CN111366619A - Display panel, crack detection method thereof and display device - Google Patents
Display panel, crack detection method thereof and display device Download PDFInfo
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Abstract
The invention relates to a display panel, a crack detection method thereof and a display device. The display panel includes: the display device comprises a display area and a non-display area surrounding the display area, wherein the non-display area comprises a substrate and a crack detection circuit, and the crack detection circuit is positioned on the substrate; the crack detection circuit comprises a first metal layer, an insulating medium layer and a second metal layer, wherein the first metal layer is positioned on the substrate, the insulating medium layer is positioned on the first metal layer, the second metal layer is positioned on the insulating medium layer, and the second metal layer is used for receiving detection voltage. According to the embodiment of the invention, whether the edge of the display panel has the crack or not can be detected, the position of the crack can be determined when the crack exists, and in addition, a mask and a complex circuit do not need to be additionally arranged.
Description
Technical Field
The invention relates to the technical field of display, in particular to a display panel, a crack detection method of the display panel and a display device.
Background
The display panel is a multilayer thin film device, and each layer of thin film is deposited on a glass substrate in the production process of the display panel, so that the display function is finally realized. Local cracking is easily caused by different hardness and tension of each film layer. Furthermore, glass substrates can also crack or develop cracks during coating, transport, testing, assembly into modules and transport.
The occurrence of cracks at the periphery of the display panel is a common defect in the panel production process. If the crack is obvious and has penetrated into the metal circuit of the BP substrate, the function abnormality can occur in the normal detection process; if the crack is less, do not appear the malfunction, flow into module/complete machine, even in the consumer's hand, in the use, the crack can worsen, and then leads to showing inefficacy. In short, the cracks may cause a peripheral circuit of the display panel to be broken, and may cause adverse effects such as abnormal display function, difficulty in analyzing defects, and customer dissatisfaction.
In the related art, a part of display panels is designed to be added with a screen crack detection (PCD for short), the detection principle is mostly impedance detection, a detection main body is generally one or more mutually independent metal wires, when the wires are completely broken, the wires are changed from conduction to open, so that the resistance of the PCD circuit is changed, and the resistance change of the PCD circuit can be detected through signal detection, lighting and other means. For example, one scheme is that, in the peripheral wiring of a display panel (panel), whether there is crack is judged by measuring the resistance change of the peripheral wiring; alternatively, the wirings are wired around the display panel and connected to pixel lines in the AA region (display region), and it is determined whether or not there is a bright line or a dark line at the time of lighting, and it is determined that there is a large crack.
Disclosure of Invention
The invention provides a display panel, a crack detection method thereof and a display device, and aims to overcome the defects in the related art.
According to a first aspect of embodiments of the present invention, there is provided a display panel including: the display device comprises a display area and a non-display area surrounding the display area, wherein the non-display area comprises a substrate and a crack detection circuit, and the crack detection circuit is positioned on the substrate;
the crack detection circuit comprises a first metal layer, an insulating medium layer and a second metal layer, wherein the first metal layer is positioned on the substrate, the insulating medium layer is positioned on the first metal layer, the second metal layer is positioned on the insulating medium layer, and the second metal layer is used for receiving detection voltage.
In one embodiment, the crack detection circuit further comprises N conductive strips, N being a positive integer; the N conducting strips are respectively connected with the second metal layer and used for receiving the detection voltage; and when N is larger than 1, the connection positions of the N conducting strips and the second metal layer are different.
In one embodiment, the second metal layer includes M metal sheets and M +1 segments of first conductive lines, where M is a positive integer, and the first conductive lines and the metal sheets are on the same layer; the ith section of first lead is connected with the ith metal sheet, the ith metal sheet is also connected with the (i + 1) th section of first lead, and i is 1, 2, 3, … … and M; n is 2, one conducting strip in 2 conducting strips is connected with the 1 st section of first wire, and the other conducting strip is connected with the M +1 section of first wire.
In one embodiment, M is greater than 1.
