CN111398644B - Mutual inductor handover test switching device and switching method thereof - Google Patents

Mutual inductor handover test switching device and switching method thereof Download PDF

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CN111398644B
CN111398644B CN202010246613.9A CN202010246613A CN111398644B CN 111398644 B CN111398644 B CN 111398644B CN 202010246613 A CN202010246613 A CN 202010246613A CN 111398644 B CN111398644 B CN 111398644B
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secondary winding
switching
test
port
mutual inductor
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CN111398644A (en
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史纯清
岑荣佳
罗家猛
黄俊澄
易洵
刘超
田小林
肖玉斌
张健华
赵鹏程
罗芳
刘昌宏
石廷章
犹永开
杨大明
柏文健
赖罗彬
吴昊
杨凌典
文雯
禹海林
余钢
王江会
冯明宇
张莹
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Guizhou Power Grid Co Ltd
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Guizhou Power Grid Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/20Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
    • G01R27/205Measuring contact resistance of connections, e.g. of earth connections
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14Circuits therefor, e.g. for generating test voltages, sensing circuits

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

The invention discloses a mutual inductor handover test switching device and a switching method thereof, wherein the switching device comprises four switching loops, namely: the first group of secondary winding switching circuits, the second group of secondary winding switching circuits, the third group of secondary winding switching circuits and the fourth group of secondary winding switching circuits respectively comprise I + input ends, I-input ends, U + input ends, U-input ends, a first switching switch, a second switching switch, an output end E, an output end L and an output end D, the I + input ends and the U + input ends are connected to one end of the secondary winding of the mutual inductor in parallel, the I-input ends and the U-input ends are connected to the other end of the secondary winding of the mutual inductor in parallel, the I + input ends are respectively connected to the output end D and the I-input ends through the first switching switch, and the I-input ends are respectively connected to the output end E and the output end L through the second switching switch. The invention can test the mutual inductor with no more than 4 groups of secondary windings, has simple switching loop and convenient switching, quickly realizes test when the mutual inductor is connected, shortens the test time and improves the test efficiency.

Description

Mutual inductor handover test switching device and switching method thereof
Technical Field
The invention relates to a mutual inductor handover test switching device and a switching method thereof, and belongs to the technical field of mutual inductor handover test equipment.
Background
When we test the mutual inductor at present, the test items are as follows:
insulation test Characteristic test
1. Primary to secondary insulation resistance 4. Transformation ratio
2. Primary to secondary AC withstand voltage 5. Excitation characteristic, polarity correction, secondary winding direct resistance
3. Insulation resistance of secondary winding earthing
During the test, there are two problems:
in a first aspect: in the above test items, the positions of the test wires required to be accessed to the secondary terminals are different, the short circuit states of the outlet terminals of the secondary windings are different, and testers are required to frequently change the positions of the test wires accessed to the secondary terminals and the short circuit states of the secondary terminals to meet the requirements of various tests, which wastes time and labor. The specific problems are as follows:
(1) when the mutual inductor is subjected to primary to secondary insulation resistance and primary to secondary alternating current withstand voltage tests, the tests can be carried out only after the mutual inductor is subjected to primary short circuit and all outlet terminals of a secondary winding are subjected to short circuit grounding.
(2) When the mutual inductor is subjected to an insulation resistance test of grounding between secondary windings, the outlet terminal of the tested secondary winding of the mutual inductor needs to be in short circuit, and the outlet terminal of the non-tested secondary winding needs to be in short circuit and grounded, so that the grounding test among the secondary windings can be completed. The more secondary windings are, the more short circuit conversion times are, and the more test line conversion times are.
(3) When the transformer is subjected to the transformation ratio test, the outgoing line terminal of the tested secondary winding of the transformer needs to be opened and connected into the test line, and the outgoing line terminal of the non-tested secondary winding is in short circuit and grounded, so that the transformation ratio test of each secondary winding can be completed. The more secondary windings, the more times the short-circuit is switched. The more test line changes.
(4) When the excitation characteristic, the polarity correction and the direct current resistance test of the secondary winding are carried out on the mutual inductor, the outlet terminal of the tested secondary winding of the mutual inductor needs to be opened and connected with a test wire, and the outlet terminal of the non-tested secondary winding is opened, so that the test can be finished. The more secondary windings, the more test line changes.
And (3) summarizing problems:
in the above tests, the position of the test wire connected to the secondary terminal and the short circuit state of the secondary winding outgoing line terminal are required as follows:
Figure BDA0002434132030000021
in order to solve the problem that the short-circuit state of the test wire and the secondary terminal needs to be frequently changed during the test of the transformer, a fast, convenient and reliable switching device is very necessary to be developed to solve the problems.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the utility model provides a mutual inductor handover test switching device and a switching method thereof, which are used for solving the problems in the prior art.
The technical scheme adopted by the invention is as follows: the utility model provides an experimental auto-change over device of mutual-inductor handing-over, includes four groups switching circuit, is respectively: the first group of secondary winding switching circuits, the second group of secondary winding switching circuits, the third group of secondary winding switching circuits and the fourth group of secondary winding switching circuits respectively comprise I + input ends, I-input ends, U + input ends, U-input ends, a first switching switch, a second switching switch, an output end E, an output end L and an output end D, the I + input ends and the U + input ends are connected to one end of the secondary winding of the mutual inductor in parallel, the I-input ends and the U-input ends are connected to the other end of the secondary winding of the mutual inductor in parallel, the I + input ends are respectively connected to the output end D and the I-input ends through the first switching switch, and the I-input ends are respectively connected to the output end E and the output end L through the second switching switch.
