CN111308232A - System and method for measuring stray parameters of current loop of high-power converter module - Google Patents

System and method for measuring stray parameters of current loop of high-power converter module Download PDF

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CN111308232A
CN111308232A CN201811517074.7A CN201811517074A CN111308232A CN 111308232 A CN111308232 A CN 111308232A CN 201811517074 A CN201811517074 A CN 201811517074A CN 111308232 A CN111308232 A CN 111308232A
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current
tested
module
stray
loop
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CN111308232B (en
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李彦涌
黄南
邹扬举
刘少奇
马振宇
朱武
刘建平
周伟军
孙保涛
胡惇
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CRRC Zhuzhou Institute Co Ltd
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    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract

The invention discloses a measuring and taking system for stray parameters of a current loop of a high-power converter module, which comprises the following components: an adjustable inductance module for providing a standard inductance value; an adjustable capacitance module for providing a standard capacitance value; the current acquisition module is connected with the adjustable inductance module and used for acquiring a first resonant current of the resonant circuit when the current loop to be tested is started; and the data processing module is used for extracting the periods of the positive half-wave current and the negative half-wave current from the resonant current, obtaining the stray parameters corresponding to the first loop through which the positive half-wave current flows and the stray parameters corresponding to the second loop through which the negative half-wave current flows according to a standard inductance value or a standard capacitance value, and representing the stray parameters of the current loop to be tested. The method is realized in a low-pressure environment, can meet the measurement and the acquisition of the stray parameters with different precision levels, and has high working efficiency.

Description

System and method for measuring stray parameters of current loop of high-power converter module
Technical Field
The invention relates to the technical field of power electronics, in particular to a system and a method for measuring stray parameters of a current loop of a high-power converter module.
Background
In the power electrical industry, the reliability of high power converters/modules is limited by many factors, such as: circuit topology, component characteristics, operating conditions, etc., while converter stray parameters inevitably exist in the converter. The high-power converter/module circuit has complex topology, large capacity and high voltage and current, so that a large number of busbars are used, and meanwhile, under the conditions of high switching frequency and high switching rate, stray parameters in a current loop of the converter easily have large influence on the switching characteristics of devices, and the safe and reliable operation of the converter is further influenced. The stray parameters generate electromagnetic radiation in the current converting process, so that the EMI of the current converter is influenced significantly. Therefore, extracting the stray parameters of the current loop of the converter is always the key for evaluating the performance and reliability of the converter.
For inductance and capacitance parameters in the circuit, corresponding instruments and devices such as an LRC meter, an electric bridge, an inductance and capacitance tester and the like can be generally adopted, so that higher precision can be achieved. However, in the current transformer, the fully-controlled power devices (such as IGBTs and IGCTs) are usually in an off state, and a certain voltage or current must be applied to test the inductance and capacitance parameters of the current loop, and the current loop can be formed only after the fully-controlled power devices are controlled to be turned on. Therefore, the general test instrument is not applicable. In the prior art, although some existing patents directly calculate the stray parameters through the oscillation period of the LC circuit, the corresponding method has a high requirement on the capacitance precision during testing, and neglects the parasitic inductance generated by the capacitance itself, so that it is difficult to achieve high measurement precision. In other technical schemes, the stray inductance value of the current loop of the converter is obtained by obtaining the current change rate when the device is switched and directly obtaining the voltage parameters at two ends of the current loop, and the method is difficult to accurately read the current change value on one hand and easy to influence the voltage signal by the device switch on the other hand, thereby causing larger reading and calculating errors. In addition, since the converter stage cannot be separately applied with high voltage and subjected to a large current test, the method is not suitable for measuring the stray parameters of the converter stage.
Disclosure of Invention
The invention needs to provide a measuring and taking system with low requirements on the precision of a capacitor and an inductor device and the parasitic inductance of the capacitor, and is suitable for measuring and taking methods at the converter or converter module level so as to solve the problem of measuring and taking the stray parameters of the test object.
In order to solve the above technical problem, the present invention provides a system for measuring stray parameters of a current loop of a high-power converter module, where the system includes: the first end of the adjustable inductance module is connected with the first end of the current loop to be tested and used for providing a set standard inductance value required by the test; the first end of the adjustable capacitance module is connected with the second end of the adjustable inductance module, and the second end of the adjustable capacitance module is connected with the second end of the current loop to be tested and used for providing a set standard capacitance value required by the test; the current acquisition module is connected with the adjustable inductance module and is used for acquiring a first resonant current of a resonant circuit formed by the adjustable inductance module and the adjustable capacitance module under the condition that the current loop to be tested is started; and the data processing module is connected with the current acquisition module and is used for respectively extracting periods of positive half-wave current and negative half-wave current from the first resonant current, obtaining stray parameters corresponding to a first loop which comprises the resonant circuit and a full-control power device access in the current loop to be tested and through which the positive half-wave current flows, and stray parameters corresponding to a second loop which comprises the resonant circuit and a follow current tube access in the current loop to be tested and through which the negative half-wave current flows, further obtaining first stray parameters aiming at the full-control power device access through the first loop stray parameters, and obtaining second stray parameters aiming at the follow current tube access through the second loop stray parameters so as to represent the stray parameters of the current loop to be tested.
Preferably, the first/second spur parameters include: a first/second stray inductance value, wherein the data processing block is configured to derive the first/second stray inductance value from the standard capacitance value according to a squared difference of a first resonant current positive/negative half-wave period and an intrinsic resonant period of the resonant circuit.
Preferably, the first/second spur parameters further include: a first/second stray capacitance value, wherein the data processing module is further configured to derive the first/second stray capacitance value from the standard inductance value according to a squared difference of a first resonant current positive/negative half-wave period and an intrinsic resonant period of the resonant circuit.
Preferably, under the condition that two ends of the current loop to be tested are connected with the measuring system through a first busbar to be tested and a second busbar to be tested which are identical in structure, stray parameters of the first busbar to be tested and the second busbar to be tested are further measured, wherein the current collecting module is further used for collecting a second resonant current of the resonant circuit under the condition that the first busbar to be tested and the second busbar to be tested are accessed; the data processing module is further configured to extract a period of a positive half-wave current from the second resonant current, obtain, according to the standard inductance value or the standard capacitance value, a stray parameter corresponding to a third loop through which the positive half-wave current flows, the third loop including the first loop, the first busbar to be tested, and the second busbar to be tested, further obtain, from the third loop stray parameter, a third stray parameter for the fully-controlled power device access, the first busbar to be tested, and the second busbar to be tested, and obtain, based on this, the stray parameter of the first/second busbar to be tested by using a difference between the third stray parameter and the first stray parameter.
Preferably, the measuring system further comprises: and the direct current power supply is connected to two ends of the adjustable capacitor module and used for charging the adjustable capacitor module so as to provide a corresponding voltage source for forming the resonant circuit for the adjustable capacitor module.
