CN111257663B - Switching test circuit - Google Patents
Switching test circuit Download PDFInfo
- Publication number
- CN111257663B CN111257663B CN201811465682.8A CN201811465682A CN111257663B CN 111257663 B CN111257663 B CN 111257663B CN 201811465682 A CN201811465682 A CN 201811465682A CN 111257663 B CN111257663 B CN 111257663B
- Authority
- CN
- China
- Prior art keywords
- capacity
- power
- voltage
- power bus
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/30—Reactive power compensation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Supply And Distribution Of Alternating Current (AREA)
Abstract
The application provides a switching test circuit, includes: the input end of the voltage regulator is connected with a power supply of the test system; the input end of the adjustable transformer is connected with the output end of the voltage regulator; the power bus is connected with the output end of the transformer; the input end interface of the tested device is connected with the power bus; the first end of the first isolating switch is connected with the power bus; one end of the reactor group is connected with the second end of the first isolating switch, and the other end of the reactor group is grounded; the first end of the second isolating switch is connected with the power bus; and one end of the compensation device is connected with the second end of the second isolating switch, and the other end of the compensation device is grounded. Before the capacitor device is connected to a power grid, a switching test is carried out on the capacitor device, and safe and reliable work of the capacitor device after the capacitor device is connected to the power grid is guaranteed.
Description
Technical Field
The invention relates to the technical field of power equipment testing, in particular to a switching test circuit for a power capacitor type test.
Background
A capacitor device refers to a device assembled by a capacitor (or a capacitor bank) and all accessories (such as a switching device, a protection device, a controller and the like) according to design requirements. It has high integration and is convenient for practical use.
In recent years, with the increasing requirements of China on power supply quality, more and more reactive compensation devices are required to be connected to a grid, and particularly in medium and high voltage lines, the utilization rate of a capacitor device is increased continuously due to the flexible installation mode of the capacitor device, which can effectively improve the power transmission efficiency of a power supply of a test system and reduce the harmonic level.
Before the capacitor device is connected to the power supply of the test system, it is necessary to ensure the safety and reliability of the capacitor device, and how to ensure that the capacitor device can safely and reliably operate after being connected to the power supply of the test system becomes one of the technical problems to be solved by those skilled in the art.
Disclosure of Invention
In view of this, the embodiment of the present invention provides a switching test circuit, so as to perform a switching test on a capacitor device before the capacitor device is connected to a power grid, thereby ensuring that the capacitor device can safely and reliably operate after being connected to the power grid.
In order to achieve the above purpose, the embodiments of the present invention provide the following technical solutions:
a switching test circuit comprising:
the input end of the voltage regulator is connected with a power supply of the test system;
the input end of the adjustable transformer is connected with the output end of the voltage regulator;
the power bus is connected with the output end of the transformer;
the input end interface of the device to be tested is connected with the power bus;
the first end of the first isolating switch is connected with the power supply bus;
a reactor group with one end connected with the second end of the first isolating switch and the other end grounded;
the first end of the second isolating switch is connected with the power bus;
and one end of the compensation device is connected with the second end of the second isolating switch, and the other end of the compensation device is grounded.
Preferably, the switching test circuit further includes:
and the data acquisition unit is used for acquiring the voltage of the power bus, the current of the power bus and the reactive power on the power bus and sending the acquired data to the compensation device.
Preferably, in the switching test circuit, the number of the input end interfaces of the device to be tested is not less than 2.
Preferably, in the switching test circuit, the reactor group is a reactor group with adjustable rated working voltage and input capacity.
Preferably, in the switching test circuit, the compensation device is configured to output a power frequency fundamental current and a harmonic current to compensate for the fundamental current and the transient harmonic current of the device to be tested during the switching test.
Preferably, in the switching test circuit, the capacity to be put into the device to be tested is smaller than the maximum output capacity of the compensation device.
Preferably, in the switching test circuit, a rated maximum output capacity of the compensation device satisfies a condition:
Preferably, in the switching test circuit, the switched capacity of the device under test is smaller than the maximum output capacity of the reactor group.
Preferably, in the switching test circuit, a rated maximum output capacity of the reactor group satisfies a condition:
Preferably, in the switching test circuit, when the first isolation switch is closed, the operating state of the reactor group satisfies a condition: so that the power factor of the power bus is between 0.95 and 1.
