CN111273102A - Bus capacitor aging test method and device, computer equipment and storage medium - Google Patents
Bus capacitor aging test method and device, computer equipment and storage medium Download PDFInfo
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- CN111273102A CN111273102A CN202010123096.6A CN202010123096A CN111273102A CN 111273102 A CN111273102 A CN 111273102A CN 202010123096 A CN202010123096 A CN 202010123096A CN 111273102 A CN111273102 A CN 111273102A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
Abstract
The application discloses a bus capacitor aging test method, a device, computer equipment and a storage medium, and relates to the technical field of servo drive, wherein the bus capacitor aging test method comprises the following steps: the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process; for the voltage data acquired each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined each time. In the working process of the servo drive circuit, the aging test of the bus capacitor is periodically carried out, and the aging test of the bus capacitor is carried out in the actual working scene of the servo drive circuit, so that the test result of the aging test is more accurate.
Description
Technical Field
The present disclosure relates to the field of servo driving technologies, and in particular, to a method and an apparatus for testing aging of a bus capacitor, a computer device, and a storage medium.
Background
The servo drive circuit is a common drive system in the field of automatic production, and absorbs high pulse current at a bus end of the servo drive circuit through a bus capacitor so as to ensure the safety of the servo drive circuit. In the operation process of the servo drive circuit, because the load of the servo motor changes greatly, acceleration and deceleration are very frequent, and the impact on the bus capacitor is strong, the bus capacitor is easy to age, so that the bus capacitor needs to be subjected to aging test to obtain an aging result of the bus capacitor, and the aging fault of the bus capacitor is predicted according to the aging result of the bus capacitor.
In the prior art, a method for performing an aging test on a bus capacitor is as follows: the method comprises the steps of putting a bus capacitor into an aging test furnace for heating, detecting the quality and the resistance of the bus capacitor at fixed time intervals, determining the capacitance value of the bus capacitor according to the quality and the resistance of the bus capacitor, and determining the aging result of the bus capacitor according to the capacitance value of the bus capacitor.
However, the aging test method only uses the temperature as a factor to perform the aging test on the bus capacitor, and the obtained aging test result of the bus capacitor is not accurate.
Disclosure of Invention
Therefore, it is necessary to provide a bus capacitor aging test method, device, computer equipment and storage medium for solving the problem that the aging test result of the bus capacitor is inaccurate.
A bus capacitor aging test method is applied to a servo drive circuit, the servo drive circuit comprises a control circuit, a bus capacitor, a discharge circuit, a capacitor detection circuit and a power drive circuit, and the method comprises the following steps:
the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time;
for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data;
and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
In one embodiment of the present application, a heating device is disposed on the bus capacitor, and the method further includes:
and in the working process of the servo drive circuit, the control circuit controls the heating equipment to heat the bus capacitor.
In one embodiment of the present application, the method further comprises:
and for the capacitance value of the bus capacitor determined after the power driving circuit stops running each time, comparing the capacitance value of the bus capacitor with a pre-stored threshold value of the capacitance value, and stopping periodically controlling the power driving circuit to stop running by the control circuit when the capacitance value of the bus capacitor is smaller than the threshold value of the capacitance value.
In one embodiment of the present application, the discharge circuit includes a first discharge circuit and a second discharge circuit, and the control circuit controls the discharge circuit to discharge the bus capacitor, including:
the control circuit firstly controls the first discharging circuit to reduce the voltage of the bus capacitor to a first target voltage, and then controls the second discharging circuit to reduce the voltage of the bus capacitor from the first target voltage to a second target voltage.
In one embodiment of the present application, the controlling the capacitance detection circuit to acquire voltage data of the bus capacitor in the discharging process includes:
the control circuit controls the capacitance detection circuit to acquire voltage data of the bus capacitor in the process that the voltage of the bus capacitor is reduced from a first target voltage to a second target voltage.
In one embodiment of the present application, the controlling the capacitance detection circuit to acquire voltage data of the bus capacitor in the discharging process includes:
the control circuit controls the capacitance detection circuit to acquire a plurality of voltage data of the bus capacitor in the discharging process according to a preset sampling frequency;
correspondingly, for the voltage data collected after the power driving circuit stops operating each time, the capacitance value of the bus capacitor is determined according to the voltage data, and the method comprises the following steps:
and for a plurality of voltage data acquired after the power driving circuit stops operating each time, determining the capacitance value of the bus capacitor according to the plurality of voltage data.
In an embodiment of the present application, the servo driving circuit further includes a power resistor, and the power driving circuit is connected to the power resistor and controls the servo driving circuit to perform power consumption, including:
and controlling the power driving circuit to be conducted with the power resistor, and performing power consumption based on the power resistor.