In one embodiment, the metal sheet is polygonal or circular in shape.
In one embodiment, M is equal to 1, the shape of the metal sheet is the same as that of the first metal layer, and the shape of the insulating medium layer is the same as that of the first metal layer; the projection of the insulating medium layer on the substrate is in the projection of the first metal layer on the substrate, and the projection of the metal sheet on the substrate is in the projection of the insulating medium layer on the substrate.
In one embodiment, the second metal layer comprises M metal sheets, and the crack detection circuit further comprises M second wires, the second wires being in the same layer as the conductive sheets; m is a positive integer; the M metal sheets are connected with the M second conducting wires in a one-to-one correspondence mode; n equals M, and M second wires are connected with M conducting strips in a one-to-one correspondence mode.
In one embodiment, the crack detection circuit further includes an interlayer dielectric layer, the interlayer dielectric layer is located between the second metal layer and the conductive sheet, the interlayer dielectric layer includes a via hole, and the second metal layer is connected to the conductive sheet through the via hole.
In one embodiment, the display panel further comprises a ground line, and the first metal layer is connected with the ground line; and when the first metal layer and the ground wire are in different layers, the first metal layer is connected with the ground wire in a jumper way.
In one embodiment, the display panel further includes a gate driving circuit located in the non-display region, and the crack detection circuit is located on a side of the gate driving circuit away from the display region.
In one embodiment, the gate driving circuit includes a transistor including a gate, a gate insulating layer, and a source; the grid electrode is positioned on the substrate and is on the same layer as the first metal layer; the grid electrode insulating layer is positioned on the grid electrode, and the grid electrode insulating layer and the insulating medium layer are on the same layer; the source electrode is positioned on the grid electrode insulating layer, and the source electrode and the second metal layer are on the same layer.
According to a second aspect of the embodiments of the present invention, there is provided a display device including the display panel described above.
According to a third aspect of the embodiments of the present invention, there is provided a crack detection method for a display panel, where the display panel is the display panel described above, the crack detection method includes:
applying the detection voltage on the second metal layer by using a capacitance-voltage characteristic tester, and obtaining a test capacitance value;
and comparing the test capacitance value with a reference capacitance value, judging whether cracks exist according to a comparison result, and acquiring the position information of the cracks according to the comparison result when the cracks exist.
According to the above embodiment, since the crack detection circuit includes the first metal layer, the insulating medium layer and the second metal layer, the insulating medium layer is located on the first metal layer, and the second metal layer is located on the insulating medium layer, when there is no crack in the non-display region, the first metal layer, the insulating medium layer and the second metal layer may form a capacitor, a capacitance value of the capacitor may be measured in advance to be used as a reference capacitance value, when there is a crack in the non-display region, a capacitance voltage characteristic tester may be used to apply a detection voltage to the second metal layer to obtain a test capacitance value, and then the test capacitance value and the reference capacitance value are compared to determine whether there is a crack according to a comparison result, for example, when the test capacitance value is substantially the same as the reference capacitance value, it may be determined that there is no crack, when the difference between the test capacitance value and the reference capacitance value is, the existence of the crack can be judged, and when the existence of the crack is judged, the position information of the crack can be obtained according to the comparison result of the test capacitance value and the reference capacitance value. Therefore, the technical scheme provided by the embodiment of the invention can detect whether the edge of the display panel has the crack or not, can determine the position of the crack when the crack exists, and does not need to additionally add a mask and a complex circuit.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
Fig. 1 is a schematic structural diagram of a display panel according to an embodiment of the present invention;
FIG. 2 is a cross-sectional view taken along section line AA in FIG. 1;
fig. 3 is a schematic structural diagram illustrating another display panel according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram illustrating another display panel according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram illustrating another display panel according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram illustrating another display panel according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram illustrating another display panel according to an embodiment of the present invention;
fig. 8 is a flowchart illustrating a crack detection method of a display panel according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the invention, as detailed in the appended claims.