Preferably, the measuring system further comprises: and the measurement control module is connected between the adjustable capacitor module and the direct current power supply and used for receiving and utilizing a charging starting signal or a charging stopping signal to control the on-off of the input end and the output end of the measurement control module so as to charge the adjustable capacitor module through the direct current power supply.
Preferably, the measuring system further comprises: the device triggering module is connected with a triggering port of a full-control power device in the current loop to be tested, and is used for providing triggering signals for all the full-control power devices in the current loop to be tested after receiving and utilizing a pulse starting signal so as to drive all the full-control power devices in the current loop to be tested to be conducted, so that the current loop to be tested generates current, and corresponding stray parameters are measured.
Preferably, the measuring system further comprises: the information configuration and test result generation module executes the following steps: acquiring standard capacitance configuration information and standard inductance configuration information, and respectively forwarding the standard capacitance configuration information and the standard inductance configuration information to the adjustable capacitance module and the adjustable inductance module so as to configure the standard capacitance value and the standard inductance value required by testing; sending the charging starting signal to the measurement control module to enable the direct-current power supply to charge the adjustable capacitor module; after charging is finished, sending the charging stop signal to the measurement control module to finish charging; sending the pulse starting signal to the device triggering module to enable the current loop to be tested to generate current; and acquiring the first stray parameter and the second stray parameter which are sent by the data processing module.
In another aspect, a method for measuring stray parameters of a current loop of a high-power converter module is provided, where the method uses the measurement system as described above to measure the stray parameters in the current loop to be tested, and the method includes: the method comprises the following steps that firstly, under the condition that a current loop to be tested is started, a current acquisition module acquires a first resonant current of a resonant circuit formed by an adjustable inductance module used for providing a set standard inductance value required by the test and an adjustable capacitance module used for providing a set standard capacitance value required by the test; secondly, the data processing module extracts periods of positive half-wave current and negative half-wave current from the first resonant current respectively, and obtains stray parameters corresponding to a first loop through which the positive half-wave current flows and a fully-controlled power device in the resonant circuit and the current loop to be tested, and stray parameters corresponding to a second loop through which the negative half-wave current flows and a follow current tube in the resonant circuit and the current loop to be tested according to the standard inductance value or the standard capacitance value; and step three, the data processing module further obtains a first stray parameter aiming at the full-control power device passage from the first loop stray parameter, and obtains a second stray parameter aiming at the follow current pipe passage from the second loop stray parameter, so as to represent the stray parameter of the current loop to be tested.
Preferably, the third step includes: the data processing module obtains a first/second stray inductance value from the standard capacitance value according to a square difference between a positive/negative half-wave period of the first resonant current and an inherent resonant period of the resonant circuit, wherein the first/second stray parameters include: first and second stray inductance values.
Compared with the prior art, one or more embodiments in the above scheme can have the following advantages or beneficial effects:
the invention adopts an incremental extraction mode, takes the stray parameters as the increment of the standard inductance value and the standard capacitance value of the reference standard, and can complete the measurement and the acquisition of the high-precision stray parameters under the condition of low precision of the adjustable inductor and the adjustable capacitor. The invention does not need to read the current change value, realizes the test under the low-voltage environment and realizes the parameter extraction of the converter level. In addition, an integrated operation mode is realized, the working efficiency of the parameter testing and extracting system is improved, the standard inductance value and the standard capacitance value can be adjusted, and the adjustment can be carried out according to the difference of current loops to be tested, so that the measurement and calculation can reach higher precision.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic structural diagram of a system for measuring a stray parameter of a current loop of a high-power current conversion module according to an embodiment of the present application.
Fig. 2 is a schematic structural diagram of a specific example when an object to be tested in the system for measuring a stray parameter of a current loop of a high-power current conversion module according to the embodiment of the present application is a two-level phase module.
Fig. 3 is a schematic structural diagram of a specific example when an object to be tested in the system for measuring a stray parameter of a current loop of a high-power current conversion module according to the embodiment of the present application is a three-level phase module.
Fig. 4 is a schematic structural diagram of a specific example of measuring the stray parameter of the current loop 101 to be tested in the measurement system for the stray parameter of the current loop of the high-power current conversion module according to the embodiment of the present application.
Fig. 5 is a schematic structural diagram of a specific example of measuring stray parameters of the busbar to be tested 102 in the measurement system for stray parameters of the current loop of the high-power current conversion module according to the embodiment of the present application.
Fig. 6 is a schematic diagram illustrating the calculation of the spurious parameter by the data processing module 30 in the system for measuring the spurious parameter of the current loop of the high-power current conversion module according to the embodiment of the present application.
Fig. 7 is a flowchart of the information configuration and test result generation module 70 in the system for measuring the stray parameter of the current loop of the high-power current transformer module according to the embodiment of the present application.
Fig. 8 is a step diagram of a method for measuring a stray parameter of a current loop of a high-power converter module according to an embodiment of the present application.
Detailed Description
The following detailed description of the embodiments of the present invention will be provided with reference to the drawings and examples, so that how to apply the technical means to solve the technical problems and achieve the technical effects can be fully understood and implemented. It should be noted that, as long as there is no conflict, the embodiments and the features of the embodiments of the present invention may be combined with each other, and the technical solutions formed are within the scope of the present invention.
In order to overcome the defects in the prior art, the embodiment provides a system and a method for measuring and obtaining the stray parameters of a current loop suitable for a high-power converter or a converter module. The method and the system are characterized in that an inductance value of an inductor and a capacitance value of a capacitor are reasonably selected, a current loop of the converter to be tested is connected into an LC circuit formed by the inductor and the capacitor, the current loop to be tested is conducted, the resonance effect of the LC circuit is utilized, the current resonance current is collected, and the stray parameters of a full-control power device passage and a follow current pipe passage in the corresponding current loop to be tested are respectively obtained by extracting the periodic parameters of positive half waves and negative half waves of the resonance current and respectively carrying out difference calculation with the inherent resonance period. Furthermore, after the stray parameters of the current loop of the object to be tested are measured, the current (after the current loop is connected with the busbar) resonant current of the busbar connected with the converter/module can be collected by utilizing the resonance effect of the LC circuit again, and the stray parameters of the busbar to be tested are further obtained by extracting the difference value between the periodic parameters of the positive half wave of the resonant current and the stray parameters of the full-control power device access.
The stray inductance obtained by the mode of calculating the difference with the inherent resonance period eliminates the influence of the parasitic parameters of the capacitor and the inductor on the measurement precision, and directly obtains the change of the resonance period under the action of the current loop to be tested. The measuring and taking method is convenient and flexible, and can realize the measurement and taking of the stray parameter levels of the current loops of different converters by adjusting the inductors and the capacitors with different parameters. In addition, the whole measuring system can be completed only by a low-voltage direct-current power supply, and high voltage does not need to be applied independently to perform a large-current test.
