CN111366887A - Mutual inductor transient sampling precision calibration method, device, terminal and medium - Google Patents
Mutual inductor transient sampling precision calibration method, device, terminal and medium Download PDFInfo
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- CN111366887A CN111366887A CN202010345855.3A CN202010345855A CN111366887A CN 111366887 A CN111366887 A CN 111366887A CN 202010345855 A CN202010345855 A CN 202010345855A CN 111366887 A CN111366887 A CN 111366887A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Abstract
The application discloses a transformer transient sampling precision verification method, a device, a terminal and a medium, the method is based on first fault recording data serving as reference data and second fault recording data serving as data to be verified, difference calculation is carried out on sampling point data under fault transient in the first fault recording data and the second fault recording data, Fourier transformation is carried out on the difference to obtain a difference effective value, and then a comparison result of the difference effective value and a preset error threshold value is used as a precision verification result of a transformer to be verified, so that the technical problem that the existing transformer precision verification error is large due to the fact that sampling accuracy in a transient process is unstable in the existing transformer is solved.
Description
Technical Field
The application relates to the field of data processing, in particular to a method, a device, a terminal and a medium for verifying transient sampling precision of a mutual inductor.
Background
In recent years, with the maturity of power system intelligent technologies, devices with fault recording functions, such as relay protection devices and fault recorders, have been widely used in power systems. In an electric power system, a mutual inductor occupies an important position as an indispensable measuring unit in fault recorder equipment, and the mutual inductor has different errors in different measuring ranges and directly influences the acquisition precision of a relay protection device and a fault recorder. With the continuous development of the smart power grid, the system scale is larger and larger, the voltage level is higher and higher, the structure is more and more complex, particularly, the transient process influenced by various factors when a fault occurs is very complex, and the influence on the sampling precision of the mutual inductor is the most serious.
At present, an electromagnetic mutual inductor is adopted in an acquisition unit of fault recording equipment, primary large current is converted into secondary small current according to a transformation ratio through magnetic coupling between a primary side coil, a secondary side coil and an iron core, the existing calibration mode is based on comparison and calibration of numerical values obtained through sampling, but the existing mutual inductor also has the problem of unstable sampling accuracy in a transient process, and further the technical problem of large precision calibration error of the existing mutual inductor is caused.
Disclosure of Invention
The application provides a transformer transient sampling precision calibration method, a device, a terminal and a medium, which are used for solving the technical problem of large precision calibration error of the existing transformer.
In view of this, the first aspect of the present application provides a method for verifying transient sampling accuracy of a transformer, including:
acquiring first fault recording data and second fault recording data, wherein the first fault recording data are fault recording data generated by a reference transformer based on a fault event, and the second fault recording data are fault recording data generated by a transformer to be verified based on the fault event;
determining sampling intervals of the first fault recording data and the second fault recording data based on a fault time node of the first fault recording data, and respectively obtaining a first sampling signal and a second sampling signal by sampling the recording data in the sampling intervals;
according to the voltage amplitude difference value of each first signal sampling point and each second signal sampling point, performing signal alignment on the first sampling signal and the second sampling signal, and extracting a first sampling signal point and a second sampling signal point in a transient interval, wherein the first signal sampling point is a sampling point in the first sampling signal, and the second signal sampling point is a sampling point in the second sampling signal;
calculating difference values of all sampling point combinations one by one, and performing Fourier transform on the difference values to obtain difference value effective values of the sampling point combinations, wherein the sampling point combinations are combinations of the first sampling points and the second sampling points, the first sampling points are sampling points in the first signal sampling points, and the second sampling points are sampling points in the second signal sampling points, which are aligned with the first sampling points;
and comparing the effective difference value with a preset error threshold value to obtain a precision checking result of the mutual inductor to be checked.
