CN111308258A - System and method for testing high-low voltage coupling mechanism - Google Patents
System and method for testing high-low voltage coupling mechanism Download PDFInfo
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- CN111308258A CN111308258A CN202010273116.8A CN202010273116A CN111308258A CN 111308258 A CN111308258 A CN 111308258A CN 202010273116 A CN202010273116 A CN 202010273116A CN 111308258 A CN111308258 A CN 111308258A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/3644—Constructional arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/378—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator
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Abstract
The application discloses a test system and a test method of a high-low voltage coupling mechanism, wherein the test system of the high-low voltage coupling mechanism respectively realizes the isolation of a high-voltage direct-current power supply, a load box and tested equipment through first high-voltage isolation equipment and second high-voltage isolation equipment, avoids the interference of the high-voltage direct-current power supply and the load box from influencing test results, realizes the isolation among receiving equipment, a low-voltage direct-current power supply and the tested equipment through low-voltage isolation equipment, avoids the interference of the receiving equipment and the low-voltage direct-current power supply from influencing the test results, tests the interference curve of the tested equipment through the receiving equipment to realize the attenuation characteristic that the high-voltage interference generated in the working process of the high-voltage circuit of the tested equipment enters low-voltage interference, further researches the high-low voltage coupling mechanism of the high-voltage circuit in the tested equipment, and guides the high-low voltage coupling design of, thereby achieving the purpose of improving the overall electromagnetic compatibility of the tested equipment.
Description
Technical Field
The application relates to the technical field of fuel cells, in particular to a system and a method for testing a high-low voltage coupling mechanism.
Background
A fuel cell (fuel cell) is a chemical device that directly converts chemical energy of fuel into electric energy, and is also called an electrochemical generator.
In a fuel cell system, a high-voltage circuit and a low-voltage circuit coexist, interference can be generated in the working process of the high-voltage circuit and the low-voltage circuit, and the interference generated by the high-voltage circuit is stronger. The high-voltage circuit has large external interference but strong anti-interference performance, while the low-voltage circuit has weak external interference but weak anti-interference capability. Therefore, the electromagnetic problem of the fuel cell system is often caused by the interference coupling of the operation of the high-voltage circuit into the low-voltage circuit, so how to test the high-voltage and low-voltage coupling mechanism of the fuel cell system becomes one of the research directions of researchers.
Disclosure of Invention
In order to solve the technical problem, the application provides a system and a method for testing a high-low voltage coupling mechanism, so as to achieve the purpose of testing the high-low voltage coupling mechanism of a device under test.
In order to achieve the technical purpose, the embodiment of the application provides the following technical scheme:
a system for testing a high-voltage and low-voltage coupling mechanism, for testing a high-voltage and low-voltage coupling coefficient of a device under test, the device under test including a high-voltage port, an output port, and a low-voltage and communication port, the system for testing the high-voltage and low-voltage coupling mechanism comprising: the system comprises a high-voltage direct-current power supply, a load box, a low-voltage direct-current power supply, a receiving device, a first high-voltage isolation device, a second high-voltage isolation device and a low-voltage isolation device; wherein the content of the first and second substances,
the high-voltage direct-current power supply is connected with the high-voltage port through the first isolation equipment, the low-voltage direct-current power supply is connected with the low-voltage and communication port through the low-voltage isolation equipment, and the load box is connected with the output port through the second high-voltage isolation equipment; the receiving equipment is connected with the low-voltage and communication port through the low-voltage isolation equipment;
the high-voltage direct-current power supply is used for providing high-voltage driving electric energy for the tested equipment;
the load box is used for providing a load for the tested equipment;
the low-voltage direct-current power supply is used for providing low-voltage electric energy for the tested equipment;
the receiving device is used for testing the interference curve of the tested device.
Optionally, the receiving device is further configured to test a noise-floor interference curve when the high-voltage port and the low-voltage and communication port of the device under test are both closed.
Optionally, the testing of the interference curve of the device under test by the receiving device is specifically configured to test a low-voltage interference curve of the device under test when the low-voltage and communication ports of the device under test are opened and the high-voltage port is closed;
or
And testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
Optionally, the method further includes: an upper computer;
the upper computer is used for controlling the working states of the tested equipment, the high-voltage direct-current power supply, the low-voltage direct-current power supply, the load box and the receiving equipment and monitoring whether all parameters of the tested equipment are normal or not.
