CN111281338A - Slit-lamp microscope tester - Google Patents
Slit-lamp microscope tester Download PDFInfo
- Publication number
- CN111281338A CN111281338A CN201811498997.2A CN201811498997A CN111281338A CN 111281338 A CN111281338 A CN 111281338A CN 201811498997 A CN201811498997 A CN 201811498997A CN 111281338 A CN111281338 A CN 111281338A
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- microscope
- slit
- lamp
- support
- detection
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- 238000001514 detection method Methods 0.000 claims abstract description 43
- 238000007689 inspection Methods 0.000 claims abstract description 24
- 235000017166 Bambusa arundinacea Nutrition 0.000 claims description 16
- 235000017491 Bambusa tulda Nutrition 0.000 claims description 16
- 241001330002 Bambuseae Species 0.000 claims description 16
- 235000015334 Phyllostachys viridis Nutrition 0.000 claims description 16
- 239000011425 bamboo Substances 0.000 claims description 16
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000000386 microscopy Methods 0.000 claims 2
- 238000003466 welding Methods 0.000 claims 1
- 210000005252 bulbus oculi Anatomy 0.000 abstract description 19
- 210000001508 eye Anatomy 0.000 description 10
- 238000010586 diagram Methods 0.000 description 4
- 238000005286 illumination Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000000084 colloidal system Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000003760 hair shine Effects 0.000 description 2
- 230000003902 lesion Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/13—Ophthalmic microscopes
- A61B3/135—Slit-lamp microscopes
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/0075—Apparatus for testing the eyes; Instruments for examining the eyes provided with adjusting devices, e.g. operated by control lever
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- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Medical Informatics (AREA)
- Biophysics (AREA)
- Ophthalmology & Optometry (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Physics & Mathematics (AREA)
- Molecular Biology (AREA)
- Surgery (AREA)
- Animal Behavior & Ethology (AREA)
- General Health & Medical Sciences (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Eye Examination Apparatus (AREA)
- Microscoopes, Condenser (AREA)
Abstract
The invention discloses a slit lamp microscope inspection tester, which comprises a base, wherein an adjusting support is arranged on the base, a microscope bracket is arranged on the adjusting support, a microscope is arranged on the microscope bracket, and an adjusting crank is arranged on the adjusting support, so that the adjusting support is convenient to move; the invention provides a slit-lamp microscope inspection instrument, which is characterized in that a detection cylinder is creatively arranged, the detection cylinder is horn-shaped, the large opening of the detection cylinder faces the microscope, emission lenses are uniformly arranged in one side, close to the microscope, of the detection cylinder, the emission lenses are fixed on the inner wall of the detection cylinder through lens supports, and in addition, a slit lamp convenient for angle adjustment is ingeniously arranged, so that the emission lenses of the slit lamp and the detection cylinder can quickly irradiate human eyeballs and multi-angle slit light beams so as to be matched with the microscope for observation and detection, the detection efficiency is greatly improved, and the use is convenient.
Description
Technical Field
The invention relates to the technical field of ophthalmic examination equipment, in particular to a slit-lamp microscope examination instrument.
Background
A slit-lamp microscope is an essential important instrument for ophthalmologic examination. The slit-lamp microscope consists of an illumination system and a binocular microscope, can not only enable superficial lesions to be observed clearly, but also adjust the focus and the width of a light source to be made into an optical section, so that the lesions of deep tissues can be also displayed clearly; the working principle of the eye-protection lamp is that light illuminates eyes through a slit as the name suggests. The light source is a narrow slit light source, so the light source is called as a 'smooth knife'. The 'optical knife' is irradiated on the eyes to form an optical section, so that the health condition of each part of the eyes can be observed. The principle is that the 'Tyndall phenomenon' of the Kindall in British physics is utilized; the Tyndall phenomenon is that when a beam of light penetrates through the colloid, a bright 'path' in the colloid can be observed from the vertical direction of the incident light, and the phenomenon is called the Tyndall phenomenon and also called the Tyndall effect; the phenomena seen in daily life include light columns of a flashlight at night, sunlight irradiating into a room through a window or a door seam, sunlight in a forest and the like; in order to effectively observe the health condition of eyes, the slit lamp must be installed in a room with relatively dark light, the slit light source illuminates the eyes, and then an examining doctor observes the health condition of each part of the eyes through a microscope.