Optionally, the performing, according to the voltage amplitude difference value between each first sampling point and each second sampling point, signal alignment on the first sampling signal and the second sampling signal specifically includes:
respectively calculating the voltage amplitude variance of each first sampling point and each second sampling point according to the voltage amplitude difference value of each first sampling point and each second sampling point, and determining a first reference sampling point and a second reference sampling point corresponding to the minimum voltage amplitude variance;
and performing signal alignment on the first sampling signal and the second sampling signal by taking the first reference sampling point and the second reference sampling point as references.
Optionally, obtaining the first sampling signal and the second sampling signal further includes:
and acquiring sampling rate parameters of the first sampling signal and the second sampling signal, and if the sampling rate parameter of the first sampling signal is greater than the sampling rate parameter of the second sampling signal, interpolating the second sampling signal according to the sampling rate parameter of the second sampling signal.
Optionally, the determining, based on the fault time node of the first fault recording data, the sampling interval of the first fault recording data and the sampling interval of the second fault recording data specifically include:
determining a fault time node according to the first fault recording data;
determining a first time node and a second time node according to a preset time span threshold value by taking the fault time node as a reference, wherein the first time node is smaller than the second time node, and the difference value between the first time node and the fault time node and the difference value between the second time node and the fault time node are equal to the time span threshold value;
and determining the sampling interval of the first fault recording data and the second fault recording data by taking the first time node and the second time node as the upper limit and the lower limit of the sampling interval.
Optionally, the method further comprises:
when the number of the second fault recording data is multiple, extracting a first transient abrupt change phase parameter and a first steady-state amplitude parameter of the first fault recording data, and a second transient abrupt change phase parameter and a second steady-state amplitude parameter of each second fault recording data;
and comparing the first transient abrupt phase difference parameter with each second transient abrupt phase difference parameter, comparing the first steady-state amplitude parameter with each second steady-state amplitude parameter, and determining second fault recording data which are the same as the transient abrupt phase difference parameter of the first fault recording data and have the smallest error of the steady-state amplitude parameter.
Optionally, after the extracting the first sampled signal point and the second sampled signal point in the transient interval, the method further includes:
and comparing the transient interval lengths of the first sampling signal and the second sampling signal, and adjusting the transient interval lengths of the first sampling signal and the second sampling signal by taking the minimum transient interval length as a reference.
Optionally, the comparing the effective difference value with a preset error threshold to obtain an accuracy verification result of the transformer to be verified specifically includes:
and comparing the effective difference value with a preset error threshold, and outputting a verification failure result when the data volume of the effective difference value larger than the error threshold exceeds a preset proportion.
The second aspect of the present application provides a mutual inductor transient sampling precision calibration apparatus, including:
the device comprises a wave recording data acquisition unit, a first fault wave recording data acquisition unit and a second fault wave recording data acquisition unit, wherein the first fault wave recording data is fault wave recording data generated by a reference mutual inductor based on a fault event, and the second fault wave recording data is fault wave recording data generated by the mutual inductor to be verified based on the fault event;
the data sampling unit is used for determining sampling intervals of the first fault recording data and the second fault recording data based on the fault time node of the first fault recording data, and respectively obtaining a first sampling signal and a second sampling signal by sampling the recording data in the sampling intervals;
the transient interval sampling point extraction unit is used for aligning the first sampling signals and the second sampling signals according to voltage amplitude difference values of the first signal sampling points and the second signal sampling points and extracting first sampling signal points and second sampling signal points in a transient interval, wherein the first signal sampling points are sampling points in the first sampling signals, and the second signal sampling points are sampling points in the second sampling signals;
the effective value of difference calculating unit is used for calculating the difference of each sampling point combination one by one and carrying out Fourier transform on the difference to obtain the effective value of the difference of the sampling point combination, wherein the sampling point combination is the combination of the first sampling point and the second sampling point, the first sampling point is the sampling point in the first signal sampling point, and the second sampling point is the sampling point in the second signal sampling point, which is aligned with the first sampling point;
and the error comparison unit is used for comparing the effective difference value with a preset error threshold value to obtain a precision verification result of the mutual inductor to be verified.
A third aspect of the present application provides a terminal, comprising: a memory and a processor;
the memory is used for storing a program code corresponding to the transformer transient sampling precision checking method in the first aspect of the application;
the processor is configured to execute the program code.