Based on the technical scheme, the switching test circuit provided by the embodiment of the invention can perform switching test on the capacitor device before the capacitor device is connected to the power grid, so that the capacitor device can work safely and reliably after being connected to the power grid.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a switching test circuit disclosed in an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In order to ensure that the capacitor device can safely and reliably work after being connected to the power supply of the test system, the application discloses a switching test circuit for performing a switching test on the capacitor device before the capacitor device is connected to the power supply of the test system, and referring to fig. 1, the switching test circuit comprises:
the voltage regulator 1 is used for carrying out voltage reduction processing on alternating current directly collected by the test system power supply and converting the alternating current into alternating current with a lower voltage value;
the adjustable transformer 2 is used for further adjusting the alternating current output by the voltage regulator 1 to enable the output voltage value to be matched with the rated working voltage of the tested device 4, and a user can adjust the output voltage of the adjustable transformer 2 according to the small rated working voltage of the tested device, for example, the adjustable transformer can be provided with a plurality of adjustable gears, and more specifically, the adjustable transformer 2 is a three-phase transformer;
the power bus 3 is a test power bus, the tested device, the reactor group 5 and the compensation device 6 are connected in parallel to the power bus 3 (hereinafter referred to as a bus), and the bus 3 is used as an outgoing line of the adjustable transformer 2;
the number of the input end interfaces J of the tested device 4 can be set according to the requirements of users, and the interfaces are used for being connected with the tested equipment so that the tested equipment can pass throughThe input end interface J of the device to be tested is directly connected with the bus 3, referring to FIG. 1, the device to be tested can be a capacitor device, and K 1 ～K n A circuit breaker or contactor of the device; c 1 ～C n Is a parallel unit inside the device;
the first isolating switch KL is connected with the power bus 3 at a first end, and controls switching of the reactor group 5 through on-off operation under the condition of no electricity;
a reactor group 5 with one end connected with the second end of the first isolating switch KL and the other end grounded, wherein the reactor group 5 is composed of three groups of reactors which can work independently and have multiple working voltage gears, is a three-phase reactor group, is connected with the bus 3 through the first isolating switch KL and is used for compensating the reactive power of the tested device;
the first end of the second isolating switch KS is connected with the power bus 3, and the second isolating switch KS controls the switching of the compensating device 6 through switching on and off operations under the condition of no electricity;
and one end of the compensation device 6 is connected with the second end of the second isolating switch KS, the other end of the compensation device 6 is grounded, and the compensation device 6 is a three-phase compensation device capable of adjusting the working voltage gear and is used for compensating reactive power to be input of a device to be tested, controlling the voltage fluctuation of a bus, stabilizing the transient process, damping system oscillation and preventing voltage flicker.
When a device to be tested needs to be tested, the input end of the device to be tested is connected with the input end interface J of the device to be tested, the output voltage of the adjustable transformer 2 is adjusted according to the rated voltage of the device to be tested, when the device to be tested needs to be subjected to the switching test of each group of units, the reactor group 5 is cut off through the first isolating switch KL, the reactor group 5 is put into the compensation device 6 through the second isolating switch KS, then single-group switching is carried out through a switching switch arranged in the device to be tested, when the back-to-back switching test needs to be carried out, the reactor group 5 is put into through the first isolating switch KL, the compensation device 6 is put into through the second isolating switch KS, then single-group switching is carried out through a switching switch arranged in the device to be tested, the bus voltage is raised to 1KV, and the reactor group is adjusted, and the power factor of the bus meets a preset threshold value, the voltage of the bus is increased to the rated working voltage of the tested device, and then single-group switching is carried out through a switching switch arranged in the tested device.
In the technical scheme disclosed by the embodiment of the application, the requirement on the capacity of a test circuit during the test can be effectively reduced by adopting the reactor group 5 and the compensation device 6, the impact on a power supply is reduced, and the voltage fluctuation of the test voltage is reduced; the compensation device can provide fundamental wave/harmonic wave reactive compensation for the loop, and the output capacity of the compensation device can be multiple times of the input capacity; greatly simplifying the test operation process and improving the efficiency.
In the technical scheme disclosed in another embodiment of the present application, the device may further include a data acquisition unit for acquiring voltage, current and power of the switching test circuit, where the data acquisition unit may refer to a plurality of sensors, and the sensors are configured to acquire voltage of the bus 3, current of the bus 3 and reactive power on the bus 3, send the acquired voltage, current and power to the compensation device, and feed back the acquired voltage, current and power to the compensation device, and the compensation device generates and outputs a compensation signal based on the voltage, current and power after acquiring the voltage, current and power sent by the data acquisition unit.
In the technical scheme disclosed in the embodiment of the application, the number of the input end interfaces of the tested device can be set by a user according to the requirement of the user, the number of the tested devices is not less than that of the tested device, for example, the number of the input end interfaces of the tested device can be set to be not less than two, and each input end interface of the tested device is correspondingly connected with one tested device.