The embodiment of the invention provides a display panel. As shown in fig. 1 to 2, the display panel 11 includes a display region 111 and a non-display region 112 surrounding the display region 111, the non-display region 112 includes a substrate 21 and a crack detection circuit 12, and the crack detection circuit 12 is located on the substrate 21. Wherein figure 2 is a cross-sectional view of figure 1 along section line AA.
As shown in fig. 2, the crack detection circuit 12 includes a first metal layer 121, an insulating medium layer 122 and a second metal layer 123, the first metal layer 121 is located on the substrate 21, the insulating medium layer 122 is located on the first metal layer 121, the second metal layer 123 is located on the insulating medium layer 122, and the second metal layer 123 is configured to receive a detection voltage.
In this embodiment, since the crack detection circuit includes the first metal layer, the insulating medium layer and the second metal layer, the insulating medium layer is located on the first metal layer, and the second metal layer is located on the insulating medium layer, when there is no crack in the non-display region, the first metal layer, the insulating medium layer and the second metal layer may form a capacitor, a capacitance value of the capacitor may be obtained by measuring in advance as a reference capacitance value, when there is a crack in the non-display region, a detection voltage may be applied to the second metal layer by using a capacitance-voltage characteristic tester to obtain a test capacitance value, and then the test capacitance value and the reference capacitance value are compared to determine whether there is a crack according to a comparison result, for example, when the test capacitance value is substantially the same as the reference capacitance value, it may be determined that there is no crack, when the test capacitance value is greatly different from the reference capacitance value, the existence of the crack can be judged, and when the existence of the crack is judged, the position information of the crack can be obtained according to the comparison result of the test capacitance value and the reference capacitance value. Therefore, the technical scheme provided by the embodiment of the invention can detect whether the edge of the display panel has the crack or not, can determine the position of the crack when the crack exists, and does not need to additionally add a mask and a complex circuit.
The display panel provided by the embodiment of the present invention is briefly described above, and the display panel provided by the embodiment of the present invention is described in detail below.
The embodiment of the invention also provides a display panel. As shown in fig. 1, the display panel 11 includes a display region 111 and a non-display region 112 surrounding the display region 111.
As shown in fig. 1, the non-display area 112 includes a gate driving circuit 13 and a crack detection circuit 12. The crack detection circuit 12 is located on a side of the gate drive circuit 13 away from the display region 111. The gate driving circuit 13 may be manufactured by using a GOA (gate on Array, Array substrate row driving) technology, but is not limited thereto.
In an embodiment of the present invention, the crack detection circuit 12 may be located at least at one side of the display area 111. For example, as shown in fig. 1, the crack detection circuits 12 are located on three sides of the display area 111, i.e., the crack detection circuits 12 half-surround the display area 111. The side of the display area 111 not enclosed may be the side where the driving chip is disposed.
As shown in fig. 2, the non-display region 112 includes a substrate 21, a buffer layer 22, a crack detection circuit 12, and an interlayer dielectric layer 23.
In the present embodiment, the substrate 21 may be a flexible substrate, and the substrate 21 includes a glass substrate 211 and an organic layer 212. The material of the organic layer 212 may be polyimide, but is not limited thereto.
In the present embodiment, the buffer layer 22 is located on the substrate 21. The material of the buffer layer 22 may include, but is not limited to, silicon oxide and silicon nitride.
In the present embodiment, the crack detection circuit 12 is located on the buffer layer 22.
As shown in fig. 2, the crack detection circuit 12 includes a first metal layer 121, an insulating dielectric layer 122, and a second metal layer 123. The first metal layer 121, the insulating dielectric layer 122 and the second metal layer 123 may form at least one capacitor. For example, when there is no crack in the non-display area 112, the first metal layer 121, the insulating dielectric layer 122 and the second metal layer 123 form a capacitor, and when there is a crack in the non-display area 112 and the crack cracks at least one of the second metal layer 123 and the first metal layer 121, the insulating dielectric layer 122 and the second metal layer 123 form L capacitors, where L is an integer greater than 1.
