CN111435308A - Method and device for acquiring program name of probe station - Google Patents
Method and device for acquiring program name of probe station Download PDFInfo
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- CN111435308A CN111435308A CN201910027675.8A CN201910027675A CN111435308A CN 111435308 A CN111435308 A CN 111435308A CN 201910027675 A CN201910027675 A CN 201910027675A CN 111435308 A CN111435308 A CN 111435308A
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Abstract
The invention provides a method and a device for acquiring a program name of a probe station. The method comprises the following steps: after a probe station calls a probe station program, acquiring a log of an FTP server; and analyzing the log to obtain a first name of a probe station program called by a probe station. The device comprises: the acquisition unit is used for acquiring a log of the FTP server after the probe station calls a probe station program; and the analysis unit is used for analyzing the log to obtain a first name of a probe station program called by the probe station. The invention can accurately obtain the name of the calling program of the probe station by acquiring the calling record of the probe station program through the log of the FTP server, realizes the complete compatibility of different test machine types and probe station machine types, has the advantages of simplicity and high efficiency, and achieves the purposes of improving the production efficiency and saving the development cost.
Description
Technical Field
The embodiment of the invention relates to the technical field of wafer testing, in particular to a method and a device for acquiring a program name of a probe station
Background
The semiconductor test process belongs to the key technology of the semiconductor industry, and the semiconductor test comprises a CP (circuit probe) test, which is also called a wafer test, and is the first step of the subsequent packaging test of a semiconductor device, so as to select out bad chips in a wafer.
The main equipment of wafer test is a tester and a probe station, the tester provides test strategy and logic, the probe station contacts with the wafer, and the tester and the probe station cooperate to complete the test. In the wafer testing process, the testing process is monitored and managed through the testing management system, automatic operation is realized, and prevention and error correction of manual operation are realized to a certain extent.
However, in the testing process, the test management system often needs to determine whether the probe station program calls in error, so the test management system needs to obtain the name of the probe station program. Because the types of the test machine and the probe station are various, each type combination needs to compile different communication program modules for the system in the test tube to obtain the program name called by the probe station, and the compatibility requirement of the system in the test tube cannot be met.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a method and a device for acquiring the name of a probe station program, which can accurately acquire the name of the probe station calling program by acquiring the calling record of the probe station program through the log of an FTP server, thereby realizing the error correction target of a test management system.
In order to achieve the purpose, the invention provides the following technical scheme:
in one aspect, the present invention provides a method for obtaining a program name of a probe station, including:
after a probe station calls a probe station program, acquiring a log of an FTP server;
and analyzing the log to obtain a first name of a probe station program called by a probe station.
In another aspect, the present invention further provides an apparatus for obtaining a program name of a probe station, including:
the acquisition unit is used for acquiring a log of the FTP server after the probe station calls a probe station program;
and the analysis unit is used for analyzing the log to obtain a first name of a probe station program called by the probe station.
Further, the method also comprises the following steps:
the configuration unit is used for acquiring a second name of a probe station program to be called by the probe station from a configuration procedure;
and the first judging unit is used for determining that the probe station calls the probe station program to cause an error when the second name of the probe station program is different from the first name of the probe station program.
Further, the method also comprises the following steps: a second determining unit, configured to enable the probe station to execute the probe station program when the second name of the probe station program is the same as the first name of the probe station program.
Further, the method also comprises the following steps:
and the execution unit is used for acquiring a test machine program and a probe station program from a configured procedure before the probe station calls the probe program, and calling the probe station program by the probe station after the test machine calls and executes the test machine program.
In another aspect, the present invention further provides an electronic device, including: a processor, a memory, a communication interface, and a communication bus; wherein the content of the first and second substances,
the processor, the communication interface and the memory complete mutual communication through a communication bus;
the processor is used for calling the logic instruction in the memory so as to execute the method for acquiring the program name of the probe station.
In another aspect, the present invention also provides a non-transitory computer-readable storage medium storing computer instructions for causing a computer to execute the method for acquiring a program name of a probe station.
