CN111404002B - Control circuit of laser thermoelectric refrigerator - Google Patents
Control circuit of laser thermoelectric refrigerator Download PDFInfo
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- CN111404002B CN111404002B CN202010272859.3A CN202010272859A CN111404002B CN 111404002 B CN111404002 B CN 111404002B CN 202010272859 A CN202010272859 A CN 202010272859A CN 111404002 B CN111404002 B CN 111404002B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/04—Arrangements for thermal management
- H01S3/0405—Conductive cooling, e.g. by heat sinks or thermo-electric elements
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
- G05D23/24—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
- H01S5/02415—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling by using a thermo-electric cooler [TEC], e.g. Peltier element
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- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Plasma & Fusion (AREA)
- Automation & Control Theory (AREA)
- Semiconductor Lasers (AREA)
Abstract
An automatic control circuit of a laser thermoelectric refrigerator comprises a main control circuit, a temperature control circuit and a laser temperature sampling circuit, wherein the main control circuit comprises a main control chip (1), the main control chip (1) is provided with two analog-to-digital converters AD1 and AD2, the AD1 is used for signal sampling after voltage amplification at two ends of a negative temperature coefficient thermistor NTC inside a laser (2), the AD2 is used for collecting sampling resistor voltage to obtain a TEC current value, and meanwhile, one pulse width modulation signal PWM1 and one I2C signal which are provided in the main control chip (1) are connected to a first voltage regulating resistor network (3); the temperature control circuit comprises a first voltage reduction chip (4), a second voltage reduction chip (5), a first voltage regulation resistor network (3), a second voltage regulation resistor network (9), a sampling resistor (7) and a TEC current operational amplifier (8), the laser temperature sampling circuit comprises an NTC current sampling unit (6), the NTC current sampling unit (6) is connected with a negative temperature coefficient thermistor NTC of a laser thermoelectric refrigerator in series, and the output of the NTC current sampling unit (6) is connected to an analog-to-digital converter AD 1.
Description
Technical Field
The invention belongs to the technical field of laser temperature control, and particularly relates to a control circuit system for a laser thermoelectric refrigerator.
Background
Since the central wavelength and the output power of the laser are affected by the temperature, in order to ensure the long-term stability of the central wavelength and the output power, the temperature of the laser must be monitored, and a Thermoelectric cooler (TEC) is widely used in the field of temperature control of the laser as a mature technology.
TEC is made using the peltier effect of semiconductor materials. The peltier effect is a phenomenon in which when a direct current passes through a couple composed of two semiconductor materials, one end absorbs heat and the other end releases heat. The heavily doped N-type and P-type bismuth telluride are mainly used as semiconductor materials of TEC, and the bismuth telluride elements are electrically connected in series and generate heat in parallel. The TEC comprises a number of P-type and N-type pairs (sets) that are connected together by electrodes and sandwiched between two ceramic electrodes. When current flows through the TEC, the heat generated by the current is transferred from one side of the TEC to the other, creating a "hot" side and a "cold" side on the TEC, which is the principle of heating and cooling of the TEC.
The conventional 14-pin butterfly laser is usually packaged with a TEC with a size of 8mm × 6mm for pumping temperature control, the cooling current of the TEC is about 1.5A, and the voltage of the TEC is about 2.5V. Along with the increase of the heat load of the laser, the refrigerating current of the TEC can reach more than 3A. However, a circuit system implemented based on the existing TEC temperature control chip has high cost and limited cooling current, and a technical scheme with better effect is urgently needed to be proposed in the field.
Disclosure of Invention
The invention aims to provide a control circuit of a low-cost laser thermoelectric refrigerator.
The technical scheme of the invention provides an automatic control circuit of a laser thermoelectric refrigerator, which comprises a main control circuit, a temperature control circuit and a laser temperature sampling circuit,
the main control circuit comprises a main control chip 1, a peripheral hardware communication interface is arranged in the main control chip 1,
the main control chip 1 is provided with two analog-to-digital converters AD1 and AD2, the AD1 is used for sampling signals amplified by voltages at two ends of a negative temperature coefficient thermistor NTC in the laser 2, the AD2 is used for acquiring voltage values at two ends of a sampling resistor connected in series with the TEC and is used for acquiring a current value of the TEC, and meanwhile, the main control chip 1 is internally provided with a pulse width modulation signal PWM1 and an I2C signal which are respectively connected to the first voltage regulating resistor network 3 and used for regulating the first voltage regulating resistor network 3; the TEC represents a thermoelectric refrigerator; the peripheral hardware communication interface is used for connecting an upper computer to support real-time monitoring of the temperature of the laser and the current of the TEC and adjusting the current of the TEC according to the requirement;
the temperature control circuit comprises a first voltage reduction chip 4, a second voltage reduction chip 5, a first voltage regulation resistance network 3, a second voltage regulation resistance network 9, a sampling resistor 7 and a TEC current operational amplifier 8,
the first voltage reduction chip 4 is connected to the anode of the TEC, and the first voltage regulation resistor network 3 is connected with the first voltage reduction chip 4; the output Vout1 of the first buck chip 4 can regulate the output through the first voltage regulating resistor network;
the second voltage reduction chip 5 is connected to the cathode of the TEC through a sampling resistor 7, and the second voltage regulation resistor network 9 is connected with the second voltage reduction chip 5; the output Vout2 of the second buck chip 5 is set as a fixed output through a second voltage regulating resistor network;
the sampling resistor 7 is connected to an analog-to-digital converter AD2 through a TEC current operational amplifier 8;
the laser temperature sampling circuit comprises an NTC current sampling unit 6, the NTC current sampling unit 6 is connected with a negative temperature coefficient thermistor NTC of a laser thermoelectric refrigerator in series, and the output of the NTC current sampling unit 6 is connected to an analog-to-digital converter AD 1.
Moreover, the first voltage regulating resistor network 3 is realized by adopting an adjustable potentiometer.
Furthermore, the pulse width modulation signal PWM1 provided in the main control chip 1 is used to control the on/off of the adjustable potentiometer, and simultaneously, the resistance value of the adjustable potentiometer is controlled through the serial data line SDA and the serial clock line SCL of the two-wire system synchronous serial bus I2C, so as to realize the resistance value change of the first voltage regulating resistor network.
Moreover, the second voltage-regulating resistor network 9 is implemented by using resistors.
Moreover, the NTC current sampling unit 6 carries out linearization processing on the negative temperature coefficient thermistor NTC by using a series resistance method, and the main control chip 1 obtains the current temperature value of the laser device quickly by obtaining the output of the temperature sampling circuit of the NTC current sampling unit 6 and looking up the table, thereby realizing real-time monitoring.
The circuit system can monitor the current temperature of the laser in real time, automatically adjust the refrigerating current or the heating current of the TEC and ensure the long-term stable work of the laser in an extreme temperature environment. Compared with the conventional circuit system realized based on the TEC temperature control chips ADN8831, MAX1968 and the like, the circuit system has the advantages that the cost can be reduced by more than half, meanwhile, the suitable voltage reduction chip is selected, the refrigerating current which is larger than that of the chips ADN8831, MAX1968 and the like can be provided, and the application range is wider.
Drawings
Fig. 1 is a block diagram of the structure of an embodiment of the present invention.
Fig. 2 is a circuit connection diagram of an embodiment of the invention.
Detailed Description
The invention is further described below with reference to the figures and examples.
Referring to fig. 1, an embodiment of the present invention provides an automatic control circuit for a laser thermoelectric refrigerator, including a main control circuit, a temperature control circuit, and a laser temperature sampling circuit.
Wherein the main control circuit includes main control chip 1, and main control chip 1 embeds peripheral hardware communication interface:
two independent analog-to-digital converters (AD1 and AD2) can be provided in the main control chip 1, the AD1 is used for sampling signals obtained by amplifying voltages at two ends of a Negative Temperature Coefficient thermistor (NTC) in the laser 2, the AD2 is used for acquiring voltage values at two ends of a sampling resistor connected with the TEC in series and obtaining a current value of the TEC, and meanwhile, a pulse width modulation signal PWM1 and an I2C signal can be provided in the chip and are respectively connected to the first voltage regulating resistor network 3 and used for regulating the first voltage regulating resistor network 3;
the peripheral hardware communication interface adopts a universal synchronous/asynchronous receiver/transmitter (USART) for connecting an upper computer, and the upper computer can monitor the temperature of the laser and the current of the TEC in real time through the interface and can adjust the current of the TEC according to the requirement.