Example one
Fig. 1 is a schematic structural diagram of a system for measuring a stray parameter of a current loop of a high-power current conversion module according to an embodiment of the present application. As shown in fig. 1, the measurement system in the embodiment of the present invention at least includes an adjustable capacitance module 10, an adjustable inductance module 20, a current collection module 60, and a data processing module 30. Wherein, the first end of the adjustable inductance module 20 is connected to the first end of the current loop 101 to be tested. The adjustable inductor module 20 is used to provide the standard inductance values required for the set up test. The adjustable inductor module 20 is an adjustable inductor that automatically adjusts the standard inductance value required for the test by obtaining the corresponding standard inductance configuration information to provide the corresponding inductance value in the LC circuit for the test. The first end of the adjustable capacitor module 10 is connected to the second end of the adjustable inductor module 20, and the second end of the adjustable capacitor module 10 is connected to the second end of the current loop 101 to be tested. The tunable capacitance module 10 is used to provide the standard capacitance values required for the test that has been set. The adjustable capacitor module 10 is an adjustable capacitor, and automatically adjusts a standard capacitance value required for the measurement test by acquiring corresponding standard capacitance configuration information, so as to provide a corresponding capacitance value in the LC circuit for the measurement test. The adjustable range of the adjustable inductance module 20 related in the embodiment of the invention is between 10nH and 10uH, and the adjustable range of the adjustable capacitance module 10 is between 10nF and 20uH, so that the tested stray parameter range can be from nH/nF to uH/uF level, and the accuracy of the stray parameter can be controlled to be about 5%.
It should be noted that the current loop (also referred to as "current loop to be tested") 101 of the object to be tested refers to a loop of all current paths that can be formed in the object to be tested (not shown), wherein the object to be tested is a high-power current transformer or a high-power current transforming module. Generally, a loop of a current path can be formed at any two level ports in an object to be tested, and any two level ports in the object to be tested are used as a current loop 101 to be tested according to test requirements and are connected to two ends of a resonant circuit formed by the adjustable capacitor module 10 and the adjustable inductor module 20. The number of level ports in the object to be tested and the number of fully-controlled power devices and freewheeling devices corresponding to the current loop to be tested are not specifically limited.
In one embodiment, if the object to be tested is a two-level phase module, the DC +, and DC-level ports of the module are respectively connected to two ends of the resonant circuit formed by the adjustable capacitor module 10 and the adjustable inductor module 20, and the object to be tested is directly used as the current loop 101 to be tested. Fig. 2 is a schematic structural diagram of a specific example when an object to be tested in the system for measuring a stray parameter of a current loop of a high-power current conversion module according to the embodiment of the present application is a two-level phase module. As shown in FIG. 2, the two-level phase module is composed of a fully-controlled power device V shown in FIG. 2a1And a freewheeling diode D1Formed of, or consisting of, two fully-controlled power devices V connected in series as shown in figure 2b1、V2And two freewheeling diodes D respectively connected in parallel with each fully-controlled power device1、D2Formed by, or formed by, a plurality of fully-controlled power devices V as shown in FIG. 2c1、V2…VNA mode of continuous extension of series connection, a freewheeling diode D connected in series after being connected in parallel with each full-control power device1、D2…DNAnd forming a phase module. Wherein the DC + sum of the current loop 101 to be tested in this caseAnd a fully-controlled power device path (comprising a plurality of fully-controlled power devices connected in series) and a follow current tube path (comprising a plurality of follow current tube devices connected in series) are correspondingly arranged between the two DC-ports, so that a current loop 101 to be tested is formed at the corresponding two-level port from DC + through the fully-controlled power device path DC-or from DC-through the follow current tube path to DC +.
In an embodiment, if the object to be tested is a three-level phase module, any two level ports of DC + and NP, NP and DC-, or DC + and DC-of the module are respectively connected to two ends of the resonant circuit formed by the adjustable capacitor module 10 and the adjustable inductor module 20, and a device path corresponding to the corresponding port is used as the current loop 101 to be tested. Fig. 3 is a schematic structural diagram of a specific example when an object to be tested in the system for measuring a stray parameter of a current loop of a high-power current conversion module according to the embodiment of the present application is a three-level phase module. As shown in fig. 3, in the present three-level phase module, a current three-level phase module can be constructed from DC + via a plurality of fully-controlled power devices V1、V2、V3To the clamping diode D6Then, a current loop 101 to be tested of NP is obtained, at the moment, the DC + and NP ports can be connected to two ends of the resonance circuit to carry out stray parameter measurement and test; can also be constructed from NP through a clamping diode D5To a plurality of fully-controlled power devices V2、V3、V4Then, a DC-current loop 101 to be tested is obtained, and at the moment, the DC-port and the NP port can be connected to the two ends of the resonance circuit to carry out stray parameter measuring and testing; can also be formed from DC + through a plurality of fully-controlled power devices V1、V2、V3、V4When the current loop 101 to be tested reaches the DC-, the DC + and DC-ports can be connected to the two ends of the resonant circuit to carry out stray parameter measurement and test. Each current loop 101 to be tested is provided with a corresponding full-control power device passage and a follow current tube passage.
It should be noted again that the specific structure of the phase module of the object to be tested is not limited to the two forms shown in fig. 2 and 3, and the current loop 101 to be tested refers to all configurable current loops in the phase module of the object to be tested. Further, all the fully-controlled power devices corresponding to the two ports of the current loop 101 of the object to be tested are all in a conducting state (all the fully-controlled power devices in the fully-controlled power path corresponding to the current loop 101 to be tested are in a conducting state) through the device triggering module 80, so that the current loop 101 to be tested is started, and all the fully-controlled power devices not belonging to the current loop 101 of the object to be tested are in a disconnecting state, thereby forming a current path corresponding to the two ports of the current loop 101 of the object to be tested.
Referring again to fig. 1, the current collection module 60 is connected to the adjustable inductor module 20, and is configured to obtain a first resonant current of a resonant circuit (LC circuit) formed by the adjustable inductor module 20 and the adjustable capacitor module 10 when the current loop 101 to be tested is started. The data processing module 30 is connected to the current collecting module 60, and is used for extracting the periods of the positive half-wave current and the negative half-wave current from the first resonant current, obtaining the stray parameters corresponding to the first loop comprising the resonance circuit and the fully-controlled power device passage in the current loop 101 to be tested, through which the positive half-wave current flows, according to the standard capacitance value or the standard inductance value, and the stray parameters corresponding to the second loop which comprises the resonance circuit and the follow current tube passage in the current loop 101 to be tested and through which the negative half-wave current flows, the first stray parameters aiming at the full-control power device passage in the current loop 101 to be tested are obtained by the stray parameters of the first loop, and the second stray parameter of the follow current tube passage in the current loop 101 to be tested is obtained from the second loop stray parameter, and then obtaining the stray parameters of all current loops in the object to be tested so as to represent the stray parameters of the current loop to be tested. It should be noted that the first resonant current here refers to a resonant current generated by the resonant circuit after the current loop 101 to be tested is connected. In addition, in the practical application process of the converter or the converter module, the stray parameters are generated when all the fully-controlled power devices are in the on state, so if the stray parameters closer to those in the practical application process are obtained, it is necessary to ensure that all the fully-controlled power devices corresponding to the current loop 101 to be tested are in the on state in the measurement process, that is, the measurement and the measurement of the stray parameters are performed under the condition that the current loop 101 to be tested is started.