Preferably, the I + input end and the U + input end and the I-input end and the U-input end are respectively connected to two wiring jacks at the tail ends of the two test wire clamps.
Preferably, the switching device further comprises a junction box, a plurality of wire insertion holes are formed in the junction box, and the I + input end, the I-input end, the U + input end, the U-input end, the output end E, the output end L and the output end D are arranged on the junction box.
A switching method of a mutual inductor handover test switching device comprises a primary insulation resistance test switching method, a secondary insulation resistance test switching method of grounding between secondary windings, a transformation ratio test switching method, an excitation characteristic and polarity correction test switching method and a direct current resistance test switching method;
the method for switching the primary insulation resistance test to the secondary insulation resistance test comprises the following steps: the P1 end and the P2 end of the primary winding of the mutual inductor are short-circuited, four change-over switches in a first group of secondary winding change-over circuits, a second group of secondary winding change-over circuits, a third group of secondary winding change-over circuits and a fourth group of secondary winding change-over circuits of the change-over device are all switched to the I-input end corresponding to each change-over switch, the port 1S1 and the port 1S2 of the secondary winding 1S of the mutual inductor, the port 2S1 and the port 2S2 of the 2S, the port 3S1 and the port 3S2 of the 3S and the port 4S1 and the port 4S2 of the 4S are all in short circuit, four change-over switches in a first group of secondary winding switching loop, a second group of secondary winding switching loop, a third group of secondary winding switching loop and a fourth group of secondary winding switching loop of the switching device are switched to an output end E, the secondary windings 1S-4S of the mutual inductor are all in a grounding state, and the mutual inductor is subjected to a secondary insulation resistance test for the first time; when a primary-pair secondary alternating current withstand voltage test is carried out, a high-voltage output line of the alternating current withstand voltage test device is connected to a P1 end and a P2 end of a primary winding of the mutual inductor, and the primary-pair secondary alternating current withstand voltage test is carried out on the mutual inductor;
the insulation resistance test switching method for grounding between the secondary windings comprises the following steps: keeping the state of the switching device in the primary-to-secondary insulation resistance test, switching the two output ends L of the switch in the first group of secondary windings of the switching device, wherein the port 1S1 and the port 1S2 of the secondary winding 1S of the mutual inductor are short-circuited to the output end L, the ports 2S1 and 2S2, the port 3S1 and the port 3S2 of the secondary winding 2S of the mutual inductor and the ports 4S1 and 4S2 of the secondary winding 4S of the mutual inductor are short-circuited and in the grounding state, performing the insulation resistance test of grounding between the secondary winding 1S and the secondary winding 2S, the secondary winding 3S and the secondary winding 4S on the mutual inductor, performing the insulation resistance test of grounding between the secondary winding 2S and the secondary winding 1S, the secondary winding 3S and the secondary winding 4S on the mutual inductor, and performing the insulation resistance test of grounding between the secondary winding 1S and the secondary winding 4S on the secondary winding 1S, When the insulation resistance between the secondary winding 2S and the secondary winding 3S is grounded, the switching method is the same as that of the secondary winding 1S;
the switching method of the transformation ratio test comprises the following steps: keeping a switching device state when the secondary winding 1S performs insulation resistance tests on the secondary windings 2S, 3 and 4S, the first switching switch in a first group of secondary winding switching loops of the switching device is switched to an output end D, at the moment, an open circuit is formed between a port 1S1 and a port 1S2 of the secondary winding 1S of the transformer, ports 2S1 and 2S2 of the secondary winding 2S of the transformer, a port 3S1 and a port 3S2 of the secondary winding 3S and ports 4S1 and 4S2 of the secondary winding 1S of the transformer are all in a short circuit state and are in a grounding state, a transformation ratio test of the primary winding P and the secondary winding 1S is performed on the transformer, and when the transformation ratio tests of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the primary winding P and the secondary winding 4S are performed, the switching method is the same as that when the secondary winding 1S tests are performed;
the excitation characteristic and polarity correction switching test method comprises the following steps: keeping the state of the switching device during the transformation ratio test of the primary winding P and the secondary winding 1S, switching three first switching switches in a second group of secondary winding switching loops, a third group of secondary winding switching loops and a fourth group of secondary winding switching loops of the switching device to a disconnected state, disconnecting the grounding on the output end E, and at the moment, opening a circuit between a port 1S1 and a port 1S2 of the secondary winding 1S of the transformer; the port 2S1 and the port 2S2 of the secondary winding 2S of the mutual inductor, the port 3S1 and the port 3S2 of the 3S, the port 4S1 and the port 4S2 of the 4S are all open-circuited and are in an ungrounded state, the mutual inductor is subjected to an excitation characteristic test of the primary winding P and the secondary winding 1S, and the switching method is the same as that of the excitation characteristic test of the secondary winding 1S when the excitation characteristics of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the primary winding P and the secondary winding 4S are tested;
when the polarity correction test is carried out, a high-voltage side test wire of the mutual inductor characteristic tester is connected to a P1 end and a P2 end of a primary winding of the mutual inductor, a low-voltage side test wire of the mutual inductor characteristic tester is connected to an output end L and an output end D, the polarity correction test of the primary winding P and a secondary winding 1S is carried out on the mutual inductor, and when the polarity correction test of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the polarity correction test of the primary winding P and the secondary winding 4S are carried out, the polarity correction test is the same as that of the secondary winding 1S;
the switching method of the direct current resistance test comprises the following steps: keeping the state of a switching device in the excitation characteristic and polarity correction test, wherein an open circuit is formed between the port 1S1 and the port 1S2 of the secondary winding 1S of the transformer; the ports 2S1 and 2S2 of the secondary winding 2S of the mutual inductor, the ports 3S1 and 3S2 of the 3S and the ports 4S1 and 4S2 of the 4S are all open-circuited and in an ungrounded state, and the switching method is the same as the direct current resistance test of the secondary winding 1S when the direct current resistance test of the secondary winding 2S, the secondary winding 3S and the secondary winding 4S is carried out.