In the embodiment, the main control chip 1 preferably adopts an STM32 series chip.
The temperature control circuit comprises a first voltage reduction chip 4, a second voltage reduction chip 5, a first voltage regulation resistor network 3, a second voltage regulation resistor network 9, a sampling resistor 7 and a TEC current operational amplifier 8
The laser temperature sampling circuit comprises an NTC current sampling unit 6. In the embodiment, the laser temperature sampling circuit adopts a thermistor linearization circuit and a high-precision operational amplifier. Since the thermistor and the temperature are in a nonlinear relationship, the output voltage of the temperature sampling circuit needs to be in a linear relationship with the temperature through the series resistor.
Referring to fig. 2, the temperature control circuit includes a first buck chip (denoted as U1), a second buck chip (denoted as U2), a first voltage regulating resistor network, a second voltage regulating resistor network, a sampling resistor and a TEC current amplifier. The output Vout1 of the first voltage reduction chip U1 is output in an adjustable mode within a certain range through a first voltage regulation resistor network; the output Vout2 of the second buck chip U2 is set to a fixed output through a second voltage regulating resistor network. The main control chip 1 is marked as U4 in the figure, and is implemented by an MCU (micro control unit) chip, wherein corresponding ports of AD1 and AD2 are marked as ADC1 and ADC2, respectively. The ADC2 in the MCU monitors the current of the TEC in real time by collecting the voltage amplified at the two ends of the sampling resistor R2.
As shown in fig. 2, U2 is a second buck chip, and has ports VCC, GND, SW and FB, where the output of the SW port is denoted as Vout2 and the output of the FB port is denoted as Vfb 2. The resistors R3 and R5 form a second voltage-regulating resistor network, R3 and R5 are disposed between FB (FEEDBACK terminal) and SW (SWITCH) of the second buck chip, and Vfb2 is the FEEDBACK voltage of the second buck chip. One end of R5 is connected to FB, the other end is grounded, and one end of R3 is connected to FB, the other end is connected to SW. In the specific implementation, Vfb2 is a fixed value, determined by chip U2,
as shown in FIG. 2, a high-precision current sampling resistor R2 is connected in series behind Vout2, and then connected to the negative pole of the TEC. The laser is denoted as U3 in the figure.
As shown in fig. 2, the TEC current operational amplifier is implemented by a high-precision operational amplifier U6, and the voltage across the R2 is amplified by the high-precision operational amplifier U6 and then is connected to the ADC2 port of the MCU, so as to monitor the current of the TEC in real time. R1 is the feedback resistance of the operational amplifier U6, and is connected between the output end and the inverting input end of U6.
As shown in fig. 2, the NTC current sampling unit 6 employs a temperature sampling circuit including an operational amplifier U7, R4, and R6, wherein R6 is a feedback resistor of the operational amplifier U7, and is connected between the output terminal and the inverting input terminal of U7; r4 is connected in series with a negative temperature coefficient thermistor NTC, which is an NTC linearization resistor. In the temperature sampling circuit, a series resistance method is used for carrying out linearization processing on the NTC of the negative temperature coefficient thermistor, Rtm is assumed to be the resistance value of the NTC at 25 ℃, and the real-time resistance values Rth and Rth of the thermistorRtm is related to formula 1:
wherein B and Rtm are constants related to the type of thermistor, T is the temperature to be measured, and T istmGenerally, 25 ℃ is selected, the relationship between Rth and the temperature T to be measured can be obtained, and meanwhile, the output of the temperature sampling circuit is expressed by formula 2:
wherein Vref is an external reference voltage, R4 is Rtm, wherein Rtm is a resistance value corresponding to the thermistor at 25 deg.C, and can be obtained by specification, and V can be obtained by substituting formula 1 into formula 2ADC1The relationship between the temperature T to be measured and the MCU real-time monitoring VADC1And then the current temperature value of the laser is quickly obtained by a table look-up method.