Optionally, the first high-voltage isolation device is a high-voltage line impedance stabilizing network;
the impedance stabilizing network of the high-voltage line of the second high-voltage isolation equipment;
the low-voltage isolation equipment is a low-voltage line impedance stabilizing network.
A method for testing a high-low voltage coupling mechanism is realized based on any one of the above systems for testing a high-low voltage coupling mechanism, and is used for testing a high-low voltage coupling coefficient of a device under test, where the device under test includes a high-voltage port, an output port, and a low-voltage and communication port, and the method for testing a high-low voltage coupling mechanism includes:
a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
and testing the interference curve of the tested equipment by utilizing the receiving equipment of the test system of the high-low voltage coupling mechanism.
Optionally, before the testing the interference curve of the device under test by the receiving device of the testing system using the high-low voltage coupling mechanism, the method further includes:
and testing a bottom noise interference curve by using the receiving equipment when the high-voltage port and the low-voltage and communication port of the tested equipment are closed.
Optionally, the testing the interference curve of the device under test by the receiving device of the testing system using the high-low voltage coupling mechanism includes:
testing a low-voltage interference curve of the tested equipment when a low-voltage port and a communication port of the tested equipment are opened and a high-voltage port is closed;
and testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
Optionally, when the low-voltage port, the communication port, and the high-voltage port of the device under test are both open, after testing the interference curves of the device under test under different operating powers, the method further includes:
and calculating high-low voltage coupling coefficients of the tested equipment under different operating powers according to the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested equipment under different operating powers.
Optionally, the calculating, according to the bottom noise interference curve, the low-voltage interference curve, and the interference curve of the device under test at different operating powers, high and low-voltage coupling coefficients of the device under test at different operating powers includes:
substituting the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested equipment under different operating powers into a first preset formula to calculate and obtain high-voltage and low-voltage coupling coefficients of the tested equipment under different operating powers;
the first preset formula includes:
wherein α represents the high-low voltage coupling coefficient of the tested device under the preset operating power, L2 represents the low-voltage interference curve, L3 represents the interference curve of the tested device under the preset operating power, and L1 represents the background noise interference curve.
It can be seen from the above technical solutions that the present application provides a test system and a test method for a high-voltage and low-voltage coupling mechanism, where the test system for a high-voltage and low-voltage coupling mechanism respectively implements isolation of a high-voltage dc power supply, a load box, and a device under test by using a first high-voltage isolation device and a second high-voltage isolation device, so as to avoid interference of the high-voltage dc power supply and the load box from affecting test results, implement isolation among a receiving device, a low-voltage dc power supply, and the device under test by using a low-voltage isolation device, avoid interference of the receiving device and the low-voltage dc power supply from affecting test results, implement attenuation characteristics after high-voltage interference generated in a working process of a high-voltage circuit of the device under test enters low-voltage interference by using the receiving device to test an interference curve of the device under test, and further study a high-voltage and low-voltage, the high-voltage and low-voltage coupling design of the high-voltage circuit is guided, so that the aim of improving the overall electromagnetic compatibility of the tested equipment is fulfilled.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a test system for a high-low voltage coupling mechanism according to an embodiment of the present application;
fig. 2 is a schematic flow chart of a method for testing a high-low voltage coupling mechanism according to an embodiment of the present application;
fig. 3 is a schematic flow chart of a method for testing a high-low voltage coupling mechanism according to another embodiment of the present application;
fig. 4 is a schematic flow chart of a method for testing a high-low voltage coupling mechanism according to another embodiment of the present application;
fig. 5 is a schematic flow chart of a method for testing a high-low voltage coupling mechanism according to still another embodiment of the present application;
fig. 6 is a schematic flowchart of a method for testing a high-low voltage coupling mechanism according to an alternative embodiment of the present application.
Detailed Description
As described in the background, how to test the high-low voltage coupling mechanism of the fuel cell system has become one of the research directions of researchers. In order to realize the test of the fuel cell system, several methods for interference test are provided in the prior art, wherein, chinese patents CN108828465A and CN108845275A inject interference signals into the input end of the switching power supply, receive the interference situation of the output end, are only applicable to the switching power supply, and consider the influence caused by the external interference injection; the chinese patent CN106443237B is a method for testing S parameters between high and low voltages by using a network analyzer, and can only be used for testing physical coupling capability between high and low voltages, and is in a non-operating state, and does not consider the influence caused by the operation of the components themselves.