According to the method and the device for acquiring the name of the probe station program, the name of the probe station program calling can be accurately acquired by acquiring the probe station program calling record through the log of the FTP server, so that the method and the device are completely compatible with different tester types and probe station types, have the advantages of simplicity and high efficiency, and achieve the purposes of improving the production efficiency and saving the development cost.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a flowchart of a method for acquiring a program name of a probe station according to a first embodiment of the present invention;
FIG. 2 is a flow chart of another method for obtaining the name of a program in a probe station according to a second embodiment of the present invention;
FIG. 3 is a schematic structural diagram of an apparatus for obtaining a name of a program of a probe station according to a third embodiment of the present invention;
fig. 4 is a schematic structural diagram of an electronic device according to a fourth embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the wafer detection process, a management system is firstly opened on a testing machine to select a wafer to be tested and position the wafer to the current detection process. The detection process is configured by the corresponding post personnel of the management system and provides correct process information, the management system actually calls a test machine program and a probe station program according to the configuration content, and after the test machine executes the test machine program, the probe station calls the probe station program and executes the probe station program to realize the detection of the wafer.
In the testing process, the test management system often needs to judge whether the probe station program is called wrongly, so the test management system needs to obtain the name of the probe station program. Because the types of the test machine and the probe station are various, each type combination needs to compile different communication program modules for the system in the test tube to obtain the program name called by the probe station, and the compatibility requirement of the system in the test tube cannot be met.
To solve the problem, a method for acquiring a program name of a probe station according to an embodiment of the present invention is shown in fig. 1, and specifically includes the following steps:
s101: after a probe station calls a probe station program, acquiring a log of an FTP server;
s102: and analyzing the log to obtain a first name of a probe station program called by a probe station.
The probe station in the wafer test is a device directly contacted with the wafer, the called probe station program is downloaded from an FTP server, and almost all probe station programs in the industry are downloaded through the FTP server, so that the name of the probe station program called by the probe station finally can be judged by analyzing the downloaded log.
Therefore, in the embodiment, the log of the FTP server is obtained after the probe station calls the probe station program; and analyzing the acquired log of the FTP server to obtain the name of the probe station program called by the probe station finally. The name of the finally called probe station program is the first name of the probe station program.
Before the probe station calls a probe program, the method further includes: and acquiring a test machine program and a probe station program from the configured procedures, and calling the probe station program by the probe station after the test machine calls and executes the test machine program.
As can be seen from the above description, in the method for obtaining the name of the probe station program according to the embodiment of the present invention, the name of the probe station program call record is obtained through the log of the FTP server, so that the name of the probe station call program can be accurately obtained, thereby achieving the error correction objective of the test management system, avoiding programming a program module on the test management system and requiring the test management system to communicate with the probe station through a test machine, achieving the full compatibility between different test machine types and the probe station type, and having the advantages of simplicity and high efficiency, thereby achieving the purposes of improving the production efficiency and saving the development cost.
Another method for acquiring a program name of a probe station according to the second embodiment of the present invention is shown in fig. 2, and further includes the following steps:
s103: acquiring a second name of a probe station program to be called by the probe station from the configured procedure;
s104: and determining that the probe station calls the probe station program to be faulty when the second name of the probe station program is different from the first name of the probe station program.
In this embodiment, before the probe station calls a probe program, the method further includes: and acquiring a test machine program and a probe station program from the configured procedures, and calling the probe station program by the probe station after the test machine calls and executes the test machine program.
After obtaining a first name of a probe station program called by a probe station, comparing the first name of the probe station program with a second name of the probe station program in a pre-configured procedure, wherein if the second name of the probe station program is different from the first name of the probe station program, determining that the probe station calling the probe station program is wrong; and if the second name of the probe station program is the same as the first name of the probe station program, enabling the probe station to execute the probe station program.
Step S103 may be performed before step S101 or after step S102, and the order of the step S103 is not limited in this embodiment.