However, in the conventional slit-lamp microscope inspection tester, a slit-lamp light source is emitted through a slit lamp and is reflected and irradiated on the eyeball of a human body through a reflector, wherein the reflector is independently arranged outside, and the eyeball is irradiated at multiple angles by adjusting the irradiation angle of the reflector and the slit lamp, so that in the adjustment process, the slit-lamp microscope inspection tester is quite inconvenient, and two parts of the reflector and the slit lamp need to be adjusted simultaneously, thereby resulting in low detection efficiency.
Disclosure of Invention
The invention aims to provide a slit-lamp microscope inspection tester to solve the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme:
a slit-lamp microscope inspection tester comprises a base, wherein an adjusting support is arranged on the base, a microscope support is arranged on the adjusting support, a microscope is mounted on the microscope support, and an adjusting crank is arranged on the adjusting support, so that the adjusting support is convenient to move; the microscope position can be conveniently and actually detected and adjusted, a fixing bracket is arranged on the base corresponding to the rear side of the microscope and welded on the base, an inspection cylinder is arranged on the fixing bracket, the inspection cylinder is horn-shaped, the large opening of the inspection cylinder faces the microscope, transmitting lenses are uniformly arranged in one side, close to the microscope, of the inspection cylinder, the transmitting lenses are fixed on the inner wall of the inspection cylinder through lens supports, a top frame is arranged at the top of the fixing bracket and extends to the position above the position between the microscope and the inspection cylinder, and an upper slit lamp capable of adjusting the angle is arranged on the top frame; when the device works, the human eyeball is abutted to the outer end of the detection cylinder, the irradiation angle of the slit lamp is adjusted, the slit lamp irradiates the transmission lens in the detection cylinder, the transmission lens enters the human eyeball at the outer end of the detection cylinder, if the human eyeball is observed and detected through the microscope, the transmission lens is uniformly arranged in the detection cylinder, so that the slit lamp and the transmission lens can be conveniently adjusted to quickly irradiate the human eyeball, the multi-angle slit light beam irradiates to be conveniently observed and detected by matching with the microscope, the microscope is an electronic microscope and is connected with a preset computer through a wire and a junction box, and the detection of the human eyeball is conveniently recorded and analyzed.
Preferably, the upper slit lamp is fixedly connected with the top frame through a threaded shaft, the outer end of the threaded shaft is connected with an adjusting knob, and the adjusting knob is conveniently rotated through threaded connection of the threaded shaft and the top frame so as to adjust the irradiation angle of the upper slit lamp.
Preferably, the bottom of the fixing bracket is provided with a bottom frame, the bottom frame and the top frame are symmetrically arranged, the bottom frame is provided with a lower slit lamp, the lower slit lamp is in threaded connection with the bottom frame through a threaded shaft, the outer end of the threaded shaft is also provided with an adjusting knob, and the adjusting knob is rotated to adjust the irradiation angle of the lower slit lamp.
Preferably, the mounting bracket middle part is connected with the balladeur train, both ends respectively with mounting bracket's both sides support body sliding connection about the balladeur train, evenly are equipped with the bolt hole on mounting bracket's the both sides support body, and the balladeur train passes through the bolt to be fixed on mounting bracket's bolt hole, and convenient height-adjusting adapts to the ophthalmic detection requirement of co-altitude not.
Preferably, the emission lens transversely is provided with two sets, and each set of emission lens is provided with 6 to along the central symmetry setting of the axle center of detecting a section of thick bamboo.
Preferably, detect a section of thick bamboo outer end and be equipped with the supporting pad, the supporting pad is the elasticity cushion, when improving the patient and detect, eye comfort level.