In order to implement a comprehensive test on a high-low voltage coupling mechanism of a fuel cell system, an embodiment of the present application provides a test system for a high-low voltage coupling mechanism, which is used for testing a high-low voltage coupling coefficient of a device under test, where the device under test includes a high-voltage port, an output port, and a low-voltage and communication port, and the test system for the high-low voltage coupling mechanism includes: the system comprises a high-voltage direct-current power supply, a load box, a low-voltage direct-current power supply, a receiving device, a first high-voltage isolation device, a second high-voltage isolation device and a low-voltage isolation device; wherein the content of the first and second substances,
the high-voltage direct-current power supply is connected with the high-voltage port through the first isolation equipment, the low-voltage direct-current power supply is connected with the low-voltage and communication port through the low-voltage isolation equipment, and the load box is connected with the output port through the second high-voltage isolation equipment; the receiving equipment is connected with the low-voltage and communication port through the low-voltage isolation equipment;
the high-voltage direct-current power supply is used for providing high-voltage driving electric energy for the tested equipment;
the load box is used for providing a load for the tested equipment;
the low-voltage direct-current power supply is used for providing low-voltage electric energy for the tested equipment;
the receiving device is used for testing the interference curve of the tested device.
The test system of the high-low voltage coupling mechanism realizes the isolation of the high-voltage direct current power supply, the load box and the tested equipment respectively through the first high-voltage isolation equipment and the second high-voltage isolation equipment, avoids the interference of the high-voltage direct current power supply and the load box from influencing the test result, the receiving equipment, the low-voltage direct-current power supply and the tested equipment are isolated by the low-voltage isolation equipment, the test result is prevented from being influenced by the self interference of the receiving equipment and the low-voltage direct-current power supply, the receiving equipment is used for testing the interference curve of the tested equipment, so that the attenuation characteristic after the high-voltage interference generated in the working process of the high-voltage circuit of the tested equipment enters low-voltage interference is tested, the high-voltage and low-voltage coupling mechanism of the high-voltage circuit in the tested equipment is further researched, the high-voltage and low-voltage coupling design of the high-voltage circuit is guided, and the aim of improving the overall electromagnetic compatibility of the tested equipment is fulfilled.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the present application provides a test system of a high-low voltage coupling mechanism, as shown in fig. 1, the test system is used for testing a high-low voltage coupling coefficient of a device under test 103, where the device under test 103 includes a high voltage port 1031, an output port 1033, and a low voltage and communication port, and the test system of the high-low voltage coupling mechanism includes: a high voltage dc power supply 101, a load box 104, a low voltage dc power supply 108, a receiving device 106, a first high voltage isolation device 1021, a second high voltage isolation device 1022, and a low voltage isolation device 107; wherein the content of the first and second substances,
the high voltage dc power supply 101 is connected to the high voltage port 1031 through the first isolation device, the low voltage dc power supply 108 is connected to the low voltage and communication port 1032 through the low voltage isolation device 107, and the load box 104 is connected to the output port 1033 through the second high voltage isolation device 1022; the receiving device 106 is connected to the low voltage and communication port 1032 through the low voltage isolation device 107;
the high-voltage direct-current power supply 101 is used for providing high-voltage driving electric energy for the tested equipment 103;
the load box 104 is used for providing a load for the device under test 103;
the low-voltage direct-current power supply 108 is used for providing low-voltage electric energy for the tested device 103;
the receiving device 106 is configured to test an interference curve of the device under test 103.
Specifically, in this embodiment, the high-voltage dc power supply 101 in the test system of the high-voltage and low-voltage coupling mechanism is connected to the high-voltage port 1031 through the first isolation device, so that the high-voltage dc power supply 101 provides high-voltage driving power for the high-voltage circuit of the device under test 103 through the high-voltage port 1031, the low-voltage dc power supply 108 is connected to the low-voltage and communication port 1032 through the low-voltage isolation device 107, so that the low-voltage dc power supply 108 provides low-voltage power for the low-voltage circuit of the device under test 103 through the low-voltage and communication port 1032, the load box 104 is configured to provide a load for the device under test 103, so as to simulate a normal on-load condition of the device under test 103, the receiving device 106 is connected to the low-voltage and communication port through the low-voltage isolation device 107, so that the receiving device 106 can test an interference curve of the device under test 103, the method lays a foundation for determining the high-low voltage coupling mechanism of the tested device 103 according to the interference curve of the tested device 103.
