CN111402220B - 用于获取信息的方法及装置 - Google Patents

用于获取信息的方法及装置 Download PDF

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CN111402220B
CN111402220B CN202010165825.4A CN202010165825A CN111402220B CN 111402220 B CN111402220 B CN 111402220B CN 202010165825 A CN202010165825 A CN 202010165825A CN 111402220 B CN111402220 B CN 111402220B
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image
sample
detected
defect
detection model
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CN111402220A (zh
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苏业
任思可
聂磊
黄锋
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Beijing Baidu Netcom Science and Technology Co Ltd
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Beijing Baidu Netcom Science and Technology Co Ltd
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Priority to CN202010165825.4A priority Critical patent/CN111402220B/zh
Publication of CN111402220A publication Critical patent/CN111402220A/zh
Priority to EP20913051.7A priority patent/EP3907697A4/en
Priority to JP2021541617A priority patent/JP2022526473A/ja
Priority to PCT/CN2020/116527 priority patent/WO2021179565A1/zh
Priority to KR1020217024357A priority patent/KR20210102458A/ko
Priority to US17/443,013 priority patent/US20220270228A1/en
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/70—Denoising; Smoothing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/90—Determination of colour characteristics
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/761—Proximity, similarity or dissimilarity measures
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30121—CRT, LCD or plasma display
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Databases & Information Systems (AREA)
  • General Health & Medical Sciences (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202010165825.4A 2020-03-11 2020-03-11 用于获取信息的方法及装置 Active CN111402220B (zh)

Priority Applications (6)

Application Number Priority Date Filing Date Title
CN202010165825.4A CN111402220B (zh) 2020-03-11 2020-03-11 用于获取信息的方法及装置
EP20913051.7A EP3907697A4 (en) 2020-03-11 2020-09-21 METHOD AND DEVICE FOR COLLECTING INFORMATION
JP2021541617A JP2022526473A (ja) 2020-03-11 2020-09-21 情報を取得するための方法および装置、電子機器、記憶媒体並びにコンピュータプログラム
PCT/CN2020/116527 WO2021179565A1 (zh) 2020-03-11 2020-09-21 用于获取信息的方法及装置
KR1020217024357A KR20210102458A (ko) 2020-03-11 2020-09-21 정보를 취득하는 방법 및 장치
US17/443,013 US20220270228A1 (en) 2020-03-11 2021-07-19 Method and apparatus for obtaining information

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CN202010165825.4A CN111402220B (zh) 2020-03-11 2020-03-11 用于获取信息的方法及装置

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CN111402220A CN111402220A (zh) 2020-07-10
CN111402220B true CN111402220B (zh) 2023-06-09

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EP (1) EP3907697A4 (https=)
JP (1) JP2022526473A (https=)
KR (1) KR20210102458A (https=)
CN (1) CN111402220B (https=)
WO (1) WO2021179565A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111402220B (zh) * 2020-03-11 2023-06-09 北京百度网讯科技有限公司 用于获取信息的方法及装置
CN113781460A (zh) * 2021-09-16 2021-12-10 北京远舢智能科技有限公司 烟包外观缺陷在线检测方法、装置、电子设备和存储介质
CN114463282B (zh) * 2022-01-13 2024-10-22 江苏六道建材有限公司 缺陷检测方法、装置、电子设备和计算机可读介质
CN116823714A (zh) * 2022-03-28 2023-09-29 日本碍子株式会社 工件的检查装置及方法
CN114913121A (zh) * 2022-03-31 2022-08-16 联想(北京)有限公司 一种屏幕缺陷检测系统、方法、电子设备及可读存储介质
CN115131327B (zh) * 2022-07-14 2024-04-30 电子科技大学 一种颜色特征融合的显示屏彩色线缺陷检测方法
CN115601341A (zh) * 2022-10-26 2023-01-13 上海闻泰信息技术有限公司（Cn） Pcba板缺陷检测方法、系统、设备、介质及产品
CN115980077A (zh) * 2023-01-17 2023-04-18 清燃修复质检科技(佛山)有限公司 缺陷检测方法、装置、丝网检测设备及存储介质
CN116936389B (zh) * 2023-06-02 2024-09-03 江苏第三代半导体研究院有限公司 缺陷诊断方法、电子设备、存储介质及程序产品
CN116990450B (zh) * 2023-07-18 2024-04-26 欧几里德(苏州)医疗科技有限公司 一种角膜塑形镜的缺陷检测方法及系统