Fig. 6 is a schematic diagram illustrating the calculation of the spurious parameter by the data processing module 30 in the system for measuring the spurious parameter of the current loop of the high-power current conversion module according to the embodiment of the present application. As shown in fig. 6, the resonant circuit formed by the tunable inductance module 20 and the tunable capacitance module 10 forms a natural resonant current curve L when the current loop 101 to be tested is not connected, using the set standard inductance value and standard capacitance value. After the current loop 101 to be tested is connected to the installation method, the period and the amplitude of the resonant current formed by the resonant circuit are changed due to the influence of the stray parameters of the current loop 101 to be tested, such as the curve L + L in fig. 6ssAs shown. In this way, the positive current half-wave and the negative current half-wave of the resonant current can respectively act on the fully-controlled power device passage and the follow current pipe passage in the current loop 101 of the object to be tested.
Fig. 4 is a schematic structural diagram of a specific example of measuring the stray parameter of the current loop 101 to be tested in the measurement system for the stray parameter of the current loop of the high-power current conversion module according to the embodiment of the present application. As shown in fig. 4, when all the fully-controlled power devices corresponding to the current loop 101 to be tested are started, i.e. in a conducting state, when the positive half-wave of the resonant current acts on the current loop 101 to be tested, it is equivalent to let a forward current through the first loop in the current loop 101 to be tested. Wherein the first loop comprises at least: the adjustable inductor module 20, the fully-controlled power device path in the current loop 101 to be tested, and the adjustable capacitor module 10. The stray parameters include stray inductance or stray capacitance. The change of the period of the positive half wave of the resonant current after the current loop 101 to be tested is accessed, compared with the inherent resonant period, is caused by the fully-controlled power device of the full-power device passage in the first loop in the current loop 101 to be tested and the stray parameters of the connecting part in the device passage. Therefore, the cycle parameters of the positive current half wave in the first resonant current include spurious parameter information of the entire fully-controlled power device path (the fully-controlled power device and the connection component in the device path) in the current loop 101 to be tested. Thus, by measuring the period of the positive current half-wave in the first resonant currentThe phase parameter can be obtained as a stray parameter (stray inductance or stray capacitance) under the whole first loop, and further, a fully-controlled power device in the first loop in the current loop 101 to be tested and a stray parameter (stray inductance L) corresponding to a connecting part in a path of the fully-controlled power device are obtainedSS1Or stray capacitance CSS1) The first spur parameter. That is, the first loop stray parameter is changed to the corresponding first stray parameter according to the standard inductance value or the standard capacitance value of the resonant circuit.
In addition, referring to fig. 4, when all the fully-controlled power devices corresponding to the current loop 101 to be tested are started, that is, in a conducting state, when the negative half-wave of the resonant current acts on the current loop 101 to be tested, it is equivalent to passing a reverse current through the second loop in the current loop 101 to be tested. Wherein the second circuit comprises at least: an adjustable capacitance module 10, a follow current tube path in a current loop 101 to be tested and an adjustable inductance module 20. The change in the period of the negative half wave of the resonant current after the connection to the current loop 101 to be tested, compared to the natural resonant period, is caused by the stray parameters of the (flow tube) device of the flow tube path in the second loop in the current loop 101 to be tested and the connecting parts of the device path. Therefore, the cycle parameter of the negative current half wave in the first resonant current contains the stray parameter information of the entire freewheeling tube path (freewheeling tube device and connection part in the device path) in the current loop 101 to be tested. Thus, by measuring the periodic parameter of the negative current half-wave in the first resonant current, the stray parameter (stray inductance or stray capacitance) under the whole second loop can be obtained, and further, the stray parameter (stray inductance L) of the device in the follow current tube passage in the second loop in the current loop to be tested and the connecting part of the device passage can be obtainedSS2Or stray capacitance CSS2) And is the second spur parameter. That is, according to the standard inductance or capacitance of the resonant circuit, the second stray parameter is obtained from the second loop stray parameter.
Specifically, the first stray parameter includes a first stray inductance value. The data processing module 30 is configured to, when calculating the first stray inductance value, obtain the first stray inductance value from the current standard capacitance value according to a square difference between a positive half-wave period of the first resonant current and an inherent resonant period of the resonant circuit by using the following expression (1). Wherein, the expression (1) is as follows:
Figure BDA0001902256380000091
in equation (1), T represents the natural resonant period of the resonant circuit, C represents the currently set standard capacitance value of the tunable capacitor module 10, L represents the currently set standard inductance value of the tunable inductor module 20, and T representsS1Representing the positive half-wave period, L, of the first resonant currentSS1Representing a first stray inductance value.
Further, the stray parameter in the embodiment of the present invention further includes a stray capacitance value. That is, the first stray parameter further includes a first stray capacitance value. The data processing module 30 is configured to, when calculating the first stray capacitance value, obtain the first stray capacitance value from the current standard inductance value according to a square difference between a positive half-wave period of the first resonant current and an inherent resonant period of the resonant circuit by using the following expression (2). Wherein, the expression (2) is as follows:
Figure BDA0001902256380000101
in the formula (2), CSS1Representing a first stray capacitance value.
In addition, specifically, the second stray parameter includes a second stray inductance value. The data processing module 30 is configured to, when calculating the second stray inductance value, obtain the second stray inductance value from the current standard capacitance value according to a square difference between the negative half-wave period of the first resonant current and the inherent resonant period of the resonant circuit by using the following expression (3). Wherein, the expression (3) is as follows:
Figure BDA0001902256380000102
in formula (3), TS2Indicating that the first resonant current is negativeHalf wave period, LSS2Representing a second stray inductance value.
Further, the stray parameter in the embodiment of the present invention further includes a stray capacitance value. That is, the second stray parameter further includes a second stray capacitance value. The data processing module 30 is configured to, when calculating the second stray capacitance value, obtain the second stray capacitance value from the current standard inductance value according to a square difference between the negative half-wave period of the first resonant current and the inherent resonant period of the resonant circuit by using the following expression (4). Wherein, the expression (4) is as follows:
Figure BDA0001902256380000111
in formula (4), CSS2Representing a second stray capacitance value.