A fourth aspect of the present application provides a storage medium, where a program code corresponding to the transformer transient sampling precision verification method according to the first aspect of the present application is stored in the storage medium.
According to the technical scheme, the embodiment of the application has the following advantages:
the application provides a method for verifying transient sampling precision of a mutual inductor, which comprises the following steps: acquiring first fault recording data and second fault recording data, wherein the first fault recording data are fault recording data generated by a reference transformer based on a fault event, and the second fault recording data are fault recording data generated by a transformer to be verified based on the fault event; determining sampling intervals of the first fault recording data and the second fault recording data based on a fault time node of the first fault recording data, and respectively obtaining a first sampling signal and a second sampling signal by sampling the recording data in the sampling intervals; according to the voltage amplitude difference value of each first signal sampling point and each second signal sampling point, performing signal alignment on the first sampling signal and the second sampling signal, and extracting a first sampling signal point and a second sampling signal point in a transient interval, wherein the first signal sampling point is a sampling point in the first sampling signal, and the second signal sampling point is a sampling point in the second sampling signal; calculating difference values of all sampling point combinations one by one, and performing Fourier transform on the difference values to obtain difference value effective values of the sampling point combinations, wherein the sampling point combinations are combinations of the first sampling points and the second sampling points, the first sampling points are sampling points in the first signal sampling points, and the second sampling points are sampling points in the second signal sampling points, which are aligned with the first sampling points; and comparing the effective difference value with a preset error threshold value to obtain a precision checking result of the mutual inductor to be checked.
Based on first fault recording data serving as datum data and second fault recording data serving as data to be verified, difference value calculation is carried out on sampling point data under fault transient state in the first fault recording data and the second fault recording data, Fourier transformation is carried out on the difference values, a difference value effective value is obtained, a comparison result of the difference value effective value and a preset error threshold value is used as a precision verification result of the mutual inductor to be verified, and the technical problem that existing mutual inductors are large in precision verification errors due to the fact that sampling accuracy in the transient process of existing mutual inductors is unstable is solved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic flowchart of a first embodiment of a transformer transient sampling precision verification method provided in the present application;
fig. 2 is a schematic flowchart of a method for verifying transient sampling accuracy of a transformer according to a second embodiment of the present disclosure;
fig. 3 is a schematic structural diagram of a first embodiment of a transformer transient sampling precision verifying apparatus provided in the present application.
Detailed Description
At present, the acquisition units of fault recording equipment all adopt electromagnetic transformers, primary large current is converted into secondary small current according to a transformation ratio through magnetic coupling between a primary side coil, a secondary side coil and an iron core, but the existing transformers also have the problem of unstable sampling accuracy in a transient process, if the numerical value obtained based on actual sampling is compared with a reference value and verified according to the existing verification mode, when the sampling value is larger, misoperation is easily caused, and when the sampling value is smaller, the potential hazard of the transformers cannot be found, so that the technical problem of large precision verification error of the existing transformers is caused.
The embodiment of the application provides a method, a device, a terminal and a medium for verifying transient sampling precision of a mutual inductor, which are used for solving the technical problem of large precision verification error of the existing mutual inductor.
In order to make the objects, features and advantages of the present invention more apparent and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the embodiments described below are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, a first embodiment of the present application provides a method for verifying transient sampling accuracy of a transformer, including:
The first fault recording data are fault recording data generated by the reference transformer based on a fault event, and the second fault recording data are fault recording data generated by the transformer to be verified based on the fault event.
And 103, performing signal alignment on the first sampling signal and the second sampling signal according to the voltage amplitude difference value of each first signal sampling point and each second signal sampling point, and extracting a first sampling signal point and a second sampling signal point in the transient interval.
The first signal sampling point is a sampling point in the first sampling signal, and the second signal sampling point is a sampling point in the second sampling signal.