The utility model provides a bus capacitance aging testing device, is applied to among the servo drive circuit, and servo drive circuit includes control circuit, bus capacitance, discharge circuit, electric capacity detection circuitry and power drive circuit, and the device includes:
the control module is used for controlling the servo drive circuit to consume power, periodically controlling the power drive circuit to stop running in the process of consuming power by the servo drive circuit, controlling the discharge circuit to discharge the bus capacitor after the power drive circuit stops running each time, and controlling the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process;
the capacitance value determining module is used for determining the capacitance value of the bus capacitor according to the voltage data acquired after the power driving circuit stops running each time;
and the aging determination module is used for determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
A computer device comprising a memory and a processor, the memory storing a computer program that when executed by the processor performs the steps of:
the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time;
for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data;
and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
A computer-readable storage medium, on which a computer program is stored which, when executed by a processor, carries out the steps of:
the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time;
for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data;
and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
The beneficial effects brought by the technical scheme provided by the embodiment of the application at least comprise:
the bus capacitor aging test method is applied to a servo drive circuit, wherein the servo drive circuit comprises a control circuit, a bus capacitor, a discharge circuit, a capacitor detection circuit and a power drive circuit, and the method comprises the following steps: the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time; for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time. In this embodiment, in the process of performing power consumption by the servo driving circuit, the aging test of the bus capacitor is periodically performed, and the aging test of the bus capacitor is performed in the actual working scene of the servo driving circuit, so that the test result of the aging test is more accurate.
Drawings
Fig. 1 is a schematic diagram of an implementation environment of a bus capacitor aging test method provided in an embodiment of the present application;
fig. 2 is a schematic diagram of another implementation environment of a bus capacitor aging test method according to an embodiment of the present disclosure;
fig. 3 is a flowchart of a method for testing aging of a bus capacitor according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram of an aging curve provided by an embodiment of the present application;
fig. 5 is a flowchart of another method for testing aging of a bus capacitor according to an embodiment of the present disclosure;
fig. 6 is a block diagram of a bus capacitor aging testing apparatus according to an embodiment of the present disclosure.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
The servo driver is also called a servo amplifier or a servo controller, and is a device for controlling a servo motor. Servo drives generally achieve high precision drive control through position control, speed control, and torque control. The servo driver is provided with a servo driving circuit for realizing the electric control function of the servo driver.
The existing servo drive circuit generally comprises a sorting filter circuit, a bus capacitor, a power drive circuit and a control circuit. The control circuit comprises a microprocessor, and the microprocessors of the current mainstream servo drivers all adopt digital signal processors. The digital signal processor is internally integrated with a motor control special integrated circuit, has higher operation speed and stronger floating point operation function, and can realize a complex control algorithm.
In the servo driving circuit, the control circuit is generally connected to the power supply, the rectifying and filtering circuit, the bus capacitor and the power driving circuit, respectively, wherein the rectifying and filtering circuit and the power driving circuit are connected by the bus, and the bus capacitor is bridged between the buses. The rectifying and filtering circuit is used for rectifying industrial alternating current provided by a power supply and then supplying power to the bus capacitor, the bus capacitor is used for stabilizing bus voltage and supplying power to the power driving circuit, and the power driving circuit is used for inverting direct current on the bus capacitor into alternating current to drive the servo motor to operate.
In the working process of the servo drive circuit, the load change of the servo motor is large, the acceleration and the deceleration are very frequent, and in addition, the surge current of starting at each time, the reverse voltage impact during emergency braking and the frequent power on and power off can cause impact on the bus capacitor and cause certain damage to the performance of the bus capacitor. When the power supply harmonic is large, the voltage ripple on the bus capacitor is large, the temperature of the bus capacitor rises, and the service life of the bus capacitor is shortened due to high temperature. In addition, in the use process of the bus capacitor, the electrolyte can be gradually volatilized, so that the capacitance value of the bus capacitor can be gradually reduced, and the health state of the servo driver tends to be deteriorated. In order to avoid sudden failure of the bus capacitor and damage to the servo driver, the bus capacitor needs to be subjected to an aging test so as to predict the service life of the bus capacitor, obtain the possible occurrence time of the failure in advance and provide a basis for maintenance work.
To predict the service life of the bus capacitor, the bus capacitor needs to be tested to obtain the aging process of the bus capacitor. In the prior art, a method for performing an aging test on a bus capacitor is as follows: the method comprises the steps of putting a bus capacitor into an aging test furnace for heating, detecting the quality and the resistance of the bus capacitor at fixed time intervals, determining the capacitance value of the bus capacitor according to the quality and the resistance of the bus capacitor, and determining the aging result of the bus capacitor according to the capacitance value of the bus capacitor. However, the aging test method only uses the temperature as a factor to perform the aging test on the bus capacitor, and the obtained aging test result of the bus capacitor is not accurate.
The bus capacitor aging test method is applied to a servo drive circuit, wherein the servo drive circuit comprises a control circuit, a bus capacitor, a discharge circuit, a capacitor detection circuit and a power drive circuit, and the method comprises the following steps: the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time; for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time. In this embodiment, in the process of performing power consumption by the servo driving circuit, the aging test of the bus capacitor is periodically performed, and the aging test of the bus capacitor is performed in the actual working scene of the servo driving circuit, so that the test result of the aging test is more accurate.
In the following, a brief description will be given of an implementation environment related to the bus capacitor aging test method provided in the embodiment of the present application.
Fig. 1 is a schematic diagram of an implementation environment provided in an embodiment of the present application, and as shown in fig. 1, the implementation environment may include a servo driving circuit, where the servo driving circuit includes a control portion and a power driving portion, where the control portion includes a control circuit 101, and the power driving portion includes a charging circuit 102, a bus capacitor C, a discharging circuit 103, a capacitor detection circuit 104, and a power driving circuit 105.
The power driving circuit 105 is connected with a power supply through a charging circuit 102 and a bus, and a bus capacitor C, a discharging circuit 103 and a capacitor detection circuit 104 are connected to the bus in a crossing manner. Meanwhile, the control circuit 101 is connected to the charging circuit 102, the discharging circuit 103, the capacitance detection circuit 104, and the power drive circuit 105 on the bus, respectively.