The invention has the beneficial effects that: compared with the prior art, the invention has the following effects:
(1) the invention adopts four groups of switching loops, can test the mutual inductor which is not more than 4 groups of secondary windings, the switching loops are simple and convenient to switch, the first switching switch and the second switching switch can realize the adjustment (disconnection and connection to two output ends) of three positions, the insulation resistance test, the transformation ratio test, the mutual inductor characteristic test and the direct current resistance test when the mutual inductor is connected are quickly realized, when all tests of the mutual inductor are completed, the functions of open circuit, short circuit and grounding operation of the secondary side winding can be quickly completed only by switching of the switching device, the test time is shortened, and the test efficiency is improved;
(6) the mode that the I + input end and the U + input end and the I-input end and the U-input end share one test wire clamp is adopted, so that the equipment is simplified, the operation is easy, the connection is reliable, the probability of short circuit of terminals between secondary windings is reduced, and the test safety is improved;
(7) the switching device is simple in structure, the plugging test line is convenient and fast to use and reasonable in layout, plugging of the corresponding sockets is conveniently and fast realized, plugging errors are avoided, and wiring and short connection of the secondary winding of the mutual inductor are fast completed through switching of the switching device. The test time is shortened, and the test efficiency is improved; the panel of the switching device is provided with an identification reticle (switching loop diagram) of a switching loop, so that staff can conveniently master wiring requirements under various test items at any time, the teaching of the staff is facilitated, the test of the test items is standardized, and the accuracy of test data is ensured;
(8) according to the switching method, the shared part between the previous time and the next time can be utilized, and the connection of the conducting wire and the switching of the change-over switch are reduced, so that the test efficiency is greatly improved, the test time is shortened, the problem that the position of the test wire and the short-circuit state of a secondary terminal need to be frequently changed when the test wire and the short-circuit wire are accessed is effectively solved, and the purpose of reliable and quick test is achieved.
Drawings
FIG. 1 is a schematic view of the connection structure of the present invention;
FIG. 2 is a schematic view of a locking connection of the test clamp;
FIG. 3 is a schematic structural view of a test clip;
FIG. 4 is a schematic diagram of a groove structure at a clamping screw of the test clamp;
FIG. 5 is a schematic diagram of a switching loop;
FIG. 6 is a schematic diagram of a primary to secondary insulation resistance test switching circuit;
FIG. 7 is a schematic diagram of an insulation resistance test switching circuit between secondary windings and ground;
FIG. 8 is a schematic diagram of a ratio-change trial switching circuit;
FIG. 9 is a schematic diagram of a switching circuit for excitation characteristic and polarity calibration tests;
FIG. 10 is a schematic diagram of a DC resistance test switching circuit;
FIG. 11 is a perspective view of the switching device;
fig. 12 is a schematic top view of the switching device.
Detailed Description
The invention is further described with reference to the accompanying drawings and specific embodiments.
Example 1: as shown in fig. 1 to 12, a switching device for mutual inductor handover test includes four switching loops, which are respectively: the first group of secondary winding switching circuits, the second group of secondary winding switching circuits, the third group of secondary winding switching circuits and the fourth group of secondary winding switching circuits respectively comprise I + input ends, I-input ends, U + input ends, U-input ends, a first switching switch, a second switching switch, an output end E, an output end L and an output end D, the I + input ends and the U + input ends are connected to one end of the secondary winding of the mutual inductor in parallel, the I-input ends and the U-input ends are connected to the other end of the secondary winding of the mutual inductor in parallel, the I + input ends are respectively connected to the output end D and the I-input ends through the first switching switch, and the I-input ends are respectively connected to the output end E and the output end L through the second switching switch.
The first group of secondary winding switching loops consists of switching switches S1 and S5, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines.
The second group of secondary winding switching loops consists of the switching switches S2 and S6, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines.
The third group of secondary winding switching loop consists of switching switches S3 and S7, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines;
the fourth group of secondary winding switching loops consists of switching switches S4 and S8, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines;
preferably, the I + input end and the U + input end and the I-input end and the U-input end are respectively connected to two wiring jacks at the tail ends of the two test wire clamps.
Preferably, the switching device 2 further includes a junction box 201, the junction box 201 is provided with a plurality of wire insertion holes 202 for an I + input end, an I-input end, a U + input end, a U-input end, an output end E, an output end L and an output end D, the wire insertion holes 202 for the I + input end, the I-input end, the U + input end and the U-input end of each secondary winding terminal are located at the rear side of the upper end face of the junction box 201, the wire insertion holes 202 for the output end E, the output end L and the output end D are located at the right lower side of the upper end face of the junction box 201, a first switch 203 and a second switch 203 connected to each secondary winding terminal are arranged at the upper end face of the junction box 201 near the longitudinal middle portion, and the upper surface of the junction box 201 is provided with an identification reticle 204 of a switching loop corresponding to the wire insertion holes 202 and the switch knobs 203.