It should be noted that, based on the first sampling signal and the second sampling signal extracted from the first fault recording data and the second fault recording data, the amplitude comparison of the sampling points in the two sampling signals is performed, and signal alignment is performed on the two homologous sampling signals, so as to perform subsequent signal processing.
And step 104, calculating the difference value of each sampling point combination one by one, and performing Fourier transform on the difference value to obtain the effective value of the difference value of the sampling point combination.
The sampling point combination is a combination of a first sampling point and a second sampling point, the first sampling point is a sampling point in the first signal sampling points, and the second sampling point is a sampling point in the second signal sampling points, which is aligned with the first sampling point.
It should be noted that, based on the aligned first sampling signal and the aligned second sampling signal, each aligned first sampling point and each aligned second sampling point may be divided into a plurality of groups of sampling point combinations, then the difference value of each sampling point combination is calculated in sequence, and the difference value is subjected to fourier transform to obtain the difference value effective value of the sampling point combination.
And 105, comparing the effective value of the difference value with a preset error threshold value to obtain a precision checking result of the mutual inductor to be checked.
The embodiment of the application is based on first fault recording data serving as reference data and second fault recording data serving as data to be verified, difference value calculation is carried out on sampling point data under a fault transient state in the first fault recording data and the second fault recording data, Fourier transformation is carried out on the difference values to obtain difference value effective values, comparison results of the difference value effective values and preset error threshold values are used as precision verification results of the mutual inductor to be verified, and the technical problem that existing mutual inductors are large in precision verification errors due to the fact that sampling accuracy in the transient process of the existing mutual inductors is unstable is solved.
The above is a detailed description of a first embodiment of a transformer transient sampling precision verification method provided by the present application, and the following is a detailed description of a second embodiment of the transformer transient sampling precision verification method provided by the present application.
Referring to fig. 2, based on the first embodiment, a method for verifying transient sampling accuracy of a transformer according to a second embodiment of the present application includes:
The first fault recording data are fault recording data generated by the reference transformer based on a fault event, and the second fault recording data are fault recording data generated by the transformer to be verified based on the fault event.
It should be noted that step 202 and step 203 in this embodiment belong to optional steps, and because the existing startup wave recording algorithms are various in variety, some startup wave recording algorithms can produce multiple wave recording files based on multiple wave recording channels with the same fault event, and when the second fault wave recording data is multiple, the wave recording files of the fault wave recorder are analyzed, the secondary values of the corresponding channels are read, and whether the searched channels have sudden changes is determined according to the following criteria:
||A(t+2*N)-A(t-N)|-|A(t+N)-A(t)||≥Kf*In(1)
where a (t) is the instantaneous sampling value of the channel, N is the number of sampling points per cycle, Kf is the coefficient of variation, which is generally 0.25, and In is the rated value of the channel. In order to ensure that transient sudden change can be accurately obtained in the system oscillation process, the out-of-limit auxiliary criterion of a channel effective value is adopted, and the channel out-of-limit action criterion is as follows:
ΔIφ＞1.25ΔIT+ΔIset(φ＝A,B,C)(2)
in the formula: delta IφEffective value of the channel, Δ ITThe floating threshold, typically load current or voltage, is defaulted to the effective value of the first cycle, Δ I, under the channelsetAnd (3) setting a starting fixed value for the channel out of limit, wherein the starting fixed value is generally 0.2In, when any channel mutation quantity meets a starting threshold, the channel meets a mutation condition, and the mutation value and a steady state value In a previous period of mutation are recorded.
And (3) carrying out mutation analysis on the wave recording files of the relay protection device in sequence, counting mutation quantity and phase difference of a channel of each wave recording file according to the formulas (1) and (2), when the phase difference meeting the mutation quantity is consistent and the error of a steady state value is within 5%, successfully matching the wave recording files, entering the next step, and otherwise, continuously searching and circulating in sequence.
And step 206, determining the sampling intervals of the first fault recording data and the second fault recording data by taking the first time node and the second time node as the upper limit and the lower limit of the sampling interval. And respectively obtaining a first sampling signal and a second sampling signal by sampling the recording data in the sampling interval.