As shown in fig. 2, U1 is a first voltage-reducing chip, and resistors R7, R8, R9, R10, a transistor Q1, and an adjustable potentiometer U5 jointly form a first voltage-regulating resistor network. The first buck chip U1 has ports VCC, GND, SW and FB, with the output at the SW port being denoted as Vout1 and the output at the FB port being denoted as Vfb 1. R7 is connected in series between the FB port of U1 and the positive electrode of TEC, R8 is the FB pin ground resistance of U1, R9 is connected in series between the FB port of U1 and an external reference voltage Vref, R10 is connected in series with a digital potentiometer U5 and then connected in parallel with R9, the collector of a triode Q1 is connected in series with R10, and the base of a triode Q1 is connected with MCU. The adjustable potentiometer U5 is provided with a port W, H, SCL and an SDA, wherein the ports of the SCL and the SDA are correspondingly connected with the corresponding ports of the MCU, the port W is connected with a resistor R8, and the port H is connected with the collector of a triode Q1. Wherein, SCL is a serial clock line, SDA is a serial data line, H port is a digital potentiometer terminal, and W is a digital potentiometer adjusting terminal.
As shown in fig. 2, the MCU generates a PWM signal (denoted as PWM1) for controlling the switching of the Q1, and controls the resistance R of the digital potentiometer U5 via the serial data line (SDA) and the Serial Clock Line (SCL) of the two-wire system synchronous serial bus I2CU5And the resistance value change of the first voltage regulating resistor network is realized.
When Q1 is off, the current is measured by kirchhoff's current law,
available output of U1
When Q1 is conducted, R10 is not connected to the first voltage-regulating resistor network, and the output of U1 is known
Assuming that the duty cycle of the PWM1 is T, the theoretical real-time output Vout1 of U1 is V ″out1*T+V′out1(1-T). Thus, by adjusting the duty cycle of the PWM1 and the resistance of U5, regulation of Vout1 is achieved.
When V isADC1When the obtained temperature T is higher than the set laser working temperature, the MCU regulates Vout1 through PWM1 and U5 to ensure that Vout1>Vout2, where the TEC current flows from TEC + to TEC-, to cool the laser.
When V isADC1When the obtained temperature T is lower than the set laser working temperature, the MCU regulates Vout1 through PWM1 and U5 to ensure that Vout1<Vout2, where the TEC current flows from TEC-to TEC +, heating of the laser is achieved.
When T reaches the set temperature, the TEC keeps the current direction and magnitude unchanged, and the temperature is adjusted to the value T again after the temperature deviates.
The circuit realizes the closed-loop control of the temperature control of the TEC, and replaces the function of the conventional TEC temperature control chip. By selecting proper U1 and U2, different refrigeration current requirements can be met.
It is to be noted and understood that various modifications and improvements can be made to the invention described in detail above without departing from the spirit and scope of the invention as claimed in the appended claims. Accordingly, the scope of the claimed subject matter is not limited by any of the specific exemplary teachings provided.