Compared with the prior art, the invention has the following technical effects:
the invention provides a slit lamp microscope inspection instrument, which is ingenious in structural arrangement and reasonable in arrangement, a detection cylinder is creatively arranged, the detection cylinder is horn-shaped, the large opening of the detection cylinder faces a microscope, emission lenses are uniformly arranged in one side, close to the microscope, of the detection cylinder and are fixed on the inner wall of the detection cylinder through lens supports, slit lamps convenient for angle adjustment are ingeniously arranged, the slit lamps and the emission lenses of the detection cylinder can quickly irradiate human eyeballs, multi-angle slit light beams are irradiated so as to be matched with the microscope for observation and detection, the detection efficiency is greatly improved, the use is convenient, two groups of emission lenses are further transversely arranged, 6 emission lenses are arranged in each group and are symmetrically arranged along the center of the axis of the detection cylinder, the requirement of ophthalmic multi-angle omnibearing detection is met, in addition, a supporting pad is arranged at the outer end of the detection cylinder, and the, when the eye comfort level of a patient is improved, the microscope is an electron microscope and is connected with a preset computer through a wire and a junction box, and the eye detection of the human eyeball is conveniently recorded and analyzed.
Drawings
Fig. 1 is a schematic structural diagram of a slit-lamp microscope inspection apparatus.
Fig. 2 is a schematic diagram of a slit-lamp microscope inspection apparatus.
Fig. 3 is a schematic diagram of a slit-lamp microscope inspection apparatus.
Fig. 4 is a schematic diagram of a slit-lamp microscope inspection apparatus.
In the figure: 1. a base; 2. adjusting the support; 3. adjusting a crank; 4. a microscope stand; 5. a microscope; 6. a junction box; 7. a wire; 8. adjusting a knob; 9. a threaded shaft; 10. an upper slit lamp; 11. a top frame; 12. a fixing bracket; 13. an inspection cylinder; 14. a chassis; 15. a lower slit lamp; 16. a transmitting lens; 17. a lens holder; 18. a support pad; 19. a pin hole; 20. a bolt; 21. a carriage.
Detailed Description
The technical solution of the present patent will be described in further detail with reference to the following embodiments.
Referring to fig. 1-4, an inspection instrument for a slit-lamp microscope 5 comprises a base 1, wherein an adjusting support 2 is arranged on the base 1, a microscope 5 support 4 is arranged on the adjusting support 2, a microscope 5 is arranged on the microscope 5 support 4, and an adjusting crank is arranged on the adjusting support 2, so that the adjusting support 2 can be moved conveniently; the microscope 5 position is convenient to actually detect and adjust, a fixing bracket 12 is arranged on the base 1 corresponding to the rear side of the microscope 5, the fixing bracket 12 is welded on the base 1, a detection barrel 13 is arranged on the fixing bracket 12, the detection barrel 13 is horn-shaped, the large opening of the detection barrel faces the microscope 5, emission lenses 16 are uniformly arranged in one side, close to the microscope 5, of the detection barrel 13, the emission lenses 16 are fixed on the inner wall of the detection barrel 13 through lens supports, a top frame 11 is arranged at the top of the fixing bracket 12, the top frame 11 extends to the upper part between the microscope 5 and the detection barrel 13, and an upper slit lamp 10 capable of adjusting the angle is arranged on the top frame 11; the during operation, human eyeball butt is in detecting a section of thick bamboo 13 outer end, through adjusting the angle of illumination of slit lamp 10, make and go up slit lamp 10 and shine emission lens 16 in detecting a section of thick bamboo 13, and get into through emission lens 16 and detect on the human eyeball of a section of thick bamboo 13 outer end, if observe the detection to human eyeball through microscope 5, owing to evenly be equipped with emission lens 16 in detecting a section of thick bamboo 13, so conveniently adjust and go up slit lamp 10 and emission lens 16 and carry out fast to human eyeball, multi-angle slit beam shines, so that cooperate microscope 5 to observe the detection.
Furthermore, the microscope 5 is an electron microscope 5, and is connected with a preset computer through a wire and a junction box, so that the detection of human eyeballs can be conveniently recorded and analyzed.
Further, go up slit lamp 10 through threaded shaft 9 and roof-rack 11 fixed connection, threaded shaft 9 outer end is connected with adjust knob 8, through the threaded connection of threaded shaft 9 with roof-rack 11, conveniently rotates adjust knob 8 and then adjusts the angle of shining of going up slit lamp 10.
Further, a bottom frame 14 is arranged at the bottom of the fixing bracket 12, the bottom frame 14 and the top frame 11 are symmetrically arranged, a lower slit lamp 15 is arranged on the bottom frame 14, the lower slit lamp 15 is in threaded connection with the bottom frame 14 through a threaded shaft 9, an adjusting knob 8 is also arranged at the outer end of the threaded shaft 9, and the adjusting knob 8 is rotated to adjust the irradiation angle of the lower slit lamp 15.