It should be noted that, in this embodiment, for the device under test 103, especially for the fuel cell system, the high voltage refers to the device or component with the dc operating voltage or the output voltage having the amplitude between 300V and 750V, and the low voltage refers to the device or component with the dc operating voltage or the output voltage of 12V or 24V. Specifically, the high-voltage dc power supply 101 is a power supply outputting a dc power voltage with an amplitude of 300V-750V, the high-voltage port is a port for receiving a dc working voltage with an amplitude of 300V-750V, the low-voltage and communication port is a port for receiving a dc working voltage with an amplitude of 12V or 24V and communication information, and the low-voltage dc power supply 108 is a power supply outputting a dc power voltage with an amplitude of 12V-24V. The high-low voltage coupling mechanism refers to a mechanism of interference coupling of interference of a high-voltage circuit of the device under test 103 to a low-voltage circuit.
In disturbances coupled to low-voltage circuits
In general, the control circuit and the like of the device under test 103 are low-voltage circuits, and the dc operating voltage thereof is usually 12V or 24V.
Optionally, the first high-voltage isolation device 1021 is a high-voltage Line Impedance Stabilization Network (LISN);
the second high-voltage isolation device 1022 is a high-voltage line impedance stabilizing network;
the low-voltage isolation device 107 is a low-voltage Line Impedance Stabilization Network (LISN).
On the basis of the above embodiments, in an embodiment of the present application, the receiving device 106 is further configured to test a noise-floor interference curve when the high-voltage port 1031 and the low-voltage and communication port 1032 of the device under test 103 are both closed.
In this embodiment, when the high-voltage port 1031 and the low-voltage and communication port 1032 of the device under test 103 are both closed, the receiving device 106 is further configured to test a noise-floor interference curve, so as to remove the influence of the noise-floor interference curve in a subsequent analysis process of a high-voltage and low-voltage coupling mechanism, and improve the test accuracy.
In fig. 1, DC + and DC-represent the positive and negative poles of the high voltage DC power supply 101, respectively, and LV + and LV-represent the positive and negative poles of the low voltage DC power supply 108, respectively.
On the basis of the above embodiment, in an embodiment of the present application, the testing of the interference curve of the device under test 103 by the receiving device 106 is specifically used for testing a low-voltage interference curve of the device under test 103 when the low-voltage and communication port 1032 of the device under test 103 is opened and the high-voltage port 1031 is closed;
or
And when the low-voltage and communication port 1032 and the high-voltage port 1031 of the tested device 103 are both opened, testing the interference curves of the tested device 103 under different operating powers.
In this embodiment, when the high-voltage circuit and the low-voltage circuit of the device under test 103 do not work, the receiving device 106 tests a noise floor interference curve; when the high-voltage circuit of the device under test 103 does not work and the low-voltage circuit works, the receiving device 106 tests the low-voltage interference curve of the low-voltage circuit of the device under test 103; when the high-voltage circuit and the low-voltage circuit of the device under test 103 both work, the receiving device 106 tests the interference curves of the device under test 103 under different operating powers, and then the high-voltage and low-voltage coupling coefficients of the device under test 103 under different operating powers can be calculated according to the bottom noise interference curve, the low-voltage interference curve and the interference curves of the device under test 103 under different operating powers.
Specifically, the calculating the high-low voltage coupling coefficients of the device under test 103 under different operating powers according to the bottom noise interference curve, the low-voltage interference curve and the interference curve of the device under test 103 under different operating powers includes:
substituting the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested device 103 under different operating powers into a first preset formula to calculate and obtain high-voltage and low-voltage coupling coefficients of the tested device 103 under different operating powers;
the first preset formula includes:
wherein α represents the high-low voltage coupling coefficient of the device under test 103 at the preset operating power, L2 represents the low voltage interference curve, L3 represents the interference curve of the device under test 103 at the preset operating power, and L1 represents the noise floor interference curve.
On the basis of the above embodiment, in another embodiment of the present application, still referring to fig. 1, the system for testing the high-low voltage coupling mechanism further includes: an upper computer 105;
the upper computer 105 is used for controlling the working states of the tested device 103, the high-voltage direct-current power supply 101, the low-voltage direct-current power supply 108, the load box 104 and the receiving device 106 and monitoring whether all parameters of the tested device 103 are normal.
The upper computer 105 monitors whether each parameter of the tested device 103 is normal or not, and specifically comprises the following steps: monitoring whether various parameters (or indexes) of the tested device 103 in operation are within a preset normal range value, and if so, judging that the working state of the tested device 103 is normal.
The following describes a method for testing a high-low voltage coupling mechanism provided in the embodiments of the present application.