Taking the first fault recording data as an example, first, a time node of the fault occurrence in the current fault recording data is obtained, and is recorded as T, and recording files in a time range of T1(T1 is T- Δ T) before the current time and T2(T2 is T + Δ T) after the current time, that is, [ T + Δ T ] are obtained1，T2]The first fault recording data in between is the first sampling signal, where Δ t is a fixed time range, preferably 5 s.
And step 207, acquiring sampling rate parameters of the first sampling signal and the second sampling signal, and if the sampling rate parameter of the first sampling signal is greater than the sampling rate parameter of the second sampling signal, interpolating the second sampling signal according to the sampling rate parameter of the second sampling signal.
It should be noted that, when the sampling accuracy specifications of the reference transformer and the transformer to be verified are inconsistent, a situation of data inconsistency occurs, generally, the accuracy of the reference transformer is generally higher, and at this time, interpolation processing may be performed on the second sampling signal with lower accuracy.
And step 208, respectively calculating the voltage amplitude variance of each first sampling point and each second sampling point according to the voltage amplitude difference value of each first sampling point and each second sampling point, and determining a first reference sampling point and a second reference sampling point corresponding to the minimum voltage amplitude variance.
Calculating the difference value of the values of the taken intervals:
θ[i]＝P[i]-Q[i](3)
in the formula: and theta [ i ] is the difference value of the first sampling point P [ i ] and the second sampling point Q [ i ] in the interval, and the standard deviation is calculated for theta and is marked as f (theta).
And 209, performing signal alignment on the first sampling signal and the second sampling signal by taking the first reference sampling point and the second reference sampling point as references.
The first signal sampling point is a sampling point in the first sampling signal, and the second signal sampling point is a sampling point in the second sampling signal.
It should be noted that, since the voltage values of the same voltage class are the same before the fault, it can be considered that the data with the smallest standard deviation and the similarity of the waveforms are the closest, so the point with the smallest variance, that is, the point where the two recording files are precisely aligned, is taken to perform signal alignment on the two homologous sampling signals, and the point is taken as a reference to extract the transient data segment for subsequent signal processing.
The length normalization processing of the transient data window is to avoid the problem of errors in the comparison process caused by inconsistent lengths of the transient data, firstly, the length of the transient data window is normalized, and according to the unified recording data, the duration time of each transient is obtained and is respectively marked as t _ A and t _ B, and then the unified time is t and meets the following formula (4).
And step 211, calculating the difference value of each sampling point combination one by one, and performing Fourier transform on the difference value to obtain the effective value of the difference value of the sampling point combination.
The sampling point combination is a combination of a first sampling point and a second sampling point, the first sampling point is a sampling point in the first signal sampling points, and the second sampling point is a sampling point in the second signal sampling points, which is aligned with the first sampling point.
It should be noted that, based on the aligned first sampling signal and the aligned second sampling signal, each aligned first sampling point and each aligned second sampling point may be divided into a plurality of groups of sampling point combinations, then a difference value of each sampling point combination is sequentially calculated, which is denoted as d (i), and the difference value is subjected to fourier transform to obtain a difference value effective value f (i) of the sampling point combination.
And step 212, comparing the difference effective value with a preset error threshold, and outputting a verification failure result when the data quantity of the difference effective value larger than the error threshold exceeds a preset proportion.
And combining the calculated difference effective values, taking the range of F (i) < delta max (delta max is the maximum error value) t, and when the sampling value exceeds the range, increasing the sampling error of the transient data and performing data early warning.
The above is a detailed description of a second embodiment of the transformer transient sampling precision verification method provided by the present application, and the following is a detailed description of a first embodiment of the transformer transient sampling precision verification apparatus provided by the present application.