Further, in order to enable the switching test circuit to adapt to tested devices with different specifications, the reactor group 5 is a reactor group with adjustable rated working voltage and input capacity.
In order to reduce the side impact on a power supply of a test system and adapt to the test requirements of multiple voltage levels and multiple parameters, the compensation device 6 is used for outputting power frequency fundamental current and harmonic current so as to compensate the fundamental current and transient harmonic current of a tested device during switching test.
Further, in the technical solutions disclosed in the above embodiments of the present application, for the switching test of each group of units, the tested device has no capacity put into the test before the test, and only the compensation device 6 is put into the test, so that the capacity to be put into the tested device is smaller than the maximum output capacity of the compensation device.
That is to say that the first and second electrodes,
wherein, Q is CS For the capacity of the device under test, the U T A test voltage (usually the rated voltage of the device under test) applied to the bus 3, U SN For rapidly compensating the output voltage of the device 6, said Q SN Is the rated maximum output capacity of the compensating device.
When a back-to-back switching test is carried out on a tested device, the tested device is put into partial capacity when the tested device is tested, the put-into capacity needs to be checked during the test, and the put-into capacity is compensated by using a reactor group; and then determining the capacity to be put into the tested device, specifically, the rated maximum output capacity of the reactor group 5 meets the condition:
Further, the reactor group 5 is further configured to ensure that a power factor on the power bus is within a preset threshold, specifically, when the first isolation switch KL is closed, a working state of the reactor group 5 satisfies a condition: so that the power factor of the bus bar 3 is between 0.95 and 1.
Experiments prove that the switching test circuit disclosed by the embodiment of the application can meet the switching test requirements of high-voltage parallel capacitor devices of 35kV, 24Mvar and below and high-voltage power filter devices of 35kV, 24Mvar and below. When the test sample is a high-voltage parallel capacitor device, the rapid compensation device is responsible for rapidly compensating the capacity to be input, and the voltage change of the bus is controlled to meet the standard requirement.
In the present specification, the embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (6)
1. A switching test circuit, comprising:
the input end of the voltage regulator is connected with a power supply of the test system;
the input end of the adjustable transformer is connected with the output end of the voltage regulator;
the power bus is connected with the output end of the transformer;
the input end interface of the device to be tested is connected with the power bus;
the first end of the first isolating switch is connected with the power bus;
a reactor group with one end connected with the second end of the first isolating switch and the other end grounded;
the first end of the second isolating switch is connected with the power supply bus;
one end of the compensation device is connected with the second end of the second isolating switch, and the other end of the compensation device is grounded;
wherein the capacity to be put into the device to be tested is smaller than the maximum output capacity of the compensating device, and the rated maximum output capacity of the compensating device meets the condition that:
and/or the presence of a gas in the gas,
wherein the input capacity of the device under test is less than the maximum output capacity of the reactor group, and the rated maximum output capacity of the reactor group satisfies the condition:
2. The switching test circuit of claim 1, further comprising:
and the data acquisition unit is used for acquiring the voltage of the power bus, the current of the power bus and the reactive power on the power bus and sending the acquired data to the compensation device.
3. The switching test circuit of claim 1, wherein the number of input ports of the device under test is not less than 2.
4. The switching test circuit according to claim 1, wherein the reactor groups are adjustable in rated operating voltage and input capacity.
5. The switching test circuit according to claim 1, wherein the compensation device is configured to output a power frequency fundamental current and a harmonic current to compensate a fundamental current and a transient harmonic current of the device under test during the switching test.