Specifically, as shown in fig. 2, the method for testing the high-low voltage coupling mechanism is implemented based on the system for testing the high-low voltage coupling mechanism in any of the embodiments, and the method for testing the high-low voltage coupling mechanism is used to test the high-low voltage coupling coefficient of a device under test, where the device under test includes a high-voltage port, an output port, and a low-voltage and communication port, and the method for testing the high-low voltage coupling mechanism includes:
s101: a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
s102: a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
s103: a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
s104: and testing the interference curve of the tested equipment by utilizing the receiving equipment of the test system of the high-low voltage coupling mechanism.
Optionally, as shown in fig. 3, the method for testing the high-low voltage coupling mechanism includes:
s201: a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
s202: a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
s203: a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
s204: testing a bottom noise interference curve by using the receiving equipment when the high-voltage port and the low-voltage and communication port of the tested equipment are closed;
s205: and testing the interference curve of the tested equipment by utilizing the receiving equipment of the test system of the high-low voltage coupling mechanism.
Optionally, as shown in fig. 4, the method for testing the high-low voltage coupling mechanism includes:
s301: a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
s302: a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
s303: a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
s304: testing a bottom noise interference curve by using the receiving equipment when the high-voltage port and the low-voltage and communication port of the tested equipment are closed;
s305: testing a low-voltage interference curve of the tested equipment when a low-voltage port and a communication port of the tested equipment are opened and a high-voltage port is closed;
s306: and testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
Optionally, as shown in fig. 5, the method for testing the high-low voltage coupling mechanism includes:
s401: a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
s402: a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
s403: a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
s404: testing a bottom noise interference curve by using the receiving equipment when the high-voltage port and the low-voltage and communication port of the tested equipment are closed;
s405: testing a low-voltage interference curve of the tested equipment when a low-voltage port and a communication port of the tested equipment are opened and a high-voltage port is closed;
s406: and testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
S407: and calculating high-low voltage coupling coefficients of the tested equipment under different operating powers according to the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested equipment under different operating powers.
Optionally, as shown in fig. 6, the method for testing the high-low voltage coupling mechanism includes:
s501: a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
s502: a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
s503: a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
s504: testing a bottom noise interference curve by using the receiving equipment when the high-voltage port and the low-voltage and communication port of the tested equipment are closed;
s505: testing a low-voltage interference curve of the tested equipment when a low-voltage port and a communication port of the tested equipment are opened and a high-voltage port is closed;
s506: and testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
S507: calculating high-low voltage coupling coefficients of the tested equipment under different operating powers according to the bottom noise interference curve, the low-voltage interference curve and interference curves of the tested equipment under different operating powers;
s508: substituting the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested equipment under different operating powers into a first preset formula to calculate and obtain high-voltage and low-voltage coupling coefficients of the tested equipment under different operating powers;
the first preset formula includes:
wherein α represents the high-low voltage coupling coefficient of the tested device under the preset operating power, L2 represents the low-voltage interference curve, L3 represents the interference curve of the tested device under the preset operating power, and L1 represents the background noise interference curve.
In summary, the embodiment of the present application provides a test system and a test method for a high-voltage and low-voltage coupling mechanism, wherein the test system for a high-voltage and low-voltage coupling mechanism respectively implements isolation of a high-voltage dc power supply, a load box, and a device under test by a first high-voltage isolation device and a second high-voltage isolation device, so as to avoid interference of the high-voltage dc power supply and the load box from affecting a test result, implement isolation between a receiving device, a low-voltage dc power supply, and the device under test by a low-voltage isolation device, avoid interference of the receiving device and the low-voltage dc power supply from affecting the test result, implement attenuation characteristics after high-voltage interference coupling generated in a working process of a high-voltage circuit of the device under test enters low-voltage interference by the receiving device, and further study the high-voltage and low-voltage coupling mechanism of a high-voltage circuit in the device, the high-voltage and low-voltage coupling design of the high-voltage circuit is guided, so that the aim of improving the overall electromagnetic compatibility of the tested equipment is fulfilled.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A system for testing a high-voltage and low-voltage coupling mechanism, the system being used for testing a high-voltage and low-voltage coupling coefficient of a device under test, the device under test including a high-voltage port, an output port, and a low-voltage and communication port, the system for testing a high-voltage and low-voltage coupling mechanism comprising: the system comprises a high-voltage direct-current power supply, a load box, a low-voltage direct-current power supply, a receiving device, a first high-voltage isolation device, a second high-voltage isolation device and a low-voltage isolation device; wherein the content of the first and second substances,
the high-voltage direct-current power supply is connected with the high-voltage port through the first isolation equipment, the low-voltage direct-current power supply is connected with the low-voltage and communication port through the low-voltage isolation equipment, and the load box is connected with the output port through the second high-voltage isolation equipment; the receiving equipment is connected with the low-voltage and communication port through the low-voltage isolation equipment;
the high-voltage direct-current power supply is used for providing high-voltage driving electric energy for the tested equipment;
the load box is used for providing a load for the tested equipment;
the low-voltage direct-current power supply is used for providing low-voltage electric energy for the tested equipment;
the receiving device is used for testing the interference curve of the tested device.