Referring to fig. 3, a third embodiment of the present application provides a device for verifying transient sampling precision of a transformer, including:
the wave recording data acquisition unit 301 is configured to acquire first fault wave recording data and second fault wave recording data, where the first fault wave recording data is fault wave recording data generated by a reference transformer based on a fault event, and the second fault wave recording data is fault wave recording data generated by a transformer to be verified based on the fault event;
the data sampling unit 302 is configured to determine sampling intervals of the first fault recording data and the second fault recording data based on a fault time node of the first fault recording data, and obtain a first sampling signal and a second sampling signal by sampling the recording data in the sampling intervals;
the transient interval sampling point extracting unit 303 is configured to perform signal alignment on the first sampling signal and the second sampling signal according to a voltage amplitude difference value between each first signal sampling point and each second signal sampling point, and extract a first sampling signal point and a second sampling signal point in a transient interval, where the first signal sampling point is a sampling point in the first sampling signal, and the second signal sampling point is a sampling point in the second sampling signal;
the difference effective value calculating unit 304 is configured to calculate differences of each combination of sampling points one by one, and perform fourier transform on the differences to obtain difference effective values of the combinations of sampling points, where the combination of sampling points is a combination of a first sampling point and a second sampling point, the first sampling point is a sampling point in a first signal sampling point, and the second sampling point is a sampling point in a second signal sampling point, which is aligned with the first sampling point;
and the error comparing unit 305 is configured to compare the effective difference value with a preset error threshold value, and obtain a precision verification result of the transformer to be verified.
The above is a detailed description of a first embodiment of the transformer transient sampling precision verifying apparatus provided by the present application, and the following is a detailed description of a terminal and a storage medium provided by the present application.
A fourth embodiment of the present application provides a terminal, including: a memory and a processor;
the memory is used for storing program codes corresponding to the transformer transient sampling precision checking method in the first aspect of the application;
the processor is used for executing the program codes.
A fifth embodiment of the present application provides a storage medium, where a program code corresponding to the transformer transient sampling precision verification method according to the first aspect of the present application is stored in the storage medium.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of a unit is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The terms "first," "second," "third," "fourth," and the like in the description of the application and the above-described figures, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.
Claims (10)
1. A transformer transient sampling precision calibration method is characterized by comprising the following steps:
acquiring first fault recording data and second fault recording data, wherein the first fault recording data are fault recording data generated by a reference transformer based on a fault event, and the second fault recording data are fault recording data generated by a transformer to be verified based on the fault event;
determining sampling intervals of the first fault recording data and the second fault recording data based on a fault time node of the first fault recording data, and respectively obtaining a first sampling signal and a second sampling signal by sampling the recording data in the sampling intervals;
according to the voltage amplitude difference value of each first signal sampling point and each second signal sampling point, performing signal alignment on the first sampling signal and the second sampling signal, and extracting a first sampling signal point and a second sampling signal point in a transient interval, wherein the first signal sampling point is a sampling point in the first sampling signal, and the second signal sampling point is a sampling point in the second sampling signal;
calculating the difference value of each sampling point combination one by one, and performing Fourier transform on the difference value to obtain the effective difference value of the target sampling point combination, wherein the sampling point combination is the combination of the first sampling point and the second sampling point, the first sampling point is the sampling point in the first signal sampling point, and the second sampling point is the sampling point in the second signal sampling point, which is aligned with the first sampling point;
and comparing the effective difference value with a preset error threshold value to obtain a precision checking result of the mutual inductor to be checked.
2. The transformer transient sampling precision verification method according to claim 1, wherein the signal alignment of the first sampling signal and the second sampling signal according to the voltage amplitude difference value of each first sampling point and each second sampling point specifically comprises:
respectively calculating the voltage amplitude variance of each first sampling point and each second sampling point according to the voltage amplitude difference value of each first sampling point and each second sampling point, and determining a first reference sampling point and a second reference sampling point corresponding to the minimum voltage amplitude variance;
and performing signal alignment on the first sampling signal and the second sampling signal by taking the first reference sampling point and the second reference sampling point as references.
3. The method for verifying transformer transient sampling accuracy according to claim 1, wherein obtaining the first sampling signal and the second sampling signal further comprises:
and acquiring sampling rate parameters of the first sampling signal and the second sampling signal, and if the sampling rate parameter of the first sampling signal is greater than the sampling rate parameter of the second sampling signal, interpolating the second sampling signal according to the sampling rate parameter of the second sampling signal.
