CN111473747B - Calibration device, calibration system, electronic device and calibration method - Google Patents
Calibration device, calibration system, electronic device and calibration method Download PDFInfo
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- CN111473747B CN111473747B CN202010293416.2A CN202010293416A CN111473747B CN 111473747 B CN111473747 B CN 111473747B CN 202010293416 A CN202010293416 A CN 202010293416A CN 111473747 B CN111473747 B CN 111473747B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
Abstract
The application discloses a calibration device, a calibration system, electronic equipment and a calibration method. The calibration device comprises a collimation assembly and a reflection assembly. The collimation assembly is used for collimating the light emitted by the emission assembly. The reflection assembly is used for reflecting the light rays collimated by the collimation assembly to the receiving assembly, and the light rays collimated by the collimation assembly are parallel to the light rays reflected by the reflection assembly. The light reflected into the receiving assembly can be used to determine the angle between the optical axis of the transmitting assembly and the optical axis of the receiving assembly. The calibration device, the calibration system, the calibration method and the electronic device can calibrate and calculate the relative offset between the optical axis of the transmitting component and the optical axis of the receiving component, so that the transceiver module can be adjusted correspondingly in the following process, and the working precision of the transceiver module can be improved.
Description
Technical Field
The present disclosure relates to the field of measurement technologies, and in particular, to a calibration device, a calibration system, an electronic device, and a calibration method.
Background
A Time of Flight (TOF) depth camera may be used to measure the distance of objects in a scene to the camera. Time-of-flight depth cameras typically include a transmitter that transmits modulated light pulses and a receiver that receives light pulses reflected back from an object, and in subsequent algorithmic processing, the distance between the object and the camera can be calculated from the round-trip time of the light pulses. In the algorithm processing process, the parallelism between the optical axis of the transmitter and the optical axis of the receiver is crucial to the calculation of the distance, and how to determine the parallelism between the optical axis of the transmitter and the optical axis of the receiver becomes a problem to be solved urgently.
Disclosure of Invention
The embodiment of the application provides a calibration device, a calibration system, electronic equipment and a calibration method.
The calibration device of the embodiment of the application is used for the transceiver module. The receiving and sending module comprises a transmitting component and a receiving component, wherein the transmitting component is used for transmitting light, and the receiving component is used for receiving the light which is transmitted by the transmitting component and reflected by an object. The calibration device comprises a collimation assembly and a reflection assembly. The collimation assembly is used for collimating the light rays emitted by the emission assembly. The reflection assembly is used for reflecting the light rays collimated by the collimation assembly to the receiving assembly, and the light rays collimated by the collimation assembly are parallel to the light rays reflected by the reflection assembly. The light rays reflected into the receiving component can be used to determine the angle between the optical axis of the emitting component and the optical axis of the receiving component.
The calibration system of the embodiment of the application comprises a transceiving module and a calibration device. The transceiving module comprises a transmitting component and a receiving component. The calibration device is used for calibrating an included angle between the optical axis of the transmitting component and the optical axis of the receiving component. The calibration device comprises a collimation assembly and a reflection assembly. The collimation assembly is used for collimating the light rays emitted by the emission assembly. The reflection assembly is used for reflecting the light rays collimated by the collimation assembly into the receiving assembly, and the light rays collimated by the collimation assembly are parallel to the light rays reflected by the reflection assembly. The light rays reflected into the receiving component can be used to determine the angle between the optical axis of the emitting component and the optical axis of the receiving component.
The electronic equipment comprises a shell and a calibration system. The calibration system is coupled to the housing. The calibration system comprises a transceiver module and a calibration device. The transceiver module comprises a transmitting component and a receiving component. The calibration device is used for calibrating an included angle between the optical axis of the transmitting component and the optical axis of the receiving component. The calibration device comprises a collimation assembly and a reflection assembly. The collimation assembly is used for collimating the light rays emitted by the emission assembly. The reflection assembly is used for reflecting the light rays collimated by the collimation assembly to the receiving assembly, and the light rays collimated by the collimation assembly are parallel to the light rays reflected by the reflection assembly. The light rays reflected into the receiving component can be used to determine the angle between the optical axis of the emitting component and the optical axis of the receiving component.