In summary, the embodiment of the invention adopts an incremental extraction manner, and uses the standard capacitance value or the standard inductance value as the reference standard of the original resonant circuit (not connected to the current loop 101 to be tested), and further regards the stray parameter in the current loop 101 to be tested as the increment of the reference standard. When the stray parameters are obtained, the stray parameters for the current loop 101 to be tested can be obtained only by obtaining the resonance periods corresponding to the whole first loop and the second loop corresponding to the resonance current of the resonance circuit after the current loop 101 to be tested is accessed. Therefore, the influence of parasitic parameters of capacitance and inductance in the original resonant circuit on the stray parameter measuring process is effectively reduced, the precision of the measuring result of the embodiment of the invention is improved, and the stray parameters with different precision grades can be accurately measured.
Example two
In the embodiment of the present invention, not only the first stray parameter and/or the second stray parameter representing the stray parameter information of the current loop 101 to be tested can be obtained in the above manner, but also the busbar with the longer connection line in the current loop 101 to be tested can be used as the busbar 102 to be tested to measure the stray parameter.
Fig. 5 is a schematic structural diagram of a specific example of measuring stray parameters of the busbar to be tested 102 in the measurement system for stray parameters of the current loop of the high-power current conversion module according to the embodiment of the present application. As shown in fig. 5, after the stray parameters of the current loop 101 of the object to be tested are measured through the testing process described in the first embodiment, two busbars (a first busbar to be tested 102 and a second busbar to be tested 102) having the same structure as the busbar to be tested 102 may be respectively connected between the current loop 101 of the object to be tested and the resonant circuit in the manner shown in fig. 5 on the basis of the first embodiment. Referring to fig. 5, ab and cd respectively represent busbars to be tested 102 having the same structure, the first busbar to be tested ab is connected to one connection point of the current loop to be tested 101 and the resonant circuit, and the second busbar to be tested cd is connected to the other connection point of the current loop to be tested 101 and the resonant circuit.
Specifically, the two ends of the current loop 101 to be tested are respectively connected with the measurement system through the first busbar to be tested 102 and the second busbar to be tested 102 which have the same structure in the above manner, and further stray parameters of the first busbar to be tested 102 (or the second busbar to be tested 102) are measured. Further, the current collection module 60 is further configured to collect a second resonant current of a resonant circuit formed by the adjustable inductor module 20 and the adjustable capacitor module 10 after the first busbar to be tested 102 and the second busbar to be tested 102 are connected and the current loop to be tested 101 is started. The data processing module 30 is further configured to extract a period of the positive half-wave current from the second resonant current, obtain, according to a standard capacitance value or a standard inductance value, a stray parameter corresponding to a third loop through which the positive half-wave current flows, the third loop including the first loop, the first to-be-tested busbar and the second to-be-tested busbar, and further obtain, according to the standard capacitance value or the standard capacitance value, a third stray parameter corresponding to the fully-controlled power device access, the first to-be-tested busbar and the second to-be-tested busbar from the third loop stray parameter, based on which, the stray parameter of the first to-be-tested busbar 102 or the first to-be-tested busbar 102 (that is, the to-be-tested busbar) is obtained by using a difference between the third. The first stray parameter is obtained by using the process shown in the first embodiment, and the first busbar to be tested 102 and the second busbar to be tested are not accessed102, when the spurious parameter is measured for the current loop 101 to be tested, the spurious parameter is obtained by obtaining the first resonance period by using the expression (1) and/or the expression (2). The second resonant current is a resonant current generated by the resonant circuit after the current loop 101 to be tested, the first busbar 102 to be tested and the second busbar 102 to be tested are accessed. Wherein the third loop comprises at least: the adjustable capacitance testing device comprises an adjustable inductance module 20, a first busbar to be tested 102(ab), a full-control power device access in a current loop to be tested 101, a second busbar to be tested 102(cd) and an adjustable capacitance module 10. Because the period of the positive half wave of the resonant current after the first busbar to be tested 102 and the second busbar to be tested 102 are connected is changed compared with the inherent resonant period, the change is caused by the stray parameters of the first busbar to be tested 102, the second busbar to be tested 102 in the current loop to be tested 101, the fully-controlled power device in the first loop and the connecting part in the device channel. Therefore, the cycle parameters of the positive current half wave in the second resonant current include the stray parameter information of the (whole) fully-controlled power device path in the current loop 101 to be tested, the first busbar to be tested 102 and the second busbar to be tested 102. Thus, by measuring the periodic parameter of the positive current half-wave in the resonant current, the stray parameter (stray inductance L) of the third loop under the whole third loop can be obtainedSS3Or stray capacitance CSS3) Obtaining the stray parameters (stray inductance L) of the first busbar to be tested 102 and the second busbar to be tested 102 in the third loop in the current loop 101 to be tested, the fully-controlled power device in the first loop and the connecting part in the device channelSS3Or stray capacitance CSS3) I.e. the third stray parameter. Furthermore, the first stray parameter is subtracted from the third stray parameter, so as to obtain the stray parameters (stray inductance L) only for the first busbar to be tested 102 and the second busbar to be tested 102SSMOr stray capacitance CSSM) Namely the sum of stray parameters of the first busbar to be tested and the second busbar to be tested. Finally, the first busbar to be tested 102 and the second busbar to be tested 102 have the same structure, so that stray parameters of the first busbar to be tested 102 or the second busbar to be tested 102 are obtained.
Specifically, first, the third stray parameter includes a third stray inductance value. The data processing module 30 is configured to, when calculating the third stray inductance value, obtain the third stray inductance value from the current standard capacitance value according to the square difference between the second resonant current positive half-wave period and the inherent resonant period of the resonant circuit by using the following expression (5) and expression (7), and further obtain the stray parameter for the busbar to be tested by using the first stray inductance value. Wherein, the expression (5) is as follows:
Figure BDA0001902256380000131
in formula (5), TS3Representing the positive half-wave period, L, of the second resonant currentSS3Representing a third stray inductance value.
Further, the stray parameter in the embodiment of the present invention further includes a stray capacitance value. That is, the third stray parameter further includes a third stray capacitance value. The data processing module 30 is configured to, when calculating the third stray capacitance value, obtain the third stray capacitance value from the current standard inductance value according to the square difference between the positive half-wave period of the second resonant current and the inherent resonant period of the resonant circuit by using the following expression (6), and further obtain the stray parameter for the to-be-tested busbar by using the first stray capacitance value. Wherein expression (6) is as follows:
Figure BDA0001902256380000132
in formula (6), CSS3Representing a third stray capacitance value.
Further, the stray parameters of the first busbar to be tested 102 and the second busbar to be tested 102 can be obtained through expression (7) and/or expression (8). Wherein, expressions (7) and (8) are as follows:
LSSM＝LSS3-LSS1(7)
CSSM＝CSS3-CSS1(8)
in the formulae (7) and (8), LSSMShowing the first busbar to be tested 102 and the second busbarStray inductance value, C, of two busbars 102 to be testedSSMThe stray capacitance values of the first busbar to be tested 102 and the second busbar to be tested 102 are shown.