Further, fixing bracket 12 middle part is connected with balladeur train 21, both ends respectively with fixing bracket 12's both sides support body sliding connection about balladeur train 21, evenly be equipped with bolt hole 19 on fixing bracket 12's the both sides support body, balladeur train 21 passes through bolt 20 to be fixed on fixing bracket 12's bolt hole 19, conveniently adjusts the height, adapts to the ophthalmic detection requirement of co-altitude not.
Further, the emission lens 16 is transversely provided with two groups, and each group of emission lens 16 is provided with 6 emission lenses, and the emission lenses are arranged along the axis center of the detection cylinder 13 in a symmetrical manner.
Further, it is equipped with supporting pad 18 to detect a section of thick bamboo 13 outer end, and supporting pad 18 is the elasticity cushion, when improving the patient and detecting, eye comfort level.
The working principle of the invention is as follows: the during operation, human eyeball butt is in detecting a section of thick bamboo 13 outer end, through adjusting the angle of illumination of slit lamp 10, make and go up slit lamp 10 and shine emission lens 16 in detecting a section of thick bamboo 13, and get into through emission lens 16 and detect on the human eyeball of a section of thick bamboo 13 outer end, if observe the detection to human eyeball through microscope 5, owing to evenly be equipped with emission lens 16 in detecting a section of thick bamboo 13, so conveniently adjust and go up slit lamp 10 and emission lens 16 and carry out fast to human eyeball, multi-angle slit beam shines, so that cooperate microscope 5 to observe the detection.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.
Although the preferred embodiments of the present patent have been described in detail, the present patent is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present patent within the knowledge of those skilled in the art.
Claims (7)
1. The utility model provides a slit-lamp microscope (5) inspection tester, includes base (1), be equipped with on base (1) and adjust support (2), be equipped with microscope (5) support (4) on adjusting support (2), install microscope (5) on microscope (5) support (4), be equipped with on adjusting support (2) and adjust the crank, be convenient for actual detection adjustment microscope (5) position, it is equipped with mounting bracket (12) to correspond microscope (5) rear side on base (1), mounting bracket (12) welding is on base (1), be equipped with on mounting bracket (12) and detect a section of thick bamboo (13), its characterized in that: detect a section of thick bamboo (13) and be the loudspeaker form, its macrostoma orientation microscope (5), it is close to evenly to be equipped with transmission lens (16) in microscope (5) one side to detect a section of thick bamboo (13), transmission lens (16) are fixed on detecting a section of thick bamboo (13) inner wall through the lens support, fixed bracket (12) top is equipped with roof-rack (11), and roof-rack (11) extend to microscope (5) and detect between section of thick bamboo (13) top, be equipped with angle regulation's last slit lamp (10) on roof-rack (11).
2. The slit-lamp microscope inspection apparatus of claim 1, wherein: the microscope (5) is an electron microscope and is connected with a preset computer through a lead and a junction box.
3. The slit-lamp microscope inspection apparatus of claim 1, wherein: go up slit lamp (10) and through threaded shaft (9) and roof-rack (11) fixed connection, threaded shaft (9) outer end is connected with adjust knob (8), through the threaded connection of threaded shaft (9) and roof-rack (11).
4. A slit-lamp microscopy instrument as claimed in claim 3, characterized in that: the bottom of the fixing bracket (12) is provided with a bottom frame (14), the bottom frame (14) and the top frame (11) are symmetrically arranged, a lower slit lamp (15) is arranged on the bottom frame (14), the lower slit lamp (15) is in threaded connection with the bottom frame (14) through a threaded shaft (9), and the outer end of the threaded shaft (9) is also provided with an adjusting knob (8).
5. The slit-lamp microscope inspection apparatus of claim 1, wherein: fixing bracket (12) middle part is connected with balladeur train (21), both ends respectively with the both sides support body sliding connection of fixing bracket (12) about balladeur train (21), evenly be equipped with bolt hole (19) on the both sides support body of fixing bracket (12), and balladeur train (21) are fixed on bolt hole (19) of fixing bracket (12) through bolt (20).