2. The system for testing a high-voltage and low-voltage coupling mechanism according to claim 1, wherein the receiving device is further configured to test a noise floor interference curve when the high-voltage port and the low-voltage and communication port of the device under test are both closed.
3. The system for testing a high-voltage and low-voltage coupling mechanism according to claim 2, wherein the receiving device tests the interference curve of the device under test, and is specifically configured to test the low-voltage interference curve of the device under test when the low-voltage and communication port of the device under test is open and the high-voltage port is closed;
or
And testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
4. The system for testing a high-low voltage coupling mechanism according to claim 1, further comprising: an upper computer;
the upper computer is used for controlling the working states of the tested equipment, the high-voltage direct-current power supply, the low-voltage direct-current power supply, the load box and the receiving equipment and monitoring whether all parameters of the tested equipment are normal or not.
5. The system for testing a high-voltage and low-voltage coupling mechanism according to claim 1, wherein the first high-voltage isolation device is a high-voltage line impedance stabilization network;
the impedance stabilizing network of the high-voltage line of the second high-voltage isolation equipment;
the low-voltage isolation equipment is a low-voltage line impedance stabilizing network.
6. A method for testing a high-low voltage coupling mechanism, which is implemented by a system for testing a high-low voltage coupling mechanism according to any one of claims 1 to 5, and is used for testing the high-low voltage coupling coefficient of a device under test, the device under test including a high-voltage port, an output port, and a low-voltage and communication port, the method for testing a high-low voltage coupling mechanism including:
a high-voltage direct-current power supply of a test system utilizing the high-low voltage coupling mechanism provides high-voltage driving electric energy for the tested equipment;
a load box of a test system utilizing the high-low voltage coupling mechanism provides load for the tested equipment;
a low-voltage direct-current power supply of the test system utilizing the high-low voltage coupling mechanism provides low-voltage electric energy for the tested equipment;
and testing the interference curve of the tested equipment by utilizing the receiving equipment of the test system of the high-low voltage coupling mechanism.
7. The method for testing the high-low voltage coupling mechanism according to claim 6, wherein before the receiving device of the testing system using the high-low voltage coupling mechanism tests the interference curve of the device under test, the method further comprises:
and testing a bottom noise interference curve by using the receiving equipment when the high-voltage port and the low-voltage and communication port of the tested equipment are closed.
8. The method for testing the high-low voltage coupling mechanism according to claim 7, wherein the step of testing the interference curve of the device under test by using the receiving device of the test system of the high-low voltage coupling mechanism comprises:
testing a low-voltage interference curve of the tested equipment when a low-voltage port and a communication port of the tested equipment are opened and a high-voltage port is closed;
and testing the interference curves of the tested equipment under different operating powers when the low-voltage port, the communication port and the high-voltage port of the tested equipment are opened.
9. The method for testing the high-low voltage coupling mechanism according to claim 8, wherein the step of testing the interference curves of the device under test at different operating powers while the low-voltage and communication ports and the high-voltage port of the device under test are both open further comprises:
and calculating high-low voltage coupling coefficients of the tested equipment under different operating powers according to the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested equipment under different operating powers.
10. The method for testing a high-low voltage coupling mechanism according to claim 9, wherein the calculating the high-low voltage coupling coefficients of the device under test at different operating powers according to the noise floor interference curve, the low-voltage interference curve and the interference curve of the device under test at different operating powers comprises:
substituting the bottom noise interference curve, the low-voltage interference curve and the interference curve of the tested equipment under different operating powers into a first preset formula to calculate and obtain high-voltage and low-voltage coupling coefficients of the tested equipment under different operating powers;
the first preset formula includes:
wherein α represents the high-low voltage coupling coefficient of the tested device under the preset operating power, L2 represents the low-voltage interference curve, L3 represents the interference curve of the tested device under the preset operating power, and L1 represents the background noise interference curve.
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