Example 2: a switching method of a mutual inductor handover test switching device comprises a primary insulation resistance test switching method, a secondary insulation resistance test switching method of grounding between secondary windings, a transformation ratio test switching method, an excitation characteristic and polarity correction test switching method and a direct current resistance test switching method;
the method for switching the primary insulation resistance test to the secondary insulation resistance test comprises the following steps: the P1 end and the P2 end of the primary winding of the transformer are in short circuit, four change-over switches in a first group of secondary winding switch circuit, a second group of secondary winding switch circuit, a third group of secondary winding switch circuit and a fourth group of secondary winding switch circuit of the switching device are all switched to the I-input end corresponding to each change-over switch, the port 1S1 and the port 1S2 of the secondary winding 1S of the mutual inductor, the port 2S1 and the port 2S2 of the 2S, the port 3S1 and the port 3S2 of the 3S and the port 4S1 and the port 4S2 of the 4S are all in short circuit, four change-over switches in a first group of secondary winding switching loop, a second group of secondary winding switching loop, a third group of secondary winding switching loop and a fourth group of secondary winding switching loop of the switching device are switched to an output end E, the secondary windings 1S-4S of the mutual inductor are all in a grounding state, and the mutual inductor is subjected to a secondary insulation resistance test for the first time; when a primary-pair secondary alternating current withstand voltage test is carried out, a high-voltage output line of the alternating current withstand voltage test device is connected to a P1 end and a P2 end of a primary winding of the mutual inductor, and the primary-pair secondary alternating current withstand voltage test is carried out on the mutual inductor;
the insulation resistance test switching method for grounding between the secondary windings comprises the following steps: keeping the state of the switching device in the primary-to-secondary insulation resistance test, switching the two output ends L of the switch in the first group of secondary windings of the switching device, wherein the port 1S1 and the port 1S2 of the secondary winding 1S of the mutual inductor are short-circuited to the output end L, the ports 2S1 and 2S2, the port 3S1 and the port 3S2 of the secondary winding 2S of the mutual inductor and the ports 4S1 and 4S2 of the secondary winding 4S of the mutual inductor are short-circuited and in the grounding state, performing the insulation resistance test of grounding between the secondary winding 1S and the secondary winding 2S, the secondary winding 3S and the secondary winding 4S on the mutual inductor, performing the insulation resistance test of grounding between the secondary winding 2S and the secondary winding 1S, the secondary winding 3S and the secondary winding 4S on the mutual inductor, and performing the insulation resistance test of grounding between the secondary winding 1S and the secondary winding 4S on the secondary winding 1S, When the insulation resistance between the secondary winding 2S and the secondary winding 3S is grounded, the switching method is the same as that of the secondary winding 1S;
the switching method of the transformation ratio test comprises the following steps: keeping a switching device state when the secondary winding 1S performs insulation resistance tests on the secondary windings 2S, 3 and 4S, the first switching switch in a first group of secondary winding switching loops of the switching device is switched to an output end D, at the moment, an open circuit is formed between a port 1S1 and a port 1S2 of the secondary winding 1S of the transformer, ports 2S1 and 2S2 of the secondary winding 2S of the transformer, a port 3S1 and a port 3S2 of the secondary winding 3S and ports 4S1 and 4S2 of the secondary winding 1S of the transformer are all in a short circuit state and are in a grounding state, a transformation ratio test of the primary winding P and the secondary winding 1S is performed on the transformer, and when the transformation ratio tests of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the primary winding P and the secondary winding 4S are performed, the switching method is the same as that when the secondary winding 1S tests are performed;
the excitation characteristic and polarity correction switching test method comprises the following steps: keeping the state of the switching device during the transformation ratio test of the primary winding P and the secondary winding 1S, switching three first switching switches in a second group of secondary winding switching loops, a third group of secondary winding switching loops and a fourth group of secondary winding switching loops of the switching device to a disconnected state, disconnecting the grounding on the output end E, and at the moment, opening a circuit between a port 1S1 and a port 1S2 of the secondary winding 1S of the transformer; the port 2S1 and the port 2S2 of the secondary winding 2S of the mutual inductor, the port 3S1 and the port 3S2 of the 3S, the port 4S1 and the port 4S2 of the 4S are all open-circuited and are in an ungrounded state, the mutual inductor is subjected to an excitation characteristic test of the primary winding P and the secondary winding 1S, and the switching method is the same as that of the excitation characteristic test of the secondary winding 1S when the excitation characteristics of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the primary winding P and the secondary winding 4S are tested;
when the polarity correction test is carried out, a high-voltage side test wire of the mutual inductor characteristic tester is connected to a P1 end and a P2 end of a primary winding of the mutual inductor, a low-voltage side test wire of the mutual inductor characteristic tester is connected to an output end L and an output end D, the polarity correction test of the primary winding P and a secondary winding 1S is carried out on the mutual inductor, and when the polarity correction test of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the polarity correction test of the primary winding P and the secondary winding 4S are carried out, the polarity correction test is the same as that of the secondary winding 1S;
the switching method of the direct current resistance test comprises the following steps: keeping the state of a switching device in the excitation characteristic and polarity correction test, wherein an open circuit is formed between the port 1S1 and the port 1S2 of the secondary winding 1S of the transformer; the ports 2S1 and 2S2 of the secondary winding 2S of the mutual inductor, the ports 3S1 and 3S2 of 3S, and the ports 4S1 and 4S2 of 4S are all open-circuited and in an ungrounded state, and when the direct current resistance test is carried out on the secondary winding 2S, the secondary winding 3S and the secondary winding 4S, the switching method is the same as that of the direct current resistance test of the secondary winding 1S.
Example 3: as shown in fig. 1-12, a mutual inductor handover test switching device comprises a test wire clamp 1, a switching device 2 and a tester 3, wherein the test wire clamp 1 is connected to an input end of the switching device 2 through a test wire, a test port of the switching device 2 is connected to the tester 3, the test wire clamp 1 can clamp and hit a screw of a secondary side terminal of a mutual inductor, the switching device 2 is used for wiring and short-circuiting a secondary winding of the mutual inductor, and the tester 3 comprises an insulation resistance tester, a transformation ratio tester, a mutual inductor characteristic tester and a direct current resistance tester.