EXAMPLE III
In addition, referring to fig. 1 again, the measuring system in the above embodiment of the present invention further includes: the device comprises a direct current power supply 40, a measurement control module 50, a current acquisition module 60, an information configuration and test result generation module 70 and a device trigger module 80.
Specifically, the dc power source 40 is connected to two ends of the adjustable capacitor module 10. Preferably, a positive power terminal of the dc power source 40 is connected to a first terminal of the tunable capacitor module 10, and a negative power terminal of the dc power source 40 is connected to a second terminal of the tunable capacitor module 10. The dc power supply 40 is used to charge the adjustable capacitor module 10 to provide the adjustable capacitor module 10 with a corresponding voltage source for forming the resonant circuit. Therefore, the direct current power supply 40 provides a low-voltage direct current driving power supply component for the resonant circuit in the measuring system, and the resonant circuit can play a resonance role by directly utilizing the low-voltage power supply 40 so as to measure the stray parameters of the current loop of the high-power converter or the converter module.
The measurement control module 50 is connected between the dc power supply 40 and the adjustable capacitor module 10. The measurement control module 50 is configured to receive and use the charging start signal or the charging stop signal to control the on-off state of the input end and the output end thereof, so as to control the dc power supply 40 to charge the adjustable capacitor module 10. Specifically, the measurement control module 50 is configured to receive and detect a charging start signal or a charging stop signal, and when it is detected that the charging start signal is valid, control the input end and the output end of the measurement control module 50 to be in a conducting state, so that the adjustable capacitor module 10 is charged by the dc power supply 40, and further, the adjustable capacitor module 10 is in a charging state. Further, when the measurement control module 50 detects the charging stop signal, the input end and the output end of the measurement control module 50 are controlled to be in a disconnected state, so that the adjustable capacitor module 10 cannot be charged through the dc power supply 40, the dc power supply 40 is disconnected from the adjustable capacitor module 10, further, the adjustable capacitor module 10 is in a discharging state, and at this time, the resonant circuit formed by the resonant circuit and the adjustable inductor module 20 can complete the measurement process of the stray parameters of the current loop 101 to be tested.
The current collection module 60 is disposed between the adjustable inductance module 20 and the data processing module 30. The current collection module 60 is used for collecting the resonance current signal in real time and transmitting the signal to the data processing module 30. The current collecting module 60 may include a current sensor (not shown) or an oscilloscope (not shown) for collecting the resonant current at the adjustable inductor module 20, an AD conversion unit (not shown) for performing analog-to-digital conversion, and the like. In this way, the data processing module 30 is configured to obtain the digital quantity data of the resonant current signal in real time, further extract the positive and negative half-wave periods according to the obtained digital quantity data of the resonant current signal, and obtain the corresponding positive half-wave period (parameter) of the first resonant current, and the corresponding negative half-wave period (parameter) of the first resonant current, and/or the positive half-wave period (parameter) of the second resonant current.
Further, the above measuring system further includes a device triggering module 80. The device triggering module 80 is connected with the triggering ports of all the corresponding fully-controlled power devices in the current loop 101 to be tested. The device triggering module 80 is configured to provide a triggering signal to all fully-controlled power devices in a fully-controlled power device path corresponding to the current loop 101 to be tested after receiving and utilizing the pulse starting signal, so as to drive all fully-controlled power devices in the current loop 101 to be tested to be turned on, so that the current loop 101 to be tested generates a current, and the current loop 101 to be tested is started, thereby measuring a stray parameter. It should be noted that the device triggering module 80 includes a plurality of output ports, the output ports of the module 80 are correspondingly connected to the triggering ports (driving signal input ends) of each fully-controlled power device in the current loop 101 to be tested, and the required number of the output ports is consistent with the number of the fully-controlled power devices corresponding to the current loop 101 to be tested.
Finally, the information configuration and test result generation module 70 will be described. The information configuration and test result generation module 70 executes the following steps. Fig. 7 is a flowchart of the information configuration and test result generation module 70 in the system for measuring the stray parameter of the current loop of the high-power current transformer module according to the embodiment of the present application. As shown in fig. 7, first, in step S701, the information configuration and test result generating module 70 is configured to obtain the standard capacitance configuration information and the standard inductance configuration information, and forward the standard capacitance configuration information and the standard inductance configuration information to the tunable capacitance module 10 and the tunable inductance module 20, respectively, so as to configure the standard capacitance value and the standard inductance value required by the test for the tunable capacitance module 10 and the tunable inductance module 20, respectively. Then, in step S702, the information configuration and test result generating module 70 is configured to send a charging start signal to the measurement control module 50 to control the input end and the output end of the measurement control module 50 to be in a conducting state, so that the dc power supply 40 charges the adjustable capacitor module 10.
Then, in step S703, the information configuration and test result generation module 70 is configured to send a charging stop signal to the measurement control module 50 to end the charging after the charging is completed. The information configuration and test result generating module 70 is further configured to detect a terminal voltage of the adjustable capacitor module 10, and when the current terminal voltage reaches a rated voltage of the adjustable capacitor module 10, the charging is completed, and a charging stop signal is generated. When the current terminal voltage does not reach the rated voltage of the adjustable capacitor module 10, the charging is not completed, and a charging start signal is generated so as to charge the adjustable capacitor module 10 by using the direct-current power supply 40.
Next, in step S704, the information configuration and test result generating module 70 is configured to further send an effective pulse start signal to the device triggering module 80, so that the device triggering module 80 causes the current loop 101 to be tested to generate a current, thereby enabling the current loop 101 to be tested to be started and in a conducting state. Further, the current resonance current signal is acquired by the current acquisition module 60, and then the digital quantity data of the current resonance current signal is acquired by the data processing module 30 and the corresponding resonance period parameter is extracted.
Finally, in step S705, the information configuration and test result generation module 70 is configured to obtain a stray parameter measurement result for the current loop 101 to be tested, which includes a first resonant current positive half-wave period, a first stray parameter, a first resonant current negative half-wave period, and a second stray parameter, sent by the data processing module 30, after obtaining the stray parameter measurement result of the current loop 101 to be tested and/or the busbar to be tested 102 according to the stray parameter measurement result obtained by the data processing module 30, and further, display the stray parameter measurement result through a display device (not shown) connected to the information configuration and test result generation module 70. Or the information configuration and test result generating module 70 is configured to obtain the stray parameter measurement results for the current loop 101 of the object to be tested and the busbar to be tested 102, which are sent by the data processing module 30 and include the first positive half-wave period of the resonant current, the first stray parameter, the first negative half-wave period of the resonant current, the second stray parameter, and the stray parameter of the busbar to be tested, and further, display the stray parameter measurement results through a display device (not shown) connected to the information configuration and test result generating module 70.