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018000731A1 (zh) * 2016-06-28 2018-01-04 华南理工大学 一种曲面表面缺陷自动检测方法及其装置
CN109829483A (zh) * 2019-01-07 2019-05-31 鲁班嫡系机器人（深圳）有限公司 缺陷识别模型训练方法、装置、计算机设备和存储介质
CN109978870A (zh) * 2019-03-29 2019-07-05 北京百度网讯科技有限公司 用于输出信息的方法和装置
CN110009614A (zh) * 2019-03-29 2019-07-12 北京百度网讯科技有限公司 用于输出信息的方法和装置
CN110148130A (zh) * 2019-05-27 2019-08-20 北京百度网讯科技有限公司 用于检测零件缺陷的方法和装置
CN110517259A (zh) * 2019-08-30 2019-11-29 北京百度网讯科技有限公司 一种产品表面状态的检测方法、装置、设备及介质

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4906609B2 (ja) * 2007-06-29 2012-03-28 キヤノン株式会社 撮像装置および方法
JP5175916B2 (ja) * 2010-11-11 2013-04-03 トヨタ自動車東日本株式会社 部品検索システム
JP6403261B2 (ja) * 2014-12-03 2018-10-10 タカノ株式会社 分類器生成装置、外観検査装置、分類器生成方法、及びプログラム
KR101531530B1 (ko) * 2014-12-31 2015-06-25 (주)스타넥스 이미지 분석 방법, 장치 및 컴퓨터로 판독가능한 장치
US20180322623A1 (en) * 2017-05-08 2018-11-08 Aquifi, Inc. Systems and methods for inspection and defect detection using 3-d scanning
US11710289B2 (en) * 2017-06-29 2023-07-25 Sony Interactive Entertainment Inc. Information processing apparatus, information processing system, and material identification method
CN111108368B (zh) * 2017-09-19 2022-06-28 富士胶片株式会社 教学数据制作方法及装置以及缺陷检查方法及装置
JP2019212073A (ja) * 2018-06-06 2019-12-12 アズビル株式会社 画像判別装置および方法
JPWO2020008538A1 (ja) * 2018-07-03 2020-07-27 三菱電機株式会社 材質推定装置及びロボット
CN109949286A (zh) * 2019-03-12 2019-06-28 北京百度网讯科技有限公司 用于输出信息的方法和装置
CN109961433A (zh) * 2019-03-29 2019-07-02 北京百度网讯科技有限公司 产品缺陷检测方法、装置及计算机设备
CN110276754B (zh) * 2019-06-21 2021-08-20 厦门大学 一种表面缺陷检测方法、终端设备及存储介质
US12307668B2 (en) * 2019-07-12 2025-05-20 Bruker Nano, Inc Methods and systems for defects detection and classification using X-rays
CN110378900B (zh) * 2019-08-01 2020-08-07 北京迈格威科技有限公司 产品缺陷的检测方法、装置及系统
CN110751177A (zh) * 2019-09-17 2020-02-04 阿里巴巴集团控股有限公司 分类模型的训练方法、预测方法及装置
CN111402220B (zh) * 2020-03-11 2023-06-09 北京百度网讯科技有限公司 用于获取信息的方法及装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018000731A1 (zh) * 2016-06-28 2018-01-04 华南理工大学 一种曲面表面缺陷自动检测方法及其装置
CN109829483A (zh) * 2019-01-07 2019-05-31 鲁班嫡系机器人（深圳）有限公司 缺陷识别模型训练方法、装置、计算机设备和存储介质
CN109978870A (zh) * 2019-03-29 2019-07-05 北京百度网讯科技有限公司 用于输出信息的方法和装置
CN110009614A (zh) * 2019-03-29 2019-07-12 北京百度网讯科技有限公司 用于输出信息的方法和装置
CN110148130A (zh) * 2019-05-27 2019-08-20 北京百度网讯科技有限公司 用于检测零件缺陷的方法和装置
CN110517259A (zh) * 2019-08-30 2019-11-29 北京百度网讯科技有限公司 一种产品表面状态的检测方法、装置、设备及介质

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Deposition uniformity inspection in ic wafer surface;Li W C等;《Journal of physics:conference series》;第483卷(第1期);第1-6页 *
基于R-FCN深层卷积神经网络的金属冲压件表面缺陷检测;苑丹丹等;《工程机械》(第1期);第8+36-43页 *

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WO2021179565A1 (zh) 2021-09-16
EP3907697A1 (en) 2021-11-10
US20220270228A1 (en) 2022-08-25
EP3907697A4 (en) 2022-11-30
KR20210102458A (ko) 2021-08-19
CN111402220A (zh) 2020-07-10
JP2022526473A (ja) 2022-05-25

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