The arrows in fig. 1 indicate the transfer direction of the control signals and the voltage data.
When the servo drive circuit is powered on, the power supply is respectively connected with the control part and the power drive part and respectively supplies power to the control circuit 101 and the bus circuit, and when the bus is powered off, the control circuit 101 can still be powered on.
In this embodiment, the servo driving circuit is controlled to consume power, the control circuit 101 periodically controls the power driving circuit 105 to stop operating in the process of consuming power by the servo driving circuit, controls the discharging circuit 103 to discharge the bus capacitor C after the power driving circuit 105 stops operating each time, and controls the capacitor detecting circuit 104 to acquire voltage data of the bus capacitor C in the discharging process; for voltage data acquired after the power driving circuit 105 stops operating each time, the control circuit 101 determines the capacitance value of the bus capacitor C according to the voltage data; the control circuit 101 determines the aging test result of the bus capacitor C according to the capacitance value of the bus capacitor C determined after the power driving circuit 105 stops operating each time.
Optionally, the bus capacitor C may be an aluminum electrolytic capacitor, a metal film capacitor, or the like.
Optionally, the bus capacitor C is an independent capacitor, or a plurality of capacitors may be formed by connecting a plurality of capacitors in parallel. The equivalent capacitance obtained by connecting a plurality of capacitors in parallel can be used for carrying out online evaluation on the aging state of a bus capacitor C formed by the plurality of capacitors.
Optionally, the power driving part further comprises a heating device, and the heating device is mounted on the bus capacitor C. Wherein the heating device is connected to the control circuit 101. Optionally, a thermocouple is further installed on the bus capacitor C, and the thermocouple is used for measuring the temperature of the bus capacitor C.
Optionally, the servo driving circuit further includes a conductive switch and a charging circuit 102, the conductive switch is connected in parallel with the charging circuit 102, and a charging resistor is disposed on the charging circuit 102. Specifically, the charging circuit 102 may include a charging switch and a charging resistor connected in series with each other. Alternatively, the conductive switch may be a relay switch.
Optionally, the discharge circuit 103 in the servo drive circuit includes a first discharge circuit 103 and a second discharge circuit 103, where the first discharge circuit 103 and the second discharge circuit 103 are respectively connected in parallel with the bus capacitor C.
Optionally, the first discharging circuit 103 is composed of a relay and a first discharging resistor connected in series, where the relay is connected to the control circuit 101, and the first discharging resistor is connected to the bus capacitor C.
Optionally, the second discharge circuit 103 includes a switching transistor and a second discharge resistor connected in series, where the switching transistor and the second discharge resistor are respectively connected to the bus capacitor C; the switching transistor is further connected to the control circuit 101, and is configured to be turned on or off under the control of the control circuit 101.
Optionally, a collector of the switching triode is connected with one end of the second discharge resistor, an emitter of the switching triode is connected with the bus capacitor C, a base set of the switching triode is connected with the control circuit 101, and the other end of the second discharge resistor is connected with the bus capacitor C.
Optionally, the capacitance detection circuit 104 includes a first detection resistor, a second detection resistor, and an isolation amplifier, where the first detection resistor is connected in series with the second detection resistor, and the first detection resistor is connected in series with the second detection resistor and then bridged on the bus. The isolation amplifier is connected in parallel with the second detection resistor and is connected to the control circuit 101.
Optionally, the servo driving circuit further includes a power resistor 106, and the power driving circuit 105 is connected to the power resistor 106.
Fig. 2 is a schematic diagram of another implementation environment provided in the embodiment of the present application, and as shown in fig. 2, the implementation environment may include a servo driving circuit and an upper computer 107, where the servo driving circuit includes a control portion and a power driving portion. The control part of the servo drive circuit is connected with an upper computer 107.
Specifically, the servo driving circuit is controlled to consume power, the control circuit 101 periodically controls the power driving circuit 105 to stop operating in the process of consuming power by the servo driving circuit, and after the power driving circuit 105 stops operating each time, the control circuit 101 controls the discharging circuit 103 to discharge the bus capacitor C and controls the capacitor detecting circuit 104 to acquire voltage data of the bus capacitor C in the discharging process. The capacitance detection circuit 104 transmits the acquired voltage data to the control circuit 101, and the control circuit 101 transmits the acquired voltage data to the upper computer 107. For voltage data acquired after the power driving circuit 105 stops running each time, the upper computer 107 determines the capacitance value of the bus capacitor C according to the voltage data; and the upper computer 107 determines an aging test result of the bus capacitor C according to the capacitance value of the bus capacitor C determined after the power driving circuit 105 stops running each time.
Referring to fig. 3, a flowchart of a bus capacitor aging test method provided in an embodiment of the present application is shown, where the bus capacitor aging test method can be applied to a servo driving circuit in the implementation environment shown in fig. 1 and fig. 2, where the servo driving circuit includes a control circuit, a bus capacitor, a discharging circuit, a capacitor detection circuit, and a power driving circuit, and as shown in fig. 3, the bus capacitor aging test method can include the following steps:
In this embodiment, in the process of performing power consumption by the servo driving circuit, the bus capacitor is periodically subjected to an aging test, where the process of controlling the servo driving circuit to perform power consumption may be:
the servo drive circuit is initially powered on, and the control circuit is powered on and starts to work. The microprocessor in the control circuit (for convenience of description, it will be referred to as the control circuit) controls the charging circuit to charge the bus capacitor. When the bus capacitor is fully charged, the control circuit controls the power driving circuit to be conducted with the bus capacitor and drives the power resistor to consume power, and in the power consumption process, the control circuit can control the capacitor detection circuit to acquire the voltage of the bus capacitor in real time. The capacitance detection circuit can send the collected voltage of the bus capacitor to the control circuit, and the control circuit can determine whether the bus capacitor has overvoltage or undervoltage faults according to the received voltage of the bus capacitor.