As shown in fig. 2, the first metal layer 121 is disposed on the substrate 21, and the material of the first metal layer 121 may be molybdenum (Mo), but is not limited thereto. As shown in fig. 3, in the present embodiment, the first metal layer 121 is located on three sides of the display region 111.
As shown in fig. 3, in the present embodiment, the display panel 11 further includes a ground line 31, and the first metal layer 121 is connected to the ground line 31. In the present embodiment, the first metal layer 121 is the same layer as the ground line 31. In another embodiment, the first metal layer 121 is different from the ground line 31, and the first metal layer 121 is jumper-connected to the ground line 31, that is, the first metal layer 121 is connected to the ground line 31 through a metal via.
As shown in fig. 2, an insulating dielectric layer 122 is located on the first metal layer 121. The insulating dielectric layer 122 may be made of a material with a high dielectric constant. For example, the material of the insulating dielectric layer 122 may include at least one of silicon nitride and aluminum oxide, but is not limited thereto.
As shown in fig. 4, in the present embodiment, the shape of the insulating medium layer 122 is the same as the shape of the first metal layer 121, and the projection of the insulating medium layer 122 on the substrate 21 falls within the projection of the first metal layer 121 on the substrate 21.
As shown in fig. 2, the second metal layer 123 is located on the insulating dielectric layer 122, and the material of the second metal layer 123 may be molybdenum, but is not limited thereto.
As shown in fig. 5, in the embodiment of the invention, the second metal layer 123 includes M metal pieces 1231 and M +1 segments of the first conductive line 1232, where M is a positive integer. The first conductive line 1232 is in the same layer as the metal sheet 1231.
In this embodiment, M is greater than 1. The ith segment of the first wire 1232 is connected to the ith metal piece 1231, and the ith metal piece 1231 is further connected to the (i + 1) th segment of the first wire 1232, where i is 1, 2, 3, … …, and M. For example, the 1 st segment of the first conductive line 1232 is connected to the 1 st metal piece 1231, the 1 st metal piece 1231 is further connected to the 2 nd segment of the first conductive line 1232, the 2 nd segment of the first conductive line 1232 is connected to the 2 nd metal piece 1231, the 2 nd metal piece 1231 is further connected to the 3 rd segment of the first conductive line 1232, … …, the mth segment of the first conductive line 1232 is connected to the mth segment of the first conductive line 1231, and the mth segment of the first conductive line 1231 is further connected to the M +1 th segment of the first conductive line 1232.
In the embodiment of the present invention, the shape of the metal sheet 1231 is a polygon or a circle. In the present embodiment, the metal sheet 1231 has a rectangular shape.
In the embodiment of the present invention, the crack detection circuit 12 further includes N conductive sheets, where N is a positive integer. The N conductive sheets are respectively connected to the second metal layer 123, and the conductive sheets are configured to receive the detection voltage. Wherein, N can be 1, 2, 3 or other positive integers. When N is greater than 1, the connection positions of the N conductive sheets and the second metal layer 123 are different.
In the present embodiment, as shown in fig. 5, N is 2. The 2 conductive sheets include a first conductive sheet 51 and a second conductive sheet 52. The first conductive plate 51 is connected to the 1 st segment of the first conductive line 1232, and the second conductive plate 52 is connected to the M +1 segment of the first conductive line 1232. The first conductive plate 51 and the second conductive plate 52 are both used for receiving a detection voltage.
As shown in fig. 2, in the present embodiment, the interlayer dielectric layer 23 is located on the second metal layer 123, and the conductive sheet is located on the interlayer dielectric layer 23, that is, the interlayer dielectric layer 23 is located between the second metal layer 123 and the conductive sheet. In the present embodiment, the interlayer dielectric layer 23 includes a via hole 24, and the second metal layer 123 is connected to the conductive sheet through the via hole 24. The material of the via 24 may be a metal, such as molybdenum, but is not limited thereto.