Claims (5)
1. The automatic control circuit of the laser thermoelectric refrigerator is characterized in that: comprises a main control circuit, a temperature control circuit and a laser temperature sampling circuit,
the main control circuit comprises a main control chip (1), a peripheral hardware communication interface is arranged in the main control chip (1),
the main control chip (1) is provided with two analog-to-digital converters AD1 and AD2, the AD1 is used for signal sampling after voltage amplification at two ends of a negative temperature coefficient thermistor NTC in the laser (2), the AD2 is used for collecting voltage values at two ends of a sampling resistor connected with a TEC in series and used for obtaining a current value of the TEC, and meanwhile, the main control chip (1) is internally provided with a pulse width modulation signal PWM1 and an I2C signal which are respectively connected to the first voltage regulating resistor network (3) and used for regulation of the first voltage regulating resistor network (3); the TEC represents a thermoelectric refrigerator;
the peripheral hardware communication interface is used for connecting an upper computer to support real-time monitoring of the temperature of the laser and the current of the TEC and adjusting the current of the TEC according to the requirement;
the temperature control circuit comprises a first voltage reduction chip (4), a second voltage reduction chip (5), a first voltage regulation resistor network (3), a second voltage regulation resistor network (9), a sampling resistor (7) and a TEC current operational amplifier (8),
the first voltage reduction chip (4) is connected to the anode of the TEC, and the first voltage regulation resistor network (3) is connected with the first voltage reduction chip (4); the output Vout1 of the first buck chip (4) can be regulated through a first voltage regulating resistor network;
the second voltage reduction chip (5) is connected to the negative electrode of the TEC through a sampling resistor (7), and the second voltage regulation resistor network (9) is connected with the second voltage reduction chip (5);
the output Vout2 of the second buck chip (5) is set as a fixed output through a second voltage-regulating resistor network;
the sampling resistor (7) is connected to an analog-to-digital converter AD2 through a TEC current operational amplifier (8);
the laser temperature sampling circuit comprises an NTC current sampling unit (6), the NTC current sampling unit (6) is connected with a negative temperature coefficient thermistor NTC in the laser in series, and the output of the NTC current sampling unit (6) is connected to an analog-to-digital converter AD 1.
2. An automatic control circuit for a laser thermoelectric cooler as claimed in claim 1, wherein: the first voltage regulating resistor network (3) is realized by adopting an adjustable potentiometer.
3. An automatic control circuit for a laser thermoelectric cooler as claimed in claim 2, wherein: the pulse width modulation signal PWM1 provided in the main control chip (1) is used for controlling the switch of the adjustable potentiometer, and simultaneously, the resistance value of the adjustable potentiometer is controlled through the serial data line SDA and the serial clock line SCL of the two-wire system synchronous serial bus I2C, so that the resistance value change of the first voltage regulating resistor network is realized.
4. An automatic control circuit for a laser thermoelectric cooler as claimed in claim 1, wherein: the second voltage regulating resistor network (9) is realized by adopting a resistor.
5. An automatic control circuit of a laser thermoelectric cooler as claimed in claim 1 or 2 or 3 or 4, wherein: the NTC current sampling unit (6) carries out linear processing on the negative temperature coefficient thermistor NTC by using a series resistance method, and the main control chip (1) quickly obtains the current temperature value of the laser by obtaining the output of the temperature sampling circuit of the NTC current sampling unit (6) and looking up the table, thereby realizing real-time monitoring.
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| CN112290370B (en) * | 2020-10-28 | 2022-06-10 | 长飞光纤光缆股份有限公司 | ASE light source constant power control device and method |
| CN112462825B (en) * | 2020-11-18 | 2022-03-11 | 北京自动化控制设备研究所 | Low-power-consumption high-stability laser temperature closed-loop control system and method |
| CN113835455B (en) * | 2021-09-28 | 2023-01-24 | 太原理工大学 | Large-range high-precision temperature control system for chaotic semiconductor laser |
| CN117767754B (en) * | 2024-02-19 | 2024-05-10 | 成都芯正微电子科技有限公司 | Bipolar Buck output positive and negative adjustable current circuit |
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| US8051665B2 (en) * | 2006-12-12 | 2011-11-08 | Finisar Corporation | High efficiency thermoelectric cooler control system |
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| US5515682A (en) * | 1994-04-19 | 1996-05-14 | Fujitsu Limited | Peltier control circuit and a peltier device structure |
| CN203562639U (en) * | 2013-11-12 | 2014-04-23 | 深圳新飞通光电子技术有限公司 | TEC control circuit of EML laser |
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Effective date of registration: 20210924 Address after: 614222 No.2, chejian Road, Jiuli Town, Emeishan City, Leshan City, Sichuan Province Patentee after: Sichuan Lefei Photoelectric Technology Co.,Ltd. Address before: 430073 Optics Valley Avenue, East Lake New Technology Development Zone, Wuhan, Hubei, 9 Patentee before: YANGTZE OPTICAL FIBRE AND CABLE JOINT STOCK Ltd. |