The calibration method of the embodiment of the application is applied to the transceiver module. The receiving and sending module comprises a transmitting component and a receiving component, wherein the transmitting component is used for transmitting light, and the receiving component is used for receiving the light which is transmitted by the transmitting component and reflected by an object. The calibration method comprises the following steps: collimating the light emitted by the emission assembly by using a collimation assembly; reflecting the light rays collimated by the collimating component into the receiving component by using a reflecting component, wherein the light rays collimated by the collimating component are parallel to the light rays reflected by the reflecting component; and determining an included angle between an optical axis of the transmitting assembly and an optical axis of the receiving assembly according to the light reflected into the receiving assembly.
According to the calibration device, the calibration system, the electronic device and the calibration method, the included angle between the optical axis of the transmitting component and the optical axis of the receiving component is determined by receiving the light reflected into the receiving component, so that whether the optical axis of the transmitting component and the optical axis of the receiving component are parallel or not can be accurately detected and calibrated. The parallelism calibration result of the two modules can be used as the adjustment basis of the transceiver module, and the working precision of the transceiver module can be improved.
Additional aspects and advantages of embodiments of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the present application.
Drawings
The above and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a schematic illustration of a calibration system according to certain embodiments of the present application;
FIG. 2 is a schematic diagram of the operation of a calibration system according to some embodiments of the present application;
FIG. 3 is a schematic illustration of a test image acquired by a calibration system according to some embodiments of the present application;
FIG. 4 is a schematic illustration of a test image acquired by a calibration system according to certain embodiments of the present application;
FIG. 5 is a schematic view of an electronic device of some embodiments of the present application;
FIG. 6 is a schematic illustration of a scenario of movement of a calibration device in an electronic device in accordance with certain embodiments of the present application;
FIG. 7 is a schematic flow chart diagram of a calibration method according to certain embodiments of the present application;
FIG. 8 is a schematic flow chart diagram of a calibration method according to some embodiments of the present application.
Detailed Description
Reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the embodiments of the present application, and are not to be construed as limiting the embodiments of the present application.
Referring to fig. 1, the present embodiment provides a calibration apparatus 10 applied to a transceiver module 20. The transceiver module 20 includes a transmitter 21 and a receiver 22, the transmitter 21 is used for transmitting light, and the receiver 22 is used for receiving the light transmitted by the transmitter 21 and reflected by the object. The calibration device 10 includes a collimation assembly 11 and a reflection assembly 12. The collimating assembly 11 is used for collimating the light emitted from the emitting assembly 21. The reflection assembly 12 is used for reflecting the light collimated by the collimation assembly 11 to the receiving assembly 22, and the light collimated by the collimation assembly 11 is parallel to the light reflected by the reflection assembly 12. The light rays reflected into the receiving component 22 can be used to determine the angle between the optical axis of the emitting component 21 and the optical axis of the receiving component 22. The calibration device 10 of the embodiment of the present application determines the included angle between the optical axis of the emitting component 21 and the optical axis of the receiving component 22 by receiving the light reflected into the receiving component 22, so as to accurately detect and calibrate whether the optical axis of the emitting component 21 and the optical axis of the receiving component 22 are parallel. The result of the parallelism calibration can be used as the adjustment basis of the transceiver module 20, and the working accuracy of the transceiver module 20 can be improved.
Referring to fig. 1 again, the present embodiment further provides a calibration system 40. The calibration system 40 includes a transceiver module 20, a calibration device 10 and a processor 30. The processor 30 is electrically connected to the transceiver module 20.
The transceiver module 20 may be a Time of Flight (TOF) depth camera, a structured light depth camera, a laser radar, a proximity sensor, etc., without limitation. The transceiver module 20 includes a transmitter 21 and a receiver 22. The emitting assembly 21 is used to emit light. The light emitted from the emitting assembly 21 may be invisible light such as infrared light, ultraviolet light, and the like. The receiving assembly 22 is used for receiving the light emitted by the emitting assembly 21 and reflected back by the object.
The calibration device 10 includes a collimation assembly 11 and a reflection assembly 12.