Preferably, the test wire clamp 1 adopts an alligator clamp structure, and includes two chucks 101 rotatably connected to each other and a return spring located at the rotary connection position of the two chucks 101, two symmetrical arc-shaped engaging jaws 104 are provided at the front ends of the two chucks 101, the two arc-shaped engaging jaws 104 can clamp the periphery of a screw on a transformer and a groove between gaskets, as shown in fig. 4, a wiring socket 105 is provided at the tail end of the two chucks 101.
Preferably, a locking screw 102 is installed in the middle of the front ends of the two chucks 101, the locking screw 102 passes through the two chucks 101 and is screwed to one of the two chucks 101 and movably passes through the other of the two chucks 101, the through hole of the locking screw 102 passing through the other of the two chucks 101 is a strip-shaped through hole 103, and the strip-shaped through hole 103 is arranged along the length direction of the two chucks 101.
Preferably, each of the arcuate engaging jaws 104 is a thin sheet integrated with the chuck, and an arcuate groove is formed in the middle of the sheet near the engaging side.
Preferably, each arcuate biting jaw 104 tapers in thickness toward the biting side.
Preferably, the switching device 2 includes four switching circuits, which are respectively: the first group of secondary winding switching circuits, the second group of secondary winding switching circuits, the third group of secondary winding switching circuits and the fourth group of secondary winding switching circuits respectively comprise I + input ends, I-input ends, U + input ends, U-input ends, a first switching switch, a second switching switch, an output end E, an output end L and an output end D, the I + input ends and the U + input ends are connected to one end of the secondary winding of the mutual inductor in parallel, the I-input ends and the U-input ends are connected to the other end of the secondary winding of the mutual inductor in parallel, the I + input ends are respectively connected to the output end D and the I-input ends through the first switching switch, and the I-input ends are respectively connected to the output end E and the output end L through the second switching switch.
The first group of secondary winding switching loops consists of switching switches S1 and S5, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines.
The second group of secondary winding switching loops consists of the switching switches S2 and S6, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines.
The third group of secondary winding switching loop consists of switching switches S3 and S7, a test wire output socket (I +, U +; U-, U +) and a corresponding connecting wire;
the fourth group of secondary winding switching loops consists of switching switches S4 and S8, test line output sockets (I +, U +; U-, U +) and corresponding connecting lines;
preferably, the I + input end and the U + input end and the I-input end and the U-input end are respectively connected to two wiring jacks at the tail ends of the two test wire clamps.
Preferably, the switching device 2 further includes a junction box 201, the junction box 201 is provided with a plurality of wire insertion holes 202 for an I + input end, an I-input end, a U + input end, a U-input end, an output end E, an output end L and an output end D, the wire insertion holes 202 for the I + input end, the I-input end, the U + input end and the U-input end of each secondary winding terminal are located at the rear side of the upper end face of the junction box 201, the wire insertion holes 202 for the output end E, the output end L and the output end D are located at the right lower side of the upper end face of the junction box 201, a first switch 203 and a second switch 203 connected to each secondary winding terminal are arranged at the upper end face of the junction box 201 near the longitudinal middle portion, and the upper surface of the junction box 201 is provided with an identification reticle 204 of a switching loop corresponding to the wire insertion holes 202 and the switch knobs 203.
Example 4: a test method of a mutual inductor handover test switching device comprises the following steps: according to the test sequence of the mutual inductor test items, firstly carrying out an insulation test and then carrying out a characteristic test. The following is a description of switching during testing by the switching device according to this test procedure: before testing, firstly, testing lines L1-L8 and testing line output sockets I + and U + in the switching loops of the first, second, third and fourth groups of secondary windings of the switching device are tested; u-and U + are respectively connected, and then the other ends of the test lines L1-L8 are respectively connected with 1S1 and 1S2 of the secondary winding 1S of the transformer; 2S1, 2S 2; 3S1, 3S2 of 3S; 4S1 and 4S2 are connected, the end E of the test port is grounded, and a primary insulation resistance test, a secondary insulation resistance test of grounding between secondary windings, a transformation ratio test, an excitation characteristic and polarity correction test and a direct current resistance test are carried out.
