot condition to achieve the state that the light spots are uniformly distributed;
and keeping the state of the magnetic system unchanged, and replacing the model tube with the to-be-tested cyclotron oscillation tube for testing.
In the technical scheme, the model tube is tested, the electron beam is emitted to the fluorescent powder to show a luminous effect, a light spot is observed when the electron beam is observed from the direction of the energy transmission window through the camera, the position of the model tube in the magnet is adjusted through the connecting flange and the adjusting system while the shape of the light spot is observed until the light spot is in a uniform shape, the state of the adjusting system is kept unchanged after the adjustment of the magnetic system is finished, and the model tube is replaced by the rotary oscillation tube to be tested. The method has the advantages that the electronic circulation adjusting mode is simple, convenient and visual, only one-time debugging is needed to be carried out on the magnetic system in the same tube type, and the debugging is more accurate and convenient.
In a preferred embodiment of the present invention, before the inner wall of the electron collector on the mold tube is coated with the phosphor, the method further comprises: and machining a scale mark on the inner wall of the electron collector on the model tube, wherein the scale mark is preferably in a ring shape.
In the above scheme, the scale mark of annular shape is convenient for the staff to observe the facula information to whether observe the facula and reached evenly distributed's requirement.
In a preferred embodiment of the invention, the light spot is viewed by a camera from the direction of the energy transmission window of the cyclotron oscillation tube.
As shown in fig. 2, which is a schematic diagram of a cyclotron oscillation tube structure, electrons are emitted from a cathode 1, under the action of an anode 2, an electron beam 3 is formed through compression of a superconducting magnetic field 6, a signal with a specific frequency is excited through a resonant cavity 4, the excited signal is amplified and transmitted through an energy transmission window 7, and the electron beam 3 after the action finally hits an electron collector 5.
Device embodiment
As shown in fig. 3, the present invention provides an electronic circulation adjusting system for a cyclotron oscillation tube, which comprises:
the technical parameters of the model tube 8 are the same as those of the cyclotron oscillation tube to be tested, and fluorescent powder is coated on the inner wall of the electronic collector on the model tube for debugging work of a magnetic system;
the light spot obtaining module 9 is used for obtaining light spot information generated by the model tube which is put into the magnetic system for testing;
an adjustment module 10 for adjusting the position of the mould tube in the magnetic system;
and the indicating module 11 is configured to indicate the magnetic system debugging completion information when the light spot information reaches the uniform distribution state.
In a preferred embodiment of the present invention, the inner wall of the electron collector of the mold tube is processed with graduation marks.
In a preferred embodiment of the invention, the graduation marks are in the shape of a ring.
In a preferred embodiment of the present invention, the light spot obtaining module is a camera, and the camera obtains the light spot information from the direction of the energy transmission window of the cyclotron oscillation tube.
In summary, the method and system for adjusting electron circulation of a cyclotron oscillation tube provided by the invention overcome the problem that the electron current circulation rate cannot be adjusted by monitoring the current of an electron collector in the traditional microwave tube test because the electron collector and a resonant cavity are at the same potential in the prior art.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a," "8230," "8230," or "comprising" does not exclude the presence of additional identical elements in the process, method, article, or apparatus comprising the element.
The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement or the like made within the spirit and principle of the present application shall be included in the scope of the claims of the present application.

Claims (8)

1. A method for adjusting electron current of a cyclotron oscillation tube, the method comprising:
manufacturing a model tube with the same technical parameters as the cyclotron oscillation tube to be detected;
coating fluorescent powder on the inner wall of the electron collector on the model tube;
placing the model pipe into a magnetic system for testing, and adjusting the position of the model pipe according to the observed light spot condition so as to achieve the state that the light spots are uniformly distributed;
and keeping the state of the magnetic system unchanged, and replacing the model tube with the to-be-tested cyclotron oscillation tube for testing.
2. The method of claim 1, wherein the method further comprises, before coating the inner wall of the electron collector on the mold tube with phosphor:
and processing scale marks on the inner wall of the electron collector on the model tube.
3. The method of claim 2, wherein the graduation marks are in the shape of a ring.
4. The method of claim 1, wherein the light spot is viewed by a camera from the direction of an energy delivery window of the cyclotron oscillation tube.
5. An electronic circulation regulation system for a cyclotron oscillation tube, the system comprising:
the technical parameters of the model tube are the same as those of the cyclotron oscillation tube to be tested, and fluorescent powder is coated on the inner wall of the electronic collector on the model tube and used for debugging a magnetic system;
the light spot acquisition module is used for acquiring light spot information generated by the model tube which is put into the magnetic system for testing;
an adjustment module for adjusting the position of the mold tube in the magnetic system;
and the indicating module is used for indicating the magnetic system debugging completion information under the condition that the light spot information reaches a uniform distribution state.
6. The cyclotron oscillation tube electron circulation adjustment system of claim 5, wherein an inner wall of the electron collector of the mold tube is machined with scale lines.
7. The cyclotron oscillation tube electronic flow adjustment system of claim 6, wherein the graduation marks are in the shape of a ring.
8. The system of claim 6, wherein the light spot obtaining module is a camera, and the camera obtains the light spot information from the direction of the energy window of the cyclotron oscillation tube.
CN202010318007.3A 2020-04-21 2020-04-21 Method and system for adjusting electron current of cyclotron oscillation tube Active CN111508801B (en)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000223004A (en) * 1999-01-25 2000-08-11 Lucent Technol Inc Device including carbon nano-tube, device including field emission structure, and its manufacture
US6447355B1 (en) * 1995-06-09 2002-09-10 Kabushiki Kaisha Toshiba Impregnated-type cathode substrate with large particle diameter low porosity region and small particle diameter high porosity region
CN101110492A (en) * 2007-08-29 2008-01-23 中国科学院电子学研究所 Whirling traveling-wave tube amplifier coupling input structure and its design method
CN101859674A (en) * 2010-05-12 2010-10-13 安徽华东光电技术研究所 Method for testing electron beam pass rate of periodic magnetic focusing system of multiple traveling wave tubes
CN110808200A (en) * 2019-11-27 2020-02-18 华中科技大学 Coaxial assembling device and method for gyrotron pipe body and magnet

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6447355B1 (en) * 1995-06-09 2002-09-10 Kabushiki Kaisha Toshiba Impregnated-type cathode substrate with large particle diameter low porosity region and small particle diameter high porosity region
JP2000223004A (en) * 1999-01-25 2000-08-11 Lucent Technol Inc Device including carbon nano-tube, device including field emission structure, and its manufacture
CN101110492A (en) * 2007-08-29 2008-01-23 中国科学院电子学研究所 Whirling traveling-wave tube amplifier coupling input structure and its design method
CN101859674A (en) * 2010-05-12 2010-10-13 安徽华东光电技术研究所 Method for testing electron beam pass rate of periodic magnetic focusing system of multiple traveling wave tubes
CN110808200A (en) * 2019-11-27 2020-02-18 华中科技大学 Coaxial assembling device and method for gyrotron pipe body and magnet

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