The collimating assembly 11 is used for collimating the light emitted from the emitting assembly 21 to collimate a plurality of non-parallel lights emitted from the emitting assembly 21 into a plurality of lights parallel to each other. The optical axis of the collimating assembly 11 is parallel to or coincides with the optical axis of the emitting assembly 21. The collimating assembly 11 may be a collimating optical element such as a collimating mirror, and is not limited herein. The collimating assembly 11 may be composed of one collimating mirror or a plurality of collimating mirrors, and is not limited herein. The difference between the distance between the collimating assembly 11 and the emitting assembly 21 and the focal length of the collimating assembly 11 is less than a predetermined value. The distance between the collimating component 11 and the emitting component 21 can be understood as the vertical distance from the optical center of the collimating component 11 to the light emitting surface of the light source in the emitting component 21. The predetermined value should be a small value, for example, the predetermined value may be 0, and of course, the specific value of the predetermined value is not limited thereto. For convenience of understanding and description, for example, the distance between the collimator assembly 11 and the emitter assembly 21 is referred to as a first distance, the focal length of the collimator assembly 11 is referred to as a second distance, and a difference between the first distance and the second distance is smaller than a predetermined value. It can be understood that, the closer the light emitting surface of the light source in the emission assembly 21 is to the focal plane of the collimation assembly 11, the higher the collimation effect of the collimation assembly 11 on the light emitted by the emission assembly 21. Therefore, when the difference between the first distance and the second distance is smaller than the predetermined value, the collimating assembly 11 can collimate the light emitted from the emitting assembly 21 better.
The reflection assembly 12 is used for reflecting the light collimated by the collimation assembly 11 to the receiving assembly 22. The light collimated by the collimating assembly 11 is parallel to the light reflected by the reflecting assembly 12. Here, since the reflection assembly 12 may reflect the light collimated by the collimation assembly 11 one or more times, the light reflected by the reflection assembly 12 herein refers to the light that has been reflected by the reflection assembly 11 and will be incident into the receiving assembly 22. The light rays reflected into the receiving component 22 can be used to determine the angle between the optical axis of the emitting component 21 and the optical axis of the receiving component 22, i.e. to determine the parallelism between the optical axis of the emitting component 21 and the optical axis of the receiving component 22.
The reflection assembly 12 includes a first reflection surface 121 and a second reflection surface 122. The included angle between the first reflective surface 121 and the second reflective surface 122 is 90 °, the first reflective surface 121 is opposite to the light emitting surface 111 of the collimating assembly 11 and forms an included angle of 45 ° with the optical axis of the collimating assembly 11, and the second reflective surface 122 is opposite to the light receiving surface 221 of the receiving assembly 22.
Specifically, the first reflecting surface 121 may be used for performing a first reflection on the light collimated by the collimating assembly 11. According to the principle that the included angle between the incident light and the normal is equal to the included angle between the reflected light and the normal, the light reflected by the first reflecting surface 121 forms an included angle of 90 ° with the light collimated by the collimating assembly 11, that is, the light reflected by the first reflecting surface 121 is perpendicular to the light collimated by the collimating assembly 11. The light reflected by the first reflecting surface 121 continues to emit to the second reflecting surface 122, and the second reflecting surface 122 is configured to reflect the light reflected by the first reflecting surface 121 for the second time. The light reflected by the second reflecting surface 122 is perpendicular to the light reflected by the first reflecting surface 121, and is parallel to the light collimated by the collimating assembly 11. Since the optical axis of the collimating assembly 11 is parallel to or coincident with the optical axis of the emitting assembly 21, the light reflected by the reflecting assembly 12 is parallel to the optical axis of the emitting assembly 21 according to the principle that a is parallel to b, and b is parallel to c. Further, it can be determined whether the optical axis of the emitting component 21 is parallel to the optical axis of the receiving component 22 according to whether the light reflected by the reflecting component 12 is parallel to the optical axis of the receiving component 22 based on the principle that a is parallel to b and b is parallel to c. If the light reflected by the reflection assembly 12 is parallel to the optical axis of the receiving assembly 22, the optical axis of the emitting assembly 21 is parallel to the optical axis of the receiving assembly 22; if the light reflected by the reflection element 12 is not parallel to the optical axis of the receiving element 22, the optical axis of the emitting element 21 is not parallel to the optical axis of the receiving element 22.
Referring to fig. 2, in one example, the reflective element 12 may be formed by combining a first mirror 123 and a second mirror 124. The first mirror 123 includes a first reflective surface 121 and the second mirror 124 includes a second reflective surface 122. The first reflection surface 121 of the first reflector 123 is opposite to the light emitting surface 111 of the collimating element 11, and forms an included angle of 45 degrees with the optical axis of the collimating element 11. The second reflective surface 122 of the second reflector 124 is opposite the light receiving surface 221 of the receiving assembly 22. The first mirror 123 and the second mirror 124 may be, for example, 45 ° mirrors. The reflection assembly 12 may be formed by combining two mirrors having the shape of an isosceles right triangle, or may be formed by combining two mirrors having the shape of a right trapezoid (the acute angle of the right trapezoid is 45 °), or may be formed by combining two plane mirrors having an included angle of 90 °, or the like, as long as the included angle formed by the two reflection surfaces of the two mirrors is 90 °, which is not limited herein.
Referring to FIG. 1, in another example, the reflective assembly 12 may include only one mirror, wherein the mirror is a K-shaped mirror. The K-mirror includes a first reflecting surface 121 and a second reflecting surface 122. The first reflection surface 121 is opposite to the light emitting surface 111 of the collimating element 11, and forms an included angle of 45 degrees with the optical axis of the collimating element 11. The second reflecting surface 122 is opposite to the light receiving surface 221 of the receiving assembly 22. The K-shaped mirror may be regarded as a mirror integrally formed by the first mirror 123 and the second mirror 124 shown in fig. 2. In the process of using the K-shaped mirror to detect the parallelism, only the relative position between the K-shaped mirror and the collimation assembly 11 needs to be adjusted, the K-shaped mirror does not need to be installed or adjusted, the operation required to be executed in the detection process can be simplified, and the operation difficulty of detection is reduced.
The processor 30 may be a processor in a computer, a processor in a mobile phone, a processor in a server, and the like, which is not limited herein. The processor 30 may determine the parallelism between the optical axis of the emitting assembly 21 and the optical axis of the receiving assembly 22 according to the imaging position of the light received by the receiving assembly 22 on the receiving assembly 22. Specifically, the processor 30 may be configured to determine an imaging area on the test image corresponding to the light received by the receiving assembly 22, calculate an offset of a center position of the imaging area relative to a center position of the test image, and calculate the included angle according to the offset and the focal length of the receiving assembly 22.
Referring to fig. 3 and 4, the receiving element 22 receives the light reflected by the reflecting element 21 to form a test image, and since a plurality of light beams reflected by the reflecting element 22 are parallel light beams, the light beam received by the receiving element 22 corresponds to an imaging area on the test image as a point a. If the light reflected into the receiving element 22 is parallel to the optical axis of the receiving element 22, the position of the imaging area (i.e. point a) of the light corresponding to the test image should be located at the center of the test image after the light is received by the receiving element 22 (as shown in fig. 3). If the light reflected into the receiving element 22 is not parallel to the optical axis of the receiving element 22, the position of the imaging area (i.e. point a) of the light on the test image will be offset from the center of the test image after the light is received by the receiving element 22 (as shown in fig. 4). Therefore, the processor 30 can determine the included angle between the light reflected by the reflection assembly 12 and the optical axis of the receiving assembly 22 according to the offset of the position of the imaging area (i.e. the central position of the imaging area) relative to the central position of the test image, so as to further determine the included angle between the emitting assembly 21 and the receiving assembly 22. Illustratively, as shown in fig. 4, the imaging area on the test image is a, and the processor 30 calculates the offset between the pixel corresponding to the center position of the imaging area a and the pixel corresponding to the center position of the test image as: a pixels are offset in the Y direction, where each pixel has a dimension b in the Y direction. Assuming that the focal length of the receiving element 22 is f and x is the angle between the light reflected by the reflecting element 12 and the optical axis of the receiving element 22, the angle x between the light reflected by the reflecting element 12 and the optical axis of the receiving element 22, that is, the angle between the optical axis of the emitting element 21 and the optical axis of the receiving element 22, can be calculated according to the formula tanx ═ a × b/f.
After determining the angle between the optical axis of the transmitting assembly 21 and the optical axis of the receiving assembly 22, in one example, the optical axis of the transmitting assembly 21 and/or the optical axis of the receiving assembly 22 may be adjusted according to the angle such that the angle between the optical axis of the transmitting assembly 21 and the optical axis of the receiving assembly 22 is 0 °. The optical axis of the emitting component 21 and/or the optical axis of the receiving component 22 may be adjusted manually, or may be adjusted by a driving component, which is not limited herein. In another example, the optical axis of the transmitting component 21 and/or the optical axis of the receiving component 22 may be adjusted directly, for example, when the transceiver module 20 is a time-of-flight depth camera, the processing algorithm related to the depth information calculation in the time-of-flight depth camera may be adjusted adaptively according to the included angle, so as to ensure the accuracy of the depth information obtained by the time-of-flight depth camera.
In summary, the calibration system 40 of the embodiment of the present application determines the included angle between the optical axis of the emitting component 21 and the optical axis of the receiving component 22 by receiving the light reflected into the receiving component 22, so as to accurately detect and calibrate whether the optical axis of the emitting component 21 and the optical axis of the receiving component 22 are parallel. Subsequently, the parallelism between the optical axis of the transmitting component 21 and the optical axis of the receiving component 22 can be corrected according to the parallelism calibration results of the two components, or the processing algorithm at the rear end of the transceiving component 20 can be corrected, so as to ensure the working accuracy of the transceiving module 20.
Referring to fig. 5, an electronic device 100 is further provided in the present embodiment. The electronic device 100 includes a housing 50 and the calibration system 40 described above. Calibration system 40 is coupled to housing 50. For example, the housing 50 is formed with a housing space 51, and the calibration system 40 is housed in the housing space 51.
The electronic device 100 may be a mobile phone, a tablet computer, a notebook computer, an intelligent wearable device (such as an intelligent bracelet, an intelligent watch, an intelligent helmet, and intelligent glasses), a virtual reality device, and the like, which is not limited herein. In an embodiment of the present invention, the electronic device 100 is a mobile phone.
Referring to fig. 1 and 6, in some embodiments, the processor 30 may calculate an angle between the optical axis of the transmitting component 21 and the optical axis of the receiving component 22 before each activation of the transceiving component 20, and perform a corresponding adjustment on the transceiving component 20 based on the angle (i.e., adjusting the optical axes to be parallel, or adjusting the back end algorithm). After the adjustment is completed, the calibration device 10 is moved out of the optical path of the transceiver component 20, for example, as shown in fig. 6, the calibration device 10 is moved in the Y-axis direction to move out of the optical path of the transceiver component 20, so as to avoid the influence of the calibration device 10 on the light emitted and received by the transceiver component 20. Of course, in other embodiments, the processor 30 may also calculate an angle between the transmitting component 21 and the receiving component 22 when the electronic device 100 is dropped, and adjust the transceiving component 20 accordingly based on the angle. It can be understood that, when the electronic device 100 is dropped, the included angle between the optical axis of the transmitting component 21 and the optical axis of the receiving component 22 is likely to change, and at this time, the included angle between the two optical axes needs to be determined again, so as to ensure the working accuracy of the transceiver module 20.
In summary, the electronic device 100 of the embodiment of the present application determines the included angle between the optical axis of the transmitting assembly 21 and the optical axis of the receiving assembly 22 by receiving the light reflected into the receiving assembly 22, so as to accurately detect and calibrate whether the optical axis of the transmitting assembly 21 and the optical axis of the receiving assembly 22 are parallel. The electronic device 100 can correct the parallelism between the optical axis of the transmitting assembly 21 and the optical axis of the receiving assembly 22 according to the parallelism calibration result of the two, or correct the processing algorithm at the rear end of the transceiving assembly 20, so as to ensure the working accuracy of the transceiving module 20.
Referring to fig. 1 and 7, an embodiment of the present application further provides a calibration method. The calibration method according to the embodiment of the present application can be used for the transceiver module 20. The transceiver module 20 includes a transmitter 21 and a receiver 22, the transmitter 21 is used for transmitting light, and the receiver 22 is used for receiving the light transmitted by the transmitter 21 and reflected by the object; the calibration method comprises the following steps:
01: collimating the light emitted from the emission assembly 21 by using the collimating assembly 11;
02: the light collimated by the collimating component 11 is reflected into the receiving component 22 by the reflecting component 12, and the light collimated by the collimating component 11 is parallel to the light reflected by the reflecting component 12;
03: the angle between the optical axis of the emitting assembly 21 and the optical axis of the receiving assembly 22 is determined according to the light reflected into the receiving assembly 22.
Referring to fig. 1 and 8, in some embodiments, the receiving element 22 receives the light reflected by the reflecting element 21 to form a test image. Step 03, determining an included angle between an optical axis of the emitting component 21 and an optical axis of the receiving component 22 according to the light reflected into the receiving component 22, including:
031: determining that the light received by the receiving assembly 22 corresponds to an imaging area on the test image;
032: calculating the offset of the central position of the imaging area relative to the central position of the test image; and
033: the angle is calculated based on the offset and the focal length of the receiving assembly 22.
The specific implementation process of calibrating the included angle between the optical axis of the transmitting component 21 and the optical axis of the receiving component 22 by the calibration method according to the embodiment of the present application is the same as the specific implementation process of calibrating the included angle between the optical axis of the transmitting component 21 and the optical axis of the receiving component 22 by the calibration system 40, which is not described herein again.
In the calibration method according to the embodiment of the present application, the collimating component 11 is used to collimate the light emitted by the emitting component 21, and the reflecting component 12 is used to reflect the light collimated by the collimating component 11, so that the receiving component 22 can receive the light emitted by the reflecting component 12. The light received by the receiving component 22 can determine the included angle between the optical axis of the emitting component 21 and the optical axis of the receiving component 22, so that whether the optical axis of the emitting component 21 and the optical axis of the receiving component 22 are parallel or not can be accurately detected and calibrated. Subsequently, the parallelism between the optical axis of the transmitting component 21 and the optical axis of the receiving component 22 can be corrected according to the parallelism calibration results of the two components, or the processing algorithm at the rear end of the transceiving component 20 can be corrected, so as to ensure the working accuracy of the transceiving module 20.
In the description of the present specification, reference to the description of "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples" or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and the scope of the preferred embodiments of the present application includes other implementations in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present application.
Although embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present application and that variations, modifications, substitutions and alterations in the above embodiments may be made by those of ordinary skill in the art within the scope of the present application.
Claims (7)
1. A calibration device for a mobile phone transceiver module is characterized in that the mobile phone transceiver module comprises a transmitting component and a receiving component, wherein the transmitting component is used for transmitting light rays, and the receiving component is used for receiving the light rays which are transmitted by the transmitting component and reflected by an object; the calibration device comprises:
the difference between the distance between the collimation assembly and the emission assembly and the focal length of the collimation assembly is less than 0, and the collimation assembly is used for collimating the light rays emitted by the emission assembly; and
the reflecting assembly comprises a reflecting mirror, the reflecting mirror is a K-shaped mirror, the K-shaped mirror comprises a first reflecting surface and a second reflecting surface, an included angle between the first reflecting surface and the second reflecting surface is 90 degrees, the first reflecting surface is opposite to a light emitting surface of the collimating assembly and forms an included angle of 45 degrees with an optical axis of the collimating assembly, and the second reflecting surface is opposite to a light receiving surface of the receiving assembly; the reflection assembly is used for reflecting light after collimation assembly collimation in proper order through first plane of reflection, the second plane of reflection directly incides after the second time the receiving assembly, after collimation assembly collimation light with pass through direct inciding after the reflection assembly reflection the receiving assembly light is parallel, reflects to in the receiving assembly light can be used for confirming in the receiving assembly the optical axis of emission assembly with the contained angle between the optical axis of receiving assembly.
2. The calibration apparatus according to claim 1, wherein the reflection assembly includes a first reflection mirror and a second reflection mirror, the first reflection mirror including the first reflection surface, the second reflection mirror including the second reflection surface.
3. A calibration system for a handset, comprising:
the receiving and transmitting module comprises a transmitting component and a receiving component; and
the calibration device of any one of claims 1-2, wherein the calibration device is configured to calibrate an angle between an optical axis of the transmitting assembly and an optical axis of the receiving assembly.
4. The calibration system of claim 3, wherein the receiving assembly receives the light reflected by the reflecting assembly to form a test image, the calibration system further comprising a processor configured to:
determining an imaging area of the light received by the receiving assembly corresponding to the test image;
calculating an offset of a center position of the imaging region relative to a center position of the test image; and
and calculating the included angle according to the offset and the focal length of the receiving assembly.
5. A cellular phone, comprising:
a housing; and
the calibration system of claim 3 or 4, in combination with the housing.
6. A calibration method for a mobile phone transceiver module is characterized in that the mobile phone transceiver module comprises a transmitting component and a receiving component, wherein the transmitting component is used for transmitting light, and the receiving component is used for receiving the light which is transmitted by the transmitting component and reflected by an object; the reflecting assembly comprises a reflecting mirror, the reflecting mirror is a K-shaped mirror, the K-shaped mirror comprises a first reflecting surface and a second reflecting surface, an included angle between the first reflecting surface and the second reflecting surface is 90 degrees, the first reflecting surface is opposite to a light emitting surface of the collimating assembly and forms an included angle of 45 degrees with an optical axis of the collimating assembly, the second reflecting surface is opposite to a light receiving surface of the receiving assembly, and the difference value between the distance between the collimating assembly and the transmitting assembly and the focal length of the collimating assembly is smaller than 0; the calibration method comprises the following steps:
collimating the light emitted by the emission assembly with the collimation assembly;
the light rays collimated by the collimation assembly are sequentially subjected to primary reflection by a first reflection surface and secondary reflection by a second reflection surface by a reflection assembly and then directly incident into the receiving assembly, and the light rays collimated by the collimation assembly are parallel to the light rays directly incident into the receiving assembly after being reflected by the reflection assembly; and
and determining an included angle between the optical axis of the transmitting component and the optical axis of the receiving component according to the light reflected into the receiving component.
7. The calibration method according to claim 6, wherein the receiving assembly receives the light reflected by the reflecting assembly to form a test image, and the determining the included angle between the optical axis of the emitting assembly and the optical axis of the receiving assembly according to the light reflected into the receiving assembly comprises:
determining an imaging area of the light received by the receiving assembly corresponding to the test image;
calculating an offset of a center position of the imaging region relative to a center position of the test image; and
and calculating the included angle according to the offset and the focal length of the receiving assembly.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010293416.2A CN111473747B (en) | 2020-04-15 | 2020-04-15 | Calibration device, calibration system, electronic device and calibration method |
| PCT/CN2021/076336 WO2021208582A1 (en) | 2020-04-15 | 2021-02-09 | Calibration apparatus, calibration system, electronic device and calibration method |
| TW110110705A TWI799817B (en) | 2020-04-15 | 2021-03-24 | Calibration device, calibration system, electronic equipment and calibration method |
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| CN111473747B (en) * | 2020-04-15 | 2022-07-26 | Oppo广东移动通信有限公司 | Calibration device, calibration system, electronic device and calibration method |
| CN112737667B (en) * | 2020-12-29 | 2023-09-01 | 成都星时代宇航科技有限公司 | Terahertz experiment signal transmission assembly and device for space communication |
| CN115047433B (en) * | 2022-08-16 | 2022-11-01 | 杭州宇称电子技术有限公司 | Optical automatic adjusting method for TOF distance measuring system and application thereof |
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| TW202140996A (en) | 2021-11-01 |
| CN111473747A (en) | 2020-07-31 |
| TWI799817B (en) | 2023-04-21 |
| WO2021208582A1 (en) | 2021-10-21 |
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