The method for testing the primary insulation resistance and the secondary insulation resistance comprises the following steps: when a secondary insulation resistance test is carried out, the ends P1 and P2 of the primary winding (P) of the transformer are in short circuit, and the change-over switches S1-S4 in the first, second, third and fourth groups of secondary winding change-over loops of the change-over device are changed to the positions in the figure 6, at the moment, 1S1 and 1S2 of the secondary winding 1S of the transformer are conducted; 2S1 and 2S 2; 3S1 and 3S 2; 4S1 and 4S2 are all short-circuited, and the change-over switches S5-S8 in the first, second, third and fourth groups of secondary winding switching loops of the switching device are switched to the positions in FIG. 6, so that the secondary windings 1S-4S of the mutual inductor are in the grounding state. And connecting an L-end test wire of the insulation resistance tester to the short-circuit ends of P1 and P2 of a primary winding (P) of the transformer, grounding the E end of the insulation resistance tester, and carrying out a primary-to-secondary insulation resistance test on the transformer. When a primary-pair secondary alternating current withstand voltage test is carried out, a high-voltage output line of the alternating current withstand voltage test device is connected to short-circuit ends P1 and P2 of a primary winding (P) of the transformer, and a primary-pair secondary alternating current withstand voltage test is carried out on the transformer;
the test method of the insulation resistance of the grounding between the secondary windings comprises the following steps: after the primary-to-secondary insulation resistance test is completed, the insulation resistance test between the secondary windings and the ground can be performed, and the insulation resistance test between the secondary windings 2S, 3S and 4S and the ground by the secondary winding 1S is taken as an example for explanation, in the state of the switching device maintained during the primary-to-secondary insulation resistance test, the switching switches S1 and S5 in the switching device first group of secondary winding switching loops are switched to the positions in fig. 7 (only the position of S5 needs to be switched actually), and the switching switches S2 to S4 and S6 to S8 in the switching device second, third and fourth groups of secondary winding switching loops are switched to the positions in fig. 7 (the state during the primary-to-secondary insulation resistance test is maintained actually without switching), at which time, the 1S1 and 1S2 of the transformer secondary winding 1S are short-circuited but not grounded; 2S1 and 2S2 of the transformer secondary winding 2S; 3S1 and 3S2 of 3S; 4S1 and 4S2 are shorted and grounded. Test lines of the insulation resistance tester are connected to the test ports L and E. At this time, the insulation resistance test of the secondary winding 1S, the secondary windings 2S, 3S and 4S and the ground can be carried out on the mutual inductor. When the other secondary windings 2S, 3S and 4S are tested, the switching principle is the same;
the transformation ratio test method comprises the following steps: after the insulation resistance test of the secondary winding 1S to the secondary windings 2S, 3S, 4S and to the ground is completed, the transformation ratio test can be performed, and the transformation ratio test of the primary winding P and the secondary winding 1S will be described as an example: in the state of the switching device maintained during the insulation resistance test of the secondary winding 1S to the secondary windings 2S, 3S and 4S and the ground, the switches S1 and S5 in the first group of secondary winding switching circuits of the switching device are switched to the positions in fig. 8 (only the position of S1 is actually switched), and the switches S2 to S4 and S6 to S8 in the second, third and fourth groups of secondary winding switching circuits of the switching device are switched to the positions in fig. 8 (the state of the secondary winding 1S to the secondary windings 2S, 3S and 4S and the ground during the insulation resistance test is actually maintained without switching), so that the transformer secondary winding 1S is open-circuited between 1S1 and 1S 2; 2S1 and 2S2 of the transformer secondary winding 2S; 3S1 and 3S2 of 3S; 4S1 and 4S2 are shorted and grounded. And connecting a high-voltage side test wire of the transformation ratio tester to the ends P1 and P2 of the primary winding (P) of the transformer. The low side test line of the ratio tester is connected to the test ports L and D on the switching device. Then, the transformer can be subjected to a transformation ratio test of the primary winding P and the secondary winding 1S. When the transformation ratio of the other secondary windings 2S, 3S and 4S is tested, the switching principle is the same;
the method for calibrating the excitation characteristic and the polarity comprises the following steps: after the transformation ratio test of the primary winding P and the secondary winding 1S is completed, the excitation characteristic and polarity calibration test can be performed, and the excitation characteristic and polarity calibration test of the primary winding P and the secondary winding 1S is described as an example: in the state of the switching device maintained during the transformation ratio test of the primary winding P and the secondary winding 1S, the switches S1 and S5 in the first group of secondary winding switching circuits of the switching device are switched to the positions in FIG. 9 (the state of the primary winding P and the secondary winding 1S during the transformation ratio test is maintained actually, and the switches are not switched), the switches S2-S4 in the second, third and fourth groups of secondary winding switching circuits of the switching device are switched to the positions in FIG. 9, the grounding on the end E of the test port is disconnected, and at the moment, the 1S1 and 1S2 of the secondary winding 1S of the transformer are opened; 2S1 and 2S2 of the transformer secondary winding 2S; 3S1 and 3S2 of 3S; 4S between 4S1 and 4S2 are both open and in an ungrounded state. And connecting the test wires of the transformer characteristic tester to the test ports L and D on the switching device. At this time, the excitation characteristics of the primary winding P and the secondary winding 1S of the transformer can be tested. The switching principle is the same for the excitation characteristic tests of the other secondary windings 2S, 3S, 4S.
When the polarity correction test is carried out, a high-voltage side test wire of the transformer characteristic tester is connected to the ends P1 and P2 of the primary winding (P) of the transformer. And connecting a low-voltage side test line of the transformer characteristic tester to the test ports L and D. The polarity correction test of the primary winding P and the secondary winding 1S can be carried out on the mutual inductor. When the polarity of the other secondary windings 2S, 3S and 4S is subjected to a polarity correction test, the switching principle is the same;
the direct current resistance test method comprises the following steps: after the excitation characteristic and polarity correction test of the primary winding P and the secondary winding 1S is completed, the dc resistance test may be performed, and the dc resistance test of the secondary winding 1S will be described below by taking as an example the dc resistance test of the secondary winding 1S, in the state of the switching device maintained in the excitation characteristic and polarity correction test, the switches S1 and S5 in the first group of secondary winding switching circuits of the switching device are switched to the positions in fig. 10 (the state in the excitation characteristic and polarity correction test is maintained actually, and switching is not required), the switches S2 to S4 in the second, third, and fourth groups of secondary winding switching circuits of the switching device are switched to the positions in fig. 10 (the state in the excitation characteristic and polarity correction test is maintained actually, and switching is not required), the ground at the test port E is disconnected (the state in the excitation characteristic and polarity correction test is maintained actually, and switching is not required), at the moment, 1S1 and 1S2 of the secondary winding 1S of the transformer are opened; 2S1 and 2S2 of the transformer secondary winding 2S; 3S1 and 3S2 of 3S; 4S between 4S1 and 4S2 are both open and in an ungrounded state. The test lines of the dc resistance tester are connected to the test ports L and D on the switching device. At this time, the direct current resistance test of the secondary winding 1S can be performed on the transformer. When the direct current resistance tests of the other secondary windings 2S, 3S and 4S are carried out, the switching principle is the same.