The process of periodically performing the aging test on the bus capacitor may be: when the power driving circuit in the servo driving circuit drives the power resistor to consume power for a preset time, the bus capacitor is lost in the normal working process of the servo driving circuit. At this moment, the control circuit can control the power driving circuit to stop operating, and after the power driving circuit stops operating, carry out aging test to the bus capacitance, it is specific: the control circuit controls the discharge circuit to be conducted, the bus capacitor is discharged through the discharge circuit, meanwhile, the control circuit controls the capacitor acquisition circuit to acquire voltage data in the discharge process of the bus capacitor, and the capacitor detection circuit sends the acquired voltage data to the control circuit.
Optionally, the servo driving circuit may further include a power resistor, wherein the power driving circuit is connected to the power resistor, and in this embodiment, the process of controlling the servo driving circuit to perform power consumption may be:
the control circuit controls the power driving circuit to be conducted with the power resistor, and power consumption is conducted based on the power resistor.
Generally speaking, a power driving circuit is connected with a motor, the motor is driven through the power driving circuit, the motor operation is easily influenced by the motor load, the load is small, the aging test duration is long, and the driving motor is easy to break down when the load is large, so that the aging test is interrupted. In order to avoid the above problem, in this embodiment, the purpose of power consumption is achieved by using the power resistor, the power consumption of the power resistor is relatively stable, and the influence factors are relatively few, so that a relatively stable working environment can be provided for the bus capacitor, and the speed of the bus capacitor in the aging test can be increased.
In this embodiment, after the bus capacitor aging test is finished, the servo driving circuit continues to consume power. After the power consumption is preset for a long time, the bus capacitor is subjected to aging test again, and the purpose of periodically performing aging test on the bus capacitor in the working process of the servo drive circuit is achieved.
It should be noted that, after the power driving circuit stops operating each time, the voltage data acquired by the aging test can be obtained by performing the aging test on the bus capacitor.
And step 302, determining the capacitance value of the bus capacitor according to the voltage data acquired after the power driving circuit stops running each time.
In this embodiment, the control circuit may calculate the capacitance value of the bus capacitor according to the voltage data collected by the capacitance detection circuit, so as to determine the actual capacitance value of the bus capacitor after the servo driving circuit operates for a period of time.
Optionally, in this embodiment, during the discharging process of the bus capacitor, the capacitance detection circuit may acquire a plurality of voltage data of the bus capacitor during the discharging process according to a preset sampling frequency. Correspondingly, for a plurality of voltage data acquired after the power driving circuit stops operating each time, the control circuit can determine the capacitance value of the bus capacitor according to the plurality of voltage data.
Optionally, in this embodiment, the process of calculating the actual capacitance value of the bus capacitor by the control circuit may include the following steps:
establishing a voltage relation according to the voltage of the bus capacitor, wherein the voltage relation is as shown in a formula (1):
wherein u isc(t) voltage data of the bus capacitor at the t-th sampling time, R3The resistance value of the resistor in the discharge circuit is shown, and C shows the actual capacitance value of the bus capacitor. The product of the resistance value and the capacitance value represents the time constant of the discharge circuit, and the dimension is 'second'.
After transforming equation (1), equation (2) can be obtained:
wherein, UdcIs a first target voltage.
Combining equation (1) and equation (2) yields equation (3):
R3C(uc(i+1)-uc(i))+Ts·uc(i) 0, i 1,2, n-1 equation (3).
Wherein the content of the first and second substances,n represents the number of voltage data collected, uc(i +1) represents the (i +1) th voltage data collected, uc(i) Representing the i-th voltage data, T, acquiredsRepresenting the sampling period.
After transforming equation (3), equation (4) can be obtained:
after transforming equation (4), equation (5) can be obtained:
uc(i+1)＝a·uc(i) wherein, in the step (A),
in the process of collecting voltage data, there will generally be a measurement error, and in this embodiment, the measurement error of the ith voltage data can be represented by formula (6):
δi＝uc(i+1)-a·uc(i) equation (6).
The sum of the variances obtained from equation (6) can be given as shown in equation (7):
x2＝∑δi 21, 2., n-1 formula (7).
Substituting equation (6) into equation (7) yields equation (8):
x2＝∑(uc(i-1)-a·uc(i))2equation (8).
By taking the partial derivative of a in equation (8) and making it equal to zero, equation (9) can be obtained:
∑(uc(i+1)-a·uc(i))·uc(i) equation (9) is 0.
The expression of a can be obtained by transforming equation (9):
substituting the expression of a into equation (5) can find that the actual capacitance value of the bus capacitor can be expressed as:
and step 303, determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
In this embodiment, an aging curve of the bus capacitor may be established according to the obtained actual capacitance value of the bus capacitor and the time point corresponding to the actual capacitance value of the bus capacitor, and the aging curve may be as shown in fig. 4, where a horizontal axis represents time and a vertical axis represents the capacitance value of the bus capacitor.