When there is no crack in the non-display area 112, the first metal layer 121, the insulating dielectric layer 122 and the second metal layer 123 may form a capacitor, and a capacitance value of the capacitor may be measured in advance to be used as a reference capacitance value. The reference capacitance value may be stored in the capacitance-voltage characteristic tester, or may be stored in other processing devices for comparing the test capacitance value with the reference capacitance value, but is not limited thereto.
When the non-display area 112 has cracks, the second metal layer 123 may be split into at least two portions, and the area of each portion may be smaller than the area of the whole second metal layer 123. Therefore, according to the plate capacitance formula C ═ S/4 π kd, the capacitance formed between each portion and first metal layer 121 may have a value smaller than the capacitance formed between second metal layer 123 and first metal layer 121 without cracks. Therefore, the presence or absence of a crack in the non-display area 112 can be detected by measuring the value of the capacitance C through the conductive sheet. Where ε is the dielectric constant of the insulating dielectric layer 122, π is the circumferential ratio, k is the constant of the electrostatic force, and d is the distance between the first metal layer 121 and the second metal layer 123.
When it is required to test whether the non-display area 112 has cracks, a capacitance-voltage characteristic tester may be used to apply a detection voltage to the first conductive sheet 51 or the second conductive sheet 52 to obtain a test capacitance value, and then the test capacitance value is compared with a reference capacitance value, and whether cracks exist is determined according to the comparison result. For example, when the test capacitance value is substantially the same as the reference capacitance value, it may be determined that there is no crack, and when the test capacitance value is greatly different from the reference capacitance value, it may be determined that there is a crack. When it is determined that there is a crack, the position information of the crack may be acquired according to the comparison result of the test capacitance value and the reference capacitance value. The capacitance-voltage characteristic tester can obtain a corresponding test capacitance value according to the detection voltage and a capacitance-voltage characteristic curve.
For example, when a capacitance-voltage characteristic tester is used to apply a detection voltage to the first conductive sheet 51 and obtain a test capacitance value, the comparison result of the test capacitance value and the reference capacitance value is the ratio of the test capacitance value and the reference capacitance value, and the ratio is 1/3, since 1/3 is much smaller than 1, it can be determined that a crack exists, and the approximate position of the crack is the third half of the display panel and is close to the first conductive sheet 51.
For another example, when a capacitance-voltage characteristic tester is used to apply a detection voltage to the first conductive sheet 52 and obtain a test capacitance value, the comparison result between the test capacitance value and the reference capacitance value is the ratio of the test capacitance value to the reference capacitance value, and the ratio is 1/3, since 1/3 is much smaller than 1, it can be determined that there is a crack, and the approximate position of the crack is the third half of the display panel and is close to the second conductive sheet 52.
In the present embodiment, the gate drive circuit 13 includes a transistor (not shown) including a gate, a gate insulating layer, a source, and a drain.
In the embodiment, the gate is located on the substrate 21, the gate is on the same layer as the first metal layer 121, and the gate and the first metal layer 121 can be prepared through the same process.
In the present embodiment, the gate insulating layer is located on the gate, the gate insulating layer is on the same layer as the insulating dielectric layer 122, and the gate insulating layer and the insulating dielectric layer 122 can be prepared through the same process.
In this embodiment, the source is located on the gate insulating layer, the source and the second metal layer 123 are on the same layer, the drain and the source are on the same layer, and the drain, the source and the second metal layer 123 can be prepared through the same process.
In summary, the technical solution provided by the embodiments of the present invention can detect whether a crack exists on the edge of the display panel, and can determine the position of the crack when the crack exists, and no additional mask and no additional complex circuit are required.
The embodiment of the invention also provides a display panel. As shown in fig. 6, the present embodiment is different from the embodiment shown in fig. 5 in that M is equal to 1 in the present embodiment. The second metal layer 123 includes 1 metal sheet 1231 and 2 segments of the first conductive line 1232.