Because all the test machines and the probe stations download the test programs from the same FTP server, the invention avoids the model difference of the probe stations, can obtain the names of the calling programs of the probe stations only by analyzing logs with uniform formats, and judges the correctness of the programs of the probe stations selected by operators, thereby ensuring the accuracy of test operation.
From the above description, it can be known that, when the test management system performs a test, a probe station program called by an operator can be easily obtained, so as to determine whether the program is correctly selected and find an error in time. The method provided by the embodiment of the invention is compatible with various mainstream machine types, and can be compatible with newly-entered test equipment without changing a test management system.
In order to further explain the method of the present invention in detail, the method provides a method for acquiring a program name of a probe station, and the specific application example of the method includes the following specific contents:
the probe station is a device directly contacted with the wafer in the wafer test, and the called probe station program is downloaded from the FTP server, so that the name of the program called by the probe station at last can be judged only by analyzing and analyzing the downloaded log.
The following is an example of a log generated by the FTP server's most widely served software Serv U:
[10] fri 28Dec 1212: 00:00- (002554) has successfully sent the file
"Z: \ ftp \ PB-TSK-09\ prober \ device \ UF200\002A4SA-C2V2A \ paddata. dat" (0.14 KB/sec-144 bytes)
[10] Fri 28Dec 1212: 00:00- (002554) is sending files
"Z:\ftp\PB-TSK-09\prober\device\UF200\002A4SA-C2V2A\inspData.dat"
[10] Fri 28Dec 1212: 00:00- (002554) has successfully sent the file
'Z: \ ftp \ PB-TSK-09\ prober \ device \ UF200\002A4SA-C2V2A \ instdata.dat' (0.05 KB/s-48 bytes)
Analyzing the logs, taking the last line of the log as an example, the last line of the log contains the name of the probe station, namely 'PB-TSK-09', and the name of the program of the probe station, namely '002A 4SA-C2V 2A', so that the name of the program actually called by the probe station can be quickly known only by finding the log file of the last line, the production management system only needs to compare the name with the program of the correct probe station, and if the calling is wrong, an alarm is given out, and the test is stopped.
An embodiment of the present invention provides a device for obtaining a program name of a probe station, and referring to fig. 3, the device specifically includes:
the acquisition unit 10 is used for acquiring a log of the FTP server after the probe station calls a probe station program;
and the analyzing unit 20 is configured to analyze the log to obtain a first name of a probe station program called by the probe station.
Further, the method also comprises the following steps:
a configuration unit 30, configured to obtain a second name of a probe station program to be called by the probe station from a configuration procedure;
a first determining unit 401, configured to determine that a probe station calls a probe station program to make an error when the second name of the probe station program is different from the first name of the probe station program.
Further, the method also comprises the following steps: a second determining unit 402, configured to enable the probe station to execute the probe station program when the second name of the probe station program is the same as the first name of the probe station program.
Further, the method also comprises the following steps:
and the execution unit is used for acquiring a test machine program and a probe station program from a configured procedure before the probe station calls the probe program, and calling the probe station program by the probe station after the test machine calls and executes the test machine program.
The functions implemented by the modules in the apparatus correspond to the corresponding operation steps in the method embodiment, and are not described herein again.
According to the technical scheme, the device for acquiring the name of the probe station program can accurately acquire the name of the probe station program calling record through the log of the FTP server, so that the error correction target of the test management system is realized, the program module compiling on the test management system is avoided, the test management system needs to communicate with the probe station through a test machine, the different test machine types and the probe station machine types are completely compatible, the advantages of simplicity and high efficiency are achieved, and the purposes of improving the production efficiency and saving the development cost are achieved. And whether the program is correctly selected can be judged, and errors can be found in time. The method provided by the embodiment of the invention is compatible with various mainstream machine types, and can be compatible with newly-entered test equipment without changing a test management system.