Mutual-inductor handing-over test device has following advantage:
(1) the test wire clamp is connected with the switching device through the test wire clamp, the switching device and different testers, the switching device is connected to the secondary winding of the mutual inductor at one time, the position is switched through the switching device and the different testers are connected, insulation resistance testing, transformation ratio testing, mutual inductor characteristic testing and direct current resistance testing during mutual inductor connection are achieved, when various tests of the mutual inductor are completed, the functions of open circuit, short circuit and grounding operation of the secondary winding can be completed quickly only through switching of the switching device, testing time is shortened, and testing efficiency is improved; the current transformer can be applied to current transformers of various voltage grades, and can also be applied to voltage transformers of various voltage grades;
(2) the arc-shaped occluding jaw utilizes the groove as a fixed point of the test wire clamp, and the original test wire clamp can only be clamped outside the screw and cannot be clamped in the groove between the screw and the gasket;
(3) because the test wire clamp is clamped by the counterforce of the spring, a locking screw is added between the middle parts of the front ends of two chucks (an upper chuck and a lower chuck) of the test wire clamp for locking, and the locking screw can ensure that the circular arc jaw at the front end of the test wire clamp can not slip off from the screw due to external force after the test wire clamp is clamped on the clamping screw, and the test wire clamp is convenient to design and operate and can be screwed in by a single hand. After the circular arc jaw at the front end of the test wire clamp is meshed with the screw groove, the screw is screwed in and fixed, so that the upper chuck and the lower chuck of the test wire clamp are relatively fixed, the phenomenon that the jaw of the test wire clamp is opened by the reaction elasticity of a spring under the action of external force, the test wire clamp is easy to slip and fall off is avoided, and the problem that the upper chuck and the lower chuck cannot be screwed in due to interference between the upper chuck and the screw due to over-positioning can be avoided;
(4) the arc-shaped occlusion jaw with the sheet structure is convenient to adapt to screws connected with secondary windings on mutual inductors with different sizes, and the gradually-thinned structure is adopted, so that the test wire clamp is conveniently clamped in the irregular groove to the maximum extent, the clamping is stable and reliable, and the electric conduction is more reliable;
(5) the four groups of switching loops are adopted, so that a mutual inductor with the secondary windings not more than 4 groups can be tested, the switching loops are simple and convenient to switch, and the first switching switch and the second switching switch can realize the adjustment of three positions (disconnection and connection to two output ends);
(6) the mode that the I + input end and the U + input end and the I-input end and the U-input end share one test wire clamp is adopted, so that the equipment is simplified, the operation is easy, the connection is reliable, the probability of short circuit of terminals between secondary windings is reduced, and the test safety is improved;
(7) the switching device is simple in structure, the plugging test line is convenient and fast to use and reasonable in layout, plugging of the corresponding sockets is conveniently and fast realized, plugging errors are avoided, and wiring and short connection of the secondary winding of the mutual inductor are fast completed through switching of the switching device. The test time is shortened, and the test efficiency is improved; the panel of the switching device is provided with an identification reticle (switching loop diagram) of a switching loop, so that staff can conveniently master wiring requirements under various test projects at any time, the teaching of the staff is facilitated, the test of the test projects is standardized, and the accuracy of test data is ensured;
(8) the cross-over test method can utilize the shared part between the front and the back, reduce the connection of the conducting wire and the switching of the change-over switch, thereby greatly improving the test efficiency, shortening the test time, effectively solving the problems that the test wire is easy to slip when being connected with the short-circuit wire and the position of the test wire and the short-circuit state of the secondary terminal need to be frequently changed, and achieving the purpose of reliable and rapid test.
The above description is only an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present invention, and therefore, the scope of the present invention should be determined by the scope of the claims.

Claims (3)

1. The utility model provides an experimental auto-change over device of mutual-inductor handing-over which characterized in that: the switching device (2) comprises four switching loops, which are respectively: the first group of secondary winding switching circuits, the second group of secondary winding switching circuits, the third group of secondary winding switching circuits and the fourth group of secondary winding switching circuits respectively comprise I + input ends, I-input ends, U + input ends, U-input ends, a first switching switch, a second switching switch, an output end E, an output end L and an output end D, wherein the I + input ends and the U + input ends are connected to one end of the secondary winding of the mutual inductor in parallel, the I-input ends and the U-input ends are connected to the other end of the secondary winding of the mutual inductor in parallel, the I + input ends are respectively connected to the output end D and the I-input ends through one switching switch, and the I-input ends are respectively connected to the output end E and the output end L through two switching switches; a switching method of a mutual inductor handover test switching device comprises a primary insulation resistance test switching method to a secondary insulation resistance test switching method, an insulation resistance test switching method of grounding between secondary windings, a transformation ratio test switching method, an excitation characteristic and polarity correction test switching method and a direct current resistance test switching method which are sequentially carried out; the switching method for the primary insulation resistance test and the secondary insulation resistance test comprises the following steps: the P1 end and the P2 end of the primary winding of the mutual inductor are short-circuited, four change-over switches in a first group of secondary winding change-over circuits, a second group of secondary winding change-over circuits, a third group of secondary winding change-over circuits and a fourth group of secondary winding change-over circuits of the change-over device are all switched to the I-input end corresponding to each change-over switch, the port 1S1 and the port 1S2 of the secondary winding 1S of the mutual inductor, the port 2S1 and the port 2S2 of the 2S, the port 3S1 and the port 3S2 of the 3S and the port 4S1 and the port 