4. The method for verifying transformer transient sampling accuracy according to claim 1, wherein the determining the sampling intervals of the first fault recording data and the second fault recording data based on the fault time node of the first fault recording data specifically comprises:
determining a fault time node according to the first fault recording data;
determining a first time node and a second time node according to a preset time span threshold value by taking the fault time node as a reference, wherein the first time node is smaller than the second time node, and the difference value between the first time node and the fault time node and the difference value between the second time node and the fault time node are equal to the time span threshold value;
and determining the sampling interval of the first fault recording data and the second fault recording data by taking the first time node and the second time node as the upper limit and the lower limit of the sampling interval.
5. The transformer transient sampling accuracy verification method of claim 4, further comprising:
when the number of the second fault recording data is multiple, extracting a first transient abrupt change phase parameter and a first steady-state amplitude parameter of the first fault recording data, and a second transient abrupt change phase parameter and a second steady-state amplitude parameter of each second fault recording data;
and comparing the first transient abrupt phase difference parameter with each second transient abrupt phase difference parameter, comparing the first steady-state amplitude parameter with each second steady-state amplitude parameter, and determining second fault recording data which are the same as the transient abrupt phase difference parameter of the first fault recording data and have the smallest error of the steady-state amplitude parameter.
6. The transformer transient sampling accuracy verification method of claim 1, wherein after extracting the first sampled signal point and the second sampled signal point in the transient interval, the method further comprises:
and comparing the transient interval lengths of the first sampling signal and the second sampling signal, and adjusting the transient interval lengths of the first sampling signal and the second sampling signal by taking the minimum transient interval length as a reference.
7. The method for verifying transformer transient sampling accuracy according to claim 1, wherein the comparing the effective difference value with a preset error threshold to obtain the accuracy verification result of the transformer to be verified specifically comprises:
and comparing the effective difference value with a preset error threshold, and outputting a verification failure result when the data volume of the effective difference value larger than the error threshold exceeds a preset proportion.
8. The utility model provides a mutual-inductor transient state sampling precision calibration equipment which characterized in that includes:
the device comprises a wave recording data acquisition unit, a first fault wave recording data acquisition unit and a second fault wave recording data acquisition unit, wherein the first fault wave recording data is fault wave recording data generated by a reference mutual inductor based on a fault event, and the second fault wave recording data is fault wave recording data generated by the mutual inductor to be verified based on the fault event;
the data sampling unit is used for determining sampling intervals of the first fault recording data and the second fault recording data based on the fault time node of the first fault recording data, and respectively obtaining a first sampling signal and a second sampling signal by sampling the recording data in the sampling intervals;
the transient interval sampling point extraction unit is used for aligning the first sampling signals and the second sampling signals according to voltage amplitude difference values of the first signal sampling points and the second signal sampling points and extracting first sampling signal points and second sampling signal points in a transient interval, wherein the first signal sampling points are sampling points in the first sampling signals, and the second signal sampling points are sampling points in the second sampling signals;
the effective value of difference calculating unit is used for calculating the difference of each sampling point combination one by one and carrying out Fourier transform on the difference to obtain the effective value of the difference of the sampling point combination, wherein the sampling point combination is the combination of the first sampling point and the second sampling point, the first sampling point is the sampling point in the first signal sampling point, and the second sampling point is the sampling point in the second signal sampling point, which is aligned with the first sampling point;
and the error comparison unit is used for comparing the effective difference value with a preset error threshold value to obtain a precision verification result of the mutual inductor to be verified.
9. A terminal, comprising: a memory and a processor;
the memory is used for storing program codes corresponding to the transformer transient sampling precision checking method in any one of claims 1 to 7;
the processor is configured to execute the program code.
10. A storage medium having stored therein program code corresponding to the transformer transient sampling accuracy verification method of any one of claims 1 to 7.
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