6. The slit-lamp microscope inspection apparatus of claim 1, wherein: the emission lenses (16) are transversely provided with two groups, and each group of emission lenses (16) is provided with 6 emission lenses and is arranged along the axis center of the detection cylinder (13) in a symmetrical mode.
7. A slit-lamp microscopy instrument as claimed in claim 1, 2, 3, 4, 5 or 6, characterized in that: the outer end of the detection cylinder (13) is provided with a supporting pad (18), and the supporting pad (18) is an elastic rubber pad.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811498997.2A CN111281338B (en) | 2018-12-08 | 2018-12-08 | Slit-lamp microscope tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811498997.2A CN111281338B (en) | 2018-12-08 | 2018-12-08 | Slit-lamp microscope tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111281338A true CN111281338A (en) | 2020-06-16 |
| CN111281338B CN111281338B (en) | 2022-08-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811498997.2A Active CN111281338B (en) | 2018-12-08 | 2018-12-08 | Slit-lamp microscope tester |
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| Country | Link |
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| CN (1) | CN111281338B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022096033A1 (en) * | 2020-11-06 | 2022-05-12 | 重庆康华瑞明科技股份有限公司 | Auxiliary lighting device for ophthalmic slit lamp |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4504129A (en) * | 1980-05-27 | 1985-03-12 | Richard Van Iderstine | Photography adaptor assembly for a slit lamp examination unit |
| US20030071968A1 (en) * | 2001-10-17 | 2003-04-17 | Carl Zeiss Ophthalmic Systems, Inc. | Method and apparatus for measuring a corneal profile of an eye |
| CN1430483A (en) * | 2000-05-19 | 2003-07-16 | 西澳大利亚公司狮眼研究所 | Portable slit lamp |
| CN102525410A (en) * | 2010-10-28 | 2012-07-04 | 欧科路光学器械有限公司 | Illumination system and method |
| CN102768403A (en) * | 2011-05-03 | 2012-11-07 | 上海美沃精密仪器有限公司 | Micro-display slit system and micro-display slit method |
| CN102894952B (en) * | 2012-11-09 | 2015-03-25 | 苏州四海通仪器有限公司 | Remote-control slit lamp microscope |
-
2018
- 2018-12-08 CN CN201811498997.2A patent/CN111281338B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4504129A (en) * | 1980-05-27 | 1985-03-12 | Richard Van Iderstine | Photography adaptor assembly for a slit lamp examination unit |
| CN1430483A (en) * | 2000-05-19 | 2003-07-16 | 西澳大利亚公司狮眼研究所 | Portable slit lamp |
| US20030071968A1 (en) * | 2001-10-17 | 2003-04-17 | Carl Zeiss Ophthalmic Systems, Inc. | Method and apparatus for measuring a corneal profile of an eye |
| CN102525410A (en) * | 2010-10-28 | 2012-07-04 | 欧科路光学器械有限公司 | Illumination system and method |
| CN102768403A (en) * | 2011-05-03 | 2012-11-07 | 上海美沃精密仪器有限公司 | Micro-display slit system and micro-display slit method |
| CN102894952B (en) * | 2012-11-09 | 2015-03-25 | 苏州四海通仪器有限公司 | Remote-control slit lamp microscope |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022096033A1 (en) * | 2020-11-06 | 2022-05-12 | 重庆康华瑞明科技股份有限公司 | Auxiliary lighting device for ophthalmic slit lamp |
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| Publication number | Publication date |
|---|---|
| CN111281338B (en) | 2022-08-26 |
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Effective date of registration: 20240109 Address after: Shop 2-201, No. 518 Tianhe Road, Tianhe District, Guangzhou City, Guangdong Province, 510645 (Location: Unit 2-001, 2-003, 2-005, 2-007, 2-009, 2-011, 2-015, 2-017, 2-019) Patentee after: Guangzhou Yinghua Eye Clinic Co.,Ltd. Address before: 510000 room 306, building 2, floor 3, Xiajiao commercial building, No. 35 (temporary), Xiajiao South Road, Luopu street, Panyu District, Guangzhou City, Guangdong Province Patentee before: Guangdong Yinghua Investment Holding Co.,Ltd. |
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