4S2 of the 4S are all in short circuit, four change-over switches in a first group of secondary winding switching loop, a second group of secondary winding switching loop, a third group of secondary winding switching loop and a fourth group of secondary winding switching loop of the switching device are switched to an output end E, the secondary windings 1S-4S of the mutual inductor are all in a grounding state, and the mutual inductor is subjected to a secondary insulation resistance test for the first time; when a primary-pair secondary alternating current withstand voltage test is carried out, a high-voltage output line of the alternating current withstand voltage test device is connected to a P1 end and a P2 end of a primary winding of the mutual inductor, and the primary-pair secondary alternating current withstand voltage test is carried out on the mutual inductor; the insulation resistance test switching method for grounding between the secondary windings comprises the following steps: keeping the state of the switching device in the primary-to-secondary insulation resistance test, switching the two output ends L of the switch in the first group of secondary windings of the switching device, wherein the port 1S1 and the port 1S2 of the secondary winding 1S of the mutual inductor are short-circuited to the output end L, the ports 2S1 and 2S2, the port 3S1 and the port 3S2 of the secondary winding 2S of the mutual inductor and the ports 4S1 and 4S2 of the secondary winding 4S of the mutual inductor are short-circuited and in the grounding state, performing the insulation resistance test of grounding between the secondary winding 1S and the secondary winding 2S, the secondary winding 3S and the secondary winding 4S on the mutual inductor, performing the insulation resistance test of grounding between the secondary winding 2S and the secondary winding 1S, the secondary winding 3S and the secondary winding 4S on the mutual inductor, and performing the insulation resistance test of grounding between the secondary winding 1S and the secondary winding 4S on the secondary winding 1S, When the insulation resistance between the secondary winding 2S and the secondary winding 3S is grounded, the switching method is the same as that of the secondary winding 1S; the switching method of the transformation ratio test comprises the following steps: keeping a switching device state when the secondary winding 1S performs insulation resistance tests on the secondary windings 2S, 3 and 4S, the first switching switch in a first group of secondary winding switching loops of the switching device is switched to an output end D, at the moment, an open circuit is formed between a port 1S1 and a port 1S2 of the secondary winding 1S of the transformer, ports 2S1 and 2S2 of the secondary winding 2S of the transformer, a port 3S1 and a port 3S2 of the secondary winding 3S and ports 4S1 and 4S2 of the secondary winding 1S of the transformer are all in a short circuit state and are in a grounding state, a transformation ratio test of the primary winding P and the secondary winding 1S is performed on the transformer, and when the transformation ratio tests of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the primary winding P and the secondary winding 4S are performed, the switching method is the same as that when the secondary winding 1S tests are performed; the excitation characteristic and polarity correction switching test method comprises the following steps: keeping the state of the switching device during the transformation ratio test of the primary winding P and the secondary winding 1S, switching three first switching switches in a second group of secondary winding switching loops, a third group of secondary winding switching loops and a fourth group of secondary winding switching loops of the switching device to a disconnected state, disconnecting the grounding on the output end E, and at the moment, opening a circuit between a port 1S1 and a port 1S2 of the secondary winding 1S of the transformer; the port 2S1 and the port 2S2 of the secondary winding 2S of the mutual inductor, the port 3S1 and the port 3S2 of the 3S, the port 4S1 and the port 4S2 of the 4S are all open-circuited and are in an ungrounded state, the mutual inductor is subjected to an excitation characteristic test of the primary winding P and the secondary winding 1S, and the switching method is the same as that of the excitation characteristic test of the secondary winding 1S when the excitation characteristics of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the primary winding P and the secondary winding 4S are tested; when the polarity correction test is carried out, a high-voltage side test wire of the mutual inductor characteristic tester is connected to a P1 end and a P2 end of a primary winding of the mutual inductor, a low-voltage side test wire of the mutual inductor characteristic tester is connected to an output end L and an output end D, the polarity correction test of the primary winding P and a secondary winding 1S is carried out on the mutual inductor, and when the polarity correction test of the primary winding P and the secondary winding 2S, the primary winding P and the secondary winding 3S and the polarity correction test of the primary winding P and the secondary winding 4S are carried out, the polarity correction test is the same as that of the secondary winding 1S; the switching method of the direct current resistance test comprises the following steps: keeping the state of a switching device in the excitation characteristic and polarity correction test, wherein an open circuit is formed between the port 1S1 and the port 1S2 of the secondary winding 1S of the transformer; the ports 2S1 and 2S2 of the secondary winding 2S of the mutual inductor, the ports 3S1 and 3S2 of the 3S and the ports 4S1 and 4S2 of the 4S are all open-circuited and in an ungrounded state, and the switching method is the same as the direct current resistance test of the secondary winding 1S when the direct current resistance test of the secondary winding 2S, the secondary winding 3S and the secondary winding 4S is carried out.
2. The instrument transformer handover test switching device according to claim 1, wherein: the I + input end and the U + input end and the I-input end and the U-input end are respectively connected to two wiring jacks at the tail ends of the two test wire clamps.
3. The instrument transformer handover test switching device according to claim 1, wherein: also comprises a junction box (201), the junction box (201) is provided with an I + input end, an I-input end, a U + input end, a U-input end and an output end E, a plurality of plug wire holes (202) of output L and output D, the I + input of connecting every secondary winding terminal, the I-input, plug wire hole (202) of U + input and U-input are located junction box (201) up end rear side, output E, plug wire hole (202) of output L and output D are located junction box (201) up end right side downside, change over knob (203) of change over switch one and change over switch two of connecting every secondary winding terminal arranges and is close to vertical middle part at junction box (201) up end, junction box (201) upper surface corresponds plug wire hole (202) and change over knob (203) department and sets up sign marking line (204) of switching circuit.
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