In this embodiment, when a new capacitance value appears, the new capacitance value of the bus capacitor is supplemented to the aging curve in fig. 4. The aging process of the bus capacitor can be tracked through the aging test result of the bus capacitor, so that the service life of the bus capacitor can be predicted.
The bus capacitor aging test method provided by the application controls a servo drive circuit to consume power, the control circuit periodically controls the power drive circuit to stop running in the process of consuming power by the servo drive circuit, the control circuit controls a discharge circuit to discharge a bus capacitor after the power drive circuit stops running each time, and controls a capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process; for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time. In this embodiment, in the process of performing power consumption by the servo driving circuit, the aging test of the bus capacitor is periodically performed, and the aging test of the bus capacitor is performed in the actual working scene of the servo driving circuit, so that the test result of the aging test is more accurate.
In one embodiment of the present application, as shown in FIG. 2. And a heating device is arranged on the bus capacitor. In the working process of the servo driving circuit, the control circuit can control the heating equipment to heat the bus capacitor.
The bus capacitor is sensitive to temperature, electrolyte of the bus capacitor volatilizes fast at high temperature, and the aging speed of the bus capacitor is accelerated. Therefore, the aging speed of the bus capacitor can be improved by heating the bus capacitor, so that the total time of the aging test can be shortened.
In this embodiment, the bus capacitor is heated both in the normal operating state and in the bus capacitor aging test state of the servo driving circuit, and the temperature of the bus capacitor is kept at the preset temperature.
Optionally, in this embodiment, the heating device may be controlled by an upper computer.
Optionally, in this embodiment, a thermocouple is disposed on the bus capacitor, the thermocouple and the heating device are respectively connected to a constant temperature controller, and the constant temperature controller is connected to the control circuit.
The control circuit is used for sending a control signal to the thermostatic controller, and the thermostatic controller is electrified and starts to work after receiving the control signal. The constant temperature controller can obtain the temperature of the bus capacitor collected by the thermocouple, and controls the heating device to heat according to the temperature of the bus capacitor, so that the temperature of the bus capacitor is kept at the preset temperature.
Optionally, in this embodiment, the thermostatic controller is connected to the upper computer. The upper computer is used for sending a control signal to the constant temperature controller, and the constant temperature controller is electrified and starts to work after receiving the control signal sent by the upper computer.
In one embodiment of the present application, as shown in FIG. 5, another bus capacitance burn-in test method is shown, the method comprising the steps of:
In this embodiment, after the power driving circuit stops operating each time, reference may be made to the content disclosed in step 301 for collecting the voltage data during the discharging process of the bus capacitor, which is not described herein again.
And 502, determining the capacitance value of the bus capacitor according to the voltage data acquired after the power driving circuit stops running each time.
In this embodiment, reference may be made to the disclosure of step 302 for the process of determining the capacitance value of the bus capacitor.
The capacitance threshold is a critical capacitance value when the bus capacitor fails, and is used for judging whether the bus capacitor fails.
In this embodiment, for the capacitance value of the bus capacitor determined after the power driving circuit stops operating each time, the capacitance value of the bus capacitor is compared with a pre-stored threshold value of the capacitance value, and when the capacitance value of the bus capacitor determined after the power driving circuit stops operating this time is greater than the threshold value of the capacitance value, it is indicated that the bus capacitor is not failed. After the voltage data of the bus capacitor is acquired at this time, the control circuit needs to control the power driving circuit to consume power again, and continuously and periodically control the power driving circuit to stop operating so as to acquire the voltage data of the bus capacitor.
And when the actual capacitance value of the bus capacitor is less than or equal to the capacitance value threshold value, the bus capacitor is invalid. When the bus capacitor fails, the collection process of voltage data of the aging test of the bus capacitor is finished, and the control circuit stops periodically controlling the power driving circuit to stop running, namely the servo driving circuit does not work any more.
And step 504, determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
In this embodiment, after the bus capacitor fails, all capacitance values of the bus capacitor obtained in the process of performing the aging test on the bus capacitor and the time points corresponding to the capacitance values may be obtained.
In this embodiment, the aging curve of the bus capacitor can be obtained according to the capacitance values of the bus capacitor corresponding to different time points, and the aging process of the bus capacitor can be obtained according to the aging curve of the bus capacitor, so that the aging process of the bus capacitor can be tracked, and the service life of the bus capacitor can be predicted.
In this embodiment, whether the bus capacitor fails or not is judged, and when the bus capacitor fails, the servo drive circuit is stopped, so that uncontrollable influence on the servo drive circuit caused by sudden failure of the bus capacitor is avoided.
In one embodiment of the present application, as shown in fig. 1 and 2, the discharge circuit includes a first discharge circuit and a second discharge circuit, and the control circuit controls the discharge circuit to discharge the bus capacitor, including:
the control circuit firstly controls the first discharging circuit to reduce the voltage of the bus capacitor to a first target voltage, and then controls the second discharging circuit to reduce the voltage of the bus capacitor from the first target voltage to a second target voltage.
In this embodiment, the resistance of the resistor in the first discharge circuit is greater than the resistance of the resistor in the second discharge circuit, and the second discharge circuit uses a low-temperature drift resistor.