As shown in fig. 6, in the present embodiment, the shape of the metal sheet 1231 is the same as that of the first metal layer 121, and the shape of the insulating dielectric layer 122 is the same as that of the first metal layer 121. The projection of the insulating dielectric layer 122 on the substrate 21 falls within the projection of the first metal layer 121 on the substrate 21, and the projection of the metal sheet 1231 on the substrate 21 falls within the projection of the insulating dielectric layer 122 on the substrate 21.
In this embodiment, the 1 st segment of the first conductive line 1232 is connected to the metal sheet 1231, and the metal sheet 1231 is further connected to the 2 nd segment of the first conductive line 1232. The first conductive plate 51 is connected to the 1 st segment of the first conductive line 1232, and the second conductive plate 52 is connected to the 2 nd segment of the first conductive line 1232. The first conductive plate 51 and the second conductive plate 52 are both used for receiving a detection voltage.
When it is required to test whether the non-display area 112 has cracks, a capacitance-voltage characteristic tester may be used to apply a detection voltage to the first conductive sheet 51 or the second conductive sheet 52 to obtain a test capacitance value, and then the test capacitance value is compared with a reference capacitance value, and whether cracks exist is determined according to the comparison result. For example, when the test capacitance value is substantially the same as the reference capacitance value, it may be determined that there is no crack, and when the test capacitance value is greatly different from the reference capacitance value, it may be determined that there is a crack. When it is determined that there is a crack, the position information of the crack may be acquired according to the comparison result of the test capacitance value and the reference capacitance value.
For example, when a capacitance-voltage characteristic tester is used to apply a detection voltage to the first conductive sheet 51 and obtain a test capacitance value, the comparison result of the test capacitance value and the reference capacitance value is the ratio of the test capacitance value and the reference capacitance value, and the ratio is 1/5, since 1/5 is much smaller than 1, it can be determined that a crack exists, and the approximate position of the crack is the fifth equal part of the display panel and is close to the first conductive sheet 51.
For another example, when a capacitance-voltage characteristic tester is used to apply a detection voltage to the first conductive sheet 52 and obtain a test capacitance value, the comparison result of the test capacitance value and the reference capacitance value is the ratio of the test capacitance value and the reference capacitance value, and the ratio is 1/6, since 1/6 is much smaller than 1, it can be determined that a crack exists, and the approximate position of the crack is the sixth division of the display panel and is close to the second conductive sheet 52.
In summary, the technical solution provided by the embodiments of the present invention can detect whether a crack exists at an edge of the display panel, and can determine a position of the crack when the crack exists, without additionally adding a mask and a complex circuit. In addition, the capacitance value of the capacitor formed by the second metal layer, the first metal layer and the insulating medium layer is relatively large, so that the sensitivity is relatively high when crack detection is carried out.
The embodiment of the invention also provides a display panel. As shown in fig. 7, the difference between the present embodiment and the embodiment shown in fig. 5 is that, in the present embodiment, the second metal layer 123 includes M metal sheets 1231, where M is a positive integer, and the crack detection circuit 12 further includes M second wires 71, where the second wires 71 are in the same layer as the conductive sheet. The M metal pieces 1231 are connected to the M second conductive lines 71 in a one-to-one correspondence. In the present embodiment, the metal sheet 1231 may be connected to the second conductive line 71 through a via.
In this embodiment, N is equal to M. The M conductive sheets include a first conductive sheet 51, a second conductive sheet 52, a third conductive sheet 53, a fourth conductive sheet 54, a fifth conductive sheet 55, a sixth conductive sheet 56, seventh conductive sheets 57, … …, an M-4 conductive sheet 58, an M-3 conductive sheet 59, an M-2 conductive sheet 510, an M-1 conductive sheet 511, and an M conductive sheet 512.
In the present embodiment, the M second wires 71 are connected to the M conductive sheets in a one-to-one correspondence. Thus, the M conductive sheets may be connected to the M metal sheets 1231 in a one-to-one correspondence. For example, the fifth conductive sheet 55 may be connected to the 1 st metal sheet 1231, the fourth conductive sheet 54 may be connected to the 2 nd metal sheet 1231, the M-3 conductive sheet 59 may be connected to the mth metal sheet 1231, and the M-2 conductive sheet 510 may be connected to the M-1 metal sheet 1231.
When there is no crack in the non-display area 112, each metal sheet 1231 forms a capacitor with the first metal layer 121 and the insulating dielectric layer 122, so that the first metal layer 121, the insulating dielectric layer 122, and the second metal layer 123 can form M capacitors. The capacitance values of the M capacitors may be measured in advance as reference capacitance values.
Preferably, the M metal sheets 1231 have the same area. Thus, the capacitance values of the M capacitors are the same. Therefore, the reference capacitance values of the M capacitors are the same. Thus, the same reference capacitance value can be used for the M capacitors.
When it is necessary to test whether the non-display area 112 has cracks, the capacitance-voltage characteristic tester may be used to apply detection voltages to the M conductive sheets, respectively, and obtain a test capacitance value. And comparing the test capacitance value with a reference capacitance value aiming at the test capacitance value obtained by each conducting strip, judging whether cracks exist according to the comparison result, and when the cracks exist, determining the positions of the cracks as the positions of the conducting strips, so that the positions of the cracks can be directly positioned.
For example, when a detection voltage is applied to the fourth conductive sheet 54 by using a capacitance-voltage characteristic tester and a test capacitance value is obtained, the comparison result of the test capacitance value and the reference capacitance value is a ratio of the test capacitance value and the reference capacitance value, and the ratio is 1/5, since 1/5 is much smaller than 1, it can be determined that a crack exists and the crack is located at the position of the 2 nd metal sheet 1231.
In this embodiment, since the position of the conductive sheet is known and the area covered is small, the position of the crack can be accurately located.
An embodiment of the present invention further provides a display device, including the display panel according to any one of the above embodiments.
In one embodiment, the display device may further include a driver chip and a flexible Circuit board (FPC), and the display panel may be electrically connected to the driver chip through the FPC. Of course, the connection mode of the driving chip and the display panel is not limited to this.
In one embodiment, the non-enclosed side of the display region 111 may be a side of the display panel close to the driving chip.
The crack detection of the display device is generally referred to as PCD detection in a module state. Crack detection of a display panel is generally referred to as PCD detection in a cell state.
The embodiment of the invention also provides a crack detection method of a display panel, and the display panel is the display panel described in any one of the embodiments. As shown in FIG. 8, the crack detection method comprises the following steps 801-802:
in step 801, a detection voltage is applied to the second metal layer by using a capacitance-voltage characteristic tester, and a test capacitance value is obtained.
In step 802, the test capacitance value is compared with the reference capacitance value, whether cracks exist is judged according to the comparison result, and when the cracks exist, the position information of the cracks is obtained according to the comparison result.
The crack detection method in this embodiment is similar to the crack detection method in the above embodiments, and is not described herein again.
The display device in this embodiment may be: any product or component with a display function, such as electronic paper, a mobile phone, a tablet computer, a television, a notebook computer, a digital photo frame, a navigator and the like.
It is noted that in the drawings, the sizes of layers and regions may be exaggerated for clarity of illustration. Also, it will be understood that when an element or layer is referred to as being "on" another element or layer, it can be directly on the other element or layer or intervening layers may also be present. In addition, it will be understood that when an element or layer is referred to as being "under" another element or layer, it can be directly under the other element or intervening layers or elements may also be present. In addition, it will also be understood that when a layer or element is referred to as being "between" two layers or elements, it can be the only layer between the two layers or elements, or more than one intermediate layer or element may also be present. Like reference numerals refer to like elements throughout.
In the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. The term "plurality" means two or more unless expressly limited otherwise.
Other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This invention is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the invention being indicated by the following claims.