6. The switching test circuit according to claim 1, wherein when said first disconnector is closed, the operating state of said reactor group satisfies the condition: so that the power factor of the power bus is between 0.95 and 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811465682.8A CN111257663B (en) | 2018-12-03 | 2018-12-03 | Switching test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811465682.8A CN111257663B (en) | 2018-12-03 | 2018-12-03 | Switching test circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111257663A CN111257663A (en) | 2020-06-09 |
| CN111257663B true CN111257663B (en) | 2022-09-09 |
Family
ID=70948813
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811465682.8A Active CN111257663B (en) | 2018-12-03 | 2018-12-03 | Switching test circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111257663B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112014676B (en) * | 2020-09-11 | 2023-10-13 | 西安高压电器研究院股份有限公司 | Switching test device for capacitor device type test |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6008548A (en) * | 1997-09-19 | 1999-12-28 | Cinergy Corp. | Programmable logic controller for resonance control in complex capacitor switching |
| CN102253291B (en) * | 2011-04-26 | 2013-05-22 | 湖北省电力公司电力科学研究院 | Testing station for automatic tracking compensation arc complete-set equipment |
| CN203069685U (en) * | 2012-08-27 | 2013-07-17 | 武汉华工先舰电气股份有限公司 | Comprehensive test instrument for capacitor or inductor switching test |
| CN102967826B (en) * | 2012-11-05 | 2015-05-13 | 中国电力科学研究院 | Test method for electric endurance of switching capacitor set beaker of extra-high voltage project |
| CN204046180U (en) * | 2014-08-01 | 2014-12-24 | 江苏银泰电气科技有限公司 | Intelligent powerless compensation system |
| CN106208106B (en) * | 2016-08-31 | 2018-10-16 | 丹东德元电力电器有限公司 | A kind of paralleling compensating device based on compensation/current-limiting reactor |
| CN107329023A (en) * | 2017-08-11 | 2017-11-07 | 杭州得诚电力科技股份有限公司 | The detecting system and detection method of a kind of reactive power compensator |
| CN108445311B (en) * | 2018-03-30 | 2020-10-09 | 中国西电电气股份有限公司 | Capacitor noise test loop and test method thereof |
-
2018
- 2018-12-03 CN CN201811465682.8A patent/CN111257663B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN111257663A (en) | 2020-06-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7352597B2 (en) | Comprehensive power quality controller for substation in power system | |
| CN103558536B (en) | The circuit of test series capacitor tolerance capability of overload and method of work thereof | |
| CN110544929B (en) | Earth fault current compensation system and method for self-generating power phase power supply | |
| CN106936140B (en) | Reactive power adjusting device and method based on cooperation of flexible direct current and high-voltage parallel capacitor | |
| CN111509691B (en) | Ground fault full-compensation topology for multiplexing reactive compensation and design method thereof | |
| CN111257663B (en) | Switching test circuit | |
| CN106483408B (en) | Detection method for high-power direct-current electrical equipment | |
| CN106684927A (en) | Grid-connected system for large generator sets in isolated grid system and grid-connected method | |
| JP2014204460A (en) | Current-limiting/current flow controller | |
| CN108663592B (en) | Opposite-dragging type SVG module debugging platform and method | |
| CN205301461U (en) | High -power high -voltage inverter aging testing system | |
| CN202150705U (en) | Thyristor voltage adjusting transformer station automatic reactive compensation device for adjusting reactive capacity | |
| CN111525606A (en) | Double closed loop control-based ship shore-based power supply system seamless grid-connection control method | |
| CN111509692A (en) | Ground fault full-compensation system and method for multiplexing parallel reactive compensation | |
| CN104901321A (en) | Long-distance cable power transmission and distribution network voltage control system | |
| US9257844B2 (en) | Arrangement and method for reactive power compensation | |
| CN106291295B (en) | Chain-end withstand voltage test method for chained STATCOM converter chain | |
| Shariatinasab et al. | Harmonic analysis of power systems in order to network conversion | |
| CN210629108U (en) | Wide-width pressure regulating device | |
| CN111509689A (en) | Ground fault full-compensation system and method for multiplexing parallel reactive compensation | |
| CN104764951A (en) | 380 V voltage class APF testing platform and testing method | |
| JP2019037089A (en) | Power fluctuation mitigation system | |
| RU2586061C2 (en) | Method and device for control of adaptive energy-saving system of n-phase network | |
| CN215871238U (en) | Dynamic starting stabilizing device for high-voltage high-power motor | |
| CN213816835U (en) | High-voltage reactive automatic compensation device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20210722 Address after: No.18, north section of West 2nd Ring Road, Lianhu District, Xi'an City, Shaanxi Province, 710077 Applicant after: XI'AN HIGH VOLTAGE APPARATUS RESEARCH INSTITUTE Co.,Ltd. Address before: No.18, north section of West 2nd Ring Road, Lianhu District, Xi'an City, Shaanxi Province, 710077 Applicant before: XI'AN HIGH VOLTAGE APPARATUS RESEARCH INSTITUTE Co.,Ltd. Applicant before: CHINA XD ELECTRIC Co.,Ltd. |
|
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 710000 No. 18, north section of West 2nd Ring Road, Lianhu District, Xi'an City, Shaanxi Province Applicant after: Xi'an High Voltage Electrical Apparatus Research Institute Co.,Ltd. Address before: No.18, north section of West 2nd Ring Road, Lianhu District, Xi'an City, Shaanxi Province, 710077 Applicant before: XI'AN HIGH VOLTAGE APPARATUS RESEARCH INSTITUTE Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |