CN111407312A - Area array probe with switching circuit - Google Patents
Area array probe with switching circuit Download PDFInfo
- Publication number
- CN111407312A CN111407312A CN202010248713.5A CN202010248713A CN111407312A CN 111407312 A CN111407312 A CN 111407312A CN 202010248713 A CN202010248713 A CN 202010248713A CN 111407312 A CN111407312 A CN 111407312A
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- cable
- probe
- switching
- area array
- switching module
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- 239000000523 sample Substances 0.000 title claims abstract description 39
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 239000004020 conductor Substances 0.000 description 8
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B8/00—Diagnosis using ultrasonic, sonic or infrasonic waves
- A61B8/44—Constructional features of the ultrasonic, sonic or infrasonic diagnostic device
- A61B8/4444—Constructional features of the ultrasonic, sonic or infrasonic diagnostic device related to the probe
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Biophysics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Medical Informatics (AREA)
- Molecular Biology (AREA)
- Surgery (AREA)
- Animal Behavior & Ethology (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
The invention discloses an area array probe with a switching circuit, which relates to the technical field of probe design, and aims at solving the problem of complex production of the existing probe.
Description
Technical Field
The invention relates to the technical field of probe design, in particular to an area array probe with a switching circuit.
Background
The ultrasonic area array probe is an important ultrasonic vibrator layout form in the ultrasonic probe, is widely applied to industrial, medical nondestructive detection fields and the like, and a plurality of independent ultrasonic vibrators, array elements for short, are arranged in one area array probe. As shown in fig. 3 and 4, the prior art apparatus needs to maintain stable, reliable and authentic signals, and each array element needs to be connected with a host computer through a separate coaxial cable.
But in practical application, a cable conductor corresponds an array element, along with the increase of quantity, the more independent, tiny coaxial cable conductor that contains in a cable conductor, the probability that the cable damaged is big, as long as a tiny coaxial cable conductor wherein damages, the area array probe just damages, and then makes in subsequent use, the spoilage of probe is higher, and to the probe of many array elements, the cable conductor quantity that needs also increases simultaneously for the production manufacturing is also more complicated, the rise that the cost is multiplied.
Disclosure of Invention
The area array probe with the switching circuit provided by the invention solves the problem of complex production of the probe.
In order to achieve the purpose, the invention adopts the following technical scheme:
the utility model provides a take switching circuit's area array probe, includes the shell, one side fixedly connected with cable of shell, one side fixed connection and shell fixed connection's of cable circuit board, be connected with a plurality of switching modules on the circuit board, one side fixedly connected with and shell fixed connection's of circuit board probe.
Preferably, a connector connected with the circuit board is arranged in the switching module, and a plurality of connecting wires are arranged in the cable.
Preferably, one side of the shell is fixedly connected with a rubber ring, and the cable is fixedly sleeved with the rubber ring.
Preferably, one end of the cable, which is far away from the circuit board, is connected with a host, and the host is connected with the circuit board through the cable.
Preferably, the supply voltage of the switching module 4 is 3.3V and 10V, respectively.
Preferably, the switching module 4 employs nanosecond processing speed.
Preferably, the pulse voltage of the switching module 4 can reach up to ± 90V.
Preferably, the pulse of the switching module 4 is switched to 14 ohms.
Preferably, the number of the switching modules 4 may be plural.
The invention has the beneficial effects that:
1: will carry out the reduction of doubling to the control coaxial line of array element through switching module, and then reduce the quantity of coaxial line in the cable for welded joint quantity also very reduces, and the degree of difficulty greatly reduced of welding, the reliability improves greatly, reduces the damage that the later stage probably produced simultaneously, and then makes the life extension of whole device, reduce cost.
2: the number of the switchable switching modules can be adapted to the use requirements of different probes, so that standardized modules are formed, the switching modules can be directly used in the production process as required, the production procedures are simplified, the production difficulty is greatly reduced, the production cost is reduced, and the yield is improved.
Drawings
Fig. 1 is a schematic front sectional view of an area array probe with a switching circuit according to the present invention;
FIG. 2 is a schematic block diagram of an area array probe with a switching circuit according to the present invention;
FIG. 3 is a schematic cross-sectional front view of an existing apparatus of an area array probe with a switching circuit according to the present invention;
FIG. 4 is a block diagram of a conventional apparatus of an area array probe with a switching circuit according to the present invention;
fig. 5 is a schematic circuit diagram of a switching module of the area array probe with a switching circuit according to the present invention.
Reference numbers in the figures: 1 shell, 2 probes, 3 cables, 4 switching modules and 5 circuit boards.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
Referring to the attached drawing 1, an area array probe with a switching circuit, including a housing 1, one side fixedly connected with cable 3 of housing 1, one side fixed connection of cable 3 and housing 1 fixed connection's circuit board 5, be connected with a plurality of switching module 4 on the circuit board 5, one side fixedly connected with of circuit board 5 and housing 1 fixed connection's probe 2, in the actual use, corresponding switching module is connected to cable 3 through the printed circuit on circuit board 5, through the processing switching of switching module, then transmit the array element that corresponds on the probe for through the printed circuit on circuit board 5, carry out corresponding detection task.
Referring to fig. 2, the apparatus further includes a host end for signal processing, at the probe end of the area array probe, one or more groups of switching modules 4 are integrated on the circuit board 5, and the space occupied by these switching modules 4 is small, one switching module 4 can switch a plurality of array elements to the same coaxial line according to the requirement and transmit the received signal to the host end, and the host transmits the transmitted signal to the corresponding array element to complete the work, wherein the host end integrates a host control switching module and a power supply, the host control switching module is respectively connected with the switching module 4 through the coaxial line and the control line, wherein the switching module 4 includes a plurality of switches SW, each switch SW is connected with one PZT, the number of the switchable array elements of each independent switching module 4 is usually 4, 8, 16, 32, 64, 128, etc., i.e. 4, b, etc. are provided in each switching module 4, 8. 16, 32, 64, 128 switches SW (also can adjust according to the demand of reality), thus, the coaxial line from probe to host computer end is double reduction, and then make original external diameter very thick, inside contains the cable conductor 3 of many coaxial lines, it is little to become the external diameter, the few cable conductor of quantity of inside coaxial line, and then make the area array probe can use single cable conductor to solve, the coaxial line in the power through cable of probe end switching module needs passes through by the power in the host computer is provided as the power cord, the electric energy of host computer control switching module also is provided by the power in the host computer.
Referring to fig. 5, after receiving the signal, the circuit in the switching module 4 turns on or off different swins according to logic, so as to control different array elements, and further implement different requirements for switching and detection.
Example (b): in the actual production process, M switching modules 4 can be integrated on a circuit board 5 as required, N switchable array elements PZT are arranged in each switching module 4, the whole device can switch MxN array elements PZT at most, when a host controls the switching module to give a signal to the switching module 4 at the probe end through a control line, if the signal is 11, SW-1 is quickly closed in the switching module 1, SW-2 to SW-N are all opened in the switching module, SW-1 to SW-N of other switching modules 4 are all kept open, thus the host end can excite a beam signal, PZT-1 array elements in the switching module 1 are given through a coaxial line C-1, echo signals generated in PZT-1 are also transmitted to the host control switching module at the host end through the coaxial line C-1, by analogy, assuming this signal is MN, then in the switching module M SW-N is quickly closed and the others remain open, while all SW-1 to SW-N in the other switching modules 4 remain open. Therefore, a beam signal is excited at the host end and is transmitted to a PZT-N array element in the switching module M through the coaxial line C-M, meanwhile, an echo signal generated in the PZT-N is transmitted to the host at the host end through the coaxial line C-M to control the switching module, and electric energy required by the probe end switching module is provided by a power supply in the host through the coaxial line in the cable as a power line. The electric energy of the host control switching module is also provided by a power supply in the host, in the process, the control coaxial line of the array element can be reduced in multiples by utilizing the switching module 4, so that the number of the coaxial lines in the cable 3 is reduced, the number of welded joints is greatly reduced, the welding difficulty is greatly reduced, and the reliability is greatly improved.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (4)
1. The utility model provides a take area array probe of switching circuit, includes shell (1), its characterized in that, one side fixedly connected with cable (3) of shell (1), one side fixed connection and shell (1) fixed connection's of cable (3) circuit board (5), be connected with a plurality of switching module (4) on circuit board (5), one side fixedly connected with and shell (1) fixed connection's probe (2) of circuit board (5).
2. The area array probe with the switching circuit according to claim 1, wherein a connector connected with a circuit board (5) is arranged in the switching module (4), and a plurality of connecting wires are arranged in the cable (3).
3. The area array probe with the switching circuit according to claim 1, wherein a rubber ring is fixedly connected to one side of the housing (1), and the cable (3) is fixedly sleeved with the rubber ring.
4. The area array probe with the switching circuit according to claim 1, wherein one end of the cable (3) far away from the circuit board (5) is connected with a host computer, and the host computer is connected with the circuit board (5) through the cable (3).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202010248713.5A CN111407312A (en) | 2020-04-01 | 2020-04-01 | Area array probe with switching circuit |
Applications Claiming Priority (1)
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CN202010248713.5A CN111407312A (en) | 2020-04-01 | 2020-04-01 | Area array probe with switching circuit |
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CN111407312A true CN111407312A (en) | 2020-07-14 |
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CN202010248713.5A Pending CN111407312A (en) | 2020-04-01 | 2020-04-01 | Area array probe with switching circuit |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002291741A (en) * | 2001-04-02 | 2002-10-08 | Aloka Co Ltd | Ultrasonic probe |
US20060241475A1 (en) * | 2005-04-07 | 2006-10-26 | Ge Medical Systems Global Technology Company, Llc | Ultrasonic probe and ultrasonic diagnostic apparatus |
US20120190986A1 (en) * | 2011-01-25 | 2012-07-26 | Fujifilm Corporation | Ultrasound probe and ultrasound diagnostic apparatus |
CN103006265A (en) * | 2012-12-25 | 2013-04-03 | 汕头市超声仪器研究所有限公司 | Ultrasonic multi-array element probe device |
US20180161011A1 (en) * | 2015-06-11 | 2018-06-14 | Koninklijke Philips N.V. | Ultrasonic transducer array probe for shear wave imaging |
-
2020
- 2020-04-01 CN CN202010248713.5A patent/CN111407312A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002291741A (en) * | 2001-04-02 | 2002-10-08 | Aloka Co Ltd | Ultrasonic probe |
US20060241475A1 (en) * | 2005-04-07 | 2006-10-26 | Ge Medical Systems Global Technology Company, Llc | Ultrasonic probe and ultrasonic diagnostic apparatus |
US20120190986A1 (en) * | 2011-01-25 | 2012-07-26 | Fujifilm Corporation | Ultrasound probe and ultrasound diagnostic apparatus |
CN103006265A (en) * | 2012-12-25 | 2013-04-03 | 汕头市超声仪器研究所有限公司 | Ultrasonic multi-array element probe device |
US20180161011A1 (en) * | 2015-06-11 | 2018-06-14 | Koninklijke Philips N.V. | Ultrasonic transducer array probe for shear wave imaging |
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Application publication date: 20200714 |
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