It will be understood that the invention is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.
Claims (13)
1. A display panel, comprising: the display device comprises a display area and a non-display area surrounding the display area, wherein the non-display area comprises a substrate and a crack detection circuit, and the crack detection circuit is positioned on the substrate;
the crack detection circuit comprises a first metal layer, an insulating medium layer and a second metal layer, wherein the first metal layer is positioned on the substrate, the insulating medium layer is positioned on the first metal layer, the second metal layer is positioned on the insulating medium layer, and the second metal layer is used for receiving detection voltage.
2. The display panel of claim 1, wherein the crack detection circuit further comprises N conductive sheets, N being a positive integer; the N conducting strips are respectively connected with the second metal layer and used for receiving the detection voltage;
and when N is larger than 1, the connection positions of the N conducting strips and the second metal layer are different.
3. The display panel according to claim 2, wherein the second metal layer comprises M metal sheets and M +1 segments of first conductive lines, M is a positive integer, and the first conductive lines are on the same layer as the metal sheets;
the ith section of first lead is connected with the ith metal sheet, the ith metal sheet is also connected with the (i + 1) th section of first lead, and i is 1, 2, 3, … … and M;
n is 2, one conducting strip in 2 conducting strips is connected with the 1 st section of first wire, and the other conducting strip is connected with the M +1 section of first wire.
4. A display panel as claimed in claim 3 characterized in that M is larger than 1.
5. The display panel according to claim 4, wherein the metal sheet has a polygonal or circular shape.
6. The display panel according to claim 3, wherein M is equal to 1, the shape of the metal sheet is the same as that of the first metal layer, and the shape of the insulating medium layer is the same as that of the first metal layer;
the projection of the insulating medium layer on the substrate is in the projection of the first metal layer on the substrate, and the projection of the metal sheet on the substrate is in the projection of the insulating medium layer on the substrate.
7. The display panel according to claim 2, wherein the second metal layer comprises M metal sheets, and the crack detection circuit further comprises M second conductive lines, the second conductive lines being on the same layer as the conductive sheets; m is a positive integer; the M metal sheets are connected with the M second conducting wires in a one-to-one correspondence mode;
n equals M, and M second wires are connected with M conducting strips in a one-to-one correspondence mode.
8. The display panel according to claim 2, wherein the crack detection circuit further comprises an interlayer dielectric layer, the interlayer dielectric layer is located between the second metal layer and the conductive sheet, the interlayer dielectric layer comprises a via hole, and the second metal layer is connected with the conductive sheet through the via hole.
9. The display panel according to claim 1, further comprising a ground line, the first metal layer being connected to the ground line;
and when the first metal layer and the ground wire are in different layers, the first metal layer is connected with the ground wire in a jumper way.
10. The display panel according to claim 1, further comprising a gate driver circuit located in the non-display region, wherein the crack detection circuit is located on a side of the gate driver circuit away from the display region.
11. The display panel according to claim 10, wherein the gate driver circuit comprises a transistor including a gate electrode, a gate insulating layer, and a source electrode;
the grid electrode is positioned on the substrate and is on the same layer as the first metal layer; the grid electrode insulating layer is positioned on the grid electrode, and the grid electrode insulating layer and the insulating medium layer are on the same layer; the source electrode is positioned on the grid electrode insulating layer, and the source electrode and the second metal layer are on the same layer.
12. A display device characterized by comprising the display panel according to any one of claims 1 to 11.
13. A crack detection method for a display panel according to any one of claims 1 to 11, the crack detection method comprising:
applying the detection voltage on the second metal layer by using a capacitance-voltage characteristic tester, and obtaining a test capacitance value;
and comparing the test capacitance value with a reference capacitance value, judging whether cracks exist according to a comparison result, and acquiring the position information of the cracks according to the comparison result when the cracks exist.
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| CN202010191613.3A CN111366619A (en) | 2020-03-18 | 2020-03-18 | Display panel, crack detection method thereof and display device |
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