Further, the adjustable inductance module 20, the adjustable capacitance module 10, the data processing module 30, the dc power supply 40, the measurement control module 50, the AD conversion unit (not shown) in the current collection module 60, the information configuration and test result generation module 70, and the device triggering module 80 may all be integrated in a circuit board.
Example four
On the other hand, the embodiment of the invention also provides a measuring method for stray parameters of a current loop of the high-power converter module, the method measures the stray parameters of the current loop to be tested 101 and/or the busbar to be tested 102 by using the measuring system, wherein each module, equipment and the like related to the method have the functions of corresponding equipment in the measuring system.
Fig. 8 is a step diagram of a method for measuring a stray parameter of a current loop of a high-power converter module according to an embodiment of the present application. As shown in fig. 8, first, in step S810, in the case that the current loop 101 to be tested is started, the current collection module 60 obtains a first resonant current of a resonant circuit formed by the adjustable inductance module 20 for providing the standard inductance value required for the set test and the adjustable capacitance module 10 for providing the standard capacitance value required for the set test. In step S810, the information configuration and test result generation module 70 is further required to execute the processes in steps S701 to S704 in the above manner to start the current loop 101 to be tested, that is, all the fully-controlled power devices corresponding to the current loop 101 to be tested are in a conducting state. Specifically, in step S701, the information configuration and test result generation module 70 obtains the standard capacitance configuration information and the standard inductance configuration information, and forwards the standard capacitance configuration information and the standard inductance configuration information to the adjustable capacitance module 10 and the adjustable inductance module 20, respectively, so as to configure the standard capacitance value and the standard inductance value required by the test. Then, in step S702, the information configuration and test result generation module 70 sends a charging start signal to the measurement and acquisition control module 50, so that the dc power supply 40 charges the adjustable capacitor module 10. Next, in step S703, after the charging is completed, the information configuration and test result generation module 70 sends a charging stop signal to the measurement control module 50 to end the charging. Finally, in step S704, the information configuration and test result generation module 70 sends a pulse start signal to the device triggering module 80, so that the current loop 101 to be tested generates a current to obtain a current resonant current.
Referring to fig. 8, in step S820, the data processing module 30 extracts periods of positive and negative half-wave currents from the first resonant current collected by the current collecting module 60, and obtains a stray parameter corresponding to a first loop through which the positive half-wave current flows and including a resonant circuit and a full-control power device path in the current loop 101 to be tested, and a stray parameter corresponding to a second loop through which the negative half-wave current flows and including a resonant circuit and a follow current tube path in the current loop 101 to be tested, according to a standard capacitance value or a standard inductance value.
Further, in step S830, the data processing module 30 further obtains, according to the standard capacitance value or the standard inductance value, a first stray parameter for a path of a fully-controlled power device in the current to-be-tested current loop 101 through the expression (1) and the expression (2) from the first loop stray parameter, and obtains, through the expression (3) and the expression (4), a second stray parameter for a path of a follow current tube in the current to-be-tested current loop 101 from the second loop stray parameter, so as to represent the stray parameter of the current to-be-tested current loop 101. Specifically, a first stray inductance value is obtained from the standard capacitance value according to the square difference of the positive half-wave period of the first resonant current and the natural resonant period of the resonant circuit by the above expression (1), wherein the first stray parameter includes the first stray inductance value. And (3) obtaining a first stray capacitance value from a standard inductance value according to the square difference of the positive half-wave period of the first resonant current and the inherent resonant period of the resonant circuit through the expression (2), wherein the first stray parameter further comprises the first stray capacitance value. And (3) obtaining a second stray inductance value from the standard capacitance value according to the square difference of the negative half-wave period of the first resonant current and the inherent resonant period of the resonant circuit through the expression (3), wherein the second stray parameter comprises the second stray inductance value. And (3) obtaining a second stray capacitance value by a standard inductance value according to the square difference of the negative half-wave period of the first resonant current and the inherent resonant period of the resonant circuit through the expression (4), wherein the second stray parameter further comprises the second stray capacitance value.
In addition, in step S830, the information configuration and test result generation module 70 needs to execute the process of step S705 in the above manner, so that the current loop 101 to be tested obtains the stray parameter test result. Specifically, in step S705, after the information configuration and test result generating module 70 obtains the stray parameter measurement result of the current loop 101 to be tested, which is sent by the data processing module 30 and includes the first resonant current positive half-wave period, the first stray parameter, the first resonant current negative half-wave period, and the second stray parameter, according to the stray parameter measurement result of the current loop 101 to be tested, obtained by the data processing module 30, the stray parameter measurement result is further displayed through a display device (not shown) connected to the information configuration and test result generating module 70.
EXAMPLE five
In addition, after the stray parameters of the current loop 101 to be tested are obtained through steps S810 to S830 in the fourth embodiment, the first busbar to be tested and the second busbar to be tested, which have the same structure as the busbar to be tested, may also be accessed according to the installation method described in the second embodiment to measure the stray parameters of the busbar to be tested. Then, in step S810, the current collection module 60 is used to collect the second resonant current of the resonant circuit after the first busbar to be tested and the second busbar to be tested are connected and the current loop 101 of the object to be tested is started. The data processing module 30 extracts the period of the positive half-wave current from the second resonant current through step S820, and obtains the stray parameters of the third loop through which the positive half-wave current flows, including the first loop, the first busbar to be tested, and the second busbar to be tested, according to the standard capacitance value or the standard inductance value. The data processing module 30 further obtains, according to the standard inductance value or the standard capacitance value through step S830, a third stray parameter for the fully-controlled power device access, the first to-be-tested busbar and the second to-be-tested busbar by using the expression (5) and the expression (6) and using the third loop stray parameter, and based on this, obtains the stray parameters of the first to-be-tested busbar and the second to-be-tested busbar according to the difference between the third stray parameter and the first stray parameter by using the expression (7) and the expression (8), thereby obtaining the stray parameters of the to-be-tested busbar.
Further, the information configuration and test result generating module 70 obtains the stray parameter measurement results for the current loop 101 of the object to be tested and the busbar to be tested 102, which are sent by the data processing module 30 and include the first resonance period, the first stray parameter, the second resonance period, the second stray parameter and the stray parameter of the busbar to be tested, so that the stray parameter measurement results are displayed through a display device (not shown) connected to the information configuration and test result generating module 70.