An embodiment of the present invention provides an electronic device, and referring to fig. 4, the electronic device may include: a processor (processor)810, a communication Interface 820, a memory 830 and a communication bus 840, wherein the processor 810, the communication Interface 820 and the memory 830 communicate with each other via the communication bus 840. The processor 810 may call logic instructions in the memory 830 to perform the following method: after a probe station calls a probe station program, acquiring a log of an FTP server; and analyzing the log to obtain a first name of a probe station program called by a probe station.
In addition, the logic instructions in the memory 830 may be implemented in software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
An embodiment five of the present invention provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the method provided by the foregoing method embodiments, and for example, includes: after a probe station calls a probe station program, acquiring a log of an FTP server; and analyzing the log to obtain a first name of a probe station program called by a probe station.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, apparatus, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus, and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means/systems for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. The terms "upper", "lower", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the description of the present invention, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description. Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be interpreted as reflecting an intention that: that the invention as claimed requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present invention is not limited to any single aspect, nor is it limited to any single embodiment, nor is it limited to any combination and/or permutation of these aspects and/or embodiments. Moreover, each aspect and/or embodiment of the present invention may be utilized alone or in combination with one or more other aspects and/or embodiments thereof.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention, and they should be construed as being included in the following claims and description.
Claims (10)
1. A method for acquiring program names of probe stations is characterized by comprising the following steps:
after a probe station calls a probe station program, acquiring a log of an FTP server;
and analyzing the log to obtain a first name of a probe station program called by a probe station.
2. The method for obtaining the name of the probe station program according to claim 1, further comprising:
acquiring a second name of a probe station program to be called by the probe station from the configured procedure;
and determining that the probe station calls the probe station program to be faulty when the second name of the probe station program is different from the first name of the probe station program.
3. The method for obtaining the name of a program in a probe station according to claim 2,
and when the second name of the probe station program is the same as the first name of the probe station program, enabling the probe station to execute the probe station program.
4. The method for acquiring the name of the probe station program according to claim 1 or 2, wherein before the probe station calls the probe program, the method further comprises:
and acquiring a test machine program and a probe station program from the configured procedures, and calling the probe station program by the probe station after the test machine calls and executes the test machine program.
5. An apparatus for obtaining a name of a program of a probe station, comprising:
the acquisition unit is used for acquiring a log of the FTP server after the probe station calls a probe station program;
and the analysis unit is used for analyzing the log to obtain a first name of a probe station program called by the probe station.
6. The apparatus for acquiring the name of a probe station program according to claim 5, further comprising:
the configuration unit is used for acquiring a second name of a probe station program to be called by the probe station from a configuration procedure;
and the first judging unit is used for determining that the probe station calls the probe station program to cause an error when the second name of the probe station program is different from the first name of the probe station program.
7. The apparatus for acquiring the name of a probe station program according to claim 6, further comprising:
a second determining unit, configured to enable the probe station to execute the probe station program when the second name of the probe station program is the same as the first name of the probe station program.
8. The apparatus for acquiring the name of a probe station program according to claim 5 or 6, further comprising:
and the execution unit is used for acquiring a test machine program and a probe station program from a configured procedure before the probe station calls the probe program, and calling the probe station program by the probe station after the test machine calls and executes the test machine program.
9. An electronic device, comprising: a processor, a memory, a communication interface, and a communication bus; wherein the content of the first and second substances,
the processor, the communication interface and the memory complete mutual communication through a communication bus;
the processor is used for calling the logic instructions in the memory to execute the method for acquiring the program name of the probe station as claimed in any one of claims 1-4.
10. A non-transitory computer readable storage medium storing computer instructions that cause the computer to perform a method of acquiring a probe station program name according to any one of claims 1-4.
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| CN201910027675.8A CN111435308A (en) | 2019-01-11 | 2019-01-11 | Method and device for acquiring program name of probe station |
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| CN201910027675.8A CN111435308A (en) | 2019-01-11 | 2019-01-11 | Method and device for acquiring program name of probe station |
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| CN101789174A (en) * | 2009-12-29 | 2010-07-28 | 北京世纪高通科技有限公司 | Journal monitoring method and device |
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