In this embodiment, the working process of the first discharge circuit may be:
in the process that the servo driving circuit controls the power driving circuit to consume power, the first discharging circuit is used for discharging the bus capacitor when the bus is in overvoltage, and therefore the voltage of the bus capacitor is reduced. When the bus voltage is normal, the control circuit controls the relay to be powered off, and the first discharging circuit is in a disconnected state.
And when the bus capacitor is subjected to aging test, the first discharge circuit is used for conducting under the control of the control circuit, so that the bus capacitor is subjected to first-stage discharge.
In this embodiment, the working process of the second discharge circuit may be:
in the process that the servo driving circuit controls the power driving circuit to consume power, the second discharging circuit is in a disconnected state under the control of the control circuit and does not have a discharging function.
When the bus capacitor is subjected to the aging test, the control circuit can control the switching triode to conduct the second discharging circuit after the first discharging circuit finishes the discharging in the first stage so as to discharge the bus capacitor in the second stage. During the discharging process of the second discharging circuit, the first discharging circuit can be in an off state.
In this embodiment, after the control circuit controls the power driving circuit to stop operating, the control circuit first controls the first discharging circuit to be turned on, the second discharging circuit to be turned off, and the bus capacitor is discharged through the first discharging circuit. Meanwhile, the control circuit can control the capacitance detection circuit to acquire the voltage value of the bus capacitor. When the voltage value of the bus capacitor is reduced to a first target voltage from the working voltage, the control circuit can control the first discharging circuit to be switched off, the second discharging circuit to be switched on, and the bus capacitor is discharged through the second discharging circuit. Meanwhile, the control circuit can control the capacitance detection circuit to acquire the voltage value of the bus capacitor. When the voltage value of the bus capacitor is reduced from the first target voltage to the second target voltage, the control circuit can control the second discharging circuit to be disconnected.
In this embodiment, the second target voltage is less than the first target voltage.
It should be noted that, in this embodiment, in the process that the voltage of the bus capacitor is dropping, the capacitor detection circuit acquires voltage data of the bus capacitor according to a preset sampling frequency.
In this embodiment, can realize the purpose that reduces bus capacitor's voltage fast through first discharge circuit, and the second discharge circuit adopts low temperature to float the resistance and discharges to bus capacitor, can improve the precision that capacitance detection circuit gathered voltage data, consequently both guaranteed bus capacitor's voltage detection's accuracy, reduced the tolerance value estimation error that the resistance value caused along with temperature variation to the utmost again, consequently, can improve bus capacitor's the degree of accuracy of actual capacitance value like this.
In one embodiment of the present application, the discharge circuit includes a first discharge circuit and a second discharge circuit, and the control capacitance detection circuit collects voltage data of the bus capacitance in a discharge process, including:
the control circuit controls the capacitance detection circuit to acquire voltage data of the bus capacitor in the process that the voltage of the bus capacitor is reduced from a first target voltage to a second target voltage.
The purpose of the first discharge circuit is to quickly drop the voltage of the bus capacitor from a higher voltage value to a lower voltage value. The purpose of the second discharge circuit is to enable the capacitance detection circuit to accurately acquire voltage data during the discharge process.
In this embodiment, in the discharging process of the first discharging circuit, the capacitance detecting circuit collects voltage data of the bus capacitor, and is configured to determine whether the voltage of the bus capacitor drops to a first target voltage. In the discharging process of the second discharging circuit, the capacitance detection circuit can acquire voltage data of the bus capacitor according to a preset sampling frequency, and sends the voltage data acquired in the process of reducing the voltage of the bus capacitor from the first target voltage to the second target voltage to the control circuit.
In this embodiment, through the voltage data of the in-process bus capacitor that gathers bus capacitor's voltage and drop to second target voltage from first target voltage, because bus capacitor discharges through second discharge circuit, and second discharge circuit adopts low temperature drift resistance, the voltage data of gathering like this is more accurate.
In an embodiment of the present application, as shown in fig. 1 and fig. 2, the servo driving circuit further includes a conductive switch and a charging circuit, the conductive switch is connected in parallel with the charging circuit, a resistor is disposed on the charging circuit, and the control circuit controls the charging circuit to charge the bus capacitor, including:
the control circuit controls the conductive switch to be switched off and controls the charging circuit to charge the bus capacitor, and when the bus capacitor is fully charged, the control circuit controls the charging circuit to be switched off and controls the conductive switch to be switched on.
Wherein the conductive switch may be a relay switch.
In this embodiment, the process of charging the bus capacitor by the charging circuit may be: the servo drive circuit is initially powered on, and the control circuit is powered on and starts to work. The control circuit controls the conductive switch to be switched off, the charging switch to be switched on and the charging circuit to be switched on. The bus capacitor starts to charge through the charging resistor. The control circuit can acquire the voltage value of the bus capacitor in real time through the capacitor detection circuit. When the voltage value of the bus capacitor reaches the working voltage or the voltage value of the bus capacitor is stable, the control circuit can control the charging switch of the charging circuit to be switched off and control the conductive switch connected with the charging circuit in parallel to be switched on, and then the control circuit can control the power driving circuit to be switched on with the bus capacitor and drive the power resistor to consume power.
When the bus capacitor is subjected to the aging test, the control circuit controls the power driving circuit to stop power consumption, and then controls the conductive switch to be switched off (at the moment, the charging switch in the charging circuit is already in the off state), so that the bus in the servo driving circuit is switched off.
It should be noted that, when the bus capacitor is disconnected from the charging circuit and the conductive switch, the control circuit may control the discharging circuit to discharge the bus capacitor.
In this embodiment, when the power supply directly charges the bus capacitor, the bus capacitor is easily broken down by the increased current, and therefore, when the bus capacitor is charged, the bus capacitor needs to be charged through the charging resistor. And when the bus capacitor is fully charged, the conductive switch is conducted to form a lead in order to reduce unnecessary electric energy loss. When the bus capacitor is subjected to aging test, the conductive switch and the charging circuit are controlled to be disconnected in order to break the connection between the bus and the power supply.
Referring to fig. 6, a block diagram of a bus capacitor aging test apparatus provided in an embodiment of the present application is shown, where the bus capacitor aging test apparatus is applied to a servo drive circuit, the servo drive circuit includes a control circuit, a charging circuit, a bus capacitor, a discharging circuit, a capacitor detection circuit, and a power drive circuit, and the bus capacitor aging test apparatus includes a control module 601, a capacitor value determination module 602, and an aging determination module 603.
The control module 601 is used for controlling the servo drive circuit to consume power, periodically controlling the power drive circuit to stop running in the process of consuming power by the servo drive circuit, controlling the discharge circuit to discharge the bus capacitor after the power drive circuit stops running each time, and controlling the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process;
the capacitance value determining module 602 is configured to determine, according to voltage data acquired after the power driving circuit stops operating each time, a capacitance value of a bus capacitor;
and the aging determination module 603 is configured to determine an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops operating each time.
In an embodiment of the present application, a heating device is disposed on the bus capacitor, and the control module 601 is further configured to control the heating device to heat the bus capacitor during the operation of the servo driving circuit.
In an embodiment of the present application, the capacitance value determining module 602 is further configured to, for the capacitance value of the bus capacitor determined after the power driving circuit stops operating each time, compare the capacitance value of the bus capacitor with a pre-stored capacitance value threshold, and when the capacitance value of the bus capacitor is smaller than the capacitance value threshold, the control circuit stops periodically controlling the power driving circuit to stop operating.
In an embodiment of the present application, the discharge circuit includes a first discharge circuit and a second discharge circuit, and the control module 601 is further configured to control the first discharge circuit to decrease the voltage of the bus capacitor to a first target voltage, and then control the second discharge circuit to decrease the voltage of the bus capacitor from the first target voltage to a second target voltage.
In an embodiment of the present application, the control module 601 is further configured to control the capacitance detection circuit to acquire voltage data of the bus capacitor in a process that the voltage of the bus capacitor decreases from a first target voltage to a second target voltage.
In an embodiment of the present application, the control module 601 is further configured to control the capacitance detection circuit to acquire a plurality of voltage data of the bus capacitor in a discharging process according to a preset sampling frequency;
and for a plurality of voltage data acquired after the power driving circuit stops operating each time, determining the capacitance value of the bus capacitor according to the plurality of voltage data.
In an embodiment of the present application, the servo driving circuit further includes a power resistor, the power driving circuit is connected to the power resistor, and the control module 601 is further configured to control the power driving circuit to be conducted with the power resistor, so as to perform power consumption based on the power resistor.
For the specific definition of the bus capacitor aging test device, reference may be made to the above definition of the bus capacitor aging test method, which is not described herein again. All or part of each module in the bus capacitor aging test device can be realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment of the present application, there is provided a computer device comprising a memory and a processor, the memory storing a computer program, the processor implementing the following steps when executing the computer program:
the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time; for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
In an embodiment of the present application, the bus capacitor is provided with a heating device, and the processor executes the computer program to further implement the following steps: and in the working process of the servo drive circuit, the heating equipment is controlled to heat the bus capacitor.
In one embodiment of the application, the processor when executing the computer program further performs the steps of: and for the capacitance value of the bus capacitor determined after the power driving circuit stops running each time, comparing the capacitance value of the bus capacitor with a pre-stored threshold value of the capacitance value, and stopping periodically controlling the power driving circuit to stop running by the control circuit when the capacitance value of the bus capacitor is smaller than the threshold value of the capacitance value.
In one embodiment of the application, the discharge circuit comprises a first discharge circuit and a second discharge circuit, and the processor when executing the computer program further implements the following steps: the first discharging circuit is controlled to reduce the voltage of the bus capacitor to a first target voltage, and then the second discharging circuit is controlled to reduce the voltage of the bus capacitor from the first target voltage to a second target voltage.
In one embodiment of the application, the processor when executing the computer program further performs the steps of: the control circuit controls the capacitance detection circuit to acquire voltage data of the bus capacitor in the process that the voltage of the bus capacitor is reduced from a first target voltage to a second target voltage.
In one embodiment of the application, the processor when executing the computer program further performs the steps of: the control circuit controls the capacitance detection circuit to acquire a plurality of voltage data of the bus capacitor in the discharging process according to a preset sampling frequency; and for a plurality of voltage data acquired after the power driving circuit stops operating each time, determining the capacitance value of the bus capacitor according to the plurality of voltage data.
In an embodiment of the present application, the servo driving circuit further includes a power resistor, the power driving circuit is connected to the power resistor, and the processor executes the computer program to further implement the following steps: and controlling the power driving circuit to be conducted with the power resistor, and performing power consumption based on the power resistor.