The embodiment of the invention provides a system and a method for measuring stray parameters of a current loop of a high-power converter or a current conversion module. The system and the method select reasonable standard inductance values and standard capacitance values, adopt an incremental extraction mode, regard stray parameters of a current loop to be tested or a busbar to be tested as the increment of the standard inductance values or the standard capacitance values of a reference standard, and can finish more accurate measurement of the stray parameters under the condition that the precision of the adjustable inductor and the adjustable capacitor is not high. The method adopting the difference calculation is suitable for the test condition environment with low requirements on the precision of the inductor and the capacitor and the parasitic inductance of the capacitor. The system and the method realize the test in a low-voltage environment, can be realized by one integrated circuit board, have flexible and various modes for constructing the measuring and taking system, and can realize the parameter extraction at the end of a high-power converter or a converter module. In addition, the invention realizes an integrated operation mode through the information configuration and test result generation module, improves the working efficiency of the parameter test extraction system, can adjust the standard inductance value and the standard capacitance value, and can adjust according to the difference of current loops of objects to be tested, so that the measurement calculation reaches higher precision. In addition, the period or frequency and the stray parameter can be directly displayed.
Although the embodiments of the present invention have been described above, the above description is only for the convenience of understanding the present invention, and is not intended to limit the present invention. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (10)

1. A system for measuring stray parameters of a current loop of a high-power current conversion module is characterized by comprising:
the first end of the adjustable inductance module is connected with the first end of the current loop to be tested and used for providing a set standard inductance value required by the test;
the first end of the adjustable capacitance module is connected with the second end of the adjustable inductance module, and the second end of the adjustable capacitance module is connected with the second end of the current loop to be tested and used for providing a set standard capacitance value required by the test;
the current acquisition module is connected with the adjustable inductance module and is used for acquiring a first resonant current of a resonant circuit formed by the adjustable inductance module and the adjustable capacitance module under the condition that the current loop to be tested is started;
and the data processing module is connected with the current acquisition module and is used for respectively extracting periods of positive half-wave current and negative half-wave current from the first resonant current, obtaining stray parameters corresponding to a first loop which comprises the resonant circuit and a full-control power device access in the current loop to be tested and through which the positive half-wave current flows, and stray parameters corresponding to a second loop which comprises the resonant circuit and a follow current tube access in the current loop to be tested and through which the negative half-wave current flows, further obtaining first stray parameters aiming at the full-control power device access through the first loop stray parameters, and obtaining second stray parameters aiming at the follow current tube access through the second loop stray parameters so as to represent the stray parameters of the current loop to be tested.
2. An extraction system according to claim 1, wherein the first/second spur parameters include: a first/second stray inductance value, wherein,
the data processing module is used for obtaining the first/second stray inductance value from the standard capacitance value according to the square difference of the positive/negative half-wave period of the first resonant current and the inherent resonant period of the resonant circuit.
3. An extraction system according to claim 1 or 2, wherein the first/second spur parameters further comprise: a first/second stray capacitance value, wherein,
the data processing module is further configured to derive the first/second stray capacitance values from the standard inductance value according to a squared difference of a first resonant current positive/negative half-wave period and an intrinsic resonant period of the resonant circuit.
4. The measurement system according to any one of claims 1 to 3, wherein the stray parameters of the first and second busbars to be tested are further measured when the first and second busbars to be tested are connected to the measurement system through a first busbar to be tested and a second busbar to be tested having the same structure at two ends of the current loop to be tested, respectively,
the current acquisition module is further used for acquiring a second resonant current of the resonant circuit under the condition that the first busbar to be tested and the second busbar to be tested are accessed;
the data processing module is further configured to extract a period of a positive half-wave current from the second resonant current, obtain, according to the standard inductance value or the standard capacitance value, a stray parameter corresponding to a third loop through which the positive half-wave current flows, the third loop including the first loop, the first busbar to be tested, and the second busbar to be tested, further obtain, from the third loop stray parameter, a third stray parameter for the fully-controlled power device access, the first busbar to be tested, and the second busbar to be tested, and obtain, based on this, the stray parameter of the first/second busbar to be tested by using a difference between the third stray parameter and the first stray parameter.
5. An assay system according to any one of claims 1-4, further comprising: a direct current power supply, wherein,
and the direct current power supply is connected to two ends of the adjustable capacitor module and is used for charging the adjustable capacitor module so as to provide a corresponding voltage source for forming the resonance circuit for the adjustable capacitor module.
6. The gauging system according to claim 5, further comprising: a control module is measured, wherein,
and the measurement control module is connected between the adjustable capacitor module and the direct current power supply and used for receiving and utilizing a charging starting signal or a charging stopping signal to control the on-off of the input end and the output end of the measurement control module so as to charge the adjustable capacitor module through the direct current power supply.
7. The gauging system according to claim 6, further comprising: a device triggering module, wherein,
the device triggering module is connected with a triggering port of a full-control power device in the current loop to be tested and is used for providing triggering signals for all the full-control power devices in the current loop to be tested after receiving and utilizing pulse starting signals so as to drive all the full-control power devices in the current loop to be tested to be conducted, so that the current loop to be tested generates current, and corresponding stray parameters are measured.
8. The gauging system according to claim 7, further comprising: the information configuration and test result generation module executes the following steps:
acquiring standard capacitance configuration information and standard inductance configuration information, and respectively forwarding the standard capacitance configuration information and the standard inductance configuration information to the adjustable capacitance module and the adjustable inductance module so as to configure the standard capacitance value and the standard inductance value required by testing;
sending the charging starting signal to the measurement control module to enable the direct-current power supply to charge the adjustable capacitor module;
after charging is finished, sending the charging stop signal to the measurement control module to finish charging;
sending the pulse starting signal to the device triggering module to enable the current loop to be tested to generate current;
and acquiring the first stray parameter and the second stray parameter which are sent by the data processing module.
9. A method for measuring stray parameters of a current loop of a high-power current converting module, wherein the method uses the measuring system as claimed in any one of claims 1 to 8 to measure the stray parameters in the current loop to be tested, and the method comprises the following steps:
the method comprises the following steps that firstly, under the condition that a current loop to be tested is started, a current acquisition module acquires a first resonant current of a resonant circuit formed by an adjustable inductance module used for providing a set standard inductance value required by the test and an adjustable capacitance module used for providing a set standard capacitance value required by the test;
secondly, the data processing module extracts periods of positive half-wave current and negative half-wave current from the first resonant current respectively, and obtains stray parameters corresponding to a first loop through which the positive half-wave current flows and a fully-controlled power device in the resonant circuit and the current loop to be tested, and stray parameters corresponding to a second loop through which the negative half-wave current flows and a follow current tube in the current loop to be tested according to the standard inductance value or the standard capacitance value;
and step three, the data processing module further obtains a first stray parameter aiming at the full-control power device passage from the first loop stray parameter, and obtains a second stray parameter aiming at the follow current pipe passage from the second loop stray parameter, so as to represent the stray parameter of the current loop to be tested.
10. The measuring method according to claim 9, wherein the third step comprises:
the data processing module obtains a first/second stray inductance value from the standard capacitance value according to a square difference between a positive/negative half-wave period of the first resonant current and an inherent resonant period of the resonant circuit, wherein the first/second stray parameters include: first and second stray inductance values.
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