The implementation principle and technical effect of the computer device provided by the embodiment of the present application are similar to those of the method embodiment described above, and are not described herein again.
In an embodiment of the application, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of:
the control circuit controls the discharge circuit to discharge the bus capacitor and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process after the power driving circuit stops running each time; for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
In an embodiment of the application, the bus capacitor is provided with a heating device, and the computer program when executed by the processor further implements the steps of: and in the working process of the servo drive circuit, the heating equipment is controlled to heat the bus capacitor.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of: and for the capacitance value of the bus capacitor determined after the power driving circuit stops running each time, comparing the capacitance value of the bus capacitor with a pre-stored threshold value of the capacitance value, and stopping periodically controlling the power driving circuit to stop running by the control circuit when the capacitance value of the bus capacitor is smaller than the threshold value of the capacitance value.
In an embodiment of the application, the discharge circuit comprises a first discharge circuit and a second discharge circuit, the computer program when executed by the processor further realizing the steps of: the first discharging circuit is controlled to reduce the voltage of the bus capacitor to a first target voltage, and then the second discharging circuit is controlled to reduce the voltage of the bus capacitor from the first target voltage to a second target voltage.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of: the control circuit controls the capacitance detection circuit to acquire voltage data of the bus capacitor in the process that the voltage of the bus capacitor is reduced from a first target voltage to a second target voltage.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of: the control circuit controls the capacitance detection circuit to acquire a plurality of voltage data of the bus capacitor in the discharging process according to a preset sampling frequency; and for a plurality of voltage data acquired after the power driving circuit stops operating each time, determining the capacitance value of the bus capacitor according to the plurality of voltage data.
In an embodiment of the application, the servo driver circuit further comprises a power resistor, the power driver circuit is connected to the power resistor, and the computer program when executed by the processor further implements the following steps: and controlling the power driving circuit to be conducted with the power resistor, and performing power consumption based on the power resistor.
The implementation principle and technical effect of the computer-readable storage medium provided in the embodiment of the present application are similar to those of the method embodiment described above, and are not described herein again.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the claims. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A bus capacitor aging test method is applied to a servo drive circuit, wherein the servo drive circuit comprises a control circuit, a bus capacitor, a discharge circuit, a capacitor detection circuit and a power drive circuit, and the method comprises the following steps:
the control circuit controls the power driving circuit to stop running periodically in the process of power consumption of the servo driving circuit, controls the discharging circuit to discharge the bus capacitor after the power driving circuit stops running each time, and controls the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharging process;
for voltage data acquired after the power driving circuit stops running each time, determining the capacitance value of the bus capacitor according to the voltage data;
and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
2. The method of claim 1, wherein a heating device is disposed on the bus capacitor, the method further comprising:
and in the working process of the servo driving circuit, the control circuit controls the heating equipment to heat the bus capacitor.
3. The method according to claim 1 or 2, characterized in that the method further comprises:
and for the capacitance value of the bus capacitor determined after the power driving circuit stops running each time, comparing the capacitance value of the bus capacitor with a pre-stored capacitance value threshold, and when the capacitance value of the bus capacitor is smaller than the capacitance value threshold, stopping periodically controlling the power driving circuit to stop running by the control circuit.
4. The method of claim 1 or 2, wherein the discharge circuit comprises a first discharge circuit and a second discharge circuit, and the control circuit controls the discharge circuit to discharge the bus capacitance, comprising:
the control circuit firstly controls the first discharging circuit to reduce the voltage of the bus capacitor to a first target voltage, and then controls the second discharging circuit to reduce the voltage of the bus capacitor from the first target voltage to a second target voltage.
5. The method of claim 4, wherein controlling the capacitance detection circuit to collect voltage data of the bus capacitor during discharge comprises:
the control circuit controls the capacitance detection circuit to acquire voltage data of the bus capacitor in the process that the voltage of the bus capacitor is reduced from the first target voltage to the second target voltage.
6. The method of claim 1, wherein controlling the capacitance detection circuit to collect voltage data of the bus capacitor during discharge comprises:
the control circuit controls the capacitance detection circuit to acquire a plurality of voltage data of the bus capacitor in the discharging process according to a preset sampling frequency;
correspondingly, for the voltage data acquired after the power driving circuit stops operating each time, determining the capacitance value of the bus capacitor according to the voltage data includes:
and for a plurality of voltage data acquired after the power driving circuit stops operating every time, determining the capacitance value of the bus capacitor according to the plurality of voltage data.
7. The method of claim 1, wherein the servo driver circuit further comprises a power resistor, the power driver circuit being connected to the power resistor, the controlling the servo driver circuit for power consumption comprising:
and controlling the power driving circuit to be conducted with the power resistor, and performing power consumption based on the power resistor.
8. The utility model provides a bus capacitance aging testing device, is applied to among the servo drive circuit, servo drive circuit includes control circuit, bus capacitance, discharge circuit, electric capacity detection circuitry and power drive circuit, its characterized in that, the device includes:
the control module is used for controlling the servo drive circuit to consume power, periodically controlling the power drive circuit to stop running in the process of consuming power by the servo drive circuit, controlling the discharge circuit to discharge the bus capacitor after the power drive circuit stops running each time, and controlling the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharge process;
the capacitance value determining module is used for determining the capacitance value of the bus capacitor according to the voltage data acquired after the power driving circuit stops running each time;
and the aging determination module is used for determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined after the power driving circuit stops running each time.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 7.
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